FemtoClock Crystal-to-LVCMOS/LVTTL Clock Generator ICS840022I-02 DATA SHEET. General Description. Features. Block Diagram.

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1 FemtoClock Crystal-to-LVCMOS/LVTTL Clock Generator ICS8400I-0 DATA SHEET General Description The ICS8400I-0 is a Gigabit Ethernet Clock Generator. The ICS8400I-0 uses a 5MHz crystal to synthesize 5MHz or 6.5MHz. The ICS8400I-0 has excellent phase jitter performance, over the khz 0MHz integration range. The ICS8400I-0 is packaged in a small 6-pin VFQFN, making it ideal for use in systems with limited board space. Features One LVCMOS/LVTTL outputs, 0Ω output impedance Crystal oscillator interface designed for 5MHz, 8pF parallel resonant crystal Output frequencies: 5MHz or 6.5MHz RMS phase jitter at 5MHz using a 5MHz crystal (khz - 0MHz): 0.57ps (typical) Supply modes: Core/Output 3.3V/3.3V 3.3V/.5V.5V/.5V -40 C to 85 C ambient operating temperature Available in lead-free (RoHS 6) package Function Table Inputs FREQ_SEL Output Frequency Range (with a 5MHz crystal) 0 5MHz 6.5MHz Block Diagram Pin Assignment FREQ_SEL Pulldown PWR_DN VDD nc nc GND Q 5MHz XTAL_IN XTAL_OUT OSC Phase Detector VCO Q XTAL_OUT XTAL_IN GND nc VDDO VDD PWR_DN Pullup M = 5 (fixed) GND nc FREQ_SEL GND ICS8400I-0 6 Lead VFQFN 3mm x 3mm x 0.95 package body K Package Top View ICS8400AKI-0 REVISION B SEPTEMBER 7, Integrated Device Technology, Inc.

2 Table. Pin Descriptions Number Name Type Description PWR_DN Input Pullup Output state control pin. See Table 3. LVCMOS/LVTTL interface levels., 3 XTAL_OUT, XTAL_IN Input 4, 5, 8, 3 GND Power Power supply ground. 6,, 4, 5 nc Unused No connect. Crystal oscillator interface. XTAL_IN is the input. XTAL_OUT is the output. 7 FREQ_SEL Input Pulldown Frequency select pin. LVCMOS/LVTTL interface levels. 9, 6 V DD Power Power supply pins. 0 V DDO Power Output supply pin. Q Output Single-ended clock output. 0Ω typical output impedance. LVCMOS/LVTTL interface levels. NOTE: Pullup and Pulldown refer to internal input resistors. See Table, Pin Characteristics, for typical values. Table. Pin Characteristics C IN Input Capacitance 4 pf C PD Power Dissipation Capacitance V DD, V DD = 3.465V or.65v 0 pf R PULLUP Input Pullup Resistor 5 kω R PULLDOWN Input Pulldown Resistor 5 kω R OUT Output Impedance 0 Ω Function Table Table 3. PWR_DN Function Table PWR_DN Input Description 0 Output in High-Impedance Output in normal operation ICS8400AKI-0 REVISION B SEPTEMBER 7, Integrated Device Technology, Inc.

3 Absolute Maximum Ratings NOTE: Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These ratings are stress specifications only. Functional operation of product at these conditions or any conditions beyond those listed in the DC Characteristics or AC Characteristics is not implied. Exposure to absolute maximum rating conditions for extended periods may affect product reliability. Item Rating Supply Voltage, V DD 4.6V Inputs, V I -0.5V to V DD + 0.5V Outputs, V O -0.5V to V DD + 0.5V Package Thermal Impedance, θ JA 74.9 C/W (0 mps) Storage Temperature, T STG -65 C to 50 C DC Electrical Characteristics Table 4A. Power Supply DC Characteristics, V DD = V DDO = 3.3V ± 5%, T A = -40 C to 85 C V DD Power Supply Voltage V V DDO Output Supply Voltage V I DD Power Supply Current PWR_DN = 77 ma PWR_DN = 0 < ma I DDO Output Supply Current ma Table 4B. Power Supply DC Characteristics, V DD = V DDO =.5V ± 5%, T A = -40 C to 85 C V DD Power Supply Voltage V V DDO Output Supply Voltage V I DD Power Supply Current PWR_DN = 68 ma PWR_DN = 0 < ma I DDO Output Supply Current 0 ma Table 4C. Power Supply DC Characteristics, V DD = 3.3V ± 5%, V DDO =.5V ± 5%, T A = -40 C to 85 C V DD Power Supply Voltage V V DDO Output Supply Voltage V I DD Power Supply Current PWR_DN = 77 ma PWR_DN = 0 < ma I DDO Output Supply Current 0 ma ICS8400AKI-0 REVISION B SEPTEMBER 7, Integrated Device Technology, Inc.

4 Table 4D. LVCMOS/LVTTL DC Characteristics, T A = -40 C to 85 C V IH V IL I IH I IL Input High Voltage Input Low Voltage Input High Current Input Low Current V OH Output High Voltage; NOTE V DD = 3.465V V DD V V DD =.65V.7 V DD V V DD = 3.465V V V DD =.65V V FREQ_SEL V DD = V IN = 3.465V or.65v 50 µa PWR_DN V DD = V IN = 3.465V or.65v 5 µa FREQ_SEL V DD = 3.465V or.65v, V IN = 0V -5 µa PWR_DN V DD = 3.465V or.65v, V IN = 0V -50 µa V DDO = 3.465V.6 V V DDO =.65V.8 V V OL Output Low Voltage; NOTE V DDO = 3.465V or.65v 0.5 V NOTE : Outputs terminated with 50Ω to V DDO /. See Parameter Measurement Information, Output Load Test Circuit diagrams. Table 5. Crystal Characteristics Parameter Test Conditions Minimum Typical Maximum Units Mode of Oscillation Fundamental Frequency 5 MHz Equivalent Series Resistance (ESR) 50 Ω Shunt Capacitance 7 pf ICS8400AKI-0 REVISION B SEPTEMBER 7, Integrated Device Technology, Inc.

5 AC Electrical Characteristics Table 6A. AC Characteristics, V DD = V DDO = 3.3V ± 5%, T A = -40 C to 85 FREQ_SEL = 0 5 MHz f OUT Output Frequency FREQ_SEL = 6.5 MHz tjit(ø) RMS Phase Jitter, Random; NOTE 5MHz, Integration Range: khz 0MHz 6.5MHz, Integration Range: khz 0MHz 0.57 ps 0.58 ps t R / t F Output Rise/Fall Time 0% to 80% ps odc Output Duty Cycle % NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium has been reached under these conditions. NOTE : Refer to Phase Noise Plot. Table 6B. AC Characteristics, V DD = V DDO =.5V ± 5%, T A = -40 C to 85 FREQ_SEL = 0 5 MHz f OUT Output Frequency FREQ_SEL = 6.5 MHz tjit(ø) RMS Phase Jitter, Random; NOTE 5MHz, Integration Range: khz 0MHz 6.5MHz, Integration Range: khz 0MHz 0.6 ps 0.58 ps t R / t F Output Rise/Fall Time 0% to 80% ps odc Output Duty Cycle % NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium has been reached under these conditions. NOTE : Refer to Phase Noise Plot. Table 6C. AC Characteristics, V DD = 3.3V ± 5%, V DDO =.5V ± 5%, T A = -40 C to 85 f OUT Output Frequency FREQ_SEL = 0 5 MHz FREQ_SEL = 6.5 MHz tjit(ø) RMS Phase Jitter, Random 5MHz, Integration Range: khz 0MHz 0.6 ps 6.5MHz, Integration Range: khz 0MHz 0.58 ps t R / t F Output Rise/Fall Time 0% to 80% ps odc Output Duty Cycle % NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium has been reached under these conditions. ICS8400AKI-0 REVISION B SEPTEMBER 7, Integrated Device Technology, Inc.

5MHz (3.3V) Offset Frequency (Hz) Gb Ethernet Filter 5MHz RMS Phase Jitter (Random) khz to 0MHz = 0.

6 Typical Phase Noise at 6.5MHz (3.3V) Gb Ethernet Filter 6.5MHz RMS Phase Jitter (Random) khz to 0MHz = 0.58ps (typical) Noise Power dbc Hz Raw Phase Noise Data Phase Noise Result by adding a Gb Ethernet filter to raw data Typical Phase Noise at 5MHz (3.3V) Offset Frequency (Hz) Gb Ethernet Filter 5MHz RMS Phase Jitter (Random) khz to 0MHz = 0.57ps (typical) Noise Power dbc Hz Raw Phase Noise Data Phase Noise Result by adding a Gb Ethernet filter to raw data Offset Frequency (Hz) ICS8400AKI-0 REVISION B SEPTEMBER 7, Integrated Device Technology, Inc.

7 Parameter Measurement Information.65V±5%.05V±5%.5V±5% V DD,, SCOPE V DD SCOPE V DDO GND LVCMOS Q V DDO LVCMOS GND Q -.65V±5% -.5V±5% 3.3V LVCMOS Output Load AC Test Circuit 3.3V/.5V LVCMOS Output Load AC Test Circuit.5V±5% Phase Noise Plot V DD, V DDO LVCMOS Q SCOPE Noise Power Phase Noise Mask GND -.5V±5% Offset Frequency f f RMS Jitter = Area Under the Masked Phase Noise Plot.5V LVCMOS Output Load AC Test Circuit RMS Phase Jitter V DDO 80% 80% Q t PW Q 0% 0% t PERIOD t R t F odc = t PW x 00% t PERIOD Output Rise/Fall Time Output Duty Cycle/Pulse Width/Period ICS8400AKI-0 REVISION B SEPTEMBER 7, Integrated Device Technology, Inc.

8 Applications Information Crystal Input Interface The ICS8400I-0 has been characterized with 8pF parallel resonant crystals. The capacitor values, C and C, shown in Figure below were determined using a 5MHz, 8pF parallel resonant crystal and were chosen to minimize the ppm error. The optimum C and C values can be slightly adjusted for different board layouts. C 7pF XTAL_IN X 8pF Parallel Crystal XTAL_OUT C 7pF Figure. Crystal Input Interface Overdriving the XTAL Interface The XTAL_IN input can accept a single-ended LVCMOS signal through an AC coupling capacitor. A general interface diagram is shown in Figure A. The XTAL_OUT pin can be left floating. The maximum amplitude of the input signal should not exceed V and the input edge rate can be as slow as 0ns. This configuration requires that the output impedance of the driver (Ro) plus the series resistance (Rs) equals the transmission line impedance. In addition, matched termination at the crystal input will attenuate the signal in half. This can be done in one of two ways. First, R and R in parallel should equal the transmission line impedance. For most 50Ω applications, R and R can be 00Ω. This can also be accomplished by removing R and making R 50Ω. By overdriving the crystal oscillator, the device will be functional, but note, the device performance is guaranteed by using a quartz crystal. 3.3V 3.3V R 00 Ro ~ 7 Ohm Zo = 50 Ohm C XTAL_IN Driver_LVCMOS RS 43 R 00 0.uF XTAL_OUT Crystal Input Interface Figure A. General Diagram for LVCMOS Driver to XTAL Input Interface VCC=3.3V Zo = 50 Ohm C XTAL_IN Zo = 50 Ohm R 50 0.uF XTAL_OUT LVPECL R 50 Crystal Input Interface R3 50 Figure B. General Diagram for LVPECL Driver to XTAL Input Interface ICS8400AKI-0 REVISION B SEPTEMBER 7, Integrated Device Technology, Inc.

9 Recommendations for Unused Input Pins Inputs: LVCMOS Control Pins The control pins have an internal pullup and pulldown; additional resistance is not required but can be added for additional protection. A kω resistor can be used. VFQFN EPAD Thermal Release Path In order to maximize both the removal of heat from the package and the electrical performance, a land pattern must be incorporated on the Printed Circuit Board (PCB) within the footprint of the package corresponding to the exposed metal pad or exposed heat slug on the package, as shown in Figure 3. The solderable area on the PCB, as defined by the solder mask, should be at least the same size/shape as the exposed pad/slug area on the package to maximize the thermal/electrical performance. Sufficient clearance should be designed on the PCB between the outer edges of the land pattern and the inner edges of pad pattern for the leads to avoid any shorts. While the land pattern on the PCB provides a means of heat transfer and electrical grounding from the package to the board through a solder joint, thermal vias are necessary to effectively conduct from the surface of the PCB to the ground plane(s). The land pattern must be connected to ground through these vias. The vias act as heat pipes. The number of vias (i.e. heat pipes ) are application specific and dependent upon the package power dissipation as well as electrical conductivity requirements. Thus, thermal and electrical analysis and/or testing are recommended to determine the minimum number needed. Maximum thermal and electrical performance is achieved when an array of vias is incorporated in the land pattern. It is recommended to use as many vias connected to ground as possible. It is also recommended that the via diameter should be to 3mils (0.30 to 0.33mm) with oz copper via barrel plating. This is desirable to avoid any solder wicking inside the via during the soldering process which may result in voids in solder between the exposed pad/slug and the thermal land. Precautions should be taken to eliminate any solder voids between the exposed heat slug and the land pattern. Note: These recommendations are to be used as a guideline only. For further information, please refer to the Application Note on the Surface Mount Assembly of Amkor s Thermally/ Electrically Enhance Leadframe Base Package, Amkor Technology. PIN SOLDER EXPOSED HEAT SLUG SOLDER PIN PIN PAD GROUND PLANE THERMAL VIA LAND PATTERN (GROUND PAD) PIN PAD Figure 3. P.C. Assembly for Exposed Pad Thermal Release Path Side View (drawing not to scale) ICS8400AKI-0 REVISION B SEPTEMBER 7, Integrated Device Technology, Inc.

10 Reliability Information Table 7. θ JA vs. Air Flow Table for a 6 Lead VFQFN θ JA at 0 Air Flow Meters per Second 0.5 Multi-Layer PCB, JEDEC Standard Test Boards 74.9 C/W 65.5 C/W 58.8 C/W Transistor Count The transistor count for ICS8400I-0 is: 760 ICS8400AKI-0 REVISION B SEPTEMBER 7, Integrated Device Technology, Inc.

11 Package Outline and Package Dimensions Package Outline - K Suffix for 6 Lead VFQFN Index Area N Top View D Chamfer 4x 0.6 x 0.6 max OPTIONAL Seating Plane Anvil Singulation or Sawn Singulation A A C A3 E E C L e (Ref.) N D& N Odd E (Ref.) (N D-)x e N D& N E (R ef.) Even D D N e (Typ.) If N D& N E are Even (N E -)x e (Re f.) b Thermal Base Bottom View w/type A ID Bottom View w/type B ID Bottom View w/type C ID BB 4 CHAMFER 4 N N- There are 3 methods of indicating pin corner at the back of the VFQFN package are:. Type A: Chamfer on the paddle (near pin ). Type B: Dummy pad between pin and N. 3. Type C: Mouse bite on the paddle (near pin ) CC 4 DD 4 N N- AA 4 RADIUS 4 N N- Table 8. Package Dimensions JEDEC Variation: VEED-/-4 All Dimensions in Millimeters Symbol Minimum Maximum N 6 A A A3 0.5 Ref. b N D & N E 4.0 D & E 3.00 Basic D & E e 0.50 Basic L Reference Document: JEDEC Publication 95, MO-0 ICS8400AKI-0 REVISION B SEPTEMBER 7, Integrated Device Technology, Inc.

12 Ordering Information Table 9. Ordering Information Part/Order Number Marking Package Shipping Packaging Temperature 8400AKI-0LF 0IL Lead-Free 6 Lead VFQFN Tube -40 C to 85 C 8400AKI-0LFT 0IL Lead-Free 6 Lead VFQFN 500 Tape & Reel -40 C to 85 C NOTE: Parts that are ordered with an "LF" suffix to the part number are the Pb-Free configuration and are RoHS compliant. While the information presented herein has been checked for both accuracy and reliability, Integrated Device Technology (IDT) assumes no responsibility for either its use or for the infringement of any patents or other rights of third parties, which would result from its use. No other circuits, patents, or licenses are implied. This product is intended for use in normal commercial and industrial applications. Any other applications, such as those requiring high reliability or other extraordinary environmental requirements are not recommended without additional processing by IDT. IDT reserves the right to change any circuitry or specifications without notice. IDT does not authorize or warrant any IDT product for use in life support devices or critical medical instruments. ICS8400AKI-0 REVISION B SEPTEMBER 7, Integrated Device Technology, Inc.

13 Revision History Sheet Rev Table Page Description of Change Date A B T4C T6C Corrected Block Diagram. Updated VFQFN EPAD Thermal Release Path section. Features Section - added 3.3V/.5V operating supply. Added 3.3V/.5V Power Supply DC Characteristics Table. Added 3.3V/.5V Power Supply AC Characteristics Table. Added 3.3V/.5V Output Load AC Test Circuit diagram. Updated Overdriving the Crystal Interface. Updated Package Drawing. Converted datasheet format. /7/07 7/8/0 B T9 Ordering Information Table - corrected marking from 0L to 0IL. 9/7/0 ICS8400AKI-0 REVISION B SEPTEMBER 7, Integrated Device Technology, Inc.

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14 We ve Got Your Timing Solution 604 Silver Creek Valley Road San Jose, California 9538 Sales (inside USA) (outside USA) Fax: Technical Support DISCLAIMER Integrated Device Technology, Inc. (IDT) and its subsidiaries reserve the right to modify the products and/or specifications described herein at any time and at IDT s sole discretion. All information in this document, including descriptions of product features and performance, is subject to change without notice. Performance specifications and the operating parameters of the described products are determined in the independent state and are not guaranteed to perform the same way when installed in customer products. The information contained herein is provided without representation or warranty of any kind, whether express or implied, including, but not limited to, the suitability of IDT s products for any particular purpose, an implied warranty of merchantability, or non-infringement of the intellectual property rights of others. This document is presented only as a guide and does not convey any license under intellectual property rights of IDT or any third parties. IDT s products are not intended for use in life support systems or similar devices where the failure or malfunction of an IDT product can be reasonably expected to significantly affect the health or safety of users. Anyone using an IDT product in such a manner does so at their own risk, absent an express, written agreement by IDT. Integrated Device Technology, IDT and the IDT logo are registered trademarks of IDT. Other trademarks and service marks used herein, including protected names, logos and designs, are the property of IDT or their respective third party owners. Copyright 00. All rights reserved.

FemtoClock Crystal-to-LVDS Frequency Synthesizer w/integrated Fanout Buffer

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