3GPP TS V ( )

Transcription

1 TS 34.4 V.3.0 (0-) Techical Specificatio 3rd Geeratio artership roject; Techical Specificatio Group Radio Access Network; User Equipet (UE) / Mobile Statio (MS) Over The Air (OTA) atea perforace; Coforace testig (Release ) The preset docuet has bee developed withi the 3 rd Geeratio artership roject ( TM ) ad ay be further elaborated for the purposes of. The preset docuet has ot bee subject to ay approval process by the Orgaizatioal arters ad shall ot be ipleeted. This Specificatio is provided for future developet work withi oly. The Orgaizatioal arters accept o liability for ay use of this Specificatio. Specificatios ad reports for ipleetatio of the TM syste should be obtaied via the Orgaizatioal arters' ublicatios Offices.

2 Release TS 34.4 V.3.0 (0-) Keywords UMTS, obile statio, atea, efficiecy, testig ostal address support office address 650 Route des Lucioles - Sophia Atipolis Valboe - FRANCE Tel.: Fax: Iteret Copyright Notificatio No part ay be reproduced except as authorized by writte perissio. The copyright ad the foregoig restrictio exted to reproductio i all edia. 0, Orgaizatioal arters (ARIB, ATIS, CCSA, ETSI, TTA, TTC). All rights reserved. Chage the copyright date above as ecessary. UMTS is a Trade Mark of ETSI registered for the beefit of its ebers is a Trade Mark of ETSI registered for the beefit of its Mebers ad of the Orgaizatioal arters LTE is a Trade Mark of ETSI curretly beig registered for the beefit of its Mebers ad of the Orgaizatioal arters GSM ad the GSM logo are registered ad owed by the GSM Associatio

3 Release 3 TS 34.4 V.3.0 (0-) Cotets Foreword... 9 Scope... 9 Refereces Defiitios, sybols, abbreviatios ad equatios Sybols Abbreviatios... 4 Geeral Measureet frequecies FDD frequecy bads GSM frequecy bads TDD frequecy bads Trasitter erforace Geeral DUT positioig Saplig grid Nuber of idepedet saples (for reverberatio chaber procedure) Total Radiated ower (TR) for FDD UE Defiitio ad applicability Miiu Requireets Test purpose Method of test Iitial coditios rocedure rocedure, reverberatio chaber ethod Test requireets Total Radiated ower (TR) for GSM MS Defiitio ad applicability Miiu Requireets Test purpose Method of test Iitial coditios rocedure rocedure, reverberatio chaber ethod Test requireets Total Radiated ower (TR) for TDD UE Defiitio ad applicability Miiu Requireets Test purpose Method of test Iitial coditios rocedure rocedure, reverberatio chaber ethod Test requireets Total Radiated ower (TR) for FDD UE usig LME Defiitio ad applicability Miiu Requireets Test purpose Method of test Iitial coditios rocedure rocedure, reverberatio chaber ethod Test requireets Total Radiated ower (TR) for GSM MS usig LME Defiitio ad applicability... 30

4 Release 4 TS 34.4 V.3.0 (0-) 5.6. Miiu Requireets Test purpose Method of test Iitial coditios rocedure rocedure, reverberatio chaber ethod Test requireets Total Radiated ower (TR) for TDD UE usig LME Defiitio ad applicability Miiu Requireets Test purpose Method of test Iitial coditios rocedure rocedure, reverberatio chaber ethod Test requireets Total Radiated ower (TR) for FDD UE usig LEE Defiitio ad applicability Miiu Requireets Test purpose Method of test Iitial coditios rocedure rocedure, reverberatio chaber ethod Test requireets Total Radiated ower (TR) for GSM MS usig LEE Defiitio ad applicability Miiu Requireets Test purpose Method of test Iitial coditios rocedure rocedure, reverberatio chaber ethod Test requireets Total Radiated ower (TR) for TDD UE usig LEE Defiitio ad applicability Miiu Requireets Test purpose Method of test Iitial coditios rocedure rocedure, reverberatio chaber ethod Test requireets Receiver erforace Geeral DUT ositioig Saplig grid Nuber of idepedet saples (for reverberatio chaber procedure) Total Radiated Sesitivity (TRS) for FDD UE Defiitio ad applicability Miiu requireets Test urpose Method of test Iitial coditios Test procedure Test procedure, reverberatio chaber ethod Test requireets Total Radiated Sesitivity (TRS) for GSM MS Defiitio ad applicability Miiu requireets Test urpose... 56

5 Release 5 TS 34.4 V.3.0 (0-) Method of test Iitial coditios Test procedure Test procedure, reverberatio chaber ethod Test requireets Total Radiated Sesitivity (TRS) for TDD UE Defiitio ad applicability Miiu requireets Test urpose Method of test Iitial coditios Test procedure Test procedure, reverberatio chaber ethod Test requireets Total Radiated Sesitivity (TRS) for FDD UE usig LME Defiitio ad applicability Miiu Requireets Test purpose Method of test Iitial coditios rocedure Test procedure, reverberatio chaber ethod Test requireets Total Radiated Sesitivity (TRS) for GSM MS usig LME Defiitio ad applicability Miiu requireets Test urpose Method of test Iitial coditios Test procedure Test procedure, reverberatio chaber ethod Test requireets Total Radiated Sesitivity (TRS) for TDD UE usig LME Defiitio ad applicability Miiu Requireets Test purpose Method of test Iitial coditios rocedure Test procedure, reverberatio chaber ethod Test requireets Total Radiated Sesitivity (TRS) for FDD UE usig LEE Defiitio ad applicability Miiu requireets Test urpose Method of test Iitial coditios Test procedure Test procedure, reverberatio chaber ethod Test requireets Total Radiated Sesitivity (TRS) for GSM MS usig LEE Defiitio ad applicability Miiu requireets Test urpose Method of test Iitial coditios Test procedure Test procedure, reverberatio chaber ethod Test requireets Total Radiated Sesitivity (TRS) for TDD UE usig LEE Defiitio ad applicability Miiu Requireets... 83

6 Release 6 TS 34.4 V.3.0 (0-) Test purpose Method of test Iitial coditios rocedure Test procedure, reverberatio chaber ethod Test requireets Aex A (orative): Test syste characterizatio A. hato specificatios A.. Head hato A.. Laptop Groud lae hato A. Aechoic chaber costraits A.. ositioer A.. Measureet Atea A..3 Quiet Zoe A..4 Shieldig effectiveess of the chaber A.3 Reverberatio chaber costraits A.3. ositioig ad ode stirrig facilities A.3. Measureet Ateas A.3.3 Chaber size ad characteristics A.3.4 Shieldig effectiveess of the chaber... 9 A.4 Ebedded Devices... 9 A.4. Notebook... 9 A.4. Tablet... 9 Aex B (orative): Calibratio B. Calibratio rocedure B. Calibratio rocedure Reverberatio Chaber Method B.. Measureet of S-paraeters through the chaber for a coplete stirrig sequece B.. Calculatio of the chaber referece trasfer fuctio B..3 Cable calibratio Aex C (orative): Measureet Test Report Aex D (orative): Maxiu ucertaity of Test Syste ad Test Toleraces D. Maxiu ucertaity of Test Syste D. Test toleraces (iforative) D.3 Derivatio of Test Requireets (iforative)... 0 Aex E (orative): Estiatio of Measureet Ucertaity E. Misatch ucertaity betwee easureet receiver ad the probe atea... E. FFS... E.3 Isertio loss of the probe atea cable... E.4 Isertio loss of the probe atea atteuator (if used)... E.5 Isertio loss of the RF relays (if used)... E.6 Ifluece of the atea cable... E.6. robe atea cable... E.6. Calibratio atea cable...

7 Release 7 TS 34.4 V.3.0 (0-) E.7 Absolute gai of the probe atea... E.8 Measureet Receiver: ucertaity of absolute level... E.9 Measureet distace... E.9. Offset of DUT phase cetre fro axis(es) of rotatio... 3 E.9. Mutual couplig... 3 E.9.3 hase curvature... 3 E.0 Quality of quiet zoe... 3 E. Tx-power drift of DUT... 4 E. Ucertaity related to the use of phato... 4 E.. Ucertaity fro usig differet types of SAM phato... 4 E.. Siulated tissue liquid ucertaity... 4 E..3 Device Holder... 4 E..4 Ucertaity of dielectric properties ad shape of the had phato... 5 E..5 Ucertaity fro usig differet types of Laptop Groud lae phato... 5 E.3 Coarse saplig grid... 5 E.4 Rado ucertaity... 6 E.5 Ucertaity of etwork aalyzer... 6 E.6 Ucertaity of the gai/efficiecy of the calibratio atea... 6 E.7 Base statio siulator: ucertaity of the absolute level... 7 E.8 BER easureet: output level step resolutio... 7 E.9 Statistical ucertaity of the BER easureet... 7 E.9. WCDMA... 7 E.9. GSM... 7 E.9.3 TD-SCDMA... 8

8 Release 8 TS 34.4 V.3.0 (0-) E.0 BER oralizatio ucertaity... 8 E. DUT sesitivity drift... 8 E. Cable loss easureet ucertaity... 8 E.3 Sigal geerator: ucertaity of the absolute output level... 9 E.4 Sigal geerator: output level stability... 9 E.5 Isertio loss: Calibratio atea feed cable... 9 E.6 Isertio loss: Calibratio atea atteuator (if used)... 9 E.6.A Chaber Statistical Ripple ad Repeatability... 9 E.6.B Additioal ower Loss i EUT Chassis... 0 E.7 Exaples of ucertaity budget calculatios for TR(Iforative)... 0 E.8 Exaples of ucertaity budget calculatios for TRS(Iforative)... 4 E.9 Exaples of ucertaity budget calculatios for TR, reverberatio chaber ethod (Iforative)... 8 E.30 Exaples of ucertaity budget calculatios for TRS, reverberatio chaber ethod (Iforative)... 3 Aex F (iforative): Suggested Recipes of Liquid to be used iside SAM hato... 3 Aex G (iforative): Aechoic Chaber Specificatios ad Validatio Method G. Shielded aechoic chaber specificatios G. Quiet Zoe reflectivity level validatio G.. Descriptio of a practical ethod for Quiet Zoe characterizatio G.3 FFS G.4 Stadard deviatio of electric field Aex G.A (iforative): Reverberatio Chaber Specificatios ad Validatio Method G.A. Shielded reverberatio chaber specificatios G.A. Reverberatio chaber statistical ripple ad repeatability validatio Aex H (iforative): Recoeded perforace H. Geeral H. Total Radiated ower H.3 Total Radiated Sesitivity Aex I (iforative): Bibliography... 4 Aex J (iforative): Chage history... 44

9 Release 9 TS 34.4 V.3.0 (0-) Foreword This Techical Specificatio has bee produced by the 3 rd Geeratio artership roject (). The cotets of the preset docuet are subject to cotiuig work withi the TSG ad ay chage followig foral TSG approval. Should the TSG odify the cotets of the preset docuet, it will be re-released by the TSG with a idetifyig chage of release date ad a icrease i versio uber as follows: Versio x.y.z where: x the first digit: preseted to TSG for iforatio; preseted to TSG for approval; 3 or greater idicates TSG approved docuet uder chage cotrol. y the secod digit is icreeted for all chages of substace, i.e. techical ehaceets, correctios, updates, etc. z the third digit is icreeted whe editorial oly chages have bee icorporated i the docuet. Scope The preset docuet describes the test procedure for the radiated perforaces easureets of the 3G/G user equipet/obile statios (UE/MS) i active ode i both the uplik ad the dowlik. The FDD UE test procedure is based o the test ethod developed as a result of COST 73 Sub-Workig Group (SWG). ebers cotributios. Backgroud work has also bee ade i the forer COST59 project. The TDD UE test procedure is based o the test ethod developed as a result of CCSA TC9 WG ebers cotributios. Backgroud work has bee ade i the forer CCSA TC9 project. The easureet procedure explaied i this docuet applies to UE/MS used uder the speech ode coditios that correspod to predefied positios for voice applicatio whe the hadset is held close to the user s head. This ethod is also applicable to free space easureets for UE/MS devices. The data trasfer positio (free space) explaied i this docuet applies whe the UE is used away fro the user s head. For LME ad LEE devices free space cofiguratio without head ad had phatos is applicable. Free space easureets are applicable to devices used i the data trasfer positio that cosist of the laptop outed equipet (LME) plug-i UEs ad laptop ebedded equipet (LEE) UEs. The tests apply to UEs ad laptops usig sigle or ultiple receive ateas. For GSM techology this is applicable to all MSs ad for 3G techology this is applicable to oe atea UEs ad RxDiversity UEs. The testig ethodology applies to ay sigle or ulti-ode (GSM / UMTS / TD-SCDMA) terials. The radio tests cosidered here are:. The easureet of the Total Radiated ower (TR). The easureet of the Total Radiated Sesitivity (TRS) The test procedure described i this docuet easures the perforace of the trasitter ad the receiver, icludig the atea ad also the effects of the user. The ajor parts of this test procedure are based o the 3-D patter easureet ethod. It has bee cosidered ecessary to defie soe ites ad copoets i the test procedure i detail, such as test chaels ad phato setups, i order to ake the testig i differet laboratories haroized. The procedure is, however, ot liited to soe specific atea chabers or positioers.

10 Release 0 TS 34.4 V.3.0 (0-) Refereces The followig docuets cotai provisios which, through referece i this text, costitute provisios of the preset docuet. Refereces are either specific (idetified by date of publicatio, editio uber, versio uber, etc.) or o-specific. For a specific referece, subsequet revisios do ot apply. For a o-specific referece, the latest versio applies. I the case of a referece to a docuet (icludig a GSM docuet), a o-specific referece iplicitly refers to the latest versio of that docuet i the sae Release as the preset docuet. [] TR 5.94 Techical Specificatio 3rd Geeratio artership roject; Techical Specificatio Group Radio Access Networks; Measureets of Radio erforaces for UMTS Terials i Speech Mode [] TS 5.0 Techical Specificatio 3rd Geeratio artership roject; Techical Specificatio Group Radio Access Networks; User Equipet (UE) radio trasissio ad receptio (FDD) [3] 34., 3rd Geeratio artership roject; Techical Specificatio Group Terials; Terial coforace specificatio; Radio trasissio ad receptio (FDD) [4] ETSI TR 00 08, aragraph D..3.6 [5] ETSI TR [6] ETSI TR [7] TR.905 "Vocabulary for Specificatios" [8] TR "Vocabulary" [9] TS " Mobile Statio (MS) coforace specificatio; art : Coforace specificatio " [0] TS "Coo Test Eviroets for User Equipet (UE) Coforace Testig". [] TS "Terial logical test iterface; Special coforace testig fuctios [] TS 5.44 "User Equipet (UE) ad Mobile Statio (MS) over the air perforace requireets" [3] TS 34. " Terial coforace specificatio; Radio trasissio ad receptio (TDD) " 3 Defiitios, sybols, abbreviatios ad equatios For the purposes of the preset docuet, the ters ad defiitios give i TR.905 [7], TR [8] ad the followig apply: 3. Sybols For the purposes of the preset docuet, the followig sybols apply: q f W G y (q,f,f) Zeith agle i the spherical co-ordiate syste Aziuth agle i the spherical co-ordiate syste Solid agle defied at the phase cetre of the DUT Atea gai patter i the y-polarizatio as fuctio of the spherical co-ordiates ad the carrier frequecy

11 Release TS 34.4 V.3.0 (0-) F tr Q y (q,f,f) db db kbps s MHz Carrier frequecy Trasitted power Agular power distributio i the y-polarizatio as fuctio of the spherical co-ordiates ad the carrier frequecy decibel db refereced to oe illiwatt eter illieter kilobit per secod illisecod egahertz 3. Abbreviatios For the purposes of the preset docuet, the followig abbreviatios apply: 3G 3 rd Geeratio 3G artership roject 3-D Three Diesioal AAU Aalborg Uiversity AD Agular ower Distributio ARFCN Absolute Radio Frequecy Chael Nuber BER Bit Error Ratio BS Base Statio BT Bluetooth CN Core Network CICH RSC Coo ilot Chael Received Sigal Code ower CRC Cyclic Redudacy Check DCH Dedicated Chael DL Dowlik DCH Dedicated hysical Chael DDCH Dedicated hysical Data Chael DCCH hysical Cotrol Chael DTCH Dedicated Traffic Chael DUT Device Uder Test EIR Effective Isotropic Radiated ower EIS Effective Isotropic Sesitivity ETSI Europea Telecouicatios Stadards Istitute FDD Frequecy Divisio Duplex FS Free Space GS Global ositioig Syste GSM Global Syste for Mobile couicatios HUT Helsiki Uiversity of Techology LEE Laptop Ebedded Equipet (e.g. ebedded odule card ebedded i otebooks) LME Laptop Mouted Equipet (e.g., plug-i devices like USB dogles) MS Mobile Statio NB Node B NSA Noralised Site Atteuatio OTA Over The Air QoS Quality of Service QSK Quadrature hase Shift Keyig (odulatio) RAB Radio Access Bearer RB Radio Bearer RAN Radio Access Network RBW Resolutio Badwidth RF Radio Frequecy RMS Root Mea Square Rx Receiver SAM Specific Athropoorphic Maequi SS Syste Siulator TDD Tie Divisio Duplex

12 Release TS 34.4 V.3.0 (0-) TFCI Tx TR TRS USB UTRA XD XR UD UL UE UMTS VBW Trasport Forat Cobiatio Idicator Trasitter Total Radiated ower Total Radiated Sesitivity (also: Total Isotropic Sesitivity) Uiversal Serial Bus UMTS Terrestrial Radio Access Cross-olar Discriiatio of the atea Cross-olarizatio ratio of the chael User Datagra rotocol Uplik User Equipet Uiversal Mobile Telecouicatios Syste Video Badwidth 4 Geeral The preset docuet describes test procedure for the radiated perforaces easureets of the 3G/G user equipet/obile statios (UE/MS) i active ode i both the up- ad the dowlik. The test procedure is based o TR 5.94 []. 4. Measureet frequecies The radiatio patters of hadset ateas ca be expected to be frequecy depedet, both i the size ad, to saller extet, i the shape of the patter. TR ad TRS shall be easured i 3 chaels i a frequecy bad, i.e. low, id ad high chaels. 4.. FDD frequecy bads UTRA/FDD is desiged to operate i the followig paired bads: Operatig Bad Table 4.: UTRA FDD frequecy bads UL Frequecies UE trasit, Node B receive DL frequecies UE receive, Node B trasit I MHz 0 70 MHz II MHz MHz III MHz MHz IV MHz 0-55 MHz V MHz MHz VI MHz MHz VII MHz MHz VIII MHz MHz IX MHz MHz X MHz 0 70 MHz XIX MHz MHz

13 Release 3 TS 34.4 V.3.0 (0-) Table 4.: UTRA FDD Chaels Operatig Bad UL Chaels DL Chaels Low Mid High Low Mid High I II III IV V VI VII VIII IX X XIX NOTE: Deployet i other frequecy bads is ot precluded. 4.. GSM frequecy bads Operatig Bad Table 4.3: GSM frequecy bads UL Frequecies MS trasit, BTS receive DL frequecies MS receive, BTS trasit GSM MHz MHz -GSM MHz MHz E-GSM MHz MHz DCS MHz MHz CS MHz MHz Operatig Bad Table 4.4: GSM Chaels Chaels Low Mid High GSM GSM E-GSM DCS CS TDD frequecy bads UTRA/TDD is desiged to operate i the followig bads:

14 Release 4 TS 34.4 V.3.0 (0-) Table 4.5: UTRA TDD frequecy bads Operatig Bad Frequecies a b* MHz MHz MHz MHz c* MHz d** e f MHz MHz MHz NOTE: Deployet i other frequecy bads is ot precluded. * Used i ITU Regio ** Used i ITU Regio Table 4.6: UTRA TDD Chaels Operatig Bad a MHz MHz b MHz Chaels Low Mid High MHz c MHz d MHz e MHz f MHz Trasitter erforace 5. Geeral This sectio specifies the test ethod ad test requireets for the radiated power easureet. There are two ethods described. The ai ethod is based o a aechoic chaber approach ad the alterative ethod is based o a reverberatio chaber approach. 5.. DUT positioig The DUT positioig o head phato eas that the easureets are perfored so that the DUT is placed agaist a SAM phato. The characteristics of the SAM phato are specified i Aex A... The DUT is attached to the SAM phato i cheek positio as defied i IEEE Std 58. The DUT perforace is easured o left ad right side of the head. The DUT positioig o laptop groud plae phato eas that a laptop groud plae phato is used for radiated perforace easureets i case of plug-i DUT like USB dogles that is used away fro the user s head. The DUT is coected to the USB coector of the laptop groud plae phato. The characteristics of the laptop groud plae phato are specified i Aex A... The objective of the laptop groud plae phato is to reproduce the effects of the groud plae for the atea of the DUT while avoidig the variatio of the easureets itroduced by a real

15 Release 5 TS 34.4 V.3.0 (0-) laptop. The DUT shall be plugged ito the USB coector ad positioed i accordace with the aufacturer recoeded priary echaical ode. I the absece of such a recoedatio the DUT with either the rotary USB porter or o-rotary USB porter should be horizotally plugged ito the horizotal USB coector. The DUT positioig i a free space cofiguratio without head ad had phatos as specified i Aex A.4 is used for radiated perforace easureets i case of ebedded odule card that is used away fro the user s head. 5.. Saplig grid A 5 -saple grid i both aziuth ad elevatio ca be cosidered sufficiet for accurate easureets. Geerally it ca be said that sice the radiatig object has a liited size the gai patter caot chage arbitrarily versus agle, ad therefore oly a liited uber of saples are required to represet the gai patter to a give accuracy. Alteratively, differet saplig patters ay be used, if they are able to esure sae or greater accuracy. The TR ca be calculated by iterpolatig the values to poits o the regular grid. If a alterative saplig patter is used uber of easureet poits should be greater tha i the regular saplig grid Nuber of idepedet saples (for reverberatio chaber procedure) Whe easurig the TR i a isotropic Rayleigh fadig eviroet, 00 idepedet saples ca be cosidered sufficiet for esurig a expaded accuracy better tha 0.5 db. 5. Total Radiated ower (TR) for FDD UE 5.. Defiitio ad applicability The Total Radiated ower (TR) is a easure of how uch power the DUT actually radiates. The TR is defied as the itegral of the power trasitted i differet directios over the etire radiatio sphere: ( EIR ( W; f ) + EIR ( W; f ) W TR = ò q j ) d 4p Where W is the solid agle describig the directio, f is frequecy. q ad j are the orthogoal polarizatios. EIR q ad Thus EIR j are the actually trasitted power-levels i correspodig polarizatios. TR» p NM N M åå - - [ EIRq ( q, j; f ) + EIRj ( q, j; f )] si( q) = 0 = 0 I these forulas N ad M are the uber of saplig itervals for theta ad phi. agles. The saplig itervals are discussed further i Sectio 5... q ad j are the easureet The TR ca also be calculated fro Rayleigh faded saples of the total power trasitted fro the UE/MS. The easureet of trasitter perforace i a isotropic Rayleigh fadig eviroet is based o saplig the radiated power of the UE/MS for a discrete uber of field cobiatios i the chaber. The average value of these statistically distributed saples is proportioal to the TR ad by calibratig the average power trasfer fuctio, a absolute value of the TR ca be obtaied. Thus TR æ N å ç =» è C N å = ( - R ) ref, ö ø

16 Release 6 TS 34.4 V.3.0 (0-) where ref, is the referece power trasfer fuctio for fixed easureet atea, R is the reflectio coefficiet for fixed easureet atea ad C is the path loss i the cables coectig the easureet receiver to fixed easureet atea. These paraeters are calculated fro the calibratio easureet ad are further discussed i Aex B.. is the average power easured by fixed easureet atea ad ca be calculated usig the followig expressio: = M å = S,, M S,, where is saple uber of the coplex trasfer fuctio easured with fixed easureet atea ad M is the total uber of saples easured for each fixed easureet atea. Note that all averagig ust be perfored usig liear power values (e.g. easureets i Watts). The requireets ad this test apply to all types of UTRA for the FDD UE for Release 7 ad later releases. 5.. Miiu Requireets The average TR of low, id ad high chael i beside head positio shall be higher tha iiu perforace requireets for roaig bads show i Table 5... The averagig shall be doe i liear scale for the TR results of both right ad left side of the phato head. TR average left _ low 0 left _ id /0 left _ high /0 right _ low /0 right _ id /0 é = 0logê ë 6 / right _ high /0 I additio the iiu TR of each easured chael i beside head positio shall be higher tha iiu perforace requireets show i the colus Mi. TR [,,,, ] i = i left _ low left _ id left _ high right _ low right _ id, right _ high Table 5.. TR iiu perforace requireet for FDD roaig bads i the speech positio ad the priary echaical ode Operatig bad ower Class ower (db) ower Class ower (db) ower Class 3 ower Class 3bis ower Class 4 ower (db) ower (db) ower (db) Average Mi Average Mi Average Mi I II III IV V VI VII VIII IX XIX NOTE: Applicable for dual-ode GSM/UMTS. ù ú û The orative referece for this clause is TS5.44 sectio 6...

17 Release 7 TS 34.4 V.3.0 (0-) 5..3 Test purpose The purpose of this test is to verify that TR average ad TRi of the UE is ot below specified values. A lower TR average ad TRi decrease the coverage area Method of test Iitial coditios The output power is a easure of the axiu power the UE ca trasit i a badwidth of at least (+ a) ties the chip rate of the radio access ode, for ore iforatio see TS 34. chapter 5.. The period of easureet shall be at least oe tieslot. Also care should be take that the oise floor of the easureet receiver is ot disturbig the power easureet. Test eviroet: oral; see TS34.- [3] clause G... Frequecies to be tested: low rage, id rage, high rage; see TS34.- [3] clause G..4. ) Set the SS dowlik physical chaels accordig to settigs i Table 5... Set the DCH power such that there will ot be trasissio gaps due to too low sigal stregth throughout the easureet. ) ower o the UE. 3) A call is set up accordig to the Geeric call setup procedure. The power cotrol algorith shall be set to ower Cotrol Algorith. Copressed ode shall be set to OFF. 4) Eter the UE ito loopback test ode ad start the loopback test. See TS [0] ad TS [] for details regardig geeric call setup procedure ad loopback test. Table 5..: Dowlik hysical Chaels trasitted durig a coectio hysical Chael ower CICH CICH_Ec / DCH_Ec = 7 db -CCCH -CCCH_Ec / DCH_Ec = 5 db SCH SCH_Ec / DCH_Ec = 5 db ICH ICH_Ec / DCH_Ec = db DCH Test depedet power rocedure ) Sed cotiuously Up power cotrol coads to the UE. ) As the UE reaches axiu power, start sedig N5 data patter. 3) ositio the UE agaist the SAM phato EIR ad EIR j with a saple step of 5 i theta (q) ad phi (f) directios usig a test syste havig characteristics as described i Aex A. 4) Measure the q 5) Calculate TR usig equatios fro chapter 5.. NOTE : The easureet procedure is based o the easureet of the spherical radiatio patter of the DUT. The power radiated by the DUT is sapled i far field i a group of poits located o a spherical surface eclosig the DUT. The EIR saples are take usig a costat saple step of 5 both i theta (q) ad phi (f) directios. I soe cases a differet saplig grid ay be used to speed up the easureets (See Sectio 5..). All the EIR saples are take with two orthogoal polarizatios, q - ad j - polarisatios.

18 Release 8 TS 34.4 V.3.0 (0-) NOTE : The oise floor of the easureet receiver shall ot disturb the power easureet. NOTE 3: No Stadard settigs: To speed up sesitivity easureets, power easureets ay be doe with o stadard odulatio. However to obtai TR result the easured EIR figures shall be oralized by DEIR = å( EIRstd i - EIRstd i ) i= where EIRstd is power easureet doe with stadard settig. i o stadard odulatio. is aout of referece easureet poits. EIRstd i is power easureet doe with To esure accuracy of TR, the aout of referece poits easured should be at least 4. It is recoeded to spread the referece easureets equally durig the easureet tie rocedure, reverberatio chaber ethod ) Sed cotiuously Up power cotrol coads to the UE. ) As the UE reaches axiu power, start sedig N5 data patter. 3) ositio the UE agaist the SAM phato 4) Measure a sufficiet uber of idepedet saples (see sectio 5..3) of, usig a test syste havig characteristics as described i Aex A. 5) Calculate TR usig equatios fro sectio 5... NOTE : The easureet procedure is based o the easureet of the total power radiated fro the UE/MS to a full 3 diesioal isotropic eviroet with uifor elevatio ad aziuth field distributio. The power trasitted by the DUT is udergoig Rayleigh fadig ad is sapled by the fixed easureet ateas. Moreover, it is iportat that the saples collected are idepedet, i order to get sufficiet accuracy of the estiated TR value. S, NOTE : The oise floor of the easureet receiver shall ot disturb the power easureet Test requireets The average TR of low, id ad high chael i beside head positio shall be higher tha test perforace requireets for roaig bads show i Table The averagig shall be doe i liear scale for the TR results of both right ad left side of the phato head. TR average left _ low 0 left _ id /0 left _ high /0 right _ low /0 right _ id /0 é = 0logê ë 6 / right _ high /0 I additio the iiu TR of each easured chael i beside head positio shall be higher tha iiu perforace requireets show i the colus Mi. TR [,,,, ] i = i left _ low left _ id left _ high right _ low right _ id, right _ high Table 5..3 TR test requireet for FDD roaig bads i the speech positio ad the priary echaical ode ù ú û Operatig bad ower Class ower (db) ower Class ower (db) ower Class 3 ower Class 3bis ower Class 4 ower (db) ower (db) ower (db) Average Mi Average Mi Average Mi

19 Release 9 TS 34.4 V.3.0 (0-) I II III IV V VI VII VIII IX XIX NOTE: Applicable for dual-ode GSM/UMTS. NOTE: If the above Test Requireet differs fro the Miiu Requireet the the Test Tolerace applied for this test is o-zero. The Test Tolerace for this test is defied ad the explaatio of how the Miiu Requireet has bee relaxed by the Test Tolerace is give i Aex D. 5.3 Total Radiated ower (TR) for GSM MS 5.3. Defiitio ad applicability The Total Radiated ower (TR) is a easure of how uch power the DUT actually radiates. The TR is defied as the itegral of the power trasitted i differet directios over the etire radiatio sphere: ( EIR ( W; f ) + EIR ( W; f ) W TR = ò q j ) d 4p Where W is the solid agle describig the directio, f is frequecy. q ad j are the orthogoal polarizatios. EIR q ad Thus EIR j are the actually trasitted power-levels i correspodig polarizatios. TR» p NM N M åå - - [ EIRq ( q, j; f ) + EIRj ( q, j; f )] si( q) = 0 = 0 I these forulas N ad M are the uber of saplig itervals for theta ad phi. agles. The saplig itervals are discussed further i Sectio 5... q ad j are the easureet The TR ca also be calculated fro Rayleigh faded saples of the total power trasitted fro the UE/MS. The easureet of trasitter perforace i a isotropic Rayleigh fadig eviroet is based o saplig the radiated power of the UE/MS for a discrete uber of field cobiatios i the chaber. The average value of these statistically distributed saples is proportioal to the TR ad by calibratig the average power trasfer fuctio, a absolute value of the TR ca be obtaied. Thus TR where æ N å ç =» è C N å = ( - R ) ref, ö ø ref, is the referece power trasfer fuctio for fixed easureet atea, R is the reflectio coefficiet for fixed easureet atea ad C is the path loss i the cables coectig the easureet receiver to fixed easureet atea. These paraeters are calculated fro the calibratio easureet ad are further discussed i Aex B.. is the average power easured by fixed easureet atea ad ca be calculated usig the followig expressio:

20 Release 0 TS 34.4 V.3.0 (0-) = M å = S,, M S,, where is saple uber of the coplex trasfer fuctio easured with fixed easureet atea ad M is the total uber of saples easured for each fixed easureet atea. The requireets ad this test apply to all types of MS that support GSM for Release 7 ad later releases Miiu Requireets The average TR of low, id ad high chael i beside head positio shall be higher tha iiu perforace requireets for roaig bads show i Table The averagig shall be doe i liear scale for the TR results of both right ad left side of the phato head. TR average left _ low 0 left _ id /0 left _ high /0 right _ low /0 right _ id /0 é = 0logê ë 6 / right _ high /0 I additio the iiu TR of each easured chael i beside head positio shall be higher tha iiu perforace requireets show i the colus Mi. TR [,,,, ] i = i left _ low left _ id left _ high right _ low right _ id, right _ high Table 5.3.: TR iiu requireet for GSM roaig bads i the speech positio ad the priary echaical ode Operatig bad ower Class ower Class ower Class 3 ower Class 4 ower Class 5 ower (db) ower (db) ower (db) ower (db) ower (db) Average Mi Average Mi Average Mi Average Mi Average Mi GSM GSM DCS CS Note: applicable for dual-ode GSM/UMTS. ù ú û The orative referece for this clause is TS5.44 sectio Test purpose The purpose of this test is to verify that TR average ad TR i of the MS is ot below specified values. A lower TR average ad TRi decrease the coverage area Method of test Iitial coditios A call is set up by the SS accordig to the geeric call set up procedure o a chael with ARFCN i the Mid ARFCN rage, power cotrol level set to Max power. MS TXWR_MAX_CCH is set to the axiu value supported by the ower Class of the Mobile uder test. The SS seds Stadard Test Sigal C; see TS5.00- [9] Aex A5.. The dowlik power is set such that there will ot be trasissio gaps due to too low sigal stregth throughout the easureet Test eviroet: oral coditio; see TS5.00- [9] Aex A...

21 Release TS 34.4 V.3.0 (0-) rocedure ) ositio the MS agaist the SAM phato EIR ad EIR j with a saple step of 5 i theta (q) ad phi (f) directios usig a test syste havig characteristics as described i Aex A. ) Measure the q 3) Calculate TR usig equatios fro chapter ) Test steps to 3 is repeated for ARFCN i the low ad high rage NOTE : Measureet of oral burst trasitter output power. The SS takes power easureet saples evely distributed over the duratio of oe burst with a saplig rate of at least /T, where T is the bit duratio. The saples are idetified i tie with respect to the odulatio o the burst. The SS idetifies the cetre of the useful 47 trasitted bits, i.e. the trasitio fro bit 3 to bit 4 of the idable, as the tiig referece NOTE : The easureet procedure is based o the easureet of the spherical radiatio patter of the DUT. The power radiated by the DUT is sapled i far field i a group of poits located o a closed surface eclosig the DUT. The EIR saples are take usig a costat saple step of 5 both i theta (q) ad phi (f) directios. I soe cases a differet saplig grid ca be used to speed up the easureets (See Sectio 5..). All the EIR saples are take with two orthogoal polarizatios, q - ad j - polarisatios. NOTE 3: The oise floor of the easureet receiver shall ot disturb the power easureet. NOTE 4: No Stadard settigs: To speed up sesitivity easureets, power easureets ca be doe with o stadard odulatio. However to obtai TR result the easured EIR figures shall be oralized by DEIR = å( EIRstd i - EIRstd i ) i= where EIRstd is power easureet doe with stadard settig. i o stadard odulatio. is aout of referece easureet poits. EIRstd i is power easureet doe with To esure accuracy of TR, the aout of referece poits easured should be at least 4. It is recoeded to spread the referece easureets equally durig the easureet tie rocedure, reverberatio chaber ethod ) ositio the UE agaist the SAM phato ) Measure a sufficiet uber of idepedet saples (see sectio 5..3) of, usig a test syste havig the characteristics described i Aex A. 3) Calculate TR usig equatios fro sectio ) Test steps to 3 is repeated for ARFCN i the low ad high rage NOTE : Measureet of oral burst trasitter output power. The SS takes power easureet saples evely distributed over the duratio of oe burst with a saplig rate of at least /T, where T is the bit duratio. The saples are idetified i tie with respect to the odulatio o the burst. The SS idetifies the cetre of the useful 47 trasitted bits, i.e. the trasitio fro bit 3 to bit 4 of the idable, as the tiig referece NOTE : The easureet procedure is based o the easureet of the total power radiated fro the UE/MS to a full 3 diesioal isotropic eviroet with uifor elevatio ad aziuth field distributio. The power trasitted by the DUT is udergoig Rayleigh fadig ad is sapled by the fixed easureet ateas. Moreover, it is iportat that the saples collected are idepedet, i order to get sufficiet accuracy of the estiated TR value. S, NOTE 3: The oise floor of the easureet receiver shall ot disturb the power easureet.

22 Release TS 34.4 V.3.0 (0-) Test requireets The average TR of low, id ad high chael i beside head positio shall be higher tha test perforace requireets for roaig bads show i Table The averagig shall be doe i liear scale for the TR results of both right ad left side of the phato head. TR average left _ low 0 left _ id /0 left _ high /0 right _ low /0 right _ id /0 é = 0logê ë 6 / right _ high /0 I additio the iiu TR of each easured chael i beside head positio shall be higher tha iiu perforace requireets show i the colus Mi. TR [,,,, ] i = i left _ low left _ id left _ high right _ low right _ id, right _ high Table 5.3.: TR test requireet for GSM roaig bads i the speech positio ad the priary echaical ode Operatig bad ower Class ower Class ower Class 3 ower Class 4 ower Class 5 ower (db) ower (db) ower (db) ower (db) ower (db) Average Mi Average Mi Average Mi Average Mi Average Mi GSM GSM E-GSM DCS CS Note : Applicable for dual-ode GSM/UMTS. Note : The test requireets for E-GSM 900 ad -GSM 900 are specified fro GSM 900 iiu requireets i table ù ú û NOTE: If the above Test Requireet differs fro the Miiu Requireet the the Test Tolerace applied for this test is o-zero. The Test Tolerace for this test is defied ad the explaatio of how the Miiu Requireet has bee relaxed by the Test Tolerace is give i Aex D. 5.4 Total Radiated ower (TR) for TDD UE 5.4. Defiitio ad applicability The Total Radiated ower (TR) is a easure of how uch power the DUT actually radiates. The TR is defied as the itegral of the power trasitted i differet directios over the etire radiatio sphere: TR = ò ( EIRq ( W; f ) + EIRj ( W; f )) dw 4p Where Ω is the solid agle describig the directio, f is frequecy. q adj are the orthogoal polarizatios. EIRq ad Thus EIRj are the actually trasitted power-levels i correspodig polarizatios. TR» p NM N M åå - - [ EIRq ( q, j; f ) + EIRj ( q, j; f )] si( q) = 0 = 0 I these forulas N ad M are the uber of saplig itervals for theta ad phi. agles. The saplig itervals are discussed further i Sectio 5... q adj are the easureet The TR ca also be calculated fro Rayleigh faded saples of the total power trasitted fro the UE/MS. The easureet of trasitter perforace i a isotropic Rayleigh fadig eviroet is based o saplig the radiated

23 Release 3 TS 34.4 V.3.0 (0-) power of the UE/MS for a discrete uber of field cobiatios i the chaber. The average value of these statistically distributed saples is proportioal to the TR ad by calibratig the average power trasfer fuctio, a absolute value of the TR ca be obtaied. Thus TR where æ N å ç =» è C N å = ( - R ) ref, ö ø ref, is the referece power trasfer fuctio for fixed easureet atea, R is the reflectio coefficiet for fixed easureet atea ad C is the path loss i the cables coectig the easureet receiver to fixed easureet atea. These paraeters are calculated fro the calibratio easureet ad are further discussed i Aex B.. is the average power easured by fixed easureet atea ad ca be calculated usig the followig expressio: = M å = S,, M S,, where is saple uber of the coplex trasfer fuctio easured with fixed easureet atea ad M is the total uber of saples easured for each fixed easureet atea. The requireets ad this test apply to all types of UTRA for the TDD UE for Release 8 ad later releases Miiu Requireets The average TR of low, id ad high chael i beside head positio shall be higher tha iiu perforace requireets for roaig bads show i Table The averagig shall be doe i liear scale for the TR results of both right ad left side of the phato head. TR average left _ low 0 left _ id /0 left _ high /0 right _ low /0 right _ id /0 é = 0logê ë 6 / right _ high /0 I additio the iiu TR of each easured chael i beside head positio shall be higher tha iiu perforace requireets show i the colus Mi. TR [,,,, ] i = i left _ low left _ id left _ high right _ low right _ id, right _ high Table 5.4.: TR iiu perforace requireet for UTRA LCR TDD roaig bads i the speech positio ad the priary echaical ode Operati g bad Note: ower Class ower Class ower Class 3 ower Class 4 ower (db) ower (db) ower (db) ower (db) Average Mi Average Mi Average Mi Average Mi a b - - TBD TBD c - - TBD TBD d - - TBD TBD e f Applicable for dual-ode GSM/UTRA LCR TDD. ù ú û

24 Release 4 TS 34.4 V.3.0 (0-) The orative referece for this clause is TS 5.44 sectio Test purpose The purpose of this test is to verify that TR average ad TR i decrease the coverage area. TRaverage ad TRi of the UE are ot below specified values. A lower Method of test Iitial coditios The output power is a easure of the axiu power the UE ca trasit i a badwidth of at least (+ a) ties the chip rate of the radio access ode, for ore iforatio see TS 34. chapter 5.. The period of easureet shall be at least oe tieslot. Also care should be take that the oise floor of the easureet receiver is ot disturbig the power easureet. Norally, the receivig device should be set accordigly so that the receivig sigal will be at least 30dB higher tha the syste oise floor. Test eviroet: oral; see TS34.- [3] clause G... Frequecies to be tested: low rage, id rage, high rage; see TS34.- [3] clause G..4. ) Set the SS dowlik physical chaels paraeters. Set the DCH power such that there will ot be trasissio gaps due to too low sigal stregth throughout the easureet. ) ower o the UE. 3) A call is set up accordig to the Geeric call setup procedure. The power cotrol algorith shall be set to ower Cotrol Algorith. 4) Eter the UE ito loopback test ode ad start the loopback test. 5) The easureet receiver shall be set to: zero spa, video trigger ad RMS detector. The RBW shall be at least (+ a) ties the chip rate of the radio access ode ad the VBW at least 3 ties bigger tha the RBW. For.8Mcps TDD UE, the RBW shall be set to 3MHz, ad VBW shall be set to 0MHz. See TS [0] ad TS [] for details regardig geeric call setup procedure ad loopback test rocedure ) Sed cotiuously Up power cotrol coads to the UE. ) As the UE reaches axiu power, start sedig N5 data patter. 3) ositio the UE agaist the SAM phato. 4) Measure the EIR θ ad EIR φwith a saple step of 5 i theta (θ) ad phi (φ) directios usig a test syste havig characteristics as described i Aex A. 5) Calculate TR usig equatios fro chapter NOTE : The easureet procedure is based o the easureet of the spherical radiatio patter of the DUT. The power radiated by the DUT is sapled i far field i a group of poits located o a spherical surface eclosig the DUT. The EIR saples are take usig a costat saple step of 5 both i theta (θ) ad phi (φ) directios. I soe cases a differet saplig grid ay be used to speed up the easureets (See Sectio 5..). All the EIR saples are take with two orthogoal polarizatios, θ- ad φ - polarizatios. NOTE : The oise floor of the easureet receiver shall ot disturb the power easureet.

25 Release 5 TS 34.4 V.3.0 (0-) NOTE 3: No Stadard settigs: To speed up sesitivity easureets, power easureets ay be doe with o stadard odulatio. However to obtai TR result the easured EIR figures shall be oralized by DEIR = å( EIRstd i - EIRstd i ) i= where i EIRstd i is power easureet doe with stadard settig. EIRstd i is power easureet doe with o stadard odulatio. is aout of referece easureet poits. To esure accuracy of TR, the aout of referece poits easured should be at least 4. It is recoeded to spread the referece easureets equally durig the easureet tie rocedure, reverberatio chaber ethod ) Sed cotiuously Up power cotrol coads to the UE. ) As the UE reaches axiu power, start sedig N5 data patter. 3) ositio the UE agaist the SAM phato 4) Measure a sufficiet uber of idepedet saples (see sectio 5..3) of, usig a test syste havig the characteristics described i Aex A. 5) Calculate TR usig equatios fro sectio NOTE : The easureet procedure is based o the easureet of the total power radiated fro the UE/MS to a full 3 diesioal isotropic eviroet with uifor elevatio ad aziuth field distributio. The power trasitted by the DUT is udergoig Rayleigh fadig ad is sapled by the fixed easureet ateas. Moreover, it is iportat that the saples collected are idepedet, i order to get sufficiet accuracy of the estiated TR value. S, NOTE : The oise floor of the easureet receiver shall ot disturb the power easureet Test requireets The average TR of low, id ad high chael i beside head positio shall be higher tha test perforace requireets for roaig bads show i Table The averagig shall be doe i liear scale for the TR results of both right ad left side of the phato head. TR average left _ low 0 left _ id /0 left _ high /0 right _ low /0 right _ id /0 é = 0logê ë 6 / right _ high /0 I additio the iiu TR of each easured chael i beside head positio shall be higher tha iiu perforace requireets show i the colus Mi. TR [,,,, ] i = i left _ low left _ id left _ high right _ low right _ id, right _ high ù ú û

26 Release 6 TS 34.4 V.3.0 (0-) Table 5.4.: TR test perforace requireet for UTRA LCR TDD roaig bads i the speech positio ad the priary echaical ode Operati g bad Note: ower Class ower Class ower Class 3 ower Class 4 ower (db) ower (db) ower (db) ower (db) Average Mi Average Mi Average Mi Average Mi a b - - TBD TBD c - - TBD TBD d - - TBD TBD e f Applicable for dual-ode GSM/UTRA LCR TDD. NOTE: If the above Test Requireet differs fro the Miiu Requireet the the Test Tolerace applied for this test is o-zero. The Test Tolerace for this test is defied ad the explaatio of how the Miiu Requireet has bee relaxed by the Test Tolerace is give i Aex D. 5.5 Total Radiated ower (TR) for FDD UE usig LME Editor s ote: This test case is icoplete. The followig aspects are either issig or ot yet deteried: The TR Miiu erforace Requireet for this test are udefied The Test Requireets ad related Test Toleraces applicable for this test are udefied 5.5. Defiitio ad applicability The Total Radiated ower (TR) is a easure of how uch power the DUT actually radiates. The TR is defied as the itegral of the power trasitted i differet directios over the etire radiatio sphere: ( EIR ( W; f ) + EIR ( W; f ) W TR = ò q j ) d 4p Where W is the solid agle describig the directio, f is frequecy. q ad j are the orthogoal polarizatios. EIR q ad Thus EIR j are the actually trasitted power-levels i correspodig polarizatios. TR» p NM N M åå - - [ EIRq ( q, j; f ) + EIRj ( q, j; f )] si( q) = 0 = 0 I these forulas N ad M are the uber of saplig itervals for theta ad phi. agles. The saplig itervals are discussed further i Sectio 5... q ad j are the easureet The TR ca also be calculated fro Rayleigh faded saples of the total power trasitted fro the LME. The easureet of trasitter perforace i a isotropic Rayleigh fadig eviroet is based o saplig the radiated power of the LME for a discrete uber of field cobiatios i the chaber. The average value of these statistically distributed saples is proportioal to the TR ad by calibratig the average power trasfer fuctio, a absolute value of the TR ca be obtaied. Thus

27 Release 7 TS 34.4 V.3.0 (0-) TR æ N å ç =» è C N å = ( - R ) ref, ö ø where ref, is the referece power trasfer fuctio for fixed easureet atea, R is the reflectio coefficiet for fixed easureet atea ad C is the path loss i the cables coectig the easureet receiver to fixed easureet atea. These paraeters are calculated fro the calibratio easureet ad are further discussed i Aex B.. is the average power easured by fixed easureet atea ad ca be calculated usig the followig expressio: = M å = S,, M S,, where is saple uber of the coplex trasfer fuctio easured with fixed easureet atea ad M is the total uber of saples easured for each fixed easureet atea. The requireets ad this test apply to all types of UTRA for the FDD UE for Release ad later releases that support LME. NOTE: This test case ca be optioally executed for Release 7 ad oward UE s supportig LME feature Miiu Requireets The average TR of low, id ad high chael shall be higher tha iiu perforace requireets for roaig bads show i Table The averagig shall be doe i liear scale for the TR results. TR average é low 0 id / = 0 logê ë 3 / high /0 ù ú û I additio the iiu TR of each easured chael shall be higher tha iiu perforace requireets show i the colus Mi. TR = /0 low /0 /0 id high [ (,0, )] i 0 log i 0 0 Table 5.5.: TR iiu perforace requireet for FDD LME devices i the data trasfers positio Operatig bad ower Class ower Class ower Class 3 ower Class 3bis ower Class 4 ower (db) ower (db) ower (db) ower (db) ower (db) Average Mi Average Mi Average Mi I - - TBD TBD TBD TBD TBD TBD II - - TBD TBD TBD TBD TBD TBD III - - TBD TBD TBD TBD TBD TBD IV - - TBD TBD TBD TBD TBD TBD V - - TBD TBD TBD TBD TBD TBD VI - - TBD TBD TBD TBD TBD TBD VII - - TBD TBD TBD TBD TBD TBD VIII - - TBD TBD TBD TBD TBD TBD IX - - TBD TBD TBD TBD TBD TBD XIX - - TBD TBD TBD TBD TBD TBD NOTE : Applicable for dual-ode GSM/UMTS. NOTE : Applicable for USB plug-i devices.

28 Release 8 TS 34.4 V.3.0 (0-) The orative referece for this clause is TS5.44 [] sectio Test purpose The purpose of this test is to verify that TR average ad TRi of the UE is ot below specified values. A lower TR average ad TRi decrease the coverage area Method of test Iitial coditios The output power is a easure of the axiu power the UE ca trasit i a badwidth of at least (+ a) ties the chip rate of the radio access ode, for ore iforatio see TS 34.- [3] clause 5.. The period of easureet shall be at least oe tieslot. Also care should be take that the oise floor of the easureet receiver is ot disturbig the power easureet. Test eviroet: oral; see TS 34.- [3] clause G... Frequecies to be tested: low rage, id rage, high rage; see TS 34.- [3] clause G..4. ) Set the SS dowlik physical chaels accordig to settigs i Table Set the DCH power such that there will ot be trasissio gaps due to too low sigal stregth throughout the easureet. ) Coect the plug-i UE to a laptop groud plae phato. ower o the plug-i UE. The real fuctioal laptop supplies power to the plug-i UE. 3) A call is set up accordig to the Geeric call setup procedure. The power cotrol algorith shall be set to ower Cotrol Algorith. Copressed ode shall be set to OFF. 4) Eter the UE ito loopback test ode ad start the loopback test. See TS [0] ad TS [] for details regardig geeric call setup procedure ad loopback test. Table 5.5.: Dowlik hysical Chaels trasitted durig a coectio hysical Chael ower CICH CICH_Ec / DCH_Ec = 7 db -CCCH -CCCH_Ec / DCH_Ec = 5 db SCH SCH_Ec / DCH_Ec = 5 db ICH ICH_Ec / DCH_Ec = db DCH Test depedet power rocedure ) Sed cotiuously Up power cotrol coads to the plug-i UE. ) As the plug-i UE reaches axiu power, start sedig N5 data patter. 3) ositio the plug-i UE ito the USB coector i accordace with the aufacturer recoeded priary echaical ode. I the absece of such a recoedatio positio the plug-i UE so that it is horizotally plugged ito the horizotal USB coector. EIR ad EIR j with a saple step of 5 i theta (q) ad phi (f) directios usig a test syste havig characteristics as described i Aex A. 4) Measure the q 5) Calculate TR usig equatios fro clause 5.5.

29 Release 9 TS 34.4 V.3.0 (0-) NOTE : The easureet procedure is based o the easureet of the spherical radiatio patter of the DUT. The power radiated by the DUT is sapled i far field i a group of poits located o a spherical surface eclosig the DUT. The EIR saples are take usig a costat saple step of 5 both i theta (q) ad phi (f) directios. I soe cases a differet saplig grid ay be used to speed up the easureets (See Sectio 5..). All the EIR saples are take with two orthogoal polarizatios, q - ad j - polarisatios. NOTE : The oise floor of the easureet receiver shall ot disturb the power easureet. NOTE 3: No Stadard settigs: To speed up sesitivity easureets, power easureets ay be doe with o stadard odulatio. However to obtai TR result the easured EIR figures shall be oralized by DEIR = å( EIRstd i - EIRstd i ) i= where EIRstd is power easureet doe with stadard settig. i o stadard odulatio. is aout of referece easureet poits. EIRstd i is power easureet doe with To esure accuracy of TR, the aout of referece poits easured should be at least 4. It is recoeded to spread the referece easureets equally durig the easureet tie rocedure, reverberatio chaber ethod ) Sed cotiuously Up power cotrol coads to the plug-i UE. ) As the plug-i UE reaches axiu power, start sedig N5 data patter. 3) ositio the plug-i UE ito the USB coector i accordace with the aufacturer recoeded priary echaical ode. I the absece of such a recoedatio positio the plug-i UE so that it is horizotally plugged ito the horizotal USB coector. 4) Measure a sufficiet uber of idepedet saples (see sectio 5..3) of, usig a test syste havig characteristics as described i Aex A. 5) Calculate TR usig equatios fro clause NOTE : The easureet procedure is based o the easureet of the total power radiated fro the UE/MS to a full 3 diesioal isotropic eviroet with uifor elevatio ad aziuth field distributio. The power trasitted by the DUT is udergoig Rayleigh fadig ad is sapled by the fixed easureet ateas. Moreover, it is iportat that the saples collected are idepedet, i order to get sufficiet accuracy of the estiated TR value. S, NOTE : The oise floor of the easureet receiver shall ot disturb the power easureet Test requireets The average TR of low, id ad high chael shall be higher tha test perforace requireets for roaig bads show i Table The averagig shall be doe i liear scale for the TR. TR average é low 0 id / = 0 logê ë 3 / high /0 ù ú û I additio the iiu TR of each easured chael shall be higher tha iiu perforace requireets show i the colus Mi. TR = /0 low /0 /0 id high [ (,0, )] i 0 log i 0 0

30 Release 30 TS 34.4 V.3.0 (0-) Table 5.5.3: TR test requireet for FDD LME devices i the data trasfers positio Operatig ower Class ower Class ower Class 3 ower Class 3bis ower Class 4 bad ower (db) ower (db) ower (db) ower (db) ower (db) Average Mi Average Mi Average Mi I - - TBD +TT TBD +TT TBD +TT TBD +TT TBD +TT TBD +TT II - - TBD +TT TBD +TT TBD +TT TBD +TT TBD +TT TBD +TT III - - TBD +TT TBD +TT TBD +TT TBD +TT TBD +TT TBD +TT IV - - TBD +TT TBD +TT TBD +TT TBD +TT TBD +TT TBD +TT V - - TBD +TT TBD +TT TBD +TT TBD +TT TBD +TT TBD +TT VI - - TBD +TT TBD +TT TBD +TT TBD +TT TBD +TT TBD +TT VII - - TBD +TT TBD +TT TBD +TT TBD +TT TBD +TT TBD +TT VIII - - TBD +TT TBD +TT TBD +TT TBD +TT TBD +TT TBD +TT IX - - TBD +TT TBD TBD +TT TBD TBD +TT TBD +TT XIX - - TBD +TT TBD +TT NOTE : Applicable for dual-ode GSM/UMTS. NOTE : Applicable for USB plug-i devices. TBD +TT +TT TBD +TT TBD +TT +TT TBD +TT NOTE: If the above Test Requireet differs fro the Miiu Requireet the the Test Tolerace applied for this test is o-zero. The Test Tolerace for this test is defied ad the explaatio of how the Miiu Requireet has bee relaxed by the Test Tolerace is give i Aex D. 5.6 Total Radiated ower (TR) for GSM MS usig LME Editor s ote: This test case is ot copleted Miiu Requireets are issig Test requireets ad related TT are issig 5.6. Defiitio ad applicability The Total Radiated ower (TR) is a easure of how uch power the DUT actually radiates. The TR is defied as the itegral of the power trasitted i differet directios over the etire radiatio sphere: ( EIR ( W; f ) + EIR ( W; f ) W TR = ò q j ) d 4p Where W is the solid agle describig the directio, f is frequecy. q ad j are the orthogoal polarizatios. EIR q ad Thus EIR j are the actually trasitted power-levels i correspodig polarizatios. TR» p NM N M åå - - [ EIRq ( q, j; f ) + EIRj ( q, j; f )] si( q) = 0 = 0 I these forulas N ad M are the uber of saplig itervals for theta ad phi. agles. The saplig itervals are discussed further i Sectio 5... q ad j are the easureet

31 Release 3 TS 34.4 V.3.0 (0-) The TR ca also be calculated fro Rayleigh faded saples of the total power trasitted fro the LME. The easureet of trasitter perforace i a isotropic Rayleigh fadig eviroet is based o saplig the radiated power of the LME for a discrete uber of field cobiatios i the chaber. The average value of these statistically distributed saples is proportioal to the TR ad by calibratig the average power trasfer fuctio, a absolute value of the TR ca be obtaied. Thus where TR æ N å ç =» è C N å = ( - R ) ref, ref, is the referece power trasfer fuctio for fixed easureet atea, ö ø R is the reflectio coefficiet for fixed easureet atea ad C is the path loss i the cables coectig the easureet receiver to fixed easureet atea. These paraeters are calculated fro the calibratio easureet ad are further discussed i Aex B.. is the average power easured by fixed easureet atea ad ca be calculated usig the followig expressio: = M å = S,, M S,, where is saple uber of the coplex trasfer fuctio easured with fixed easureet atea ad M is the total uber of saples easured for each fixed easureet atea. The requireets ad this test apply to all types of LME that support GSM for Release ad later releases. NOTE: This test case ca be optioally executed for Release 7 ad oward MS s supportig LME feature Miiu Requireets The average TR of low, id ad high chael of the LME i the data trasfers positio shall be higher tha iiu perforace requireets for roaig bads show i Table The averagig shall be doe i liear scale for the TR results. TR average é low 0 id / = 0logê êë 3 / high /0 ù ú úû I additio the iiu TR of each easured chael i the data trasfers positio shall be higher tha iiu perforace requireets show i the colus Mi. [, ] TR i, i = Table 5.6.: TR iiu perforace requireet for GSM LME devices i the data trasfers positio Operatig bad low id high ower Class ower Class ower Class 3 ower Class 4 ower Class 5 ower (db) ower (db) ower (db) ower (db) ower (db) Average Mi Average Mi Average Mi Average Mi Average Mi GSM TBD TBD - - GSM TBD TBD - - DCS 800 TBD TBD CS 900 TBD TBD NOTE : Applicable for dual-ode GSM/UMTS. NOTE : Applicable for USB plug-i devices.

32 Release 3 TS 34.4 V.3.0 (0-) The orative referece for this clause is TS5.44 sectio Test purpose The purpose of this test is to verify that TR average ad TR i of the MS is ot below specified values. A lower TR average ad TRi decrease the coverage area Method of test Iitial coditios A call is set up by the SS accordig to the geeric call set up procedure o a chael with ARFCN i the Mid ARFCN rage, power cotrol level set to Max power. MS TXWR_MAX_CCH is set to the axiu value supported by the ower Class of the Mobile uder test. The SS seds Stadard Test Sigal C; see TS5.00- [9] Aex A5.. The dowlik power is set such that there will ot be trasissio gaps due to too low sigal stregth throughout the easureet The LME shall be tested usig the Laptop Groud lae hato as described i Aex A... Test eviroet: oral coditio; see TS5.00- [9] Aex A rocedure ) ositio the LME usig the Laptop Groud lae hato described i aex A.. ad accordig to DUT positioig described i clause 5... EIR ad EIR j with a saple step of 5 i theta (q) ad phi (f) directios usig a test syste havig characteristics as described i Aex A. ) Measure the q 3) Calculate TR usig equatios fro clause ) Test steps to 3 is repeated for ARFCN i the low ad high rage NOTE : Measureet of oral burst trasitter output power. The SS takes power easureet saples evely distributed over the duratio of oe burst with a saplig rate of at least /T, where T is the bit duratio. The saples are idetified i tie with respect to the odulatio o the burst. The SS idetifies the cetre of the useful 47 trasitted bits, i.e. the trasitio fro bit 3 to bit 4 of the idable, as the tiig referece. NOTE : The easureet procedure is based o the easureet of the spherical radiatio patter of the DUT. The power radiated by the DUT is sapled i far field i a group of poits located o a closed surface eclosig the DUT. The EIR saples are take usig a costat saple step of 5 both i theta (q) ad phi (f) directios. I soe cases a differet saplig grid ca be used to speed up the easureets (See Sectio 5..). All the EIR saples are take with two orthogoal polarizatios, q - ad j - polarisatios. NOTE 3: The oise floor of the easureet receiver shall ot disturb the power easureet. NOTE 4: No Stadard settigs: To speed up sesitivity easureets, power easureets ca be doe with o stadard odulatio. However to obtai TR result the easured EIR figures shall be oralized by DEIR = å( EIRstd i - EIRstd i ) i= where EIRstd is power easureet doe with stadard settig. i o stadard odulatio. is aout of referece easureet poits. EIRstd i is power easureet doe with

33 Release 33 TS 34.4 V.3.0 (0-) To esure accuracy of TR, the aout of referece poits easured should be at least 4. It is recoeded to spread the referece easureets equally durig the easureet tie rocedure, reverberatio chaber ethod ) ositio the LME usig the Laptop Groud lae hato described i Aex A.. ad accordig to DUT positioig described i chapter 5... ) Measure a sufficiet uber of idepedet saples (see sectio 5..3) of, usig a test syste havig the characteristics described i Aex A. 3) Calculate TR usig equatios fro clause ) Test steps to 3 is repeated for ARFCN i the low ad high rage NOTE : Measureet of oral burst trasitter output power. The SS takes power easureet saples evely distributed over the duratio of oe burst with a saplig rate of at least /T, where T is the bit duratio. The saples are idetified i tie with respect to the odulatio o the burst. The SS idetifies the cetre of the useful 47 trasitted bits, i.e. the trasitio fro bit 3 to bit 4 of the idable, as the tiig referece. NOTE : The easureet procedure is based o the easureet of the total power radiated fro the UE/MS to a full 3 diesioal isotropic eviroet with uifor elevatio ad aziuth field distributio. The power trasitted by the DUT is udergoig Rayleigh fadig ad is sapled by the fixed easureet ateas. Moreover, it is iportat that the saples collected are idepedet, i order to get sufficiet accuracy of the estiated TR value. S, NOTE 3: The oise floor of the easureet receiver shall ot disturb the power easureet Test requireets The average TR of low, id ad high chael i the data trasfers positio shall be higher tha test perforace requireets for roaig bads show i Table The averagig shall be doe i liear scale for the TR results. TR average é low 0 id / = 0logê êë 3 / high /0 ù ú úû I additio the iiu TR of each easured chael i the data trasfers positio shall be higher tha iiu perforace requireets show i the colus Mi. Operatig bad [, ] TR i, i = Table 5.6.: TR test requireet for GSM LME devices i the data trasfers positio low id high ower Class ower Class ower Class 3 ower Class 4 ower Class 5 ower (db) ower (db) ower (db) ower (db) ower (db) Average Mi Average Mi Average Mi Average Mi Average Mi GSM TBD TBD - - GSM TBD TBD - - DCS 800 TBD TBD CS 900 TBD TBD NOTE : Applicable for dual-ode GSM/UMTS. NOTE : Applicable for USB plug-i devices. NOTE: If the above Test Requireet differs fro the Miiu Requireet the the Test Tolerace applied for this test is o-zero. The Test Tolerace for this test is defied ad the explaatio of how the Miiu Requireet has bee relaxed by the Test Tolerace is give i Aex D.

34 Release 34 TS 34.4 V.3.0 (0-) 5.7 Total Radiated ower (TR) for TDD UE usig LME Editor s ote: This test case is icoplete. The followig aspects are either issig or ot yet deteried: The TR Miiu erforace Requireet for this test are udefied The Test Requireets ad related Test Toleraces applicable for this test are udefied 5.7. Defiitio ad applicability The Total Radiated ower (TR) is a easure of how uch power the DUT actually radiates. The TR is defied as the itegral of the power trasitted i differet directios over the etire radiatio sphere: ( EIR ( W; f ) + EIR ( W; f ) W TR = ò q j ) d 4p Where W is the solid agle describig the directio, f is frequecy. q ad j are the orthogoal polarizatios. EIR q ad Thus EIR j are the actually trasitted power-levels i correspodig polarizatios. TR» p NM N M åå - - [ EIRq ( q, j; f ) + EIRj ( q, j; f )] si( q) = 0 = 0 I these forulas N ad M are the uber of saplig itervals for theta ad phi. agles. The saplig itervals are discussed further i Sectio 5... q ad j are the easureet The TR ca also be calculated fro Rayleigh faded saples of the total power trasitted fro the LME. The easureet of trasitter perforace i a isotropic Rayleigh fadig eviroet is based o saplig the radiated power of the LME for a discrete uber of field cobiatios i the chaber. The average value of these statistically distributed saples is proportioal to the TR ad by calibratig the average power trasfer fuctio, a absolute value of the TR ca be obtaied. Thus where TR æ N å ç =» è C N å = ( - R ) ref, ref, is the referece power trasfer fuctio for fixed easureet atea, ö ø R is the reflectio coefficiet for fixed easureet atea ad C is the path loss i the cables coectig the easureet receiver to fixed easureet atea. These paraeters are calculated fro the calibratio easureet ad are further discussed i Aex B.. is the average power easured by fixed easureet atea ad ca be calculated usig the followig expressio: = M å = S,, M S,, where is saple uber of the coplex trasfer fuctio easured with fixed easureet atea ad M is the total uber of saples easured for each fixed easureet atea. The requireets ad this test apply to all types of UTRA for the TDD UE for Release ad later releases that support LME. NOTE: This test case ca be optioally executed for Release 8 ad oward UE s supportig LME feature.

35 Release 35 TS 34.4 V.3.0 (0-) 5.7. Miiu Requireets The average TR of low, id ad high chael shall be higher tha iiu perforace requireets for roaig bads show i Table The averagig shall be doe i liear scale for the TR results. TR average é low 0 id / = 0 logê ë 3 / high /0 ù ú û I additio the iiu TR of each easured chael shall be higher tha iiu perforace requireets show i the colus Mi. /0 low /0 /0 id high [ (,0, )] i 0 log i 0 0 TR = Table 5.7.: TR iiu perforace requireet for TDD LME devices i the data trasfers positio Operatig bad ower Class ower Class ower Class 3 ower Class 4 ower (db) ower (db) ower (db) ower (db) Average Mi Average Mi Average Mi Average Mi a - - TBD TBD b - - TBD TBD c - - TBD TBD d - - TBD TBD e - - TBD TBD f - - TBD TBD NOTE : Applicable for dual-ode GSM/UTRA LCR TDD. NOTE : Applicable for USB plug-i devices. The orative referece for this clause is TS5.44 [] sectio Test purpose The purpose of this test is to verify that TR average ad TRi of the UE is ot below specified values. A lower TR average ad TRi decrease the coverage area Method of test Iitial coditios The output power is a easure of the axiu power the UE ca trasit i a badwidth of at least (+ a) ties the chip rate of the radio access ode, for ore iforatio see TS 34. [3] clause 5.. The period of easureet shall be at least oe tieslot. Also care should be take that the oise floor of the easureet receiver is ot disturbig the power easureet. Norally, the receivig device should be set accordigly so that the receivig sigal will be at least 30 db higher tha the syste oise floor. Test eviroet: oral; see TS 34. [3] clause G... Frequecies to be tested: low rage, id rage, high rage; see TS 34. [3] clause G..4. ) Set the SS dowlik physical chaels accordig to settigs i Table Set the DCH power such that there will ot be trasissio gaps due to too low sigal stregth throughout the easureet. ) Coect the plug-i UE to a laptop groud plae phato. ower o the plug-i UE. The real fuctioal laptop supplies power to the plug-i UE.

36 Release 36 TS 34.4 V.3.0 (0-) 3) A call is set up accordig to the Geeric call setup procedure. The power cotrol algorith shall be set to ower Cotrol Algorith. 4) Eter the UE ito loopback test ode ad start the loopback test. 5) The easureet receiver shall be set to: zero spa, video trigger ad RMS detector. The RBW shall be at least (+ a) ties the chip rate of the radio access ode ad the VBW at least 3 ties bigger tha the RBW. For.8Mcps TDD UE, the RBW shall be set to 3MHz, ad VBW shall be set to 0MHz. See TS [0] ad TS [] for details regardig geeric call setup procedure ad loopback test. Table 5.7.: Dowlik hysical Chaels trasitted durig a coectio hysical Chael ower Ior -75 db DwCH DwCH_Ec / Ior = 0 db CCCH -CCCH_Ec / Ior = -3 db SCCCH S-CCCH_Ec / Ior = -6 db ICH ICH_Ec / Ior = -6 db FACH FACH_Ec / Ior = -6 db DL DCH DCH_Ec / Ior = 0 db rocedure ) Sed cotiuously Up power cotrol coads to the plug-i UE. ) As the plug-i UE reaches axiu power, start sedig N5 to ositio the plug-i UE ito the USB coector i accordace with the aufacturer recoeded priary echaical ode. I the absece of such a recoedatio positio the plug-i UE so that it is horizotally plugged ito the horizotal USB coector.ta patter. 3) EIR ad EIR j with a saple step of 5 i theta (q) ad phi (f) directios usig a test syste havig characteristics as described i Aex A. 4) Measure the q 5) Calculate TR usig equatios fro clause 5.7. NOTE : The easureet procedure is based o the easureet of the spherical radiatio patter of the DUT. The power radiated by the DUT is sapled i far field i a group of poits located o a spherical surface eclosig the DUT. The EIR saples are take usig a costat saple step of 5 both i theta (q) ad phi (f) directios. I soe cases a differet saplig grid ay be used to speed up the easureets (See Sectio 5..). All the EIR saples are take with two orthogoal polarizatios, q - ad j - polarisatios. NOTE : The oise floor of the easureet receiver shall ot disturb the power easureet. NOTE 3: No Stadard settigs: To speed up sesitivity easureets, power easureets ay be doe with o stadard odulatio. However to obtai TR result the easured EIR figures shall be oralized by DEIR = å( EIRstd i - EIRstd i ) i= where EIRstd is power easureet doe with stadard settig. i o stadard odulatio. is aout of referece easureet poits. EIRstd i is power easureet doe with To esure accuracy of TR, the aout of referece poits easured should be at least 4. It is recoeded to spread the referece easureets equally durig the easureet tie.

37 Release 37 TS 34.4 V.3.0 (0-) rocedure, reverberatio chaber ethod ) Sed cotiuously Up power cotrol coads to the plug-i UE. ) As the plug-i UE reaches axiu power, start sedig N5 data patter. 3) ositio the plug-i UE ito the USB coector i accordace with the aufacturer recoeded priary echaical ode. I the absece of such a recoedatio positio the plug-i UE so that it is horizotally plugged ito the horizotal USB coector. 4) Measure a sufficiet uber of idepedet saples (see sectio 5..3) of, usig a test syste havig the characteristics described i Aex A. 5) Calculate TR usig equatios fro sectio NOTE : The easureet procedure is based o the easureet of the total power radiated fro the UE/MS to a full 3 diesioal isotropic eviroet with uifor elevatio ad aziuth field distributio. The power trasitted by the DUT is udergoig Rayleigh fadig ad is sapled by the fixed easureet ateas. Moreover, it is iportat that the saples collected are idepedet, i order to get sufficiet accuracy of the estiated TR value. S, NOTE : The oise floor of the easureet receiver shall ot disturb the power easureet Test requireets The average TR of low, id ad high chael shall be higher tha test perforace requireets for roaig bads show i Table The averagig shall be doe i liear scale for the TR. TR average é low 0 id / = 0 logê ë 3 / high /0 ù ú û I additio the iiu TR of each easured chael shall be higher tha iiu perforace requireets show i the colus Mi. TR = /0 low /0 /0 id high [ (,0, )] i 0 log i 0 0 Table 5.7.3: TR test requireet for TDD LME devices i the data trasfers positio Operatig bad ower Class ower Class ower Class 3 ower Class 4 ower (db) ower (db) ower (db) ower (db) Average Mi Average Mi Average Mi Average Mi a - - TBD + TT TBD + TT b - - TBD + TT TBD + TT c - - TBD + TT TBD + TT d - - TBD + TT TBD + TT e - - TBD + TT TBD + TT f - - TBD + TT TBD + TT NOTE : Applicable for dual-ode GSM/UTRA LCR TDD. NOTE : Applicable for USB plug-i devices. NOTE: If the above Test Requireet differs fro the Miiu Requireet the the Test Tolerace applied for this test is o-zero. The Test Tolerace for this test is defied ad the explaatio of how the Miiu Requireet has bee relaxed by the Test Tolerace is give i Aex D.

38 Release 38 TS 34.4 V.3.0 (0-) 5.8 Total Radiated ower (TR) for FDD UE usig LEE Editor s ote: This test case is ot copleted Miiu Requireets are issig Test requireets ad related TT are issig 5.8. Defiitio ad applicability The Total Radiated ower (TR) is a easure of how uch power the DUT actually radiates. The TR is defied as the itegral of the power trasitted i differet directios over the etire radiatio sphere: ( EIR ( W; f ) + EIR ( W; f ) W TR = ò q j ) d 4p Where W is the solid agle describig the directio, f is frequecy. q ad j are the orthogoal polarizatios. EIR q ad Thus EIR j are the actually trasitted power-levels i correspodig polarizatios. TR» p NM N M åå - - [ EIRq ( q, j; f ) + EIRj ( q, j; f )] si( q) = 0 = 0 I these forulas N ad M are the uber of saplig itervals for theta ad phi. agles. The saplig itervals are discussed further i Sectio 5... q ad j are the easureet The TR ca also be calculated fro Rayleigh faded saples of the total power trasitted fro the LEE. The easureet of trasitter perforace i a isotropic Rayleigh fadig eviroet is based o saplig the radiated power of the LEE for a discrete uber of field cobiatios i the chaber. The average value of these statistically distributed saples is proportioal to the TR ad by calibratig the average power trasfer fuctio, a absolute value of the TR ca be obtaied. Thus where TR æ N å ç =» è C N å = ( - R ) ref, ref, is the referece power trasfer fuctio for fixed easureet atea, ö ø R is the reflectio coefficiet for fixed easureet atea ad C is the path loss i the cables coectig the easureet receiver to fixed easureet atea. These paraeters are calculated fro the calibratio easureet ad are further discussed i Aex B.. is the average power easured by fixed easureet atea ad ca be calculated usig the followig expressio: = M å = S,, M S,, where is saple uber of the coplex trasfer fuctio easured with fixed easureet atea ad M is the total uber of saples easured for each fixed easureet atea. Note that all averagig ust be perfored usig liear power values (e.g. easureets i Watts).

39 Release 39 TS 34.4 V.3.0 (0-) The requireets ad this test apply to all types of UTRA for the FDD UE for Release ad later releases that support LEE. NOTE: This test case ca be optioally executed for Release 7 ad oward UE s supportig LEE feature Miiu Requireets The average TR of low, id ad high chael of the LME i the data trasfers positio shall be higher tha iiu perforace requireets for roaig bads show i Table The averagig shall be doe i liear scale for the TR results. TR average é low 0 id / = 0logê êë 3 / high /0 ù ú úû I additio the iiu TR of each easured chael i the data trasfers positio shall be higher tha iiu perforace requireets show i the colus Mi. [, ] TR i, i = Table 5.8.: TR iiu perforace requireet for LEE devices i the data trasfers positio Operatig bad low ower Class ower Class ower Class 3 ower Class 3bis ower Class 4 ower (db) ower (db) ower (db) ower (db) ower (db) Average Mi Average Mi Average Mi I - - TBD TBD TBD TBD TBD TBD II - - TBD TBD TBD TBD TBD TBD III - - TBD TBD TBD TBD TBD TBD IV - - TBD TBD TBD TBD TBD TBD V - - TBD TBD TBD TBD TBD TBD VI - - TBD TBD TBD TBD TBD TBD VII - - TBD TBD TBD TBD TBD TBD VIII - - TBD TBD TBD TBD TBD TBD IX - - TBD TBD TBD TBD TBD TBD XIX - - TBD TBD TBD TBD TBD TBD NOTE : Applicable for dual-ode GSM/UMTS. NOTE : Applicable for otebook devices. id high The orative referece for this clause is TS5.44 sectio Test purpose The purpose of this test is to verify that TR average ad TRi of the UE is ot below specified values. A lower TR average ad TRi decrease the coverage area Method of test Iitial coditios The output power is a easure of the axiu power the UE ca trasit i a badwidth of at least (+ a) ties the chip rate of the radio access ode, for ore iforatio see TS 34. chapter 5.. The period of easureet shall be at least oe tieslot. Also care should be take that the oise floor of the easureet receiver is ot disturbig the power easureet. The LEE shall be tested accordig to DUT positioig described i chapter 5... Test eviroet: oral; see TS34.- [3] clause G... Frequecies to be tested: low rage, id rage, high rage; see TS34.- [3] clause G..4.

40 Release 40 TS 34.4 V.3.0 (0-) ) Set the SS dowlik physical chaels accordig to settigs i Table Set the DCH power such that there will ot be trasissio gaps due to too low sigal stregth throughout the easureet. ) ower o the UE. 3) A call is set up accordig to the Geeric call setup procedure. The power cotrol algorith shall be set to ower Cotrol Algorith. Copressed ode shall be set to OFF. 4) Eter the UE ito loopback test ode ad start the loopback test. See TS [0] ad TS [] for details regardig geeric call setup procedure ad loopback test. Table 5.8.: Dowlik hysical Chaels trasitted durig a coectio hysical Chael ower CICH CICH_Ec / DCH_Ec = 7 db -CCCH -CCCH_Ec / DCH_Ec = 5 db SCH SCH_Ec / DCH_Ec = 5 db ICH ICH_Ec / DCH_Ec = db DCH Test depedet power rocedure ) Sed cotiuously Up power cotrol coads to the UE. ) As the UE reaches axiu power, start sedig N5 data patter. 3) ositio ad cofigure the LEE accordig to chapter 5.. EIR ad EIR j with a saple step of 5 i theta (q) ad phi (f) directios usig a test syste havig characteristics as described i Aex A. 4) Measure the q 5) Calculate TR usig equatios fro chapter 5.8. NOTE : The easureet procedure is based o the easureet of the spherical radiatio patter of the DUT. The power radiated by the DUT is sapled i far field i a group of poits located o a spherical surface eclosig the DUT. The EIR saples are take usig a costat saple step of 5 both i theta (q) ad phi (f) directios. I soe cases a differet saplig grid ay be used to speed up the easureets (See Sectio 5..). All the EIR saples are take with two orthogoal polarizatios, q - ad j - polarisatios. NOTE : The oise floor of the easureet receiver shall ot disturb the power easureet. NOTE 3: No Stadard settigs: To speed up sesitivity easureets, power easureets ay be doe with o stadard odulatio. However to obtai TR result the easured EIR figures shall be oralized by DEIR = å( EIRstd i - EIRstd i ) i= where EIRstd is power easureet doe with stadard settig. i o stadard odulatio. is aout of referece easureet poits. EIRstd i is power easureet doe with To esure accuracy of TR, the aout of referece poits easured should be at least 4. It is recoeded to spread the referece easureets equally durig the easureet tie rocedure, reverberatio chaber ethod ) Sed cotiuously Up power cotrol coads to the UE. ) As the UE reaches axiu power, start sedig N5 data patter.

41 Release 4 TS 34.4 V.3.0 (0-) 3) ositio ad cofigure the LEE accordig to chapter 5.. 4) Measure a sufficiet uber of idepedet saples (see sectio 5..3) of, usig a test syste havig characteristics as described i Aex A. 5) Calculate TR usig equatios fro sectio NOTE : The easureet procedure is based o the easureet of the total power radiated fro the UE/MS to a full 3 diesioal isotropic eviroet with uifor elevatio ad aziuth field distributio. The power trasitted by the DUT is udergoig Rayleigh fadig ad is sapled by the fixed easureet ateas. Moreover, it is iportat that the saples collected are idepedet, i order to get sufficiet accuracy of the estiated TR value. S, NOTE : The oise floor of the easureet receiver shall ot disturb the power easureet Test requireets The average TR of low, id ad high chael i the data trasfers positio shall be higher tha test perforace requireets for roaig bads show i Table The averagig shall be doe i liear scale for the TR results. TR average é low 0 id / = 0logê êë 3 / high /0 ù ú úû I additio the iiu TR of each easured chael i the data trasfers positio shall be higher tha iiu perforace requireets show i the colus Mi. Operatig bad [, ] TR i, i = Table 5.8.3: TR test requireet for LEE devices i the data trasfers positio low ower Class ower Class ower Class 3 ower Class 3bis ower Class 4 ower (db) ower (db) ower (db) ower (db) ower (db) Average Mi Average Mi Average Mi I - - TBD TBD TBD TBD TBD TBD II - - TBD TBD TBD TBD TBD TBD III - - TBD TBD TBD TBD TBD TBD IV - - TBD TBD TBD TBD TBD TBD V - - TBD TBD TBD TBD TBD TBD VI - - TBD TBD TBD TBD TBD TBD VII - - TBD TBD TBD TBD TBD TBD VIII - - TBD TBD TBD TBD TBD TBD IX - - TBD TBD TBD TBD TBD TBD XIX - - TBD TBD TBD TBD TBD TBD NOTE : Applicable for dual-ode GSM/UMTS. NOTE : Applicable for otebook devices. id high NOTE: If the above Test Requireet differs fro the Miiu Requireet the the Test Tolerace applied for this test is o-zero. The Test Tolerace for this test is defied ad the explaatio of how the Miiu Requireet has bee relaxed by the Test Tolerace is give i Aex D. 5.9 Total Radiated ower (TR) for GSM MS usig LEE Editor s ote: This test case is ot copleted Miiu Requireets are issig Test requireets ad related TT are issig

42 Release 4 TS 34.4 V.3.0 (0-) 5.9. Defiitio ad applicability The Total Radiated ower (TR) is a easure of how uch power the DUT actually radiates. The TR is defied as the itegral of the power trasitted i differet directios over the etire radiatio sphere: ( EIR ( W; f ) + EIR ( W; f ) W TR = ò q j ) d 4p Where W is the solid agle describig the directio, f is frequecy. q ad j are the orthogoal polarizatios. EIR q ad Thus EIR j are the actually trasitted power-levels i correspodig polarizatios. TR» p NM N M åå - - [ EIRq ( q, j; f ) + EIRj ( q, j; f )] si( q) = 0 = 0 I these forulas N ad M are the uber of saplig itervals for theta ad phi. agles. The saplig itervals are discussed further i Sectio 5... q ad j are the easureet The TR ca also be calculated fro Rayleigh faded saples of the total power trasitted fro the LEE. The easureet of trasitter perforace i a isotropic Rayleigh fadig eviroet is based o saplig the radiated power of the LEE for a discrete uber of field cobiatios i the chaber. The average value of these statistically distributed saples is proportioal to the TR ad by calibratig the average power trasfer fuctio, a absolute value of the TR ca be obtaied. Thus where TR æ N å ç =» è C N å = ( - R ) ref, ref, is the referece power trasfer fuctio for fixed easureet atea, ö ø R is the reflectio coefficiet for fixed easureet atea ad C is the path loss i the cables coectig the easureet receiver to fixed easureet atea. These paraeters are calculated fro the calibratio easureet ad are further discussed i Aex B.. is the average power easured by fixed easureet atea ad ca be calculated usig the followig expressio: = M å = S,, M S,, where is saple uber of the coplex trasfer fuctio easured with fixed easureet atea ad M is the total uber of saples easured for each fixed easureet atea. The requireets ad this test apply to all types of LEE that support GSM for Release ad later releases. NOTE: This test case ca be optioally executed for Release 7 ad oward MS s supportig LEE feature Miiu Requireets The average TR of low, id ad high chael of the LME i the data trasfers positio shall be higher tha iiu perforace requireets for roaig bads show i Table The averagig shall be doe i liear scale for the TR results.

43 Release 43 TS 34.4 V.3.0 (0-) TR average é low 0 id / = 0logê êë 3 / high /0 ù ú úû I additio the iiu TR of each easured chaellig the data trasfers positio shall be higher tha iiu perforace requireets show i the colus Mi. [, ] TR i, i = Table 5.9.: TR iiu perforace requireet for GSM LEE devices i the data trasfer positio Operatig bad low id high ower Class ower Class ower Class 3 ower Class 4 ower Class 5 ower (db) ower (db) ower (db) ower (db) ower (db) Average Mi Average Mi Average Mi Average Mi Average Mi GSM TBD TBD - - GSM TBD TBD - - DCS 800 TBD TBD CS 900 TBD TBD NOTE : Applicable for dual-ode GSM/UMTS. NOTE : Applicable for otebook devices. The orative referece for this clause is TS5.44 sectio Test purpose The purpose of this test is to verify that TR average ad TR i of the MS is ot below specified values. A lower TR average ad TRi decrease the coverage area Method of test Iitial coditios A call is set up by the SS accordig to the geeric call set up procedure o a chael with ARFCN i the Mid ARFCN rage, power cotrol level set to Max power. MS TXWR_MAX_CCH is set to the axiu value supported by the ower Class of the Mobile uder test. The SS seds Stadard Test Sigal C; see TS5.00- [9] Aex A5.. The dowlik power is set such that there will ot be trasissio gaps due to too low sigal stregth throughout the easureet The LEE shall be tested accordig to DUT positioig described i clause 5... Test eviroet: oral coditio; see TS5.00- [9] Aex A rocedure ) ositio ad cofigure the LEE accordig to clause 5.. EIR ad EIR j with a saple step of 5 i theta (q) ad phi (f) directios usig a test syste havig characteristics as described i Aex A. ) Measure the q 3) Calculate TR usig equatios fro clause ) Test steps to 3 is repeated for ARFCN i the low ad high rage NOTE : Measureet of oral burst trasitter output power. The SS takes power easureet saples evely distributed over the duratio of oe burst with a saplig rate of at least /T, where T is the bit duratio. The

44 Release 44 TS 34.4 V.3.0 (0-) saples are idetified i tie with respect to the odulatio o the burst. The SS idetifies the cetre of the useful 47 trasitted bits, i.e. the trasitio fro bit 3 to bit 4 of the idable, as the tiig referece. NOTE : The easureet procedure is based o the easureet of the spherical radiatio patter of the DUT. The power radiated by the DUT is sapled i far field i a group of poits located o a closed surface eclosig the DUT. The EIR saples are take usig a costat saple step of 5 both i theta (q) ad phi (f) directios. I soe cases a differet saplig grid ca be used to speed up the easureets (See Sectio 5..). All the EIR saples are take with two orthogoal polarizatios, q - ad j - polarisatios. NOTE 3: The oise floor of the easureet receiver shall ot disturb the power easureet. NOTE 4: No Stadard settigs: To speed up sesitivity easureets, power easureets ca be doe with o stadard odulatio. However to obtai TR result the easured EIR figures shall be oralized by DEIR = å( EIRstd i - EIRstd i ) i= where EIRstd is power easureet doe with stadard settig. i o stadard odulatio. is aout of referece easureet poits. EIRstd i is power easureet doe with To esure accuracy of TR, the aout of referece poits easured should be at least 4. It is recoeded to spread the referece easureets equally durig the easureet tie rocedure, reverberatio chaber ethod ) ositio ad cofigure the LEE accordig to clause 5.. ) Measure a sufficiet uber of idepedet saples (see sectio 5..3) of, usig a test syste havig the characteristics described i Aex A. 3) Calculate TR usig equatios fro sectio ) Test steps to 3 is repeated for ARFCN i the low ad high rage NOTE : Measureet of oral burst trasitter output power. The SS takes power easureet saples evely distributed over the duratio of oe burst with a saplig rate of at least /T, where T is the bit duratio. The saples are idetified i tie with respect to the odulatio o the burst. The SS idetifies the cetre of the useful 47 trasitted bits, i.e. the trasitio fro bit 3 to bit 4 of the idable, as the tiig referece. NOTE : The easureet procedure is based o the easureet of the total power radiated fro the UE/MS to a full 3 diesioal isotropic eviroet with uifor elevatio ad aziuth field distributio. The power trasitted by the DUT is udergoig Rayleigh fadig ad is sapled by the fixed easureet ateas. Moreover, it is iportat that the saples collected are idepedet, i order to get sufficiet accuracy of the estiated TR value. S, NOTE 3: The oise floor of the easureet receiver shall ot disturb the power easureet Test requireets The average TR of low, id ad high chael i the data trasfers positio shall be higher tha test perforace requireets for roaig bads show i Table The averagig shall be doe i liear scale for the TR results. TR average é low 0 id / = 0logê êë 3 / high /0 ù ú úû I additio the iiu TR of each easured chael i the data trasfers positio shall be higher tha iiu perforace requireets show i the colus Mi.

45 Release 45 [, ] TR i, i = low id high TS 34.4 V.3.0 (0-) Operatig bad Table 5.9.: TR test requireet for GSM LEE devices i the data trasfer positio ower Class ower Class ower Class 3 ower Class 4 ower Class 5 ower (db) ower (db) ower (db) ower (db) ower (db) Average Mi Average Mi Average Mi Average Mi Average Mi GSM TBD TBD - - GSM TBD TBD - - DCS 800 TBD TBD CS 900 TBD TBD NOTE : Applicable for dual-ode GSM/UMTS. NOTE : Applicable for otebook devices. NOTE: If the above Test Requireet differs fro the Miiu Requireet the the Test Tolerace applied for this test is o-zero. The Test Tolerace for this test is defied ad the explaatio of how the Miiu Requireet has bee relaxed by the Test Tolerace is give i Aex D. 5.0 Total Radiated ower (TR) for TDD UE usig LEE Editor s ote: This test case is icoplete. The followig aspects are either issig or ot yet deteried: The TR Miiu erforace Requireet for this test are udefied The Test Requireets ad related Test Toleraces applicable for this test are udefied 5.0. Defiitio ad applicability The Total Radiated ower (TR) is a easure of how uch power the DUT actually radiates. The TR is defied as the itegral of the power trasitted i differet directios over the etire radiatio sphere: ( EIR ( W; f ) + EIR ( W; f ) W TR = ò q j ) d 4p Where W is the solid agle describig the directio, f is frequecy. q ad j are the orthogoal polarizatios. EIR q ad Thus EIR j are the actually trasitted power-levels i correspodig polarizatios. TR» p NM N M åå - - [ EIRq ( q, j; f ) + EIRj ( q, j; f )] si( q) = 0 = 0 I these forulas N ad M are the uber of saplig itervals for theta ad phi. agles. The saplig itervals are discussed further i Sectio 5... q ad j are the easureet The TR ca also be calculated fro Rayleigh faded saples of the total power trasitted fro the LEE. The easureet of trasitter perforace i a isotropic Rayleigh fadig eviroet is based o saplig the radiated power of the LEE for a discrete uber of field cobiatios i the chaber. The average value of these statistically distributed saples is proportioal to the TR ad by calibratig the average power trasfer fuctio, a absolute value of the TR ca be obtaied. Thus TR æ N å ç =» è C N å = ( - R ) ref, ö ø

46 Release 46 TS 34.4 V.3.0 (0-) where ref, is the referece power trasfer fuctio for fixed easureet atea, R is the reflectio coefficiet for fixed easureet atea ad C is the path loss i the cables coectig the easureet receiver to fixed easureet atea. These paraeters are calculated fro the calibratio easureet ad are further discussed i Aex B.. is the average power easured by fixed easureet atea ad ca be calculated usig the followig expressio: = M å = S,, M S,, where is saple uber of the coplex trasfer fuctio easured with fixed easureet atea ad M is the total uber of saples easured for each fixed easureet atea. Note that all averagig ust be perfored usig liear power values (e.g. easureets i Watts). The requireets ad this test apply to all types of UTRA for the TDD UE for Release ad later releases that support LEE. Note: This test case ca be optioally executed for Release 8 ad oward UE s supportig LEE feature Miiu Requireets The average TR of low, id ad high chael shall be higher tha iiu perforace requireets for roaig bads show i Table The averagig shall be doe i liear scale for the TR results. TR average é low 0 id / = 0 logê ë 3 / high /0 ù ú û I additio the iiu TR of each easured chael shall be higher tha iiu perforace requireets show i the colus Mi. TR = /0 low /0 /0 id high [ (,0, )] i 0 log i 0 0 Table 5.0.: TR iiu perforace requireet for TDD LEE devices i the data trasfers positio Operati g bad ower Class ower Class ower Class 3 ower Class 4 ower (db) ower (db) ower (db) ower (db) Average Mi Average Mi Average Mi Average Mi a - - TBD TBD b - - TBD TBD c - - TBD TBD d - - TBD TBD e - - TBD TBd f - - TBD TBD NOTE : Applicable for dual-ode GSM/UTRA LCR TDD. NOTE : Applicable for otebook devices. The orative referece for this clause is TS5.44 [] sectio Test purpose The purpose of this test is to verify that TR average ad TRi of the UE is ot below specified values. A lower TR average ad TRi decrease the coverage area.

47 Release 47 TS 34.4 V.3.0 (0-) Method of test Iitial coditios The output power is a easure of the axiu power the UE ca trasit i a badwidth of at least (+ a) ties the chip rate of the radio access ode, for ore iforatio see TS 34. [3] clause 5.. The period of easureet shall be at least oe tieslot. Also care should be take that the oise floor of the easureet receiver is ot disturbig the power easureet. Norally, the receivig device should be set accordigly so that the receivig sigal will be at least 30 db higher tha the syste oise floor. The LEE shall be tested accordig to DUT positioig described i clause 5... Test eviroet: oral; see TS 34. [3] clause G... Frequecies to be tested: low rage, id rage, high rage; see TS 34. [3] clause G..4. ) Set the SS dowlik physical chaels accordig to settigs i Table Set the DCH power such that there will ot be trasissio gaps due to too low sigal stregth throughout the easureet. ) ower o the LEE UE 3) A call is set up accordig to the Geeric call setup procedure. The power cotrol algorith shall be set to ower Cotrol Algorith. 4) Eter the UE ito loopback test ode ad start the loopback test. 5) The easureet receiver shall be set to: zero spa, video trigger ad RMS detector. The RBW shall be at least (+ a) ties the chip rate of the radio access ode ad the VBW at least 3 ties bigger tha the RBW. For.8Mcps TDD UE, the RBW shall be set to 3MHz, ad VBW shall be set to 0MHz. See TS [0] ad TS [] for details regardig geeric call setup procedure ad loopback test. Table 5.0.: Dowlik hysical Chaels trasitted durig a coectio hysical Chael ower Ior -75 db DwCH DwCH_Ec / Ior = 0 db CCCH -CCCH_Ec / Ior = -3 db SCCCH S-CCCH_Ec / Ior = -6 db ICH ICH_Ec / Ior = -6 db FACH FACH_Ec / Ior = -6 db DL DCH DCH_Ec / Ior = 0 db rocedure ) Sed cotiuously Up power cotrol coads to the LEE UE. ) As the LEE UE reaches axiu power, start sedig N5 data patter. 3) ositio ad cofigure the LEE accordig to clause 5.. EIR ad EIR j with a saple step of 5 i theta (q) ad phi (f) directios usig a test syste havig characteristics as described i Aex A. 4) Measure the q 5) Calculate TR usig equatios fro clause 5.0. NOTE : The easureet procedure is based o the easureet of the spherical radiatio patter of the DUT. The power radiated by the DUT is sapled i far field i a group of poits located o a spherical surface eclosig the DUT. The EIR saples are take usig a costat saple step of 5 both i theta (q) ad phi (f) directios. I soe cases a differet saplig grid ay be used to speed up the easureets (See Sectio 5..). All the EIR saples are take with two orthogoal polarizatios, q - ad j - polarisatios.

48 Release 48 TS 34.4 V.3.0 (0-) NOTE : The oise floor of the easureet receiver shall ot disturb the power easureet. NOTE 3: No Stadard settigs: To speed up sesitivity easureets, power easureets ay be doe with o stadard odulatio. However to obtai TR result the easured EIR figures shall be oralized by DEIR = å( EIRstd i - EIRstd i ) i= where EIRstd is power easureet doe with stadard settig. i o stadard odulatio. is aout of referece easureet poits. EIRstd i is power easureet doe with To esure accuracy of TR, the aout of referece poits easured should be at least 4. It is recoeded to spread the referece easureets equally durig the easureet tie rocedure, reverberatio chaber ethod ) Sed cotiuously Up power cotrol coads to the LEE UE. ) As the UE reaches axiu power, start sedig N5 data patter. 3) ositio ad cofigure the LEE accordig to clause 5.. 4) Measure a sufficiet uber of idepedet saples (see sectio 5..3) of, usig a test syste havig the characteristics described i Aex A. 5) Calculate TR usig equatios fro sectio NOTE : The easureet procedure is based o the easureet of the total power radiated fro the UE/MS to a full 3 diesioal isotropic eviroet with uifor elevatio ad aziuth field distributio. The power trasitted by the DUT is udergoig Rayleigh fadig ad is sapled by the fixed easureet ateas. Moreover, it is iportat that the saples collected are idepedet, i order to get sufficiet accuracy of the estiated TR value. S, NOTE : The oise floor of the easureet receiver shall ot disturb the power easureet Test requireets The average TR of low, id ad high chael shall be higher tha test perforace requireets for roaig bads show i Table The averagig shall be doe i liear scale for the TR. TR average é low 0 id / = 0 logê ë 3 / high /0 ù ú û I additio the iiu TR of each easured chael shall be higher tha iiu perforace requireets show i the colus Mi. /0 low /0 /0 id high [ (,0, )] i 0 log i 0 0 TR =

49 Release 49 TS 34.4 V.3.0 (0-) Table 5.0.3: TR test requireet for TDD LEE devices i the data trasfers positio Operati g bad ower Class ower Class ower Class 3 ower Class 4 ower (db) ower (db ower (db) ower (db) Average Mi Average Mi Average Mi Average Mi a - - TBD +TT TBD +TT b - - TBD +TT TBD +TT c - - TBD +TT TBD +TT d - - TBD +TT TBD +TT e - - TBD +TT TBD +TT TT f - - TBD +TT TBD +TT NOTE : Applicable for dual-ode GSM/UTRA LCR TDD. NOTE : Applicable for otebook devices. NOTE: If the above Test Requireet differs fro the Miiu Requireet the the Test Tolerace applied for this test is o-zero. The Test Tolerace for this test is defied ad the explaatio of how the Miiu Requireet has bee relaxed by the Test Tolerace is give i Aex D. 6 Receiver erforace 6. Geeral This sectio describes the specifics of the radiated sesitivity easureet procedure. There are two ethods described. The ai ethod is based o a aechoic chaber approach ad the alterative ethod is based o a reverberatio chaber approach. The procedure for the easureet of the UE receiver perforace is i priciple equivalet to the trasitter perforace easureet described i Aex A. The basic differece is that ow the absolute sesitivity value at a predefied BER level is the paraeter of iterest i each easureet poit. Note that the receiver ad trasitter perforaces easureets ay be doe i parallel, at each positio. For DUTs with ore tha oe atea port, all the tests should be perfored usig both (all) ateas siultaeously. 6.. DUT ositioig The DUT positioig o head phato eas that the easureets are perfored so that the DUT is placed agaist a SAM phato. The characteristics of the SAM phato are specified i Aex A... The DUT is attached to the SAM phato i cheek positio as defied i IEEE Std 58. The DUT perforace is easured o both left ad right side of the head. The DUT positioig o laptop groud plae phato eas that a laptop groud plae phato is used for radiated perforace easureets i case of plug-i DUT like USB dogles that is used away fro the user s head. The DUT is coected to the USB coector of the laptop groud plae phato. The characteristics of the laptop groud plae phato ad the DUT positioig are specified i Aex A... The objective of the laptop groud plae phato is to reproduce the effects of the groud plae for the atea of the DUT while avoidig the variatio of the easureets itroduced by a real laptop. The DUT shall be plugged ito the USB coector ad positioed i accordace with the aufacturer recoeded priary echaical ode. I the absece of such a recoedatio the DUT with either the rotary USB porter or o-rotary USB porter should be horizotally plugged ito the horizotal USB coector. The DUT positioig i free space cofiguratio without head ad had phatos as specified i Aex A.4 is used for radiated perforace easureets i case of ebedded odule card that is used away fro the user s head.

50 Release 50 TS 34.4 V.3.0 (0-) 6.. Saplig grid A 5 -saple grid i both aziuth ad elevatio ca be cosidered sufficiet for accurate easureets. Geerally it ca be said that sice the radiatig object has a liited size the gai patter caot chage arbitrarily versus agle, ad therefore oly a liited uber of saples are required to represet the gai patter to a give accuracy cosequetly. A 30 -saple grid ay be used takig also ito accout that there is a trade-off betwee the accuracy of the approxiated TRS values ad the total easureet tie required to obtai a coplete 3-D radiatio patter of the atea. Alteratively, differet saplig patters ay be used, if they are able to esure sae or greater level of accuracy. The TRS ca be calculated by iterpolatig the values to poits o the regular grid. If a alterative saplig patter is used uber of easureet poits should be greater tha i the regular saplig grid Nuber of idepedet saples (for reverberatio chaber procedure) Whe easurig the TRS i a isotropic Rayleigh fadig eviroet, 00 idepedet saples ca be cosidered sufficiet for esurig a expaded accuracy better tha 0.5 db. 6. Total Radiated Sesitivity (TRS) for FDD UE 6.. Defiitio ad applicability The Total Radiated Sesitivity is defied as: TRS = ò 4p é ù ê + údw êë EISq ( W; f ) EISj ( W; f ) úû Where the effective isotropic sesitivity (EIS) is defied as the power available at the atea output such as the sesitivity threshold is achieved for each polarizatio. W is the solid agle describig the directio, f is frequecy. q ad j are the orthogoal polarizatios. TRS» p N - M - åå = 0 NM é = ú ú ù ê + si 0êë EISq ( q, j; f ) EISj ( q, j; f ) û I these forulas N ad M are the uber of saplig itervals for theta ad phi. agles. The saplig itervals are discussed further i Sectio 6... ( q ) q ad j are the easureet The TRS ca also be calculated fro easureets i a Rayleigh fadig 3 diesioal isotropic eviroet with i average uifor elevatio ad aziuth distributio. The calculatio of the TRS is i this case based o searchig for the lowest power received by the UE/MS for a discrete uber of field cobiatios i the chaber that gives a BER that is better tha the specified target BER level. By calibratig the average power trasfer fuctio, a absolute value of the TRS ca be obtaied. The followig expressio ca be used to fid the TRS. TRS æ ç N å è =» N N ( C ( - R ) ) å = ref, thres, ö ø -

51 Release 5 TS 34.4 V.3.0 (0-) where ref, is the referece power trasfer fuctio for fixed easureet atea, R is the reflectio coefficiet for fixed easureet atea ad C is the path loss i the cables coectig the easureet receiver to fixed easureet atea. These paraeters are calculated fro the calibratio easureet ad are further discussed i Aex B.., is calculated by usig the followig equatio: thres thres, = M å = S thres,, M where thres S,, is the :th value of the trasfer fuctio for fixed easureet atea, which gives the BER threshold. M is the total uber of values of the BER threshold power easured for each fixed easureet atea. The requireets ad this test apply to all types of UTRA for the FDD UE for Release 7 ad later releases. 6.. Miiu requireets The average TRS of low, id ad high chael i beside head positio for % BER with.kbps DL referece chael as defied i Aex C.3 of TS5.0 [] shall be lower tha iiu perforace requireets for roaig bads show i Table 6... The averagig shall be doe i liear scale for the TRS results of both right ad left side of the phato head. TRS average é æ = 0logê6 ç left _ low / 0 left _ id /0 left _ high /0 right _ low /0 right _ id /0 right _ high / 0 ë è I additio the axiu TRS of each easured chael i beside head positio shall be better tha iiu perforace requireets for roaig bads show i the colus Max. öù ú øû TRS = 0log ax 0 ax left _ low /0 left _ id /0 left _ high /0 right _ low /0 right _ id /0 right _ high /0 [ (,0,0,0,0,0 )] Table 6..: TRS iiu requireets for FDD roaig bads i the speech positio for the priary echaical ode Operatig Bad Uit <REFÎ or> Average Max I db/3.84 MHz II db/3.84 MHz III db/3.84 MHz IV db/3.84 MHz V db/3.84 MHz VI db/3.84 MHz VII db/3.84 MHz VIII db/3.84 MHz IX db/3.84 MHz XIX db/3.84 MHz NOTE For ower Class 3, 3bis ad 4 this shall be achieved at the axiu output power. NOTE For the UE which supports both Bad III ad Bad IX operatig frequecies, the referece level of TDB db TRS <REFÎ or> [average ad i] shall apply for Bad IX. NOTE 3: Applicable for dual-ode GSM/UMTS. The orative referece for this clause is TS5.44 sectio 7...

52 Release 5 TS 34.4 V.3.0 (0-) 6..3 Test urpose The purpose of this test is to esure that TRS average ad ax receptio sesitivity decreases the coverage area at the far side fro Node B Method of test Iitial coditios Test eviroet: oral; see TS34.- [3] clause G... ) Set the SS dowlik physical chaels accordig to settigs i Table 6... ) ower o the UE. TRS of the UE is above specified liit. The lack of the 3) A call is set up accordig to the Geeric call setup procedure. The power cotrol algorith shall be set to ower Cotrol Algorith. Copressed ode shall be set to OFF. 4) Eter the UE ito loopback test ode ad start the loopback test. See TS [0] ad TS [] for details regardig geeric call setup procedure ad loopback test. Table 6..: Dowlik hysical Chaels trasitted durig a coectio hysical Chael ower CICH CICH_Ec / DCH_Ec = 7 db -CCCH -CCCH_Ec/ DCH_Ec = 5 db SCH SCH_Ec / DCH_Ec = 5 db ICH ICH_Ec / DCH_Ec = db DCH Test depedet power Test procedure ) Sed cotiuously Up power cotrol coads to the UE. ) As the UE reaches axiu power, start sedig N5 data patter. 3) ositio the UE agaist the SAM phato 4) Measure EIS fro oe easureet poit. EIS is the power trasitted fro oe specific directio to the UE causig BER value of % ± 0.% usig 0000 or ore bits, see Aex E.9.. NOTE: To eet BER value target DL power level ca be chaged usig user s freely selectable algorith. 5) Measure the EIS for every directio of selected saplig gird usig two orthogoal polarizatios to obtai TRS. 6) Calculate TRS usig equatios fro chapter 6.. NOTE: To speed up sesitivity easureets o stadard settig (i.e. data speed, CL, BER target) ca be used i the easureets. However to obtai TRS result the easured EIS figures shall be oralized by DEIS = å( EISstd i - EISstd i ) i= Where EISstd is sesitivity easureet doe with stadard settig. i with o stadard settigs. is aout of referece easureet poits. EISstd i is sesitivity easureet doe To esure accuracy of TRS, the aout of referece poits easured should be at least 4. It is recoeded to spread the referece easureets equally durig the easureet tie.

53 Release 53 TS 34.4 V.3.0 (0-) The easureet procedure is based o the easureet of the spherical sesitivity patter of the DUT. The sesitivity values of the DUT at a predefied BER level are sapled i far field i a group of poits located o a spherical surface eclosig the DUT. The EIS saples are take usig a costat saple step of 30 both i theta (q) ad phi (f) directios. All the EIS saples are take with two orthogoal polarizatios, q - ad j -polarisatios. The Total Radiated Sesitivity is calculated fro the easured data by equatio i chapter Test procedure, reverberatio chaber ethod ) Sed cotiuously Up power cotrol coads to the UE. ) As the UE reaches axiu power, start sedig N5 data patter. 3) ositio the UE agaist the SAM phato 4) Set the base statio siulator to a specific output power ad perfor a BER easureet. 5) Icrease or decrease the base statio output power as eeded, ad repeat step 5 util the lowest output power is foud that gives a BER value of % ± 0.% usig 0000 or ore bits, see Aex E.9.. This correspods to thres,, S. NOTE: To eet BER value target DL power level ca be chaged usig user s freely selectable algorith. 6) Repeat step 4 ad 5 util a sufficiet uber of idepedet saples (see sectio 6..3) of easured. thres,, S has bee 7) Calculate TRS usig equatios fro chapter 6.. NOTE : The easureet procedure is based o saples of the received sigal power at the UE/MS fro a full 3 diesioal isotropic eviroet with uifor elevatio ad aziuth field distributio. The power received by the DUT is udergoig Rayleigh fadig ad is trasitted by the fixed easureet ateas. Moreover, it is iportat that the saples collected are idepedet, i order to get sufficiet accuracy of the estiated TRS value Test requireets The average TRS of low, id ad high chael i beside head positio for % BER with.kbps DL referece chael as defied i Aex C.3 of [] shall be lower tha test requireets for roaig bads show i Table The averagig shall be doe i liear scale for the TRS results of both right ad left side of the phato head. TRS average é æ = 0logê6 ç left _ low / 0 left _ id /0 left _ high /0 right _ low /0 right _ id /0 right _ high / 0 ë è I additio the axiu TRS of each easured chael i beside head positio shall be better tha iiu perforace requireets for roaig bads show i the colus Max. öù ú øû TRS = 0log ax 0 ax left _ low /0 left _ id /0 left _ high /0 right _ low /0 right _ id /0 right _ high /0 [ (,0,0,0,0,0 )]

54 Release 54 TS 34.4 V.3.0 (0-) Table 6..3: TRS test requireets for FDD roaig bads i the speech positio for the priary echaical ode Operatig Bad Uit <REFÎ or> Average Max I db/3.84 MHz II db/3.84 MHz III db/3.84 MHz IV db/3.84 MHz V db/3.84 MHz VI db/3.84 MHz VII db/3.84 MHz VIII db/3.84 MHz IX db/3.84 MHz XIX db/3.84 MHz NOTE For ower Class 3, 3bis ad 4 this shall be achieved at the axiu output power. NOTE For the UE which supports both Bad III ad Bad IX operatig frequecies, the referece level of TDB db TRS <REFÎ or> [average ad i] shall apply for Bad IX. NOTE3: Applicable for dual-ode GSM/UMTS. NOTE: If the above Test Requireet differs fro the Miiu Requireet the the Test Tolerace applied for this test is o-zero. The Test Tolerace for this test is defied ad the explaatio of how the Miiu Requireet has bee relaxed by the Test Tolerace is give i Aex D. 6.3 Total Radiated Sesitivity (TRS) for GSM MS 6.3. Defiitio ad applicability The Total Radiated Sesitivity is defied as: TRS = ò 4p é ù ê + údw êë EISq ( W; f ) EISj ( W; f ) úû Where the effective isotropic sesitivity (EIS) is defied as the power available at the atea output such as the sesitivity threshold is achieved for each polarizatio. W is the solid agle describig the directio, f is frequecy. q ad j are the orthogoal polarizatios. TRS» p N - M - åå = 0 NM é = ú ú ù ê + si 0êë EISq ( q, j; f ) EISj ( q, j; f ) û ( q ) I these forulas N ad M are the uber of saplig itervals for theta ad phi. agles. The saplig itervals are discussed further i Sectio q ad j are the easureet The TRS ca also be calculated fro easureets i a Rayleigh fadig 3 diesioal isotropic eviroet with uifor elevatio ad aziuth distributio. The calculatio of the TRS is i this case based o searchig for the lowest power received by the UE/MS for a discrete uber of field cobiatios i the chaber The power received by the UE at each discrete field cobiatio that provides a BER (or BLER) which is better tha the specified target BER/BLER level shall be averaged with other such easureets usig differet field cobiatios. By calibratig the average power trasfer fuctio, a absolute value of the TRS ca be obtaied whe the liear values of all dowlik power levels described above have bee averaged. The followig expressio ca be used to fid the TRS.

55 Release 55 TS 34.4 V.3.0 (0-) TRS æ ç N å è =» N N ( C ( - R ) ) å = ref, thres, ö ø - where ref, is the referece power trasfer fuctio for fixed easureet atea, R is the reflectio coefficiet for fixed easureet atea ad C is the path loss i the cables coectig the easureet receiver to fixed easureet atea. These paraeters are calculated fro the calibratio easureet ad are further discussed i Aex B.., is calculated by usig the followig equatio: thres thres, = M å = S thres,, M where thres S,, is the :th value of the trasfer fuctio for fixed easureet atea, which gives the BER threshold. M is the total uber of values of the BER threshold power easured for each fixed easureet atea. The requireets ad this test apply to all types of MS that support GSM for Release 7 ad later releases Miiu requireets The average TRS of low, id ad high chael i beside head positio for TCH/FS at % class II (RBER) shall be lower tha iiu perforace requireets for roaig bads show i Table The averagig shall be doe i liear scale for the TRS results of both right ad left side of the phato head. TRS average é æ = 0logê6 ç left _ low / 0 left _ id /0 left _ high /0 right _ low /0 right _ id /0 right _ high / 0 ë è I additio the axiu TRS of each easured chael i beside head positio shall be better tha iiu perforace requireets for roaig bads show i the colus Max. öù ú øû TRS = 0log ax 0 ax left _ low /0 left _ id /0 left _ high /0 right _ low /0 right _ id /0 right _ high /0 [ (,0,0,0,0,0 )] Table 6.3.: TRS iiu requireets for GSM roaig bads i the speech positio for the priary echaical ode Operatig Bad Uit <REFÎ or> Average Max GSM 850 db GSM 900 db DCS 800 db CS 900 db Note : For ower Class ad 4 this shall be achieved at the axiu output power. Note : Applicable for dual-ode GSM/UMTS. The orative referece for this clause is TS5.44 sectio 7...

56 Release 56 TS 34.4 V.3.0 (0-) Test urpose The purpose of this test is to esure thattrs average ad TRS ax of the MS is above specified liit. The lack of the receptio sesitivity decreases the coverage area at the far side fro Base Statio Method of test Iitial coditios Test eviroet: oral coditio; see TS5.00- [9] Aex A... A call is set up accordig to the geeric call set up procedure o a TCH/FS with a ARFCN i the Mid ARFCN rage, power cotrol level set to axiu power. The SS trasits Stadard Test Sigal C o the traffic chael, see TS5.00- [9] Aex A5.. The SS coads the MS to create traffic chael loop back sigallig erased fraes, see TS44.04 [34] clause Test procedure ) ositio the MS agaist the SAM phato ) The SS copares the data of the sigal that it seds to the MS with the sigal which is looped back fro the receiver after deodulatio ad decodig, ad checks the frae erasure idicatio. 3) The SS deteries the uber of residual bit error evets for the bits of class II, by exaiig sequeces of at least the iiu uber of saples of cosecutive bits of class II. Bits are take oly fro those fraes ot sigalled as erased. 4) Measure EIS fro oe easureet poit. EIS is the power trasitted fro oe specific directio to the MS causig RBERII value of.00% ± 0.%, see Aex E.9. NOTE: To eet BER value target DL power level ca be chaged usig user s freely selectable algorith. 5) Measure the EIS for every directio of selected saplig gird usig two orthogoal polarizatios to obtai TRS. 6) Calculate TRS usig equatios fro chapter ) Steps ) to 6) are repeated for TCH/FS with ARFCNs i the Low ARFCN rage ad the High ARFCN rage. NOTE : No stadard settigs: To speed up sesitivity easureets o stadard settig (i.e. data speed, CL, BER target) ca be used i the easureets. However to obtai TRS result the easured EIS figures shall be oralized by DEIS = å( EISstd i - EISstd i ) i= Where EISstd is sesitivity easureet doe with stadard settig. i with o stadard settigs. is aout of referece easureet poits. EISstd i is sesitivity easureet doe To esure accuracy of TRS, the aout of referece poits easured should be at least 4. It is recoeded to spread the referece easureets equally durig the easureet tie. The easureet procedure is based o the easureet of the spherical sesitivity patter of the DUT. The sesitivity values of the DUT at a predefied BER level are sapled i far field i a group of poits located o a closed surface eclosig the DUT. The EIS saples are take usig a costat saple step of 30 both i theta (q) ad phi (f) directios. All the EIS saples are take with two orthogoal polarizatios, q - ad j -polarisatios. The Total Radiated Sesitivity is calculated fro the easured data by equatio i chapter 6.3..

57 Release 57 TS 34.4 V.3.0 (0-) Test procedure, reverberatio chaber ethod ) ositio the UE agaist the SAM phato ) The SS copares the data of the sigal that it seds to the MS with the sigal which is looped back fro the receiver after deodulatio ad decodig, ad checks the frae erasure idicatio. 3) The SS deteries the uber of residual bit error evets for the bits of class II, by exaiig sequeces of at least the iiu uber of saples of cosecutive bits of class II. Bits are take oly fro those fraes ot sigalled as erased. 4) Set the base statio siulator to a specific output power ad perfor a BER easureet. 5) Icrease or decrease the base statio output power as eeded, ad repeat step 5 util the lowest output power is foud that gives a BER value of.00% ± 0.%, see Aex E.9.. This correspods to thres,, S. NOTE: To eet BER value target DL power level ca be chaged usig user s freely selectable algorith. 6) Repeat step 4 ad 5 util a sufficiet uber of idepedet saples (see sectio 6..3) of easured. thres,, S has bee 7) Calculate TRS usig equatios fro chapter ) Steps ) to 7) are repeated for TCH/FS with ARFCNs i the Low ARFCN rage ad the High ARFCN rage. NOTE : The easureet procedure is based o saples of the received sigal power at the UE/MS fro a full 3 diesioal isotropic eviroet with uifor elevatio ad aziuth field distributio. The power received by the DUT is udergoig Rayleigh fadig ad is trasitted by the fixed easureet ateas. Moreover, it is iportat that the saples collected are idepedet, i order to get sufficiet accuracy of the estiated TRS value Test requireets The average TRS of low, id ad high chael i beside head positio for TCH/FS at % class II (RBER) shall be lower tha test requireets for roaig bads show i Table The averagig shall be doe i liear scale for the TRS results of both right ad left side of the phato head. TRS average é æ = 0logê6 ç left _ low / 0 left _ id /0 left _ high /0 right _ low /0 right _ id /0 right _ high / 0 ë è I additio the axiu TRS of each easured chael i beside head positio shall be better tha iiu perforace requireets for roaig bads show i the colus Max. öù ú øû TRS = 0log ax 0 ax left _ low /0 left _ id /0 left _ high /0 right _ low /0 right _ id /0 right _ high /0 [ (,0,0,0,0,0 )]

58 Release 58 TS 34.4 V.3.0 (0-) Table 6.3.: TRS test requireets for GSM roaig bads i the speech positio for the priary echaical ode Operatig Bad Uit <REFÎ or> Average Max GSM 850 db GSM 900 db E-GSM 900 db DCS 800 db CS 900 db Note : For ower Class ad 4 this shall be achieved at the axiu output power. Note : Applicable for dual-ode GSM/UMTS. Note 3: The test requireets for E-GSM 900 ad -GSM 900 are specified fro GSM 900 iiu requireets i table NOTE: If the above Test Requireet differs fro the Miiu Requireet the the Test Tolerace applied for this test is o-zero. The Test Tolerace for this test is defied ad the explaatio of how the Miiu Requireet has bee relaxed by the Test Tolerace is give i Aex D. 6.4 Total Radiated Sesitivity (TRS) for TDD UE 6.4. Defiitio ad applicability The Total Radiated Sesitivity is defied as: TRS = ò é ê êë EIS q 4p + ( W; f ) EIS j ù údw ( W; f ) úû Where the effective isotropic sesitivity (EIS) is defied as the power available at the atea output such as the sesitivity threshold is achieved for each polarizatio. W is the solid agle describig the directio, f is frequecy. q ad j are the orthogoal polarizatios. TRS» p N - M - åå = 0 NM é = ú ú ù ê + si 0êë EISq ( q, j; f ) EISj ( q, j; f ) û ( q ) I these forulas N ad M are the uber of saplig itervals for theta ad phi. agles. The saplig itervals are discussed further i Sectio 6... q ad j are the easureet The TRS ca also be calculated fro easureets i a Rayleigh fadig 3 diesioal isotropic eviroet with uifor elevatio ad aziuth distributio. The calculatio of the TRS is i this case based o searchig for the lowest power received by the UE/MS for a discrete uber of field cobiatios i the chaber The power received by the UE at each discrete field cobiatio that provides a BER (or BLER) which is better tha the specified target BER/BLER level shall be averaged with other such easureets usig differet field cobiatios. By calibratig the average power trasfer fuctio, a absolute value of the TRS ca be obtaied whe the liear values of all dowlik power levels described above have bee averaged. The followig expressio ca be used to fid the TRS. TRS æ ç N å è =» N N ( C ( - R ) ) å = ref, thres, ö ø -

59 Release 59 TS 34.4 V.3.0 (0-) where ref, is the referece power trasfer fuctio for fixed easureet atea, R is the reflectio coefficiet for fixed easureet atea ad C is the path loss i the cables coectig the easureet receiver to fixed easureet atea. These paraeters are calculated fro the calibratio easureet ad are further discussed i Aex B.., is calculated by usig the followig equatio: thres thres, = M å = S thres,, M where thres S,, is the :th value of the trasfer fuctio for fixed easureet atea, which gives the BER threshold. M is the total uber of values of the BER threshold power easured for each fixed easureet atea. The requireets ad this test apply to all types of UTRA for the TDD UE for Release 8 ad later releases Miiu requireets The average TRS of low, id ad high chael i beside head positio for % ± 0.% BER with.kbps DL referece chael as defied i Aex C.3 of TS5.0 [] shall be lower tha iiu perforace requireets for roaig bads show i Table The averagig shall be doe i liear scale for the TRS results of both right ad left side of the phato head. TRS average é æ = 0logê6 ç left _ low / 0 left _ id /0 left _ high /0 right _ low /0 right _ id /0 right _ high / 0 ë è I additio the axiu TRS of each easured chael i beside head positio shall be better tha iiu perforace requireets for roaig bads show i the colus Max. öù ú øû TRS = 0log ax 0 ax left _ low /0 left _ id /0 left _ high /0 right _ low /0 right _ id /0 right _ high /0 [ (,0,0,0,0,0 )] Table 6.4.: TRS iiu requireet for UTRA LCR TDD roaig bads i the speech positio for the priary echaical ode Note: Operatig Bad Uit <REFÎor> - - Average Max a db/.8 MHz b db/.8 MHz TBD TBD c db/.8 MHz TBD TBD d db/.8 MHz TBD TBD e db/.8 MHz f db/.8 MHz Applicable for dual-ode GSM/UTRA LCR TDD. The orative referece for this clause is TS 5.44 sectio Test urpose TRS The purpose of this test is to esure that TRS average ad ax of the UE are above specified liit. The lack of the receptio sesitivity decreases the coverage area at the far side fro Node B.

60 Release 60 TS 34.4 V.3.0 (0-) Method of test Iitial coditios Test eviroet: oral; see TS34. [3] clause G... ) Set the SS dowlik physical chaels accordig to settigs i Table 6.4.A. The DL power level should be set to esure 0% BER at.kbps data rate at the whole 3D iitial sca. ) ower o the UE. 3) A call is set up accordig to the Geeric call setup procedure. The power cotrol algorith shall be set to ower Cotrol Algorith. 4) Eter the UE ito loopback test ode ad start the loopback test. See TS [0] ad TS [] ad Aex C of TS 34.[3]. For details regardig geeric call setup procedure ad loopback test. Table 6.4.A: Dowlik hysical Chaels trasitted durig a coectio hysical Chael ower Ior -75 db DwCH DwCH_Ec / Ior = 0 db CCCH -CCCH_Ec / Ior = -3 db SCCCH S-CCCH_Ec / Ior = -6 db ICH ICH_Ec / Ior = -6 db FACH FACH_Ec / Ior = -6 db DL DCH DCH_Ec / Ior = 0 db Test procedure ) Sed cotiuously Up power cotrol coads to the UE. ) As the UE reaches axiu power, start sedig N5 data patter. 3) ositio the UE agaist the SAM phato. 4) Measure EIS fro oe easureet poit. EIS is the power trasitted fro oe specific directio to the UE causig BER value of % ± 0.% usig or ore bits, see Aex E.9.3. The DL power step size shall be o bigger tha 0.5dB whe the RF level is ear the TDD UE sesitivity level. NOTE: To eet BER value target DL power level ca be chaged usig user s freely selectable algorith. 5) Measure the EIS for every directio of selected saplig gird usig two orthogoal polarizatios to obtai TRS. 6) Calculate TRS usig equatios fro chapter 6.4. NOTE: To speed up sesitivity easureets o stadard settig (i.e. data speed, CL, BER target) ca be used i the easureets. However to obtai TRS result the easured EIS figures shall be oralized by DEIS = å( EISstd i - EISstd i ) i= Where EISstd i is sesitivity easureet doe with stadard settig. EISstd i is sesitivity easureet doe with o stadard settigs. is aout of referece easureet poits. To esure accuracy of TRS, the aout of referece poits easured should be at least 4. It is recoeded to spread the referece easureets equally durig the easureet tie. The easureet procedure is based o the easureet of the spherical sesitivity patter of the DUT. The sesitivity values of the DUT at a predefied BER level are sapled i far field i a group of poits located o a

61 Release 6 TS 34.4 V.3.0 (0-) spherical surface eclosig the DUT. The EIS saples are take usig a costat saple step of 30 both i theta (q) ad phi (f) directios. All the EIS saples are take with two orthogoal polarizatios, q - ad j -polarisatios. The Total Radiated Sesitivity is calculated fro the easured data by equatio i chapter Test procedure, reverberatio chaber ethod ) Sed cotiuously Up power cotrol coads to the UE. ) As the UE reaches axiu power, start sedig N5 data patter. 3) ositio the UE agaist the SAM phato 4) Set the base statio siulator to a specific output power ad perfor a BER easureet. 5) Icrease or decrease the base statio output power as eeded, ad repeat step 5 util the lowest output power is foud that gives a BER value of % ± 0.% usig or ore bits, see Aex E.9.3. This correspods to S thres,, sesitivity level.. The DL power step size shall be o bigger tha 0.5dB whe the RF level is ear the TDD UE NOTE: To eet BER value target DL power level ca be chaged usig user s freely selectable algorith. 6) Repeat step 4 ad 5 util a sufficiet uber of idepedet saples (see sectio 6..3) of easured. thres,, S has bee 7) Calculate TRS usig equatios fro chapter 6.4. NOTE : The easureet procedure is based o saples of the received sigal power at the UE/MS fro a full 3 diesioal isotropic eviroet with uifor elevatio ad aziuth field distributio. The power received by the DUT is udergoig Rayleigh fadig ad is trasitted by the fixed easureet ateas. Moreover, it is iportat that the saples collected are idepedet, i order to get sufficiet accuracy of the estiated TRS value Test requireets The average TRS of low, id ad high chael i beside head positio for % ± 0.% BER with.kbps DL referece chael as defied i Aex C.3 of TS5.0 [] shall be lower tha test requireets for roaig bads show i Table The averagig shall be doe i liear scale for the TRS results of both right ad left side of the phato head. TRS average é æ = 0logê6 ç left _ low / 0 left _ id /0 left _ high /0 right _ low /0 right _ id /0 right _ high / 0 ë è I additio the axiu TRS of each easured chael i beside head positio shall be better tha iiu perforace requireets for roaig bads show i the colus Max. öù ú øû TRS = 0log ax 0 ax left _ low /0 left _ id /0 left _ high /0 right _ low /0 right _ id /0 right _ high /0 [ (,0,0,0,0,0 )]

62 Release 6 TS 34.4 V.3.0 (0-) Table 6.4.: TRS test requireet for UTRA LCR TDD roaig bads i the speech positio for the priary echaical ode Note: Operatig Bad Uit <REFÎor> - - Average Max a db/.8 MHz b db/.8 MHz TBD TBD c db/.8 MHz TBD TBD d db/.8 MHz TBD TBD e db/.8 MHz f db/.8 MHz Applicable for dual-ode GSM/UTRA LCR TDD. NOTE: If the above Test Requireet differs fro the Miiu Requireet the the Test Tolerace applied for this test is o-zero. The Test Tolerace for this test is defied ad the explaatio of how the Miiu Requireet has bee relaxed by the Test Tolerace is give i Aex D. 6.5 Total Radiated Sesitivity (TRS) for FDD UE usig LME Editor s ote: This test case is icoplete. The followig aspects are either issig or ot yet deteried: The TRS Miiu erforace Requireet for this test are udefied The Test Requireets ad related Test Toleraces applicable for this test are udefied 6.5. Defiitio ad applicability The Total Radiated Sesitivity (TRS) is a easure of the iiu power required to achieve a specified Bit Error Rate (BER). The TRS is defied as: TRS = ò 4p é ù ê + údw êë EISq ( W; f ) EISj ( W; f ) úû Where the effective isotropic sesitivity (EIS) is defied as the power available at the atea output such as the sesitivity threshold is achieved for each polarizatio. W is the solid agle describig the directio, f is frequecy. q ad j are the orthogoal polarizatios. TRS» p N - M - åå = 0 NM é = ú ú ù ê + si 0êë EISq ( q, j; f ) EISj ( q, j; f ) û I these forulas N ad M are the uber of saplig itervals for theta ad phi. agles. The saplig itervals are discussed further i Sectio 6... ( q ) q ad j are the easureet The TRS ca also be calculated fro easureets i a Rayleigh fadig 3 diesioal isotropic eviroet with i average uifor elevatio ad aziuth distributio. The calculatio of the TRS is i this case based o searchig for the lowest power received by the LME for a discrete uber of field cobiatios i the chaber that gives a BER that is better tha the specified target BER level. By calibratig the average power trasfer fuctio, a absolute value of the TRS ca be obtaied. The followig expressio ca be used to fid the TRS. TRS æ ç N å è =» N N ( C ( - R ) ) å = ref, thres, ö ø -

63 Release 63 TS 34.4 V.3.0 (0-) where ref, is the referece power trasfer fuctio for fixed easureet atea, R is the reflectio coefficiet for fixed easureet atea ad C is the path loss i the cables coectig the easureet receiver to fixed easureet atea. These paraeters are calculated fro the calibratio easureet ad are further discussed i Aex B.., is calculated by usig the followig equatio: thres thres, = M å = S thres,, M where thres S,, is the :th value of the trasfer fuctio for fixed easureet atea, which gives the BER threshold. M is the total uber of values of the BER threshold power easured for each fixed easureet atea. The requireets ad this test apply to all types of UTRA for the FDD UE for Release ad later releases that support LME. NOTE: This test case ca be optioally executed for Release 7 ad oward UE s supportig LME feature Miiu Requireets The average TRS of low, id ad high chael for % BER with.kbps DL referece chael as defied i Aex C.3 of TS5.0 [] shall be lower tha iiu perforace requireets for roaig bads show i Table The averagig shall be doe i liear scale for the TRS results. TRS average é æ = 0logê3 ç + + low /0 id /0 high / 0 ë è0 0 0 I additio the axiu TRS of each easured chael shall be better tha iiu perforace requireets for roaig bads show i the colus Max. öù ú øû TRS = /0 low /0 /0 id high [ (,0, )] ax 0log ax 0 0 Table 6.5.: TRS iiu requireets for FDD LME devices i data trasfer positio Operatig Bad Uit <REFÎ or> Average Max I db/3.84 MHz TBD TBD II db/3.84 MHz TBD TBD III db/3.84 MHz TBD TBD IV db/3.84 MHz TBD TBD V db/3.84 MHz TBD TBD VI db/3.84 MHz TBD TBD VII db/3.84 MHz TBD TBD VIII db/3.84 MHz TBD TBD IX db/3.84 MHz TBD TBD IX db/3.84 MHz TBD TBD NOTE For ower Class 3, 3bis ad 4 this shall be achieved at the axiu output power. NOTE Applicable for dual-ode GSM/UMTS. NOTE 3 Applicable for USB plug-i devices. The orative referece for this clause is TS5.44 [] sectio

64 Release 64 TS 34.4 V.3.0 (0-) Test purpose The purpose of this test is to esure that TRS average ad ax receptio sesitivity decreases the coverage area at the far side fro Node B Method of test Iitial coditios Test eviroet: oral; see TS 34.- [3] clause G... ) Set the SS dowlik physical chaels accordig to settigs i Table TRS of the UE is above specified liit. The lack of the ) Coect the plug-i UE to a laptop groud plae phato. ower o the plug-i UE. The real fuctioal laptop supplies power to the plug-i UE. 3) A call is set up accordig to the Geeric call setup procedure. The power cotrol algorith shall be set to ower Cotrol Algorith. Copressed ode shall be set to OFF. 4) Eter the UE ito loopback test ode ad start the loopback test. See TS [0] ad TS [] for details regardig geeric call setup procedure ad loopback test. Table 6.5.: Dowlik hysical Chaels trasitted durig a coectio hysical Chael ower CICH CICH_Ec / DCH_Ec = 7 db -CCCH -CCCH_Ec/ DCH_Ec = 5 db SCH SCH_Ec / DCH_Ec = 5 db ICH ICH_Ec / DCH_Ec = db DCH Test depedet power rocedure ) Sed cotiuously Up power cotrol coads to the plug-i UE. ) As the plug-i UE reaches axiu power, start sedig N5 data patter. 3) ositio the plug-i UE ito the USB coector i accordace with the aufacturer recoeded priary echaical ode. I the absece of such a recoedatio positio the plug-i UE so that it is horizotally plugged ito the horizotal USB coector. 4) Measure EIS fro oe easureet poit. EIS is the power trasitted fro oe specific directio to the plugi UE causig BER value of % ± 0.% usig 0000 or ore bits, see Aex E.9.. NOTE: To eet BER value target DL power level ca be chaged usig user s freely selectable algorith. 5) Measure the EIS for every directio of selected saplig gird usig two orthogoal polarizatios to obtai TRS. 6) Calculate TRS usig equatios fro clause 6.5. NOTE: To speed up sesitivity easureets o stadard settig (i.e. data speed, CL, BER target) ca be used i the easureets. However to obtai TRS result the easured EIS figures shall be oralized by DEIS = å( EISstd i - EISstd i ) i= Where EISstd is sesitivity easureet doe with stadard settig. i with o stadard settigs. is aout of referece easureet poits. EISstd i is sesitivity easureet doe

65 Release 65 TS 34.4 V.3.0 (0-) To esure accuracy of TRS, the aout of referece poits easured should be at least 4. It is recoeded to spread the referece easureets equally durig the easureet tie. The easureet procedure is based o the easureet of the spherical sesitivity patter of the DUT. The sesitivity values of the DUT at a predefied BER level are sapled i far field i a group of poits located o a spherical surface eclosig the DUT. The EIS saples are take usig a costat saple step of 30 both i theta (q) ad phi (f) directios. All the EIS saples are take with two orthogoal polarizatios, q - ad j -polarisatios. The Total Radiated Sesitivity is calculated fro the easured data by equatio i clause Test procedure, reverberatio chaber ethod ) Sed cotiuously Up power cotrol coads to the plug-i UE. ) As the plug-i UE reaches axiu power, start sedig N5 data patter. 3) ositio the plug-i UE ito the USB coector i accordace with the aufacturer recoeded priary echaical ode. I the absece of such a recoedatio positio the plug-i UE so that it is horizotally plugged ito the horizotal USB coector. 4) Set the base statio siulator to a specific output power ad perfor a BER easureet. 5) Icrease or decrease the base statio output power as eeded, ad repeat step 5 util the lowest output power is foud that gives a BER value of % ± 0.% usig 0000 or ore bits, see Aex E.9.. This correspods to thres,, S. NOTE : To eet BER value target DL power level ca be chaged usig user s freely selectable algorith. 6) Repeat step 4 ad 5 util a sufficiet uber of idepedet saples (see sectio 6..3) of easured. thres,, S has bee 7) Calculate TRS usig equatios fro clause 6.5. NOTE : The easureet procedure is based o saples of the received sigal power at the UE/MS fro a full 3 diesioal isotropic eviroet with uifor elevatio ad aziuth field distributio. The power received by the DUT is udergoig Rayleigh fadig ad is trasitted by the fixed easureet ateas. Moreover, it is iportat that the saples collected are idepedet, i order to get sufficiet accuracy of the estiated TRS value Test requireets The average TRS of low, id ad high chael for % BER with.kbps DL referece chael as defied i Aex C.3 of [] shall be lower tha test requireets for roaig bads show i Table The averagig shall be doe i liear scale for the TRS results. TRS average é æ = 0logê3 ç + + low /0 id /0 high / 0 ë è0 0 0 I additio the axiu TRS of each easured chael shall be better tha iiu perforace requireets for roaig bads show i the colus Max. öù ú øû /0 low /0 /0 id high [ (,0, )] ax 0log ax 0 0 TRS =

66 Release 66 TS 34.4 V.3.0 (0-) Table 6.5.3: TRS test requireets for FDD LME devices i data trasfer positio Operatig Bad Uit <REFÎ or> Average Max I db/3.84 MHz TBD + TT TBD + TT II db/3.84 MHz TBD + TT TBD + TT III db/3.84 MHz TBD + TT TBD + TT IV db/3.84 MHz TBD + TT TBD + TT V db/3.84 MHz TBD + TT TBD + TT VI db/3.84 MHz TBD + TT TBD + TT VII db/3.84 MHz TBD + TT TBD + TT VIII db/3.84 MHz TBD + TT TBD + TT IX db/3.84 MHz TBD + TT TBD + TT XIX db/3.84 MHz TBD + TT TBD + TT NOTE For ower Class 3, 3bis ad 4 this shall be achieved at the axiu output power. NOTE Applicable for dual-ode GSM/UMTS. NOTE 3 Applicable for USB plug-i devices. NOTE: If the above Test Requireet differs fro the Miiu Requireet the the Test Tolerace applied for this test is o-zero. The Test Tolerace for this test is defied ad the explaatio of how the Miiu Requireet has bee relaxed by the Test Tolerace is give i Aex D. 6.6 Total Radiated Sesitivity (TRS) for GSM MS usig LME Editor s ote: This test case is ot copleted Miiu Requireets are issig Test requireets ad related TT are issig 6.6. Defiitio ad applicability The Total Radiated Sesitivity is defied as: TRS = ò 4p é ù ê + údw êë EISq ( W; f ) EISj ( W; f ) úû Where the effective isotropic sesitivity (EIS) is defied as the power available at the atea output such as the sesitivity threshold is achieved for each polarizatio. W is the solid agle describig the directio, f is frequecy. q ad j are the orthogoal polarizatios. TRS» p N - M - åå = 0 NM é = ú ú ù ê + si 0êë EISq ( q, j; f ) EISj ( q, j; f ) û I these forulas N ad M are the uber of saplig itervals for theta ad phi. agles. The saplig itervals are discussed further i Sectio ( q ) q ad j are the easureet The TRS ca also be calculated fro easureets i a Rayleigh fadig 3 diesioal isotropic eviroet with uifor elevatio ad aziuth distributio. The calculatio of the TRS is i this case based o searchig for the lowest power received by the LME for a discrete uber of field cobiatios i the chaber The power received by the UE at each discrete field cobiatio that provides a BLER which is better tha the specified target BLER level shall be averaged with other such easureets usig differet field cobiatios. By calibratig the average power trasfer fuctio, a absolute value of the TRS ca be obtaied whe the liear values of all dowlik power levels described above have bee averaged. The followig expressio ca be used to fid the TRS.

67 Release 67 TS 34.4 V.3.0 (0-) TRS æ ç N å è =» N N ( C ( - R ) ) å = ref, thres, ö ø - where ref, is the referece power trasfer fuctio for fixed easureet atea, R is the reflectio coefficiet for fixed easureet atea ad C is the path loss i the cables coectig the easureet receiver to fixed easureet atea. These paraeters are calculated fro the calibratio easureet ad are further discussed i Aex B.., is calculated by usig the followig equatio: thres thres, = M å = S thres,, M where thres S,, is the :th value of the trasfer fuctio for fixed easureet atea, which gives the BLER threshold. M is the total uber of values of the BLER threshold power easured for each fixed easureet atea. The requireets ad this test apply to all types of LME that support GSM for Release ad later releases. NOTE: This test case ca be optioally executed for Release 7 ad oward MS s supportig LME feature Miiu requireets The average TRS of low, id ad high chael of the LME i the data trasfers positio for GRS DTCH/CS at 0% BLER shall be lower tha iiu perforace requireets for roaig bads show i Table The averagig shall be doe i liear scale for the TRS results. TRS average é æ = 0logê3 ç + + low /0 id /0 high / 0 ë è0 0 0 I additio the axiu TRS of each easured chael i the data trasfers positio shall be better tha iiu perforace requireets for roaig bads show i the colus Max. TRS = /0 low /0 /0 id high [ (,0, )] ax 0log ax 0 0 öù ú øû Table 6.6.: TRS iiu requireets for GSM LME devices i data trasfers positio Operatig Bad Uit <REFÎ or> Average Max GSM 850 db TBD TBD GSM 900 db TBD TBD DCS 800 db TBD TBD CS 900 db TBD TBD NOTE : For ower Class ad 4 this shall be achieved at the axiu output power. NOTE : Applicable for dual-ode GSM/UMTS. NOTE 3: Applicable for USB plug-i devices. The orative referece for this clause is TS5.44 sectio 73...

68 Release 68 TS 34.4 V.3.0 (0-) Test urpose The purpose of this test is to esure that TRS Average ad TRS ax of the MS is above specified liit. The lack of the receptio sesitivity decreases the coverage area at the far side fro Base Statio Method of test Iitial coditios Test eviroet: oral coditio; see TS5.00- [9] Aex A... A call is set up accordig to the procedure o a GRS DTCH/CS with a ARFCN i the Mid ARFCN rage, power cotrol level set to axiu power. The SS trasits Stadard Test Sigal C o the traffic chael, see TS5.00- [9] Aex A5.. The SS coads the MS to create traffic chael loop back, see TS44.04 [34] clause 5.4. The LME shall be tested usig the Laptop Groud lae hato as described i Aex A Test procedure ) ositio the LME usig the Laptop Groud lae hato described i Aex A.. ad accordig to DUT positioig described i clause 6... ) The SS copares the data of the sigal that it seds to the MS with the sigal which is looped back fro the receiver after deodulatio ad decodig. 3) The SS deteries the uber of block error evets, by exaiig sequeces of at least the iiu uber of saples of cosecutive blocks. 4) Measure EIS fro oe easureet poit. EIS is the power trasitted fro oe specific directio to the MS causig BLER value of 0% ± %, see Aex E. 9. NOTE: To eet BLER value target DL power level ca be chaged usig user s freely selectable algorith. 5) Measure the EIS for every directio of selected saplig gird usig two orthogoal polarizatios to obtai TRS. 6) Calculate TRS usig equatios fro clause ) Steps ) to 6) are repeated for GRS DTCH/CS with ARFCNs i the Low ARFCN rage ad the High ARFCN rage. NOTE : No stadard settigs: To speed up sesitivity easureets o stadard settig (i.e. data speed, CL, BLER target) ca be used i the easureets. However to obtai TRS result the easured EIS figures shall be oralized by DEIS = å( EISstd i - EISstd i ) i= Where EISstd is sesitivity easureet doe with stadard settig. i with o stadard settigs. is aout of referece easureet poits. EISstd i is sesitivity easureet doe To esure accuracy of TRS, the aout of referece poits easured should be at least 4. It is recoeded to spread the referece easureets equally durig the easureet tie. The easureet procedure is based o the easureet of the spherical sesitivity patter of the DUT. The sesitivity values of the DUT at a predefied BLER level are sapled i far field i a group of poits located o a closed surface eclosig the DUT. The EIS saples are take usig a costat saple step of 30 both i theta (q)

69 Release 69 TS 34.4 V.3.0 (0-) ad phi (f) directios. All the EIS saples are take with two orthogoal polarizatios, q - ad j -polarisatios. The Total Radiated Sesitivity is calculated fro the easured data by equatio i clause Test procedure, reverberatio chaber ethod ) ositio the LME usig the Laptop Groud lae hato described i aex A.. ad accordig to DUT positioig described i clause 6.. ) The SS copares the data of the sigal that it seds to the MS with the sigal which is looped back fro the receiver after deodulatio ad decodig. 3) The SS deteries the uber of block error evets, by exaiig sequeces of at least the iiu uber of saples of cosecutive blocks. 4) Set the base statio siulator to a specific output power ad perfor a BLER easureet. 5) Icrease or decrease the base statio output power as eeded, ad repeat step 5 util the lowest output power is foud that gives a BLER value of 0% ± %, see Aex E.9.. This correspods to thres,, S. NOTE: To eet BLER value target DL power level ca be chaged usig user s freely selectable algorith. 6) Repeat step 4 ad 5 util a sufficiet uber of idepedet saples (see sectio 6..3) of easured. thres,, S has bee 7) Calculate TRS usig equatios fro clause ) Steps ) to 7) are repeated for GRS DTCH/CS with ARFCNs i the Low ARFCN rage ad the High ARFCN rage. NOTE : The easureet procedure is based o saples of the received sigal power at the UE/MS fro a full 3 diesioal isotropic eviroet with uifor elevatio ad aziuth field distributio. The power received by the DUT is udergoig Rayleigh fadig ad is trasitted by the fixed easureet ateas. Moreover, it is iportat that the saples collected are idepedet, i order to get sufficiet accuracy of the estiated TRS value Test requireets The average TRS of low, id ad high chael i the data trasfers positio for GRS DTCH/CS at 0% BLER shall be lower tha test requireets for roaig bads show i Table The averagig shall be doe i liear scale for the TRS results. TRS average é æ = 0logê3 ç + + low /0 id /0 high / 0 ë è0 0 0 I additio the axiu TRS of each easured chael i the data trasfers positio shall be better tha iiu perforace requireets for roaig bads show i the colus Max. /0 low /0 /0 id high [ (,0, )] ax 0log ax 0 0 TRS = öù ú øû

70 Release 70 TS 34.4 V.3.0 (0-) Table 6.6.: TRS test requireets for GSM LME devices i data trasfers positio Operatig Bad Uit <REFÎ or> Average Max GSM 850 db TBD TBD GSM 900 db TBD TBD DCS 800 db TBD TBD CS 900 db TBD TBD NOTE : For ower Class ad 4 this shall be achieved at the axiu output power. NOTE : Applicable for dual-ode GSM/UMTS. NOTE 3: Applicable for USB plug-i devices. NOTE: If the above Test Requireet differs fro the Miiu Requireet the the Test Tolerace applied for this test is o-zero. The Test Tolerace for this test is defied ad the explaatio of how the Miiu Requireet has bee relaxed by the Test Tolerace is give i Aex D. 6.7 Total Radiated Sesitivity (TRS) for TDD UE usig LME Editor s ote: This test case is icoplete. The followig aspects are either issig or ot yet deteried: The TR Miiu erforace Requireet for this test are udefied The Test Requireets ad related Test Toleraces applicable for this test are udefied 6.7. Defiitio ad applicability The Total Radiated Sesitivity (TRS) is a easure of the iiu power required to achieve a specified Bit Error Rate (BER). The TRS is defied as: TRS = ò 4p é ù ê + údw êë EISq ( W; f ) EISj ( W; f ) úû Where the effective isotropic sesitivity (EIS) is defied as the power available at the atea output such as the sesitivity threshold is achieved for each polarizatio. W is the solid agle describig the directio, f is frequecy. q ad j are the orthogoal polarizatios. TRS» p N - M - åå = 0 NM é = ú ú ù ê + si 0êë EISq ( q, j; f ) EISj ( q, j; f ) û I these forulas N ad M are the uber of saplig itervals for theta ad phi. agles. The saplig itervals are discussed further i Sectio 6... ( q ) q ad j are the easureet The TRS ca also be calculated fro easureets i a Rayleigh fadig 3 diesioal isotropic eviroet with uifor elevatio ad aziuth distributio. The calculatio of the TRS is i this case based o searchig for the lowest power received by the UE/MS for a discrete uber of field cobiatios i the chaber The power received by the UE at each discrete field cobiatio that provides a BER which is better tha the specified target BER level shall be averaged with other such easureets usig differet field cobiatios. By calibratig the average power trasfer fuctio, a absolute value of the TRS ca be obtaied whe the liear values of all dowlik power levels described above have bee averaged. The followig expressio ca be used to fid the TRS.

71 Release 7 TS 34.4 V.3.0 (0-) TRS æ ç N å è =» N N ( C ( - R ) ) å = ref, thres, ö ø - where ref, is the referece power trasfer fuctio for fixed easureet atea, R is the reflectio coefficiet for fixed easureet atea ad C is the path loss i the cables coectig the easureet receiver to fixed easureet atea. These paraeters are calculated fro the calibratio easureet ad are further discussed i Aex B.., is calculated by usig the followig equatio: thres thres, = M å = S thres,, M where thres S,, is the :th value of the trasfer fuctio for fixed easureet atea, which gives the BER threshold. M is the total uber of values of the BER threshold power easured for each fixed easureet atea. The requireets ad this test apply to all types of UTRA for the TDD UE for Release ad later releases that support LME. NOTE: This test case ca be optioally executed for Release 7 ad oward UE s supportig LME feature Miiu Requireets The average TRS of low, id ad high chael for % BER with.kbps DL referece chael as defied i Aex C.3 of TS 34. [3] shall be lower tha iiu perforace requireets for roaig bads show i Table The averagig shall be doe i liear scale for the TRS results. TRS average é æ = 0logê3 ç + + low /0 id /0 high / 0 ë è0 0 0 I additio the axiu TRS of each easured chael shall be better tha iiu perforace requireets for roaig bads show i the colus Max. öù ú øû TRS = /0 low /0 /0 id high [ (,0, )] ax 0log ax 0 0 Table 6.7.: TRS iiu requireets for TDD LME devices i data trasfer positio Operatig Bad Uit <REFÎor> - - Average Max a db/.8 MHz TBD TBD b db/.8 MHz TBD TBD c db/.8 MHz TBD TBD d db/.8 MHz TBD TBD e db/.8 MHz TBD TBD f db/.8 MHz TBD TBD NOTE : Applicable for dual-ode GSM/UTRA LCR TDD. NOTE : Applicable for USB plug-i devices. The orative referece for this clause is TS5.44 [] sectio

72 Release 7 TS 34.4 V.3.0 (0-) Test purpose The purpose of this test is to esure that TRS average ad ax receptio sesitivity decreases the coverage area at the far side fro Node B Method of test Iitial coditios Test eviroet: oral; see TS34. [3] clause G... TRS of the UE is above specified liit. The lack of the ) Set the SS dowlik physical chaels accordig to settigs i Table The DL power level should be set to esure 0% BER at.kbps data rate at the whole 3D iitial sca. ) Coect the plug-i UE to a laptop groud plae phato. ower o the plug-i UE. The real fuctioal laptop supplies power to the plug-i UE. 3) A call is set up accordig to the Geeric call setup procedure. The power cotrol algorith shall be set to ower Cotrol Algorith. 4) Eter the UE ito loopback test ode ad start the loopback test. See TS [0] ad TS [] ad Aex C of TS 34.[3]. For details regardig geeric call setup procedure ad loopback test. Table 6.7.: Dowlik hysical Chaels trasitted durig a coectio hysical Chael ower Ior -75 db DwCH DwCH_Ec / Ior = 0 db CCCH -CCCH_Ec / Ior = -3 db SCCCH S-CCCH_Ec / Ior = -6 db ICH ICH_Ec / Ior = -6 db FACH FACH_Ec / Ior = -6 db DL DCH DCH_Ec / Ior = 0 db rocedure ) Sed cotiuously Up power cotrol coads to the plug-i UE. ) As the plug-i UE reaches axiu power, start sedig N5 data patter. 3) ositio the plug-i UE ito the USB coector i accordace with the aufacturer recoeded priary echaical ode. I the absece of such a recoedatio positio the plug-i UE so that it is horizotally plugged ito the horizotal USB coector. 4) Measure EIS fro oe easureet poit. EIS is the power trasitted fro oe specific directio to the UE causig BER value of % ± 0.% usig or ore bits, see Aex E.9.3. The DL power step size shall be o bigger tha 0.5dB whe the RF level is ear the TDD UE sesitivity level. NOTE: To eet BER value target DL power level ca be chaged usig user s freely selectable algorith. 5) Measure the EIS for every directio of selected saplig gird usig two orthogoal polarizatios to obtai TRS. 6) Calculate TRS usig equatios fro clause 6.7. NOTE: To speed up sesitivity easureets o stadard settig (i.e. data speed, CL, BER target) ca be used i the easureets. However to obtai TRS result the easured EIS figures shall be oralized by DEIS = å( EISstd i - EISstd i ) i=

73 Release 73 TS 34.4 V.3.0 (0-) Where EISstd is sesitivity easureet doe with stadard settig. i with o stadard settigs. is aout of referece easureet poits. EISstd i is sesitivity easureet doe To esure accuracy of TRS, the aout of referece poits easured should be at least 4. It is recoeded to spread the referece easureets equally durig the easureet tie. The easureet procedure is based o the easureet of the spherical sesitivity patter of the DUT. The sesitivity values of the DUT at a predefied BER level are sapled i far field i a group of poits located o a spherical surface eclosig the DUT. The EIS saples are take usig a costat saple step of 30 both i theta (q) ad phi (f) directios. All the EIS saples are take with two orthogoal polarizatios, q - ad j -polarisatios. The Total Radiated Sesitivity is calculated fro the easured data by equatio i clause Test procedure, reverberatio chaber ethod ) Sed cotiuously Up power cotrol coads to the plug-i UE. ) As the plug-i UE reaches axiu power, start sedig N5 data patter. 3) ositio the plug-i UE ito the USB coector i accordace with the aufacturer recoeded priary echaical ode. I the absece of such a recoedatio positio the plug-i UE so that it is horizotally plugged ito the horizotal USB coector. 4) Set the base statio siulator to a specific output power ad perfor a BER easureet. 5) Icrease or decrease the base statio output power as eeded, ad repeat step 5 util the lowest output power is foud that gives a BER value of % ± 0.% usig or ore bits, see Aex E.9.3. This correspods to S thres,, sesitivity level.. The DL power step size shall be o bigger tha 0.5dB whe the RF level is ear the TDD UE NOTE: To eet BER value target DL power level ca be chaged usig user s freely selectable algorith. 6) Repeat step 4 ad 5 util a sufficiet uber of idepedet saples (see sectio 6..3) of easured. thres,, S has bee 7) Calculate TRS usig equatios fro clause 6.7. NOTE : The easureet procedure is based o saples of the received sigal power at the UE/MS fro a full 3 diesioal isotropic eviroet with uifor elevatio ad aziuth field distributio. The power received by the DUT is udergoig Rayleigh fadig ad is trasitted by the fixed easureet ateas. Moreover, it is iportat that the saples collected are idepedet, i order to get sufficiet accuracy of the estiated TRS value Test requireets The average TRS of low, id ad high chael for % BER with.kbps DL referece chael as defied i Aex C.3 of TS 34. [3] shall be lower tha test requireets for roaig bads show i Table The averagig shall be doe i liear scale for the TRS results. TRS average é æ = 0logê3 ç + + low /0 id /0 high / 0 ë è0 0 0 I additio the axiu TRS of each easured chael shall be better tha iiu perforace requireets for roaig bads show i the colus Max. öù ú øû TRS = /0 low /0 /0 id high [ (,0, )] ax 0log ax 0 0

74 Release 74 TS 34.4 V.3.0 (0-) Table 6.7.3: TRS test requireets for TDD LME devices i data trasfer positio Operatig Bad Uit <REFÎor> - - Average Max a db/.8 MHz TBD + TT TBD + TT b db/.8 MHz TBD + TT TBD + TT c db/.8 MHz TBD + TT TBD + TT d db/.8 MHz TBD + TT TBD + TT e db/.8 MHz TBD + TT TBD + TT f db/.8 MHz TBD + TT TBD + TT NOTE : Applicable for dual-ode GSM/UTRA LCR TDD. NOTE : Applicable for USB plug-i devices. NOTE: If the above Test Requireet differs fro the Miiu Requireet the the Test Tolerace applied for this test is o-zero. The Test Tolerace for this test is defied ad the explaatio of how the Miiu Requireet has bee relaxed by the Test Tolerace is give i Aex D. 6.8 Total Radiated Sesitivity (TRS) for FDD UE usig LEE Editor s ote: This test case is ot copleted Miiu Requireets are issig Test requireets ad related TT are issig 6.8. Defiitio ad applicability The Total Radiated Sesitivity is defied as: TRS = ò 4p é ù ê + údw êë EISq ( W; f ) EISj ( W; f ) úû Where the effective isotropic sesitivity (EIS) is defied as the power available at the atea output such as the sesitivity threshold is achieved for each polarizatio. W is the solid agle describig the directio, f is frequecy. q ad j are the orthogoal polarizatios. TRS» p N - M - åå = 0 NM é = ú ú ù ê + si 0êë EISq ( q, j; f ) EISj ( q, j; f ) û I these forulas N ad M are the uber of saplig itervals for theta ad phi. agles. The saplig itervals are discussed further i Sectio 6... ( q ) q ad j are the easureet The TRS ca also be calculated fro easureets i a Rayleigh fadig 3 diesioal isotropic eviroet with i average uifor elevatio ad aziuth distributio. The calculatio of the TRS is i this case based o searchig for the lowest power received by the LEE for a discrete uber of field cobiatios i the chaber that gives a BER that is better tha the specified target BER level. By calibratig the average power trasfer fuctio, a absolute value of the TRS ca be obtaied. The followig expressio ca be used to fid the TRS. TRS æ ç N å è =» N N ( C ( - R ) ) å = ref, thres, ö ø -

75 Release 75 TS 34.4 V.3.0 (0-) where ref, is the referece power trasfer fuctio for fixed easureet atea, R is the reflectio coefficiet for fixed easureet atea ad C is the path loss i the cables coectig the easureet receiver to fixed easureet atea. These paraeters are calculated fro the calibratio easureet ad are further discussed i Aex B.., is calculated by usig the followig equatio: thres thres, = M å = S thres,, M where thres S,, is the :th value of the trasfer fuctio for fixed easureet atea, which gives the BER threshold. M is the total uber of values of the BER threshold power easured for each fixed easureet atea. The requireets ad this test apply to all types of UTRA for the FDD UE for Release ad later releases that support LEE. NOTE: This test case ca be optioally executed for Release 7 ad oward UE s supportig LEE feature Miiu requireets The average TRS of low, id ad high chael of the LEE i the data trasfers positio for % BER with.kbps DL referece chael as defied i Aex C.3 of TS5.0 [] shall be lower tha iiu perforace requireets for roaig bads show i Table 68.. The averagig shall be doe i liear scale for the TRS results. TRS average é æ = 0logê3 ç + + low /0 id /0 high / 0 ë è0 0 0 I additio the axiu TRS of each easured chael i the data trasfers positio shall be better tha iiu perforace requireets for roaig bads show i the colus Max. TRS = /0 low /0 /0 id high [ (,0, )] ax 0log ax 0 0 Table 6.8.: TRS iiu requireets for LEE devices i data trasfer positio Operatig Bad Uit <REFÎ or> Average Max I db/3.84 MHz TBD TBD II db/3.84 MHz TBD TBD III db/3.84 MHz TBD TBD IV db/3.84 MHz TBD TBD V db/3.84 MHz TBD TBD VI db/3.84 MHz TBD TBD VII db/3.84 MHz TBD TBD VIII db/3.84 MHz TBD TBD IX db/3.84 MHz TBD TBD XIX db/3.84 MHz TBD TBD NOTE For ower Class 3, 3bis ad 4 this shall be achieved at the axiu output power. NOTE Applicable for dual-ode GSM/UMTS. NOTE 3 Applicable for otebook devices. öù ú øû The orative referece for this clause is TS5.44 sectio 7.3..

76 Release 76 TS 34.4 V.3.0 (0-) Test urpose The purpose of this test is to esure that TRS Average ad ax receptio sesitivity decreases the coverage area at the far side fro Node B Method of test Iitial coditios Test eviroet: oral; see TS34.- [3] clause G... ) Set the SS dowlik physical chaels accordig to settigs i Table ) ower o the UE. TRS of the UE is above specified liit. The lack of the 3) A call is set up accordig to the Geeric call setup procedure. The power cotrol algorith shall be set to ower Cotrol Algorith. Copressed ode shall be set to OFF. 4) Eter the UE ito loopback test ode ad start the loopback test. See TS [0] ad TS [] for details regardig geeric call setup procedure ad loopback test. Table 6.8.: Dowlik hysical Chaels trasitted durig a coectio hysical Chael ower CICH CICH_Ec / DCH_Ec = 7 db -CCCH -CCCH_Ec/ DCH_Ec = 5 db SCH SCH_Ec / DCH_Ec = 5 db ICH ICH_Ec / DCH_Ec = db DCH Test depedet power The LEE shall be tested accordig to DUT positioig described i chapter Test procedure ) Sed cotiuously Up power cotrol coads to the UE. ) As the UE reaches axiu power, start sedig N5 data patter. 3) ositio ad cofigure the LEE accordig to chapter 6.. 4) Measure EIS fro oe easureet poit. EIS is the power trasitted fro oe specific directio to the UE causig BER value of % ± 0.% usig 0000 or ore bits, see Aex E.9.. NOTE: To eet BER value target DL power level ca be chaged usig user s freely selectable algorith. 5) Measure the EIS for every directio of selected saplig gird usig two orthogoal polarizatios to obtai TRS. 6) Calculate TRS usig equatios fro chapter 6.8. NOTE: To speed up sesitivity easureets o stadard settig (i.e. data speed, CL, BER target) ca be used i the easureets. However to obtai TRS result the easured EIS figures shall be oralized by DEIS = å( EISstd i - EISstd i ) i= Where EISstd is sesitivity easureet doe with stadard settig. i with o stadard settigs. is aout of referece easureet poits. EISstd i is sesitivity easureet doe To esure accuracy of TRS, the aout of referece poits easured should be at least 4. It is recoeded to spread the referece easureets equally durig the easureet tie.

77 Release 77 TS 34.4 V.3.0 (0-) The easureet procedure is based o the easureet of the spherical sesitivity patter of the DUT. The sesitivity values of the DUT at a predefied BER level are sapled i far field i a group of poits located o a spherical surface eclosig the DUT. The EIS saples are take usig a costat saple step of 30 both i theta (q) ad phi (f) directios. All the EIS saples are take with two orthogoal polarizatios, q - ad j -polarisatios. The Total Radiated Sesitivity is calculated fro the easured data by equatio i chapter Test procedure, reverberatio chaber ethod ) Sed cotiuously Up power cotrol coads to the UE. ) As the UE reaches axiu power, start sedig N5 data patter. 3) ositio ad cofigure the LEE accordig to chapter 6..4) Set the base statio siulator to a specific output power ad perfor a BER easureet. 5) Icrease or decrease the base statio output power as eeded, ad repeat step 5 util the lowest output power is foud that gives a BER value of % ± 0.% usig 0000 or ore bits, see Aex E.9.. This correspods to thres,, S. NOTE: To eet BER value target DL power level ca be chaged usig user s freely selectable algorith. 6) Repeat step 4 ad 5 util a sufficiet uber of idepedet saples (see sectio 6..3) of easured. thres,, S has bee 7) Calculate TRS usig equatios fro chapter 6.8. NOTE : The easureet procedure is based o saples of the received sigal power at the UE/MS fro a full 3 diesioal isotropic eviroet with uifor elevatio ad aziuth field distributio. The power received by the DUT is udergoig Rayleigh fadig ad is trasitted by the fixed easureet ateas. Moreover, it is iportat that the saples collected are idepedet, i order to get sufficiet accuracy of the estiated TRS value Test requireets The average TRS of low, id ad high chael i the data trasfers positio for % BER with.kbps DL referece chael as defied i Aex C.3 of [] shall be lower tha test requireets for roaig bads show i Table The averagig shall be doe i liear scale for the TRS results. TRS average é æ = 0logê3 ç + + low /0 id /0 high / 0 ë è0 0 0 I additio the axiu TRS of each easured chael i the data trasfers positio shall be better tha iiu perforace requireets for roaig bads show i the colus Max. /0 low /0 /0 id high [ (,0, )] ax 0log ax 0 0 TRS = öù ú øû

78 Release 78 TS 34.4 V.3.0 (0-) Table 6.8.3: TRS test requireets for LEE devices i data trasfer positio Operatig Bad Uit <REFÎ or> Average Max I db/3.84 MHz TBD TBD II db/3.84 MHz TBD TBD III db/3.84 MHz TBD TBD IV db/3.84 MHz TBD TBD V db/3.84 MHz TBD TBD VI db/3.84 MHz TBD TBD VII db/3.84 MHz TBD TBD VIII db/3.84 MHz TBD TBD IX db/3.84 MHz TBD TBD XIX db/3.84 MHz TBD TBD NOTE For ower Class 3, 3bis ad 4 this shall be achieved at the axiu output power. NOTE Applicable for dual-ode GSM/UMTS. NOTE 3 Applicable for otebook devices. NOTE: If the above Test Requireet differs fro the Miiu Requireet the the Test Tolerace applied for this test is o-zero. The Test Tolerace for this test is defied ad the explaatio of how the Miiu Requireet has bee relaxed by the Test Tolerace is give i Aex D. 6.9 Total Radiated Sesitivity (TRS) for GSM MS usig LEE Editor s ote: This test case is ot copleted Miiu Requireets are issig Test requireets ad related TT are issig 6.9. Defiitio ad applicability The Total Radiated Sesitivity is defied as: TRS = ò 4p é ù ê + údw êë EISq ( W; f ) EISj ( W; f ) úû Where the effective isotropic sesitivity (EIS) is defied as the power available at the atea output such as the sesitivity threshold is achieved for each polarizatio. W is the solid agle describig the directio, f is frequecy. q ad j are the orthogoal polarizatios. TRS» p N - M - åå = 0 NM é = ú ú ù ê + si 0êë EISq ( q, j; f ) EISj ( q, j; f ) û I these forulas N ad M are the uber of saplig itervals for theta ad phi. agles. The saplig itervals are discussed further i Sectio ( q ) q ad j are the easureet The TRS ca also be calculated fro easureets i a Rayleigh fadig 3 diesioal isotropic eviroet with uifor elevatio ad aziuth distributio. The calculatio of the TRS is i this case based o searchig for the lowest power received by the LEE for a discrete uber of field cobiatios i the chaber The power received by the UE at each discrete field cobiatio that provides a BLER which is better tha the specified target BLER level shall be averaged with other such easureets usig differet field cobiatios. By calibratig the average power trasfer fuctio, a absolute value of the TRS ca be obtaied whe the liear values of all dowlik power levels described above have bee averaged. The followig expressio ca be used to fid the TRS.

79 Release 79 TS 34.4 V.3.0 (0-) TRS æ ç N å è =» N N ( C ( - R ) ) å = ref, thres, ö ø - where ref, is the referece power trasfer fuctio for fixed easureet atea, R is the reflectio coefficiet for fixed easureet atea ad C is the path loss i the cables coectig the easureet receiver to fixed easureet atea. These paraeters are calculated fro the calibratio easureet ad are further discussed i Aex B.., is calculated by usig the followig equatio: thres thres, = M å = S thres,, M where thres S,, is the :th value of the trasfer fuctio for fixed easureet atea, which gives the BLER threshold. M is the total uber of values of the BLER threshold power easured for each fixed easureet atea. The requireets ad this test apply to all types of LEE that support GSM for Release ad later releases. NOTE: This test case ca be optioally executed for Release 7 ad oward MS s supportig LEE feature Miiu requireets The average TRS of low, id ad high chael of the LME i the data trasfers positio for GRS DTCH/CS at 0% BLER shall be lower tha iiu perforace requireets for roaig bads show i Table The averagig shall be doe i liear scale for the TRS results. TRS average é æ = 0logê3 ç + + low /0 id /0 high / 0 ë è0 0 0 I additio the iiu TRS of each easured chael i the data trasfers positio shall be better tha iiu perforace requireets for roaig bads show i the colus Mi. TRS = /0 low /0 /0 id high [ (,0, )] ax 0log ax 0 0 Table 6.9.: TRS iiu requireets for GSM LEE devices i data trasfer positio Operatig Bad Uit <REFÎ or> Average Max GSM 850 db TBD TBD GSM 900 db TBD TBD DCS 800 db TBD TBD CS 900 db TBD TBD NOTE : For ower Class ad 4 this shall be achieved at the axiu output power. NOTE : Applicable for dual-ode GSM/UMTS. NOTE 3: Applicable for otebook devices. öù ú øû The orative referece for this clause is TS5.44 sectio

80 Release 80 TS 34.4 V.3.0 (0-) Test urpose The purpose of this test is to esure that TRS Average ad TRS Mi of the MS is above specified liit. The lack of the receptio sesitivity decreases the coverage area at the far side fro Base Statio Method of test Iitial coditios Test eviroet: oral coditio; see TS5.00- [9] Aex A... A call is set up accordig to the procedure o GRS DTCH/CS with a ARFCN i the Mid ARFCN rage, power cotrol level set to axiu power. The SS trasits Stadard Test Sigal C o the traffic chael, see TS5.00- [9] Aex A5.. The SS coads the MS to create traffic chael loop back, see TS44.04 [34] clause 5.4. The LEE shall be tested accordig to DUT positioig described i clause Test procedure ) ositio ad cofigure the LEE accordig to clause 6.. ) The SS copares the data of the sigal that it seds to the MS with the sigal which is looped back fro the receiver after deodulatio ad decodig. 3) The SS deteries the uber of block error evets, by exaiig sequeces of at least the iiu uber of saples of cosecutive blocks. 4) Measure EIS fro oe easureet poit. EIS is the power trasitted fro oe specific directio to the MS causig BLER value of 0% ± %, see Aex E. 9. NOTE: To eet BLER value target DL power level ca be chaged usig user s freely selectable algorith. 5) Measure the EIS for every directio of selected saplig gird usig two orthogoal polarizatios to obtai TRS. 6) Calculate TRS usig equatios fro clause ) Steps ) to 6) are repeated for GRS DTCH/CS with ARFCNs i the Low ARFCN rage ad the High ARFCN rage. NOTE : No stadard settigs: To speed up sesitivity easureets o stadard settig (i.e. data speed, CL, BLER target) ca be used i the easureets. However to obtai TRS result the easured EIS figures shall be oralized by DEIS = å( EISstd i - EISstd i ) i= Where EISstd is sesitivity easureet doe with stadard settig. i with o stadard settigs. is aout of referece easureet poits. EISstd i is sesitivity easureet doe To esure accuracy of TRS, the aout of referece poits easured should be at least 4. It is recoeded to spread the referece easureets equally durig the easureet tie. The easureet procedure is based o the easureet of the spherical sesitivity patter of the DUT. The sesitivity values of the DUT at a predefied BLER level are sapled i far field i a group of poits located o a closed surface eclosig the DUT. The EIS saples are take usig a costat saple step of 30 both i theta (q) ad phi (f) directios. All the EIS saples are take with two orthogoal polarizatios, q - ad j -polarisatios. The Total Radiated Sesitivity is calculated fro the easured data by equatio i clause 6.9..

81 Release 8 TS 34.4 V.3.0 (0-) Test procedure, reverberatio chaber ethod ) ositio ad cofigure the LEE accordig to clause 6.. ) The SS copares the data of the sigal that it seds to the MS with the sigal which is looped back fro the receiver after deodulatio ad decodig. 3) The SS deteries the uber of block error evets, by exaiig sequeces of at least the iiu uber of saples of cosecutive blocks. 4) Set the base statio siulator to a specific output power ad perfor a BLER easureet. 5) Icrease or decrease the base statio output power as eeded, ad repeat step 5 util the lowest output power is foud that gives a BLER value of 0% ± %, see Aex E.9.. This correspods to thres,, S. NOTE: To eet BLER value target DL power level ca be chaged usig user s freely selectable algorith. 6) Repeat step 4 ad 5 util a sufficiet uber of idepedet saples (see sectio 6..3) of easured. thres,, S has bee 7) Calculate TRS usig equatios fro clause ) Steps ) to 7) are repeated for GRS DTCH/CS with ARFCNs i the Low ARFCN rage ad the High ARFCN rage. NOTE : The easureet procedure is based o saples of the received sigal power at the UE/MS fro a full 3 diesioal isotropic eviroet with uifor elevatio ad aziuth field distributio. The power received by the DUT is udergoig Rayleigh fadig ad is trasitted by the fixed easureet ateas. Moreover, it is iportat that the saples collected are idepedet, i order to get sufficiet accuracy of the estiated TRS value Test requireets The average TRS of low, id ad high chael i the data trasfers positio for GRS DTCH/CS at 0% BLER shall be lower tha test requireets for roaig bads show i Table The averagig shall be doe i liear scale for the TRS results. TRS average é æ = 0logê3 ç + + low /0 id /0 high / 0 ë è0 0 0 I additio the iiu TRS of each easured chael i the data trasfers positio shall be better tha iiu perforace requireets for roaig bads show i the colus Mi. TRS = /0 low /0 /0 id high [ (,0, )] ax 0log ax 0 0 Table 6.9.: TRS test requireets for GSM LEE devices i data trasfer positio Operatig Bad Uit <REFÎ or> Average Max GSM 850 db TBD TBD GSM 900 db TBD TBD DCS 800 db TBD TBD CS 900 db TBD TBD NOTE : For ower Class ad 4 this shall be achieved at the axiu output power. NOTE : Applicable for dual-ode GSM/UMTS. NOTE 3: Applicable for otebook devices. öù ú øû

82 Release 8 TS 34.4 V.3.0 (0-) NOTE: If the above Test Requireet differs fro the Miiu Requireet the the Test Tolerace applied for this test is o-zero. The Test Tolerace for this test is defied ad the explaatio of how the Miiu Requireet has bee relaxed by the Test Tolerace is give i Aex D. 6.0 Total Radiated Sesitivity (TRS) for TDD UE usig LEE Editor s ote: This test case is icoplete. The followig aspects are either issig or ot yet deteried: The TR Miiu erforace Requireet for this test are udefied The Test Requireets ad related Test Toleraces applicable for this test are udefied 6.0. Defiitio ad applicability The Total Radiated Sesitivity (TRS) is a easure of the iiu power required to achieve a specified Bit Error Rate (BER). The TRS is defied as: TRS = ò 4p é ù ê + údw êë EISq ( W; f ) EISj ( W; f ) úû Where the effective isotropic sesitivity (EIS) is defied as the power available at the atea output such as the sesitivity threshold is achieved for each polarizatio. W is the solid agle describig the directio, f is frequecy. q ad j are the orthogoal polarizatios. TRS» p N - M - åå = 0 NM é = ú ú ù ê + si 0êë EISq ( q, j; f ) EISj ( q, j; f ) û I these forulas N ad M are the uber of saplig itervals for theta ad phi. agles. The saplig itervals are discussed further i Sectio 6... ( q ) q ad j are the easureet The TRS ca also be calculated fro easureets i a Rayleigh fadig 3 diesioal isotropic eviroet with uifor elevatio ad aziuth distributio. The calculatio of the TRS is i this case based o searchig for the lowest power received by the UE/MS for a discrete uber of field cobiatios i the chaber The power received by the UE at each discrete field cobiatio that provides a BER which is better tha the specified target BER level shall be averaged with other such easureets usig differet field cobiatios. By calibratig the average power trasfer fuctio, a absolute value of the TRS ca be obtaied whe the liear values of all dowlik power levels described above have bee averaged. The followig expressio ca be used to fid the TRS. TRS æ ç N å è =» N N ( C ( - R ) ) å = ref, thres, ö ø - where ref, is the referece power trasfer fuctio for fixed easureet atea, R is the reflectio coefficiet for fixed easureet atea ad C is the path loss i the cables coectig the easureet receiver to fixed easureet atea. These paraeters are calculated fro the calibratio easureet ad are further discussed i Aex B.., is calculated by usig the followig equatio: thres thres, = M å = S thres,, M

83 Release 83 TS 34.4 V.3.0 (0-) where thres S,, is the :th value of the trasfer fuctio for fixed easureet atea, which gives the BER threshold. M is the total uber of values of the BER threshold power easured for each fixed easureet atea. The requireets ad this test apply to all types of UTRA for the TDD UE for Release ad later releases that support LEE. Note: This test case ca be optioally executed for Release 7 ad oward UE s supportig LEE feature Miiu Requireets The average TRS of low, id ad high chael for % BER with.kbps DL referece chael as defied i Aex C.3 of TS 34. [3] shall be lower tha iiu perforace requireets for roaig bads show i Table The averagig shall be doe i liear scale for the TRS results. TRS average é æ = 0logê3 ç + + low /0 id /0 high / 0 ë è0 0 0 I additio the axiu TRS of each easured chael shall be better tha iiu perforace requireets for roaig bads show i the colus Mi. /0 low /0 /0 id high [ (,0, )] ax 0log ax 0 0 TRS = Table 6.0.: TRS iiu requireets for TDD LEE devices i data trasfer positio Operatig Bad Uit <REFÎor> - - Average Max a db/.8 MHz TBD TBD b db/.8 MHz TBD TBD c db/.8 MHz TBD TBD d db/.8 MHz TBD TBD e db/.8 MHz TBD TBD f db/.8 MHz TBD TBD NOTE : Applicable for dual-ode GSM/UTRA LCR TDD. NOTE : Applicable for otebook devices. öù ú øû The orative referece for this clause is TS5.44 [] sectio Test purpose The purpose of this test is to esure that TRS average ad ax receptio sesitivity decreases the coverage area at the far side fro Node B Method of test Iitial coditios Test eviroet: oral; see TS34. [3] clause G... TRS of the UE is above specified liit. The lack of the ) Set the SS dowlik physical chaels accordig to settigs i Table The DL power level should be set to esure 0% BER at.kbps data rate at the whole 3D iitial sca. ) ower o the LEE UE. 3) A call is set up accordig to the Geeric call setup procedure. The power cotrol algorith shall be set to ower Cotrol Algorith. 4) Eter the UE ito loopback test ode ad start the loopback test.

84 Release 84 TS 34.4 V.3.0 (0-) See TS [0] ad TS [] ad Aex C of TS 34.[3]. For details regardig geeric call setup procedure ad loopback test. Table 6.0.: Dowlik hysical Chaels trasitted durig a coectio hysical Chael ower Ior -75 db DwCH DwCH_Ec / Ior = 0 db CCCH -CCCH_Ec / Ior = -3 db SCCCH S-CCCH_Ec / Ior = -6 db ICH ICH_Ec / Ior = -6 db FACH FACH_Ec / Ior = -6 db DL DCH DCH_Ec / Ior = 0 db rocedure ) Sed cotiuously Up power cotrol coads to the LEE UE. ) As the UE reaches axiu power, start sedig N5 data patter. 3) ositio ad cofigure the LEE accordig to clause 5.. 4) Measure EIS fro oe easureet poit. EIS is the power trasitted fro oe specific directio to the UE causig BER value of % ± 0.% usig or ore bits, see Aex E.9.3. The DL power step size shall be o bigger tha 0.5dB whe the RF level is ear the TDD UE sesitivity level. NOTE: To eet BER value target DL power level ca be chaged usig user s freely selectable algorith. 5) Measure the EIS for every directio of selected saplig gird usig two orthogoal polarizatios to obtai TRS. 6) Calculate TRS usig equatios fro clause 6.7. NOTE: To speed up sesitivity easureets o stadard settig (i.e. data speed, CL, BER target) ca be used i the easureets. However to obtai TRS result the easured EIS figures shall be oralized by DEIS = å( EISstd i - EISstd i ) i= Where EISstd is sesitivity easureet doe with stadard settig. i with o stadard settigs. is aout of referece easureet poits. EISstd i is sesitivity easureet doe To esure accuracy of TRS, the aout of referece poits easured should be at least 4. It is recoeded to spread the referece easureets equally durig the easureet tie. The easureet procedure is based o the easureet of the spherical sesitivity patter of the DUT. The sesitivity values of the DUT at a predefied BER level are sapled i far field i a group of poits located o a spherical surface eclosig the DUT. The EIS saples are take usig a costat saple step of 30 both i theta (q) ad phi (f) directios. All the EIS saples are take with two orthogoal polarizatios, q - ad j -polarisatios. The Total Radiated Sesitivity is calculated fro the easured data by equatio i clause Test procedure, reverberatio chaber ethod ) Sed cotiuously Up power cotrol coads to the LEE UE. ) As the UE reaches axiu power, start sedig N5 data patter. 3) ositio ad cofigure the LEE accordig to clause 5.. 4) Set the base statio siulator to a specific output power ad perfor a BER easureet. 5) Icrease or decrease the base statio output power as eeded, ad repeat step 5 util the lowest output power is foud that gives a BER value of % ± 0.% usig or ore bits, see Aex E.9.3. This correspods to

85 Release 85 TS 34.4 V.3.0 (0-) S thres,,. The DL power step size shall be o bigger tha 0.5dB whe the RF level is ear the TDD UE sesitivity level. NOTE: To eet BER value target DL power level ca be chaged usig user s freely selectable algorith. 6) Repeat step 4 ad 5 util a sufficiet uber of idepedet saples (see sectio 6..3) of easured. thres,, S has bee 7) Calculate TRS usig equatios fro chapter 6.0. NOTE : The easureet procedure is based o saples of the received sigal power at the UE/MS fro a full 3 diesioal isotropic eviroet with uifor elevatio ad aziuth field distributio. The power received by the DUT is udergoig Rayleigh fadig ad is trasitted by the fixed easureet ateas. Moreover, it is iportat that the saples collected are idepedet, i order to get sufficiet accuracy of the estiated TRS value Test requireets The average TRS of low, id ad high chael for % BER with.kbps DL referece chael as defied i Aex C.3 of TS 34. [3] shall be lower tha test requireets for roaig bads show i Table The averagig shall be doe i liear scale for the TRS results. TRS average é æ = 0logê3 ç + + low /0 id /0 high / 0 ë è0 0 0 I additio the axiu TRS of each easured chael shall be better tha iiu perforace requireets for roaig bads show i the colus Max. TRS = /0 low /0 /0 id high [ (,0, )] ax 0log ax 0 0 Table 6.0.3: TRS test requireets for TDD LEE devices i data trasfer positio Operatig Bad Uit <REFÎor> - - Average Max a db/.8 MHz TBD +TT TBD +TT b db/.8 MHz TBD +TT TBD +TT c db/.8 MHz TBD +TT TBD +TT d db/.8 MHz TBD +TT TBD +TT e db/.8 MHz TBD +TT TBD +TT f db/.8 MHz TBD +TT TBD +TT NOTE : Applicable for dual-ode GSM/UTRA LCR TDD. NOTE : Applicable for otebook devices. öù ú øû NOTE: If the above Test Requireet differs fro the Miiu Requireet the the Test Tolerace applied for this test is o-zero. The Test Tolerace for this test is defied ad the explaatio of how the Miiu Requireet has bee relaxed by the Test Tolerace is give i Aex D.

86 Release 86 TS 34.4 V.3.0 (0-) Aex A (orative): Test syste characterizatio The ai objective of this sectio is to defie basic paraeters of siulated user (phato) ad easureet setup. A. hato specificatios A.. Head hato The Specific Athropoorphic Maequi (SAM) is used for radiated perforace easureets without the shell thickess requireet i o-critical areas of SAM. The dielectric properties of used aterial shall be aitaied withi ±5% of target properties listed i table A.. For other frequecies withi the frequecy rage, liear iterpolatio ethod shall be used to obtai target dielectric properties. Table A. Frequecy Relative Dielectric Coductivity (s) (MHz) Costat (e r) (S/) ,5 0, ,5 0, ,5 0, ,5, ,0, ,0, ,0, ,0, ,, ,5,40 Exaple of recipe for tissue siulatig liquid is preseted i aex F. A.. Laptop Groud lae hato A laptop groud plae phato is used for radiated perforace easureets i case of plug-i DUT like USB dogles. The laptop groud plae phato specified i figure A.A is coposed of the followig parts: A rectagular plae covered by a coductive fil o the upper side with thickess of 4 to eulate the keyboard ad ai body of the laptop; A rectagular plae covered by the sae coductive fil o the upper side with thickess of 4 to eulate the scree of the laptop; The coductive fil o the two plaes is coected. The agle betwee the two plaes is 0 degrees. The aterial is FR-4 copper-clad sheet ad the legth ad width of these two plaes are 345 ad 38 respectively; A horizotal USB coector is placed alog the short ed of the plae. The locatio of the port is at the right back corer, the distace betwee the cetral axis of the USB coector ad the rear edge of plae is 45, ad the groud of the USB coector is welded o the coductive fil of the plae. The detailed descriptio of the structure is specified i figure A.A;

87 Release 87 TS 34.4 V.3.0 (0-) A USB cable crossig the groud plae ad coectig the USB coector to a real fuctioal laptop. The USB cable should be equipped with a shielded etal fil, ad the portio of the cable that is haged i the air shall be covered with absorbig aterial or treated with quarter wave chokes. The part of the USB cable lyig o the plae is covered by a coductive adhesive strip used for fixig the cable o the plae ad for guaratyig at the sae tie the superficial cotiuity of the coductive plae. The shielded coductive fil of this part of the USB cable is coected to the coductive fil of the plae ad the covered strip to well groud the atea. The legth of the USB cable should be o ore tha 3. Figure A.A: The laptop groud plae phato with DUT ad the real fuctioal laptop 38 Frot view rear edge 0degree 38 Side view Coductive adhesive strip USB Coector USB Cable 345 Top view Figure A.A: The structure ad diesio of the laptop groud phato

88 Release 88 TS 34.4 V.3.0 (0-) A. Aechoic chaber costraits Testig shall be perfored i a aechoic chaber fulfillig followig requireets. A.. ositioer For the DUT positioig o head phato the chaber should be equipped with a positioer akig possible to perfor full 3-D easureets for both Tx ad Rx radiated perforace. The cetre of the rotatio should be the phase cetre of the atea, i the case it is ot possible to evaluate a estiatio of the atea cetre should be used. Alteratively cetre of the lie betwee right ad left ear referece poits ca be used as a cetre of rotatio. Theta (q) ad phi (f) agles are specified i figure A.. DUT f q probe atea Figure A.: The coordiate syste used i the easureets for the head phato For the DUT positioig o laptop groud plae phato the chaber should be equipped with a positioer akig possible to perfor full 3-D easureets for both Tx ad Rx radiated perforace. The real fuctioal laptop is laid o the floor of the aechoic chaber, supplies power to the DUT ad cotrols the state of the DUT. Both the USB cable ad the real fuctioal laptop are properly setup i order to have a egligible ipact o the easureets: the real fuctioal laptop is fully wrapped up with aechoic absorbers. Theta (q) ad phi (f) agles are specified i figure A.A.

89 Release 89 TS 34.4 V.3.0 (0-) Figure A.A: The coordiate syste used i the easureets for the laptop groud plae phato A.. Measureet Atea The easureet atea should be able to easure two orthogoal polarizatios (typically liear theta (q) ad phi (f) polarizatios). Note that sigle-polarized liear easureet atea ca also be used by turig it 90 for every easureet poit. For far-field easureets, the distace r betwee the DUT ad the easureet atea should be æ D ö r > ax ç,3d,3l è l ø where l is the wavelegth of the easureet frequecy ad D the axiu extesio of the radiatig structure. The the phase- ad aplitude ucertaity liits ad the reactive ear field liit are ot exceeded. The ifluece of easureet distace is discussed i Appedix A - Estiatio of Measureet Ucertaity A..3 Quiet Zoe Reflectivity of the quiet zoe shall be easured for frequecies used with ethod described i Appedix F. Measured reflectivity level is used i ucertaity calculatios. A..4 Shieldig effectiveess of the chaber The recoeded level of the shieldig effectiveess is -00 db fro 800 MHz to 4 GHz. See Appedix G for ore details o shieldig effectiveess validatio. A.3 Reverberatio chaber costraits The alterative test ethod ca be realized i a reverberatio chaber fulfillig the followig requireets.

90 Release A.3. ositioig ad ode stirrig facilities 90 TS 34.4 V.3.0 (0-) The reverberatio chaber shall be equipped with ode-stirrig facilities i such a way that eough uber of idepedet power saples ca be achieved for the accuracy requireet stated i this stadard to be fulfilled. ossible ode-stirrig ethods iclude platfor stirrig, polarizatio stirrig ad echaical stirrig with fa-type stirrers, irregular shaped rotatioal stirrers, or plate-type stirrers. Also frequecy stirrig is possible if the type of easureet allows for a frequecy-averaged value, but this is ot ecessary if the chaber is sufficietly large ad well stirred. For the DUT positioig o head phato or for the DUT positioig o laptop groud plae phato, the DUT should be placed i such a way that a sufficiet uber of idepedet saples are obtaied to fulfil the ucertaity requireets. For exaple, for chabers utilizig platfor stirrig the DUT should be placed o the edge of the turtable i order to axiize rotatio of the DUT. I additio, the DUT ust ot be closer tha 0.5 wavelegths to other electroagetic reflective objects iside the chaber ad 0.7 wavelegths to absorbig objects. For the DUT positioig o laptop groud plae phato the real fuctioal laptop is laid o the floor of the chaber, supplies power to the DUT ad cotrols the state of the DUT. Both the USB cable ad the real fuctioal laptop are properly setup i order to have a egligible ipact o the easureets: the real fuctioal laptop is fully wrapped up with aechoic absorbers. The real fuctioal laptop ca be placed outside the chaber if the coectio to the DUT ca be aitaied ad if the couicatio iterface betwee DUT ad real fuctioal laptop has egligible ipact o the easureets. A scheatic picture of the easureet setup is provided i Figure A.. Figure A.: A scheatic picture of the reverberatio chaber easureet setup. A.3. Measureet Ateas It is iportat that the easureet ateas are cofigured i such a way that the statistical distributio of waves i the chaber i average correspods to a isotropic eviroet. A.3.3 Chaber size ad characteristics The reverberatio chaber shall have a volue large eough to support the uber of odes eeded for the stated accuracy at the lowest operatig frequecy. If the UE/MS is oved aroud i the chaber durig the easureet, the volue of the reverberatio chaber ca be reduced. Also, frequecy stirrig ca be used to iprove the accuracy, however, this will reduce the resolutio of the results correspodigly. The reverberatio chaber ca be loaded with lossy objects i order to cotrol the power delay profile i the chaber to soe extet. However the reverberatio chaber should ot be loaded to such a extet that the ode statistics i the chaber are destroyed. It is iportat to keep the sae aout of lossy objects i the chaber durig calibratio

91 Release 9 TS 34.4 V.3.0 (0-) easureet ad test easureet, i order ot to chage the average power trasfer fuctio betwee these two cases. Exaples of lossy object are head ad had phatos. Furtherore, the DUT ust ot be closer tha 0.5 wavelegths to other electroagetic reflective objects iside the chaber ad 0.7 wavelegths to absorbig objects. A.3.4 Shieldig effectiveess of the chaber The recoeded level of the shieldig effectiveess is -00 db fro 800 MHz to 4 GHz. See Appedix G.A for ore details o shieldig effectiveess validatio. A.4 Ebedded Devices The ai objectives of this sectio are to defie basic paraeters required whe perforig TR ad TRS easureets o Notebook ad Tablets. A.4. Notebook A otebook C is a portable persoal coputer cobiig the coputer, keyboard ad display i oe for factor. Typically the keyboard is built ito the base ad the display is higed alog the back edge of the base. The largest sigle diesio for a otebook is liited to 0.4. As otebooks are ot body wor equipet or recoeded for use placed directly o the lap, the otebook shall be tested i a free space cofiguratio without head ad had phatos. Whe the otebook is placed i a easureet chaber the display shall be cofigured accordig to Table A.. Table A.: Display settigs araeter Value Note Display lid agle 0 +/- 5 degrees The lid agle is defied as the agle betwee the frot of the display to the levelled base. LCD Backlight 50% Abiet sesor Disabled A typical otebook C is equipped with several radio access techologies. Durig the easureet the DUT shall be cofigured accordig to Table A.3. Table A.3: Ebedded radio trasitters araeter Value Note WWAN Eabled This is the DUT trasceiver Other trasceivers Disabled UWB, WLAN, Bluetooth The otebook power aageet shall be cofigured accordig to Table A.4. Table A.4: ower aageet araeter Value Note Screesaver Disabled Tur OFF display Never Tur OFF Hard Never drive Syste Hiberate Never Syste Stadby Never Dyaic cotrol of Disabled clock frequecies ower source Stadard battery

92 Release 9 TS 34.4 V.3.0 (0-) If the otebook is equipped with retractable ateas the device shall be tested with the ateas i a cofiguratio recoeded by the aufactures. A.4. Tablet <for future use>

93 Release 93 TS 34.4 V.3.0 (0-) Aex B (orative): Calibratio The relative power values of the easureet poits will be trasfored to absolute radiated power values (i db) by perforig a calibratio easureet. The calibratio easureet is doe by usig a referece atea with kow efficiecy or gai values. I the calibratio easureet the referece atea is easured i the sae place as the DUT, ad the atteuatio of the coplete trasissio path ( L total ) fro the DUT to the easureet receiver/nb/bs siulator is calibrated out. For the reverberatio chaber ethod, the calibratio atea ca be placed i a arbitrarily positio i the chaber, as log as it is placed 0.5 wavelegths fro other etallic objects ad 0.7 wavelegths fro absorbig objects. The gai ad/or radiatio efficiecy of the referece atea shall be kow at the frequecy bads i which the calibratios are perfored. Recoeded calibratio ateas are oopole ateas or sleeve dipoles tued for the each frequecy bad of iterest. Alteratively, other ethods ay be used if they esure a equal or greater level of accuracy. A etwork aalyzer is recoeded to be used to perfor the calibratio easureet. Also other devices ca be used to easure atteuatio. The calibratio is perfored idividually for the both orthogoal polarizatios, all the trasissio paths ad all frequecies used i the testig. For the reverberatio chaber ethod, all polarizatios ad trasissio paths are icluded i oe calibratio easureet. The priciple is based o the use of calibratio/substitutio ateas presetig a efficiecy kow with a sufficiet accuracy i the easureet badwidths. Such a calibratio atea is placed o the DUT positioer at the exact MS locatio used for TR ad TRS easureet. It is possible to use a echaical piece to place the calibratio atea o the positioer. This echaical piece should ot preset ay electroagetic properties, which could ifluece the frequecy respose ad the radiatio properties of the calibratio atea. Fid hereafter, a illustratio of the substitutio cofiguratio i Figure B.. For the reverberatio chaber ethod the calibratio atea ca be place i a arbitrarily positio, as log as it is placed 0.5 wavelegths fro other etallic objects ad 0.7 wavelegths fro absorbig objects. A illustratio of the easureet setup for this procedure ca be foud i Figure B.. B. Calibratio rocedure L total is the atteuatio betwee ad B, see figure B.. total ( L - L E ) L = + AB AC cal Where L AC is cable loss fro A to C. The cable AC coectig the substitutio atea should be such that its ifluece upo radiatio patter easureets is iial. L AB is the atteuatio betwee poits A ad B. I TR ad TRS easureets poit B is coected to the calibrated iput/output port of easureet receiver. E cal is the efficiecy or gai of the calibratio atea at the frequecy of iterest.

94 Release 94 TS 34.4 V.3.0 (0-) Figure B. Calibratio/substitutio procedures usig a vector etwork aalyzer. If the calibratio is based o kow efficiecy of the calibratio atea, a full spherical scaig is perfored to deterie L AB. Uless the otherwise specified i the calibratio atea docuetatio, TR saplig grid ad equatio for TR i sectio 5.. should be used for head phato ad TR saplig grid ad equatio for TR i sectio 5.5. should be used for laptop groud plae phato ad ebedded devices. This procedure has to be doe at each frequecy of iterest. To achieve easureets with a ucertaity as low as possible, it is absolutely ecessary to exactly keep the sae to B cofiguratio (cables, dual-polarized atea. B. Calibratio rocedure Reverberatio Chaber Method The purpose of the calibratio easureet is to deterie the average power trasfer fuctio i the chaber, isatch of fixed easureet ateas ad path losses i cables coectig the power saplig istruet ad the fixed easureet ateas. referably a etwork aalyzer is used for these easureets. Recoeded calibratio ateas are dipoles tued to the frequecy bad of iterest. I geeral, the calibratio of a reverberatio chaber is perfored i three steps:. Measureet of S-paraeters through the reverberatio chaber for a coplete stirrig sequece. Calculatio of the chaber referece trasfer fuctio 3. Measureet of coectig cable isertio loss If several setups are used (e.g. epty chaber, chaber with head phato, etc.), steps ad ust be repeated for each cofiguratio. The calibratio easureet setup ca be studied i Figure B..

95 Release 95 TS 34.4 V.3.0 (0-) Figure B. Calibratio easureet setup i the reverberatio chaber, usig a vector etwork aalyzer. B.. Measureet of S-paraeters through the chaber for a coplete stirrig sequece This step will easure S-paraeters through the reverberatio chaber through a coplete stirrig sequece. This iforatio is required to deterie the chaber s referece trasfer fuctio. The procedure ust be perfored separately for each easureet setup of which the loadig of the chaber has bee chaged. The calibratio procedure ust be repeated for each frequecy as defied above. Therefore, it is advatageous if the etwork aalyzer ca be set to a frequecy sweep coverig the defied frequecies, so that all frequecies of iterest ca be easured with a iial uber of easureet rus. i. lace all objects ito the RC which will be used durig TR or TRS easureets, icludig a head phato, had phato ad fixture for the EUT. This esures that the loss i the chaber, which deteries the average power trasfer level, is the sae durig both calibratio ad test easureets. Also, if the EUT is large or cotais ay ateas, it ay represet a oticeable loadig of the chaber. It should the be preset i the chaber ad tured o durig the calibratio. ii. lace the calibratio atea iside the chaber. The calibratio atea is preferably outed o a low-loss dielectric fixture, to avoid effects fro the fixture itself which ay affect the EUT s radiatio efficiecy ad isatch factor. The calibratio atea ust be placed i the chaber i such a way that it is far eough fro ay walls, ode-stirrers, head phato, or other object, such that the eviroet for the calibratio atea (take over the coplete stirrig sequece) resebles a free space eviroet. Far eough away depeds o the type of calibratio atea used. For low gai early oidirectioal ateas like dipoles, it is orally sufficiet to esure that this spacig is larger tha 0.5 wavelegths. More directive calibratio ateas should be situated towards the cetre of the chaber. The calibratio atea should be preset i the chaber durig the TR/TRS easureets. iii. Calibrate the etwork aalyzer with a full -port calibratio i such a way that the vector S-paraeters betwee the ports of the fixed easureet atea ad the calibratio atea ca be accurately easured. referably, the etwork aalyzer is set to perfor a frequecy sweep at each stirrer positio. This will eable calibratio of several frequecy poits durig the sae stirrig sequece, thereby reducig calibratio tie. This will also eable frequecy stirrig, i.e., averagig the easured power trasfer fuctio over a sall frequecy badwidth aroud each easured frequecy poit (ovig frequecy widow). This will icrease accuracy at the expese of frequecy resolutio. iv. Coect the ateas ad easure the S-paraeters for each stirrer positio ad each fixed easureet atea.