Review and Adjudication Information. Group: DSSC/OPV Task Force Taiwan PVTC Chapter Date: TBD Aug 6, 2015 Time & Time zone: TBD

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1 Background Statement for SEMI Draft Document 5647 NEW STANDARD: TEST METHOD FOR SPECTRUM RESPONSE (SR) MEASUREMENT OF ORGANIC PHOTOVOLTAIC (OPV) AND DYE- SENSITIZED SOLAR CELL (DSSC) Notice: This background statement is not part of the balloted item. It is provided solely to assist the recipient in reaching an informed decision based on the rationale of the activity that preceded the creation of this document. Notice: Recipients of this Document are invited to submit, with their comments, notification of any relevant patented technology or copyrighted items of which they are aware and to provide supporting documentation. In this context, patented technology is defined as technology for which a patent has issued or has been applied for. In the latter case, only publicly available information on the contents of the patent application is to be provided. Background Statement: The major difference between DSSC/OPV and p-n junction solar cell is photoelectric conversion mechanism. DSSC/OPV should need specific basis of reference that differ with STC condition (AM1.5G, 25 C, 1000 W/m 2 ) used by p-n junction solar cell, which is not suitable for DSSC/OPV product that most work for visible light spectrum (300 ~ 800 nm). Therefore, the extra mass data modification is required for DSSC/OPV test. DSSC/OPV also needs to reserves extra time for SR test due to capacitance effect. This activity shall develop a new performance test method for DSSC/OPV according to its SR measurement and device qualification. Review and Adjudication Information Task Force Review Committee Adjudication Group: DSSC/OPV Task Force Taiwan PVTC Chapter Date: TBD Aug 6, 2015 Time & Time zone: TBD 14:00 16:00 / Taiwan (GMT+8) Location: ITRI ITRI City, State/Country: Hsinchu, Taiwan Hsinchu, Taiwan Leader(s): D.R. Huang (NDHU) Anderson Hsu (ITRI) T.C. Wu (ITRI) Frank Koo (MUST) B.N. Chuang (ITRI) JS Chen (Tera Solar) Ray Sung (UL Taiwan) Standards Staff: Andy Tuan (SEMI Taiwan) /atuan@semi.org Andy Tuan (SEMI Taiwan) /atuan@semi.org This meeting s details are subject to change, and additional review sessions may be scheduled if necessary. Contact Standards staff for confirmation. Telephone and web information will be distributed to interested parties as the meeting date approaches. If you will not be able to attend these meetings in person but would like to participate by telephone/web, please contact Standards staff. Check on calendar of event for the latest meeting schedule. If you need further assistance, or have questions, please do not hesitate to contact the Organic and Dye Sensitized Solar Cell Task Force: D. R. Huang,derray@mail.ndhu.edu.tw Anderson S. T. Hsu, andersonhsu@itri.org.tw

2 SEMI Draft Document 5647 NEW STANDARD: TEST METHOD FOR SPECTRUM RESPONSE (SR) MEASUREMENT OF ORGANIC PHOTOVOLTAIC (OPV) AND DYE- SENSITIZED SOLAR CELL (DSSC) 1 Purpose 1.1 This standard provides performance test method for OPV/DSSC according to its spectrum response (SR) measurement and device qualification. 1.2 The major difference between OPV/DSSC and p-n junction solar cell is photoelectric conversion mechanism, such as The operation principle of OPV/DSSC is using layers of organic molecules subject to lighting after excitation electron then pass to the inorganic/organic layer of the wide energy gap nano-layer and voltage OPV/DSSC has different spectrum and absorption range with p-n junction solar cell does OPV/DSSC needs more photoelectric conversion response time caused by specific material properties Therefore, OPV/DSSC shall need specific basis of reference to differ with STC condition (AM 1.5G, 25 C, 1000 W m 2 ) used by p-n junction solar cell, and also make reserves extra time for SR test due to capacitance effect. 2 Scope 2.1 The objective is to focus on OPV/DSSC SR evaluation for either indoors or outdoors and provides followings: Suitable statistic method to solve low response time issue for OPV/DSSC A guideline to correct OPV/DSSC data measured under STC A new isothermal platform standard for OPV/DSSC. NOTICE: SEMI Standards and Safety Guidelines do not purport to address all safety issues associated with their use. It is the responsibility of the users of the documents to establish appropriate safety and health practices, and determine the applicability of regulatory or other limitations prior to use. 3 Limitations 3.1 This document does not specify any kind of sample specification for OPV/DSSC, e.g. 1x1 cm 2, 1x5 cm 2, 2x5 cm 2, 1x10 cm 2, etc. 3.2 SR measurement method does not provide the specifications of setting delay time and chopped frequency but the test time should be considered. 4 Referenced Standards and Documents 4.1 SEMI Standards SEMI PV Test Method for Current-Voltage (I-V) Performance Measurement of Organic Photovoltaic (OPV) and Dye-Sensitized Solar Cell (DSSC) 4.2 IEC Standards 1 IEC Sampling plans and procedures for inspection by attributes IEC Photovoltaic devices Part 2: Requirements for reference solar devices IEC Photovoltaic devices Part 3: Measurement principles for terrestrial photovoltaic solar devices with reference spectral irradiance data 1. International Electro-technical Commission, Page 1

3 IEC Photovoltaic devices - Part 4: Reference solar devices - Procedures for establishing calibration traceability IEC Photovoltaic devices Part 7: Computation of spectral mismatch error introduced in the testing of a photovoltaic device IEC Photovoltaic devices Part 8: Measurement of spectral response of a photovoltaic (PV) device IEC Photovoltaic devices Part 9: Solar simulator performance requirements IEC Thin-film terrestrial photovoltaic (PV) modules Design qualification and type approval NOTICE: Unless otherwise indicated, all documents cited shall be the latest published versions. 5 Terminology 5.1 Abbreviations and Acronyms OPV organic photovoltaic DSSC dye-sensitized solar cell DUT device under test RD reference device TM temperature monitor SMU source measurement unit ITP isothermal test plane CI control interface SS solar simulator wavelength (nm) SR spectrum response SR1 spectral response SR2 spectral responsivity (A W 1 or A m 2 W 1 ) STC standard test conditions NTC normal test conditions SRC standard reporting conditions 5.2 Definitions cell temperature the temperature ( C) of test sample chopper a rotating blade or other device used to modulate a light source IPCE incident photon-electron conversion efficiency isothermal test plane the isothermal plane intended to contain DUT at the reference irradiance level light source a source of radiant energy to simulate natural sunlight and used for cell performance measurement monitor photo-detector a photo detector incorporated into the optical system to monitor the amount of light reaching the device under test, enabling adjustments to be made to accommodate varying light intensity monochromatic beam a chopped light from a monochromatic source reaching the reference photo-detector or device under test monochromator an optical device that allows a selected wavelength of light to pass while blocking other wavelengths Page 2

4 5.2.9 quantum efficiency the number of collected electrons per incident photon at a specific wavelength in percent units spectral bandwidth the range of wavelengths in a monochromatic light source, determined as the difference between its half-maximum-intensity wavelengths I-V the current-voltage curve of a test sample is the superposition of the curve with the light/dark-generated current RSD relative standard deviation STC standard test conditions for test sample. Sample temperature: 25 C, AM 1.5G, Irradiance:1000 W m NTC normal test conditions for test sample. Sample temperature: 35 C, AM 1.5G, Irradiance: 1000 W m SRC standard reporting conditions for test sample. Defined by temperature, spectral irradiance, and total irradiance. The term reporting, rather than reference or test, is used because a measurement can be performed at conditions other than SRC and then carefully corrected to be equivalent to being measured at SRC. As a matter of shorthand, the global and direct terrestrial reference spectra are often referred to as AM1.5G and AM1.5D, respectively test sample test device of OPV/DSSC 5.3 Symbols A cell area (m 2 ) E irradiance (W m 2 ) I current (A) I sc short-circuit current (A) MMF spectral mismatch parameter (or factor) T temperature ( C) V voltage (V) e charge of an electron ( C) h Plank s constant ( m 2 kg / s) c speed of light (299,792,458 m/s) P power incident on the test sample 6 Apparatus 6.1 The relative spectral responsivity of a test sample is measured by irradiating it by a narrow-bandwidth light source at a series of different wavelengths covering its response range, and measuring the short-circuit current density and irradiance at each of these wavelengths. The light source should irradiate the device uniformly, and the temperature of the device should be controlled. The current densities are then divided by the irradiances or a proportional parameter and plotted as a function of wavelength. Alternatively, the irradiance may be kept constant (for instance, by varying the length of a monochromator exit slit), in which case the relative spectral response is obtained directly from the current density readings. The irradiance monitor may be a vacuum thermocouple, a pyroelectric radiometer or other suitable detector. Another alternative is a previously calibrated reference photovoltaic device whose relative spectral response covers the required range. Apparatus includes reference device (RD), temperature monitor (TM), source measurement unit (SMU), isothermal test plane (ITP), lock-in amplifier (LIA), chopper, monochromator (MC), shutter and light source (LS)(see Fig. 1). Page 3

5 LS MC Chopper PC Control Interface LIA Test Sample ITP (a) AC Mode LS MC Shutter PC Control Interface SMU Test Sample ITP (b) DC Mode Figure 1 Testing Setup Equipment Diagrammatic Sketch 6.2 Testing setup equipment AC mode The spectral responsivity of a test sample, defined as the output current per input irradiance or radiant power at a given wavelength, and normally reported over the wavelength range to which the device responds, is determined by the following procedure: (a) A monochromatic, chopped beam of light is directed at normal incidence onto the cell. Simultaneously, a continuous white-light beam (bias light) is used to illuminate the DUT at irradiance levels between one-third and one-half of normal end use operating conditions intended for the test sample. See Fig. 1. (b) The magnitude of the AC (chopped, see 6.6) component of the current at the intended voltage is monitored as the wavelength of the incident light is varied over the spectral response range of the test sample Measurement of the absolute spectral responsivity of a device requires knowledge of the absolute beam power or irradiance produced by the monochromatic beam. The total power or irradiance of the monochromatic beam incident on the device is determined by the reference device (see 6.3). The absolute spectral responsivity of the test sample can then be computed using the measured device photocurrent and the power or irradiance of the monochromatic beam The choice of power versus irradiance mode may depend on the spatial non-uniformity of the test device. Overall spectral response of a test sample with substantial spatial non-uniformity of response should be performed in irradiance mode The test procedure can be adapted to providing absolute or relative spectral responsivity measurements, depending on the calibration device used, its calibration mode and the relative sizes of the calibration device, the monochromatic beam size, and the device being measured. Page 4

6 6.2.2 DC mode The spectral responsivity of a test sample, defined as the output current per input irradiance or radiant power at a given wavelength, and normally reported over the wavelength range to which the device responds, is determined by the following procedure: (a) A monochromatic, chopped beam of light is directed at normal incidence onto the cell. Simultaneously, a continuous white-light beam (bias light) is used to illuminate the DUT at irradiance levels between one-third and one-half of normal end use operating conditions intended for the device. See Fig. 1. (b) The magnitude of the DC component (Ex. SMU, see 6.5) of the current at the intended voltage is monitored as the wavelength of the incident light is varied over the spectral response range of the device Measurement of the absolute spectral responsivity of a device requires knowledge of the absolute beam power or irradiance produced by the monochromatic beam. The total power or irradiance of the monochromatic beam incident on the device is determined by the reference device (see 6.3). The absolute spectral responsivity of the device can then be computed using the measured device photocurrent and the power or irradiance of the monochromatic beam The choice of power versus irradiance mode may depend on the spatial non-uniformity of the test sample. Overall spectral response of a test device with substantial spatial non-uniformity of response should be performed in irradiance mode The test procedure can be adapted to providing absolute or relative spectral responsivity measurements, depending on the calibration device used, its calibration mode and the relative sizes of the calibration device, the monochromatic beam size, and the device being measured. 6.3 Reference device (RD) Reference device is calibrated indoors using simulated sunlight or outdoors in natural sunlight by reference to the same desired reference spectral irradiance distribution Report need to commit traceability including measurement of I-V, SR and IPCE, which are determined in accordance with IEC Temperature monitor (TM) Temperature monitor shall record both the cell temperature and test plane temperature simultaneously while I- V is measured, and its accuracy need keep within ± 0.5 C. 6.5 Source measurement unit (SMU) Source measurement unit is used to measure current and voltage through DUT by using a biased voltage with numerous steps (see 9.7) to build SR spectrum. 6.6 Lock-In Amplifier (LIA) A lock-in amplifier (also known as a phase-sensitive detector) is a meter that can extract a signal with a known carrier wave from an extremely noisy environment. Depending on the dynamic reserve of the instrument, signals up to 1 million times smaller than noise components, potentially fairly close by in frequency, can still be reliably detected. It is essentially a homodyne detector followed by low-pass filter that is often adjustable in cut off frequency and filter order. 6.7 Bias Light (BL) A stable DC light source is used to illuminate the device during the measurement. The bias light needs to meet the criteria for a Class C (see IEC ), and provides a sufficient intensity to ensure the DUT is operating in its linear response region. If the DUT is not linear, the bias light source shall provide bias light over the intensity range of interest. The bias source contains no significant harmonics of the chopper frequency used with the monochromatic source. This can be achieved by using a well regulated, DC power supply for the bias light. Mechanical vibrations, either from the chopper or other sources, shall not be allowed to modulate the bias light. 6.8 Isothermal test plane (ITP) Page 5

7 6.8.1 Isothermal test plane intended to contain DUT at the reference irradiance level (see 9.7), and control test cell keep temperature within ± 1 C. 6.9 Light source (LS) Light source may be one of three classes (A, B, or C) for each of the three categories includes spectral match, spatial non-uniformity and temporal instability. Each simulator is rated with three letters in order of spectral match, non-uniformity of irradiance in the test plane and temporal instability (e.g. CBA). It should at least fulfill class CBA requirements, and class AAA is better for long term instability issue (see IEC ) Test plane should be intended to fully contain all the area of test device Report need to commit traceability include measurement of spectral match, uniformity and temporal instability. 7 Preconditioning and Conditioning 7.1 Test samples refer to SEMI PV Five test samples, which are made by same raw materials and process, are required at least. General test sample assembled should be including seal, package and four well-attached wires (or terminal wires). Terminal wires are used multiply set designed for the safety of the rated current and length is 5 cm Relative performance data is defined as Eq. (1) for test samples, and shall keep 90 % at least in one month after pre-test. 7.2 Reference device The reference photo-detector s calibration must be traceable to SI units through a 3 rd party Lab spectral responsivity scale or other relevant radiometric scale. The calibration mode of the photo-detector (irradiance or power) will affect the procedures used and the kinds of measurements that can be performed The following detectors are acceptable for use in the calibration of the monochromatic light source: Pyroelectric radiometer, and Cryogenic radiometer, and Spectrally calibrated photodiode, photodiode irradiance detector, or solar cell, calibrated in power or irradiance mode. It should have calibration data that includes the entire spectral response range of the device to be tested. If a part of the range is omitted, it will limit the spectral range of the results of this test, causing an error in computing the spectral mismatch parameter. 8 Calculations 8.1 The objective is to reduce measurement error due to the capacitive effect and find the relationship between I sc and spectral correction factor (see 9.7, 9.10). 8.2 MMF calculations Relative Performance data(%) (Final Initial) 100% Initial This statistic method (see Fig. 2) provides guidelines for test sample to compensate measured data under STC (see , , and ). (1) Page 6

8 Figure 2 Corrected I sc in I-V by Mismatch Factor (MMF, abbreviation: M) MMF (abbreviation: M) by which the readings of a physical photometer may be multiplied in order to correct for the error caused by differences between the relative spectral responsivity of the photometer and the photometric observer function that it is intended to simulate, when the photometer is used to measure a light source having a relative spectral power distribution different from that of the source with which the photometer was calibrated In Figure 2, a reference solar cell is calibrated when its short-circuit current is known with respect to an internationally accepted set of test conditions called the Standard Test Conditions (1 Sun or 1000 W/m 2 of AM1.5G and a sample temperature of 25 C). In the (indoor) reference cell method for calibrating an unknown solar cell, a reference solar cell is used to adjust the intensity of a solar simulator until the short-circuit current produced by the reference cell is equivalent to its calibrated short-circuit current. One might then assume that the simulator is set to 1 Sun, i.e., that the total irradiance (at least where the reference cell is located) is 1 Sun, and that to calibrate an unknown test cell one can simply replace the reference cell by the unknown cell and measure it s short-circuit current. This is only the case if the reference and the unknown solar cells exhibit identical spectral responses or that the simulator spectrum perfectly matches the reference spectrum AM1.5G. The latter would be highly unlikely since the reference spectrum is calculated using a numerical model of the atmosphere sunlight interaction given theoretical values for barometric pressure, perceptible water, ozone content, etc. It is also often the case that the respective spectral responses of the reference and unknown solar cells don t quite match. These spectral mismatches lead to a kind of measurement error called spectral mismatch error that is quantified by the spectral mismatch factor. If this factor is known, it can be used to correct a solar cell s electrical performance under simulated sunlight to the reference condition of AM1.5G. We will derive an expression for M that will allow us to relate the spectrally corrected short-circuit current to its measured value or the short circuit current produced by an unknown test cell under standard test conditions (STC) or normal test conditions (NTC) can be expressed as the integral of the product of the cell absolute spectral response and the reference spectral irradiance For the test sample, the shape of the I-V characteristic depends on the short-circuit current and the device temperature, but not on the spectrum used to generate the short-circuit current. For these devices, the correction of spectrum mismatch or spectral response mismatch is possible using the following procedure. For other devices, a measurement of the I-V characteristic shall be done using a light source with the appropriate spectrum. A correction is not necessary if either the test spectrum is identical to the reference spectrum (see IEC ) or if the test sample s relative spectral response is identical to the reference cell relative spectral response. The reading as obtained from the reference cell specifies which intensity at the reference spectrum will generate the same shortcircuit current in the test sample as the test spectrum. If there is a mismatch between both spectra and spectral responses, then a mismatch correction should be calculated. 8.3 RSD is defined as Eq. (2). Page 7

9 RSD(%) standard deviation average 100% (2) 8.4 The non-uniformity is defined as Eq. (3) 8.5 IPCE calculations Non uniformity(%) (max min) (max + min) 100% Careful measurement of the power at a given wavelength can be used to calculate the number of photons that are incident on the test sample through the Eq. (4). (3) # photons s P hf P hc Where h is Plank s constant ( m 2 kg/s), c is the speed of light (299,792,458 m/s), and λ is the wavelength in meters, and P is the power incident on the test sample as measured by a power meter in Watts When a cell is under illumination, the number of generated electrons can easily be calculated by measuring the output current of the test sample under short circuit conditions (V bias = 0) and using the Eq. (5) and (6). (4) #electrons I s e Where I is the short circuit current, and e is the charge of an electron ( C). (5) Calculating the IPCE is then simply: IPCE(%) # electrons Isc / e Isc / e hc Isc 100 ( ) ( ) ( )( ) (6) # photons P /( hf ) P /( hc) e P Where IPCE is the value of the incident power and current needs to be measured at each wavelength. 8.6 I sc calculations and checking for consistency between AM1.5G and IPCE An IPCE measurement is a measurement of short circuit current as a function of wavelength. These values can be used to estimate the total short circuit current that would be generated under AM1.5 illumination conditions. If a number of incident photons of a particular wavelength is known, the IPCE value (at that wavelength) for the test sample can be used to determine the number of electrons that will be generated. This number can be very easily converted into a current by multiplying by the charge of an electron ( x C). To find the IPCE estimated AM1.5 short circuit current one simply needs to perform a weighted sum of these values based on the AM1.5 photon flux distribution. The AM1.5 energy (flux units of Wm -2 nm -1 s -1, see and IEC ) converted into photon flux by multiplying by wavelength and dividing by Planks constant and the speed of light The IPCE estimated AM1.5 short circuit current can be calculated from IPCE measurements according to IEC with the following restrictions, which can be written as: Where n p is the number of photons occurring in the wavelength interval dλ. IPCE I sc ( n p ) ( ) e d (7) 100 Page 8

10 9 Testing Procedures 9.1 The measured performance data (see ) of test sample is highly responsive to the external measurement conditions. A reliable evaluation results requires the measurement to be performed under proper conditions and the details of the measurement should be clearly described in the report. Fig. 3 is the testing procedures for test sample performance data evaluation. 9.2 Visual Inspection: refer to SEMI PV Measured Active Area: refer to SEMI PV Light Soaking: refer to SEMI PV Check SR/IPCE Measurement System The irradiance measurements shall be made by using a reference device packaged (or a pyranometer) and calibrated in conformance with IEC or IEC PV reference device shall either be spectrally matched to test specimen, or a spectral mismatch correction shall be performed in conformance with IEC Reference device shall be linear in short-circuit current as defined in IEC over the irradiance range of interest. The temperature of reference device and the specimen shall be measured by using instrumentation with accuracy of ± 1 C and repeatability of ± 0.5 C. If the temperature of reference device differs and more than 2 C from the temperature at which it was calibrated, the calibration value shall be adjusted to the measured temperature. If the reference device is a pyranometer, then temperature measurement and temperature correction are not required for output signal. Note the wavelengths, if any, for which the output of the modulated current measurement instrumentation in recording the output of the monitor reference device, while the signal produced by the DUT relative to the background signal recorded in measuring the output of the modulated current, which represents a signal-to-noise ratio greater than 1%. 9.2 Visual inspection 9.3 Measured active area 9.4 Light soaking 9.5 Check SR/IPCE measurement systems 9.6 Check wire connection 9.7 SR Check AC/DC mode at STC or NTC 9.8 SR at STC or NTC 9.9 Visual inspection 9.10 Data analysis Figure 3 Testing procedures 9.6 Check Wire Connection: refer to SEMI PV SR check AC/DC mode at STC or NTC Set up wavelength range. Measure the source irradiance as a function of wavelength at a minimum of 12 wavelengths throughout the SR ranges of the device to be tested, using the reference device output. The wavelengths Page 9

11 used for the source irradiance must be identical with the DUT response. Record the SR and temperature of the specimen concurrently with recording the output and temperature (if required) of the reference device at the desired temperatures. The response time of DUT to chopped light can be a problem for electrochemical cells or those cells with many deep-level recombination centers. Many systems operate with chopping frequencies of Hz as a compromise between stability, noise, and deep level response. Chopping frequencies below 4 Hz are required to keep the AC photo-response independent of frequency. This effect is more pronounced at lowlight levels and in the infrared. It is important that the light from the bias light source not be allowed to go through the light chopper. A simple procedure to determine if this artifact is present is to turn off the monochromatic light source and measure the test device s response as a function of bias light intensity. If necessary, make the measurements immediately after removing the shade. Below are two approaches (see 10.7) to decide SR measurement of test sample SR setting delay time in AC/DC mode: (a) chopped frequency in AC mode: The chopped frequency should be lease 5 Hz; (b) the delay time should be longer than 20 ms for measuring OPV, be longer than 40 ms for measuring DSSC with organic solvent electrolyte, and be longer than 1000 ms for measuring DSSC with ionic liquid electrolyte in AC/DC mode SR including real-time removing capacity effect in AC/DC mode: (a) chopped frequency in AC mode: The chopped frequency should be lease 5 Hz; (b) this method needs to read simultaneously multi-point forming step after taking the optimization stabilizing an area as a point on the SR spectrum SR measurements of both AC/DC modes are necessary to estimate the related measurement error, as the temporal response is expected to be dependent on the device structure of test sample. The final performance data shall have deviations 0.2 % or less. 9.8 SR at STC or NTC Each SR need test at least five times RSD (see Eq. (2)) of performance data measured at each sweep direction shall be less than 1.5 % The non-uniformity (see Eq. (3)) of performance data measured at each sweep direction shall be less than 1.5 %. 9.9 Visual Inspection: see Data Analysis: Provide calculation method of performance data Test sample need to correct I sc with reference cell (see 8.2) This clause describes a procedure for calibrating test sample in natural or simulated sunlight against a reference cell whose calibration is traceable to SI units. The spectral response match between the reference cell and test sample under the illumination used for the calibration shall be determined by the procedure given in IEC If the spectral mismatch correction is less than 1 %, the mismatch correction may be omitted. 10 Reporting Results 10.1 The test report shall include, at minimum, the following: A title Name and address of the test laboratory and location where the tests were carried out Unique identification of the certification or report and of each page Name and address of client, where appropriate Description and identification of the item tested Characterization and condition of the test item. Page 10

12 Date of receipt of test item and date(s) of test, where appropriate Identification of test method used Reference to sampling procedure, where relevant Any deviations from, additions to or exclusions from the test method, and any other information relevant to specific tests, such as environmental conditions Measurements, examinations and derived results supported by tables, graphs, sketches and photographs A statement of the estimated uncertainty of the test results (where relevant) A signature and title, or equivalent identification of the person(s) accepting responsibility for the content of the certificate or report, and the date of issue Where relevant, a statement to the effect that the results relate only to the items tested A statement that the certificate or report shall not be reproduced except in full, without the written approval of the laboratory. 11 Related Documents 11.1 ASTM Standards 2 ASTM E927 Standard specification for solar simulation for terrestrial photovoltaic testing ASTM E1021 Standard test method for spectral responsivity measurements of photovoltaic devices 11.2 ISO Standards 3 ISO Statistics -- Vocabulary and symbols ISO/IEC 17025, General requirements for the competence of testing and calibration laboratories 11.3 Other Documents N. Koide, Y. Chiba and L. Han, Jpn. J. Appl. Phys., 2005, 44, N. Koide, and L. Han, Rev. Sci. Instrum., 2004, 75, M. A. Green, K. Emery, Y. Hishikawa, W. Warta & E. D. Dunlop, Prog. Photovolt: Res. Appl. 2012, 20, 12. X. Yang, M.Yanagida& L. Han, Energy Environ. Sci Henry J. Snaith, Energy Environ. Sci. 2012, 5, Teng-Chun Wu, Shu-Tsung Hsu and Yean-San Long, PVSEC-23 (2013). Teng-Chun Wu, Shu-Tsung Hsu and Yean-San Long, JEPE2014, 8, 6, BRIAN O'REGAN and MICHAEL GRÄ TZEL, Nature 353, (1991) Fraunhofer-Institut für Solare Energiesysteme ISE, Calibration Lab, Principles of Instrumental Analysis, Douglas A. Skoog, F. James Holler and Stanley R. Crouch. Giorgio Bardizza, Diego Pavanello, Harald Müllejans and Tony Sample, Prog. Photovolt: Res. Appl. (2014) 2American Society for Testing and Materials, 3International Organization for Standardization, Page 11

13 APPENDIX 1REPORTING FORM (DEMO) NOTICE: The material in this Appendix is an official part of SEMI [designation number] and was approved by full letter ballot procedures on [A&R approval date]. A1-1 Description of Testing Laboratory: Measurement of test data (e.g.sr) need be operated by 3rd party testing lab, e.g., ISO accredited lab. Laboratory ID/Name Address Basic Information of Testing Laboratory A1-1.1 Description of Testing Sample Sample ID Sample Dimension Sample Material Packaged/Window Material Temperature Sensor A1-1.2 Testing Data All data measured in each sweep direction (forward or backward) need test at least five times. The average data and standard deviation are listed in the following table. Sample ID: Basic Information Mismatch Factor MMF = Area A = cm 2 Reference Condition = A1-1.3 SR Data The Spectral Response Measurement Sample SR/IPCE Plot Sample ID: A1-1.4 Others Descriptions A Measured Methods A The testing items and methods listed in this report have been approved by the commissioners and commissioned parties and then been adopted for the calibration. A The measured procedure was carried out according to. Page 12

14 A Standard Equipment of System Item Primary reference cell DMM Traceability Org. Report No. Traceability Date Due Date lock-in amplifier SMU Temperature monitor Reference detector Area Light source A Environmental Conditions A The calibration was performed under the following environmental conditions. A Ambient temperature: (±) A Relative humidity: (±) %RH A Relative Expanded Combined Uncertainty A Relative expanded combined uncertainty was performed according to. A The relative expanded uncertainty, with a coverage factor k = 2 and a confidence level of about 95 %. A1-1.5 References IEC :2008, second edition, Photovoltaic devices Part 3: Measurement principles for terrestrial photovoltaic solar devices with reference spectral irradiance data. IEC Photovoltaic devices - Part 4: Reference solar devices - Procedures for establishing calibration traceability IEC :2008, second edition, Photovoltaic devices Part 7: Computation of spectral mismatch error introduced in the testing of a photovoltaic devices. IEC :1998, second edition, Photovoltaic devices Part 8: Measurement of spectral response of a photovoltaic device. IEC :2007, second edition, Photovoltaic devices Part 9: Solar simulator performance requirements. A1-1.6 Appendix A Photos of testing sample Page 13

15 Item Front-side Back-side Sample ID: NOTICE: SEMI makes no warranties or representations as to the suitability of the Standards and Safety Guidelines set forth herein for any particular application. The determination of the suitability of the Standard or Safety Guideline is solely the responsibility of the user. Users are cautioned to refer to manufacturer s instructions, product labels, product data sheets, and other relevant literature, respecting any materials or equipment mentioned herein. Standards and Safety Guidelines are subject to change without notice. By publication of this Standard or Safety Guideline, SEMI takes no position respecting the validity of any patent rights or copyrights asserted in connection with any items mentioned in this Standard or Safety Guideline. Users of this Standard or Safety Guideline are expressly advised that determination of any such patent rights or copyrights and the risk of infringement of such rights are entirely their own responsibility. Page 14