1 CONTENTS. Copyright Zemax, LLC All Rights Reserved.

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2 1 CONTENTS 2 OVERVIEW LICENSING & INSTALLATION Single User Softkey Licensing (All Editions) License Manager Enhancements (All Editions) SURFACES & OBJECTS Opto-Mechanical Semi-Diameters (Premium & Professional Only) Additional NSC Objects as Detectors (Premium & Professional Only) Edge Apertures for NSC Even Asphere Lens (Premium & Professional Only) ANALYSES Detector Viewer Spot Size Values (Premium & Professional Only) Multi-Threaded Diffraction Encircled Energy (All Editions) Huygens PSF Spherical Wavelet Construction (All Editions) TOOLS Fully Instrumented NSC Conversion Tool (Premium & Professional Only) Design Lockdown Tool (Premium & Professional Only) Critical Rayset Generator Tool (Premium & Professional Only) NSC Critical Ray Tracer Tool (Premium & Professional Only) Auto-Calculated Pupil Shift Factors (All Editions) Disable Semi-Diameter Margins for Surface (Premium & Professional Only) Opto-Mechanical Semi-Diameter Multi-Config Operands (Premium & Professional Only) OPTIMIZATION Opto-Mechanical Semi-Diameter Operands (Premium & Professional Only) NSDE Beam Size Calculation for Specific Wavelengths (Premium & Professional Only) LIBRARIES New LuxExcel Material Catalog for 3D Printed Optics (All Editions) New Nihon Kessho Kogaku Material Catalog (All Editions) Updated Schott Material Catalog (All Editions) Updated Schott_IRG Material Catalog (All Editions) Updated Ohara Material Catalog (All Editions) PROGRAMMING ZPL Opto-Mechanical Semi-Diameter Commands (Premium & Professional Only) ZOS-API Opto-Mechanical Semi-Diameter Commands (Premium & Professional Only) ZOS-API Detector Polar Output (Premium & Professional Only)... 13

3 10 USER-INTERFACE Faster Analysis Window Updates (All Editions) Keyboard Shortcuts in Tooltips (All Editions) ALT Key Shortcuts for Analyses (All Editions) File Syntax Highlighting (All Editions) BUG FIXES OVERVIEW OpticStudio 16 adds a host of new manufacturing related improvements, expands softkey licensing technology, and brings UI speed improvements. Defining lenses for manufacture is greatly improved with more realistic aperture definitions that account for mechanical edges. These changes impact everything from thermal analysis to manufacturing drawings, adding a new level of functionality. New tools automate the preparation of sequential optical systems for manufacturing, and support validation of performance after adding opto-mechanical components. Softkey licensing is now offered for single user keys. The single user softkey license provides flexibility and security without the need for a USB dongle. Analysis windows now render faster than before, returning UI control to the editors more quickly. Read on for complete details about all the new additions. 3 LICENSING & INSTALLATION 3.1 SINGLE USER SOFTKEY LICENSING (ALL EDITIONS) Single user softkey licensing is now available and allows users to digitally activate OpticStudio as opposed to using a hardkey (USB dongle) for authentication. The softkey license uses an activation code, obtained from Zemax, that ties the license to a specific machine. The license can be easily transferred from one machine to another. Activation, transfer, and update of softkey licenses is managed through the License Manager. This capability opens the door for running OpticStudio on virtual and cloud based machines that don t have USB ports. Softkey licenses can only be used with OpticStudio 15.5 and newer versions of the software. If you are interested in exchanging your existing hardkey for a softkey license, contact Zemax sales (sales@zemax.com). Find the License Manager in the Information section of the Help ribbon. 3.2 LICENSE MANAGER ENHANCEMENTS (ALL EDITIONS) The license manager has been enhanced in several ways. Recognized black hardkeys (USB dongle) will now show up in the license manager, alongside the new softkey licenses. Upon launch of OpticStudio, if no key is found, the user will be presented with the option to start the License Manager for the purpose of activating a softkey license or troubleshooting problems. A new Help tab has been added to the License Manager that provides information about the different types of licenses OpticStudio supports and relevant installation help resources.

4 Find it in the Information section of the Help ribbon. 4 SURFACES & OBJECTS 4.1 OPTO-MECHANICAL SEMI-DIAMETERS (PREMIUM & PROFESSIONAL ONLY) Sequential surfaces now support a more realistic definition of surface aperture: Semi-Diameter (clear aperture), Chip Zone, and Mechanical Semi-Diameter. The Semi-Diameter functions the same as in previous releases, with the same optional margin applied as specified in the System Explorer. The Chip Zone represents a buffer region of the surface that follows the Semi-Diameter curvature. This region is usually a coating falloff area and isn t held to tight tolerances. The Mechanical Semi-Diameter is used to define the mounting edge of the surface. Using this diameter, users can add flat and angled flanges to lenses without having to resort to dummy surfaces. These new diameters are accounted for across a range of features: thermal modeling, optimization operands, sag computations, manufacturing drawings, and the cost estimator. The cost estimator will incorporate these diameters into the estimates provided. The ISO element drawing will also incorporate the new diameters when generating drawings. For stray light modeling purposes, the Standard and Even Asphere surfaces will convert to NSC with the Mechanical Semi-Diameter defined properly. Only rotationally symmetric surfaces are supported. Rays only interact with the Semi-Diameter for sequential raytracing purposes.

5 Find it in the Lens Data Editor. 4.2 ADDITIONAL NSC OBJECTS AS DETECTORS (PREMIUM & PROFESSIONAL ONLY) Most non-sequential objects now support the option to be used as detectors. If the option is supported the Object is a Detector checkbox will be enabled in the Type tab of the Object Properties dialog. Data collected on detector objects can be viewed in the Shaded Model Layout or as text listings in the Detector Viewer. The pixilation of detector objects is defined by the drawing resolution defined in the Draw section of the Object Properties dialog.

6 Find it in the Type section of the Object Properties dialog. 4.3 EDGE APERTURES FOR NSC EVEN ASPHERE LENS (PREMIUM & PROFESSIONAL ONLY) The NSC Even Asphere lens supports Edge apertures on the front and rear faces, similar to the Standard Lens. This was added to support conversion of sequential even asphere lenses with Mechanical Semi- Diameters defined. These edge regions of lenses are very important for comprehensive stray light analysis. Find it in the NSC editor as a parameter on the Even Asphere surface. 5 ANALYSES 5.1 DETECTOR VIEWER SPOT SIZE VALUES (PREMIUM & PROFESSIONAL ONLY) The detector viewer now displays additional spot size values when displaying data on a detector rectangle or a detector color. The calculated values are RMS spot radius, RMS spot X & Y widths, and X & Y centroid location. These values could previously only be obtained via the NSDD and NSDE operands in the merit function. The values are provided in a new Beam Info tab at the bottom of the detector viewer window.

7 The detector color additionally allows these values to be reported for a specific spectral range. This spectral range is defined in the Type tab of the Object Properties dialog under the detector settings. Find the Detector Viewer in the Detectors section of the Analyze ribbon. 5.2 MULTI-THREADED DIFFRACTION ENCIRCLED ENERGY (ALL EDITIONS) The diffraction encircled energy analysis is now multi-threaded. This improvement speeds up analysis and optimization. Find it in the Image Quality section of the Analyze ribbon. 5.3 HUYGENS PSF SPHERICAL WAVELET CONSTRUCTION (ALL EDITIONS) The Huygens PSF calculation now supports a spherical wavelet basis for the PSF construction. The decision to use the default planar wavelet basis or new spherical wavelet basis is determined automatically for maximum accuracy. This capability significantly expands the range of optical systems in which ray-based diffraction calculations can be performed. Systems that don t form diffraction limited point images can now use this analysis. One specific class of newly supported systems is discrete/pixilated diffractive and hologram

8 surfaces. These optical surfaces are often used to generate very complex, diffraction-based light distributions. They can even be used to form extended images from collimated input. The image below is a phase map of a computer generated hologram (CGH) that encodes a tachometer display. The phase is so complex, that it looks like random noise. Applying this phase profile to a grid phase surface (added in OpticStudio 15.5), the Huygens PSF can be used to render an image of the tachometer. In addition, users can now analyze beam profiles, both near and far from focus. In this respect, the analysis shares some similarities with physical optics, however with much faster computation speeds in certain systems. Specifically, optical systems with large numbers of surfaces may benefit from this calculation, whereas previously physical optics was required to get an accurate simulation. Find it in the Image Quality section of the Analyze ribbon.

9 6 TOOLS 6.1 FULLY INSTRUMENTED NSC CONVERSION TOOL (PREMIUM & PROFESSIONAL ONLY) The NSC conversion tool has been improved to create sources and detectors that enable simulation of spot diagrams and extended scenes. This option is only available if converting to pure NSC. When selected, source points and detectors corresponding the defined field points are generated. In addition, if the object surface is at finite conjugates, a slide object and extended detector are defined for extended scene analysis. This capability is useful for determining what impact stray light and opto-mechanics have on imaging performance.

10 Find it in the Convert section of the File ribbon. 6.2 DESIGN LOCKDOWN TOOL (PREMIUM & PROFESSIONAL ONLY) This tool automatically performs a number of operations needed to prepare a sequential optical system for opto-mechanical analysis and production. The tool will convert semi-diameters to fixed apertures, replace vignetting with fixed apertures, switch from image-based to object based field and aperture definitions, remove solves, and round thickness values. Find it in the Production Tools section of the Tolerance ribbon or in the Convert to NSC Tool. 6.3 CRITICAL RAYSET GENERATOR TOOL (PREMIUM & PROFESSIONAL ONLY) This tool will create a set of reference rays that can be traced in non-sequential mode. These rays are useful in order to verify system performance in the presence of opto-mechanical changes made in nonsequential mode. The Critical Ray Tracer Tool is used to trace these rays in non-sequential mode. Find it in the Production Tools section of the Tolerance ribbon or in the Convert to NSC Tool.

11 6.4 NSC CRITICAL RAY TRACER TOOL (PREMIUM & PROFESSIONAL ONLY) The NSC Critical Ray Tracer tool traces critical raysets saved using the Critical Rayset Generator. A text listing is generated providing a quick pass/fail diagnosis comparing the critical rayset position and direction in sequential mode to non-sequential mode. These raysets are intended to be used to validate the performance impact of opto-mechanical components added in non-sequential mode. Find it in the Trace Rays section of the Analyze ribbon in non-sequential mode. 6.5 AUTO-CALCULATED PUPIL SHIFT FACTORS (ALL EDITIONS) Pupil shift factors used with ray aiming are now automatically calculated and prepopulated in the appropriate fields. The values are calculated based upon the difference between the location of the real and paraxial entrance pupils. These values can be overwritten by the user if necessary. Find it in the Ray Aiming section of the System Explorer. 6.6 DISABLE SEMI-DIAMETER MARGINS FOR SURFACE (PREMIUM & PROFESSIONAL ONLY) This checkbox provides the ability to disable semi-diameter margins for any specific surface. This setting is useful when trying to use only the Chip Zone parameter to define the unfinished edge of the clear aperture of a surface. Find it in the Aperture section of the Surface Properties Dialog. 6.7 OPTO-MECHANICAL SEMI-DIAMETER MULTI-CONFIG OPERANDS (PREMIUM & PROFESSIONAL ONLY) Two operands related to the new opto-mechanical semi-diameters have been added. The operands CHZN and MCSD provide multi-configuration control of the Chip Zone and Mechanical Semi-Diameter parameters, respectively. When doing a thermal analysis, the Make Thermal tool will add these operands along with SDIA for each defined surface. Find it in the Multi-Configuration Editor.

12 7 OPTIMIZATION 7.1 OPTO-MECHANICAL SEMI-DIAMETER OPERANDS (PREMIUM & PROFESSIONAL ONLY) Three optimization operands related to the new opto-mechanical semi-diameters have been added. The optimization operands OMSD, OMMI, and OMMX provide optimization control of the Mechanical Semi- Diameter value, minimum boundary constraint, and maximum boundary constraint, respectively. Find it in the Merit Function Editor. 7.2 NSDE BEAM SIZE CALCULATION FOR SPECIFIC WAVELENGTHS (PREMIUM & PROFESSIONAL ONLY) The NSDE optimization operand supports the ability to calculate centroids and RMS radii for wavelengths in a specific spectral range. If the option Record pixel spectral data is enabled in the detector properties, a new Wavelength argument allows definition of a specific spectral bin from which to calculate data. Find it in the Merit Function Editor. 8 LIBRARIES 8.1 NEW LUXEXCEL MATERIAL CATALOG FOR 3D PRINTED OPTICS (ALL EDITIONS) A new LuxExcel material catalog has been added. The catalog contains LuxExcel s primary material for 3D printed optics: LUX-Opticlear. For more information, see LuxExcel s website that includes design guidelines here. When conveying designs for 3D printing, the STL and STP CAD formats are preferred. OpticStudio supports STL and STP export via the CAD Export tool in the File ribbon. Find it in the Material Catalog located in the Libraries ribbon. 8.2 NEW NIHON KESSHO KOGAKU MATERIAL CATALOG (ALL EDITIONS) A new material catalog from Nihon Kessho Kogaku has been added. This catalog contains CaF2 crystal materials. Find it in the Material Catalog located in the Libraries ribbon. 8.3 UPDATED SCHOTT MATERIAL CATALOG (ALL EDITIONS) An updated material catalog from Schott has been added. In particular, this catalog contains updated relative price information. Find it in the Material Catalog located in the Libraries ribbon. 8.4 UPDATED SCHOTT_IRG MATERIAL CATALOG (ALL EDITIONS) An updated material catalog from Schott has been added. In particular, this catalog contains updated thermal data for infrared glasses. Schott recommends that the older SCHOTT_IG material catalog be removed altogether.

13 Find it in the Material Catalog located in the Libraries ribbon. 8.5 UPDATED OHARA MATERIAL CATALOG (ALL EDITIONS) An updated material catalog from Ohara has been added. In particular, this catalog contains new glasses S-LAH53V and S-LAH60V. Find it in the Material Catalog located in the Libraries ribbon. 9 PROGRAMMING 9.1 ZPL OPTO-MECHANICAL SEMI-DIAMETER COMMANDS (PREMIUM & PROFESSIONAL ONLY) Multiple additions to the Zemax Programming Language relate to the new Opto-Mechanical Semi- Diameter feature. SURP Keyword: set the Chip Zone and Mechanical Semi-Diameter on any surface. CHZN(n) Numeric Function: get the Chip Zone on any surface. MCSD(n) Numeric Function: get the Mechanical Semi-Diameter on any surface. OCOD/OPEV Numeric Functions: updated to work with operands OMSD, OMMI, and OMMX. 9.2 ZOS-API OPTO-MECHANICAL SEMI-DIAMETER COMMANDS (PREMIUM & PROFESSIONAL ONLY) Multiple additions to the ZOS-API relate to the new Opto-Mechanical Semi-Diameter feature. ILDERow Properties: sets and gets Chip Zone and Mechanical Semi-Diameter on any surface. SemiDiameterMarginsForThisSurface Boolean for Aperture: toggles the Disable Semi-Diameter Margins for this Surface option in the Surface Properties dialog. 9.3 ZOS-API DETECTOR POLAR OUTPUT (PREMIUM & PROFESSIONAL ONLY) Detector polar data can be accessed via the ZOS-API using the GetPolarDetectorData method. This allows users to more easily post-process data from light collected on polar detectors. 10 USER-INTERFACE 10.1 FASTER ANALYSIS WINDOW UPDATES (ALL EDITIONS) Analysis window updates have been optimized to more quickly return UI control to the editors KEYBOARD SHORTCUTS IN TOOLTIPS (ALL EDITIONS) Keyboard shortcuts are now shown in the tooltip that is displayed when hovering over the icon of any tool or analysis. These shortcuts will update accordingly if the user defines custom keyboard shortcuts in the Project Preferences.

14 10.3 ALT KEY SHORTCUTS FOR ANALYSES (ALL EDITIONS) Analysis windows now support ALT key shortcuts. Using these shortcuts, windows can be updated, settings can be opened, and focus can switch from graph to text views. Find more details in the Shortcut Keys section of the Help System FILE SYNTAX HIGHLIGHTING (ALL EDITIONS) Syntax highlighting for POB (polygon object), ZMM (POP multimode beam), DAT (coatings), and TSC (tolerance script) files. This highlighting is available when editing these files in the built-in text editor in OpticStudio. Syntax highlighting makes file syntax more readable and reduces the likelihood of syntax errors. 11 BUG FIXES The Code V to OpticStudio Converter macro has been updated to version The new version now supports correct conversion of decentered circular apertures.

15 Ray Aiming has been improved to better account for coordinate break surfaces at the front of the optical system as a part of the iterative algorithm for determining the launch points of the rays. An issue calculating the phase slope for the Zernike Annular Phase surface which resulted in incorrect ray tracing has been corrected. The data in the Text tab of the FFT Line/Edge Spread Function now agree with the data shown in the Graph tab, and are no longer always normalized to unity. An issue with the Internal Transmission vs. Wavelength plot has been corrected for cases when a table glass is used for the input to the analysis. Updates have been made to the Test Plate Fitting algorithm to correctly account for the sign of the curvature and for the units of the lens system when replacing an optimized Radius value with a value from a test plate catalog. The SHA_ROTX and SHA_ROTZ inputs to the ZPL keyword MODIFYSETTINGS now result in rotations about the X and Z axes in the Shaded Model, respectively (the functionality was previously swapped, so that SHA_ROTX resulted in a rotation about Z and SHA_ROTZ resulted in a rotation about X). Selection of a Reference Glass has been added back to the Athermal Glass Map. Issues in which the Spot Diagram output series could be incorrectly labelled and colored have been corrected. An issue relating tor XY-plots has been corrected in which manually editing the min/max axis limits via the context menu would not rescale properly until after a calculation update.