EMC TEST REPORT For Prokits Industries Co., Ltd.

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1 Page 1 of 34 EMC TEST REPORT For Prokits Industries Co., Ltd. Temperature-Controlled Soldering Station Model No.:SS-206/207 Series Test Report Number : ESTSZ E EST COMPLIANCE LABORATORY LIMITED 4/F, 7 th Building, Xinyuan Industrial Park, Xinguang Road, Xili, Nanshan District, Shenzhen , China Tel: Fax:

2 Page 2 of 34 TABLE OF CONTENTS 1. GENERAL INFORMATION PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) TEST STANDARDS TEST SUMMARY TEST METHODOLOGY TEST FACILITY TEST EQUIPMENT LIST AND DETAILS SYSTEM TEST CONFIGURATION JUSTIFICATION EUT EXERCISE SOFTWARE SPECIAL ACCESSORIES EQUIPMENT MODIFICATIONS CONFIGURATION OF TEST SYSTEM TEST SETUP DIAGRAM DISTURBANCE VOLTAGE AT THE MAINS TERMINALS MEASUREMENT UNCERTAINTY LIMIT OF DISTURBANCE VOLTAGE AT THE MAINS TERMINALS (EN ) EUT SETUP INSTRUMENTS SETUP TEST PROCEDURE SUMMARY OF TEST RESULTS DISTURBANCE VOLTAGE TEST DATA TEST RESULT CLICK TEST LIMIT OF CLICK TEST AT THE MAINS TERMINALS (EN ) EUT SETUP TEST PROCEDURE SUMMARY OF TEST RESULTS DISTURBANCE CLICK TEST DATA TEST RESULT DISTURBANCE POWER LIMIT OF DISTURBANCE POWER EUT SETUP INSTRUMENTS SETUP TEST PROCEDURE DISTURBANCE POWER TEST DATA TEST PLOT(S) FOR DISTURBANCE POWER TEST RESULT HARMONIC CURRENT TEST (EN ) APPLICATION OF HARMONIC CURRENT EMISSION MEASUREMENT DATA TEST RESULTS VOLTAGE FLUCTUATIONS AND FLICKER TEST (EN ) APPLICATION OF VOLTAGE FLUCTUATIONS AND FLICKER TEST MEASUREMENT DATA TEST RESULTS EN MEASUREMENT INSTRUMENTATION ELECTROSTATIC DISCHARGE TEST SYSTEM RADIATED SUSCEPTIBILITY TEST SYSTEM ELECTRICAL FAST TRANSIENT/BURST IMMUNITY TEST SYSTEM SURGE IMMUNITY TEST SYSTEM CONDUCTED SUSCEPTIBILITY TEST SYSTEM VOLTAGE DIPS, SHORT INTERRUPTIONS IMMUNITY TESTS SYSTEM EQUIPMENT TEST TABLE INSTRUMENT CALIBRATION EN TEST PROCEDURES EUT AND CABLE PLACEMENT... 23

3 Page 3 of APPLICATION OF ELECTROSTATIC DISCHARGE IMMUNITY TEST APPLICATION OF RADIATED SUSCEPTIBILITY TEST APPLICATION OF ELECTRICAL FAST TRANSIENT/BURST IMMUNITY TEST APPLICATION OF SURGE IMMUNITY TEST APPLICATION OF CONDUCTED SUSCEPTIBILITY TEST APPLICATION OF VOLTAGE DIPS, SHORT INTERRUPTIONS IMMUNITY TESTS DEVIATIONS FROM THE STANDARD TEST DATA ELECTROSTATIC DISCHARGE IMMUNITY TEST (IEC ) RADIATED SUSCEPTIBILITY TEST (IEC ) ELECTRICAL FAST TRANSIENT/BURST IMMUNITY TEST (IEC ) SURGE IMMUNITY TEST (IEC ) CONDUCTED SUSCEPTIBILITY TEST (IEC ) VOLTAGE DIPS, SHORT INTERRUPTIONS IMMUNITY TESTS (IEC ) TEST RESULTS IEC ELECTROSTATIC DISCHARGE IMMUNITY TEST CONFIGURATION IEC RADIATED SUSCEPTIBILITY TEST CONFIGURATION IEC ELECTRICAL FAST TRANSIENT/BURST IMMUNITY TEST CONFIGURATION IEC SURGE IMMUNITY TEST CONFIGURATION IEC CONDUCTED SUSCEPTIBILITY TEST CONFIGURATION IEC VOLTAGE DIPS, SHORT INTERRUPTIONS IMMUNITY TESTS CONFIGURATION APPENDIX A. EUT PHOTOGRAPHS EUT - TOP VIEW EUT - BACK VIEW EUT - INSIDE VIEW EUT - INSIDE VIEW EUT - INSIDE VIEW APPENDIX B. TEST SETUP PHOTOGRAPHS CONDUCTED EMISSION & CLICK TEST DISTURBANCE POWER TEST RADIATED SUSCEPTIBILITY TEST VOLTAGE FLUCTUATIONS AND FLICKER TEST ELECTROSTATIC DISCHARGE IMMUNITY TEST ELECTRICAL FAST TRANSIENT/BURST IMMUNITY, SURGE IMMUNITY, VOLTAGE DIPS, SHORT INTERRUPTIONS IMMUNITY TEST... 34

4 Page 4 of GENERAL INFORMATION 1.1 Product Description for Equipment Under Test (EUT) Client Information Applicant: Address of applicant: Manufacturer: Address of Manufacturer: Prokits Industries Co., Ltd. 5F, No.7, Lane 130, Ming-Chung Rd., Hsin-Tien Dist, New Taipei City, Taiwan, R.O.C. Prokits Industries Co., Ltd.(Shanghai) No.25, Lane 1365, Kangqiao East Rd., Kangqiao Industrial Zone, Shanghai. General Description of E.U.T EUT Description: Trade Name: Model No.: Input: Test Power Supply: Temperature-Controlled Soldering Station SS-206/207 Series AC V, 50/60Hz AC 230V, 50Hz Remark: All models are identical except appearance of equipment. Unless otherwise specified, all tests were performed on model SS-206B to represent the other similar models. 1.2 Test Standards The following Declaration of Conformity report of EUT is prepared in accordance with EN : 2006+A1: 2009; EN : 1997+A1: 2001+A2: 2008; EN : 2006+A1: 2009+A2: 2009; EN : 2008; The objective of the manufacturer is to demonstrate compliance with the described standards above. Note: This test report is limited to the above client company and the product model only. It may not be duplicated without prior written consent of EST COMPLIANCE LABORATORY LIMITED. Date of Test : Aug. 01~Sept. 19, 2011 Prepared by : (Engineer) Reviewer : (Project Manager) Approved & Authorized Signer : (Manager)

5 Page 5 of Test Summary For the EUT described above. The standards used were EN for Emissions & EN for Immunity. Table 1: Tests Carried Out Under EN : 2006+A1: 2009 Standard Test Items Status EN : A1: 2009 Disturbance Voltage at The Mains Terminals (150KHz To 30MHz) CLICK Test at The Mains Terminals Disturbance Power (30MHz To 300MHz) Indicates that the test is applicable Indicates that the test is not applicable Table 2: Tests Carried Out Under EN : 2006+A1: 2009+A2: 2009 / EN : 2008 Standard Test Items Status EN : A1: 2009+A2: 2009 Harmonic Current Test EN : 2008 Voltage Fluctuations and Flicker Test Indicates that the test is applicable Indicates that the test is not applicabl Table 3 : Tests Carried Out Under EN : 1997+A1: 2001+A2: 2008 Standard Test Items Status IEC : 2008 Electrostatic discharge Immunity IEC : 2008 Radiated Susceptibility (80MHz to 1GHz) IEC : 2004 Electrical Fast Transient/Burst Immunity IEC : 2005 Surge Immunity IEC : 2008 Conducted Susceptibility (150kHz to 80MHz) IEC : 2004 Voltage Dips, Short Interruptions Immunity Indicates that the test is applicable Indicates that the test is not applicable 1.4 Test Methodology All measurements contained in this report were conducted with CISPR 16-1: 2002, radio disturbance and immunity measuring apparatus, and CISPR16-2: 2002, Method of measurement of disturbances and immunity. 1.5 Test Facility The test facility is recognized, certified, or accredited by the following organizations: FCC Registration No.: SGS-CSTC Standards Technical Services Co., Ltd., EMC Laboratory has been registered and fully described in a report filed with the (FCC) Federal Communications Commission. The acceptance letter from the FCC is maintained in our files. Registration , August 04, 2005.

6 Page 6 of Test Equipment List and Details Table 1: Test Equipment for Emission Test and Harmonic Current / Flicker Test Equipment Manufacturer Model# Serial # Data of Cal. Due Data 3m Semi-Anechoic ETS-LINDGREN N/A N/A Apr.28, 2011 Apr.27, 2013 Chamber EMI Test Receiver Rohde & Schwarz ESIB26 SEL0023 Dec. 12, 2010 Dec. 11, 2011 EMI Test Software AUDIX E3 SEL0050 N/A N/A Coaxial cable SGS N/A SEL0028 Apr. 18, 2011 Apr. 17, 2012 BiConiLog ETS-LINDGREN 3142C SEL0014 Apr. 12, 2011 Apr. 11, 2012 Antenna ( MHz) Pre-amplifier (0.1- Agilent Technologies 8447D SEL0053 Apr. 18, 2011 Apr. 17, MHz) Double-ridged ETS-LINDGREN 3117 SEL0005 Apr. 12, 2011 Apr. 11, 2012 horn (1-18GHz) Pre-amplifier (1- Rohde & Schwarz AFS42- SEL0081 Apr. 18, 2011 Apr. 17, GHz) S-42 Band filter Amindeon SEL0094 Apr. 18, 2011 Apr. 17, 2012 Shielding Room Zhong Yu Electron GB-88 SEL0042 N/A N/A LISN ETS-LINDGREN 3816/2 SEL0021 Apr. 18, 2011 Apr. 17, 2012 ISN Rohde & Schwarz ENY EMC0114 Apr. 18, 2011 Apr. 17, 2012 ISN Rohde & Schwarz ENY EMC0115 Apr. 18, 2011 Apr. 17, 2012 EMI Test Receiver Rohde & Schwarz ESCI SEL0022 Apr. 18, 2011 Apr. 17, 2012 Coaxial Cable SGS N/A SEL0024 Apr. 18, 2011 Apr. 17, 2012 AC Power Source California 5001ix SEL0052 Apr. 27, 2011 Apr. 26, 2012 Instruments Power Analyzer California Instruments PACS-1 SEL0051 Apr. 27, 2011 Apr. 26, 2012 CTS3.0 Software California Instruments N/A SEL0087 N/A N/A

7 Page 7 of 34 Table 2: Test Equipment for Immunity Test Equipment Manufacturer Model# Serial # Data of Cal. Due Data ESD Simulator Thermo MZ-15/EC SEL0012 Apr. 03, 2011 Apr. 02, 2012 ESD Ground Plane SGS 3m*3m N/A SEL0004 N/A N/A 3m Semi-Anechoic ETS-LINDGREN N/A N/A Apr.28, 2011 Apr. 27, 2013 Chamber Signal Generator Rohde & Schwarz SML Aug. 01, 2011 Jul. 31, 2013 RF Amplifier 30M- Amplifier 250W SEL0066 Nov. 12, 2010 Nov. 11, GHz Research 1000A RF Amplifier 0.8M- Amplifier 60S1G3 SEL0065 Nov. 12, 2010 Nov. 11, GHz Research Power Meter Rohde & Schwarz NRVD SEL0069 Apr. 18, 2011 Apr. 17, 2012 Power Meter Rohde & Schwarz URV5-Z2 SEL0071 Apr. 18, 2011 Apr. 17, 2012 Power Meter Rohde & Schwarz URV5-Z2 SEL0072 Apr. 18, 2011 Apr. 17, 2012 Software EMC32 Rohde & Schwarz EMC32-S SEL0082 N/A N/A Log-periodic Amplifier AT1080 SEL0073 N/A N/A Antenna Research Antenna Tripod Amplifier TP1000A SEL0074 N/A N/A Research ProPLUS System Thermo N/A SEL0007 Dec. 12, 2010 Dec. 11, 2011 ELECTRON Pro PLUS Capacitive Thermo N/A SEL0008 N/A N/A Clamp ELECTRON CM-HCOIL H-field Thermo N/A SEL0010 Dec. 12, 2010 Dec. 11, 2011 loop ELECTRON RF-Generator SCHAFFNER NSG2070 SEL0039 Dec. 12, 2010 Dec. 11, 2011 Coupling/Decoupling SCHAFFNER CDNM016 SEL0040 Dec. 12, 2010 Dec. 11, 2011 Network EM CLAMP SCHAFFNER KEMZ801 SEL0041 Dec. 12, 2010 Dec. 11, 2011 Table 3: General used equipment Equipment Manufacturer Model# Serial # Data of Cal. Due Data Humidity/Temperature Indicator Shanghai ZJ1-2B SEL0101 to Nov. 18, 2010 Nov. 17, 2011 SEL0103 Barometer Changchun DYM3 SEL0088 Jun. 22, 2009 Jun. 21, 2012

8 Page 8 of SYSTEM TEST CONFIGURATION 2.1 Justification The system was configured for testing in a typical fashion (as normally used by a typical user). 2.2 EUT Exercise Software The EUT exercising program used during radiated and conducted testing was designed to exercise the various system components in a manner similar to a typical use. The software offered by manufacture, can let the EUT being normal operation. 2.3 Special Accessories As shown in section 2.5, interface cable used for compliance testing is shielded as normally supplied by Prokits Industries Co., Ltd. and its respective support equipment manufacturers. 2.4 Equipment Modifications The EUT tested was not modified by EST COMPLIANCE LABORATORY LIMITED. 2.5 Configuration of Test System Power Supply EUT 2.6 Test Setup Diagram EUT Simuater 1.0m 1.5m

9 Page 9 of DISTURBANCE VOLTAGE AT THE MAINS TERMINALS 3.1 Measurement Uncertainty All measurements involve certain levels of uncertainties, especially in field of EMC. The factors contributing to uncertainties are spectrum analyzer, cable loss, and LISN. The Treatment of Uncertainty in EMC Measurements, the best estimate of the uncertainty of any conducted emissions measurement is +2.4 db. 3.2 Limit of Disturbance Voltage At The Mains Terminals (EN ) Frequency Range (MHz) Limits ( dbuv) Quasi-Peak Average Note: (1)The tighter limit shall apply at the edge between two frequency bands. 3.3 EUT Setup The setup of EUT is according with CISPR 16-1: 2002, CISPR16-2: 2002 measurement procedure. The specification used was the EN limits. The EUT was placed center and the back edge of the test table. The spacing between the peripherals was 10 cm. Maximum emission emitted from EUT was determined by manipulating the EUT, support equipment, interconnecting cables and varying the mode of operation and the levels in the final result of the test were recorded with the EUT running in the operating mode that maximum emission was emitted. 3.4 Instruments Setup The receiver was set with the following configurations: Test Receiver Setting: Frequency Range.150 KHz to 30 MHz Detector..Peak & Quasi-Peak & Average Sweep Speed Auto IF Band Width...9 KHz

10 Page 10 of Test Procedure During the conducted emission test, the EUT power cord was connected to the auxiliary outlet of the first Artificial Mains. Maximizing procedure was performed on the six (6) highest emissions to ensure EUT compliance using all installation combination. All data was recorded in the peak detection mode. Quasi-peak and Average readings were only performed when an emission was found to be marginal (within -10 dbµv of specification limits). Quasi-peak readings are distinguished with a "QP". Average readings are distinguished with a "AV". 3.6 Summary of Test Results According to the data in section 3.6, the EUT complied with the EN Conducted margin, with the worst margin reading of: 3.7 Disturbance Voltage Test Data Temperature ( ) 23 Humidity ( %RH ) 59 Barometric Pressure ( mbar ) EUT Temperature-Controlled Soldering Station M/N SS-206B Operating Mode On Remark: (1) When PK reading is less than relevant limit 20dB, the QP reading and AV reading will not be recorded. (2) Where QP reading is less than relevant AV limit, the AV reading will not be measured 3.8 Test Result Pass Test data see following pages.

11 Page 11 of 34 Conducted Emission Test Data

12 Page 12 of 34 Conducted Emission Test Data

13 Page 13 of CLICK TEST 4.1 Limit of Click Test At The Mains Terminals (EN ) According to standard EN , if click rate (N) less 5/min and the time of these discontinuous disturbances ( T) does not exceed 10ms, then the limit value are omitted. 4.2 EUT Setup The setup of EUT is according with CISPR 16-1: 2002, CISPR16-2: 2002 measurement procedure. The specification used was the EN limits. The EUT was placed center and the back edge of the test table. The spacing between the peripherals was 10 cm. Maximum emission emitted from EUT was determined by manipulating the EUT, support equipment, interconnecting cables and varying the mode of operation and the levels in the final result of the test were recorded with the EUT running in the operating mode that maximum emission was emitted. 4.3 Test Procedure This test is done when switch operations in thermostatically controlled appliances, automatic program controlled machines and other electrically controlled or operated appliances may generate discontinuous disturbance (Click). The measurement of disturbance shall be performed at the following restricted number of frequencies: 150KHz, 500KHz, 1.4MHz and 30MHz. At each frequency, for appliances which stop automatically, duration of the minimum number of complete programs necessary to produce 40 counted clicks or, where relevant, 40 counted clicks have not been produced, the test is stopped at the end of the program in course. The relevant click rate N. The appliance under test shall be deemed to comply with the limit if not more than a quarter of the number of the counted click registered during the observation time. 4.4 Summary of Test Results According to the data in section 4.6, the EUT complied with the EN Click test. 4.5 Disturbance Click Test Data Temperature ( ) 23 Humidity ( %RH ) 59 Barometric Pressure ( mbar ) EUT Temperature-Controlled Soldering Station M/N SS-206B Operating Mode On 4.6 Test Result Pass Test data see following pages.

14 Page 14 of 34 Click Test Data

15 Page 15 of DISTURBANCE POWER 5.1 Limit of Disturbance Power Frequency Range (MHz) Quasi-Peak Limit (dbpw) Average Remark: (1) When PK reading is less than relevant limit 20dB, the QP reading and AV reading will not be recorded. (2) Where QP reading is less than relevant AV limit, the AV reading will not be measured 5.2 EUT Setup The setup of EUT is according with CISPR 16-1: 2002, CISPR16-2: 2002 measurement procedure. See following test setup figure. The specification used was the EN limits. The EUT was placed at the edge of the test table so as to make the end of the lead close to the EUT as short as possible between the power clamp and the EUT. The spacing between the peripherals was 10 cm. Maximum emission emitted from EUT was determined by manipulating the EUT, support equipment, interconnecting cables and varying the mode of operation and the levels in the final result of the test were recorded with the EUT running in the operating mode that maximum emission was emitted. 6 m ABSORBING CLAMP EUT RECEIVER 0.8m 0.8m 5.3 Instruments Setup The test receiver was set with the following configurations: Test Receiver Setting: Frequency Range.30 MHz to 300 MHz Detector..Peak & Quasi-Peak & Average Sweep Speed Auto IF Band Width...9 KHz

16 Page 16 of Test Procedure The associated equipment under test is placed on a non-metallic table of 0.8 m of height above the floor and at least 0.4 m from other objects and from any person. The lead to be measured shall be stretched in a straight horizontal line for a length sufficient to accommodate the absorbing clamp and to permit the necessary adjustment of its position for tuning. The absorbing clamp is placed around the lead to be measured, with its current transformer towards the equipment under test, so as to measure a quantity proportional to the disturbance power on the lead. Any other lead less than that to be measured shall either be disconnected, if mechanically and functionally possible, or fitted with ferrite rings to attenuate RF currents which may affect the measurement results. Such a lead shall be stretched away from the connected unit in a direction perpendicular to the direction of the lead to be measured. All connectors not used shall be left un-terminated. All connectors having a connected lead shall be terminated in a manner representative of use. If the leads are screened and normally terminated in a screened unit, then the termination shall be screened. 5.5 Disturbance Power Test Data Temperature ( ) 23 Humidity ( %RH ) 59 Barometric Pressure ( mbar ) 1001 EUT Temperature-Controlled Soldering Station M/N SS-206B Operating Mode On 5.6 Test Plot(s) for Disturbance Power Plot(s) of Conducted Emissions Test Data is presented hereinafter as reference. 5.7 Test Result Pass Test data see following pages.

17 Page 17 of 34 Disturbance Power Test Data

18 Page 18 of HARMONIC CURRENT TEST (EN ) 6.1 Application of Harmonic Current Emission Compliance to these standards ensures that tested equipment will not generate harmonic currents at levels that cause unacceptable degradation of the main environment. This directly contributes to meeting compatibility levels established in other EMC standards, which defines compatibility levels for low-frequency conducted disturbances in low-voltage supply systems. 6.2 Measurement Data Note: For detailed test data, refer to the following pages: Standard used EN/IEC A14 (2006) Quasi-stationary - Equipment Observation time 150s EUT M/N Operating Mode Temperature-Controlled Soldering Station SS-206B On Test Result N/A 6.3 Test Results This EUT is deemed to comply with the requirements of EN without test since the power of EUT is less than 75W.

19 Page 19 of VOLTAGE FLUCTUATIONS AND FLICKER TEST (EN ) 7.1 Application of Voltage Fluctuations and Flicker Test Compliance to these standards ensures that tested equipment will not generate flickers and voltage change at levels that cause unacceptable degradation of the main environment. This directly contributes to meeting compatibility levels established in other EMC standards, which defines compatibility levels for low-frequency conducted disturbances in low-voltage supply systems. 7.2 Measurement Data Standard used Short time (Pst) Observation time Flicker meter EUT M/N Operating Mode EN/IEC Flicker 10 min 10 min (1 Flicker measurement) AC 230V / 50Hz Temperature-Controlled Soldering Station SS-206B On Test Result PASS 7.3 Test Results The EUT was subjected to the voltage fluctuations and flicker test required by EN : The EUT measured values of the Flicker test of the input current, including live current and neutral current, shall be compared with the limits given in section 7.2. Test setup photographs presented in Appendix B. The test results are shown in the following page.

20 Page 20 of 34 Flicker Test Summary per EN Test Report Company Name: EST Date of test: 09:19 05.Aug 2011 Tester: David Standard used: EN/IEC Flicker Short time (Pst): 10 min Observation time: 10 min (1 Flicker measurement) Flickermeter: 230V / 50Hz Flicker Impedance: Zref (IEC 60725) Customer: Prokits Industries Co., Ltd. E. U. T.: Temperature-Controlled Soldering Station Model: SS-206B Test Result PASS Maximum Flicker results EUT values Limit Result Pst PASS Plt PASS dc [%] PASS dmax [%] PASS dt [s] PASS

21 Page 21 of EN MEASUREMENT INSTRUMENTATION 8.1 Electrostatic Discharge Test System An MZ-15/EC ESD simulator is used for all testing. It is capable of applying Electrostatic discharges in both contact discharge modes to 4 kv and air discharge modes to 8 kv in both positive and negative polarities. This is in accordance with the IEC basic EMC publication. 8.2 Radiated Susceptibility Test System An SML03 signal generator and a Amplifier Research power amplifier are used to provide a signal at the appropriate power and frequency to a transmitting antenna to obtain the required electromagnetic field at the position of the EUT in accordance with the IEC basic EMC publication. The field was monitored by Amplifier Research field probe and Amplifier Research PM2002 power meter according the IEC standards. In order to judge the performance of the EUT, a set of monitor system is used. 8.3 Electrical Fast Transient/Burst Immunity Test System An Pro PLUS Capacitive Clamp Immunity test system is used for all testing. It is capable of applying fast transients to the AC line at any phase angle with respect to the AC line voltage wave form and to attached cables via a capacitive coupling clamp in accordance with the IEC basic EMC publication. 8.4 Surge Immunity Test System An Pro PLUS Capacitive Clamp Immunity test system is used for all testing. Both positive and negative polarities of voltage up to 2kV were applied to the AC input lines. The coupling network defined in the standard was used. 8.5 Conducted Susceptibility Test System An NSG2070 signal generator and a set of Amplifier Research test system are used for the testing. EUT was tested from 0.15 MHz to 80 MHz with 1kHz sine wave, 80% modulation with 3Vr.m.s. CDN coupling and de-coupling networks and EM clamp was tested. During the tests, injected was applied to power line by using CDNs method, and I/O lines was injected by using EM clamp injection method. 8.6 Voltage Dips, Short Interruptions Immunity Tests System An Pro PLUS Capacitive Clamp Immunity test system is used for all testing. Test level as described in IEC , section 5, titled Test Levels.

22 Page 22 of Equipment Test Table IEC : 1995 specifies that a tabletop EUT shall be placed on a non-conducting table which is 80 centimeters above a ground reference plane and that floor mounted equipment shall be placed on a insulating support approximately 10 centimeters above a ground plane. During the tests, the EUT is positioned over a ground reference plane in conformance with this requirement. For tabletop equipment, a 1.6 by 0.8-meter metal sheet (HCP) is placed on the table and connected to the ground plane via a metal strap with two 470 k Ohms resistors in series. The EUT and attached cables are isolated from this metal sheet by 0.5-millimeter thick insulating material. A Vertical Coupling Plane (VCP) grounded on the ground plane through the same configuration as in the HCP is used. IEC and IEC specify that a tabletop EUT be placed on a non-conducting table 80 centimeters above a ground reference plane and that floor-mounted equipment shall be placed on an insulating support approximately 10 centimeters above a ground plane. During the IEC tests, the EUT is positioned on a table in a shielded semi-anechoic test chamber to reduce reflections from the internal surfaces of the chamber. During the IEC tests, the EUT is positioned on a table over a ground reference plane in conformance with this requirement. 8.8 Instrument Calibration All test equipment is regularly checked to ensure that performance is maintained in accordance with the manufacturer's specifications. Extensive engineering efforts have been made to ensure test data reliability through Quality Control and regular equipment calibration schedules. However, the application of radio frequency fields and voltages are not without an unavoidable level of uncertainty. These include inaccuracies in antenna factors, chamber imperfections and possible test generator output uncertainties.

23 Page 23 of EN TEST PROCEDURES 9.1 EUT and Cable Placement The EUT and any peripherals are located at the center of the table for tabletop devices and in the center of the ground plane with the insulating support for floor-standing devices. The standards require that interconnecting cables to be connected to available ports of the unit and that the placement of the unit and the attached cables simulate a typical installation so far as to be practical. 9.2 Application of Electrostatic Discharge Immunity Test The test is conducted in the following order according to the basic standard IEC : Air Discharge, Direct Contact Discharge, Indirect Contact Horizontal Coupling Plane Discharge, and Indirect Contact Vertical Coupling Plane Discharge. The Electrostatic Discharge test levels are set and discharges for the different test modes are set appropriately. The Electrostatic Discharge is applied to the conductive surface of the computer in which the EUT is enclosed, and along all seams and control surfaces on the computer. When a discharge occurs and an error is caused, the type of error, discharge level and location is recorded. 9.3 Application of Radiated Susceptibility Test The electromagnetic field is established at the front edge of the EUT. The frequency range is swept from 80 to 1000 MHz using a power level necessary to obtain a 3 volt/meter and 80% amplitude of a 1 khz sine wave modulated field Strength is directed at the EUT. The test is performed with each of four sides of EUT facing the transmitting antenna. If an error is detected when the susceptible side of the EUT facing the transmitting antenna, the field is reduced until the error is not repeatable, the field is then manually increased until the error begins to occur. This threshold level, the frequency and the error created are noted before continuing. Both horizontal and vertical polarization of the antenna are set on test and measured individually 9.4 Application of Electrical Fast Transient/Burst Immunity Test The EUT was arranged for Power Line Coupling and for I/O Line Coupling through a capacitive clamp, where applicable. (Note: The I/O coupling test using a capacitive clamp is performed on the I/O interface cables that are longer in length than 3 meters.) A metal ground plane 2.4 meter by 2.0 meter was placed between the floor and the table and is connected to the earth by a 2.0 meter ground rod. The ground rod is connected to the test facility s electrical earth. 9.5 Application of Surge Immunity Test The EUT was setup as described in IEC and the test shall be performed according to the test plan. 9.6 Application of Conducted Susceptibility Test The EUT was setup according to the IEC and the test shall be performed with the test generator connected to each of the coupling and decoupling devices in turn while the other nonexcited RF input ports of the coupling devices are terminated by a 50 Ω load resistor. The frequency range is 150kHz to 80 MHz. 9.7 Application of Voltage Dips, Short Interruptions Immunity Tests The EUT was setup according to the IEC and the test shall be done as the procedure described in the standard. 9.8 Deviations from the Standard No deviations from EN were made when performing the tests described in this report.

24 Page 24 of TEST DATA 10.1 Electrostatic Discharge Immunity Test (IEC ) Temperature ( ) 24 Humidity ( %RH ) 57 Barometric Pressure ( mbar ) EUT Temperature-Controlled Soldering Station M/N SS-206B Operating Mode On Table 1: Electrostatic Discharge Immunity (Air Discharge) IEC Test Points Test Levels -2 kv +2 kv -4 kv +4 kv -6 kv +6 kv -8 kv +8 kv -15 kv +15 kv Slots 10 points A A A A A A A A / / Switch 10 points A A A A A A A A / / Table 2: Electrostatic Discharge Immunity (Indirect Contact) IEC Test Points Metal of EUT 12 points Test Levels -2 kv +2 kv -4 kv +4 kv -6 kv +6 kv -8 kv +8 kv -15 kv +15 kv A A A A / / / / / / Table 3: Electrostatic Discharge Immunity (Indirect Contact HCP) IEC Test Points Test Levels -2 kv +2 kv -4 kv +4 kv -6 kv +6 kv -8 kv +8 kv -15 kv +15 kv Front Side A A A A / / / / / / Back Side A A A A / / / / / / Left Side A A A A / / / / / / Right Side A A A A / / / / / / Table 4: Electrostatic Discharge Immunity (Indirect Contact VCP) IEC Test Points Test Levels -2 kv +2 kv -4 kv +4 kv -6 kv +6 kv -8 kv +8 kv -15 kv +15 kv Front Side A A A A / / / / / / Back Side A A A A / / / / / / Left Side A A A A / / / / / / Right Side A A A A / / / / / /

25 Page 25 of Radiated Susceptibility Test (IEC ) Frequency Range (MHz): 80~1000MHz Modulation: Amplitude 80%, 1kHz sine wave Severity Level: 3V/m Temperature ( ) 24 Humidity ( %RH ) 57 Barometric Pressure ( mbar ) EUT Temperature-Controlled Soldering Station M/N SS-206B Operating Mode On Frequency Range (MHz) Front (3 V/m) Rear (3 V/m) Left Side (3 V/m) Right Side (3 V/m) VERT HORI VERT HORI VERT HORI VERT HORI A A A A A A A A 10.3 Electrical Fast Transient/Burst Immunity Test (IEC ) Temperature ( ) 24 Humidity ( %RH ) 57 Barometric Pressure ( mbar ) EUT Temperature-Controlled Soldering Station M/N SS-206B Operating Mode On Power Supply Power Line of EUT IEC Test Points Test Levels (kv) L1 A A A A / / / / L2 A A A A / / / / Earth A A A A / / / / L1+L2 A A A A / / / / L1 + Earth A A A A / / / / L2 + Earth A A A A / / / / L1+L2+Earth A A A A / / / /

26 Page 26 of Surge Immunity Test (IEC ) Temperature ( ) 24 Humidity ( %RH ) 57 Barometric Pressure ( mbar ) EUT Temperature-Controlled Soldering Station M/N SS-206B Operating Mode On Table 1: Surge Power Supply Level Voltage Poll Path Pass Fail 1 0.5kV ± L-N A / 2 1kV ± L-PE, N-PE A / 3 2kV ± L-PE, N-PE / / 4 4kV ± L-N, L-PE, N-PE / / 10.5 Conducted Susceptibility Test (IEC ) Frequency Range (MHz): 0.15~80MHz Modulation: Amplitude 80%, 1kHz sine wave Severity Level: 3Vr.m.s. Temperature ( ) 24 Humidity ( %RH ) 57 Barometric Pressure ( mbar ) EUT Temperature-Controlled Soldering Station M/N SS-206B Operating Mode On Level Voltage Level (e.m.f.) U 0 Pass 1 1 / / 2 3 A / 3 10 / / X Special / / Fail

27 Page 27 of Voltage Dips, Short Interruptions Immunity Tests (IEC ) Temperature ( ) 24 Humidity ( %RH ) 57 Barometric Pressure ( mbar ) EUT Temperature-Controlled Soldering Station M/N SS-206B Operating Mode On Level U2 td Phase Angle N Pass Fail 1 >95% 10ms 0/90/180/270 3 B / 2 30% 500ms N/A 3 C / 3 >95% 5000ms N/A 3 C / Note: A Performance Criteria A as stated in Section 1.2 of this report B Performance Criteria B as stated in Section 1.2 of this report C Performance Criteria C as stated in Section 1.2 of this report

28 Page 28 of TEST RESULTS The following tests were performed on the Prokits Industries Co., Ltd. s product; model: SS- 206B ; the actual test results are contained within the Test Data section of this report IEC Electrostatic Discharge Immunity Test Configuration The EUT was subjected to the electrostatic discharge tests required by EN and all lower levels specified in IEC The EUT continued to perform as intended during and after the application of the ESD. Test setup photographs presented in Appendix B IEC Radiated Susceptibility Test Configuration The EUT was subjected to a 3-volt/meter, 80% Amplitude, 1 khz Sine wave field as required by EN and all lower levels specified in IEC The EUT continued to perform as intended during and after the application of the electromagnetic field. Test setup photographs presented in Appendix B IEC Electrical Fast Transient/Burst Immunity Test Configuration The EUT was subjected to the electrical fast transient tests required by EN and all lower levels specified in IEC The EUT continued to perform as intended during and after the application of the EFT/B. Test setup photographs presented in Appendix B IEC Surge Immunity Test Configuration The EUT was subjected to the Surge Immunity tests required by EN and all lower levels specified in IEC The EUT continued to perform as intended during and after the application of the Surge Immunity Test. Test setup photographs presented in Appendix B IEC Conducted Susceptibility Test Configuration The EUT was subjected to the Conducted Susceptibility tests required by EN and all lower levels specified in IEC The EUT continued to perform as intended during and after the application of the Conducted Susceptibility Test. Test setup photographs presented in Appendix B IEC Voltage Dips, Short Interruptions Immunity Tests Configuration The EUT was subjected to the Voltage Dips/Interruptions tests required by EN and all lower levels specified in IEC The EUT continued to perform as intended during and after the application of the Voltage Dips/Interruptions. Test setup photographs presented in Appendix B.

29 Page 29 of 34 APPENDIX A. EUT PHOTOGRAPHS EUT - Top View EUT - Back View

30 Page 30 of 34 EUT - Inside View EUT - Inside View

31 Page 31 of 34 EUT - Inside View

32 Page 32 of 34 APPENDIX B. TEST SETUP PHOTOGRAPHS Conducted Emission & Click Test Disturbance Power Test

33 Page 33 of 34 Radiated Susceptibility Test Voltage Fluctuations and Flicker Test

34 Page 34 of 34 Electrostatic Discharge Immunity Test Electrical Fast Transient/Burst Immunity, Surge Immunity, Voltage Dips, Short Interruptions Immunity Test

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