Certificate of Accreditation

Transcription

1 PERRY JOHNSON LABORATORY ACCREDITATION, INC. Certificate of Accreditation Perry Johnson Laboratory Accreditation, Inc. has assessed the Laboratory of: Quad State Gauging and Measurement, Inc. (Hereinafter called the Organization) and hereby declares that Organization is accredited in accordance with the recognized International Standard: ISO/IEC 17025:2005 & Meets the Requirements of ANSI/NCSL Z & ANSI/NCSI Z sub clause 5.3 This accreditation demonstrates technical competence for a defined scope and the operation of a laboratory quality management system (as outlined by the joint ISO-ILAC-IAF Communiqué dated April 2017): Dimensional, Electrical, Mass, Force & Weighing, Mechanical, Time & Frequency and Thermodynamic Calibration (As detailed in the supplement) Accreditation claims for such testing and/or calibration services shall only be made from addresses referenced within this certificate. This Accreditation is granted subject to the system rules governing the Accreditation referred to above, and the Organization hereby covenants with the Accreditation body s duty to observe and comply with the said rules. For PJLA: Initial Accreditation Date: Issue Date: Expiration Date: June 6, 2006 October 3, 2018 December 31, 2020 Tracy Szerszen President/Operations Manager Perry Johnson Laboratory Accreditation, Inc. (PJLA) 755 W. Big Beaver, Suite 1325 Troy, Michigan Accreditation Certificate No.: L The validity of this certificate is maintained through ongoing assessments based on a continuous accreditation cycle. The validity of this certificate should be confirmed through the PJLA website:

2 Dimensional MEASURED INSTRUMENT, RANGE (AND SPECIFICATION WHERE ) CAPABILITY EXPRESSED AS AN UNCERTAINTY (±) Length - Single Axis F mm to mm mm ULM ( in to in) Length - 5 Axis Max F 762 mm cube (30 in) mm/axis High Accuracy CMM with High accuracy Probe System and Head Inside Cylindrical mm to 310 mm mm Comparative Ring F ( in to in) mm to 610 mm mm ULM ( in to in) mm to 762 mm ( in to 30 in) mm High Accuracy CMM with High accuracy Probe System and Head Height F mm to 900 mm ( in to in) mm Comparative (Surface Plate, Height Gage, and Gage Block Comparative) mm to mm mm High Accuracy CMM ( in in) Thread Plugs PD or mm to 8 mm pitch mm ULM and 3 wire method MOW F ( in to in) Thread Plugs Major mm to 610 mm mm ULM Diameter F ( in to in) Pipe Plugs Tapered F mm to 102 mm mm ULM, 3 Wires and Sine Bar ( in to in) Surface Plate Flatness F mm to 762 mm square ( in to 30 in) mm/axis High Accuracy CMM and High Accuracy Probe System 300 mm to mm square mm Electronic Levels ( in to in) Thread Rings F mm to 330 mm (Split Design) mm Masters Class W (Functional Test) ( in to in) mm to 330 mm mm ULM and 2 Ball Method (Solid Design) ( in to in) Linear mm to mm mm ULM Measurements F ( in to in) mm to mm ( in to in) mm High Accuracy CMM and High Accuracy Probe and Head Optical Comparator mm to 330 mm mm OGP Calibration Kit Linearity FO ( in to in) Optical Comparator to Master Angle Artifacts Angularity FO Optical Comparator 0.03 X to 50 X 0.03 mm OGP Calibration Kit Magnification FO Surface Roughness 0 mm to.075 mm mm Profilometer Issue: 10/2018 This supplement is in conjunction with certificate #L Page 2 of 9

3 Electrical Equipment to Measure DC Voltage F Equipment to Measure DC Current F Equipment to Measure Resistance F Up to 100 mv mv Fluke 5520A 100 mv to 1 V mv 1 V to 10 V V 10 V to 100 V V 100 V to V V A to 20.5 A A 0.1 µa to 1 µa µa 1 µa to 10 µa 0.6 µa 10 µa to 100 µa 0.8 µa 0.1 ma to 10 ma 0.12 ma 10 ma to 100 ma 0.12 ma 0.1 A to 1 A A Up to 10 Ω Ω 10 Ω to 100 Ω Ω 0.1 kω to 1 kω kω 1 kω to 10 kω kω 10 kω to 100 kω kω 0.1 MΩ to 1 MΩ MΩ 1 MΩ to 10 MΩ MΩ 10 MΩ to 100 MΩ MΩ 0.1 GΩ to 1 GΩ 0.6 MΩ Up to 100 Hz Up to 10 mv mv 100 Hz to 1 khz Up to 10 mv mv 1 khz to 10 khz Up to 10 mv mv 10 khz to 100 khz Up to 10 mv mv Issue: 10/2018 This supplement is in conjunction with certificate #L Page 3 of 9

4 Electrical Up to 100 Hz 10 mv to 100 mv 0.18 mv 100 Hz to 1 khz 10 mv to 100 mv 0.18 mv 1 khz to 10 khz 10 mv to 100 mv 0.20 mv 10 khz to 100 khz 10 mv to 100 mv 2.5 mv Up to 100 Hz 0.1 V to 1 V V 100 Hz to 1 khz 0.1 V to 1 V V 1 khz to 10 khz 0.1 V to 1 V V 10 khz to 100 khz 0.1 V to 1 V V Up to 100 Hz 1 V to 10 V V 100 Hz to 1 khz 1 V to 10 V V 1 khz to 10 khz 1 V to 10 V V 10 khz to 100 khz 1 V to 10 V V Up to 100 Hz 10 V to 100 V V 100 Hz to 1 khz 10 V to 100 V V 1 khz to 10 khz 10 V to 100 V V 10 khz to 100 khz 10 V to 100 V V Up to 100 Hz 100 V to 700 V V 100 Hz to 1 khz 100 V to 700 V V 1 khz to 10 khz 100 V to 700 V V Up to 50 Hz 29 µa to 100 µa 0.28 µa 50 Hz to 100 Hz 29 µa to 100 µa 0.28 µa 100 Hz to 1 khz 29 µa to 100 µa 0.54 µa Fluke 5520A Issue: 10/2018 This supplement is in conjunction with certificate #L Page 4 of 9

5 Electrical Up to 50 Hz 0.1 ma to 1 ma 1.2 µa 50 Hz to 100 Hz 0.1 ma to 1 ma ma 100 Hz to 1 khz 0.1 ma to 1 ma ma 1 khz to 10 khz 0.1 ma to 1 ma 13 µa Up to 50 Hz 1 ma to 10 ma ma 50 Hz to 100 Hz 1 ma to 10 ma ma 100 Hz to 1 khz 1 ma to 10 ma ma 1 khz to 10 khz 1 ma to 10 ma ma Up to 50 Hz 10 ma to 100 ma ma 50 Hz to 100 Hz 10 ma to 100 ma ma 100 Hz to 1 khz 10 ma to 100 ma 0.18 ma 1 khz to 10 khz 10 ma to 100 ma 0.72 ma Up to 50 Hz 100 ma to 1 A A 50 Hz to 100 Hz 100 ma to 1 A A 100 Hz to 1 khz 100 ma to 1 A A 1 khz to 10 khz 100 ma to 1 A A Equipment to Measure Capacitance 10 Hz to 10 khz Up to 1 nf nf 10 Hz to 1 khz 1 nf to 10 nf nf 10 Hz to 1 khz 10 nf to 100 nf 0.42 nf 10 Hz to 600 Hz 100 nf to 1 µf µf 10 Hz to 150 Hz 1 µf to 10 µf µf 10 Hz to 80 Hz 10 µf to 100 µf 1.2 µf Fluke 5520A Issue: 10/2018 This supplement is in conjunction with certificate #L Page 5 of 9

6 Electrical Temperature Calibration, Indication and Control Equipment used with Thermocouple Type E F Temperature Calibration, Indication and Control Equipment used with Thermocouple Type J F Temperature Calibration, Indication and Control Equipment used with Thermocouple Type K F Temperature Calibration, Indication and Control Equipment used with Thermocouple Type T F -250 C to -100 C 0.6 C Electrical Simulation of -100 C to -25 C 0.2 C Thermcouple Output Fluke 5520A -25 C to 350 C 0.18 C 350 C to 650 C 0.2 C 650 C to C 0.26 C -210 C to -100 C 0.33 C -100 C to -30 C 0.2 C -30 C to 150 C 0.18 C 150 C to 760 C 0.21 C 760 C to C 0.28 C -200 C to -100 C 0.4 C -100 C to -25 C 0.22 C -25 C to 120 C 0.2 C 120 C to C 0.32 C C to C 0.48 C -250 C to -150 C 0.76 C -150 C to 0 C 0.29 C 0 C to 120 C 0.2 C 120 C to 400 C 0.18 C Mass, Force, and Weighing Devices Weights F g to 80 g ( x 10-5 Wt) mg Comparative 80 g to 210 g ( x 10-5 Wt) mg 200 g to 500 g ( x 10-5 Wt) mg 500 g to 2 kg ( x 10-5 Wt) mg 2 kg to 32 kg ( x 10-5 Wt) mg Force F N to 445 N 1.3 N Instron Test Equipment 445 N to N 14 N N to N 140 N Issue: 10/2018 This supplement is in conjunction with certificate #L Page 6 of 9

7 Mechanical Torque Instruments F N m to 5.65 N m ( x 10-3 T) N m Torque Transducers N m to N m ( x 10-3 T) N m and/or Torque Meter N m to 113 N m ( x 10-3 T) N m N m to 340 N m ( x 10-3 T) N m N m to N m ( x 10-3 T) N m Oil Pressure F 34 kpa to kpa 3.5 kpa Dead Weight Tester Air Pressure F 3.45 kpa to 827 kpa 3.5 kpa Comparative Tester Vacuum F kpa to 102 kpa 0.84 kpa Comparative Tester Hardness, Surface F Indirect Verification of 100 to 600 Brinell 20 HRC to 80 HRC 2.0 respective hardness points Rockwell Hardness 20 HRB to 100 HRB Tester F 60 HRA to 90 HRA 65 H15-N to 96 H15-N 40 H30-N to 92 H30-N 60 H15-T to 95 H15-T 15 H30-T to 84 H30-T 63 Knoop to 846 Knoop Calibrated Rockwell Hardness Test Blocks Time and Frequency Equipment to measure Frequency or Time F Up to 100 Hz 0.06 Hz Fluke 5520A 100 Hz to 1 khz khz Frequency/Time Measure 1 khz to 10 khz khz 10 khz to 100 khz 0.06 khz 100 khz to 1 MHz MHz Issue: 10/2018 This supplement is in conjunction with certificate #L Page 7 of 9

8 Thermodynamic Temperature Measurement RTD Pt 385, 100 Ω F -196 C to 800 C 0.95 C Fluke 5520A Fluke 714 RTD Pt 3926, 100Ω F RTD Pt 3916, 100 Ω F RTD Pt 385, 200 Ω F RTD Pt 385, 500 Ω F RTD Pt 385, Ω F Temperature Measurement -80 C to 260 C 0.95 C RTD Ni 120, 120 Ω F Temperature Measurement -100 C to 260 C 0.95 C RTD Cu 427, 10 Ω F Temperature Measurement -196 C to C 4.4 C Thermocouple Type J F Temperature Measurement -196 C to C 4.4 C Thermocouple Type K F Temperature Measurement -196 C to 400 C 4.4 C Thermocouple Type T F Temperature Measurement -196 C to 950 C 4.4 C Thermocouple Type E F Temperature Measurement -196 C to C 4.4 C Thermocouple Type N F Temperature Measurement -20 C to C 4.4 C Thermocouple Type R F Temperature Measurement -20 C to C 4.4 C Thermocouple Type S F Temperature Measurement 600 C to C 4.4 C Thermocouple Type B F Thermometers F -45 C to 650 C 1.8 C Dry Hot and Cold Deep Temperature Wells Infrared/Non-contact 50 C to 500 C 2.5 C Blackspot Thermometers F Ovens O -196 C to C 3.5 C Fluke 724 Temperature Calibrator Issue: 10/2018 This supplement is in conjunction with certificate #L Page 8 of 9

9 1. The CMC (Calibration and Measurement Capability) stated for calibrations included on this scope of accreditation represents the smallest measurement uncertainty attainable by the laboratory when performing a more or less routine calibration of a nearly ideal device under nearly ideal conditions. It is typically expressed at a confidence level of 95 % using a coverage factor k (usually equal to 2). The actual measurement uncertainty associated with a specific calibration performed by the laboratory will typically be larger than the CMC for the same calibration since capability and performance of the device being calibrated and the conditions related to the calibration may reasonably be expected to deviate from ideal to some degree. 2. The laboratories range of calibration capability for all disciplines for which they are accredited is the interval from the smallest calibrated standard to the largest calibrated standard used in performing the calibration. The low end of this range must be an attainable value for which the laboratory has or has access to the standard referenced. Verification of an indicated value of zero in the absence of a standard is common practice in the procedure for many calibrations but by its definition it does not constitute calibration of zero capacity. 3. The presence of a superscript F means that the laboratory performs calibration of the indicated parameter at its fixed location. Example: Outside Micrometer F would mean that the laboratory performs this calibration at its fixed location. 4. The presence of a superscript O means that the laboratory performs calibration of the indicated parameter onsite at customer locations. Example: Outside Micrometer O would mean that the laboratory performs this calibration onsite at the customer s location. 5. The presence of a superscript FO means that the laboratory performs calibration of the indicated parameter both at its fixed location and onsite at customer locations. Example: Outside Micrometer FO would mean that the laboratory performs this calibration at its fixed location and onsite at customer locations. 6. Measurement uncertainties obtained for calibrations performed at customer sites can be expected to be larger than the measurement uncertainties obtained at the laboratories fixed location for similar calibrations. This is due to the effects of transportation of the standards and equipment and upon environmental conditions at the customer site which are typically not controlled as closely as at the laboratories fixed location. 7. The term Wt represents weight in pounds or grams (including SI multiple and submultiple units) appropriate to the uncertainty statement. 8. The term T represents torque in N m (including SI multiple and submultiple units) appropriate to the uncertainty statement. Issue: 10/2018 This supplement is in conjunction with certificate #L Page 9 of 9