Declaration of Conformity.
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- Ferdinand Greer
- 5 years ago
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1 Declaration of Conformity. Type of equipment: Brand Name /Trade Mark: Type designation /model: Applicant: DVR SAMSUNG SRD-1640P SAMSUNG TECHWIN CO., LTD. In accordance with the following Directives: 2004/108/EC The Electromagnetic Compatibility Directive Including amendments by the CE Marking Directive 93/68/EEC The following harmonized European standards or technical specifications have been applied: EN 55022:2010 EN :1995 +A1:1998 +A2:2003 EN :2006+A2:2009 EN :2008 EN :2009 EN :2006+A1:2008 EN :2004+A1:2010 EN :2006 EN :2009 EN :2004 Limits and methods of measurement of radio disturbance characteristics of information technology equipment Product family standard: Immunity requirements for components of fire, intruder and social alarm systems Limits for harmonic current emissions Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current <=16 A per phase and not subject to conditional connection Electrostatic discharge immunity test Radiated, radio-frequency, electromagnetic field immunity test Electrical fast transient/burst immunity test Surge immunity test Immunity to conducted disturbances, induced by radio-frequency fields Voltage dips, short interruptions and voltage variations immunity tests The CE Marking on the products and/or their packaging signifies that SAMSUNG TECHWIN CO., LTD. holds the reference technical file available to the European Union authorities. Place and date of issue: #42 Seongju-Dong, Changwon-Shi, Kyungsangnam-Do,Korea / May 24, 2012 Authorized Signatory: Name : Jei Soon, Kang Title : Principal Research Engineer Signature :
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3 Page: 2 of 72 Contents 1. Applicant information Laboratory information Test system configuration Operation environment Measurement Uncertainty Description of E.U.T General information Product description Auxiliary equipments Test configuration Operating conditions Summary of test results Modification to the E.U.T Summary of EMI emission test results Summary of immunity test results Performance criteria Test results Conducted Emission Radiated Emission Harmonics Flicker Electrostatic Discharge Radio Frequency Electromagnetic Fields Electric Fast Transient/BURST Surge Conducted Immunity Dips and Interruptions Mains supply voltage variations E.U.T. photographs... 56
4 Page: 3 of Applicant information Applicant: SAMSUNG TECHWIN CO., LTD. Address: #42 Seongju-Dong, Changwon-Shi, Kyungsangnam-Do, Korea Telephone: Fax: js2002.kang@samsung.com Contact name: Kang Jei Soon Manufacturer#1: SAMSUNG TECHWIN CO., LTD. Address: #42 Seongju-Dong, Changwon-Shi, Kyungsangnam-Do, Korea Telephone: Fax: js2002.kang@samsung.com Contact name: Kang Jei Soon Manufacturer#2: Address: TIANJIN SAMSUNG TECHWIN OPTO-ELECTRONIC CO., LTD No.11 Weiliu Road. Micro-Electronic Industrial Park Jingang Road Tianjin , China
5 Page: 4 of Laboratory information Address EMC compliance Ltd Sin-dong, Yeongtong-gu, Suwon-city, Gyeonggi-do, , Korea Telephone Number: Facsimile Number: FCC CAB.: KR0040 VCCI Registration No. : R-3327, G-198, C-3706, T-1849 Industry Canada Registration No. : 8035A KOLAS NO.: 231 SITE MAP Suwon city EMC compliance
6 Page: 5 of Test system configuration 3.1 Operation environment Temperature Humidity Pressure Chamber(10 m) : 20 C 19 % R.H. - Shielded room(ce) : 21 C 20 % R.H. - Shielded room(esd) : 32 C 40 % R.H kpa Test site These testing items were performed following locations; Test item Test site Conducted Emission Shielded Room Radiated Emission 10 m Chamber Harmonics current Immunity area Voltage fluctuations and flickers Immunity area Electrostatic discharge Shielded Room Radiated RF immunity Fully anechoic chamber (3 m) Electric Fast Transient/BURST Shielded Room Surge Shielded Room Conducted RF immunity Shielded Room Voltage dip/interruption Shielded Room Mains supply voltage variations Shielded Room
7 Page: 6 of Measurement Uncertainty All measurements involve certain levels of uncertainties, especially in field of EMC. The factors contributing to uncertainties are test receiver, cable loss, antenna factor calibration, Antenna directivity, antenna factor variation with height, antenna phase center variation, antenna frequency interpolation, measurement distance variation, site imperfection, mismatch, and system repeatability. Based on CISPR , the measurement uncertainty level with a 95 % confidence level was applied. Conducted emission measurement :( k = 2, 95 %) Shielded Room (CE#1) Shielded Room (CE#2) Shielded Room (CE#3) Radiated Emission measurement :( k = 2, 95 %) 10 m Chamber (#F4) 10 m Chamber (#F2) 9 khz ~ 150 khz : ± 3.77 [ db ] 150 khz ~ 30 MHz : ± 3.35 [ db ] 9 khz ~ 150 khz : ± 3.95 [ db ] 150 khz ~ 30 MHz : ± 3.55 [ db ] 9 khz ~ 150 khz : ± 3.88 [ db ] 150 khz ~ 30 MHz : ± 3.50 [ db ] 30 MHz ~ 300 MHz 300 MHz ~ MHz 3 m: [ db ], [ db ] 10 m: [ db ], [ db ] 3 m: [ db ], [ db ] 10 m: [ db ], [ db ] 1 GHz ~ 6 GHz 3 m: [ db ], [ db ] 30 MHz ~ 300 MHz 300 MHz ~ MHz Radio Frequency Electromagnetic Fields :( k = 2, 95 %) ± 1.82 [ db ] Disturbance power Electromagnetic Fields: (k = 2, 95 %) ± 3.73 [ db ] 3 m: [ db ], [ db ] 10 m: [ db ], [ db ] 3 m: [ db ], [ db ] 10 m: [ db ], [ db ] 1 GHz ~ 6 GHz 3 m: [ db ], [ db ]
8 Page: 7 of Description of E.U.T. 4.1 General information
9 Page: 8 of Product description Type of product Model name (Basic) Model name (Variant) DVR SRD-1640P N/A Difference - Trade name - Serial no Testing voltage Product rating Internal clock frequency Note Engineering Sample 230 V, 50 Hz AC/DC Adaptor (model name: ADP-4812) Input: AC V, 50 / 60 Hz, 1.2 A Output: DC 12 V, 4 A 400 MHz AC/DC adaptor was provided by the manufacturer. 4.3 Auxiliary equipments Type Model / Part # Serial number Manufacturer Note PC C FUJITSU Monitor 1 GH19PS N727HVZLC04632H SAMSUNG Monitor 2 PM24KO YER8HVDBA00057E SAMSUNG Camera SDC-435P C08C6V3Z SAMSUNG TECHWIN Controller SC CNB JIG - - -
10 Page: 9 of Test configuration
11 Page: 10 of 72 Note * 1 Start End Cable Length Name I/O port Name I/O port Spec. (m) Power AC/DC Adaptor Power 1.6 Non-Shield - 2 USB USB Memory USB Direct LAN(RJ-45) Note PC LAN(RJ-45) 3.0 Non-Shield - 4 Console Note PC RS Shield - Cable 5 Audio In #1 Note PC Audio Out 3.0 Shield Out-door 6 Audio In #2~#4 Open Shield Out-door 7 RS-485 Controller RS Non-Shield Out-door 8 Alarm In #1~#4 JIG Alarm Out #1~#4 3.0 Non-Shield Out-door 9 Alarm In #5~#16 Open Non-Shield Out-door 10 EUT Alarm In Alarm Out #1~#2 JIG (DVR) #1~#2 3.0 Non-Shield Out-door 11 USB USB Mouse (EUT) USB 1.6 Shield - 12 D-SUB Monitor 1 D-SUB 1.6 Shield - 13 Audio Out Monitor 1 Audio In 3.0 Shield Out-door 14 Video Out Monitor 2 Video In 3.0 Shield Out-door 15 Video In #1 Camera Video Out 3.0 Shield Out-door 16 Video In #2~#16 75 Ω Termination Shield Out-door 17 SPOT 75 Ω Termination Shield Out-door 18 Serial Open Shield Operating conditions The EUT was configured as normal intended use. Test mode Normal operating Web viewer test mode. 1 Monitoring test mode. Alarm operating mode. RS-485 operating mode.
12 Page: 11 of Summary of test results 5.1 Modification to the E.U.T. None 5.2 Summary of EMI emission test results Applied Test items Test method Result Conducted Emission EN 55022:2010 Radiated Emission EN 55022:2010 Harmonics current EN :2006+A2:2009 Voltage fluctuations and flickers EN : Summary of immunity test results Applied Test items Test method Result Electrostatic discharge EN :2009 Radiated RF immunity EN :2006+A1:2008 Electric Fast Transient/BURST EN :2004+A1:2010 Surge EN :2006 Conducted RF immunity EN :2009 Voltage dip/interruption EN :2004 Mains supply voltage variations EN :1995+A1:1998+A2:2003
13 Page: 12 of Performance criteria The variety and the diversity of the apparatus within the scope of this document makes it difficult to define precise criteria for the evaluation of the immunity test results. If as a result of the application of the tests defined in this standard, the apparatus becomes dangerous or unsafe then the apparatus shall be deemed to have failed the test. A functional description and a definition of performance by the manufacture and noted in the test report, based on the following criteria: Electrostatic discharge There shall be no damage, malfunction or change of status due to the conditioning. Flickering of an indicator during the application of discharge is permissible, providing which could be interpreted by associated equipment as a change, Radiated electromagnetic fields There shall be no damage, malfunction or change of status due to the conditioning. Flickering of an indicator during the application of discharge is permissible, providing which could be interpreted by associated equipment as a change, and no such Flickering of indicators occurs at a field strength of 3 V/m. For components of CCTV systems, where the picture is allowed at 10 V/m, providing. (a) there is no permanent damage or change to EUT (e.g. no corruption of memory or changes to programmable setting etc.) (b) at 3 V/m, any deterioration of the picture is so minor that the system could still be used; and (c) there is no observable deterioration of the picture at 1 V/m. Fast transient burst / slow high energy voltage surge There shall be no damage, malfunction or change of status due to the conditioning. Flickering of an indicator during the application of discharge is permissible, providing That there is no residual is permissible, providing that there is no residual change in the EUT or any change in outputs, which could be interpreted by associated equipment as
14 Page: 13 of 72 Conducted RF immunity There shall be no damage, malfunction or change of status due to the conditioning. Flickering of an indicator during the application of discharge is permissible, providing That there is no residual is permissible, providing that there is no residual change in the EUT or any change in outputs, which could be interpreted by associated equipment as a change, and no such flickering of indicators oeuvres at U = 130 dbμv. For component of CCTV systems, where the status is monitored by observing the TV picture, then deterioration of the picture is allowed at U = 140, providing: (a) there is no permanent damage or change to the EUT (e.g. no corruption of memory or changes to programmable settings etc.): (b) at U = 130 dbμv, any deterioration of the picture is so minor that the system could still be used; and (c) there in no observable deterioration of the picture at U = 120 dbμv. Voltage dip/interruption / Voltage variation There shall be no damage, malfunction or change of status due to the conditioning. Flickering of an indicator during the conditioning is permissible, providing that there is no residual change in the EUT or any change in outputs, which could be interpreted by associated equipment as a change. The EUT shall meet the acceptance criteria for the functional test, after the conditioning.
15 Page: 14 of Test results 6.1 Conducted Emission Test specification Testing voltage Test facility EN 55022:2010, Class A 230 V, 50 Hz Shielded room (CE#1) Date Temperature ( C) 21 C Humidity (% R.H.) 20 % R.H. Remarks Limits of conducted emission measurement AC main Frequency [ MHz ] Class A ( db ( μv )) Class B ( db ( μv )) Quasi-peak Average Quasi-peak Average 0.15 ~ ~ 56 * 56 ~ 46* 0.5 ~ ~ *The limit decreases linearly with the logarithm of frequency. Telecommunication Frequency [ MHz ] Class A Voltage Limits ( db ( μv )) Current Limits ( db ( μa )) Quasi-Peak Average Quasi-Peak Average 0.15 ~ to to to to ~ Frequency [ MHz ] Class B Limits ( db ( μv )) Current Limits ( db ( μa )) Quasi-Peak Average Quasi-Peak Average 0.15 ~ to to to to ~ * The limits decrease linearly with the logarithm of the frequency in the range 0.15 MHz to 0.5 MHz * The current and voltage disturbance limits are derived for use with an impedance stabilization Network (ISN) which presents a common mode (asymmetric mode) impedance of 150 Ω to the telecommunication port under test (conversion factor is 20 log /I = 44 db ).
16 Page: 15 of Measurement procedure The measurements were performed in a shielded room. EUT was setup as shown in photograph and placed on a non-metallic table height of 0.8 m above the reference ground plane. The rear of table was located 0.4 m to the vertical conducted plane. EUT was power through the LISN, which was bonded to the ground plane. The LISN power was filtered. Each EUT power lead, except ground (safety) lead was individually connected through a LISN to input power source. EUT signal cables that hung closer than 0.4 m to the Horizontal metal ground 0.3 m ~ 0.4 m long. The power cord was bundles in the center. All peripheral equipment was powered from a sub LISN. The LISN and ISN were positioned 0.8 m from the EUT. Peak and Average detection were used in preliminary testing and Quasi-peak and Average detections were used at final measurement. Both lines of power cord, hot and neutral, were measured Used equipments Equipment Model Serial No. Makers Next Cal. Date Used Test Receiver ESHS /003 R&S LISN ESH3-Z R&S LISN L2-16A 0000J10705 PMM - ISN T TESEQ
17 Page: 16 of Photographs of test setup * AC Main
18 Page: 17 of 72 * Telecommunication
19 Page: 18 of Conducted emission measurement result *AC Main Frequency Correction Factor Line Quasi-peak Average Limit Reading Result Margin Limit Reading Result Margin [ MHz ] LISN Cable [ db ( μv )] [ db ( μv )] [ db ( μv )] [ db ] [ db ( μv )] [ db ( μv )] [ db ( μv )] [ db ] N H N N H N N H H H H N
20 Page: 19 of 72 [Hot-Line] [Neutral-Line]
21 Page: 20 of 72 * Telecommunication port * LCL 55 db (LAN(RJ-45) Port)_10Mbps Frequency Correction Factor Quasi-peak Average Limit Reading Result Margin Limit Reading Result Margin [ MHz ] ISN Cable [ db ( μv )] [ db ( μv )] [ db ( μv )] [ db ] [ db ( μv )] [ db ( μv )] [ db ( μv )] [ db ] [TEL-Line]
22 Page: 21 of 72 * LCL 65 db (LAN(RJ-45) Port)_100Mbps Frequency Correction Factor Quasi-peak Average Limit Reading Result Margin Limit Reading Result Margin [ MHz ] ISN Cable [ db ( μv )] [ db ( μv )] [ db ( μv )] [ db ] [ db ( μv )] [ db ( μv )] [ db ( μv )] [ db ] [TEL-Line]
23 Page: 22 of Radiated Emission Test specification Testing voltage Test facility Test distance EN 55022:2010, Class A 230 V, 50 Hz 10 m Chamber (#F2) 10 m, 3 m Date Temperature ( C) 20 C Humidity (% R.H.) 19 % R.H. Remarks Limits of radiated emission measurement Limits below 1 GHz Frequency [ MHz ] Class A ( db ( μv 10 m Class B ( db ( μv 10 m 30 ~ ~ Limits above 1 GHz Class 3 m Class 3 m Frequency Average limit Peak limit Average limit Peak limit [ GHz ] ( db ( μv /m)) ( db ( μv /m)) ( db ( μv /m)) ( db ( μv /m)) 1 ~ ~ Note - The lower limit applies at the transition frequency Measurement procedure The test was done at a 10 m chamber with a quasi-peak detector. EUT was placed on a non-metallic table height of 0.8 m above the reference ground plane. Cables were folded back and forth forming a bundle 0.3 m to 0.4 m long and were hanged at a 0.4 m height to the ground plane. Cables connected to EUT were fixed to cause maximum emission. Test was made with the antenna positioned in both the horizontal and vertical planes of polarization. The measurement antenna was varied in height above the conducting ground plane to obtain the maximum signal strength.
24 Page: 23 of Used equipments Equipment Model no. Serial no. Makers Next Cal. Date Used Test Receiver ESCI R&S Bi-Log Antenna VULB SCHWARZBECK Amplifier 310N SONOMA INSTRUMENT db Attenuator 8491A HP Antenna Mast MA4000-EP 303 Innco Systems - Turn Table DT2000S-1t 079 Innco Systems - Horn ANT ETS Amplifier 8449B 3008A01802 AGILENT Spectrum Analyzer FSP R&S Sample calculation The field strength is calculated adding the antenna Factor, cable loss and, Antenna pad adding, subtracting the amplifier gain from the measured reading. The sample calculation is as follow: Result = M.R + C.F(A.F + C.L +3 db Att A.G) M.R = Meter Reading C.F = Correction Factor A.F = Antenna Factor C.L = Cable Loss A.G= Amplifier Gain 3 db Att = 3 db Attenuator If M.R is 30 db, A.F 12 db, C.L 5 db, 3 db, A.G 35 db The result is = 15 db ( μv /m)
25 Page: 24 of Photographs of test setup * 30 MHz ~ 1 GHz
26 Page: 25 of 72 *1 ~6
27 Page: 26 of Radiated emission measurement result * Graph and Data * 30 ~ 1 EMC Compliance Ltd. 10m Chamber <<Radiated Emission>> Model : Serial : Operator : AC Power : AC 230V / 50Hz Temp,Humidity: [db(uv/m)] 60 Standard Remark1 Remark2 Remark3 Remark4 : CISPR 22 Class A 10m : : : : <CISPR 22 Class A> Limit(QP) <CE> Spectrum(H.PK) Spectrum(V,PK) Suspected Item(H) Suspected Item(V) Final Item(H,QP) Final Item(V,QP) 50 Level Frequency 1000 [MHz] Final Result No. Frequency [MHz] (P) V V V H H V H H Reading QP [db(uv)] c.f Result QP [db(1/m)] [db(uv/m)] Limit QP [db(uv/m)] Margin QP [db] Height Angle [cm] [deg] Remark
28 Page: 27 of 72 *1 ~6 EMC Compliance Ltd. 10m Chamber <<Radiated Emission>> Model : Serial : Operator : AC Power : AC 230V / 50Hz Temp,Humidity: [db(uv/m)] 90 Standard Remark1 Remark2 Remark3 Remark4 : CISPR Pub.22 Class A GHz 3m : : : : <CISPR22 A GHz 3m> Limit(AV) Limit(PK) <CE_SVSWR> Spectrum(H.PK) Spectrum(V,PK) Suspected Item(H) Suspected Item(V) Final Item(H,AV) Final Item(H,PK) Final Item(V,AV) Final Item(V,PK) Level Frequency 6000 [MHz] Final Result No. Frequency (P) Reading Reading c.f Result Result AV PK AV PK [MHz] [db(uv)] [db(uv)] [db(1/m)] [db(uv/m)] [db(uv/m)] V V V H H V Limit Limit AV PK [db(uv/m)] [db(uv/m)] Margin AV [db] Margin Height PK [db] [cm] Angle Remark [deg]
29 Page: 28 of Harmonics Test specification EN :2006+A2:2009 Testing voltage 230 V, 50 Test facility Immunity area Date Temperature( C) 20 C Remarks Humidity (% R.H.) 19 % R.H. Pressure ( ) Measurement procedure The equipment is supplied in serieswith shunt(s) Rmor current transformer(s) from asourcehaving thesame nominal voltage and frequency as the rated supplyvoltage and frequencyof the equipment. Measurements shallbemadeunder normal load, or conditionsfor adequateheat discharge, and under normaloperating conditions. User soperation controls or automaticprogrammers shall be set to produce themaximumharmonic component, for each successiveharmonic component in turn.for thepurposeof harmonic current limitation, equipment is classified asfollows : ClassA: Equipmentnot specified in one of the threeother Classesshallbe considered as ClassAequipment. - Balanced three-phaseequipment; - Household appliances excluding equipment identified as Class D; - Tools excludingportable tools; - Dimmers for incandescent lamps; - Audio equipment. Class B :Portable tools;arc welding equipmentwhich isnotprofessional equipment. Class C : Lighting equipment. Class D : Equipmenthaving aspecified power according to less than or equal to 600 w,of thefollowing types: - Personal computers and personal computer monitors; - Television receivers.
30 Page: 29 of Used equipments Equipment Model no. Serial no. Makers Next Cal. date Harmonics/Flicker meter 5001x-CTS C.I Used Photographs of test setup
31 Page: 30 of Measurement result
32 Page: 31 of 72
33 Page: 32 of 72
34 Page: 33 of Flicker Test specification EN :2008 Testing voltage 230 V, 50 Test facility Immunity area Date Temperature( C) 20 C Remarks Humidity (% R.H.) 19 % R.H. Pressure ( ) Measurement procedure EUT was connected to the power analyzer system. Measurement was performed to obtain the desired flicker parameters. The measuring time depends on which parameters are to be measured. Plt =2h Pst = 10 min Controls and automatic programs shall be set to produce the most unfavorable sequence of voltage changes, using only those combinations of controls and programs are mentioned by the manufacturer in the instruction manual.
35 Page: 34 of Used equipments Equipment Model no. Serial no. Makers Next Cal. date Harmonics/Flicker meter 5001x-CTS C.I Used Photographs of test setup
36 Page: 35 of Measurement result
37 Page: 36 of Electrostatic Discharge Test specification EN :2009 Contact: ± 2, ± 4, ± 6 Air: ± 2, ± 4, ± 8 HCP: ± 2, ± 4, ± 6 VCP: ± 2, ± 4, ± 6 Test level Discharge impedance 330 Ω / 150 Number of discharge (Each polarity) Contact: 10 Air: 10 HCP / VCP: 10 Interval between discharges 1s Testing voltage 230 V, 50 Test facility Shielded room Date Temperature( C) 22 C Remarks - There was no change of operation status during above testing. Humidity (% R.H.) 40 % R.H. Pressure ( ) Measurement procedure A ground reference plane was located on the floor, and connected to earth via a low Impedance connection. The return cable of the ESD generator was connected to the reference plane. In case of floor standing equipment, EUT was placed on the reference plane on 0.1 m of insulating Support. In case of table top equipment, EUT was placed on a wooden table 0.8 m above the reference grounded floor. A horizontal coupling plane (HCP) was placed on the table, and Connected to the reference plane via a 470 resistor located in each end (0.5 insulating support between EUT and HCP). In both cases a vertical coupling plane(vcp) OF 0.5 X 0.5 m was located 0.1 m from the EUT s sides. The VCP was connected to the reference plane in the same matter as the HCP.
38 Page: 37 of Used equipments Equipment Model No. Serial No. Makers Next Cal. Date ESD Tester NSG TESEQ HCP VCP Used Photographs of test setup
39 Page: 38 of Measurement result Electrostatic Discharge (Test Point) Air discharge Contact discharge
40 Page: 39 of 72 HCP/VCP discharge Location(EUT) HCP (All 4 sides) VCP (All 4 sides) Applied level (±) ± 2, ± 4, ± 6 ± 2, ± 4, ± 6 Result Contact discharge Location(EUT) C1 Case C2 Screw C3 USB Port C4 Audio In Port C5 Audio Out Port C6 Video In Port C7 Video Out Port C8 D-SUB Port C9 Serial Port C10 LAN Port C11 Power Port ±2 ±2 ±2 ±2 ±2 ±2 ±2 ±2 ±2 ±2 ±2 Applied level (±), ± 4, ± 6, ± 4, ± 6, ± 4, ± 6, ± 4, ± 6, ± 4, ± 6, ± 4, ± 6, ± 4, ± 6, ± 4, ± 6, ± 4, ± 6, ± 4, ± 6, ± 4, ± 6 Result Air discharge Location(EUT) A1 LED Applied level (±) ± 2, ± 4, ± 8 Result A2 Adaptor ± 2, ± 4, ± 8 A3 Console Port ± 2, ± 4, ± 8 A4 Terminal Port ± 2, ± 4, ± 8
41 Page: 40 of Radio Frequency Electromagnetic Fields Test specification EN :2006+A1:2008 Tested frequency 80 ~ 1, 1 ~ 2 Test level & Modulation 1, 3, 10 V/m, 80 % Amplitude Modulation (1 ) 1, 3, 10 V/m, Pulse Modulation (1 (0.5s ON: 0.5s OFF)) Frequency Step log 1 % step Dwell time 3s Distance 3 m from EUT to tip of antenna Testing Voltage 230 V, 50 Test facility Fully anechoic chamber (3 m) Date Temperature( C) 21 C Remarks - There was no change of operation status during above testing. Humidity (% R.H.) 20 % R.H. Pressure ( ) Measurement procedure The test was performed at 3 m full anechoic chamber. For floor standing equipment, the EUT was standing on the floor. For tabletop equipment, the EUT was located on a wooden table 0.8 m above the floor. The EUT was tested all sides, horizontal and vertical polarization.
42 Page: 41 of Used equipments Equipment Model no. Serial no. Makers Next Cal. date Power meter PM AR Power sensor PH AR Power sensor PH AR Directional coupler DC AR Directional coupler DC7144M AR Signal generator E4421B GB AGILENT Amplifier 150W1000M AR Amplifier 60S1G3M AR Broadband Ant. LPDA ETS - Field monitor SI TDK - Antenna master - - ETS - Used Photographs of test setup
43 Page: 42 of Measurement result Location(EUT) Front side Rear side Left side Right side Antenna polarization Horizontal Vertical Horizontal Vertical Horizontal Vertical Horizontal Vertical Result
44 Page: 43 of Electric Fast Transient/BURST Test specification EN :2004+A1:2010 AC main Signal / Control: Clamp Telecommunication: Clamp Coupling AC main: ± 2 Peak Signal / Control: ± 1 Peak Telecommunication: ± 1 Peak Test level Repetition frequency 5, Tr/Th = 5 / 50 Coupling time 60 s Testing Voltage 230 V, 50 Test facility Shielded room Date Temperature( C) 19 C Remarks - There was no change of operation status during above testing. Humidity (% R.H.) 20 % R.H. Pressure ( ) Measurement procedure A ground reference plane was located on the floor. EFT generator was connected to reference ground plane via low impedance connection. For floor standing equipment, EUT was placed on a 0.1 m wooden table. For tabletop equipment, EUT was placed on a 0.1 m above the ground reference plane. Test generator and coupling/decoupling network was placed on, and bounded to, the ground reference plane. When using the coupling clamp, the minimum distance between the coupling plates and all other conductive surfaces, except the ground reference plane beneath the coupling clamp, Shall be 0.5 m Used equipments Equipment Model No. Serial No. Makers Next Cal. date Generator UCS 500 M EM TEST Capacitive Coupling Clamp - - EM TEST - Used
45 Page: 44 of Photographs of test setup
46 Page: 45 of Measurement result * AC main EFT coupling point (+) (-) Result L+N+PE +2-2 EFT coupling point (+) (-) Result Video In/Out +1-1 Audio In/Out +1-1 Alarm In/Out +1-1 RS EFT coupling point (+) (-) Result LAN(RJ-45) +1-1 * Signal / Control * Telecommunication
47 Page: 46 of Surge Test specification EN :2006 AC main: Direct Signal / Control: Direct / CDN Coupling Differential mode: ± 0.5, ± 1 AC main: Common mode: ± 0.5, ± 1, ± 2 Test level Signal / Control: ± 0.5, ± 1 Differential mode: Ω Coupling Impedance Common mode: 10 Ω + 9 Direct Surge pulse shape Tr/Th = 1.2 / 50 Angles 0, 90, 180, 270 Number of surge 5 Coupling time 1 min Testing Voltage 230 V, 50 Test facility Shielded room Date Temperature( C) 19 C Remarks - There was no change of operation status during above testing. Humidity (% R.H.) 20 % R.H. Pressure ( ) Measurement procedure A ground reference plane was located on the floor. SURGE generator was connected to reference ground plane via low impedance connection. For floor standing equipment & table top equipment, EUT was placed on a wooden table Used equipments Equipment Model No. Serial No. Makers Next Cal. date Generator UCS 500 M EM TEST CDN CNV 508 S EM TEST - Used
48 Page: 47 of Photographs of test setup
49 Page: 48 of Measurement result * AC main Coupling point (+) (-) Result L+N L+PE N+PE + 0.5, , + 1, , + 1, , , - 1, , - 1, - 2 (+) (-) Result * Signal / Control Coupling point Video In/Out Audio In/Out Alarm In/Out RS , + 1, + 1, + 1, , - 1, - 1, - 1, - 1
50 Page: 49 of Conducted Immunity Test specification EN :2009 Tested frequency 0.15 ~ 100 Test level & Modulation 1, 3, 10 V, 80 % Amplitude Modulation (1 ) 1, 3, 10 V, Pulse Modulation (1 (0.5s ON: 0.5s OFF)) Frequency Step log 1 % step Coupling method AC main: CDN(M3) Signal / Control: Clamp Telecommunication: Clamp Testing Voltage 230 V, 50 Test facility Shielded room Date Temperature( C) 20 C Remarks - There was no change of operation status during above testing. Humidity (% R.H) 19 % R.H Pressure( ) Measurement procedure A ground reference plane was located on the floor. The test was performed on a ground reference plane on a 0.1 m wooden table. This test were Performed using CDN for mains, clamp for signal and injection probe. The frequency range was swept from 0.15 to 100. This frequency range was Modulated with 1 sine wave at 80 %. The signal generators provided the modulated frequency at a 1 % step size. The power and all network cable, I/O cables longer than 3 m length were tested.
51 Page: 50 of Used equipments Equipment Model no. Serial no. Makers Next Cal. date CS generator NSG Schaffner CDN M Schaffner CDN CDN M2/M3N EM TEST Attenuator INA Schaffner EM Clamp KEMZ Schaffner CDN CDN S1/75 EM TEST Current probe MD W /M6/ 0068 Schaffner - Used Photographs of test setup
52 Page: 51 of Measurement result * AC main Coupling point Coupling method Result Power CDN(M3) Coupling point Coupling method Result Video In/Out Clamp Audio In/Out Clamp Alarm In/Out Clamp RS-485 Clamp Coupling point Coupling method Result LAN(RJ-45) Clamp * Signal / Control * Telecommunication
53 Page: 52 of Dips and Interruptions Test specification EN :2004 Number of dips 3T Duration 10 s Phase Zero crossing (0, 180 ) Testing Voltage 100 V, 50 / 240 V, 50 Test facility Shielded room Test Date Temperature ( C) 19 C Remarks Humidity (% R.H) 20 % R.H Pressure ( ) Measurement procedure The dips/interruption test is only applicable to AC mains. The dips/interruptions were applied at zero crossing Used equipments Equipment Model no. Serial no. Makers Next Cal. date Generator UCS 500 M EM TEST Used
54 Page: 53 of Photographs of test setup Measurement result * 240 V, 50 Test Level (%UT) Dip/Int. (%UT) Duration /Period Phase ( ) Count number Result 0% 100 % 0.5, 1, 5 Period 0 / 180 3T 40 % 60 % 0.5, 1, 5, 10 Period 0 / 180 3T 70 % 30 % 0.5, 1, 5, 10 Period 0 / 180 3T Comment: - There was no change of operation status during above testing.
55 Page: 54 of 72 * 100 V, 50 Test Level (%UT) Dip/Int. (%UT) Duration /Period Phase ( ) Count number Result 0% 100 % 0.5, 1, 5 Period 0 / 180 3T 40 % 60 % 0.5, 1, 5, 10 Period 0 / 180 3T 70 % 30 % 0.5, 1, 5, 10 Period 0 / 180 3T Comment: - There was no change of operation status during above testing.
56 Page: 55 of Mains supply voltage variations Test specification EN :1995+A1:1998+A2:2003 Supply voltage U nom + 10 %, U nom - 15 % Testing voltage 100 V, 50 / 240 V, 50 Date Temperature ( C) 19 C Remarks - There was no change of operation status during above testing. Humidity (% R.H) 20 % R.H Pressure ( ) Used equipments Equipment Model no. Serial no. Makers Next Cal. Date Generator UCS 500 M EM TEST Used Measurement result * 240 V, 50 Supply voltage + 10 % - 15 % 264 V 204 V Result - There was no change of operation status during above testing. * 100 V, 50 Supply voltage + 10 % - 15 % 110 V 85 V Result - There was no change of operation status during above testing.
57 Page: 56 of E.U.T. photographs Whole
58 Page: 57 of 72 * Main Front View Rear View
59 Page: 58 of 72 Left View Right View
60 Page: 59 of 72 Top View Bottom View
61 Page: 60 of 72 Port View
62 Page: 61 of 72 Inside
63 Page: 62 of 72 Main Board
64 Page: 63 of 72 BNC Board
65 Page: 64 of 72 HDD (500 GB)
66 Page: 65 of 72
67 Page: 66 of 72 AC/DC Adaptor
68 Page: 67 of 72 * USB Mouse Front View Rear View
69 Page: 68 of 72 Inside
70 Page: 69 of 72 Main Board
71 Page: 70 of 72 * Remote Controller Front View Rear View
72 Page: 71 of 72 Inside
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4322705.50 EMC Test report for Plug-in adaptor Models PM1W-IT, PM1WU2-IT, PM1W-GR, PM1W-SP, PM1W-RS, PM1WB-RS, PM1WU2-GR, PM1WU2-SP, PM1WU2-RS, PM1WBU2-RS, PM1W-UK, PM1WU2-UK, PM1W-FR, PM1WU2-FR Guangzhou,
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