Relevance of Carbon Dioxide Laser to Remove Scratches on Large Fused Silica Polished Optics

Size: px
Start display at page:

Download "Relevance of Carbon Dioxide Laser to Remove Scratches on Large Fused Silica Polished Optics"

Transcription

1 DOI: /adem Relevance of Carbon Dioxide Laser to Remove Scratches on Large Fused Silica Polished Optics By Philippe Cormont,* Antoine Bourgeade, Sandy Cavaro, Thierry Donval, Thomas Doualle, Gael Gaborit, Laurent Gallais, Laurent Lamaignère and Jean-Luc Rullier Scratches at the surface of fused silica optics can be detrimental for the performance of optical systems. A carbon dioxide (CO 2 ) laser is an interesting tool to remove those scratches because it can melt efficiently the silica in a rapid and localized way, without generating debris. In this article, we propose a new process for optical fabrication, which uses a CO 2 laser to remove scratches between polishing and finishing steps. This is a linear process with no iterative polishing operations for scratch removal. This process is applied on an optic representative of laser megajoule facility production. Indeed, we succeed in removing a 10 mm deep scratch and we demonstrate that this laser operation increases the laser damage threshold by a factor of three in fluence. 1. Introduction Being able to produce a defect free glass interface has always been and is still a concern for an optical manufacturer; and this for applications such as lithography, astronomy, or high power lasers. These interfacial defects are likely to trigger damage in the case of high power lasers (HPL) such as the French Megajoule Laser facility (LMJ). [1,2] LMJ will contain 22 bundles, each consisting of eight laser beams, and so there will be around 8000 large optics (40 40 cm 2 ). The beams will be focused onto micron-sized targets containing deuterium and tritium to initiate the thermonuclear fusion reaction. This huge device, like other HPLs, entails high exploitation costs principally linked with the lifetime of optical components under intense laser irradiation. This lifetime depends on several factors. [3,4] One of them is the optical quality in term of surface defects after polishing. The manufacture of these optical components includes a double challenge associated with the polishing step. The first challenge is to minimize wavefront distortion because of its main impacts on beam alignment, focal spot at target, and energy loss. [5] The second challenge is to have no surface defects on the optical components. High surface quality in terms of flatness can [*] P. Cormont, A. Bourgeade, S. Cavaro, T. Donval, G. Gaborit, L. Lamaignère, J.-L. Rullier CEA CESTA, F Le Barp, France philippe.cormont@cea.fr T. Doualle, L. Gallais Institut Fresnel, CNRS, Aix-Marseille Universite, Ecole Centrale Marseille 13013, Marseille, France be obtained by polishing for a long time, with frequent controls during it. On the other hand, the safest way to prevent surface defects is to limit polishing time and optics handling. The optics costs can be prohibitive if the proper compromise is not found between optical specification and surface defects. Surface defects after polishing are mostly scratches and pits. We essentially discuss scratches because they are the mainly visible defect and also the most problematic for LMJ application but the carbon dioxide (CO 2 ) laser process that will be presented can also be applied to various kinds of surface defects. Conventional fabrication methods attempt to take off scratches by an iterative step of polishing, but with low removal rates that require a long polishing time. Moreover, any further treatment may also spoil the quality of surface waveform and create new scratches. The Fraunhofer Institute for Laser Technology ILT has developed a laser-based process chain for manufacturing optics. [6] This process offers many advantages compared to conventional polishing specially for free form optics but it is not yet operational for large optics. We propose to adapt the method for removal of scratches on fused silica optics by using a CO 2 laser on a small area of the optics. [7] So we add a new step using CO 2 laser in a conventional optics fabrication process in order to make it more predictable and less iterative. It is intended to validate technological choices made for LMJ and to prepare for its exploitation. Section 2 develops the key principles for scratch repair and its advantages. In Section 3, we describe the dedicated tools that we use to demonstrate this new process on a silica plate representative of LMJ optical fabrication. Then, the operations DOI: /adem WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim wileyonlinelibrary.com 1

2 conducted on our demonstrative silica plate are given in Section 4. The Section 5 contains studies for our process acceptance including surface topology, calculation of beam propagation, and ultraviolet laser damage test. We present our conclusions in Section Key Principles of Our CO 2 Laser Operation for Defects Removal Localized CO 2 laser heating of silica glass has demonstrated its capacity to mitigate surface damage sites on optics used in high power laser application. [8 10] In that way, several works have been carried out to optimize the process. [11,12] As, for example, thermal analysis of the laser silica interaction under CO 2 laser irradiation has been widely investigated with both experiments [13,14] and simulations. [15,16] A schema of the general succession of steps from laser irradiation to surface cooling is represented in Figure 1. The first step is to localize the defect that will be annihilated (a). Then during laser irradiation (b), local heating increases the surface temperature (c) so that there are various transformations of the silica (d) including crack healing. Finally after treatment (e), there is usually a crater with a surrounding raised rim and a laseraffected zone. The application of two successive heatings by CO 2 laser with adapted different parameters offers the possibility to improve damage repairing sufficiently to extend the lifetime of the silica components. [17] Results of this study are resumed in Figure 2. For this experiment, each damaged site was heated by a first CO 2 laser (1 s, 0.6 mm at 1/e 2 and 5.5 W), and then a second heating (1 s, 1.4 mm at 1/e 2 and 12.5 W) was applied. Thanks to the polariscope analysis, [18] we observed unambiguously the area of major stress. In our concern, residual stress area is initially correlated with the damage including all surrounding fractures (a). After the first irradiation by CO 2 laser, which eliminated completely the damage, it forms a ring adjacent to the crater (b). The second heating reduces these stresses sufficiently to make them invisible to the polariscope but it creates a new stress area at a greater distance from the crater (c). This new zone is larger than the older one with equivalent intensity of relative retardation. Although the second heating by CO 2 laser removes debris and smoothes crater edges, the polariscope measurement shows that it also causes the initially damaged area to spread out over a much larger surface. Nevertheless, the damage test at 355 nm demonstrates that such a modification has a beneficial effect regarding UV laser irradiation (d). 3. Productions Tools The experimental set-up shown in Figure 3 has been developed to stabilize large fused silica optical components. This facility detects and localizes defects of the component, and then allows us to repair a selected surface defect with CO 2 laser. For the detection, we use a damage mapping system (DMS) that includes a transversal sample illumination and a high-resolution camera. [19] Then we record the x y coordinate for each defect. By means of an automatic x y translation, the selected defect is placed in front of the CO 2 laser beam. A long working distance microscope with a field of view of mm 2 observes this area of interest. As it can be seen in Figure 3, the microscope is equipped from the opposite site compared to the camera system. The CO 2 laser from Synrad (Firestar V20) operates at a 10.6 mm wavelength with a 20 W maximum power. The pulse length is adjustable in a large range of duration (milliseconds to several seconds). Mean power control is achieved by pulsed width modulation at a 5 khz frequency: a duty cycle of 10% corresponds to a power of 2 Wand 100% to 20 W. The laser output power can be adjusted by a half wave plate and a polarizer. The beam is focused with a ZnSe lens with a 254 mm focal length. The latter is mounted on a z-translation stage to adjust the beam diameter on the sample from 400 to 2500 mm measured at 1/e 2. Different diagnostics in the laser path measure its power, and its temporal or spatial profile. Finally, adjusting the following parameters: beam focus size, mean power, and pulse length, we can easily vary the laser energy deposition. Fig. 1. Successive steps of the defects mitigation method WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim DOI: /adem

3 Figure 4. The first step is to select the defect that will be reappeared in the DMS image of the optical component. In that way, we delimit a rectangular area including the whole parts of the scratch even if not contiguous (a). Then, the selected image is binarized and the noise eliminated to isolate the different constituent of the scratch (b) and (c). The presence of slick steps is frequent. From all these fragments, the defect is outlined (d), and its skeleton is calculated (e). Finally, laser positions are generated on this latter following the distance between two successive irradiations defined by the operator (f). We note that this work configuration including the image processing is well suited to work on large optics such as LMJ optics but they can also be easily adapted to other optics and applications. Fig. 2. Polariscope images for a typical damage site (a), its transformation after the first heating by CO 2 laser (b) and the impact of the second heating on the previous crater (c). The laser damage probability as a function of the fluence of irradiation at 355 nm is given for the three configurations (d). To stabilize a defect longer than 100 mm, we need to heat it with numerous x y positions. Thus, it is useful to computerize the procedure for complete automation. The objective is to determine each shot position for running automatically the laser and for moving the sample. Then, the operator has only to select the defect to mitigate and the CO 2 laser parameters. The different steps for image processing in the case of scratches on an optical component are summarized in Fig. 3. Defect observation and laser operation setups. 4. Fabrication Process In this study, we are interested in improving an optics manufacture by introducing the CO 2 laser heating after the step of polishing, and before the finishing step. To address this issue, we investigate the scratches removal by CO 2 laser on a large optic. The fused silica sample used is glass 7980 from Corning (NY, USA) polished by THALES-SESO ( The sample is 15 mm thick with a surface of mm 2 that corresponds to the half-scale of LMJ components. As displayed by observations with the DMS in Figure 5a, a scratch of about 50 mm large and 10 cm long was formed at one corner of the optic after polishing. We split this later in three zones to evaluate the surface modification during our repair using successively two laser heatings, as shown in Figure 5. The zone 1 has not been irradiated by CO 2 laser in order to remain a reference of the initial scratch. We know from previous works [7] that adjusting subtly the parameters of the CO 2 laser can heal cracks. A first heating has been done on zones 2 and 3 and then a second heating only on zone 3. Zone 2 in Figure 5b indicates that the scratch is well reduced but is still visible. Therefore, the second heating is useful not only to improve laser damage resistance [7] but also to remove the whole defect in view of the DMS characterization. In fact, this second heating was realized with a run of 20 shots before moving the optical component to the next position along the scratch. Compared to the shots of the first heating, shots for the second heating have the same pulse duration but a wider beam and a higher power to partially DOI: /adem WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim 3

4 Fig. 4. Image processing in order to extract medial axis of scratches and to get the positions of the CO 2 laser shots. The treatment progress is illustrated by following each images from (a) to (f). compensate this beam widening. After laser operation, we have finished the fabrication process with slightly polishing the optical component, resulting in the DMS image of Figure 5c. During this final step of polishing, that we call finishing, the uniform removal was 3.3 mm. 5. Results of Studies for Our Process Acceptance 5.1. Topography Surface deformations of our fused silica sample were characterized using a 3D optical profiler. This microscope from ZYGO (New View 7300) is based on coherence correlation interferometry. An objective with a magnification of 10 and a numerical aperture of 0.4 was used, which permits us to attain a measurement area of mm 2 with an optical resolution of 1.1 mm in x y. Step height standards provided by the manufacturer were used to calibrate the instrument. The manufacturer specifies the vertical resolution as about 1 nm. From our measurements, we obtain a 3D-map corresponding to the surface level in the irradiated area. Figure 6 shows the impact of two successive heatings along a scratch mitigated with different procedures. For the three zones detailed in the preceding part, 3D-map before (upper row) and after (middle row) the final polishing are shown, followed by comparison of their profiles (lower row). The color scales of these six images were automatically adjusted with minimum and maximum values and so are different for each picture. The form of the cracks visible in zone 1, independently of the finishing, indicates that this is a typical trailing indent scratch if we refer to the categorization made by Suratwala et al. [20] After the first heating by CO 2 laser (zone 2), we distinguish a central region with significant matter removal [21] and a surrounding area where silica has been distorted by viscous flow, [13] densification, [22] or tensile surface forces. [23] Then, we see obviously that even after the second heating (zone 3), the imprint of the initial scratch is still present although it was indiscernible with DMS characterization as mentioned in paragraph 4. Nevertheless, comparing profile of zones 1 and 2, there is a moderate enhancement of the initial Fig. 5. DMS images of a component after each final step of fabrication: (a) polishing, (b) CO 2 laser irradiation, (c) finishing. Zones 1 3 correspond to different CO 2 laser operations during the step (b) WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim DOI: /adem

5 P. Cormont et al./relevance of Carbon Dioxide Laser to Remove Scratches Fig. 6. The two first rows of images obtained by ZYGO New view 7300 are 3D-maps before and after the surface finishing, and the lower compares their profiles related with the dashed lines, respectively, dark and blue. The first column (zone 1) is the characterization of a part of the initial scratch, the second (zone 2) is the transformation of the other scratch area after the first heating by CO2 laser, and the third (zone 3) shows the impact of the second heating on a section equivalent to the previous zone. It is important to notice the scale difference between the different zones. scratch depth (less than a factor two) due mainly to matter ejection during the first heating. Then comparing profile of zones 2 and 3, the scratch depth is reduced by a factor five thanks to the second heating. We mention that after the polishing removal of 3.3 mm, the two blue profiles for zones 1 and 2, which we have shifted by 3.3 mm, are in good agreement with the depth before the finishing step. In zone 3, the blue curve has also been positioned 3.3 mm lower than the black one to take into account the polishing removal. Surprisingly, the expected eradication of the 2 mm deep trench is not total. The shallow residual trench after polishing can be caused by the neighboring silica affected by the laser. In the laser-affected zone, the temperature reached during the second heating is higher than the annealing point (1315 K for Corning 7980 fused silica). The width of this zone is approximately equal to the beam diameter at 1/e2 and is much deeper than 50 mm.[7] 5.2. Beam Propagation Defects on optical components have an impact on beam characteristics in the neighborhood of the defects and at longer distances due to downstream propagation mechanisms.[2] This problem is even more critical for final optics of LMJ beam baseline,[2] which are, respectively, the 3v focusing DOI: /adem grating and the vacuum window. The defects on LMJ 3v focusing grating may trigger damage on vacuum window. This section presents the numerical approach we carry out to evaluate the effect of fused silica surface defects on the laser beam propagation. Here, we consider the previously investigated scratch. A transverse profile of the scratch, that is sufficiently long to be supposed infinite, has been introduced into a code solving the plane 1D-transverse propagation þ where A is the laser beam envelope, k0 is the wave number at the used wave frequency, z is the abscissa on the propagation axis, and x is the coordinate in the transverse direction. Such profile impact corresponds to a phase perturbation that is a simple way to introduce a defect into the laser beam propagation modeling. Then, we calculate the evolution of the maximum of the ratio between the laser beam intensity at a distance z and the initial intensity at z ¼ 0 (noted CMAX). We realized this simulation for the two different profiles of the zone 3 of the Figure 6, i.e., after the complete cracks repair before and after the finishing process. For a 3v planar wave, 2014 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim 5

6 the evolution of C MAX as a function of the propagation from the 3v grating to the vacuum window is shown in Figure 7. Without optic finishing, the profile is corrugated and then induces a very rapid increase of the laser beam intensity, C MAX ¼ 5.7 at z 1 mm. During the propagation this oscillating value decreases, but is still around 2.5 at the vacuum window. By opposition, the smoother profile after finishing is linked with a low increase that reaches 60% after 0.65 m of propagation (C MAX ¼ 1.6). This is 2.5 less than before finishing. It is noticeable that improving the finishing process, using RMS technical as, for example, could enhance such an effect UV-Laser Damage Tests Laser damage resistance tests were performed with a tabletop laser, whose main characteristics are comparable with the LMJ laser beam. The laser used is a Nd:YAG, which delivers an equivalent pulse length of 2.5 ns at 355 nm with a 10 Hz repetition rate. The laser beam is focused by a 5 m focal length to get a Gaussian spatial profile with a diameter of 0.9 mm at 1/e 2. Damages are detected in situ with a mobile visual inspection system. In order to scan the whole area, the sample to be tested is translated continuously along a first direction and stepped along a second direction. Repeating this test at several fluences on different zones allows us to determine the number of damage sites versus fluence, thus the damage density. More details of this method of characterization are furnished elsewhere. [24] We have applied this method on our demonstration component presented in Section 4. The whole surface was tested except the three zones. We have measured a density of damage equal to 0.2 damage sites per cm 2 at 14 J cm 2. This result is in good agreement with results obtained on similar optics without visible defects. In parallel, we have tested zone 1 in mode 1-on-1, which consists in having one laser shot for one position on the optical surface. At fluence of 5 J cm 2, 50% of the site irradiated showed damage growth, and at 6 J cm 2 the totality of sites (100%). These results on scratches confirm usual threshold for damage growth. We have also tested zone 3 in mode 1-on-1 at higher fluences in order to evaluate our repair process. The results of these UV-laser damage tests are presented in Figure 8. We can notice that after our repair process, the laser resistance is even better than in Figure 2. The main difference between the process tested on Figure 2 and the one tested on Figure 8 is the slight polishing after laser process. So we assume that the finishing after laser process is an explanation of this excellent result. These results validate the relevance of this new process for LMJ optics fabrication because the maximum fluence expected on LMJ is 14 J cm 2,as indicated by the dashed line in Figure Summary and Conclusion We have presented a new fabrication process for manufacturing optics. In this fabrication process, the conventional polishing loop for scratch removal has been replaced by aco 2 laser operation including two main steps. The first step uses a smaller beam and a higher power density than the second step. The first step replaces scratch fractures by a smooth trench and the second step improves UV laser resistance and fills in the trench so that the surface is smooth enough to avoid beam propagation problems. To validate our process, we have applied our method to an optical component of large dimensions. This 20 cm 20 cm window was polished with conventional tooling in order to obtain specified flatness. After polishing, a several millimeters long scratch was visible on the surface. This 10 mm deep scratch was then removed by CO 2 laser operation. Finally, a conventional finishing step was done in order to obtain the low roughness necessary for LMJ optics. We have observed that a shallow residual trench has replaced the scratch and we have evaluated the impact on beam propagation. The most important result is that the laser resistance of the window has been greatly improved. The laser damage threshold measured Fig. 7. Evolution of C MAX as a function of the distance of propagation; z ¼ 0 corresponds to the 3v grating and z ¼ 0.65 m to the vacuum window. The black curve is the evolution of C MAX for the black profile of the zone 3 in Figure 6, the blue curve named after finishing corresponds to the calculation for the blue profile in Figure 6 zone 3. The difference between the two curves is due to the polishing after laser process. Fig. 8. Laser damage probability as a function of the fluence of irradiation at 355 nm before and after repairing the scratch. The green dashed line indicates the LMJ maximum fluence WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim DOI: /adem

7 at 355 nm with a 3 ns pulse duration has been increased from 5to15Jcm 2, which is higher than the maximum fluence on LMJ. In this study, we have demonstrated that CO 2 laser is an appropriate tool to remove scratches on fused silica optics because it is rapid, localized to the scratch, and it creates no debris. Nonetheless, we are still looking for finishing techniques to reduce the impact on beam propagation after the laser process. Received: August 15, 2014 Final Version: September 23, 2014 [1] J. Ebrardt, J. M. Chaput, J. Phys.: Conf. Ser. 2010, 244, [2] S. Mainguy, B. Le Garrec, M. Josse, Proc. SPIE 2005, 5991, [3] N. Bloembergen, Appl. Opt. 1973, 12, 661. [4] H. Bercegol, P. Bouchut, L. Lamaignère, B. Le Garrec, G. Raze, Proc. SPIE 2004, 5273, 302. [5] S. Mainguy, Proc. SPIE 2013, 8602, 86020G. [6] S. Heidrich, A. Richmann, P. Schmitz, E. Willenborg, K. Wissenbach, P. Loosen, R. Poprawe, Opt. Lasers Eng. 2014, 59, 34. [7] P. Cormont, P. Combis, L. Gallais, C. Hecquet, L. Lamaignere, J. L. Rullier, Opt. Express 2013, 21, [8] E. Mendez, K. M. Nowak, H. J. Baker, F. J. Villarreal, D. R. Hall, Appl. Opt. 2006, 45, [9] S. Palmier, L. Gallais, M. Commandre, P. Cormont, R. Courchinoux, L. Lamaignère, J.-L. Rullier, P. Legros, Appl. Surf. Sci. 2009, 255, [10] I. L. Bass, G. M. Guss, M. J. Nostrand, P. J. Wegner, Proc. SPIE 2010, 7842, [11] S. T. Yang, M. J. Matthews, S. Elhadj, D. Cooke, G. M. Guss, V. G. Draggoo, P. J. Wegner, Appl. Opt. 2010, 49, [12] W. Dai, X. Xiang, Y. Jiang, H. J. Wang, X. B. Li, X. D. Yuan, W. G. Zheng, H. B. Lv, X. T. Zu, Opt. Lasers Eng. 2011, 49, 273. [13] L. Robin, P. Combis, P. Cormont, L. Gallais, D. Hebert, C. Mainfray, J.-L. Rullier, J. Appl. Phys. 2012, 111, [14] S. T. Yang, M. J. Matthews, S. Elhadj, V. G. Draggoo, S. E. Bisson, J. Appl. Phys. 2009, 106, [15] P. Combis, P. Cormont, L. Gallais, D. Hebert, L. Robin, J.- L. Rullier, Appl. Phys. Lett. 2012, 101, 21. [16] R. M. Vignes, T. F. Soules, J. S. Stolken, R. R. Settgast, S. Elhadj, M. J. Matthews, J. Am. Ceram. Soc. 2013, 96, 137. [17] P. Cormont, L. Gallais, L. Lamaignere, J. L. Rullier, P. Combis, D. Hebert, Opt. Express 2010, 18, [18] L. Gallais, P. Cormont, J.-L. Rullier, Opt. Express 2009, 17, [19] R. Prasad, M. Bernacil, J. Halpin, J. Peterson, S. Mills, R Hackel. Proc. SPIE 2004, 5647, 421. [20] T. Suratwala, R. Steele, M. D. Feit, L. Wong, P. Miller, J. Menapace, P. Davis, J. Non-Crystal. Solids 2008, 354. [21] M. D. Feit, A. M. Rubenchick, Proc. SPIE 2002, 4932, 91. [22] M. D. Feit, M. J. Matthews, T. F. Soules, J. S. Stolken, R. M. Vignes, S. T. Yang, J. D. Cooke, Proc. SPIE 2010, 7842, 78420O. [23] T. R. Anthony, H. E. Cline, J. Appl. Phys. 1977, 48, [24] L. Lamaignère, G. Dupuy, T. Donval, P. Grua, H. Bercegol, Appl. Opt. 2011, 50, 441. DOI: /adem WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim 7

Luminescence study of defects in silica glasses under near-uv excitation.

Luminescence study of defects in silica glasses under near-uv excitation. Available online at www.sciencedirect.com Physics Procedia 00 (2010) 000 000 Physics Procedia 8 (2010) 39 43 www.elsevier.com/locate/procedia VI Encuentro Franco-Español de Química y Física del Estado

More information

Mitigation of Laser Damage Growth in Fused Silica with a Galvanometer Scanned CO2 Laser

Mitigation of Laser Damage Growth in Fused Silica with a Galvanometer Scanned CO2 Laser UCRL-PROC-216737 Mitigation of Laser Damage Growth in Fused Silica with a Galvanometer Scanned CO2 Laser I. L. Bass, G. M. Guss, R. P. Hackel November 1, 2005 Boulder Damage Symposium XXXVII Boulder, CO,

More information

Laser polishing and laser shape correction of optical glass

Laser polishing and laser shape correction of optical glass Laser polishing and laser shape correction of optical glass Christian Weingarten, Andreas Schmickler, Edgar Willenborg, Konrad Wissenbach, and Reinhart Poprawe Citation: Journal of Laser Applications 29,

More information

Enhanced optical damage resistance of fused silica surfaces using UV laser conditioning and CO2 laser treatment

Enhanced optical damage resistance of fused silica surfaces using UV laser conditioning and CO2 laser treatment Enhanced optical damage resistance of fused silica surfaces using UV laser conditioning and CO2 laser treatment Laurent Lamaignère1, Hervé Bercegol', P. Bouchut2, Annelise During1, Jérôme Néauport',Hervé

More information

An Improved Method of Mitigating Laser Induced Surface Damage Growth in Fused Silica Using a Rastered, Pulsed CO2 Laser

An Improved Method of Mitigating Laser Induced Surface Damage Growth in Fused Silica Using a Rastered, Pulsed CO2 Laser LLNL-PROC-462135 An Improved Method of Mitigating Laser Induced Surface Damage Growth in Fused Silica Using a Rastered, Pulsed CO2 Laser I. L. Bass, G. M. Guss, M. J. Nostrand, P. L. Wegner November 15,

More information

Effects of spherical aberrations on micro welding of glass using ultra short laser pulses

Effects of spherical aberrations on micro welding of glass using ultra short laser pulses Available online at www.sciencedirect.com Physics Procedia 39 (2012 ) 563 568 LANE 2012 Effects of spherical aberrations on micro welding of glass using ultra short laser pulses Kristian Cvecek a,b,, Isamu

More information

Radial Polarization Converter With LC Driver USER MANUAL

Radial Polarization Converter With LC Driver USER MANUAL ARCoptix Radial Polarization Converter With LC Driver USER MANUAL Arcoptix S.A Ch. Trois-portes 18 2000 Neuchâtel Switzerland Mail: info@arcoptix.com Tel: ++41 32 731 04 66 Principle of the radial polarization

More information

CHAPTER 7. Waveguide writing in optimal conditions. 7.1 Introduction

CHAPTER 7. Waveguide writing in optimal conditions. 7.1 Introduction CHAPTER 7 7.1 Introduction In this chapter, we want to emphasize the technological interest of controlled laser-processing in dielectric materials. Since the first report of femtosecond laser induced refractive

More information

Far field intensity distributions of an OMEGA laser beam were measured with

Far field intensity distributions of an OMEGA laser beam were measured with Experimental Investigation of the Far Field on OMEGA with an Annular Apertured Near Field Uyen Tran Advisor: Sean P. Regan Laboratory for Laser Energetics Summer High School Research Program 200 1 Abstract

More information

UV EXCIMER LASER BEAM HOMOGENIZATION FOR MICROMACHINING APPLICATIONS

UV EXCIMER LASER BEAM HOMOGENIZATION FOR MICROMACHINING APPLICATIONS Optics and Photonics Letters Vol. 4, No. 2 (2011) 75 81 c World Scientific Publishing Company DOI: 10.1142/S1793528811000226 UV EXCIMER LASER BEAM HOMOGENIZATION FOR MICROMACHINING APPLICATIONS ANDREW

More information

Title: Laser marking with graded contrast micro crack inside transparent material using UV ns pulse

Title: Laser marking with graded contrast micro crack inside transparent material using UV ns pulse Cover Page Title: Laser marking with graded contrast micro crack inside transparent material using UV ns pulse laser Authors: Futoshi MATSUI*(1,2), Masaaki ASHIHARA(1), Mitsuyasu MATSUO (1), Sakae KAWATO(2),

More information

Practical Guide to Specifying Optical Components

Practical Guide to Specifying Optical Components Practical Guide to Specifying Optical Components OPTI 521 Introduction to Opto-Mechanical Engineering Fall 2012 December 10, 2012 Brian Parris Introduction This paper is intended to serve as a practical

More information

Improving efficiency of CO 2

Improving efficiency of CO 2 Improving efficiency of CO 2 Laser System for LPP Sn EUV Source K.Nowak*, T.Suganuma*, T.Yokotsuka*, K.Fujitaka*, M.Moriya*, T.Ohta*, A.Kurosu*, A.Sumitani** and J.Fujimoto*** * KOMATSU ** KOMATSU/EUVA

More information

Ultra-stable flashlamp-pumped laser *

Ultra-stable flashlamp-pumped laser * SLAC-PUB-10290 September 2002 Ultra-stable flashlamp-pumped laser * A. Brachmann, J. Clendenin, T.Galetto, T. Maruyama, J.Sodja, J. Turner, M. Woods Stanford Linear Accelerator Center, 2575 Sand Hill Rd.,

More information

Laser Beam Analysis Using Image Processing

Laser Beam Analysis Using Image Processing Journal of Computer Science 2 (): 09-3, 2006 ISSN 549-3636 Science Publications, 2006 Laser Beam Analysis Using Image Processing Yas A. Alsultanny Computer Science Department, Amman Arab University for

More information

Application Note (A11)

Application Note (A11) Application Note (A11) Slit and Aperture Selection in Spectroradiometry REVISION: C August 2013 Gooch & Housego 4632 36 th Street, Orlando, FL 32811 Tel: 1 407 422 3171 Fax: 1 407 648 5412 Email: sales@goochandhousego.com

More information

Improvement of terahertz imaging with a dynamic subtraction technique

Improvement of terahertz imaging with a dynamic subtraction technique Improvement of terahertz imaging with a dynamic subtraction technique Zhiping Jiang, X. G. Xu, and X.-C. Zhang By use of dynamic subtraction it is feasible to adopt phase-sensitive detection with a CCD

More information

Near-field optical photomask repair with a femtosecond laser

Near-field optical photomask repair with a femtosecond laser Journal of Microscopy, Vol. 194, Pt 2/3, May/June 1999, pp. 537 541. Received 6 December 1998; accepted 9 February 1999 Near-field optical photomask repair with a femtosecond laser K. LIEBERMAN, Y. SHANI,

More information

Adaptive optics for laser-based manufacturing processes

Adaptive optics for laser-based manufacturing processes Adaptive optics for laser-based manufacturing processes Rainer Beck 1, Jon Parry 1, Rhys Carrington 1,William MacPherson 1, Andrew Waddie 1, Derryck Reid 1, Nick Weston 2, Jon Shephard 1, Duncan Hand 1

More information

Precise hardening with high power diode lasers using beam shaping mirror optics

Precise hardening with high power diode lasers using beam shaping mirror optics Precise hardening with high power diode lasers using beam shaping mirror optics Steffen Bonss, Marko Seifert, Berndt Brenner, Eckhard Beyer Fraunhofer IWS, Winterbergstrasse 28, D-01277 Dresden, Germany

More information

Gerhard K. Ackermann and Jurgen Eichler. Holography. A Practical Approach BICENTENNIAL. WILEY-VCH Verlag GmbH & Co. KGaA

Gerhard K. Ackermann and Jurgen Eichler. Holography. A Practical Approach BICENTENNIAL. WILEY-VCH Verlag GmbH & Co. KGaA Gerhard K. Ackermann and Jurgen Eichler Holography A Practical Approach BICENTENNIAL BICENTENNIAL WILEY-VCH Verlag GmbH & Co. KGaA Contents Preface XVII Part 1 Fundamentals of Holography 1 1 Introduction

More information

End Capped High Power Assemblies

End Capped High Power Assemblies Fiberguide s end capped fiber optic assemblies allow the user to achieve higher coupled power into a fiber core by reducing the power density at the air/ silica interface, commonly the point of laser damage.

More information

Beam Shaping in High-Power Laser Systems with Using Refractive Beam Shapers

Beam Shaping in High-Power Laser Systems with Using Refractive Beam Shapers - 1 - Beam Shaping in High-Power Laser Systems with Using Refractive Beam Shapers Alexander Laskin, Vadim Laskin AdlOptica GmbH, Rudower Chaussee 29, 12489 Berlin, Germany ABSTRACT Beam Shaping of the

More information

The Laser Processing of Diamond and Sapphire

The Laser Processing of Diamond and Sapphire The Laser Processing of Diamond and Sapphire Neil Sykes Micronanics Limited neil@micronanics.com Diamond Diamond has the highest hardness and thermal conductivity of any bulk material 10/10 on the Mohs

More information

MASSACHUSETTS INSTITUTE OF TECHNOLOGY Department of Electrical Engineering and Computer Science

MASSACHUSETTS INSTITUTE OF TECHNOLOGY Department of Electrical Engineering and Computer Science Student Name Date MASSACHUSETTS INSTITUTE OF TECHNOLOGY Department of Electrical Engineering and Computer Science 6.161 Modern Optics Project Laboratory Laboratory Exercise No. 3 Fall 2005 Diffraction

More information

SUPPLEMENTARY INFORMATION

SUPPLEMENTARY INFORMATION Optically reconfigurable metasurfaces and photonic devices based on phase change materials S1: Schematic diagram of the experimental setup. A Ti-Sapphire femtosecond laser (Coherent Chameleon Vision S)

More information

Integrated Focusing Photoresist Microlenses on AlGaAs Top-Emitting VCSELs

Integrated Focusing Photoresist Microlenses on AlGaAs Top-Emitting VCSELs Integrated Focusing Photoresist Microlenses on AlGaAs Top-Emitting VCSELs Andrea Kroner We present 85 nm wavelength top-emitting vertical-cavity surface-emitting lasers (VCSELs) with integrated photoresist

More information

High Resolution Microlithography Applications of Deep-UV Excimer Lasers

High Resolution Microlithography Applications of Deep-UV Excimer Lasers Invited Paper High Resolution Microlithography Applications of Deep-UV Excimer Lasers F.K. Tittel1, M. Erdélyi2, G. Szabó2, Zs. Bor2, J. Cavallaro1, and M.C. Smayling3 1Department of Electrical and Computer

More information

Features. Applications. Optional Features

Features. Applications. Optional Features Features Compact, Rugged Design TEM Beam with M 2 < 1.2 Pulse Rates from Single Shot to 15 khz IR, Green, UV, and Deep UV Wavelengths Available RS232 Computer Control Patented Harmonic Generation Technology

More information

Heriot-Watt University

Heriot-Watt University Heriot-Watt University Heriot-Watt University Research Gateway Shaping the surface of optical glasses with picosecond laser and adaptive optics Wlodarczyk, Krystian Lukasz; Albri, Frank; Beck, Rainer J.;

More information

Use of Computer Generated Holograms for Testing Aspheric Optics

Use of Computer Generated Holograms for Testing Aspheric Optics Use of Computer Generated Holograms for Testing Aspheric Optics James H. Burge and James C. Wyant Optical Sciences Center, University of Arizona, Tucson, AZ 85721 http://www.optics.arizona.edu/jcwyant,

More information

SURFACE ANALYSIS STUDY OF LASER MARKING OF ALUMINUM

SURFACE ANALYSIS STUDY OF LASER MARKING OF ALUMINUM SURFACE ANALYSIS STUDY OF LASER MARKING OF ALUMINUM Julie Maltais 1, Vincent Brochu 1, Clément Frayssinous 2, Réal Vallée 3, Xavier Godmaire 4 and Alex Fraser 5 1. Summer intern 4. President 5. Chief technology

More information

101 W of average green beam from diode-side-pumped Nd:YAG/LBO-based system in a relay imaged cavity

101 W of average green beam from diode-side-pumped Nd:YAG/LBO-based system in a relay imaged cavity PRAMANA c Indian Academy of Sciences Vol. 75, No. 5 journal of November 2010 physics pp. 935 940 101 W of average green beam from diode-side-pumped Nd:YAG/LBO-based system in a relay imaged cavity S K

More information

2. Pulsed Acoustic Microscopy and Picosecond Ultrasonics

2. Pulsed Acoustic Microscopy and Picosecond Ultrasonics 1st International Symposium on Laser Ultrasonics: Science, Technology and Applications July 16-18 2008, Montreal, Canada Picosecond Ultrasonic Microscopy of Semiconductor Nanostructures Thomas J GRIMSLEY

More information

Experiment 1: Fraunhofer Diffraction of Light by a Single Slit

Experiment 1: Fraunhofer Diffraction of Light by a Single Slit Experiment 1: Fraunhofer Diffraction of Light by a Single Slit Purpose 1. To understand the theory of Fraunhofer diffraction of light at a single slit and at a circular aperture; 2. To learn how to measure

More information

Conditions for the dynamic control of the focusing properties of the high power cw CO 2 laser beam in a system with an adaptive mirror

Conditions for the dynamic control of the focusing properties of the high power cw CO 2 laser beam in a system with an adaptive mirror Conditions for the dynamic control of the focusing properties of the high power cw CO 2 laser beam in a system with an adaptive mirror G. Rabczuk 1, M. Sawczak Institute of Fluid Flow Machinery, Polish

More information

Laser direct writing of volume modified Fresnel zone plates

Laser direct writing of volume modified Fresnel zone plates 2090 J. Opt. Soc. Am. B/ Vol. 24, No. 9/ September 2007 Srisungsitthisunti et al. Laser direct writing of volume modified Fresnel zone plates Pornsak Srisungsitthisunti, 1 Okan K. Ersoy, 2 and Xianfan

More information

Focusing X-ray beams below 50 nm using bent multilayers. O. Hignette Optics group. European Synchrotron Radiation Facility (FRANCE) Outline

Focusing X-ray beams below 50 nm using bent multilayers. O. Hignette Optics group. European Synchrotron Radiation Facility (FRANCE) Outline Focusing X-ray beams below 50 nm using bent multilayers O. Hignette Optics group European Synchrotron Radiation Facility (FRANCE) Outline Graded multilayers resolution limits 40 nanometers focusing Fabrication

More information

Improving the output beam quality of multimode laser resonators

Improving the output beam quality of multimode laser resonators Improving the output beam quality of multimode laser resonators Amiel A. Ishaaya, Vardit Eckhouse, Liran Shimshi, Nir Davidson and Asher A. Friesem Department of Physics of Complex Systems, Weizmann Institute

More information

Application Note #548 AcuityXR Technology Significantly Enhances Lateral Resolution of White-Light Optical Profilers

Application Note #548 AcuityXR Technology Significantly Enhances Lateral Resolution of White-Light Optical Profilers Application Note #548 AcuityXR Technology Significantly Enhances Lateral Resolution of White-Light Optical Profilers ContourGT with AcuityXR TM capability White light interferometry is firmly established

More information

ARCoptix. Radial Polarization Converter. Arcoptix S.A Ch. Trois-portes Neuchâtel Switzerland Mail: Tel:

ARCoptix. Radial Polarization Converter. Arcoptix S.A Ch. Trois-portes Neuchâtel Switzerland Mail: Tel: ARCoptix Radial Polarization Converter Arcoptix S.A Ch. Trois-portes 18 2000 Neuchâtel Switzerland Mail: info@arcoptix.com Tel: ++41 32 731 04 66 Radially and azimuthally polarized beams generated by Liquid

More information

FRAUNHOFER AND FRESNEL DIFFRACTION IN ONE DIMENSION

FRAUNHOFER AND FRESNEL DIFFRACTION IN ONE DIMENSION FRAUNHOFER AND FRESNEL DIFFRACTION IN ONE DIMENSION Revised November 15, 2017 INTRODUCTION The simplest and most commonly described examples of diffraction and interference from two-dimensional apertures

More information

High power VCSEL array pumped Q-switched Nd:YAG lasers

High power VCSEL array pumped Q-switched Nd:YAG lasers High power array pumped Q-switched Nd:YAG lasers Yihan Xiong, Robert Van Leeuwen, Laurence S. Watkins, Jean-Francois Seurin, Guoyang Xu, Alexander Miglo, Qing Wang, and Chuni Ghosh Princeton Optronics,

More information

Diamond X-ray Rocking Curve and Topograph Measurements at CHESS

Diamond X-ray Rocking Curve and Topograph Measurements at CHESS Diamond X-ray Rocking Curve and Topograph Measurements at CHESS G. Yang 1, R.T. Jones 2, F. Klein 3 1 Department of Physics and Astronomy, University of Glasgow, Glasgow, UK G12 8QQ. 2 University of Connecticut

More information

KNIFE-EDGE RIGHT-ANGLE PRISM MIRRORS

KNIFE-EDGE RIGHT-ANGLE PRISM MIRRORS KNIFE-EDGE RIGHT-ANGLE PRISM MIRRORS Precision Cut Prisms Feature Bevel-Free 90 Angle Dielectric, Silver, Gold, and Aluminum Coatings Available 25 mm x 25 mm Faces Application Idea MRAK25-M01 Mounted on

More information

How to Avoid Thermal Sensor Damage & Out of Tolerance Conditions

How to Avoid Thermal Sensor Damage & Out of Tolerance Conditions About Ophir-Spiricon With over 30 years of experience, the Ophir Photonics Group provides a complete line of instrumentation including power and energy meters, beam profilers, spectrum analyzers, and goniometric

More information

Analysis and optimization on single-zone binary flat-top beam shaper

Analysis and optimization on single-zone binary flat-top beam shaper Analysis and optimization on single-zone binary flat-top beam shaper Jame J. Yang New Span Opto-Technology Incorporated Miami, Florida Michael R. Wang, MEMBER SPIE University of Miami Department of Electrical

More information

Faraday Rotators and Isolators

Faraday Rotators and Isolators Faraday Rotators and I. Introduction The negative effects of optical feedback on laser oscillators and laser diodes have long been known. Problems include frequency instability, relaxation oscillations,

More information

A System for Measuring Defect Induced Beam Modulation on Inertial Confinement Fusion-class Laser Optics

A System for Measuring Defect Induced Beam Modulation on Inertial Confinement Fusion-class Laser Optics UCRL-CONF-216523 A System for Measuring Defect Induced Beam Modulation on Inertial Confinement Fusion-class Laser Optics M. Runkel, R. Hawley-Fedder, C. Widmayer, W. Williams, C. Weinzapfel, D. Roberts

More information

Major Fabrication Steps in MOS Process Flow

Major Fabrication Steps in MOS Process Flow Major Fabrication Steps in MOS Process Flow UV light Mask oxygen Silicon dioxide photoresist exposed photoresist oxide Silicon substrate Oxidation (Field oxide) Photoresist Coating Mask-Wafer Alignment

More information

Characteristics of point-focus Simultaneous Spatial and temporal Focusing (SSTF) as a two-photon excited fluorescence microscopy

Characteristics of point-focus Simultaneous Spatial and temporal Focusing (SSTF) as a two-photon excited fluorescence microscopy Characteristics of point-focus Simultaneous Spatial and temporal Focusing (SSTF) as a two-photon excited fluorescence microscopy Qiyuan Song (M2) and Aoi Nakamura (B4) Abstracts: We theoretically and experimentally

More information

Hamidreza Karbasi, P. Eng., PhD Conestoga College ITAL Oct. 7, 2010

Hamidreza Karbasi, P. Eng., PhD Conestoga College ITAL Oct. 7, 2010 Presented at the COMSOL Conference 2010 Boston Presented by: Hamidreza Karbasi, P. Eng., PhD Conestoga College ITAL Oct. 7, 2010 Creating and Building Sustainable Environments Outline Background Objectives

More information

Will contain image distance after raytrace Will contain image height after raytrace

Will contain image distance after raytrace Will contain image height after raytrace Name: LASR 51 Final Exam May 29, 2002 Answer all questions. Module numbers are for guidance, some material is from class handouts. Exam ends at 8:20 pm. Ynu Raytracing The first questions refer to the

More information

COTTON FIBER QUALITY MEASUREMENT USING FRAUNHOFER DIFFRACTION

COTTON FIBER QUALITY MEASUREMENT USING FRAUNHOFER DIFFRACTION COTTON FIBER QUALITY MEASUREMENT USING FRAUNHOFER DIFFRACTION Ayodeji Adedoyin, Changying Li Department of Biological and Agricultural Engineering, University of Georgia, Tifton, GA Abstract Properties

More information

Bandpass Edge Dichroic Notch & More

Bandpass Edge Dichroic Notch & More Edmund Optics BROCHURE Filters COPYRIGHT 217 EDMUND OPTICS, INC. ALL RIGHTS RESERVED 1/17 Bandpass Edge Dichroic Notch & More Contact us for a Stock or Custom Quote Today! USA: +1-856-547-3488 EUROPE:

More information

Evaluation of Scientific Solutions Liquid Crystal Fabry-Perot Etalon

Evaluation of Scientific Solutions Liquid Crystal Fabry-Perot Etalon Evaluation of Scientific Solutions Liquid Crystal Fabry-Perot Etalon Testing of the etalon was done using a frequency stabilized He-Ne laser. The beam from the laser was passed through a spatial filter

More information

AgilOptics mirrors increase coupling efficiency into a 4 µm diameter fiber by 750%.

AgilOptics mirrors increase coupling efficiency into a 4 µm diameter fiber by 750%. Application Note AN004: Fiber Coupling Improvement Introduction AgilOptics mirrors increase coupling efficiency into a 4 µm diameter fiber by 750%. Industrial lasers used for cutting, welding, drilling,

More information

LOS 1 LASER OPTICS SET

LOS 1 LASER OPTICS SET LOS 1 LASER OPTICS SET Contents 1 Introduction 3 2 Light interference 5 2.1 Light interference on a thin glass plate 6 2.2 Michelson s interferometer 7 3 Light diffraction 13 3.1 Light diffraction on a

More information

The End of Thresholds: Subwavelength Optical Linewidth Measurement Using the Flux-Area Technique

The End of Thresholds: Subwavelength Optical Linewidth Measurement Using the Flux-Area Technique The End of Thresholds: Subwavelength Optical Linewidth Measurement Using the Flux-Area Technique Peter Fiekowsky Automated Visual Inspection, Los Altos, California ABSTRACT The patented Flux-Area technique

More information

Laser Induced Damage Threshold of Optical Coatings

Laser Induced Damage Threshold of Optical Coatings White Paper Laser Induced Damage Threshold of Optical Coatings An IDEX Optics & Photonics White Paper Ronian Siew, PhD Craig Hanson Turan Erdogan, PhD INTRODUCTION Optical components are used in many applications

More information

BEAM HALO OBSERVATION BY CORONAGRAPH

BEAM HALO OBSERVATION BY CORONAGRAPH BEAM HALO OBSERVATION BY CORONAGRAPH T. Mitsuhashi, KEK, TSUKUBA, Japan Abstract We have developed a coronagraph for the observation of the beam halo surrounding a beam. An opaque disk is set in the beam

More information

GRENOUILLE.

GRENOUILLE. GRENOUILLE Measuring ultrashort laser pulses the shortest events ever created has always been a challenge. For many years, it was possible to create ultrashort pulses, but not to measure them. Techniques

More information

Nmark AGV-HP. High Accuracy, Thermally Stable Galvo Scanner

Nmark AGV-HP. High Accuracy, Thermally Stable Galvo Scanner Nmark AGV-HP Galvanometer Nmark AGV-HP High Accuracy, Thermally Stable Galvo Scanner Highest accuracy scanner available attains single-digit, micron-level accuracy over the field of view Optical feedback

More information

Supplementary Figure 1. GO thin film thickness characterization. The thickness of the prepared GO thin

Supplementary Figure 1. GO thin film thickness characterization. The thickness of the prepared GO thin Supplementary Figure 1. GO thin film thickness characterization. The thickness of the prepared GO thin film is characterized by using an optical profiler (Bruker ContourGT InMotion). Inset: 3D optical

More information

Practical Applications of Laser Technology for Semiconductor Electronics

Practical Applications of Laser Technology for Semiconductor Electronics Practical Applications of Laser Technology for Semiconductor Electronics MOPA Single Pass Nanosecond Laser Applications for Semiconductor / Solar / MEMS & General Manufacturing Mark Brodsky US Application

More information

ADVANCED OPTICS LAB -ECEN 5606

ADVANCED OPTICS LAB -ECEN 5606 ADVANCED OPTICS LAB -ECEN 5606 Basic Skills Lab Dr. Steve Cundiff and Edward McKenna, 1/15/04 rev KW 1/15/06, 1/8/10 The goal of this lab is to provide you with practice of some of the basic skills needed

More information

Supplementary Figure 1. Effect of the spacer thickness on the resonance properties of the gold and silver metasurface layers.

Supplementary Figure 1. Effect of the spacer thickness on the resonance properties of the gold and silver metasurface layers. Supplementary Figure 1. Effect of the spacer thickness on the resonance properties of the gold and silver metasurface layers. Finite-difference time-domain calculations of the optical transmittance through

More information

Optical Coherence: Recreation of the Experiment of Thompson and Wolf

Optical Coherence: Recreation of the Experiment of Thompson and Wolf Optical Coherence: Recreation of the Experiment of Thompson and Wolf David Collins Senior project Department of Physics, California Polytechnic State University San Luis Obispo June 2010 Abstract The purpose

More information

How-to guide. Working with a pre-assembled THz system

How-to guide. Working with a pre-assembled THz system How-to guide 15/06/2016 1 Table of contents 0. Preparation / Basics...3 1. Input beam adjustment...4 2. Working with free space antennas...5 3. Working with fiber-coupled antennas...6 4. Contact details...8

More information

White Paper: Modifying Laser Beams No Way Around It, So Here s How

White Paper: Modifying Laser Beams No Way Around It, So Here s How White Paper: Modifying Laser Beams No Way Around It, So Here s How By John McCauley, Product Specialist, Ophir Photonics There are many applications for lasers in the world today with even more on the

More information

EUV Plasma Source with IR Power Recycling

EUV Plasma Source with IR Power Recycling 1 EUV Plasma Source with IR Power Recycling Kenneth C. Johnson kjinnovation@earthlink.net 1/6/2016 (first revision) Abstract Laser power requirements for an EUV laser-produced plasma source can be reduced

More information

Large-Area Interference Lithography Exposure Tool Development

Large-Area Interference Lithography Exposure Tool Development Large-Area Interference Lithography Exposure Tool Development John Burnett 1, Eric Benck 1 and James Jacob 2 1 Physical Measurements Laboratory, NIST, Gaithersburg, MD, USA 2 Actinix, Scotts Valley, CA

More information

Difrotec Product & Services. Ultra high accuracy interferometry & custom optical solutions

Difrotec Product & Services. Ultra high accuracy interferometry & custom optical solutions Difrotec Product & Services Ultra high accuracy interferometry & custom optical solutions Content 1. Overview 2. Interferometer D7 3. Benefits 4. Measurements 5. Specifications 6. Applications 7. Cases

More information

1272. Phase-controlled vibrational laser percussion drilling

1272. Phase-controlled vibrational laser percussion drilling 1272. Phase-controlled vibrational laser percussion drilling Chao-Ching Ho 1, Chih-Mu Chiu 2, Yuan-Jen Chang 3, Jin-Chen Hsu 4, Chia-Lung Kuo 5 National Yunlin University of Science and Technology, Douliou,

More information

Recent Activities of the Actinic Mask Inspection using the EUV microscope at Center for EUVL

Recent Activities of the Actinic Mask Inspection using the EUV microscope at Center for EUVL Recent Activities of the Actinic Mask Inspection using the EUV microscope at Center for EUVL Takeo Watanabe, Tetsuo Harada, and Hiroo Kinoshita Center for EUVL, University of Hyogo Outline 1) EUV actinic

More information

All diode-pumped 4 Joule 527 nm Nd:YLF laser for pumping Ti:Sapphire lasers

All diode-pumped 4 Joule 527 nm Nd:YLF laser for pumping Ti:Sapphire lasers All diode-pumped 4 Joule 527 nm Nd:YLF laser for pumping Ti:Sapphire lasers Faming Xu, Chris Briggs, Jay Doster, Ryan Feeler and Edward Stephens Northrop Grumman Cutting Edge Optronics, 20 Point West Blvd,

More information

Transferring wavefront measurements to ablation profiles. Michael Mrochen PhD Swiss Federal Institut of Technology, Zurich IROC Zurich

Transferring wavefront measurements to ablation profiles. Michael Mrochen PhD Swiss Federal Institut of Technology, Zurich IROC Zurich Transferring wavefront measurements to ablation profiles Michael Mrochen PhD Swiss Federal Institut of Technology, Zurich IROC Zurich corneal ablation Calculation laser spot positions Centration Calculation

More information

Adaptive Optics for LIGO

Adaptive Optics for LIGO Adaptive Optics for LIGO Justin Mansell Ginzton Laboratory LIGO-G990022-39-M Motivation Wavefront Sensor Outline Characterization Enhancements Modeling Projections Adaptive Optics Results Effects of Thermal

More information

First Observation of Stimulated Coherent Transition Radiation

First Observation of Stimulated Coherent Transition Radiation SLAC 95 6913 June 1995 First Observation of Stimulated Coherent Transition Radiation Hung-chi Lihn, Pamela Kung, Chitrlada Settakorn, and Helmut Wiedemann Applied Physics Department and Stanford Linear

More information

Evaluation of laser-based active thermography for the inspection of optoelectronic devices

Evaluation of laser-based active thermography for the inspection of optoelectronic devices More info about this article: http://www.ndt.net/?id=15849 Evaluation of laser-based active thermography for the inspection of optoelectronic devices by E. Kollorz, M. Boehnel, S. Mohr, W. Holub, U. Hassler

More information

Bias errors in PIV: the pixel locking effect revisited.

Bias errors in PIV: the pixel locking effect revisited. Bias errors in PIV: the pixel locking effect revisited. E.F.J. Overmars 1, N.G.W. Warncke, C. Poelma and J. Westerweel 1: Laboratory for Aero & Hydrodynamics, University of Technology, Delft, The Netherlands,

More information

Linewidth control by overexposure in laser lithography

Linewidth control by overexposure in laser lithography Optica Applicata, Vol. XXXVIII, No. 2, 2008 Linewidth control by overexposure in laser lithography LIANG YIYONG*, YANG GUOGUANG State Key Laboratory of Modern Optical Instruments, Zhejiang University,

More information

Design Description Document

Design Description Document UNIVERSITY OF ROCHESTER Design Description Document Flat Output Backlit Strobe Dare Bodington, Changchen Chen, Nick Cirucci Customer: Engineers: Advisor committee: Sydor Instruments Dare Bodington, Changchen

More information

X-ray generation by femtosecond laser pulses and its application to soft X-ray imaging microscope

X-ray generation by femtosecond laser pulses and its application to soft X-ray imaging microscope X-ray generation by femtosecond laser pulses and its application to soft X-ray imaging microscope Kenichi Ikeda 1, Hideyuki Kotaki 1 ' 2 and Kazuhisa Nakajima 1 ' 2 ' 3 1 Graduate University for Advanced

More information

Ablation of microstructures applying diffractive elements and UV femtosecond laser pulses

Ablation of microstructures applying diffractive elements and UV femtosecond laser pulses Appl Phys A (2010) 101: 225 229 DOI 10.1007/s00339-010-5824-8 Ablation of microstructures applying diffractive elements and UV femtosecond laser pulses J.J.J. Kaakkunen J. Bekesi J. Ihlemann P. Simon Received:

More information

PROCEEDINGS OF SPIE. Closed-loop next generation laser polishing. Rolf Rascher, Christian Vogt, Oliver Fähnle, DaeWook Kim

PROCEEDINGS OF SPIE. Closed-loop next generation laser polishing. Rolf Rascher, Christian Vogt, Oliver Fähnle, DaeWook Kim PROCEEDINGS OF SPIE SPIEDigitalLibrary.org/conference-proceedings-of-spie Closed-loop next generation laser polishing Rolf Rascher, Christian Vogt, Oliver Fähnle, DaeWook Kim Rolf Rascher, Christian Vogt,

More information

Terahertz control of nanotip photoemission

Terahertz control of nanotip photoemission Terahertz control of nanotip photoemission L. Wimmer, G. Herink, D. R. Solli, S. V. Yalunin, K. E. Echternkamp, and C. Ropers Near-infrared pulses of 800 nm wavelength, 50 fs duration and at 1 khz repetition

More information

Simple interferometric fringe stabilization by CCD-based feedback control

Simple interferometric fringe stabilization by CCD-based feedback control Simple interferometric fringe stabilization by CCD-based feedback control Preston P. Young and Purnomo S. Priambodo, Department of Electrical Engineering, University of Texas at Arlington, P.O. Box 19016,

More information

DIRECT PART MARKING THE NEXT GENERATION OF DIRECT PART MARKING (DPM)

DIRECT PART MARKING THE NEXT GENERATION OF DIRECT PART MARKING (DPM) DIRECT PART MARKING THE NEXT GENERATION OF DIRECT PART MARKING (DPM) Direct Part Marking (DPM) is a process by which bar codes are permanently marked onto a variety of materials. The DPM process allows

More information

Diffraction. Interference with more than 2 beams. Diffraction gratings. Diffraction by an aperture. Diffraction of a laser beam

Diffraction. Interference with more than 2 beams. Diffraction gratings. Diffraction by an aperture. Diffraction of a laser beam Diffraction Interference with more than 2 beams 3, 4, 5 beams Large number of beams Diffraction gratings Equation Uses Diffraction by an aperture Huygen s principle again, Fresnel zones, Arago s spot Qualitative

More information

Suppression of FM-to-AM conversion in third-harmonic. generation at the retracing point of a crystal

Suppression of FM-to-AM conversion in third-harmonic. generation at the retracing point of a crystal Suppression of FM-to-AM conversion in third-harmonic generation at the retracing point of a crystal Yisheng Yang, 1,,* Bin Feng, Wei Han, Wanguo Zheng, Fuquan Li, and Jichun Tan 1 1 College of Science,

More information

Improving the Collection Efficiency of Raman Scattering

Improving the Collection Efficiency of Raman Scattering PERFORMANCE Unparalleled signal-to-noise ratio with diffraction-limited spectral and imaging resolution Deep-cooled CCD with excelon sensor technology Aberration-free optical design for uniform high resolution

More information

Integrated into Nanowire Waveguides

Integrated into Nanowire Waveguides Supporting Information Widely Tunable Distributed Bragg Reflectors Integrated into Nanowire Waveguides Anthony Fu, 1,3 Hanwei Gao, 1,3,4 Petar Petrov, 1, Peidong Yang 1,2,3* 1 Department of Chemistry,

More information

PERFORMANCE OF THE CMS ECAL LASER MONITORING SOURCE IN THE TEST BEAM

PERFORMANCE OF THE CMS ECAL LASER MONITORING SOURCE IN THE TEST BEAM PERFORMANCE OF THE CMS ECAL LASER MONITORING SOURCE IN THE TEST BEAM A. BORNHEIM CALTECH 2 E. California Blvd., Pasadena, CA 925, USA E-mail: bornheim@hep.caltech.edu On behalf of the CMS ECAL Collaboration.

More information

POCKET DEFORMABLE MIRROR FOR ADAPTIVE OPTICS APPLICATIONS

POCKET DEFORMABLE MIRROR FOR ADAPTIVE OPTICS APPLICATIONS POCKET DEFORMABLE MIRROR FOR ADAPTIVE OPTICS APPLICATIONS Leonid Beresnev1, Mikhail Vorontsov1,2 and Peter Wangsness3 1) US Army Research Laboratory, 2800 Powder Mill Road, Adelphi Maryland 20783, lberesnev@arl.army.mil,

More information

The Beam Characteristics of High Power Diode Laser Stack

The Beam Characteristics of High Power Diode Laser Stack IOP Conference Series: Materials Science and Engineering PAPER OPEN ACCESS The Beam Characteristics of High Power Diode Laser Stack To cite this article: Yuanyuan Gu et al 2018 IOP Conf. Ser.: Mater. Sci.

More information

DEVELOPMENT OF CW AND Q-SWITCHED DIODE PUMPED ND: YVO 4 LASER

DEVELOPMENT OF CW AND Q-SWITCHED DIODE PUMPED ND: YVO 4 LASER DEVELOPMENT OF CW AND Q-SWITCHED DIODE PUMPED ND: YVO 4 LASER Gagan Thakkar 1, Vatsal Rustagi 2 1 Applied Physics, 2 Production and Industrial Engineering, Delhi Technological University, New Delhi (India)

More information

Physics 431 Final Exam Examples (3:00-5:00 pm 12/16/2009) TIME ALLOTTED: 120 MINUTES Name: Signature:

Physics 431 Final Exam Examples (3:00-5:00 pm 12/16/2009) TIME ALLOTTED: 120 MINUTES Name: Signature: Physics 431 Final Exam Examples (3:00-5:00 pm 12/16/2009) TIME ALLOTTED: 120 MINUTES Name: PID: Signature: CLOSED BOOK. TWO 8 1/2 X 11 SHEET OF NOTES (double sided is allowed), AND SCIENTIFIC POCKET CALCULATOR

More information

High Average Power, High Repetition Rate Side-Pumped Nd:YVO 4 Slab Laser

High Average Power, High Repetition Rate Side-Pumped Nd:YVO 4 Slab Laser High Average Power, High Repetition Rate Side-Pumped Nd:YVO Slab Laser Kevin J. Snell and Dicky Lee Q-Peak Incorporated 135 South Rd., Bedford, MA 173 (71) 75-9535 FAX (71) 75-97 e-mail: ksnell@qpeak.com,

More information

Dynamic Phase-Shifting Electronic Speckle Pattern Interferometer

Dynamic Phase-Shifting Electronic Speckle Pattern Interferometer Dynamic Phase-Shifting Electronic Speckle Pattern Interferometer Michael North Morris, James Millerd, Neal Brock, John Hayes and *Babak Saif 4D Technology Corporation, 3280 E. Hemisphere Loop Suite 146,

More information