March 4-7, 2018 Hilton Phoenix / Mesa Hotel Mesa, Arizona Archive

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1 March 4-7, 2018 Hilton Phoenix / Mesa Hotel Mesa, Arizona Archive 2018 BiTS Workshop Image: pilgrims49 / istock

2 COPYRIGHT NOTICE The presentation(s)/poster(s) in this publication comprise the Proceedings of the 2018 BiTS Workshop. The content reflects the opinion of the authors and their respective companies. They are reproduced here as they were presented at the 2018 BiTS Workshop. This version of the presentation or poster may differ from the version that was distributed in hardcopy & softcopy form at the 2018 BiTS Workshop. The inclusion of the presentations/posters in this publication does not constitute an endorsement by BiTS Workshop or the workshop s sponsors. There is NO copyright protection claimed on the presentation/poster content by BiTS Workshop. However, each presentation/poster is the work of the authors and their respective companies: as such, it is strongly encouraged that any use reflect proper acknowledgement to the appropriate source. Any questions regarding the use of any materials presented should be directed to the author(s) or their companies. The BiTS logo and are trademarks of BiTS Workshop. All rights reserved.

3 Life Cycles of Sockets; Specification vs Reality and Setting Standards Texas Instruments James Tong Conference Ready mm/dd/2014 BiTS Workshop March 4-7, 2018

4 TI Contactor Strategy Pass/Fail Criteria: > Life of 1M insertions,1 pins for all pitch by package type Electrical Mis-contact reliability DC (Open/Shorts) ofirst Pass conti% oyield recovery from Conti test Frist Pass yield Func-Para failures orf or speed related test Others Temperature performance Mechanical Force? Do we care if it performs the test Tip wear? Do we care if it does not affects the yield (electrical and mechanical) Package witness marks No physical damage to DUT pad or ball Alignment features - alignment of contact affecting potential VM rejects/electrical performance Contactor Live Cycles Panel Session Texas Instruments 2

Supplier Socket Self-Evaluation Methodology Equipment for METS Test

Power suppliers, offline measurement tools, Infrared camera, network

devices Emulating test application as best as possible Pin specification

scrub wear test, Cu expose test Vendor Self Qualification Prototype

RF/Speed characteristic of solution Small sample run to reduce risk at

lifetime (Cres) and other spec envelop Temperature, Current, Speed/RF test

5 Supplier Socket Self-Evaluation Methodology Equipment for METS Test Standard contactor vendor test equipment FReD tester, Contactor cycler, Power suppliers, offline measurement tools, Infrared camera, network analyzer and contactor checker or OQC tools Tester/Handler with actual devices Emulating test application as best as possible Pin specification Cost Pin and contactor METS test 1M Cres test at temp Mechanical test: scrub wear test, Cu expose test Vendor Self Qualification Prototype Checkout Build prototype contactor/s for engineering evaluation Prove RF/Speed characteristic of solution Small sample run to reduce risk at production qualification phase Multiple samples of contactor to prove lifetime (Cres) and other spec envelop Temperature, Current, Speed/RF test performance Maintenance learning Production Qualification Contactor Live Cycles Panel Session Texas Instruments 3

The Not-Me-Too Supplier Product distinction Cres stability Pin

and characteristic Temperature, current, plating of plunger and

from supplier Hot switching, Residual electrical charge

Current carrying capability using METS Insertions life

test guide line of specifying solution for high speed broadband

6 The Not-Me-Too Supplier Product distinction Cres stability Pin structure design, Plunger material and hardness, Spring material and characteristic Temperature, current, plating of plunger and barrel if applicable Support distinction Application support from supplier Hot switching, Residual electrical charge handling, Current load sharing and distribution Standardization Current carrying capability using METS Insertions life expectancy base on test application Compress pin height Common test guide line of specifying solution for high speed broadband and/or RF test needs Santa s List Contactor Live Cycles Panel Session Texas Instruments 4

March 4-7, 2018 Hilton Phoenix / Mesa Hotel Mesa, Arizona Archive

March 4-7, 2018 Hilton Phoenix / Mesa Hotel Mesa, Arizona Archive 2018 BiTS Workshop Image: pilgrims49 / istock COPYRIGHT NOTICE The presentation(s)/poster(s) in this publication comprise the Proceedings