DELTA Test Report. Type approval testing of C6200 and C6250. Performed for Selco A/S. We help ideas meet the real world

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1 We help ideas meet the real world DELTA Test Report TEST Reg. no. 19 Type approval testing of C6200 and C6250 Performed for Selco A/S DANAK Project no.: A Page 1 of 54 including 6 annexes 19 June 2008 DELTA Danish Electronics, Light & Acoustics Venlighedsvej Hørsholm Denmark Tel. (+45) Fax (+45) This report is issued under the rules of DANAK (Danish Accreditation) and ILAC (International Laboratory Accreditation Cooperation) including its MRA (Mutual Recognition Arrangement). Further information can be found at and The report must not be reproduced, except in full, without the written approval of DELTA. Version m

2 Page 2 of 54 Title Test object Type approval testing of C6200 and C6250 C6200 and C6250 Detailed information is given in Section 2. The test objects were received on 25 March Report no. Project no. DANAK A Test period 25 March - 16 June 2008 Client Selco A/S Betonvej Roskilde Denmark Tel.: Fax: Contact person Manufacturer Specifications Mr Jesper Højland jesperhojland@selco.com Selco A/S IACS E10: Rev. 5, Dec Test Specification for Type Approval. Test specification applicable, but not confined to, all equipment used for: - Control, protection and safety; - internal communication. IEC 60945: Fourth edition, 2002 Maritime navigation and radio communication equipment and systems - General requirements - Methods of testing and required test results. IEC 60533: Second edition, Electrical and electronic installations in ships - Electromagnetic compatibility. Results Test personnel No malfunctions were detected. The criteria for compliance are listed in Section 3.2. Karsten Kruse Jensen Henrik Egeberg Nielsen Poul Nørgaard Poul Terkelsen Olling Truelsen

3 Page 3 of 54 Date 19 June 2008 Project manager Henrik Funding Raun, B.Sc.E.E. DELTA Responsible Susanne Otto, B.Sc.E.E. DELTA

4 Page 4 of 54 Table of contents Page 1. Summary of test Test requirements Conclusion 7 2. Test objects Test object(s) Auxiliary equipment 9 3. General test conditions Test setup Criteria for compliance Functional test Standard environment Test sequence Test and results Power supply failure Power supply variations (permanent) Low temperature (cold) Dry heat Damp heat, cyclic Insulation resistance High voltage Resonance search (4 g) Endurance - random (4 grms) Electrostatic discharge Radiated radio frequency interference Conducted low frequency interference Conducted radio frequency interference Fast transients (burst) Slow transients (surge) Radiated emissions Conducted emissions Enclosure protection, IP 2X 23 Annex 1 List of instruments 24 Annex 2 Photos 26 Annex 3 Test record sheets - Conducted emissions 35 Annex 4 Test record sheets - Radiated emissions 42 Annex 5 Measurement curves - Vibration 47

5 Page 5 of 54 Annex 6 Functional test procedure (from Client) (This annex is informative and not part of the accredited report) 53

6 Page 6 of Summary of test 1.1 Test requirements Test Test method Power supply failure IACS E10:2006 Power supply variations IEC 60945:2002, IACS E10:2006 Low temperature (cold) IEC :2007 Dry heat IEC :2007 Damp heat (cyclic) IEC :2005 Insulation resistance IACS E10:2006 High voltage IACS E10:2006 Vibration (resonance search) IEC :2007 Vibration (endurance - random) IEC :1993 Electrostatic discharges IEC :2001 Radiated radio frequency interference IEC :2006 Conducted low frequency interference IACS E10:2006 Conducted radio frequency interference IEC :2004 Electrical fast transients (burst) IEC :2004 Slow transients (surge) IEC :2005 Radiated emissions CISPR 16-1:1999, CISPR 16-2:2002, Conducted emissions CISPR 16-1:1999, CISPR 16-2:2002, Enclosure protection, IP 2X IEC 60529:2001

7 Page 7 of Conclusion The test objects mentioned in this report meet the relevant requirements of the standards stated below. IACS E10:2004 IEC 60533:1999 IEC 60945:2002 The test results relate only to the object tested.

8 Page 8 of Test objects 2.1 Test object(s) Test object Name of test object Generator Controller Model / type C6200 Part no. C Serial no FCC ID - Manufacturer Selco A/S Supply voltage 24 VDC Comments The customer states as follows, regarding modifications of the test object: Modification 1: A capacitor of 10nF has been added to the reset pin 44 of the DSP (ADSP2184, IC8). Modification 2: A T-Filter 22nF has been added to the analogue output 1 and 2. Test object Name of test object Hand Terminal for C6200 Model / type C6250 Part no. C Serial no FCC ID - Manufacturer Selco A/S Supply voltage 24 VDC through CAN bus Comments -

9 Page 9 of Auxiliary equipment Auxiliary equipment Name of auxiliary equipment Sigma UI Module Model / type S6500 Part no. S Serial no FCC ID - Manufacturer Selco A/S Supply voltage 24 VDC Comments -

10 Page 10 of General test conditions 3.1 Test setup A drawing of the test setup is enclosed in Annex Criteria for compliance No change of the actual operational states of the test objects is allowed. However, temporary change is allowed during the power supply failure test. In addition, the following generic acceptance criteria for compliance were in force during the EMC immunity testing: Performance Criterion A: (For continuous phenomena): The EUT shall continue to operate as intended during and after the test. No degradation of performance or loss of function is allowed as defined in the relevant equipment standard and in the technical specification published by the manufacturer. Performance Criterion B: (For transient phenomena): The EUT shall continue to operate as intended after the tests. No degradation of performance or loss of function is allowed as defined in the technical specification published by the manufacturer. During the test, degradation or loss of function or performance which is self-recoverable is, however, allowed but no change of actual operating state or stored data is allowed. Performance Criterion C: Temporary degradation or loss of function or performance is allowed during and after the test, provided the function is selfrecoverable, or can be restored by the operation of the controls as defined in the relevant equipment standard and in the technical specification published by the manufacturer. 3.3 Functional test A functional test was performed before, during (if specified) and after each test. The functional test was carried out in accordance with the functional test procedure provided by the customer. The functional test procedure is given in Annex 6.

11 Page 11 of Standard environment Normal environmental condition: Temperature : 15 C - 35 C Humidity : 25 %RH - 75 %RH Air pressure : 86 kpa kpa (860 mbar mbar) Power supply voltage : U nom. ±3% 3.5 Test sequence

12 Page 12 of Test and results 4.1 Power supply failure Test methods IACS E10, Test No. 3. Procedure The power supply is interrupted 3 times within 5 minutes with a break time of 60 seconds. Normal power-up procedure is to be obtained after each power break. Results No malfunction was observed during the exposure, and the function of the test objects was OK after each exposure. One of the power supply failures was made during the boot sequence. Performance criterion: C. 4.2 Power supply variations (permanent) Test method IACS E10, Test No. 4. IEC 60945, Section Procedure (24 VDC input) U nom. = Nominal supply voltage = 24 VDC Exposures, each with a duration of 15 minutes, are performed at the following supply voltages: U 1 = Un +30 % = 31.2 VDC U 2 = Un -25 % = 18.0 VDC The test objects are observed during the exposures, and a functional test is performed at the end of each exposure. An additional power supply variations test is performed as part of the functional test during the low temperature and the dry heat test profiles.

13 Page 13 of 54 Results No malfunction was observed during the exposure, and the function of the test objects was OK after the exposure. Performance criterion: A. 4.3 Low temperature (cold) Test method IEC :2007, Test Ad: Cold for heat-dissipating object with gradual change of temperature. Severity and procedure Temperature : -15 C Duration : 16 hours The test objects are de-energised during the exposure. However, during the last 2 hours of the exposure, the test objects are energised and a functional test is performed. A power supply variations test ref. Section 4.2 is performed as part of the functional test during the low temperature test profile. After recovery, a functional test and an insulation resistance test are performed in standard environment. Results No malfunction was observed during the exposure and the function of the test objects was OK during the last 2 hours of the exposure and after recovery. 4.4 Dry heat Test method IEC :1974, Test Bd: Dry heat for heat-dissipating object with gradual change of temperature, Amendment 1 (1993), Amendment 2 (1994). Severity and procedure Temperature : +70 C Duration : 16 hours Humidity : Below 50 %RH

14 Page 14 of 54 The test objects are energised and in normal operating condition during the exposure. During the last hour of the exposure, a functional test is performed. A power supply variations test ref. Section 4.2 is performed as part of the functional test during the dry heat test profile. After recovery the functional test is repeated in standard environment. Results No malfunction was observed during the exposure and the function of the test objects was OK during the last 2 hours of the exposure and after recovery. 4.5 Damp heat, cyclic Test method IEC (2005), Test Db: Damp heat cyclic ( hours cycle), Variant 1. Severity and procedure Lower temperature : 25 C Humidity at lower temperature : >95 %RH Upper temperature : 55 C Humidity at upper temperature : 93 %RH Number of cycles : 2 During the first cycle, the test objects are energised and in normal operational mode. A functional test is performed during the first 2 hours of the 55 C phase. During the second cycle, the test objects are de-energised. However, during the last 2 hours of the second 55 C phase, the test objects are energised and a functional test is performed. After recovery the test objects are energised and a functional test and an insulation resistance test are performed in standard environment. Results No malfunction was observed during the exposure, and the function of the test objects was OK during the first and second cycle at 55 C and 93 %RH and after recovery. No corrosion attack was observed after the exposure.

15 Page 15 of Insulation resistance Test method IACS E10, Test No. 9. Procedure The insulation resistance is measured between shorted supply terminals and earth with 50 VDC for 24 VDC power ports. The insulation resistance has to be above 10 MΩ initially, and above 1 MΩ after the cold, damp heat and high voltage exposures. Results Cable designation DC power port Test condition Test voltage [Vrms] Duration [sec] Insulation resistance [MΩ] Initial 50 VDC 60 sec. > 10 MΩ After Low 50 VDC 60 sec. > 1 MΩ temperature test After Damp heat test 50 VDC 60 sec. > 1 MΩ After High voltage 50 VDC 60 sec. > 1 MΩ test 4.7 High voltage Test method IACS E10, Test No. 10. Procedure 550 VAC, 50 Hz is applied between shorted supply terminals and earth for 1 minute for the 24 VDC supply line. No flashover, breakdown etc. is acceptable. Results No flashover or breakdown was observed during the exposure. The insulation resistance was OK after the exposure.

16 Page 16 of Resonance search (4 g) Test method IEC :2007, Test Fc: Vibration (sinusoidal). Severity and procedure Frequency range : Hz Frequency / amplitude : 2-25 Hz : ± 1.6 mm Hz : ± 4 g Sweep rate : Max. 0.5 octave/min. Number of axes : 3 mutually perpendicular The test objects are de-energised during the exposure. During the resonance search, the resonance frequencies are determined by means of stroboscopic light with slow motion facility and accelerometer measurements of the amplification factors (Q). Resonance frequencies with an amplification factor above 2 are recorded. Results Amplification factor above 2 was recorded. Place of measurement Axis Frequency Amplification factor [Hz] X < 2 C6200 Y < 2 Z X < 2 C6250 Y < 2 Z Endurance - random (4 grms) The sinusoidal vibration test according to IACS E10 is replaced by random vibration test according to Environmental test specification for instrumentation and automation equipment No. 2.4, issued April 2006 by DNV. This random vibration test will cover the requirements of the sinusoidal vibration test according to IACS E10.

17 Page 17 of 54 Test method IEC :1993, Test Fh: Vibration, broadband random (digital control). Severity and procedure Frequency range : Hz Acceleration spectral : 2-25 Hz : +12 db/octave Density : Hz : 0.2 g 2 /Hz Total RMS level : 4.0 g Duration : 150 minutes per axis Number of axes : 3 mutually perpendicular The test objects are energised and in normal operational mode during the exposures. A functional test is performed during and after the exposure in each axis. A visual inspection is performed after the exposure. Results No malfunction was observed during the exposure and the function of the test specimens was OK during and after the exposure in each axis. No damage was observed after the exposures Electrostatic discharge Test method IEC :2001: Testing and measurement techniques - Electrostatic discharge immunity test. Severity and procedure Air discharge : 2, 4 and 8 kv Contact discharge : 2, 4 and 6 kv Energy storage capacitance : 150 pf Discharge resistance : 330 Ω Polarity : + and - Number of discharges : 10 per polarity at each test point The discharges are applied only to such points and surfaces of the test objects, which are accessible to personnel during normal use.

18 Page 18 of 54 Contact discharges are applied to conductive surfaces and coupling planes. Air discharges are applied to insulating surfaces. The test objects are energised and in normal operational mode during the exposure. The test objects are observed during the exposure, and a functional test is performed after the exposure. Results No malfunction was observed during the exposure and the function of the test objects was OK after the exposure. Performance criterion: B Radiated radio frequency interference Test method IEC :2006: Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test. Severity and procedure Frequency range : MHz Field strength : 10 V/m Modulation : 80 % AM, 1000 Hz sine wave The test is performed in a semi anechoic room. The field is generated using linearly polarised broadband antennas. The test objects are energised and in normal operational mode during the exposure. The test objects are observed during the exposure and a functional test is performed after the exposure. Results No malfunction was observed during the exposure and the function of the test objects was OK after the exposure. Performance criterion: A.

19 Page 19 of Conducted low frequency interference Test method IACS E10:2006, Test No. 15. Severity and procedure Frequency range : khz Amplitude (DC-supplied) : khz : 10 % of U nom./ min. 3 Vrms Maximum applied power : 2.0 W The impedance of the test generator is less than 1 Ω. The test signal is superimposed on the power supply lines via a coupling transformer. The test objects are energised and in normal operational mode during the exposure. The test objects are observed during the exposure, and a functional test is performed after the exposure. Results No malfunction was observed during the exposure, and the function of the test objects was OK after the exposure. Performance criterion: A Conducted radio frequency interference Test method IEC :2004: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields. Severity and procedure Frequency range : 150 khz - 80 MHz Amplitude : MHz : 10 Vrms Modulation : 80 % AM, 400 Hz sine wave Sweep rate : MHz : decades/s The test objects are supplied with power via a coupling / decoupling network. The test signal is coupled to the power lines and signal lines via coupling networks. The coupling impedance is 150 Ω.

20 Page 20 of 54 The test objects are energised and in normal operational mode during the exposure. The test objects are observed during the exposure, and a functional test is performed after the exposure. Results No malfunction was observed during the exposure, and the function of the test objects was OK after the exposure. Performance criterion: A Fast transients (burst) Test method IEC :2004: Testing and measurement techniques - Section 4: Electrical fast transient / burst immunity test. Severity and procedure Amplitude : 2 kv on power lines : 1 kv on signal lines Pulse rise time : 5 ns Pulse duration : 50 ns Generator impedance : 50 Ω Repetition rate : 5 khz Burst duration : 15 ms Burst period time : 300 ms The test objects are supplied with power via a transient coupling network. The test signal is successively coupled to each power line and protective earth with reference to the ground plane. The test signal is injected on the signal lines using a capacitive coupling clamp. The clamp is successively used on selected signal cables. The test signal is injected on the power lines for 5 minutes, using each coupling mode and each polarity, and then on the signal lines for 5 minutes using each polarity. The test objects are energised and in normal operational mode during the exposure. The test objects are observed during the exposure and a functional test is performed after the exposure.

21 Page 21 of 54 Results No malfunction was observed during the exposure and the function of the test objects was OK after the exposure. Performance criterion: B Slow transients (surge) Test method IEC :2005: Testing and measurement techniques - Surge immunity test. Severity and procedure Amplitude power ports : 1 kv line-to-earth, 0.5 kv line-to-line Voltage rise time : 1.2 µs (open circuit) Voltage decay time : 50 µs (open circuit) The impedance of the test generator is 2 Ω for line-to-line coupling and 12 Ω for line-toearth coupling. The test objects are energised and in normal operational mode during the exposure. The test objects are observed during the exposure, and a functional test is performed after the exposure. Results No malfunction was observed during the exposure and the function of the test objects was OK after the exposure. Performance criterion: B Radiated emissions Test methods CISPR 16-1:1999: Specification for radio disturbance and immunity measuring apparatus and methods - Part 1: Radio disturbance and immunity measuring apparatus. CISPR 16-2:2002: Specification for radio disturbance and immunity measuring apparatus and methods. Part 2: Methods of measurement of disturbances and immunity.

22 Page 22 of 54 Severity and procedure General power distribution zone. Frequency range : MHz Limits (quasi-peak) : MHz : dbμv/m MHz : dbμv/m MHz : 54 dbμv/m, except for MHz : 24 dbμv/m The electric field is measured with antennas at a distance of 3 m. The measuring bandwidth is 200 Hz in the frequency range 10 khz khz, 9 khz in the frequency range 150 khz - 30 MHz and 120 khz in the frequency range 30 MHz MHz, except for the frequency range 156 MHz MHz where the measuring bandwidth is 9 khz. The test objects are energised and in normal operational mode during the measurement. Results The radiated emissions were within the specified limits. Test record sheets of the radiated emission measurements are enclosed in Annex Conducted emissions Test methods CISPR 16-1:1999: Specification for radio disturbance and immunity measuring apparatus and methods - Part 1: Radio disturbance and immunity measuring apparatus. CISPR 16-2:2002: Specification for radio disturbance and immunity measuring apparatus and methods. Part 2: Methods of measurement of disturbances and immunity. Severity and procedure General power distribution zone. Frequency range : MHz Limits (quasi-peak) : MHz : dbμv MHz : 79 dbμv MHz : 73 dbμv The radio frequency voltage is measured at the power supply terminals of the test object by a receiver through an artificial mains network.

23 Page 23 of 54 The measuring bandwidth is 200 Hz in the frequency range 10 khz khz and 9 khz in the frequency range 150 khz - 30 MHz. The test objects are energised and in normal operational mode during the measurement. Results The conducted emissions were within the specified limits. Test record sheets of the conducted emission measurements are enclosed in Annex Enclosure protection, IP 2X Test method IEC 60529:2001: Degrees of protection provided by enclosures (IP Code). Severity and procedure The test specimen was subjected to a test corresponding to IEC 60529:2001, table 1, first characteristic numeral 2 (IP 2X): Protection against access to hazardous parts with a finger, and thus IEC 60945:2001, clause 12.1: Protection against access to dangerous voltages. Results The test objects have adequate protection against access to hazardous parts with a finger, i.e. no openings greater than 12 mm Ø were measured.

24 Page 24 of 54 Annex 1 List of instruments

25 Page 25 of 54 List of instruments NO. DESCRIPTION MANUFACTURER TYPE NO. Y221A EL.DYN SHAKER LING DYNAMICS V Acc. 91 ACCELEROMETER BRÜEL & KJÆR ACCELEROMETER BRÜEL & KJÆR 4393 Acc. 72 ACCELEROMETER BRÜEL & KJÆR ACCELEROMETER BRÜEL & KJÆR ACCELEROMETER BRÜEL & KJÆR ACC. PRE-AMP. BRÜEL & KJÆR ACC. PRE-AMP. 4-CHAN. BRÜEL & KJÆR VIBR. CONTROLLER SIGNALSTAR VECTOR U VOLTMETER HEWLETT-PACKARD 34401A OSCILLOSCOPE ISOTECH ISR620 EVFGT-19 CLIMATIC CHAMBER DELTA VKF875-3 EVFGT-28 CLIMATIC CHAMBER DELTA VF CURRENT PROBE SINGER REFLECTOMETER COUPLER, MHz ROHDE & SCHWARZ ZPD CURRENT PROBE AMPLIFIER FOR AND TEKTRONIX TM501 & AM503T GHz. SYNTH. SWEEPER HEWLETT-PACKARD 83620A GHz. HORN ANTENNA. LOGIMETRICS AN 8200 F HF CURRENT INJ. CLAMP LUTHI EM LF POWER AMPLIFIER BRÜEL & KJÆR DIGITAL MULTIMETER W. HPIB HEWLETT-PACKARD 34401A RF ATTENUATOR, 50 OHM, 10 db, DC-12.4 GHz SUHNER A BROADBAND POWER AMPLIFIER, 10 khz-220 MHz, 75 W AMPLIFIER RESEARCH 75A LINE CDN NETWORK, IEC MEB M LINE CDN NETWORK, IEC MEB M dbc VOLTAGE SAMPLER, DC-100 MHz DELTA EMC DEPT. SAMPLER_VER_ RF GENERATOR, 9 khz-2.4 GHz MARCONI CAPACITIVE COUPLING CLAMP DELTA EMC IEC CAPACITIVE COUPLING CLAMP DELTA EMC IEC DIFFERENTIAL HIGH VOLTAGE PROBE, DC-25 MHz TEKTRONIX P DIGITAL MULTIMETER W. HPIB HEWLETT-PACKARD 34401A ELECTRICAL FAST TRANSIENT (BURST) GENERATOR EM TEST EFT ELECTRONIC SURGE GENERATOR EM TEST VCS SAMPLING OSCILLOSCOPE, 100 MHz, 500 MS/s TEKTRONIX TDS 340A RF POWER ATTENUATOR, 50 OHM, 6 db, 150 W NARDA RF POWER AMPLIFIER, GHz, 200W MILMEGA AS ESD GENERATOR, AIR AND CONTACT DISCHARGE EM TEST ESD 30, P18 & P SINGLE CHANNEL POWER METER DISPLAY UNIT ROHDE & SCHWARZ NRVS CABLE#36, 3,25 M, 50 OHM, COAX CABLE, N(STRAIGHT)-7/16, ROOM1 SUHNER RG 214/U ACTIVE CURRENT PROBE HEAD FOR TEKTRONIX A SHIELD-LINE CDN NETWORK, IEC DELTA EMC DEPT. SHIELD-LINE CDN COAX RF DIODE DETECTOR, NEG. OUTPUT, CS TEST AGILENT 8471D COAX RF DIODE DETECTOR, NEG. OUTPUT, CS TEST AGILENT 8471D 15 MHz FUNCTION / ARBITRARY WAVE GENERATOR HEWLETT-PACKARD 33120A

26 Page 26 of 54 Annex 2 Photos

27 Page 27 of 54 Photo 1. Vibration, resonance search, C6200. Photo 2. Vibration, resonance search, C6250.

28 Page 28 of 54 Photo 3. Vibration, endurance, e.g. Z-axis. Photo 4. Radiated emissions ( MHz).

29 Page 29 of 54 Photo 5. Radiated emissions ( MHz). Photo 6. Conducted emissions.

30 Page 30 of 54 Photo 7. Radiated radio frequency interference ( MHz). Photo 8. Radiated radio frequency interference ( MHz).

31 Page 31 of 54 Photo 9. Conducted radio frequency interference. Photo 10. Conducted low frequency interference.

32 Page 32 of 54 Photo 11. Electrostatic discharge. Photo 12. Slow transients (surge).

33 Page 33 of 54 Photo 13. Fast transients (burst). Photo 14. Climatic testing, in test chamber.

34 Page 34 of 54 Photo 15. Climatic testing, test setup.

35 Page 35 of 54 Annex 3 Test record sheets - Conducted emissions

36 Page 36 of 54 DELTA Electronics Testing, EMC Section EUT: C6200 & C6250 Manufacturer: Selco A/S Operating Condition: Line: Line. Power input: BUSBAR Voltage, 230 VAC Test Site: EMC - 4 Operator: KKJ - A Test Specification: IEC 60945, E10 Comment: Sheet 06 Start of Test: SCAN TABLE: "CE PK" Unit: dbµv Detector: Mode: Curve 1: MaxPeak ClearWrite 100 Level [dbµv] x x xxx x x x xx xx x xx xx x x x 0 10k 30k 100k 300k 1M 2M 4M 10M 30M Frequency [Hz] x MES CE PK MaxPk MES CE QP QPk LIM CE, IEC 60945, QP Conducted Emission LIM CE, E-10 deck bridge Conducted Emission

37 Page 37 of 54 DELTA Electronics Testing, EMC Section EUT: C6200 & C6250 Manufacturer: Selco A/S Operating Condition: Line: Neutral. Power input: BUSBAR Voltage, 230 VAC Test Site: EMC - 4 Operator: KKJ - A Test Specification: IEC 60945, E10 Comment: Sheet 07 Start of Test: SCAN TABLE: "CE PK" Unit: dbµv Detector: Mode: Curve 1: MaxPeak ClearWrite 100 Level [dbµv] x xxx x xx k 30k 100k 300k 1M 2M 4M 10M 30M Frequency [Hz] x MES CE PK MaxPk MES CE QP QPk LIM CE, IEC 60945, QP Conducted Emission LIM CE, E-10 deck bridge Conducted Emission

38 Page 38 of 54 DELTA Electronics Testing, EMC Section EUT: C6200 & C6250 Manufacturer: Selco A/S Operating Condition: Line: Line. Power input: Generator Voltage, 230 VAC Test Site: EMC - 4 Operator: KKJ - A Test Specification: IEC 60945, E10 Comment: Sheet 08 Start of Test: Level [dbµv] x x xx k 30k 100k 300k 1M 2M 4M 10M 30M Frequency [Hz] x MES CE PK MaxPk MES CE QP QPk LIM CE, IEC 60945, QP Conducted Emission LIM CE, E-10 deck bridge Conducted Emission

39 Page 39 of 54 DELTA Electronics Testing, EMC Section EUT: C6200 & C6250 Manufacturer: Selco A/S Operating Condition: Line: Neutral. Power input: Generator Voltage, 230 VAC Test Site: EMC - 4 Operator: KKJ - A Test Specification: IEC 60945, E10 Comment: Sheet 09 Start of Test: Level [dbµv] x x x xx x xxxx x xx x x xx x xx x x xx 0 10k 30k 100k 300k 1M 2M 4M 10M 30M Frequency [Hz] x MES CE PK MaxPk MES CE QP QPk LIM CE, IEC 60945, QP Conducted Emission LIM CE, E-10 deck bridge Conducted Emission

40 Page 40 of 54 DELTA Electronics Testing, EMC Section EUT: C6200 & C6250 Manufacturer: Selco A/S Operating Condition: Line: Pos. Power input: AUX Supply, 24VDC Test Site: EMC - 4 Operator: KKJ - A Test Specification: IEC 60945, E10 Comment: Sheet 10 Start of Test: Level [dbµv] k 30k 100k 300k 1M 2M 4M 10M 30M Frequency [Hz] MES CE PK MaxPk LIM CE, IEC 60945, QP Conducted Emission LIM CE, E-10 deck bridge Conducted Emission

41 Page 41 of 54 DELTA Electronics Testing, EMC Section EUT: C6200 & C6250 Manufacturer: Selco A/S Operating Condition: Line: Neg. Power input: AUX Supply, 24VDC Test Site: EMC - 4 Operator: KKJ - A Test Specification: IEC 60945, E10 Comment: Sheet 11 Start of Test: Level [dbµv] k 30k 100k 300k 1M 2M 4M 10M 30M Frequency [Hz] MES CE PK MaxPk LIM CE, IEC 60945, QP Conducted Emission LIM CE, E-10 deck bridge Conducted Emission

42 Page 42 of 54 Annex 4 Test record sheets - Radiated emissions

43 Page 43 of 54 DELTA Electronics Testing EMC Section EUT: C6200 & C6250 Manufacturer: Selco A/S Operating Condition: Ant: Activ loop 0 Deg. Voltage: 24 VDC and 230 VAC Test Site: EMC - 5 Operator: PFN - A Test Specification: E10 & IEC & IEC Comment: Sheet 04 Start of Test: / 13:20:40 80 Level [dbµv/m] k 300k 500k 1M 2M 3M 5M 7M 10M 30M Frequency [Hz] MES ME IEC 945 (0 MaxPk LIM ME, IEC60533, QP Magnetic Emission LIM ME, IEC 60945, QP Magnetic Emission LIM ME, E10, QP Magnetic Emission

44 Page 44 of 54 DELTA Electronics Testing EMC Section EUT: C6200 & C6250 Manufacturer: Selco A/S Operating Condition: Ant: Activ loop 90 Deg. Voltage: 24 VDC and 230 VAC Test Site: EMC - 5 Operator: PFN - A Test Specification: E10 & IEC & IEC Comment: Sheet 05 Start of Test: / 13:20:40 80 Level [dbµv/m] x k 300k 500k 1M 2M 3M 5M 7M 10M 30M Frequency [Hz] x MES ME IEC 945 (90 MaxPk MES mfield 0001_fin QP LIM ME, IEC 60945, QP Magnetic Emission LIM ME, E10, QP Magnetic Emission

45 Page 45 of 54 DELTA Electronics Testing EMC Section EUT: C6200 and C6250 Manufacturer: Selco A/S Operating Condition: Ant. 1 m vertical Test Site: EMC - 5 Operator: HEN - A Test Specification: IEC 60945, E10 and IEC Comment: Sheet 12 Start of Test: Level [dbµv/m] 50 x x x 40 x x x M 50M 70M 100M 200M 300M 500M 1G 2G Frequency [Hz] x MES Maximering_fin QP MES IEC945 1m 30 MaxPk 1 LIM RE, IEC Radiated Emission MEASUREMENT RESULT: "Maximering_fin QP" :07 Frequency Level Transd Limit Margin Height Azimuth Polarisation MHz dbµv/m db dbµv/m db cm deg VERTICAL HORIZONTAL VERTICAL VERTICAL VERTICAL VERTICAL

46 Page 46 of 54 DELTA Electronics Testing EMC Section EUT: C6200 and C6250 Manufacturer: Selco A/S Operating Condition: Ant. 4 m horizontal Test Site: EMC - 5 Operator: HEN - A Test Specification: IEC 60945, E10 and IEC Comment: Sheet 13 Start of Test: Level [dbµv/m] 50 x x x 40 x x x M 50M 70M 100M 200M 300M 500M 1G 2G Frequency [Hz] x MES IEC945 4m 30 MaxPk 1 MES IEC945 4m 30 MaxPk 3 MES Maximering_fin QP LIM RE, IEC Radiated Emission

47 Page 47 of 54 Annex 5 Measurement curves - Vibration

48 Page 48 of 54 CH Mea1/Mea5 X: Y : LogMag, Ratio m 10.0m SKIB_4_RES start 09:07:13 Frequency, Hz test date Curve 1 Resonance search, X-axis (max. ampl. fact.), C6200. CH Mea1/Mea5 X: Y : LogMag, Ratio m 10.0m SKIB_4_RES start 12:30:27 Frequency, Hz test date Curve 2 Resonance search, Y-axis (max. ampl. fact.), C6200.

49 Page 49 of 54 CH Mea1/Mea5 X: Y : LogMag, Ratio m 10.0m SKIB_4_RES start 16:09:20 Frequency, Hz test date Curve 3 Resonance search, Z-axis (max. ampl. fact.), C6200. CH Mea4/Mea5 X: Y: LogMag, Ratio m 10.0m SKIB_4_RES start 09:07: test date Frequency, Hz Curve 4 Resonance search, X-axis (max. ampl. fact.), C6250.

50 Page 50 of 54 CH Mea4/Mea5 X: Y: LogMag, Ratio m 10.0m SKIB_4_RES start 09:23: test date Frequency, Hz Curve 5 Resonance search, Y-axis (max. ampl. fact.), C6250. CH Mea4/Mea5 X: Y: LogMag, Ratio m 10.0m SKIB_4_RES start 16:09: test date Frequency, Hz Curve 6 Resonance search, Z-axis (max. ampl. fact.), C6250.

51 Page 51 of m LogMag, g²/hz 10.0m 1.0m 100.0u 10.0u RMS: u Frequency, Hz SKBDNV4GRMS start 09:36:13 test date Curve 7 Endurance vibration, X-axis, 4 g rms m LogMag, g²/hz 10.0m 1.0m 100.0u 10.0u RMS: u Frequency, Hz SKBDNV4GRMS start 12:41:53 test date Curve 8 Endurance vibration, Y-axis, 4 g rms.

52 Page 52 of m LogMag, g²/hz 10.0m 1.0m 100.0u 10.0u RMS: u Frequency, Hz SKBDNV4GRMS start 16:25:01 test date Curve 9 Endurance vibration, Z-axis, 4 g rms.

53 Page 53 of 54 Annex 6 Functional test procedure (from Client) (This annex is informative and not part of the accredited report)

54 Page 54 of 54 C6200 Test description 1. Attach 9VDC batteries to the 3 wire s ALARM, PROT TRIP and PROGRAMMABLE OUTPUTS 2. Attach 24VDC to AUX SUPPLY on C6200 and see AUX SUPPLY led light up 3. Attach CANBUS connection between C6200 and S Attach 24VDC to S6500 AUX module, after a few seconds it will show the BUS and GEN Voltage on the display. 5. Attach C6250, after a few seconds it will show data on the display 6. Attach 220VAC to GENERATOR VOLTAGE and BUSBAR VOLTAGE and see the GENERATOR VOLTAGE and BUSBAR VOLTAGE led s light up, and see 220VAC in the display s of the S6500 and the C The green SYNC led on C6200 will now light up 8. Bridge C/B and see the C/B led on the C6200 and the C/B CLOSED led on the S6500 light up 9. Bridge PROGRAMMABLE INPUTS and see led 1 on PROGRAMMABLE INPUTS and PROGRAMMABLE OUTPUTS light up. 10. Attach a voltmeter on PAR LINES and measure 5VDC 11. Attach a voltmeter on ANA OUT and measure 5VDC 12. Attach a voltmeter on GOV CONTROL and measure 5VDC 13. Attach a voltmeter on AVR CONTROL and measure 500HZ with a duty cycle at 50% 14. Bridge ANA IN 15. Attach the RS485 cable from laptop to RS485 on the C Run the C6200_RS485 test on the laptop 17. push the start button on the C6200_RS485 test program on the laptop 18. The unit are now ready for test 19. It is consider an error if any of the led s on the C6200 alters its state