Evaluation of 1MHz, 16-bit Analog to Digital Converters

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1 Evaluation of 1MHz, 16-bit Analog to Digital Converters Sahar Kashef Research Advisors: Chris Wright, Jerry Cabak UCO/Lick Engineering Lab Center for Adaptive Optics August 9, 2004 University of California, Santa Cruz

2 Overview: Charge Coupled Device Connection Schematic Objective Project Goal ADC Tests The graphs Conclusion

3 Charge Coupled Device(CCD): CCDs are composed of CCD detectors, preamplifiers, analog switches, and a CCD controller CCD controllers are used to control the timing and readout of the astronomy-grade CCDs

4 CCD Controller: Based on a board set from Astronomical Research Cameras(ARC) Consists of a timing board, a utility board, multiple clock generation boards, and multiple video boards

5 Connection Schematic CCDs DEWAR Electron ic Box CCD Controller

6 Component Schematic Clocks CCD Controller CCDs Vo lta g e s De wa r Timing Board P P P Clock Board Video Board 16 bit A/D PreAmplifiers Ele c tro n ic s Bo x Voltages/Clocks S S S Ana lo g Switc he s

7 Video Board Video boards contain all of the CCD signal processing circuitry and a 16-bit Analog to Digital (A/D) converter to digitize the CCD signal Signal in CCD Signal Processing Electronics A/D

8 Overall Objective: To shrink the size of the video board component of the CCD and use a 16-bit analog digital converter (ADC) with faster readout speed to achieve identical or better performance.

9 Analog to Digital Converters A/D 7677 A/DS-937MC

10 Project Goal: A full performance evaluation of a new integrated 16-bit ADC (AD 7677) to be later compared to the existing ADC on the ARC Figure 1: AD 7677

11 3 ways of testing the A/D converter: Gain (Vout/Vin) & Offset Frequency Response Noise Noise Test (Amp PPK): V (No input- grounded)

12 Test Equipment: 15 MHz Function/ Arbitrary Waveform Generator 7 ½ Digit Nano Volt/ Micro Ohm Meter Two Channel Oscilloscope (200 MHz) 230 Programmable Voltage Source

13 Gain and Offset Test: 3 RMS & PPK vs. Voltage RMS & PPK (Volts y = 2x RMS Peak-Peak Linear (ideal) Input (Volts)

14 Gain and Offset test continued: Peak to Peak vs. Voltage Peak-Peak Average Input (Volts) The average DC peak to peak: V

15 Gain and Offset Voltage test continued: RMS Error vs. Voltage 0.01 RMS Error (Volts) Input (Volts) The average DC % error: (.06)

16 Frequency Response: Signal/Noise Ratio vs Frequency SNR (db) Frequency (khz) Signal to Noise Ratio: 85 db (94)

17 Frequency Response: Total Harmonic Distortion vs Frequency THD (db) Frequency (khz) Total Harmonic Distortion: -122 db (-110)(

18 Conclusion: Data was collected on output voltage, signal to noise ratio, and total harmonic distortion In future the collected data is ready to be compared to similar data from the current ADC being used in the ARC Possible problems: Errors due to improper equipment and a non-controlled environment

19 Acknowledgements: Chris Wright, Jerry Cabak at the UCO/Lick Observatory Shops Lisa Hunter, Malika Moutawakkil, Hilary O Bryan National Science Foundation Science and Technology Center for Adaptive Optics, managed by the university of California at Santa Cruz under a cooperative agreement No. AST

20 References: Kester, Walt. Analog-Digital Conversion; Analog Devices,

21 Charge Coupled Device (CCD) A charge-coupled coupled device (CCD), is an integrated circuit containing an array of linked, or coupled, capacitors. Under the control of an external circuit, each capacitor can transfer its electric charge to one or other of its neighbors. CCDs are used in digital photography and astronomy (particularly in photometry and optical and UV spectroscopy).

22 Noise test: Noise test: Amp RMS(V) Amp ppk(vpp) Amp Max(V) Average

23 The performance of new integrated 16-bit ADCs from Analog Devices will be later compared to the existing ADC on the Astronomical Research Camera (ARC) video boards.

24 DC Test (Histogram)

25 AC Test

26 Frequency Analysis

27 Summary of Results: The average DC % error: (.06) The average DC peak to peak: V Signal to Noise Ratio: 85 db (94) Total Harmonic Distortion: -122 db (-110)( Noise Test (Amp PPK): V (No input- grounded)

28 RMS & PPK vs. Voltage 3 RMS & PPK (Volts) y = 2x RMS Peak-Peak ideal Linear (ideal) Input (Volts)

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