Glenn G. Daves. Director, Packaging Solutions Development Freescale Semiconductor, Inc.
|
|
- Clement Kelley
- 5 years ago
- Views:
Transcription
1 Glenn G. Daves Director, Packaging Solutions Development Freescale Semiconductor, Inc. Freescale, the Freescale logo, AltiVec, C-5, CodeTEST, CodeWarrior, ColdFire, C-Ware, t he Energy Efficient Solutions logo, mobilegt, PowerQUICC, QorIQ, StarCore and Symphony are trademarks of Freescale Semiconductor, Inc., Reg. U.S. Pat. & Tm. Off. BeeKit, BeeStack, ColdFire+, CoreNet, Flexis, Kinetis, MXC, Platform in a Package, Processor Expert, QorIQ Qonverge, Qorivva, QUICC Engine, SMAROS, TurboLink, VortiQa and Xtrinsic are trademarks of Freescale Semiconductor, Inc. All other product or service names are the property of their respective owners Freescale Semiconductor, Inc.
2 iphone Wii Piezo-resistive effect of Si-Ge discovered Bio Sensors Gyroscopes Accelerometers Inkjet Heads Si-Ge Strain Gage Pressure Sensors IR Sensors Digital Light Processors Resonant Gate Transistor patented Term MEMS first used Tire Pressure Monitors ipod 1950 s 1960 s 1970 s 1980 s 1990 s 2000 s 2010 s 2 SOURCE: Southwest Center for Microsystems Education (SCME), History of MEMS Learning Module, 2001
3 Increasing Accuracy Increasing precision is desired/demanded over time Isolation: stable packages that isolate sensor from extraneous stresses Increasing Integration More functions, more chips in a single sense unit Integration: expanding SiP, PiP, PoP complexity Miniaturization Handheld device space constraints fix maximum volumetric envelope Miniaturization: Increasing Diversity Expanding applications and markets Customization: Each package customized for the application, market, and environment. Pressure, inertial, optical / consumer, automotive, medical... Design: accuracy required to do all the above well. Freescale Pressure Sensor Portfolio Cost, Cost, Cost Leverage existing capabilities (test & pkg) and integration, standardization. 3
4 Design Accuracy Isolation Improvement Cost Applications 4
5 MEMS designs sometimes experience many revisions. Inherent functionality Fabrication process variation Assembly and board mounting stresses Environmental conditions Current analytic and finite element modeling approaches are insufficient to achieve first time right design objectives. Research Needs Automation / Simplification To enable modeling of statistical variation and complex systems without added labor. Definition of model boundary conditions To improve design accuracy and better predict actual performance 5
6 Conventional wisdom: ceramic as a stable foundation for the system. But, it is unaffordable and not scalable to miniaturization needs. Conventional microelectronics packaging materials (lead frames, substrates, mold compounds, etc.) have attractive pricing but create and transmit more extraneous stresses to the sensor. Increasing sensitivity requirements are revealing the limitations of applying these packages to MEMS. Research Needs Materials Create a cost-effective ceramic-like base suitable for many form factors. Physical Isolation Design robust sensors that are immune to extraneous stress fields. Compensation / Trimming Develop more sophisticated methodologies that cancel-out extraneous stresses. 6
7 Courtesy of SPEA Cost Hierarchy: Conventional microelectronics paradigm: chip > package > test Emerging MEMS paradigm: test > package > chip Despite the changing cost paradigm, the overwhelming majority of R&D attention, effort, and dollars are directed towards improving the chips to deliver more sensitivity, integration, etc. Research Needs MEMS Design-for-test / Self-test methodologies To eliminate the need for custom actuation-based testers & handlers and leverage existing digital tester/handler infrastructure. Isolation Improvement To enable leverage of existing digital packaging technologies & cost structures. Standardization & Integration One product / one process / one package. Multi-function products = fewer pkgs. 7
8 Courtesy of 3D Plus Micro-fluidics Medical and implantable devices, drug delivery, lab-on-chip, etc. Cooling 3D chip stacks 2-D and 3-D Packaging Integration Sensing node concepts for aerospace and military Volumetric shrinks More function in constant volume Wafer-level Packaging ASIC-as-cap-wafer, TSV chip/wafer stacks Optical packaging: dispensed lenses, etc. 8
9
Freescale, the Freescale logo, AltiVec, C-5, CodeTEST, CodeWarrior, ColdFire, ColdFire+, C-Ware, the Energy Efficient Solutions logo, Kinetis,
TM November 2012 Freescale, the Freescale logo, AltiVec, C-5, CodeTEST, CodeWarrior, ColdFire, ColdFire+, C-Ware, the Energy Efficient Solutions logo, Kinetis, mobilegt, PowerQUICC, Processor Expert, QorIQ,
More informationFreescale, the Freescale logo, AltiVec, C-5, CodeTEST, CodeWarrior, ColdFire, ColdFire+, C- Ware, the Energy Efficient Solutions logo, Kinetis,
April 2013 Freescale, the Freescale logo, AltiVec, C-5, CodeTEST, CodeWarrior, ColdFire, ColdFire+, C- Ware, the Energy Efficient Solutions logo, Kinetis, mobilegt, PEG, PowerQUICC, Processor Expert, QorIQ,
More informationFreescale, the Freescale logo, AltiVec, C-5, CodeTEST, CodeWarrior, ColdFire, ColdFire+, C- Ware, the Energy Efficient Solutions logo, Kinetis,
Freescale, the Freescale logo, AltiVec, C-5, CodeTEST, CodeWarrior, ColdFire, ColdFire+, C- Ware, the Energy Efficient Solutions logo, Kinetis, mobilegt, PEG, PowerQUICC, Processor Expert, QorIQ, Qorivva,
More informationFreescale Semiconductor
Freescale Semiconductor Data Sheet: Technical Information Pressure Document Number: Rev 3, 1/2013 High Temperature Accuracy Integrated Silicon Pressure Sensor for Measuring Absolute Pressure, On-Chip Signal
More informationRepetitive Short-circuit Performances
Freescale Semiconductor Application Note AN3959 Rev. 2.0, 6/2012 Repetitive Short-circuit Performances For the MC15XS3400D, MC35XS3400D, and MC10XS3435D 1 Introduction This application note relates the
More informationSystem-on-Chip Two-Way Radio
System-on-Chip Two-Way Radio FTF-CON-F0508 Steve Johnson / Keith Tilley Product Management 31 August 2011 Freescale, the Freescale logo, AltiVec, C-5, CodeTEST, CodeWarrior, ColdFire, C-Ware, t he Energy
More informationHeterojunction Bipolar Transistor Technology (InGaP HBT) High Efficiency/Linearity Amplifier
Freescale Semiconductor Technical Data Heterojunction Bipolar Transistor Technology (InGaP HBT) High Efficiency/Linearity Amplifier The MMZ25332B is a 2--stage, high linearity InGaP HBT broadband amplifier
More informationFreescale, the Freescale logo, AltiVec, C-5, CodeTEST, CodeWarrior, ColdFire, C-Ware, the Energy Efficient Solutions logo, mobilegt, PowerQUICC,
Freescale, the Freescale logo, AltiVec, C-5, CodeTEST, CodeWarrior, ColdFire, C-Ware, the Energy Efficient Solutions logo, mobilegt, PowerQUICC, QorIQ, StarCore and Symphony are trademarks of Freescale
More informationTest Methodology. Characteristic Symbol Min Typ Max Unit. V GS(th) Vdc. V GS(Q) Vdc. V DS(on)
Freescale Semiconductor Technical Data RF Power Field Effect Transistors N--Channel Enhancement--Mode Lateral MOSFETs Designed for CDMA base station applications with frequencies from185 MHz to 1995 MHz.
More informationFreescale, the Freescale logo, AltiVec, C-5, CodeTEST, CodeWarrior, ColdFire, ColdFire+, C-Ware, the Energy Efficient Solutions logo, Kinetis,
Freescale, the Freescale logo, AltiVec, C-5, CodeTEST, CodeWarrior, ColdFire, ColdFire+, C-Ware, the Energy Efficient Solutions logo, Kinetis, mobilegt, PowerQUICC, Processor Expert, QorIQ, Qorivva, StarCore,
More informationFreescale, the Freescale logo, AltiVec, C-5, CodeTEST, CodeWarrior, ColdFire, ColdFire+, C- Ware, the Energy Efficient Solutions logo, Kinetis,
April 2013 Freescale, the Freescale logo, AltiVec, C-5, CodeTEST, CodeWarrior, ColdFire, ColdFire+, C- Ware, the Energy Efficient Solutions logo, Kinetis, mobilegt, PEG, PowerQUICC, Processor Expert, QorIQ,
More informationChuck Corley. NPD Applications Engineering
Chuck Corley NPD Applications Engineering June 2012 Freescale, the Freescale logo, AltiVec, C-5, CodeTEST, CodeWarrior, ColdFire, ColdFire+, C-Ware, the Energy Efficient Solutions logo, Kinetis, mobilegt,
More informationCharacteristic Symbol Value (2,3) Unit. Test Methodology
Freescale Semiconductor Technical Data RF LDMOS Wideband Integrated Power Amplifiers The MD7IC2251N wideband integrated circuit is designed with on--chip matching that makes it usable from 2110--2170 MHz.
More informationFRDM-KW36 Co-existence with RF System Evaluation Report for Bluetooth Low Energy Application
NXP Semiconductors Document Number: AN12256 Application Note Rev. 0, 09/2018 FRDM-KW36 Co-existence with RF System Evaluation Report for Bluetooth Low Energy Application Contents 1. Introduction This document
More informationRF Power LDMOS Transistor N--Channel Enhancement--Mode Lateral MOSFET
Freescale Semiconductor Technical Data Document Number: AFT18S23S Rev. 2, 3/213 RF ower LDMOS Transistor N--Channel nhancement--mode Lateral MOSFT This 5 watt RF power LDMOS transistor is designed for
More informationMask Set Errata for Mask 3N95G
NXP Semiconductors S12ZVM128_3N95G Mask Set Errata Rev. 17 March 2016 Mask Set Errata for Mask 3N95G This report applies to mask 3N95G for these products: S12ZVML32 S12ZVML64 S12ZVML12 S12ZVMC64 S12ZVMC12
More informationThe Advantages of Integrated MEMS to Enable the Internet of Moving Things
The Advantages of Integrated MEMS to Enable the Internet of Moving Things January 2018 The availability of contextual information regarding motion is transforming several consumer device applications.
More informationPackaging Roadmap: The impact of miniaturization. Bob Pfahl, inemi Celestica-iNEMI Technology Forum May 15, 2007
Packaging Roadmap: The impact of miniaturization Bob Pfahl, inemi Celestica-iNEMI Technology Forum May 15, 2007 The Challenges for the Next Decade Addressing the consumer experience using the converged
More informationMEMS in ECE at CMU. Gary K. Fedder
MEMS in ECE at CMU Gary K. Fedder Department of Electrical and Computer Engineering and The Robotics Institute Carnegie Mellon University Pittsburgh, PA 15213-3890 fedder@ece.cmu.edu http://www.ece.cmu.edu/~mems
More informationReducing MEMS product development and commercialization time
Reducing MEMS product development and commercialization time Introduction Fariborz Maseeh, Andrew Swiecki, Nora Finch IntelliSense Corporation 36 Jonspin Road, Wilmington MA 01887 www.intellisense.com
More informationPOSSUM TM Die Design as a Low Cost 3D Packaging Alternative
POSSUM TM Die Design as a Low Cost 3D Packaging Alternative The trend toward 3D system integration in a small form factor has accelerated even more with the introduction of smartphones and tablets. Integration
More informationMPC5777C Clock Calculator Guide
NXP Semiconductors Document Number: AN12176 Application Notes Rev. 0, 04/2018 MPC5777C Clock Calculator Guide How to use MPC5777C tool to easily calculate device frequency domains by: NXP Semiconductors
More informationMask Set Errata for Mask 2N95G
NXP Semiconductors S12ZVM128_2N95G Mask Set Errata Rev. 24 June 2016 Mask Set Errata for Mask 2N95G This report applies to mask 2N95G for these products: S12ZVML32 S12ZVML64 S12ZVML12 S12ZVMC64 S12ZVMC12
More informationCompression Molding. Solutions for 3D TSV and other advanced packages as well as cost savings for standard package applications
Compression Molding Solutions for 3D TSV and other advanced packages as well as cost savings for standard package applications 1. Company Introduction 2. Package Development Trend 3. Compression FFT Molding
More informationDead-Time Compensation Method for Vector-Controlled VSI Drives Based on Qorivva Family
Freescale Semiconductor Document Number: AN4863 Application Note Rev 0, June Dead-Time Compensation Method for Vector-Controlled VSI Drives Based on Qorivva Family by: Petr Konvicny 1 Introduction One
More informationFRDM-KW36 Minimum BoM Development Board User s Guide
NXP Semiconductor Document Number: MiniBoMKW36UG User s Guide Rev. 0, 09/2018 FRDM-KW36 Minimum BoM Development Board User s Guide 1. Introduction This guide describes the hardware of KW36 Minimum Bill
More informationRecent Developments in Multifunctional Integration. Stephan Guttowski, Head of Technology Park»Heterointegration«, Fraunhofer FMD
Recent Developments in Multifunctional Integration Stephan Guttowski, Head of Technology Park»Heterointegration«, Fraunhofer FMD Founding Participants 2 One-Stop-Shop for developments from wafer technologies
More informationSilicon Photonics Transceivers for Hyper Scale Datacenters: Deployment and Roadmap
Silicon Photonics Transceivers for Hyper Scale Datacenters: Deployment and Roadmap Peter De Dobbelaere Luxtera Inc. 09/19/2016 Luxtera Proprietary www.luxtera.com Luxtera Company Introduction $100B+ Shift
More informationModel-Based Design Toolbox
Model-Based Design Toolbox License Installation & Management Manual An Embedded Target for S32K1xx Family of Processors Version 3.0.0 Target Based Automatic Code Generation Tools For MATLAB /Simulink /Stateflow
More informationMEMS Technology Roadmapping
MEMS Technology Roadmapping Michael Gaitan, NIST Chair, inemi and ITRS MEMS Technology Working Groups Nano-Tec Workshop 3 31 May 2012 MEMS Technology Working Group More than Moore White Paper, http://www.itrs.net
More informationFaculty Development Program on Micro-Electro-Mechanical Systems (MEMS Sensor)
Faculty Development Program on Micro-Electro-Mechanical Systems (MEMS Report MEMS sensors have been dominating the consumer products such as mobile phones, music players and other portable devices. With
More informationXtrinsic MAG3110 Three-Axis, Digital Magnetometer
Freescale Semiconductor Document Number: Data Sheet: Technical Data Rev. 9.1, 10/2012 An Energy Efficient Solution by Freescale Xtrinsic Three-Axis, Digital Magnetometer Freescale s is a small, low-power,
More informationThe Future of Packaging ~ Advanced System Integration
The Future of Packaging ~ Advanced System Integration Enabling a Microelectronic World R. Huemoeller SVP, Adv. Product / Platform Develop June 2013 Product Segments End Market % Share Summary 2 New Product
More informationMPXM2051G, 0 to 50 kpa, Gauge Compensated Pressure Sensors
Freescale Semiconductor Document Number: Data Sheet: Technical Data Rev. 3.0, 11/2015, 0 to 50 kpa, Gauge Compensated Pressure The device is a silicon piezoresistive pressure sensor providing a highly
More informationTriple i - The key to your success
Triple i - The key to your success The needs and challenges of today s world are becoming ever more demanding. Standards are constantly rising. Creativity, reliability and high performance are basic prerequisites
More informationDes MEMS aux NEMS : évolution des technologies et des concepts aux travers des développements menés au LETI
Des MEMS aux NEMS : évolution des technologies et des concepts aux travers des développements menés au LETI Ph. Robert 1 Content LETI at a glance From MEMS to NEMS: 30 years of technological evolution
More informationIndustrialization of Micro-Electro-Mechanical Systems. Werner Weber Infineon Technologies
Industrialization of Micro-Electro-Mechanical Systems Werner Weber Infineon Technologies Semiconductor-based MEMS market MEMS Market 2004 (total 22.7 BUS$) Others mostly Digital Light Projection IR Sensors
More information1 Introduction 1.1 HISTORICAL DEVELOPMENT OF MICROELECTRONICS
1 Introduction 1.1 HISTORICAL DEVELOPMENT OF MICROELECTRONICS The field of microelectronics began in 1948 when the first transistor was invented. This first transistor was a point-contact transistor, which
More informationWCT101xS Automotive MP-A9 V4.0 Wireless Charging Application
NXP Semiconductors Document Number: WCT0XSV0AUG User's Guide Rev. 0, 0/08 WCT0xS Automotive MP-A9 V4.0 Wireless Charging Application. Introduction The Automotive MP-A9_Rev.0 (MP-A9_Rev_SCH- 9_B, MP-A9_Rev_LAY-9_B)
More informationMID Manufacturing Process.
3D Aerosol Jet Printing An Emerging MID Manufacturing Process. Dr. Martin Hedges Neotech Services MTP, Nuremberg, Germany info@neotechservices.com Aerosol Jet Printing Aerosol Jet Process Overview Current
More informationRF MEMS Simulation High Isolation CPW Shunt Switches
RF MEMS Simulation High Isolation CPW Shunt Switches Authored by: Desmond Tan James Chow Ansoft Corporation Ansoft 2003 / Global Seminars: Delivering Performance Presentation #4 What s MEMS Micro-Electro-Mechanical
More informationCMP for More Than Moore
2009 Levitronix Conference on CMP Gerfried Zwicker Fraunhofer Institute for Silicon Technology ISIT Itzehoe, Germany gerfried.zwicker@isit.fraunhofer.de Contents Moore s Law and More Than Moore Comparison:
More information9 rue Alfred Kastler - BP Nantes Cedex 3 - France Phone : +33 (0) website :
9 rue Alfred Kastler - BP 10748-44307 Nantes Cedex 3 - France Phone : +33 (0) 240 180 916 - email : info@systemplus.fr - website : www.systemplus.fr December 2010 - Version 1 Written by: Romain FRAUX DISCLAIMER
More informationAdvances in Freescale Airfast RFICs Setting New Benchmarks in LDMOS for Macrocells through Small Cells
Freescale Semiconductor White Paper AIRFASTWBFWP Rev. 0, 5/2015 Advances in Freescale Airfast RFICs Setting New Benchmarks in LDMOS for Macrocells through Small Cells By: Margaret Szymanowski and Suhail
More informationR&D Requirements from the 2004 inemi Roadmap. April 7, 2005 Dr. Robert C. Pfahl, Jr. VP of Operations, inemi
R&D Requirements from the 2004 inemi Roadmap April 7, 2005 Dr. Robert C. Pfahl, Jr. VP of Operations, inemi Topics Covered Overview of inemi and the 2004 Roadmap Situation Analysis Highlights from the
More informationThermal Management in the 3D-SiP World of the Future
Thermal Management in the 3D-SiP World of the Future Presented by W. R. Bottoms March 181 th, 2013 Smaller, More Powerful Portable Devices Are Driving Up Power Density Power (both power delivery and power
More informationMEMS Processes at CMP
MEMS Processes at CMP MEMS Processes Bulk Micromachining MUMPs from MEMSCAP Teledyne DALSA MIDIS Micralyne MicraGEM-Si CEA/LETI Photonic Si-310 PHMP2M 2 Bulk micromachining on CMOS Compatible with electronics
More informationTechnology & Manufacturing
Technology & Manufacturing Jean-Marc Chery Chief Operating Officer Front-End Manufacturing Unique capability 2 Technology portfolio aligned with application focus areas Flexible IDM model with foundry
More informationRecent Innovations in MEMS Sensors for PNT Applications
Recent Innovations in MEMS Sensors for PNT Applications Stanford PNT Symposium 2017 Alissa M. Fitzgerald, Ph.D. Founder & CEO amf@amfitzgerald.com Overview Navigation Developments in MEMS gyroscope technology
More informationFinal Exam Topics. IC Technology Advancement. Microelectronics Technology in the 21 st Century. Intel s 90 nm CMOS Technology. 14 nm CMOS Transistors
ANNOUNCEMENTS Final Exam: When: Wednesday 12/10 12:30-3:30PM Where: 10 Evans (last names beginning A-R) 60 Evans (last names beginning S-Z) Comprehensive coverage of course material Closed book; 3 sheets
More informationInvenSense IDG-300 Dual-Axis Angular Rate Gyroscope Sensor
InvenSense IDG-300 Dual-Axis Angular Rate Gyroscope Sensor MEMS Process Review For comments, questions, or more information about this report, or for any additional technical needs concerning semiconductor
More informationFlexible Hybrid Electronics Fabricated with High-Performance COTS ICs using RTI CircuitFilm TM Technology
Flexible Hybrid Electronics Fabricated with High-Performance COTS ICs using RTI CircuitFilm TM Technology Scott Goodwin 1, Erik Vick 2 and Dorota Temple 2 1 Micross Advanced Interconnect Technology Micross
More informationTUTORIAL on the Industrialization of MEMS
Munich Germany 11-13 September 2007 TUTORIAL on the Industrialization of MEMS Date: Monday, September 10 th, 2007 Venue: Organizer: TU München, Main Campus, Arcisstrasse 21, 80333 München Werner Weber,
More informationQorIQ Qonverge Portfolio. Small Cells Call for Scalable Architecture. By Jean-Christophe Nanan and Barry Stern. freescale.com
QorIQ Qonverge Portfolio Small Cells Call for Scalable Architecture By Jean-Christophe Nanan and Barry Stern Introduction If 2011 was the year of the heterogeneous network (HetNet) concept 1, Mobile World
More informationMEMS Test & Reliability Conference. Dynamic Product Performance Testing of Capacitive MEMS Elements at Wafer Level
MEMS Test & Reliability Conference Dynamic Product Performance Testing of Capacitive MEMS Elements at Wafer Level Solidus Technologies Abstract Testing the electro/mechanical behavior of capacitive MEMS
More informationMEMS Sensors: From Automotive. CE Applications. MicroNanoTec Forum Innovations for Industry April 19 th Hannover, Germany
MEMS Sensors: From Automotive to CE Applications MicroNanoTec Forum Innovations for Industry 2010 April 19 th Hannover, Germany Oliver Schatz, CTO 1 Engineering April 2010 GmbH 2009. All rights reserved,
More informationFeasibility of MEMS Vibration Energy Harvesting for High Temperature Sensing
Energy Harvesting 2015 Feasibility of MEMS Vibration Energy Harvesting for High Temperature Sensing Steve Riches GE Aviation Systems Newmarket Ashwin Seshia University of Cambridge Yu Jia University of
More information3.0 A 1.0 MHz Fully Integrated DDR Switch-Mode Power Supply
Freescale Semiconductor Advance Information 3.0 A 1.0 MHz Fully Integrated DDR Switch-Mode Power Supply The is a highly integrated, space efficient, low cost, single synchronous buck switching regulator
More informationHigh-Throughput Precise Dotting in Electronics Assembly
Abstract High-Throughput Precise Dotting in Electronics Assembly Hanzhuang Liang, Akira Morita and Brian Chung Nordson ASYMTEK 2765 Loker Avenue West, Carlsbad, CA 92010, USA In Electro-Mechanical Module
More informationFreescale Semiconductor Data Sheet: Technical Data
Freescale Semiconductor Data Sheet: Technical Data Media Resistant and High Temperature Accuracy Integrated Silicon Sensor for Measuring Absolute, On-Chip Signal Conditioned, Temperature Compensated and
More informationHahn-Schickard Stuttgart
Hahn-Schickard Stuttgart Hahn-Schickard Applied research for industry Budget 2016: 23,1 Mio. (5,1 Mio. industry) Employees 2016: 181 FTE (228 persons) Part of the Innovation Alliance Baden-Württemberg
More informationTrends in Advanced Packaging Technologies An IMAPS UK view
Trends in Advanced Packaging Technologies An IMAPS UK view Andy Longford Chair IMAPS UK 2007 9 PandA Europe IMAPS UK IeMRC Interconnection event December 2008 1 International Microelectronics And Packaging
More informationMicro and Smart Systems
Micro and Smart Systems Lecture - 39 (1)Packaging Pressure sensors (Continued from Lecture 38) (2)Micromachined Silicon Accelerometers Prof K.N.Bhat, ECE Department, IISc Bangalore email: knbhat@gmail.com
More informationMEDIA RELEASE FOR IMMEDIATE RELEASE 26 JULY 2016
MEDIA RELEASE FOR IMMEDIATE RELEASE 26 JULY 2016 A*STAR S IME KICKS OFF CONSORTIA TO DEVELOP ADVANCED PACKAGING SOLUTIONS FOR NEXT-GENERATION INTERNET OF THINGS APPLICATIONS AND HIGH-PERFORMANCE WIRELESS
More informationSensors and actuators at NXP: bringing more than Moore to CMOS
Sensors and actuators at NXP: bringing more than Moore to CMOS Joost van Beek Senior Principal Scientist Corporate R&D, NXP Semiconductors Presented at the International Symposium on Advanced Hybrid Nano
More informationCHOOSING THE RIGHT TYPE OF ACCELEROMETER
As with most engineering activities, choosing the right tool may have serious implications on the measurement results. The information below may help the readers make the proper accelerometer selection.
More informationLow-Cost Far-Infrared FPA based on High-Volume Pressure Sensor Process
Low-Cost Far-Infrared FPA based on High-Volume Pressure Sensor Process Michael Krueger 1, Ingo Herrmann 1 Robert Bosch GmbH - Automotive Electronics, Tuebinger Str. 13, D-776 Reutlingen, Germany, michael.krueger@de.bosch.com
More informationDesign of MEMS Piezoelectric Vibrational Energy Harvesters for Industrial and Commercial Applications
Design of MEMS Piezoelectric Vibrational Energy Harvesters for Industrial and Commercial Applications Consumer Applications Civil Infrastructure Kathleen M. Vaeth, Vice President of Engineering microgen
More informationPressure Sensors, Accelerometers, and Custom Microstructures
Sensors, Accelerometers, and Custom Microstructures IC SENSORS Products Databook Consistent with Measurement Specialties, Inc. policy of continually updating and improving its products, the type designation
More informationStudy of MEMS Devices for Space Applications ~Study Status and Subject of RF-MEMS~
Study of MEMS Devices for Space Applications ~Study Status and Subject of RF-MEMS~ The 26 th Microelectronics Workshop October, 2013 Maya Kato Electronic Devices and Materials Group Japan Aerospace Exploration
More informationMICROFLEX Project: MEMS on New Emerging Smart Textiles/Flexibles
MICROFLEX Project: MEMS on New Emerging Smart Textiles/Flexibles S Beeby, M J Tudor, R Torah, K Yang, Y Wei Dr Steve Beeby ESD Research Group Smart Fabrics 2011 5 th April 2011 Overview Introduce the MicroFlex
More informationAdvancing MEMS R&D in materials, processes and devices to face major needs arising from the booming MEMS market
Advancing MEMS R&D in materials, processes and devices to face major needs arising from the booming MEMS market Dr Julien Arcamone MEMS Business development Manager, CEA-LETI julien.arcamone@cea.fr MEMS
More informationEE105 Fall 2015 Microelectronic Devices and Circuits. Invention of Transistors
EE105 Fall 2015 Microelectronic Devices and Circuits Prof. Ming C. Wu wu@eecs.berkeley.edu 511 Sutardja Dai Hall (SDH) 1-1 Invention of Transistors - 1947 Bardeen, Shockley, and Brattain at Bell Labs Invented
More information<DRAFT> MM5110 Digital-Micro-Switch 100W SPST. Product Specification
MM5110 Digital-Micro-Switch 100W SPST Product Specification Features: DC to > 6 GHz Frequency Range 100 Watt (50 dbm) Maximum Power Low On-State Insertion Loss < 0.2 db @ 3 GHz -15 db Off-State Isolation
More informationME 434 MEMS Tuning Fork Gyroscope Amanda Bristow Stephen Nary Travis Barton 12/9/10
ME 434 MEMS Tuning Fork Gyroscope Amanda Bristow Stephen Nary Travis Barton 12/9/10 1 Abstract MEMS based gyroscopes have gained in popularity for use as rotation rate sensors in commercial products like
More informationDiverse Lasers Support Key Microelectronic Packaging Tasks
Diverse Lasers Support Key Microelectronic Packaging Tasks Written by D Muller, R Patzel, G Oulundsen, H Halou, E Rea 23 July 2018 To support more sophisticated and compact tablets, phones, watches and
More informationReference Oscillator Crystal Requirements for MKW40 and MKW30 Device Series
Freescale Semiconductor, Inc. Application Note Document Number: AN5177 Rev. 0, 08/2015 Reference Oscillator Crystal Requirements for MKW40 and MKW30 Device Series 1 Introduction This document describes
More informationLithography in our Connected World
Lithography in our Connected World SEMI Austin Spring Forum TOP PAN P R INTING CO., LTD MATER IAL SOLUTIONS DIVISION Toppan Printing Co., LTD A Broad-Based Global Printing Company Foundation: January 17,
More informationAdvances in Silicon Technology Enables Replacement of Quartz-Based Oscillators
Advances in Silicon Technology Enables Replacement of Quartz-Based Oscillators I. Introduction With a market size estimated at more than $650M and more than 1.4B crystal oscillators supplied annually [1],
More informationAEROSPACE AND DEFENSE
AEROSPACE AND DEFENSE Analog Devices provides solutions from antenna to bits to enable today s mission-critical platforms. We offer the industry s broadest portfolio of components and high performance
More informationFan-Out Solutions: Today, Tomorrow the Future Ron Huemoeller
Fan-Out Solutions: Today, Tomorrow the Future Ron Huemoeller Corporate Vice President, WW RnD & Technology Strategy 1 In the Beginning ewlb 2 Fan Out Packaging Emerges Introduction of Fan Out (ewlb) Marketed
More informationSmartSenseCom Introduces Next Generation Seismic Sensor Systems
SmartSenseCom Introduces Next Generation Seismic Sensor Systems Summary: SmartSenseCom, Inc. (SSC) has introduced the next generation in seismic sensing technology. SSC s systems use a unique optical sensing
More informationReference Diagram IDG-300. Coriolis Sense. Low-Pass Sensor. Coriolis Sense. Demodulator Y-RATE OUT YAGC R LPY C LPy ±10% EEPROM TRIM.
FEATURES Integrated X- and Y-axis gyro on a single chip Factory trimmed full scale range of ±500 /sec Integrated low-pass filters High vibration rejection over a wide frequency range High cross-axis isolation
More informationEE C245 ME C218 Introduction to MEMS Design
EE C245 ME C218 Introduction to MEMS Design Fall 2008 Prof. Clark T.-C. Nguyen Dept. of Electrical Engineering & Computer Sciences University of California at Berkeley Berkeley, CA 94720 Lecture 1: Definition
More informationMAPPER: High throughput Maskless Lithography
MAPPER: High throughput Maskless Lithography Marco Wieland CEA- Leti Alterative Lithography workshop 1 Today s agenda Introduction Applications Qualification of on-tool metrology by in-resist metrology
More informationChapter 7 Introduction to 3D Integration Technology using TSV
Chapter 7 Introduction to 3D Integration Technology using TSV Jin-Fu Li Department of Electrical Engineering National Central University Jungli, Taiwan Outline Why 3D Integration An Exemplary TSV Process
More informationSiP packaging technology of intelligent sensor module. Tony li
SiP packaging technology of intelligent sensor module Tony li 2016.9 Contents What we can do with sensors Sensor market trend Challenges of sensor packaging SiP technology to overcome challenges Overview
More informationSensing Solutions Overview
Sensing Solutions Overview Overview Sensor Signal Conditioning ICs for Industrial and Consumer Applications INDUSTRIAL / CONSUMER SSC OVERVIEW 1 Easy-to-Use Sensor Signal Conditioner ICs Designing sensor
More informationEE C245 ME C218 Introduction to MEMS Design Fall 2007
EE C245 ME C218 Introduction to MEMS Design Fall 2007 Prof. Clark T.-C. Nguyen Dept. of Electrical Engineering & Computer Sciences University of California at Berkeley Berkeley, CA 94720 Lecture 1: Definition
More informationElectronics in Our Daily Life Today and Packaging Trends Influencing the Future
Rochester Institute of Technology RIT Scholar Works Presentations and other scholarship 4-14-2009 Electronics in Our Daily Life Today and Packaging Trends Influencing the Future S. Manian Ramkumar Rochester
More informationFigure 7. Hot Carrier Damage Tracks the P-well Current.
Hot Carrier Degradation Physics By Christopher Henderson One useful technique to indirectly observe the damage created by hot carriers is to measure the p-well current. The p-well current closely tracks
More informationIntroduction to Microdevices and Microsystems
PHYS 534 (Fall 2008) Module on Microsystems & Microfabrication Lecture 1 Introduction to Microdevices and Microsystems Srikar Vengallatore, McGill University 1 Introduction to Microsystems Outline of Lecture
More informationLecture Introduction
Lecture 1 6.012 Introduction 1. Overview of 6.012 Outline 2. Key conclusions of 6.012 Reading Assignment: Howe and Sodini, Chapter 1 6.012 Electronic Devices and Circuits-Fall 200 Lecture 1 1 Overview
More informationVybrid ASRC Performance
Freescale Semiconductor, Inc. Engineering Bulletin Document Number: EB808 Rev. 0, 10/2014 Vybrid ASRC Performance Audio Analyzer Measurements by: Jiri Kotzian, Ronald Wang This bulletin contains performance
More informationLaminate Based Fan-Out Embedded Die Technologies: The Other Option
Laminate Based Fan-Out Embedded Die Technologies: The Other Option Theodore (Ted) G. Tessier, Tanja Karila*, Tuomas Waris*, Mark Dhaenens and David Clark FlipChip International, LLC 3701 E University Drive
More informationResearch in Support of the Die / Package Interface
Research in Support of the Die / Package Interface Introduction As the microelectronics industry continues to scale down CMOS in accordance with Moore s Law and the ITRS roadmap, the minimum feature size
More information1.1 PHILOSOPHY OF MICRO/NANOFABRICATION
CHAPTER Introduction 1 C H A P T E R C O N T E N T S 1.1 Philosophy of Micro/Nanofabrication... 1 1.2 The Industry Science Dualism... 5 1.3 Industrial Applications... 8 1.4 Purpose and Organization of
More informationComputer Aided Design of Electronics
Computer Aided Design of Electronics [Datorstödd Elektronikkonstruktion] Zebo Peng, Petru Eles, and Nima Aghaee Embedded Systems Laboratory IDA, Linköping University www.ida.liu.se/~tdts01 Electronic Systems
More informationBeyond Moore the challenge for Europe
Beyond Moore the challenge for Europe Dr. Alfred J. van Roosmalen Vice-President Business Development, NXP Semiconductors Company member of MEDEA+/CATRENE/AENEAS/Point-One FIT-IT 08 Spring Research Wien,
More informationCMP for Advanced Packaging
CMP for Advanced Packaging Robert L. Rhoades, Ph.D. NCCAVS TFUG-CMPUG Joint Meeting June 9, 2016 Semiconductor Equipment Spare Parts and Service CMP Foundry Foundry Click to edit Master Outline title style
More information