Certificate of Accreditation

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1 PERRY JOHNSON LABORATORY ACCREDITATION, INC. Certificate of Accreditation Perry Johnson Laboratory Accreditation, Inc. has assessed the Laboratory of: Acceso III No. 16 A Nave 10, Parque Industrial Benito Juárez (Hereinafter called the Organization) and hereby declares that Organization is accredited in accordance with the recognized International Standard: ISO/IEC 17025:2005 This accreditation demonstrates technical competence for a defined scope and the operation of a laboratory quality management system (as outlined by the joint ISO-ILAC-IAF Communiqué dated January 2009): Dimensional, Mechanical, Thermodynamic, Electrical, Mass, Force and Weighing Devices Calibration (As detailed in the supplement) Accreditation claims for such testing and/or calibration services shall only be made from addresses referenced within this certificate. This Accreditation is granted subject to the system rules governing the Accreditation referred to above, and the Organization hereby covenants with the Accreditation body s duty to observe and comply with the said rules. For PJLA: Tracy Szerszen President/Operations Manager Perry Johnson Laboratory Accreditation, Inc. (PJLA) 755 W. Big Beaver, Suite 1325 Troy, Michigan Initial Accreditation Date: Issue Date: Expiration Date: July 29, 2015 July 13, 2017 October 31, 2019 Revision Date: Accreditation No.: Certificate No.: May 24, L R1 The validity of this certificate is maintained through ongoing assessments based on a continuous accreditation cycle. The validity of this certificate should be confirmed through the PJLA website: Page 1 of 11

2 Querétaro, Querétaro, México C.P Mechanical Torque FO 0.2 N m to 1 N m 0.13 % of reading Torque Transducers and 1 N m to 10 N m 0.12 % of reading Digital Indicators ISO N m to 25 N m 0.13 % of reading 25 N m to 400 N m 0.27 % of reading 400 N m to N m 0.32 % of reading Dimensional Coordinate Measuring s (CMM) Verification EL - Length Error of Indication Surface Finish Measuring s (Profilometers) Ra FO Surface Finish Measuring s (Profilometers) Rz FO Surface Finish Measuring s(profilometers) Pt FO Surface Finish Measuring s Rsm FO (Contours Instruments) X Axis O (Contours Instruments) X Axis O (Contour Instruments) X axis O 10 mm to mm ( L) µm Laser Interferometer, Step Gage, Gage Blocks, Master sphere ASME B ISO µm to 3.2 µm 0.05 µm Roughness Standards, Master Sphere, Optical 1.5 µm to 10 µm 0.08 µm 0.36 µm to 2.6 mm 0.08 µm 15 µm to 100 µm 0.08 µm Flat ISO µm to 1 mm 1.3 µm Gage Blocks, Master Sphere, Contour Standard ISO mm to 10 mm 1.6 µm 10 mm to 200 mm ( L) µm Issue: 07/17 This supplement is in conjunction with certificate #L R1 Page 2 of 11

3 Dimensional (Contour Instruments) Z axis O (Contour Instruments) Radius O (Contour Instruments) Angle O Roundness Measuring Sensitivity (Displacement Error) Radial Error Axial Error O Optical Comparators Vision Systems & Measuring Microscopes O 1 mm to 50 mm ( L) µm Gage Blocks, Master Sphere, Contour Standard. ISO mm to 6.5 mm ( L) µm µm to 10 µm 65 nm + 46 nm/µm Slope Table Standard 160 µm to 500 µm 0.09 µm Gage Blocks; Optical Flat; Sphere Radius: 0.05 µm Roundness Standard 6 mm to 25 mm ISO 4291 Optical Flat Radius: 0.04 µm 15 mm to 70 mm X and Y Axis Error of Indication X and Y Axis Error of Indication Z Axis Error of Indication 0.01 mm to 300 mm 300 mm to 500 mm 0.16 mm to 300 mm ( L) µm ( L) µm ( L) µm Glass Scale, Gage Blocks Angular Reticule Angle 1 to JIS B 7184 Mass, Force and Weighing Devices Force Measuring Devices Tension and Compression FO 0.2 N to N % of reading Mass M1, M2 ISO , ISO kn to 10 kn 0.02 % of reading ISO , ISO kn to 100 kn % of reading 100 kn to 890 kn 0.22 % of reading Load Cells and Digital Indicators Issue: 07/17 This supplement is in conjunction with certificate #L R1 Page 3 of 11

4 Dimensional Articulated Arm Coordinate Measuring s (AACMM) Verification3 Volumetric Performance Radius: Up to mm ( L) µm Gage Blocks; Step Gage, Calibrated Cone, Master Sphere ASME B Effective Diameter Performance FO Universal Length F Surface Plates Flatness Only O Height Gages FO Vertical Measurement System FO Outside Micrometers F Calipers F Dial Indicators F Plain Rings Standard F Sphere Diameter: 2 µm 30 mm (Nominal) 0.5 mm to 100 mm ( L) µm Gage Blocks 100 mm to mm ( L) µm Laser Interferometer ISO / ISO NC mm x 100 mm to ( L) µm Autocollimator mm x mm, Photoelectric Grade 0, 1, 2 and 3 (Res.= 0.1 second) NMX-CH :IMNC Level 0.01 mm to mm ( L) µm Gage Block Sets (Res.= 0.01 mm) NMX-CH mm to mm ( L) µm Gage Block Sets (Res.= 0.5 µm) NMX-CH mm to mm ( L) µm Gage Blocks (Res.= mm) NMX-CH-099-IMNC 0.5 mm to mm (9 + 20L) µm Gage Blocks (Res.= 0.01 mm) mm to mm (Res.= mm) 3 mm to 150 mm Class "Z, ZZ" NMX-CH-002-IMNC ( L) µm Universal Length ASME B M 1.4 µm Standard Ring Class "Y" ANSI/ASME B Universal Length Discs and Plug Gage F 0.1 µm to 100 mm ( L) µm Universal Length ASME B Feeler Gauges Steel Material F Feeler Gauges 0.01 mm to 3 mm 0.01 mm to 3 mm 1.7 µm 1.7 µm Universal Length Plastic Material F JIS B 7524 Thickness Standard F 0.01 mm to 3 mm 1.6 µm Issue: 07/17 This supplement is in conjunction with certificate #L R1 Page 4 of 11

5 Dimensional Certificate of Accreditation: Supplement Sphere F 0.1 mm to 100 mm ( L) µm Universal Length machine ISO , ISO Class G 10 to G 200 Micrometer Heads F Bore Gage F Stylus Test Indicator F 0.1 µm to 50.8 mm (Res.= mm) 6 mm to 100 mm (Effective Range Measuring 50.8 mm) (Res.= mm) 0.1 µm to mm (Res.= mm) ( L) µm Universal Length NC , JIS B7502 ( L) µm Universal Length JIS B 7515 ( L) µm Universal Length ASME B M Length Bars F 10 mm to 550 mm ( L) µm Steel Standard Blocks Grade "0 and 1" Under NMX-CH-3650:2004, BS 5317 Universal Length Pin Gages F 0.5 mm to 20 mm 0.86 µm Universal Length Bolt Master Class "0" Roundness DIN 2269 Wire Cloth and Sieves for mm to 40 mm ( L) µm Vision System Testing Purposes F Standard Radius F 0.1 µm to 25.4 mm 1.6 µm Standard Scales F 0.01 mm to 300 mm ( L) µm Mechanical Accuracy ( L/1 000) µm JIS B 7541 Pressure FO 100 psi to psi 1.4 psi Fluke 750P psi to 1500 psi 1.5 psi Fluke 750P09 Issue: 07/17 This supplement is in conjunction with certificate #L R1 Page 5 of 11

6 Mechanical Pressure FO 300 psi to psi 2.7 psi Fluke 750P psi to psi 4.3 psi Fluke 750P psi to psi 11 psi Fluke 750P31 Thermodynamic Thermocouple Sensor Type RTD F Thermocouple Sensor Type Thermistor F -15 C to 110 C 0.15 C Fluke C to 350 C 0.25 C -15 C to 110 C 0.15 C 110 C to 350 C 0.25 C Bimetallic Thermometer F -15 C to 110 C 0.15 C 110 C to 350 C 0.25 C Electrical DC Voltage F DC Voltage FO DC Current F 33 mv to 330 mv mv Fluke 5522A 0.33 V to 3.3 V V 3.3 V to 33 V V 33 V to 330 V V 330 V to V 0.12 V 10 mv to 100 mv mv Fluke 8845A 0.1 V to 1 V mv 1 V to 10 V 0.15 mv 10 V to 100 V 1.7 mv 100 V to V 0.02 V 0.1 kv to 6 kv kv Fluke 80K μa to μa μa Fluke 5522A 0.33 ma to ma 0.15 μa 3.3 ma to ma 1.3 μa 33 ma to ma ma 0.33 A to A 1.3 ma 2.2 A to 11 A A Issue: 07/17 This supplement is in conjunction with certificate #L R1 Page 6 of 11

7 Electrical 11 A to 20.5 A A Fluke 5522A DC Current F Clamp-On Meters F 11 A to A 0.12 A Fluke 5522A and 50 Turn Coil (Type Thyroid) DC Current FO Resistance F AC Voltage 45 Hz to 10 khz F AC Voltage 45 Hz to 1 khz F 1 ma to 10 ma ma Fluke 8845A 10 ma to 100 ma ma 0.1 A to 1 A 1.2 ma 1 A to 3 A 2.4 ma 3 A to 10 A 0.07 A 1.1 Ω to Ω Ω Fluke 5522A 11 Ω to Ω Ω 33 Ω to Ω Ω 110 Ω to Ω Ω 0.33 kω to kω 0.12 Ω 1.1 kω to kω 0.13 Ω 3.3 kω to kω 1.2 Ω 11 kω to kω 1.3 Ω 33 kω to kω kω 110 kω to kω kω 0.33 MΩ to MΩ 0.12 kω 1.1 MΩ to MΩ 0.44 kω 3.3 MΩ to MΩ MΩ 11 MΩ to MΩ MΩ 33 MΩ to MΩ 0.13 MΩ 110 MΩ to 330 MΩ 1.9 MΩ 330 MΩ to MΩ 12 MΩ 3.3 mv to mv mv 33 mv to mv 0.12 mv 0.33 V to V 1.3 mv 3.3 V to V V 33 V to V V 330 V to V 0.26 V Issue: 07/17 This supplement is in conjunction with certificate #L R1 Page 7 of 11

8 Electrical AC Voltage 10 Hz to 20 khz FO AC Voltage 45 Hz to 500 Hz FO AC Current 45 Hz to 1 khz F AC Current 45 Hz to 100 Hz F AC Current Clamp-On Meters At the listed Frequencies 45 Hz a 65 Hz (Type Thyroid) F AC Current 10 Hz to 5 khz FO AC Current 40 Hz to 1 khz FO Resistance FO 10 mv to 100 mv mv Fluke 8845A 0.1 V to 1 V 0.4 mv >1 V to 10 V 4.2 mv >10 V to 100 V V 1 V to 750 V 0.32 V 0.1 kv to 6 kv kv Fluke 80K-6 33 μa to μa 0.12 μa Fluke 5522A 0.33 ma to ma 1.3 μa 3.3 ma to ma ma 33 ma to ma 0.12 ma 0.33 A to A 1.8 ma A to A A 3 A to A A A to 20.5 A A 11 A to A 0.12 A Fluke 5522A and 50 Turn Coil 0.1 A to 1 A 0.59 ma Fluke 8845A 1 A to 3 A 4 ma 3 A to 10 A A Fluke 8845A 1 Ω to 10 Ω Ω 10 Ω to 100 Ω Ω 0.1 kω to 1 kω 0.12 Ω 1 kω to 10 kω 1.2 Ω 10 kω to 100 kω 11 Ω Issue: 07/17 This supplement is in conjunction with certificate #L R1 Page 8 of 11

9 Electrical 0.1 MΩ to 1 MΩ 120 kω Fluke 8845A Resistance FO 1 MΩ to 10 MΩ 1.3 kω RTD Type Pt 385, 100Ω FO RTD Type Pt 3 926, 100Ω F RTD Type Pt 3 916, 100Ω F RTD Type Pt 385, 200Ω F RTD Type Pt 385, 500Ω FO RTD Type Pt 385, 1 000Ω FO RTD Type Pt Ni 385, 120Ω (Ni 120Ω) RTD Type Cu Ω FO Thermocouple Type B FO 10 MΩ to 100 MΩ 0.1 MΩ 0.1 GΩ to 1 GΩ MΩ -200 C to 800 C C Electrical Simulation of RTD Output Fluke 5522A -200 C to 630 C C Electrical Simulation of RTD Output Fluke 5522A -200 C to 630 C C -190 C to 630 C C -190 C to 630 C C Electrical Simulation of RTD Output Fluke 5522A / Fluke C to 630 C C -80 C to 260 C 0.10 C -100 C to 260 C 0.35 C 600 C to C 0.37 C Electrical Simulation of Thermocouple Input / Output Fluke 5522A / Fluke 725 Issue: 07/17 This supplement is in conjunction with certificate #L R1 Page 9 of 11

10 Electrical Thermocouple Type C FO Thermocouple Type E FO Thermocouple Type J FO Thermocouple Type K FO Thermocouple Type N FO Thermocouple Type R FO Thermocouple Type S FO Thermocouple Type T FO 0 C to C 0.33 C Electrical Simulation of Thermocouple Input /Output Fluke 5522A / Fluke C to C 0.21 C -210 C to C 0.21 C -200 C to C 0.23 C -200 C to C 0.25 C 0 C to C 0.41 C Electrical Simulation of Thermocouple Input /Output Fluke 5522A / Fluke C to C 0.44 C -250 C to 400 C 0.21 C 1. The CMC (Calibration and Measurement Capability) stated for calibrations included on this scope of accreditation represents the smallest measurement uncertainty attainable by the laboratory when performing a more or less routine calibration of a nearly ideal device under nearly ideal conditions. It is typically expressed at a confidence level of 95 % using a coverage factor k (usually equal to 2). The actual measurement uncertainty associated with a specific calibration performed by the laboratory will typically be larger than the CMC for the same calibration since capability and performance of the device being calibrated and the conditions related to the calibration may reasonably be expected to deviate from ideal to some degree. Issue: 07/17 This supplement is in conjunction with certificate #L R1 Page 10 of 11

11 2. The laboratories range of calibration capability for all disciplines for which they are accredited is the interval from the smallest calibrated standard to the largest calibrated standard used in performing the calibration. The low end of this range must be an attainable value for which the laboratory has or has access to the standard referenced. Verification of an indicated value of zero in the absence of a standard is common practice in the procedure for many calibrations but by its definition it does not constitute calibration of zero capacity. 3. The presence of a superscript F means that the laboratory performs calibration of the indicated parameter at its fixed location. Example: Outside Micrometer F would mean that the laboratory performs this calibration at its fixed location. 4. The presence of a superscript O means that the laboratory performs calibration of the indicated parameter onsite at customer locations. Example: Outside Micrometer O would mean that the laboratory performs this calibration onsite at the customer s location. 5. The presence of a superscript FO means that the laboratory performs calibration of the indicated parameter both at its fixed location and onsite at customer locations. Example: Outside Micrometer FO would mean that the laboratory performs this calibration at its fixed location and onsite at customer locations. 6. Measurement uncertainties obtained for calibrations performed at customer sites can be expected to be larger than the measurement uncertainties obtained at the laboratories fixed location for similar calibrations. This is due to the effects of transportation of the standards and equipment and upon environmental conditions at the customer site which are typically not controlled as closely as at the laboratories fixed location. 7. The term L represents length in meters or millimeters as appropriate to the uncertainty statement. Issue: 07/17 This supplement is in conjunction with certificate #L R1 Page 11 of 11

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