CC1-15: I-V Curve Data Acquisition System Description and features

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1 General System Description The Solar Cell I-V Curve Data Acquisition System characterizes the current-voltage (I-V) characteristics of photovoltaic devices with currents up to 15.0 amperes. It calculates the solar cell parameters, generates printable test reports and saves test data in text files. Curves are measured using classic four probes (Kelvin) technique. The system includes electronics, software, rack-mount computer, and cell testing fixture with irradiance monitoring and optional temperature control. It interfaces with the customers Solar Simulator or a Solar Simulator can be supplied. Figure 1: View of the Electronic Console I-V Curve Data Acquisition System Spec Page 1 of 7 Copyright 2006

2 Technical Specifications General Technical Specifications Phase Voltage Power Consumption Single Phase 230 V/50-60 Hz (115V on request) ~230VA Max. Output Power ~200W Max. Output Voltage (hardware controlled) Min. Output Voltage Step Max. Output Current (hardware controlled) Storage Temperature ±10 V (±2 V sub-range) ~±5 mv or ~±1 mv for ±2 V sub-range ±15A Optional ±20 A `20-60 o C Dimensions (H x W x D) (mm) 16" (406) x 21" (533) x 24.5" (622) Weight ~ 66Lbs (30 kg) Electronic Load Specifications Resolution Current Ranges Voltage Ranges 16 Bit ± 15 A, ± 10A, ± 1A, ± 100mA, ± 10mA, ± 1mA, ±100µA ± 10V, ± 2V or ± 1V Measurement Accuracy Should be better than 0.5% Reproducibility Measurement Time Depends on the light stability. Expected to be ±range assuming light stability of ±0.5%. For worse light stability additional data points may taken to improve filtering and reproducibility. <500ms for good light stability of ±o.5% (3-4 sec if filtering of light fluctuations is necessary) I-V Curve Data Acquisition System Spec Page 2 of 7 Copyright 2006

3 System Details Test Fixture The I-V Curve Data Acquisition includes a fixture for mounting test devices. The cell holding platen is brass with gold plating built into polished stone plate. This fixture can accommodate test devices up to 20 cm x 20 cm, but other sizes are available. Four independent vacuum controlled manual probes and vacuum system to hold the cell during testing is included. Optional automatic cell contacting is available upon request. Figure 2: View of the measuring table with four probes in contact with solar cell Figure 3: Close up view of Cell Vacuum Hold & Rubber Vacuum Seal I-V Curve Data Acquisition System Spec Page 3 of 7 Copyright 2006

4 Two back-side voltage probes are located inside the platen (galvanically isolated from the platen) and move up when the cell is held by vacuum to the platen. Both the voltage and current soft-touch, spring loaded probes are gold-plated and are vacuum operated via computer or by pressing a foot pedal. Four upper probes are vacuum held to the base and are vacuum operated. These probes can be positioned anywhere on the table. Special silicone rubber gasket allows testing of cells that are soldered or not perfectly flat at the bottom. Platen can be either cooled or heated at temperature range of 0-60 o C using Peltier cells. Temperature of the platen is measured automatically with accuracy of ±2 o C and is monitored during cell measurement. Software Features Easy to use MS Windows environment software Advanced noise filtering feature to enable measurement of good quality I-V curves even under fluctuating intensity conditions. Calculation of cell series resistance according to IEC standard. Procedures for fitting of measured I-V Curve to either equivalent diode models, i.e. SEM-Single Exponential, DEM-Double Exponential and VDEM-Variable Double Exponential. Procedures for curve correction to Standard Test Conditions (STC) to IEC60891, Anderson s and Blaessar s. Computes solar cell parameters including I SC, V OC, F F, I MAX, V MAX, P MAX, and Eff and saves them automatically on hard disk drive. In addition cell s temperature and irradiance level is measured and stored for future analysis. Dark saturation current, R S and R SH determination Optional automatic correction of measured I-V curve to STC (Standard Test Conditions), i.e. light intensity and temperature, if required. Provides printable test reports and test data in text files for easy exchange between programs Solar Simulator shutter control (Solar Simulator not included) I-V Curve Data Acquisition System Spec Page 4 of 7 Copyright 2006

5 Binary Inputs (TTL Standard) Start Measurement Repeat Measurement Shutter Open/Close Current Input for Temperature Measurement Voltage Measurement (±5V) Vacuum On/Off Binary Outputs (TTL Standard) Ready for Measurement Measurement in Process End of Measurement Error in Measurement Shutter open/close Vacuum On/Off OPTIONS Higher Current Range By using a different electronic load source, this system can be configured for current ranges of 20A. Irradiance Monitor The customer s solar simulator may exhibit small temporal instability in its illumination intensity due to lamp flicker or lamp power supply ripple. By mounting an irradiance monitor in the test plane, the system can measure the simulator irradiance while measuring test device current, and adjust the current readings to compensate for the irradiance fluctuations. If desired, the adjustments can be deactivated using a software control. Setup and Training System setup is easy when using the instructions provided in the manual. If desired, PET will provide system setup and training at the customer s facility. The above specifications provide general information about this product. Actual product can be customized to meet the needs of individual customers. I-V Curve Data Acquisition System Spec Page 5 of 7 Copyright 2006

6 Examples of Measurements Figure 4: Example of light measurement Figure 5: Example of dark measurement I-V Curve Data Acquisition System Spec Page 6 of 7 Copyright 2006

7 Figure 6: Example of cell s series resistance determination according to IEC Standard Figure 7: Example of cell s I-V curve fitting to Double Diode equivalent electrical model I-V Curve Data Acquisition System Spec Page 7 of 7 Copyright 2006

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