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2 Seite 2 von 27 Page 2 of 27 TEST SUMMARY HARMONICS ON AC MAINS RESULT: Passed VOLTAGE FLUCTUATIONS ON AC MAINS RESULT: Passed TERMINAL CONTINUOUS DISTURBANCE VOLTAGE AT RESULT: Passed RADIATED ELECTROMAGNETIC DISTURBANCES RESULT: Passed RADIATED ELECTROMAGNETIC DISTURBANCES RESULT: Passed RADIO-FREQUENCY ELECTROMAGNETIC FIELD (RS) RESULT: Passed INJECTED CURRENTS / CONDUCTED SUSCEPTIBILITY (CS) RESULT: Passed ELECTRICAL FAST TRANSIENTS (EFT) RESULT: Passed SURGE RESULT: Passed ELECTROSTATIC DISCHARGES (ESD) RESULT: Passed VOLTAGE DIP AND INTERRUPTION RESULT: Passed

3 Seite 3 von 27 Page 3 of 27 Contents 1. GENERAL REMARKS COMPLEMENTARY MATERIALS TEST SITES TEST FACILITIES LIST OF TEST AND MEASUREMENT INSTRUMENTS GENERAL PRODUCT INFORMATION PRODUCT FUNCTION AND INTENDED USE RATINGS AND SYSTEM DETAILS INDEPENDENT OPERATION MODES NOISE GENERATING AND NOISE SUPPRESSING PARTS SUBMITTED DOCUMENTS TEST SET-UP AND OPERATION MODES PRINCIPLE OF CONFIGURATION SELECTION TEST OPERATION AND TEST SOFTWARE SPECIAL ACCESSORIES AND AUXILIARY EQUIPMENT COUNTERMEASURES TO ACHIEVE EMC COMPLIANCE TEST RESULTS E M I S S I O N EMISSION IN THE FREQUENCY RANGE UP TO 30 MHZ Harmonics on AC Mains Voltage Fluctuations on AC Mains Terminal Continuous Disturbance Voltage at Radiated Electromagnetic Disturbances EMISSION IN THE FREQUENCY RANGE ABOVE 30 MHZ Radiated Electromagnetic Disturbances TEST RESULTS I M M U N I T Y CLASSIFICATION OF APPARATUS CONTINUOUS DISTURBANCES Radio-Frequency Electromagnetic Field (RS) Injected Currents / Conducted Susceptibility (CS) TRANSIENT DISTURBANCES Electrical Fast Transients (EFT) Surge Electrostatic Discharges (ESD) POWER SUPPLY ALTERATIONS Voltage Dip and Interruption PHOTOGRAPHS OF THE TEST SET-UP... 22

4 Seite 4 von 27 Page 4 of LIST OF TABLES LIST OF PHOTOGRAPHS General Remarks 1.1 Complementary Materials All attachments are integral parts of this test report. This applies especially to the following appendix: Appendix 1: Test result Appendix 2: Measurement Uncertainties 2. Test Sites 2.1 Test Facilities Shenzhen EMTEK Co., Ltd. Bldg 69, Majialong Industry Zone, Nanshan District, Shenzhen, Guangdong, China The tests at the test site have been conducted under the supervision of a TÜV engineer.

5 Seite 5 von 27 Page 5 of List of Test and Measurement Instruments Table 1: List of Test and Measurement Equipment Kind of Equipment Manufacturer Type S/N Calibrated until Conducted Emission (Emtek) Test Receiver Rohde & Schwarz ESCS / L.I.S.N. Schwarzbeck NNLK Coaxial Switch Anritsu MP59B M Pulse Limiter Rohde & Schwarz ESH3-Z Voltage Probe Rohde & Schwarz TK9416 N/A I.S.N Rohde & Schwarz ENY Radiated Emission (9k-300MHz) (Emtek) Test Receiver Rohde & ESCS / Schwarz Loop Antenna Laplace RF Instrument Ltd Pulse Limiter Rohde & ESH3-Z Schwarz RF Cable FUJIKURA RG-55/U LISN Cable Coaxial Switch Anritsu MP59B M Radiated Emission (30M-300MHz) (Emtek) EMI Test Receiver Rohde & Schwarz ESU Pre-Amplifier HP 8447D 2944A Bilog Antenna Schwarzbeck VULB Loop Antenna ARA PLA-1030/B Horn Antenna Schwarzbeck BBHA 9170 BBHA Horn Antenna Schwarzbeck BBHA 9120 D Cable Schwarzbeck AK9513 ACRX Cable Rosenberger N/A FP2RX Cable Schwarzbeck AK9513 CRPX Cable Schwarzbeck AK9513 CRRX ESD (Emtek) ESD Tester TESEQ AG NSG Radio-Frequency Strength Susceptibility (Emtek) RF Power Meter. Dual BOONTON 4232A Channel 50ohm Diode Power BOONTON 51011EMC 34236/ Sensor Broad-Band Horn SCHWARZBECK BBHA Antenna L3F Power Amplifier PRANA AP32MT215 N/A Power Amplifier MILMEGA AS N/A Signal Generator AEROFLEX 2023B N/A Field Strength Meter HOLADAY HI-6005 N/A RS232 Fiber Optic HOLADAY HI-4413P N/A Modem Log.-Per. Antenna SCHWARZBECK VULP 9118E N/A

6 Seite 6 von 27 Page 6 of 27 Kind of Equipment Manufacturer Type S/N Calibrated until Electrical Fast Transient /Burst (Emtek) Burst Tester HAEFELY PEFT Coupling Clamp HAEFELY IP-4A Surge (Emtek) Surge Controller HAEFELY Psurge Impulse Module HAEFELY PIM Coupling Decoupling HAEFELY PCD Filter Coupling Module HAEFELY PCD Surge Impulse Module HAEFELY PIM Coupling Module HAEFELY PCD 126A Impulse Module HAEFELY PIM Injected Current Susceptibility (Emtek) Simulator EMTEST CWS500C CDN EMTEST CDN-M CDN EMTEST CDN-M Injection Clamp EMTEST F MM Attenuator EMTEST ATT A Harmonic & Voltage Dips and Interruptions (Emtek) 45KVA AC Power source Teseq NSG A /45KVA Teseq CCN A Signal conditioning Unit Three phase impedance Teseq/Germany INA2197/37A 1305A02873 N/A network Three phase impedance Teseq/Germany INA 1305A02874 N/A network Profline 2100 AC Switching Unit 2196/75A Teseq/Germany NSG A22714 N/A

7 Seite 7 von 27 Page 7 of General Product Information 3.1 Product Function and Intended Use The EUTs are LED Tubes for illumination purpose. All models have the same construction and diagram circuit, model list and models differences are shown as below: Model name Wattage length LED (A) Alt. LED (B) ZY-T8-8W600 9 W 0,6 m ZY-T8-10W W 0,6 m ZY-T8-15W W 0,6 m ZY-T8-10W600U Shape 10 W 0,6 m ZY-T8-15W600U Shape 15 W 0,6 m ZY-T8-18W600U Shape 18 W 0,6 m ZY-T8-10W W 0,9 m ZY-T8-13W W 0,9 m ZY-T8-15W W 0,9 m ZY-T8-18W W 0,9 m ZY-T8-10W W 1,2 m ZY-T8-13W W 1,2 m ZY-T8-15W W 1,2 m ZY-T8-18W W 1,2 m ZY-T8-22W W 1,2 m ZY-T8-10W W 1,5 m ZY-T8-13W W 1,5 m ZY-T8-15W W 1,5 m ZY-T8-18W W 1,5 m ZY-T8-22W W 1,5 m ZY-T8-25W W 1,2 m ZY-T8-27W W 1,2 m ZY-T8-25W W 1,5 m ZY-T8-27W W 1,5 m ZY-T8-30W W 1,5 m For more information refer to the Circuit diagram & Instruction Manual. 3.2 Ratings and System Details System input voltage: AC V Frequency: 50-60Hz Rated input power: See clause 3.1. Protection class: II

8 Seite 8 von 27 Page 8 of Independent Operation Modes The basic operation modes are: A. On. B. Off. 3.4 Noise Generating and Noise Suppressing Parts Refer to the Schematic Diagram. 3.5 Submitted Documents - Schematic diagram - Instruction manual - Bill of Material - Rating label

9 Seite 9 von 27 Page 9 of Test Set-up and Operation Modes 4.1 Principle of Configuration Selection Emission: The equipment under test (EUT) was configured to measure its highest possible radiation level. The test modes were adapted accordingly in reference to the instructions for use. Immunity: The equipment under test (EUT) was configured to have its highest possible susceptibility against the tested phenomena. The test modes were adapted accordingly in reference to the instructions for use. 4.2 Test Operation and Test Software Test operation refers to test setup in chapter 5 & 6. Full tests were only applied to model of ZY-T8-30W1500, due to models difference indicated in clause Special Accessories and Auxiliary Equipment None. 4.4 Countermeasures to achieve EMC Compliance The test sample, which has been tested, contained the noise suppression parts as described in the Constructional Data Form or the Technical Construction File. No additional measures were employed to achieve compliance.

10 Seite 10 von 27 Page 10 of Test Results E M I S S I O N 5.1 Emission in the Frequency Range up to 30 MHz Harmonics on AC Mains RESULT: Passed Date of testing : Test procedure : EN :2006+A1+A2 Class : C Limit : Table 2 Measuredharmonics : 1 40 Test setup Input Voltage : AC 230V±2%, 50Hz Operation Condition : According to Annex C.5 Operation mode : A Earthing : Not connected Refer to attached Appendix 1. Remark: for models with active power less than 25W, according to CTL decision DSH: 617, a LED is not considered as an incandescent lamp, and neither as a discharge lamp. Hence those models are deemed to fulfill the requirement without testing. Test was carried out on ZY-T8-30W1500 only.

11 Seite 11 von 27 Page 11 of Voltage Fluctuations on AC Mains RESULT: Passed Test procedure : EN :2008 Limit : Clause 5 Frequency range : 0-2kHz The max. power of the EUTs is 30W only, which is unlikely to produce significant voltage fluctuation. Therefore no test was applied. See clause 6.1*** *** EN :2008, clause 6.1:... Tests need not be made on equipment which is unlikely to produce significant voltage fluctuations or flicker....

12 Seite 12 von 27 Page 12 of Terminal Continuous Disturbance Voltage at AC Mains RESULT: Passed Date of testing : Test standard : EN 55015:2006+A1+A2 Frequency range : MHz Limits : Table 2a Kind of test site : Shielded room Test setup Input Voltage : AC V, 50-60Hz Operation Condition : According to Clause 5.4, 6 & 8.6 Operation mode : A Earthing : Not connected Refer to attached Appendix 1.

13 Seite 13 von 27 Page 13 of Radiated Electromagnetic Disturbances RESULT: Passed Date of testing : Test standard : EN 55015:2006+A1+A2 Frequency range : MHz Limits : Table 3a Kind of test site : Shielded room Test setup Input Voltage : AC V, 50-60Hz Operation Condition : According to Clause 5.4, 6 & 9.6 Operation mode : A Earthing : Not connected Refer to attached Appendix 1

14 Seite 14 von 27 Page 14 of Emission in the Frequency Range above 30 MHz Radiated Electromagnetic Disturbances RESULT: Passed Date of testing : Test standard : EN 55015:2006+A1+A2 Basic standard : CISPR 22:2005 Frequency range : MHz Limits : Table 3b of EN 55015:2006+A1+A2 Kind of test site : 3m semi-anechoic chamber Test setup: Input Voltage : AC V, 50-60Hz Operation Condition : According to Clause 5.4, 6 & 9.6 Operation mode : A Earthing : Not connected Refer to attached Appendix 1

15 Seite 15 von 27 Page 15 of Test Results I M M U N I T Y 6.1 Classification of apparatus According to EN 61547:2009, the EUTs belong to Self-Ballasted Lamp, and shall be tested in accordance with clause 5 and comply with the performance criterion of table 13. Continuous Disturbance Radio-Frequency Electromagnetic Fields (RS) Injected Currents Power Frequency Magnetic Fields * Criterion A Criterion A Criterion A Transient Disturbance Fast Transient (EFT) Surge Electrostatic Discharges (ESD) Criterion B Criterion C Criterion B Power supply Alterations Voltage Dips and Interruptions 30% Voltage Reduction, 10 Periods 100% Voltage Reduction, 0.5 Periods Criterion C Criterion B Remark: * Power Frequency Magnetic Fields is not applicable, since the EUTs do not contain any components susceptible to magnetic fields.

16 Seite 16 von 27 Page 16 of Continuous Disturbances Radio-Frequency Electromagnetic Field (RS) RESULT: Passed Date of Testing : Test Specification : EN 61547:2009, Table 2 Basic Standard : IEC :2006 Criterion : A Frequency Range : 80 1,000MHz Test Level : 3V/m (Unmodulated, rms) Modulation : 80% AM, 1kHz Test setup Input Voltage : AC V, 50-60Hz Operation Mode : A Earthing : Not connected Ambient Temperature : Refer to Appendix 1 Relative Humidity : Refer to Appendix 1 Atmospheric Pressure : Refer to Appendix 1 Refer to attached Appendix 1

17 Seite 17 von 27 Page 17 of Injected Currents / Conducted Susceptibility (CS) RESULT: Passed Date of testing : Test Specification : EN 61547:2009, Table 9 Basic Standard : IEC :2006 Criterion : A Frequency range : MHz Source impedance : 150Ω Test level : Level2 (3V) (unmodulated, rms.) Modulation : AM 80%, 1kHz sine-wave Sweep mode : automatic Sweep rate : < decade / sec. Test setup Input Voltage : AC V, 50-60Hz Operation Mode : A Earthing : Not connected Ambient temperature : Refer to Appendix 1 Relative humidity : Refer to Appendix 1 Atmospheric pressure : Refer to Appendix 1 Refer to attached Appendix 1

18 Seite 18 von 27 Page 18 of Transient Disturbances Electrical Fast Transients (EFT) RESULT: Passed Date of testing : Test Specification : EN 61547:2009, Table 6 Basic Standard : IEC :2004 Criterion : B Test level : ±1kV Test duration : 60sec Rise time : 5/50ns Repetition frequency : 5 khz Test setup Input Voltage : AC V, 50-60Hz Operation Mode : A Earthing : Not connected Ambient temperature : Refer to Appendix 1 Relative humidity : Refer to Appendix 1 Atmospheric pressure : Refer to Appendix 1 Refer to attached Appendix 1

19 Seite 19 von 27 Page 19 of Surge RESULT: Passed Date of testing : Test Specification : EN 61547:2009, Table 10 Basic Standard : IEC :2005 Criterion : B Source impedance : 2Ω Test level : ±0.5kV Coupling phases : π/2, 3π/2 Number of surges : 5 (for each combination of parameters) Repetition rate : Max. 1/min Test Setup Input Voltage : AC V, 50-60Hz Operation Mode : A Earthing : Not connected Ambient temperature : Refer to Appendix 1 Relative humidity : Refer to Appendix 1 Atmospheric pressure : Refer to Appendix 1 Refer to attached Appendix 1

20 Seite 20 von 27 Page 20 of Electrostatic Discharges (ESD) RESULT: Passed Date of testing : Test Specification : EN 61547:2009, Table 1 Basic Standard : IEC :2001 Criterion : B Charge voltage : Level3 (±8kV) (air discharge) Level2 (±4kV) (contact discharge) Number of discharges : >10 Test Setup Input Voltage : AC V, 50-60Hz Operation Mode : A Earthing : Not connected Ambient temperature : Refer to Appendix 1 Relative humidity : Refer to Appendix 1 Atmospheric pressure : Refer to Appendix 1 Refer to attached Appendix 1

21 Seite 21 von 27 Page 21 of Power Supply Alterations Voltage Dip and Interruption RESULT: Passed Date of testing : Test Specification : EN 61547:2009, Table 11 & 12 Basic Standard : IEC :2004 Criterion : C - table 11 B - table 12 Test Setup Input Voltage : AC V, 50-60Hz Operation Mode : A Earthing : Not connected Ambient temperature : Refer to Appendix 1 Relative humidity : Refer to Appendix 1 Atmospheric pressure : Refer to Appendix 1 Refer to attached Appendix 1

22 Seite 22 von 27 Page 22 of Photographs of the Test Set-Up Photograph 1: Set-up for Disturbance Voltage Photograph 2: Set-up for Radiated Electromagnetic Disturbances (Table 3a)

23 Seite 23 von 27 Page 23 of 27 Photograph 3: Set-up for Radiated Electromagnetic Disturbances (Table 3b) Photograph 4: Set-up for Injected Currents on AC Mains (CS)

24 Seite 24 von 27 Page 24 of 27 Photograph 5: Set-up for Radio-Frequency Electromagnetic Field (RS) Photograph 6: Set-up for EFT on AC Mains

25 Seite 25 von 27 Page 25 of 27 Photograph 7: Set-up for Surge on AC Mains Photograph 8: Set-up for Harmonic & Voltage Dips on AC Mains

26 Seite 26 von 27 Page 26 of 27 Photograph 9: Set-up for Electrostatic Discharges (ESD)

27 Seite 27 von 27 Page 27 of List of Tables Table 1: List of Test and Measurement Equipment List of Photographs Photograph 1: Set-up for Disturbance Voltage...22 Photograph 2: Set-up for Radiated Electromagnetic Disturbances (Table 3a)...22 Photograph 3: Set-up for Radiated Electromagnetic Disturbances (Table 3b)...23 Photograph 4: Set-up for Injected Currents on AC Mains (CS)...23 Photograph 5: Set-up for Radio-Frequency Electromagnetic Field (RS)...24 Photograph 6: Set-up for EFT on AC Mains...24 Photograph 7: Set-up for Surge on AC Mains...25 Photograph 8: Set-up for Harmonic & Voltage Dips on AC Mains...25 Photograph 9: Set-up for Electrostatic Discharges (ESD)...26

28 Appendix Page 1 of 16

29 Appendix Page 2 of 16

30 Appendix Page 3 of 16

31 Appendix Page 4 of 16

32 Appendix Page 5 of 16

33 Appendix Page 6 of 16

34 Appendix Page 7 of 16

35 Appendix Page 8 of 16

36 Appendix Page 9 of 16

37 Appendix Page 10 of 16

38 Appendix Page 11 of 16

39 Appendix Page 12 of 16

40 Appendix Page 13 of 16

41 Appendix Page 14 of 16

42 Appendix Page 15 of 16

43 Appendix Page 16 of 16

44 Appendix Page 1 of 1 Measurement Uncertainties Where relevant, the following measurement uncertainty levels have been estimated for tests performed on the apparatus. The reported expanded uncertainty of measurement is stated as the standard uncertainty of measurement multiplied by the coverage factor of k=2, which for a normal distribution corresponds to a coverage probability of approximately 95%. Table 1: Measurement Uncertainty levels Test Conducted Emission Power disturbance Electromagnetic Radiated Emission (3-loop) Radiated Emission Radiated Emission Parameters Level accuracy (9kHz to 150kHz) (150kHz to 30MHz) Level accuracy (30MHz to 300MHz) Level accuracy (9kHz to 30MHz) Level accuracy (30MHz to 200MHz, Horizontal) (30MHz to 200MHz, Vertical) (200MHz to 1000MHz, Horizontal) (200MHz to 1000MHz, Vertical) Level accuracy (above 1000MHz, Horizontal) (above 1000MHz, Vertical) Expanded uncertainty (U lab ) ± 2.8 db ± 2.8 db Expanded uncertainty (U cispr ) ± 4.0 db ± 3.6 db ± 3.1 db ± 4.5 db ± 3.7 db N/A ± 3.3 db ± 3.2 db ± 4.0 db ± 4.2 db ± 3.7 db ± 3.6 db ± 5.2 db N/A Mains Harmonic Voltage ± 0.07% N/A Voltage Fluctuations & Flicker Voltage ± 1.8% N/A As U lab in all applicable tests listed above are less than U cispr according to CISPR :2003, compliance is deemed to occur if no measured disturbance exceeds the disturbance limit; non-compliance is deemed to occur if any measured disturbance exceeds the disturbance limit.

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