COMPLIANCE REPORT. Emission & Immunity of Electromagnetic disturbance. Date of Test: October 16, 2014 ~ October 18, 2014

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2 Page: 1of 45 COMPLIANCE REPORT Emission & Immunity of Electromagnetic disturbance Test Report No: Equipment: Type/Model: Applicant: Manufacturer: STD-CE Fingerprint Reader TSG-250 TrustOne Global Co Ltd TrustOne Global Co Ltd Date of Test: October 16, 2014 ~ October 18, 2014 Date of Issued: October 20, 2014 Test Standard: EN 55022:2010/Class A EN 55024:2010 EN /A2:2009 EN :2008 Test Result: Positive Negative This product complies with the requirements of the EMC Directive 2004/108/EC The results in this report apply only to the sample tested This test report shall not be reproduced except in full, without the written approval of Standard Engineering Laboratory Tested by HJ Cho / Test Engineer Approved by SS Seo / Senior Researcher Chungcheongnam-do , Republic of Korea Tel: , Fax : stdeng@stdengcom

3 Contents Page: 2of 45 1 Information of 2 General information 21 Product Information 22 Client information 23 Peripherals EMI Test Report 3 Procedure of measurement 31 Conducted emission 311 Configuration of measurement 312 Detector function selection 313 Frequency range to be scanned 32 Radiated emission 321 Configuration of measurement 322 Detector function selection 323 Frequency range to be scanned 33 Harmonic Currents 331 Test set-up and procedure 332 Test instrumentation 34 Voltage Fluctuations and Flicker 341 Test set-up and procedure 342 Test instrumentation 35 Method of calculation 4 Environment of measurement 41 Condition of environment 42 Measurement uncertainty 43 List of Test equipments for EMI Test 44 List of peripherals and cables Chungcheongnam-do , Republic of Korea Tel: , Fax : stdeng@stdengcom

4 Page: 3of 45 5 Result of measurement 51 Conducted emission 511 Test data 512 Result 52 Radiated emission 521 Test data 522 Result 53 Harmonic Currents 531 Test data 532 Result 54 Voltage Fluctuations and Flicker 541 Test data 542 Result Chungcheongnam-do , Republic of Korea Tel: , Fax : stdeng@stdengcom

5 Page: 4of 45 EMS Test Report 6 Test Specifications 61 Standards 62 Performance criteria 7 Test and Results 71 Electrostatic discharge Immunity Test 711 Configuration of measurement 712 Operating environment 713 Test Equipment 714 Test Conditions 715 Test Result 72 Radiated, RF Electromagnetic Field Immunity Test 721 Configuration of measurement 722 Operating environment 723 Test Equipment 724 Test Conditions 725 Test Result 73 Electrical Fast Transient/Burst Immunity Test 731 Configuration of measurement 732 Operating environment 733 Test Equipment 734 Test Conditions 735 Test Result 74 Surge Immunity Test 741 Configuration of measurement 742 Operating environment 743 Test Equipment 744 Test Conditions 745 Test Result Chungcheongnam-do , Republic of Korea Tel: , Fax : stdeng@stdengcom

6 Page: 5of Immunity to Conducted Disturbance, Induced by RF Field 751 Configuration of measurement 752 Operating environment 753 Test Equipment 754 Test Conditions 755 Test Result 76 Voltage Dips, Short Interruptions & Voltage variations Immunity Test 761 Configuration of measurement 762 Operating environment 763 Test Equipment 764 Test Conditions 765 Test Result 8 Appendix 81 Photographs of Set-up 82 Photographs of EUT 83 Conducted emission data 84 Radiated emission data Chungcheongnam-do , Republic of Korea Tel: , Fax : stdeng@stdengcom

7 1 Information of Page: 6of 45 Name of test laboratory Standard Engineering Co, Ltd Location Chungcheongnam-do , Republic of Korea Phone No : ~7 Fax No : Homepage: Environment of Laboratory This location can keep accuracy in measuring more than anywhere because surrounding noise ambient is low and silent excellently to be suitable in EMI's measuring Map Chungcheongnam-do , Republic of Korea Tel: , Fax : stdeng@stdengcom

8 Page: 7of 45 2 General Information 21 Product information Description of EUT : Model number : Specification : Crystal & Clock Freq : Applied Standard : Fingerprint Reader TSG-250 DC 12 V Above 108 MHz EN 55022:2010/Class A EN 55024:2010 EN /A2:2009 EN :2008 EN :2009 EN /A2:2010 EN :2012 EN :2006 EN :2009 EN : Client information Applicant : TrustOne Global Co Ltd Address : #108, University Industry Academy Corperation Group A-ju University, 5 on Mountain, Won-cheon dong, Yeong-dong gu, Kyung-ki do, Korea Phone No : Fax No : Contact person : Yoon Hyung il / CEO Manufacturer : TrustOne Global Co Ltd Address : #108, University Industry Academy Corperation Group A-ju University, 5 on Mountain, Won-cheon dong, Yeong-dong gu, Kyung-ki do, Korea Phone No: Fax No: Chungcheongnam-do , Republic of Korea Tel: , Fax : stdeng@stdengcom

9 Page: 8of Peripherals 220Vac 60Hz 230Vac 50Hz CVCF Adaptor PC RJ45 EUT 10 m RCVR Used Peripherals Descriptions Maker Type S/No Remarks EUT TrustOne Global Co Ltd TSG-250 N/A PC Lenovo WB Adaptor LC POWER ELECTRONICS CO,LTD LCP A N/A EUT Operation Auto Run Mode Chungcheongnam-do , Republic of Korea Tel: , Fax : stdeng@stdengcom

10 Page: 9of 45 EMI Test Report Emission of Electromagnetic disturbance 3 Procedure of measurement 31 Conducted emission 311 Configuration of measurement This measurement executed in shield-room and EUT was tested on wooden table height 08m above the reference ground plane EUT's rear part had 04m distance from VCP(Vertical Conducted Plane), 08m any other grounded conducting surface and LISN placed on the grounded plane with 1m distance from EUT's side part Excess power cord and cables fixed in bundle style of 30~40cm length with non-inductive material, and power line was connected to power source through LISN to detect maximum EMI without external RFI from aux instruments The conducted common mode disturbance voltage at telecommunication port was measured with the EUT in shield room The measurement was conducted with ISN The EUT was placed on non-metallic table 04 m above the metallic grounded floor Measuring equipments and EUT confirmed that warming-up was performed during enough time and calibration of antenna as well as calibration of measuring equipment also completed beforehand This measurement was performed on condition of worst-case emission 312 Detector function selection Amplitude measurements were performed with quasi-peak and an average detector 313 Frequency range to be scanned For conducted emissions measurement, frequency range of 150 khz to 30 MHz included, was investigated Chungcheongnam-do , Republic of Korea Tel: , Fax : stdeng@stdengcom

11 Page: 10of Radiated Emission 321 Configuration of measurement Preliminary measurement was performed in 3 meter semi-anechoic chamber to detect correct EMI frequency Final measurement was executed at 10 meters OATS(Open Area Test Site) using Quasi-peak detector and TRILOG antenna EUT was placed on 08m height wooden table located on the reference ground plane Excess power cord and other excess cables fixed in bundle style of 30~40cm length with non-inductive material to detect maximum EMI emission from EUT The height of the measuring antenna is varied 1 to 4 meters and table was rotated a full revolution in order to obtain maximum electric field intensity The measurement is made in both the vertical and horizontal polarization, and measurement is performed with a quasi-peak detector The highest emissions between 1 GHz to 6 GHz were analyzed in details by operating the spectrum analyzer in peak and average mode to determine the precise amplitude of the emissions At the highest amplitudes observed, the EUT is rotated in the horizontal plane while changing the antenna polarization in the vertical plane to maximize the reading The interconnecting cables were arranged and moved to get the maximum measurement Once the maximum reading is obtained, the antenna elevation and polarization will be varied between specified limits to maximize the readings The highest internal source of an EUT is defined as the highest frequency generated or used within the EUT or on which the EUT operates or tunes If the highest frequency of the internal sources of the EUT is less than 108 MHz, the measurement shall only be made up to 1 GHz If the highest frequency of the internal sources of the EUT is between 108 MHz and 500 MHz, the measurement shall only be made up to 2 GHz If the highest frequency of the internal sources of the EUT is between 500 MHz and 1 GHz, the measurement shall only be made up to 5 GHz If the highest frequency of the internal sources of the EUT is above 1 GHz, the measurement shall be made up to 5 times the highest frequency or 6 GHz, whichever is less 322 Detector function selection Amplitude measurements were performed with quasi-peak and an average detector 323 Frequency range to be scanned For Radiated emissions measurement, frequency range of 30 MHz ~ 300 MHz included, was investigated Chungcheongnam-do , Republic of Korea Tel: , Fax : stdeng@stdengcom

12 Page: 11of Harmonic Currents 331 Test set-up and procedure Emission tests shall be conducted with the user s operation controls or automatic programs set to the mode expected to produce the maximum total harmonic current(thc) under normal operating conditions This defines the equipment set-up during emission tests and not a requirement to measure THC or to conduct searches for worst-case emissions The equipment is tested as presented by, and in accordance with information provided by, the manufacturer 332 Test instrumentation Equipment Model No Serial No Makers RMKS Power Simulation PM Voltech System 34 Voltage Fluctuations and Flicker 341 Test set-up and procedure Unless the test conditions for the measurement of voltage fluctuations and flicker are given A controls or automatic program shall be set to produce the most unfavorable sequence of voltages, using only those combinations of controls and programs which are mentioned by the manufacturer in the instruction manual 342 Test instrumentation Equipment Model No Serial No Makers RMKS Power Simulation PM Voltech System Chungcheongnam-do , Republic of Korea Tel: , Fax : stdeng@stdengcom

13 Page: 12of Method of Calculation 351 Unit of Conducted emission measurement Conducted Emission Test results for conducted emissions are reported in micro-volts 352 Unit of Radiated emission measurement Test results of radiated emissions measurement are reported in micro-volts per meter at the specific distance Using the unit of dbμv on the test instrument, the indication unit was converted to field strength unit of μv/m as following method; F (µv/m) = 10 {(R+CL+AF)/20} (µv/m) F: Field Strength in uv/m, R: Meter Reading Level in db(µv), CL: Cable Loss from antenna to meter in db, AF: Antenna Factor of receiving antenna in db(/m) Sample calculation (Radiated emission) Emission level is calculated as follows; Emission Level(dBµV/m) = Reading Level + Ant Factor + Cable Loss Amp Gain Margin Level is calculated as follows; Margin(dBµV) = Limit Level Emission Level Example) Standard limit = 40 dbµv/m, Reading Level = 10 dbµv, Ant Factor = 15 db, Cable Loss= 1 db Emission Level(dBµV/m) = = 26 (dbµv/m) Margin(dBµV) = = 14 (dbµv) Chungcheongnam-do , Republic of Korea Tel: , Fax : stdeng@stdengcom

14 4 Environments of measurement Page: 13of Condition of environment Shield room OATS Temperature 21 C Humidity 47 %RH Pressure 1010 hpa Temperature 22 C Humidity 61 %RH Pressure 1010 hpa 42 Measurement uncertainty All measurements, especially EUT's measurement includes uncertain level that can happen for the reason as following; Variation of antenna factor by changes of height, center, polarization, directivity Uncertainty factor by change of measurement distance, site's imperfection Radiated emissions measurements: db Mains terminal disturbance voltage: Quasi-peak & Average Detection: db Telecom terminal disturbance voltage: Quasi-peak & Average Detection: + 3 db The measurement uncertainty describes the overall uncertainty of the given measured value during the operation of the EUT in the above mentioned way The measurement uncertainty was calculated in accordance with NAMAS NIS 81 : The treatment of uncertainty in EMC measurement The measurement uncertainty was given with a confidence of 95% Chungcheongnam-do , Republic of Korea Tel: , Fax : stdeng@stdengcom

15 Page: 14of List of Test equipments for EMI test Used Equipment Maker Model No S/No Caldue date EMI Test Receiver Rhode & Schwarz ESIB /11/2015 EMI Test Receiver LIG LSA-30 L /04/2015 Artificial Mains Rhode & Schwarz ESH2-Z /27/2015 Artificial Mains Rhode & Schwarz ESH3-Z /14/2014 Signal Generator Rhode & Schwarz SML /11/2014 Absorbing Clamp Rhode & Schwarz MDS /04/2015 TRILOG Antenna Schwarzbeck VULB /15/2016 Pulse Limitter Rhode & Schwarz ESH3-Z /15/2014 Power Simulation System Voltech PM /29/2014 Horn Antenna Schwarzbeck BBHA9120A /27/2015 ISN CAT3 Schwarzbeck NTFM /06/2014 ISN CAT5 Schwarzbeck NTFM /06/2014 ISN CAT6 Schwarzbeck NTFM /05/2015 Attenuator Rhode & Schwarz MDS /04/2015 Click Meter AFJ INSTRUMENTS CL55C /21/2015 Switching Box AFJ INSTRUMENTS SW04 SW /21/ List of Peripherals & Cables for EMI test Used Descriptions Maker Type S/No Approval Reference PC set TG TG Notebook(H2) Class B Reference Printer EPSON P730A 60H CE/FCC/VCCI DC Power Supply HP 6574A US CE M/W Cable/2GHz 5m H+Suhner SF104/2x11BNC M/W Cable/2GHz10m M/W Cable/18GHz18m SF104/2x11N 6025 M/W Cable/18GHz18m 6026 M/W Cable/18GHz10m 6027 M/W Cable/2GHz43m Thermax MS-P400 Function Generator HP 3311A 1244A25104 CCD Color Camera Sung Eun PSS-C5327 Chungcheongnam-do , Republic of Korea Tel: , Fax : stdeng@stdengcom

16 5 Result of Measurement Page: 15of Conducted Emission 511 Test data a) Mains terminal disturbance voltage Frequency [MHz] Line Limit[dBuV] Result[dBuV] Factor Margin[dBuV] QP AV QP AV [db] QP AV L L N N * Detector function was set into Quasi-peak & Average mode * Factor = LISN Factor + Cable loss + Pulse Limiter Chungcheongnam-do , Republic of Korea Tel: , Fax : stdeng@stdengcom

17 Page: 16of 45 b) Conducted disturbance at telecommunication ports Frequency [MHz] Port Limit[dBuV] Result[dBuV] Factor Margin[dBuV] QP AV QP AV [db] QP AV 10 Mbps 7431 N N N Mbps N N N * Detector function was set into Quasi-peak & Average mode * Factor = LISN Factor + Cable loss 512 Result Complied Chungcheongnam-do , Republic of Korea Tel: , Fax : stdeng@stdengcom

18 Page: 17of Radiated Emission 521 Test data Below 1GHz Frequency [MHz] Polarization [Ver/Hor] Limit [dbuv/m] Result [dbuv/m] Factor [db] Margin [dbuv/m] 3999 V V V V V V * Detector function was set into Quasi-peak mode * Factor = Antenna Factor + Cable loss Chungcheongnam-do , Republic of Korea Tel: , Fax : stdeng@stdengcom

19 Page: 18of 45 Above 1 GHz Frequency [MHz] Polarizatio n [Ver/Hor] Limit[dBuV] Result[dBuV] Margin[dBuV] Factor [db] PK AV PK AV PK AV V * Factor = Antenna Factor + Cable loss * Margin PK(Peak) = Limit PK Result PK * Margin AV(Average) = Limit AV Result AV 522 Result Complied Chungcheongnam-do , Republic of Korea Tel: , Fax : stdeng@stdengcom

20 Page: 19of Harmonic Currents 5 31 Test data - As specified on clause 7 of , the limits are not specified for equipment with a rated power of 75W or less 532 Result : Complied Chungcheongnam-do , Republic of Korea Tel: , Fax : stdeng@stdengcom

21 Page: 20of Voltage Fluctuations and Flicker 541 Test data 542 Result: Complied Chungcheongnam-do , Republic of Korea Tel: , Fax :

22 Page: 21of 45 EMS Test Report Immunity of Electromagnetic disturbance 6 Test Specifications 61 Standards EN /2010 Information technology equipment immunity characteristics Limits and methods of measurement Basic standards EN :2009 Electrostatic discharge immunity test Required test level Contact discharge ±4 kv, Air discharge ±8 kv EN /A2:2010 Radiated disturbance induced by RF fields Required test level 3 V/m, AM 80%(1 khz), MHz EN :2012 Electrical fast transient burst immunity test Required test level AC input + 1 kv, Telecommunication & signal line + 05 kv EN :2006 Surge immunity test Required test level Differential mode + 1 kv on AC supply Common mode + 2 kv on AC supply EN :2009 Conducted disturbance induced by RF fields Required test level 3 V, AM 80%(1kHz), 015~80 MHz AC Mains, Telecommunication & Signal line EN :2010 Magnetic field immunity test Required test level (a) 1 A/m(RMS), 50/60 Hz EN :2004 Voltage dips, short interruptions and voltage variation immunity tests Required test level 05cycle/95%, 25cycle/30%, 250cycle/95% (a) The EUT is not affected by magnetic fields, so this test was not applied Chungcheongnam-do , Republic of Korea Tel: , Fax : stdeng@stdengcom

23 Page: 22of Performance criteria The performance criteria are based on the general criteria of the standard and specified by the manufacturer Criterion A : The EUT shall be operated to the normal mode The measurement shall be done by the subjective observation of a observer to operate a intended during the test Criterion B : The EUT shall continue to operate as intended after the test During the test, degradation of performance is allowed however Criterion C : Temporary loss of function is allowed, provided the function is self-recoverable or can be restored by power on/off The monitoring performance of EUT during the test was performed by observation of the EUT communication condition Chungcheongnam-do , Republic of Korea Tel: , Fax : stdeng@stdengcom

24 7 Test and Results Page: 23of Electrostatic discharge Immunity Test 711 Configuration of measurement The EUT was placed on a non-metallic support 08m above a reference ground plane(rgp) and floor standing EUT was placed on 01m wooden table above the RGP The return cable of the ESD generator was connected to the RGP A vertical coupling plane(vcp) and horizontal coupling plan(hcp) connected to the RGP with a cable through two 470 k ohms register s each ends 05mm insulating supporter between EUT and HCP was used to locate the EUT 712 Operating environment This test was performed in a shield room Temperature: 21 C(15~35 ) Relative Humidity: 47 %RH(30~60%) 713 Test Equipment Equipment Model No Maker Serial No Cal due date ESD Simulator ESS-2000 Noiseken ESS /14/2014 Discharge gun TC-815P Noiseken ESS02X /14/2014 Loading Resistor A Noiseken - N/A HCP N/A VCP N/A 714 Test Conditions Discharge voltage Polarity Discharge method Discharge impedance Discharge interval Number of discharge Criterion Test point Air discharge Contact discharge + 4 kv contact, + 8 kv Air discharge Positive and Negative Direct & Indirect(VCP/HCP) 330 ohm / 150 pf 1 second 20 of each polarity B EUT 715 Test result: There was no change of operation status during above testing Pass Chungcheongnam-do , Republic of Korea Tel: , Fax : stdeng@stdengcom

25 Page: 24of Radiated, RF Electromagnetic Field Immunity Test 721 Configuration of measurement The EUT was placed on a non-metallic table 08m above the reference ground plane covered with ferrite tiles in semi-anechoic chamber which field uniformity chamber was calibrated for 18V/m The horizontal/vertical polarization and all side of EUT was tested 722 Operating environment Temperature: 21 C Relative Humidity: 47 %RH 723 Test Equipment Equipment Model No Maker Serial No Caldue date RF Amplifier NA80MF3G Noiseken A /11/2014 Signal Generator SML03 R & S /11/2014 Power Meter ECC418B Agilent GB /11/2014 Radiation Meter EMC-20 Narda AP /21/2015 E-Field Probe Type 84 Narda AR /21/2015 Bi-Log Antenna CC5131 Schaffner /15/2016 Power Sensor 8482A Agilent MY /12/ Test Conditions Frequency Range 80 ~ 1000 MHz Field strength 3 V/m Modulation AM 80% with 1 khz sine wave Frequency Step 1 % Field Polarization Horizontal and Vertical Exposed sides Front/Back/Right/Left Antenna distance from EUT 3 m Dwell time 3 seconds Criterion A 725 Test result: There was no change of operation status during above testing Pass Chungcheongnam-do , Republic of Korea Tel: , Fax : stdeng@stdengcom

26 Page: 25of Electrical Fast Transient/Burst Immunity Test 731 Configuration of measurement The EUT was placed on a non-metallic table 08m above the reference ground plane and floor standing EUT was placed on 01m wooden table above the RGP The capacitive coupling clamp was also placed at a distance of 01 m above the RGP and the length between clamp and EUT should not be more than 1m 732 Operating environment This test was performed in a shield room Temperature: 21 C (15~35) Relative Humidity: 47 %RH(25~75) Atmosphere pressure: 1010 hpa(860~1060) 733 Test Equipment Equipment Model Maker S/N Caldue date Fast Transient Noise Simulator FNS-2002 Noiseken FNS /10/2015 Attenuator AT810 Noiseken INS N/A Coupling Clamp A Noiseken - 09/10/ Test Conditions Severity Level Type of Line Polarity Rise time/width Pulse repetition Duration Coupling Mode Criterion Power line + 1 kv Telecommunication line + 05 kv Power line: unshielded Positive and Negative 5 ns / 50 ns 50 khz 120 seconds L+N (Power line), Telecommunication line B 735 Test result: There was no change of operation status during above testing Pass Chungcheongnam-do , Republic of Korea Tel: , Fax : stdeng@stdengcom

27 Page: 26of Surge Immunity Test 741 Configuration of measurement The EUT was placed on a non-metallic table 08m above the reference ground plane and floor standing EUT was placed on 01m wooden table above the RGP 742 Operating environment This test was performed in a shield room Temperature: 21 C(15~35) Relative Humidity: 47 %RH(10~75) Atmosphere pressure: 1010 hpa(861~1061) 743 Test Equipment Equipment Model Maker S/N Caldue date Surge Simulator LSS-6030 Noiseken LSS /11/2014 CDN (Telecom Lines) IJ6401tel Noiseken LSS /11/2014 EM clamp EM23 Noiseken Test Conditions Severity Level Number of transient Rise time/width Repetition rate Phase angles Application method Criterion Differential mode + 1 kv on AC supply 5 positive & 5 negative 12(8,0)us / 50(20)us 1 min 0,90,180,270 (versus supply voltage) Direct coupling B 745 Test result : There was no change of operation status during above testing Pass Chungcheongnam-do , Republic of Korea Tel: , Fax : stdeng@stdengcom

28 Page: 27of Immunity to Conducted Disturbances, Induced by RF Field 751 Configuration of measurement The EUT was placed on a non-metallic table 08m above the RGP and floor standing EUT was placed on 01m isolating support above the RGP This test was performed using CDN for mains, clamp for signal and injection probe A power meter for calibration was connected to the EUT side of the CDN through a ohms adapter The auxiliary equipment(ae) side of the network was terminated with 150 ohm to ground during the calibration 752 Operating environment Temperature: 21 C Relative Humidity: 47 %RH 753 Test Equipment Equipment Model No Maker Serial No Caldue date Amplifier NA10K230M75 Noiseken A /11/2014 Signal Generator SML01 R & S /18/2014 CDN NCDN-M3-16A FCC /17/2014 CDN NCDN-M2-16A FCC /17/2014 EM clamp NEM-23MM FCC /11/2015 Power Meter ECC418B Agilent GB /11/2014 De/Coupling Network NAE-23MM FCC 32 N/A 754 Test Conditions Frequency Range 015 ~ 80 MHz Field strength 3 V Modulation AM 80% with 1 khz sine wave Frequency Step 1 % Application method Lines for test Dwell time Criterion CDN (AC mains), EM clamp (Telecommunication line) AC mains 3 seconds A 755 Test result: There was no change of operation status during above testing Pass Chungcheongnam-do , Republic of Korea Tel: , Fax : stdeng@stdengcom

29 Page: 28of Voltage Dips, Short Interruptions & Voltage variations Immunity Test 761 Configuration of measurement The shortest possible mains cable is used, unless otherwise specified by the manufacturer 762 Operating environment This test was performed in a shield room Temperature: 21 C(15~35) Relative Humidity: 47 %RH(25~75) Atmosphere pressure: 1010 hpa(860~1060) 763 Test Equipment Equipment Model Maker S/N Caldue date Voltage dip/interruption Simulator VDS-2002 Noiseken VDS /11/ Test Conditions Test level 30%, 95% Voltage / Duration 250/95% 25/30% 05/95% Phase angle of insertion 0, 90, 180, 270 Recovery time between pulse 10 seconds Criterion C, B 765 Test result : EUT s power was down interruption test(250/95%), but this EUT was returned to normal function after rebooting Pass Chungcheongnam-do , Republic of Korea Tel: , Fax : stdeng@stdengcom

30 8 Appendix 81 Photograph of Set-up Conducted Emission (Power line) Page: 29of 45 Conducted Emission (telecommunication line) Chungcheongnam-do , Republic of Korea Tel: , Fax :

31 Page: 30of 45 Radiated Emission (Below 1GHz) Radiated Emission (Above 1GHz) Chungcheongnam-do , Republic of Korea Tel: , Fax :

32 Page: 31of 45 Electrostatic discharge Radiated, RF Electromagnetic Field Chungcheongnam-do , Republic of Korea Tel: , Fax :

33 Page: 32of 45 Electrical Fast Transient/Bust (Power line) Electrical Fast Transient/Bust (Signal line) Chungcheongnam-do , Republic of Korea Tel: , Fax :

34 Page: 33of 45 Surge Immunity to Conducted Disturbance (Power line) Chungcheongnam-do , Republic of Korea Tel: , Fax :

35 Page: 34of 45 Immunity to Conducted Disturbance (Signal line) Voltage Dips, Short Interruptions & Voltage variations Immunity Test Chungcheongnam-do , Republic of Korea Tel: , Fax :

36 Page: 35of Photographs of EUT Front View Chungcheongnam-do , Republic of Korea Tel: , Fax :

37 Page: 36of 45 Rear View Chungcheongnam-do , Republic of Korea Tel: , Fax :

38 Page: 37of 45 Top View Chungcheongnam-do , Republic of Korea Tel: , Fax :

39 Page: 38of 45 Bottom View Chungcheongnam-do , Republic of Korea Tel: , Fax :

40 Page: 39of 45 Side View-1 Chungcheongnam-do , Republic of Korea Tel: , Fax :

41 Page: 40of 45 Side View-2 Chungcheongnam-do , Republic of Korea Tel: , Fax :

42 Page: 41of Conducted emission data Standard Engineering Co, Ltd Conducted Emission Measurement EUT: Manufacturer: Operating Condition: Test Site: Operator: Test Specification: Comment: TSG-250 TrustOne Global Co Ltd Shield Room HJ Cho EN / Class A Phase N SCAN TABLE: "ZFCCCEA" Start Stop Step Detector Meas IF Transducer Frequency Frequency Width Time Bandw 1500 khz 300 MHz 50 khz MaxPeak 10 ms 9 khz ESH3-Z2 Average Chungcheongnam-do , Republic of Korea Tel: , Fax : stdeng@stdengcom

43 Page: 42of 45 Standard Engineering Co, Ltd Conducted Emission Measurement EUT: Manufacturer: Operating Condition: Test Site: Operator: Test Specification: Comment: TSG-250 TrustOne Global Co Ltd Shield Room HJ Cho EN / Class A Phase L SCAN TABLE: "ZFCCCEA" Start Stop Step Detector Meas IF Transducer Frequency Frequency Width Time Bandw 1500 khz 300 MHz 50 khz MaxPeak 10 ms 9 khz ESH3-Z2 Average Chungcheongnam-do , Republic of Korea Tel: , Fax : stdeng@stdengcom

44 Page: 43of 45 Standard Engineering Co, Ltd Conducted Emission Measurement EUT: TSG-250 Manufacturer: TrustOne Global Co Ltd Operating Condition: Telecommunication port (10 Mbps) Test Site: Shield Room Operator: HJ Cho Test Specification: Conducted Emission EN / Class A Comment: 10 Mbps SCAN TABLE: "ZFCCCEA" Start Stop Step Detector Meas IF Transducer Frequency Frequency Width Time Bandw 1500 khz 300 MHz 50 khz MaxPeak 10 ms 9 khz ESH3-Z2 Average Chungcheongnam-do , Republic of Korea Tel: , Fax : stdeng@stdengcom

45 Page: 44of 45 Standard Engineering Co, Ltd Conducted Emission Measurement EUT: TSG-250 Manufacturer: TrustOne Global Co Ltd Operating Condition: Telecommunication port (100 Mbps) Test Site: Shield Room Operator: HJ Cho Test Specification: Conducted Emission EN / Class A Comment: 100 Mbps SCAN TABLE: "ZFCCCEA" Start Stop Step Detector Meas IF Transducer Frequency Frequency Width Time Bandw 1500 khz 300 MHz 50 khz MaxPeak 10 ms 9 khz ESH3-Z2 Average Chungcheongnam-do , Republic of Korea Tel: , Fax : stdeng@stdengcom

46 Page: 45of Radiated emission data Standard Engineering Co, Ltd Radiated Emission Measurement EUT: Manufacturer: Operating Condition: Test Site: Operator: Test Specification: Comment: TSG-250 TrustOne Global Co Ltd HJ Cho SCAN TABLE: "KN22 1G-6G Field-03" Short Description: EN Field Strength Start Stop Step Detector Meas IF Transducer Frequency Frequency Width Time Bandw 10 GHz 60 GHz 400 khz MaxPeak 10 ms 1 MHz HONE-ANT Average 100 Level [db 킮/m] G 2G 3G 4G 5G 6G Frequency [Hz] MES KN22 1G-6G Fie MaxPk MES KN22 1G-6G Field Avg LIM KN22REB1-6PK-A Power QP Limit LIM KN22REB1-6AV-A Power QP Limit Chungcheongnam-do , Republic of Korea Tel: , Fax : stdeng@stdengcom

Yoon Hyung il / President. Standard Engineering Co., Ltd.

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