Plasma Sheath Velocity and Pinch Phenomenal Measurements in TPF-II Plasma Focus Device

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1 Plasma Sheath Velocity and Pinch Phenomenal Measurements in TPF-II Plasma Focus Device Arlee Tamman PE wave : Center of Excellence in Plasma Science and Electromagnetic Wave Walailak University, THAILAND

2 Plasma Research in Walailak University 1.5 cm 8 cm Low Pressure Plasma Atmospheric Pressure Plasma

3 The Fusion Research in Thailand Simulations of ITER and Tokamak Sirindhorn International Institute of Technology Prof. Thawatchai Onjun Plasma Focus Device - UNU/ICTP Device : Chulalongkorn University Prof. Rattachat Mongkolnavin - TPF-I : Thammasat University Prof. Nopporn Poolyarat - TPF-II : Walailak University Prof. Mudtrolep Nisoa Phuket TPF : Thailand Plasma Focus 3

4 Presentation Outline Introduction to Plasma Focus Experiment Setup System Inductance Designing Short circuit test Plasma Parameter Estimation Measurement System Result Conclusion 4

5 Discharge Unit 23rd IAEA Technical Meeting on the Research Using Small Fusion Devices Introduction to Plasma Focus device - Plasma focus n = m 3 Anode Cathode Radial Phase Axial Acceleration Phase Responding Waveform Breakdown Phase Triggering Unit Power Supply Spark Gap Capacitor Power Source Plasma Focus Equivalent Circuit 5

6 JxB Introduction to Plasma Focus device - RLC Circuit responding Pinch Time, t= T/4 B I Spark Gap The pinch phase must occur at the equal time with the maximum current. Capacitor 6

7 Experimental Setup: System Inductance Capacitor: 40 nh Coaxial (RG218): 252 nh/m Target : 125 nh Current Collector : 19 nh TDI3-200k: 20 nh Designing Inductance Static inductance (79 nh) Capacitor : 40 nh (Fix) Current Collector : 19 nh Spark Gap (TDI3-200k) : 20 nh (from NX3: TDI1-150K) Varying inductance (368 nh) 1 m of Coaxial Cable : 252 nh/line Connector : 116 nh/line (8 line of Coaxial -> 368/8 = 46 nh) 7

8 Experimental Setup - Current Collector Design (Target : 20 nh) 8

9 Experimental Setup - Short Circuit test Operating parameter Voltage: 3 kv Coaxial Lines: 2, 4, 8 L R I Short Circuit Plate 9

10 Experimental Setup Short Circuit Test 10 Loop of Rogowski Coil 19.9 ± 0.3 nh 15.8 ± 0.2 nh ± 0.08 nh Number of Connector: 2 Number of Connector: 4 Number of Connector: 8 L 0 = 330 ± 10 nh L 0 = 211 ± 5 nh L 0 = 153 ± 2 nh 10

11 Experimental Setup Short Circuit Test System Inductance (n=8) - Design : 125 nh - Device : 153 nh L 0 = /n L static =93 nh L connector =476 nh Device: 153 nh L capacitor =40 nh Coaxial Cable = 252 nh L collector =19 nh Connector = 224 nh (Design = 116 nh) L Spark Gap =34 nh (Design : 20 nh) 11

12 Experimental Setup Plasma Parameter Estimation Device : L 0 = 153 nh T/4 = 3 ms 23rd IAEA Technical Meeting on the Research Using Small Fusion Devices Operating Parameters C 0 : 30 mf R 0 : 20 mohm V 0 : 10 kv Gas Type : Argon Pressure : 1.2 Torr Model Parameters F m = F c = 0.78 F mr = 0.17 F cr = 1 I max =110 ka 12

13 Experimental Setup Capacitor Charging Voltage Storage Energy Inductance Operating Gas Electrode : 30 mf : 10 kv : 1.5 kj : 153 nh Argon ( 1.2 torr ) - Cathode Radial : 2.50 cm - Anode Radial : 1.25 cm - Length : 8.5 cm Lee Model Maximum Current : 110 ka Pinch Duration : ns Pinch Temperature : ev = 80 ka/(cm torr 1/2 ). 13

14 Experimental Setup Glass Viewer Fiber Optic 14

15 Experimental Setup Dental X-ray film (30 40 mm) 15

16 Results: Pinch Percentages Charging Voltage : 10 kv Charging Voltage : 12 kv 16

17 Results: Sheath Velocity Charging Voltage : 10 kv 17

18 Results: X-Ray 50 Shot 30 Shot Dental X-Ray Machine 20 Shot 10 Shot TPF-II 0.6 torr 10 kv of Charging Voltage 18

19 Cu-I Cu-III Ar-I rd IAEA Technical Meeting on the Research Using Small Fusion Devices Ar-II Ar-II Ar-II Results: Optical Emission Spectroscopy #964-NF No Focus 19

20 Conclusion The pinch phase is confirmed by the current waveform and X-ray photography. Estimate parameters of the TPF-II are 110 ka of maximum current, ns of pinch duration and 200 ev of the pinch temperature. Light emission of the pinch phase show the line of Ar-I, Ar-II, Cu-I, Cu-II and Cu-III Future Work PIN Diodes for X-Ray Diagnostics. Faraday Cup for Ion Beam Diagnostics. Application of Ion Beam for Gemstone Modification.

21 Acknowledges - A scholarship was supported by Human Resource Development in Science Project (Science Achievement Scholarship of Thailand, SAST) - Government Annual Research Budget through Thammasat University. - High Voltage Power Supply was Supported by Chulalongkorn University and Chang Mail University 21

22 INTERNATIONAL CONFERENCE ON PLASMA SCIENCE AND APPLICATIONS ICPSA OCTOBER 2017 WALAILAK UNIVERSITY, THAILAND

23 Ar-II Cu-III Ar-II Cu-I Ar-II Experimental Setup : Optical Emission Spectroscopy Line Wavelength (nm) Intensity (a.u.) Cu I Cu III Cu II Cu II Cu I Cu I Cu I Cu II Line Wavelength (nm) Intensity (a.u.) Ar II Ar I Ar II Ar II Ar II Ar I Ar I Ar I Ar II Ar I Ar I Ar II Ar I Ar II Ar II Ar II Ar II No Focus 23

24 Experimental Setup : Rogowski Coil and Magnetic Probe - Plasma focus OES X-Ray Film Magnetic Probe Targ et 4 Ch. Scope 2 GSa/s 2 Ch. Scope 1 GSa/s Current Probe 2 Ch. Scope 1 GSa/s OES Scope Current Probe Triggering Unit Power Supply Spark Gap Capacitor HV Probe 24

25 Experimental Setup : HV Probe and Magnetic Probe Magnetic Probe V x High Voltage Probe 25

26 Experimental Setup :Current and Voltage 3/2558 1/

27 Experimental Setup : HV Probe and X-Ray Film Current X-Ray 27

28 Experimental Setup : HV Probe and Magnetic Probe Magnetic Probe V x High Voltage Probe 28

29 Current Coil

30 Introduction to Plasma Focus device - Plasma focus phase : Axial Acceleration Phase Optimized gas pressure REF: Bernard, A., et all. (1998). Scientific status of plasma focus research. J. Moscow. Phys. Soc., 8,

31 Introduction to Plasma Focus device - RLC Circuit responding RLC Circuit I t = V 0 ωl e R 2L t sin ωt = I 0 e R 2L t sin ωt 31

32 db/dt B (a.u.) 32

33 Experimental Setup Problem 33

34 Experimental Setup Problem Solving 34

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