Declaration of Conformity.

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1 Declaration of Conformity. Type of equipment Brand Name /Trade Mark Type designation /model Applicant Network Camera SAMSUNG SNB-6003P SAMSUNG TECHWIN CO., LTD. In accordance with the following Directives 2004/108/EC The Electromagnetic Compatibility Directive Including amendments by the CE Marking Directive 93/68/EEC The following harmonized European standards or technical specifications have been applied EN EN EN EN EN A22010 EN A12010 EN EN EN Limits and methods of measurement of radio disturbance characteristics of information technology equipment Product family standard Immunity requirements for components of fire, intruder and social alarm systems Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current <=16 A per phase and not subject to conditional connection Electrostatic discharge immunity test Radiated, radio-frequency, electromagnetic field immunity test Electrical fast transient/burst immunity test Surge immunity test Immunity to conducted disturbances, induced by radio-frequency fields Voltage dips, short interruptions and voltage variations immunity tests and the Directive (2011/65/EU) on the restriction of the use of certain hazardous substances in electrical and electronic equipment Place and date of issue #42 Seongju-Dong, Changwon-Shi, Kyungsangnam-Do,Korea / February 20, 2013 Authorized Signatory Name Jei Soon, Kang Title Principal Research Engineer Signature

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3 Page 2 of 68 Contents 1. Applicant information Laboratory information Test system configuration Operation environment Measurement Uncertainty Description of E.U.T General information Product description Auxiliary equipments Test configuration Operating conditions Summary of test results Summary of EMI emission test results Summary of immunity test results Performance criteria Test results Conducted Emission Radiated Emission Flicker Electrostatic Discharge Radio Frequency Electromagnetic Fields Electric Fast Transient/BURST Surge Conducted Immunity Dips and Interruptions E.U.T. photographs... 62

4 Page 3 of Applicant information Applicant SAMSUNG TECHWIN CO., LTD. Address #42 Seongju-Dong, Changwon-Shi, Kyungsangnam-Do, Korea Telephone Fax js2002.kang@samsung.com Contact name Kang Jei Soon Manufacturer#1 SAMSUNG TECHWIN CO., LTD. Address #42 Seongju-Dong, Changwon-Shi, Kyungsangnam-Do, Korea Telephone Fax js2002.kang@samsung.com Contact name Kang Jei Soon Manufacturer#2 Address TIANJIN SAMSUNG TECHWIN OPTO-ELECTRONIC CO., LTD No.11 Weiliu Road. Micro-Electronic Industrial Park Jingang Road Tianjin , China

5 Page 4 of Laboratory information Address EMC compliance Ltd Sin-dong, Yeongtong-gu, Suwon-city, Gyeonggi-do, , Korea Telephone Number Facsimile Number FCC CAB. KR0040 VCCI Registration No. R-3327, G-198, C-3706, T-1849 Industry Canada Registration No. 8035A KOLAS NO. 231 SITE MAP Suwon city EMC compliance

6 Page 5 of Test system configuration 3.1 Operation environment Temperature Humidity Pressure Chamber(10 m) 18 C 20 % R.H. - Shielded room(ce) 22 C 19 % R.H. - Shielded room(esd) 21 C 39 % R.H kpa Test site These testing items were performed following locations; Test item Test site Conducted Emission Shielded Room Radiated Emission 10 m Chamber Harmonics current Immunity area Voltage fluctuations and flickers Immunity area Electrostatic discharge Shielded Room Radiated RF immunity Fully anechoic chamber (3 m) Electric Fast Transient/BURST Shielded Room Surge Shielded Room Conducted RF immunity Shielded Room Voltage dip/interruption Shielded Room Mains supply voltage variations Shielded Room

7 Page 6 of Measurement Uncertainty All measurements involve certain levels of uncertainties, especially in field of EMC. The factors contributing to uncertainties are test receiver, cable loss, antenna factor calibration, Antenna directivity, antenna factor variation with height, antenna phase center variation, antenna frequency interpolation, measurement distance variation, site imperfection, mismatch, and system repeatability. Based on CISPR , the measurement uncertainty level with a 95 % confidence level was applied. Conducted emission measurement (C.L Approx 95 %, k = 2) Shielded Room (CE#1) Shielded Room (CE#2) Shielded Room (CE#3) 9 khz ~ 150 khz ± 3.82 db 150 khz ~ 30 MHz ± 3.43 db 9 khz ~ 150 khz ± 3.82 db 150 khz ~ 30 MHz ± 3.43 db 9 khz ~ 150 khz ± 4.00 db 150 khz ~ 30 MHz ± 3.63 db Radiated Emission measurement (C.L Approx 95 %, k = 2) 10 m Chamber (#F4) 10 m Chamber (#F2) 30 MHz ~ 300 MHz 300 MHz ~ MHz 3 m db, db 10 m db, db 3 m db, db 10 m db, db 1 GHz ~ 6 GHz 3 m db, db 30 MHz ~ 300 MHz 300 MHz ~ MHz 3 m db, db 10 m db, db 3 m db, db 10 m db, db 1 GHz ~ 6 GHz 3 m db, db Radio Frequency Electromagnetic Fields (C.L Approx 95 %, k = 2) ± 1.82 db Disturbance power Electromagnetic Fields (C.L Approx 95 %, k = 2) ± 3.73 db

8 Page 7 of Description of E.U.T. 4.1 General information

9 Page 8 of 68

10 Page 9 of Product description Type of product Model name (Basic) Network Camera SNB-6003P Model name (Variant) - Difference - Trade name - Serial no Testing voltage Product rating Internal clock frequency Note C99T6V2D DC 12 V, AC 24 V, PoE DC 12 V, AC 24 V, PoE Above 108 MHz * AC/DC adaptor was not provided by the manufacturer. * AC/AC adaptor was not provided by the manufacturer. * PoE Switch was not provided by the manufacturer. 4.3 Auxiliary equipments Type Model / Part # Serial number Manufacturer Note PC Satellite L730 3B134626W TOSHIBA Headset 1 SHS-250V - SAMSUNG Headset 2 SHS-250V - SAMSUNG JIG USB Mouse Microsoft Micro SD Card(4 GB) - - Sandisk Lens AC/DC Adaptor DAD 12050DKA - Dream Electronics AC/AC Adaptor DRC AC - Samsung Techwin PoE Switch FS108P 1DL20C3N00544 NETGEAR

11 Page 10 of Test configuration #1- DC 12V, #2- AC 24V Note Start End Cable * Name I/O port Name I/O port Length (m) Spec. Cable AC/AC Adaptor 1 Power or Power 1.8 Non-Shield - AC/DC Adaptor 2 LAN(RJ-45) Note PC LAN(RJ-45) 3.0 Non-Shield - 3 EUT Audio In/Out Headset 1 Audio In/Out 1.9 Non-Shield - 4 (Network Alarm In/Out JIG Alarm In/Out 3.0 Non-Shield Out-door 5 Camera) GND GND GND 1.8 Non-Shield - 6 IRIS Lens IRIS 0.1 Non-Shield Lens - Direct Micro SD Card Micro SD Card Micro SD Card Direct USB USB Mouse USB 1.7 Shield - Note PC 10 MIC/Audio Headset 2 MIC/Audio 1.9 Non-Shield -

12 Page 11 of 68 #3- PoE Note * 1 * Power supplied from PoE Switch Start End Cable Length Name I/O port Name I/O port Spec. (m) LAN(PoE) PoE Switch LAN(PoE) 3.0 Non-Shield - 2 Audio In/Out Headset 1 Audio In/Out 1.9 Non-Shield - Cable 3 EUT Alarm In/Out JIG Alarm In/Out 3.0 Non-Shield Out-door 4 (Network GND GND GND 1.8 Non-Shield - 5 Camera) IRIS Lens IRIS 0.1 Non-Shield Lens - Direct Micro SD Card Micro SD Card Micro SD Card Direct LAN(RJ-45) PoE Switch LAN(RJ-45) 3.0 Non-Shield - 9 Note PC USB USB Mouse USB 1.7 Shield - 10 MIC/Audio Headset 2 MIC/Audio 1.9 Non-Shield -

13 Page 12 of Operating conditions The EUT was configured as normal intended use. Test mode Normal operating 1 Check the video image with webview. * Note 3 types of powers are available for the product, that are DC 12 V, AC 24 V, PoE. Therefore, tests were performed for 3 different types of powers.

14 Page 13 of Summary of test results 5.1 Summary of EMI emission test results Applied Test items Test method Result Conducted Emission EN Radiated Emission EN Harmonics current EN A22009 N/A Voltage fluctuations and flickers EN Summary of immunity test results Applied Test items Test method Result Electrostatic discharge EN Radiated RF immunity EN A22010 Electric Fast Transient/BURST EN A12010 Surge EN Conducted RF immunity EN Voltage dip/interruption EN Mains supply voltage variations EN N/A

15 Page 14 of Performance criteria The variety and the diversity of the apparatus within the scope of this document makes it difficult to define precise criteria for the evaluation of the immunity test results. If as a result of the application of the tests defined in this standard, the apparatus becomes dangerous or unsafe then the apparatus shall be deemed to have failed the test. A functional description and a definition of performance by the manufacture and noted in the test report, based on the following criteria Electrostatic discharge There shall be no damage, malfunction or change of status due to the conditioning. Flickering of an indicator during the application of discharge is permissible, providing which could be interpreted by associated equipment as a change, Radiated electromagnetic fields There shall be no damage, malfunction or change of status due to the conditioning. Flickering of an indicator during the application of discharge is permissible, providing which could be interpreted by associated equipment as a change, and no such Flickering of indicators occurs at a field strength of 3 V/m. For components of CCTV systems, where the picture is allowed at 10 V/m, providing. (a) there is no permanent damage or change to EUT (e.g. no corruption of memory or changes to programmable setting etc.) (b) at 3 V/m, any deterioration of the picture is so minor that the system could still be used; and (c) there is no observable deterioration of the picture at 1 V/m. Fast transient burst / slow high energy voltage surge There shall be no damage, malfunction or change of status due to the conditioning. Flickering of an indicator during the application of discharge is permissible, providing That there is no residual is permissible, providing that there is no residual change in the EUT or any change in outputs, which could be interpreted by associated equipment as

16 Page 15 of 68 Conducted RF immunity There shall be no damage, malfunction or change of status due to the conditioning. Flickering of an indicator during the application of discharge is permissible, providing That there is no residual is permissible, providing that there is no residual change in the EUT or any change in outputs, which could be interpreted by associated equipment as a change, and no such flickering of indicators oeuvres at U = 130 dbμv. For component of CCTV systems, where the status is monitored by observing the TV picture, then deterioration of the picture is allowed at U = 140 dbμv, providing (a) there is no permanent damage or change to the EUT (e.g. no corruption of memory or changes to programmable settings etc.) (b) at U = 130 dbμv, any deterioration of the picture is so minor that the system could still be used; and (c) there in no observable deterioration of the picture at U = 120 dbμv. Voltage dip/interruption / Voltage variation There shall be no damage, malfunction or change of status due to the conditioning. Flickering of an indicator during the conditioning is permissible, providing that there is no residual change in the EUT or any change in outputs, which could be interpreted by associated equipment as a change. The EUT shall meet the acceptance criteria for the functional test, after the conditioning.

17 Page 16 of Test results 6.1 Conducted Emission Test specification Testing voltage Test facility EN , Class A DC 12 V, AC 24 V, PoE Shielded room (CE#3) Date Temperature ( C) 22 C Humidity (% R.H.) 19 % R.H. Remarks Limits of conducted emission measurement AC main Frequency [ MHz ] Class A ( db ( μv )) Class B ( db ( μv )) Quasi-peak Average Quasi-peak Average 0.15 ~ ~ 56 * 56 ~ 46* 0.5 ~ ~ *The limit decreases linearly with the logarithm of frequency. Telecommunication Frequency [ MHz ] Class A Voltage Limits ( db ( μv )) Current Limits ( db ( μa )) Quasi-Peak Average Quasi-Peak Average 0.15 ~ to to to to ~ Frequency [ MHz ] Class B Limits ( db ( μv )) Current Limits ( db ( μa )) Quasi-Peak Average Quasi-Peak Average 0.15 ~ to to to to ~ * The limits decrease linearly with the logarithm of the frequency in the range 0.15 MHz to 0.5 MHz * The current and voltage disturbance limits are derived for use with an impedance stabilization Network (ISN) which presents a common mode (asymmetric mode) impedance of 150 Ω to the telecommunication port under test (conversion factor is 20 log /I = 44 db ).

18 Page 17 of Measurement procedure The measurements were performed in a shielded room. EUT was setup as shown in photograph and placed on a non-metallic table height of 0.8 m above the reference ground plane. The rear of table was located 0.4 m to the vertical conducted plane. EUT was power through the LISN, which was bonded to the ground plane. The LISN power was filtered. Each EUT power lead, except ground (safety) lead was individually connected through a LISN to input power source. EUT signal cables that hung closer than 0.4 m to the Horizontal metal ground 0.3 m ~ 0.4 m long. The power cord was bundles in the center. All peripheral equipment was powered from a sub LISN. The LISN and ISN were positioned 0.8 m from the EUT. Peak and Average detection were used in preliminary testing and Quasi-peak and Average detections were used at final measurement. Both lines of power cord, hot and neutral, were measured Used equipments Equipment Model Serial No. Makers Next Cal. Date Used Test Receiver ESHS /003 R&S LISN ESH3-Z R&S LISN NNLK SCHWARZBECK PULSE LIMITER ESH3-Z R&S ISN T TESEQ WIRE ISN NTFM 8158 CAT5 CAT SCHWARZBECK WIRE ISN NTFM 8158 CAT3 CAT SCHWARZBECK ISN ENY R&S

19 Page 18 of Photographs of test setup * Telecommunication #1- DC 12V, #2- AC 24V #3-PoE

20 Page 19 of Conducted emission measurement result * Telecommunication port #1- DC 12V _ LAN Port (LCL 55 db )_10 Mbps Frequency Correction Factor Quasi-peak Average Limit Reading Result Margin Limit Reading Result Margin [ MHz ] ISN Cable [ db ( μv )] [ db ( μv )] [ db ( μv )] [ db ] [ db ( μv )] [ db ( μv )] [ db ( μv )] [ db ] [TEL-Line]

21 Page 20 of 68 #1- DC 12V _ LAN Port (LCL 65 db )_100 Mbps Frequency Correction Factor Quasi-peak Average Limit Reading Result Margin Limit Reading Result Margin [ MHz ] ISN Cable [ db ( μv )] [ db ( μv )] [ db ( μv )] [ db ] [ db ( μv )] [ db ( μv )] [ db ( μv )] [ db ] [TEL-Line]

22 Page 21 of 68 #2- AC 24V _ LAN Port (LCL 55 db )_10 Mbps Frequency Correction Factor Quasi-peak Average Limit Reading Result Margin Limit Reading Result Margin [ MHz ] ISN Cable [ db ( μv )] [ db ( μv )] [ db ( μv )] [ db ] [ db ( μv )] [ db ( μv )] [ db ( μv )] [ db ] [TEL-Line]

23 Page 22 of 68 #2- AC 24V _ LAN Port (LCL 65 db )_100 Mbps Frequency Correction Factor Quasi-peak Average Limit Reading Result Margin Limit Reading Result Margin [ MHz ] ISN Cable [ db ( μv )] [ db ( μv )] [ db ( μv )] [ db ] [ db ( μv )] [ db ( μv )] [ db ( μv )] [ db ] [TEL-Line]

24 Page 23 of 68 #3- PoE _ LAN Port (LCL 55 )_10 Mbps Frequency [ ] Correction Factor Quasi-peak Limit Reading Result Average Margin ISN Cable [ ( )] [ ( )] [ ( )] [ ] Limit Reading Result [ ( )] [ ( )] [ ( )] Margin [ ] [TEL-Line]

25 Page 24 of 68 #3- PoE _ LAN Port (LCL 65 )_100 Mbps Frequency [ ] Correction Factor Quasi-peak Limit Reading Result Average Margin ISN Cable [ ( )] [ ( )] [ ( )] [ ] Limit Reading Result [ ( )] [ ( )] [ ( )] Margin [ ] [TEL-Line]

26 Page 25 of Radiated Emission Test specification EN , Class A Testing voltage DC 12 V, AC 24 V, PoE Test facility 10 m Chamber (#F2) Test distance 10 m, 3 m Date Temperature ( C) 18 C Remarks Humidity (% R.H.) 20 % R.H Limits of radiated emission measurement Limits below 1 Frequency [ ] 30 ~ ~ Class A ( ( 10 m Class B ( ( 10 m Limits above 1 Class 3 m Average limit Peak limit ( ( /m)) ( ( /m)) 1~ ~ Note - The lower limit applies at the transition frequency. Frequency [ ] Class 3 m Average limit Peak limit ( ( /m)) ( ( /m)) Measurement procedure The test was done at a 10 m chamber with a quasi-peak detector. EUT was placed on a non-metallic table height of 0.8 m above the reference ground plane. Cables were folded back and forth forming a bundle 0.3 m to 0.4 m long and were hanged at a 0.4 m height to the ground plane. Cables connected to EUT were fixed to cause maximum emission. Test was made with the antenna positioned in both the horizontal and vertical planes of polarization. The measurement antenna was varied in height above the conducting ground plane to obtain the maximum signal strength.

27 Page 26 of Used equipments Equipment Model no. Serial no. Makers Next Cal. Date Test Receiver ESCI R&S Bi-Log Antenna VULB Amplifier 310N Attenuator 8491A SCHWARZBECK SONOMA INSTRUMENT HP Antenna Mast MA4000-EP 303 Innco Systems - Turn Table DT2000S-1t 079 Innco Systems - Horn ANT ETS Amplifier 8449B 3008A01802 AGILENT Amplifier 8449B 3008A02343 AGILENT Spectrum Analyzer FSP R&S Used Sample calculation The field strength is calculated adding the antenna Factor, cable loss and, Antenna pad adding, subtracting the amplifier gain from the measured reading. The sample calculation is as follow Result = M.R + C.F(A.F + C.L +3 Att A.G) M.R = Meter Reading C.F = Correction Factor A.F = Antenna Factor C.L = Cable Loss A.G= Amplifier Gain 3 Att = 3 Attenuator If M.R is 30, A.F 12, C.L 5, 3, A.G 35 The result is = 15 ( /m)

28 Page 27 of Photographs of test setup * 30 ~ 1 (#1- DC 12V, #2- AC 24V)

29 Page 28 of 68 * 1 ~ 6 (#1- DC 12V, #2- AC 24V)

30 Page 29 of 68 * 30 ~ 1 (#3-PoE)

31 Page 30 of 68 * 1 ~ 6 (#3-PoE)

32 Page 31 of Radiated emission measurement result * Graph and Data * 30 ~ 1 (#1- DC 12V) EMC Compliance Ltd. 10m Chamber <<Radiated Emission>> Model SNB-6003P Serial Operator DC Power DC 12V Temp,Humidity [db(uv/m)] 60 Standard Remark1 Remark2 Remark3 Remark4 CISPR Pub.22 Class A 10m <CISPR 22 Class A> Limit(QP) <CE_DC 12V> Spectrum(H,PK) Spectrum(V,PK) Suspected Item(H) Suspected Item(V) Final Item(H,QP) Final Item(V,QP) 50 Level Frequency 1000 [MHz] Final Result No. Frequency [MHz] (P) Reading QP [db(uv)] V 46.1 V 50.2 V 43.7 V 53.5 V 48.3 H 39.3 H 37.2 V 33.4 c.f Result QP [db(1/m)] [db(uv/m)] Limit QP [db(uv/m)] Margin QP [db] Height Angle [cm] [deg] Remark

33 Page 32 of 68 * 1 ~ 6 (#1- DC 12V) EMC Compliance Ltd. 10m Chamber <<Radiated Emission>> Model SNB-6003P Serial Operator DC Power DC 12V Temp,Humidity [db(uv/m)] 90 Standard Remark1 Remark2 Remark3 Remark4 CISPR Pub.22 Class A GHz 3m <CISPR 22 A GHz 3m> Limit(AV) Limit(PK) <CE_DC 12V_G> Spectrum(H,PK) Spectrum(V,PK) Suspected Item(H) Suspected Item(V) Final Item(H,AV) Final Item(H,PK) Final Item(V,AV) Final Item(V,PK) Level Frequency 6000 [MHz] Final Result No. Frequency [MHz] (P) V V H V V V Reading AV [db(uv)] Reading PK [db(uv)] c.f Result AV [db(1/m)] [db(uv/m)] Result PK [db(uv/m)] Limit AV [db(uv/m)] Limit PK [db(uv/m)] Margin AV [db] Margin PK [db] Height Angle [cm] [deg] Remark

34 Page 33 of 68 * 30 ~ 1 (#2- AC 24V) EMC Compliance Ltd. 10m Chamber <<Radiated Emission>> Model SNB-6003P Serial Operator AC Power AC 24V Temp,Humidity [db(uv/m)] 60 Standard Remark1 Remark2 Remark3 Remark4 CISPR Pub.22 Class A 10m <CISPR 22 Class A> Limit(QP) <CE_AC 24V> Spectrum(H,PK) Spectrum(V,PK) Suspected Item(H) Suspected Item(V) Final Item(H,QP) Final Item(V,QP) 50 Level Frequency 1000 [MHz] Final Result No. Frequency [MHz] (P) Reading QP [db(uv)] V 46.2 V 50.4 V 44.4 V 50.8 V 51.1 H 41.5 H 35.9 V 29.5 c.f Result QP [db(1/m)] [db(uv/m)] Limit QP [db(uv/m)] Margin QP [db] Height Angle [cm] [deg] Remark

35 Page 34 of 68 * 1 ~ 6 (#2- AC 24V) EMC Compliance Ltd. 10m Chamber <<Radiated Emission>> Model SNB-6003P Serial Operator AC Power AC 24V Temp,Humidity [db(uv/m)] 90 Standard Remark1 Remark2 Remark3 Remark4 CISPR Pub.22 Class A GHz 3m <CISPR22 A GHz 3m> Limit(AV) Limit(PK) <CE_AC 24V_G> Spectrum(H,PK) Spectrum(V,PK) Suspected Item(H) Suspected Item(V) Final Item(H,AV) Final Item(H,PK) Final Item(V,AV) Final Item(V,PK) Level Frequency 6000 [MHz] Final Result No. Frequency [MHz] (P) H V V V V V Reading AV [db(uv)] Reading PK [db(uv)] c.f Result AV [db(1/m)] [db(uv/m)] Result PK [db(uv/m)] Limit AV [db(uv/m)] Limit PK [db(uv/m)] Margin AV [db] Margin PK [db] Height Angle [cm] [deg] Remark

36 Page 35 of 68 * 30 ~ 1 (#3- PoE) EMC Compliance Ltd. 10m Chamber <<Radiated Emission>> Model SNB-6003P Serial Operator Power POE Temp,Humidity [db(uv/m)] 60 Standard Remark1 Remark2 Remark3 Remark4 CISPR Pub.22 Class A 10m <CISPR 22 Class A> Limit(QP) <CE_POE> Spectrum(H,PK) Spectrum(V,PK) Suspected Item(H) Suspected Item(V) Final Item(H,QP) Final Item(V,QP) 50 Level Frequency 1000 [MHz] Final Result No. Frequency [MHz] (P) Reading QP [db(uv)] V 45.7 V 47.1 V 42.0 V 47.3 V 50.6 H 41.5 H 33.6 H 34.5 c.f Result QP [db(1/m)] [db(uv/m)] Limit QP [db(uv/m)] Margin QP [db] Height Angle [cm] [deg] Remark

37 Page 36 of 68 * 1 ~ 6 (#3- PoE) EMC Compliance Ltd. 10m Chamber <<Radiated Emission>> Model SNB-6003P Serial Operator Power POE Temp,Humidity [db(uv/m)] 90 Standard Remark1 Remark2 Remark3 Remark4 CISPR Pub.22 Class A GHz 3m <CISPR22 A GHz 3m> Limit(AV) Limit(PK) <CE_POE_G> Spectrum(H,PK) Spectrum(V,PK) Suspected Item(H) Suspected Item(V) Final Item(H,AV) Final Item(H,PK) Final Item(V,AV) Final Item(V,PK) Level Frequency 6000 [MHz] Final Result No. Frequency [MHz] (P) V V H V V V Reading AV [db(uv)] Reading PK [db(uv)] c.f Result AV [db(1/m)] [db(uv/m)] Result PK [db(uv/m)] Limit AV [db(uv/m)] Limit PK [db(uv/m)] Margin AV [db] Margin PK [db] Height Angle [cm] [deg] Remark

38 Page 37 of Flicker Test specification EN Testing voltage 230 V, 50 (From AC/AC Adaptor) Test facility Immunity area Date Temperature( C) 21 C Remarks Humidity (% R.H.) 21 % R.H. Pressure ( ) Measurement procedure EUT was connected to the power analyzer system. Measurement was performed to obtain the desired flicker parameters. The measuring time depends on which parameters are to be measured. Plt =2h Pst = 10 min Controls and automatic programs shall be set to produce the most unfavorable sequence of voltage changes, using only those combinations of controls and programs are mentioned by the manufacturer in the instruction manual Used equipments Equipment Model no. Serial no. Makers Next Cal. date Harmonics/Flicker meter 5001x-CTS C.I Used

39 Page 38 of Photographs of test setup #2- AC 24 V

40 Page 39 of Measurement result #2- AC 24 V

41 Page 40 of Electrostatic Discharge Test specification EN Contact ± 6 Air ± 2, ± 4, ± 8 HCP ± 2, ± 4, ± 6 VCP ± 2, ± 4, ± 6 Test level Discharge impedance 330 Ω / 150 Number of discharge (Each polarity) Contact 10 Air 10 HCP / VCP 10 Interval between discharges 1s Testing voltage DC 12 V, AC 24 V, PoE Test facility Shielded room Date Temperature( C) 21 C Remarks - There was no change of operation status during above testing. Humidity (% R.H.) 39 % R.H. Pressure ( ) Measurement procedure A ground reference plane was located on the floor, and connected to earth via a low Impedance connection. The return cable of the ESD generator was connected to the reference plane. In case of floor standing equipment, EUT was placed on the reference plane on 0.1 m of insulating Support. In case of table top equipment, EUT was placed on a wooden table 0.8 m above the reference grounded floor. A horizontal coupling plane (HCP) was placed on the table, and Connected to the reference plane via a 470 resistor located in each end (0.5 insulating support between EUT and HCP). In both cases a vertical coupling plane(vcp) OF 0.5 X 0.5 m was located 0.1 m from the EUT s sides. The VCP was connected to the reference plane in the same matter as the HCP.

42 Page 41 of Used equipments Equipment Model No. Serial No. Makers Next Cal. Date ESD Tester PESD 1600 H HAEFELY HCP VCP Used Photographs of test setup #1- DC 12V, #2- AC 24V

43 Page 42 of 68 #3-PoE

44 Page 43 of Measurement result Electrostatic Discharge (Test Point) Air discharge Contact discharge #1- DC 12V, #2- AC 24V

45 Page 44 of 68 #3-PoE

46 Page 45 of 68

47 Page 46 of 68 #1- DC 12 V, #2- AC 24 V, #3- PoE HCP/VCP discharge Location(EUT) HCP (All 4 sides) VCP (All 4 sides) Applied level (±) ± 2, ± 4, ± 6 Result Contact discharge Location(EUT) C1 Enclosure(Case) C2 Screw C3 LAN(RJ-45) Port C4 Power Port C5 GND Applied level (±) ±6 ±6 ±6 ±6 ±6 Result Air discharge Location(EUT) A1 Enclosure(Case) Applied level (±) ± 2, ± 4, ± 8 Result A2 Lens ± 2, ± 4, ± 8 A3 IRIS Port ± 2, ± 4, ± 8 A4 Alarm In/Out Port ± 2, ± 4, ± 8 A5 Audio In/Out Port ± 2, ± 4, ± 8

48 Page 47 of Radio Frequency Electromagnetic Fields Test specification EN A22010 Tested frequency 80 ~ 1, 1 ~ 2, 2 ~ 2.7 Test level & Modulation 1 V/m, 3 V/m, 10 V/m, 80 % Amplitude Modulation (1 ) 1 V/m, 3 V/m, 10 V/m, Pulse Modulation (1 (0.5s ON 0.5s OFF)) Frequency Step log 1 % step Dwell time 3s Distance 3 m from EUT to tip of antenna Testing Voltage DC 12 V, AC 24 V, PoE Test facility Fully anechoic chamber (3 m) Date Temperature( C) 21 C Remarks - There was no change of operation status during above testing. Humidity (% R.H.) 23 % R.H. Pressure ( ) Measurement procedure The test was performed at 3 m full anechoic chamber. For floor standing equipment, the EUT was standing on the floor. For tabletop equipment, the EUT was located on a wooden table 0.8 m above the floor. The EUT was tested all sides, horizontal and vertical polarization.

49 Page 48 of Used equipments Equipment Model no. Serial no. Makers Next Cal. date Power meter PM AR Power sensor PH AR Power sensor PH AR Directional coupler DC AR Directional coupler DC7144M AR Signal generator E4421B GB AGILENT Amplifier BBA R&S Amplifier 60S1G3M AR Broadband Ant. LPDA Fiber Optic Modem HI-4413P - ETS ETSLINDGREM Antenna master - - ETS - Used Photographs of test setup #1- DC 12 V, #2- AC 24 V

50 Page 49 of 68 #3- PoE Measurement result #1- DC 12 V, #2- AC 24 V, #3- PoE Location(EUT) Front side Rear side Left side Right side Antenna polarization Horizontal Vertical Horizontal Result Vertical Horizontal Vertical Horizontal Vertical

51 Page 50 of Electric Fast Transient/BURST Test specification EN A12010 Coupling DC 12 V, AC 24 V Signal Clamp Telecommunication Clamp Test level DC 12 V, AC 24 V ± 1 Peak Signal ± 1 Peak Telecommunication ± 1 Peak Repetition frequency 100, Tr/Th = 5 / 50 Coupling time 60 s Testing Voltage DC 12 V, AC 24 V, PoE Test facility Shielded room Date Temperature( C) 24 C Remarks - There was no change of operation status during above testing. Humidity (% R.H.) 20 % R.H. Pressure ( ) Measurement procedure A ground reference plane was located on the floor. EFT generator was connected to reference ground plane via low impedance connection. For floor standing equipment, EUT was placed on a 0.1 m wooden table. For tabletop equipment, EUT was placed on a 0.1 m above the ground reference plane. Test generator and coupling/decoupling network was placed on, and bounded to, the ground reference plane. When using the coupling clamp, the minimum distance between the coupling plates and all other conductive surfaces, except the ground reference plane beneath the coupling clamp, Shall be 0.5 m Used equipments Equipment Model No. Serial No. Makers Next Cal. date Generator UCS 500 M EM TEST Capacitive Coupling Clamp - - EM TEST - Used

52 Page 51 of Photographs of test setup #1- DC 12 V, #2- AC 24 V

53 Page 52 of 68 #3- PoE Measurement result * AC/DC Line EFT coupling point (+) (-) Result AC 24 V +1-1 DC 12 V +1-1 * Signal (DC 12 V, AC 24 V, PoE) EFT coupling point (+) (-) Result Alarm In/Out +1-1 * Telecommunication (DC 12 V, AC 24 V, PoE) EFT coupling point (+) (-) Result LAN(RJ-45) +1-1 LAN(PoE) +1-1

54 Page 53 of Surge Test specification EN DC 12 V, AC 24 V CDN Signal CDN Coupling DC 12 V, AC 24 V Test level Differential mode ± 0.5, ± 1 Common mode ± 0.5, ± 1, ± 2 Signal ± 0.5, ± 1 Differential mode Ω Coupling Impedance Common mode 10 Ω + 9 Direct Surge pulse shape Tr/Th = 1.2 / 50 Number of surge 5 Coupling time 1 min Testing Voltage DC 12 V, AC 24 V, PoE Test facility Shielded room Date Temperature( C) 24 C Remarks - There was no change of operation status during above testing. Humidity (% R.H.) 20 % R.H. Pressure ( ) Measurement procedure A ground reference plane was located on the floor. SURGE generator was connected to reference ground plane via low impedance connection. For floor standing equipment & table top equipment, EUT was placed on a wooden table Used equipments Equipment Model No. Serial No. Makers Next Cal. date Generator UCS 500 M EM TEST CDN CNV 508 N1 V EM TEST Used

55 Page 54 of Photographs of test setup #1- DC 12 V, #2- AC 24 V

56 Page 55 of 68 #3-PoE Measurement result * AC /DC Line Coupling point (+) (-) Result DC 12 V AC 24 V + 0.5, , , , - 1 * Signal (DC 12 V, AC 24 V, PoE) Coupling point (+) (-) Result Alarm In/Out + 0.5, , - 1

57 Page 56 of Conducted Immunity Test specification EN Tested frequency 0.15 ~ 100 Test level & Modulation 1 V, 3 V, 10 V, 80 % Amplitude Modulation (1 ) 1 V, 3 V, 10 V, Pulse Modulation (1 (0.5s ON 0.5s OFF)) Frequency Step log 1 % step Coupling method DC 12 V, AC 24 V CDN(M2) Signal Clamp Telecommunication Clamp Testing Voltage DC 12 V, AC 24 V, PoE Test facility Shielded room Date Temperature( C) 20 C Remarks - There was no change of operation status during above testing. Humidity (% R.H) 40 % R.H Pressure( ) Measurement procedure A ground reference plane was located on the floor. The test was performed on a ground reference plane on a 0.1 m wooden table. This test were Performed using CDN for mains, clamp for signal and injection probe. The frequency range was swept from 0.15 to 100. This frequency range was Modulated with 1 sine wave at 80 %. The signal generators provided the modulated frequency at a 1 % step size. The power and all network cable, I/O cables longer than 3 m length were tested.

58 Page 57 of Used equipments Equipment Model no. Serial no. Makers Next Cal. date CS generator NSG Schaffner CDN M Schaffner CDN CDN M2/M3N EM TEST Attenuator INA Schaffner EM Clamp KEMZ Schaffner Current probe MD720 W /M6/ 0068 Schaffner - Used Photographs of test setup #1- DC 12 V, #2- AC 24 V

59 Page 58 of 68 #3- PoE

60 Page 59 of Measurement result * AC/DC Line Coupling point Coupling method Result AC 24 V CDN(M2) DC 12 V CDN(M2) Coupling point Coupling method Result Alarm In/Out Clamp * Signal (DC 12 V, AC 24 V, PoE) * Telecommunication (DC 12 V, AC 24 V, PoE) Coupling point Coupling method Result LAN(RJ-45) Clamp LAN(PoE) Clamp

61 Page 60 of Dips and Interruptions Test specification EN Number of dips 3T Duration 10 s Phase Zero crossing (0 ) Testing Voltage 230 V, 50 (From AC/AC Adaptor) Test facility Shielded room Test Date Temperature ( C) 24 C Remarks Humidity (% R.H) 20 % R.H Pressure ( ) Measurement procedure The dips/interruption test is only applicable to AC mains. The dips/interruptions were applied at zero crossing Used equipments Equipment Model no. Serial no. Makers Next Cal. date Generator UCS 500 M EM TEST Used

62 Page 61 of Photographs of test setup #2- AC 24 V Measurement result * 230 V, 50 (From AC/AC Adaptor) Test Level (%UT) Dip/Int. (%UT) Duration /Period Phase ( ) Count number Result 80 % 20% 250 Period(1) 0 3T 70 % 30 % 25Period 0 3T 40 % 60 % 10 Period 0 3T 0 3T Note* 0% 100 % 250 Period (2) Comment - There was no change of operation status during above testing. (250 Period (1), 25 Period, 10 Period) - The power of EUT is off during the test. After the test, EUT is getting back to normal operation. (250 Period(2)) Note* It fully recorded using ancillary Power source equipment to content with Manufacturer`s set up manual.

63 Page 62 of E.U.T. photographs Front View Rear View

64 Page 63 of 68 Left View Right View

65 Page 64 of 68 Top View Bottom View

66 Page 65 of 68 Inside

67 Page 66 of 68 Main Board

68 Page 67 of 68 CCD Board

69 Page 68 of 68 Power Board

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