ISO Add:2nd Floor,Building 2,G aofa Technology Park Longjing,Nanshan,Shenzhen,China.PC

Transcription

1 Temperature Compensation Attenuator TCA Series High Reliability Test Report ISO Yantel Corporation Add:2nd Floor,Building 2,G aofa Technology Park Longjing,Nanshan,Shenzhen,China.PC Tel: FAX: Website:

2 TCA Series High Reliability Test Flow Test Begin IQC(Incoming Quality Control) Solderability Test Static Resistance Test Adhesion Test Temperature Cycle RF Test-Q Low Temperature shock Test Power Life Test High Temperature Bake Burn in Test Temperature Cycle RF Test-H Thermal Shock Test Overload Test End

3 IQC Report-TCA Series

4 Static Resistance Test

5 Temperature Cycle RF Test shown in chart below Put sample units into programmable temperature control tank for temperature cycle RF test Programmable Temperature Control Tank RS232 Cable Sample Units GPIB RF Cable Test Computer Agilent E5071B Vector Network Analyzer

6 Temperature Cycle RF Test Report-Q

7 Temperature Cycle RF Test Report-1

8 Temperature Cycle RF Test Report-2

9 Low Temperature Shock Test-1 1. Allow sample units to stabilize at -55 for one hour. Dissipate rated power(2w) at low temperature for one hour. Power Supply RF Signals Center Frequency 1GHz Power Amplifier RF Cable Power Meter Sample Units

10 Low Temperature Shock Test-2 2.After one hour, allow units to stabilize at 25 5 for two hours. Measure attenuation and VSWR from DC to RS232 Programmable Temperature Control Tank Sample Units GPIB RF Cable Test Computer Agilent E5071B Vector Network Analyzer

11 Low Temperature Shock Test Report

12 Test Result Comparison of Low Temperature RF Test

13 High Temperature Bake shown in chart below-1 1. Allow sample units to stabilize at 125 for hours. Exposing samples to bake for a duration of hours at temperature of 125. Programmable Temperature Control Tank

14 High Temperature Bake shown in chart below shown in chart below-2 2.Measure and record attenuation &VSWR at 25 respectively before and after high temperature Bake test. Programmable Temperature Control Tank RS232 Sample Units GPIB RF Cable Test Computer Agilent E5071B Vector Network Analyzer

15 High Temperature Bake Test Report

16 Test Results Comparison Before after High Temperature Bake Before and

17 Burn in 1. Burn-in at 125 for a duration of 168 hours with the dissipate rated power (2W). Power Supply RF Signals Center Frequency 1GHz Power Amplifier Sample Units RF Cable Power Meter

18 Burn in 2.After one hour, allow units to stabilize at 25 5 for two hours. Measure attenuation and VSWR from DC to RS232 Programmable Temperature Control Tank Sample Units GPIB RF Cable Test Computer Agilent E5071B Vector Network Analyzer

19 Burn in

20 Test Results Comparison Before after High Temperature Bake Before and

21 Thermal Shock Test shown in chart below 1. Performing 10 cycles thermal shock test from -55 to Programmable temperature control tank Performing 10 cycles thermal shock test from 55 to +125 Programmable temperature control tank

22 Thermal Shock Test shown in chart below 2.Measure and record attenuation & VSWR at 25 respectively before and after thermal shock test. Programmable Temperature Control Tank RS232 Sample Units GPIB RF Cable Test Computer Agilent E5071B Vector Network Analyzer

23 Thermal Shock Test Report

24 Test Result Comparison-Before Thermal Shock Test Before -and -After

25 Power Life Test Power life test per testing requirements: Power Supply RF Signals Center frequency 1GHz Power Amplifier Sample units Power Meter RF Cable

26 Power Life Test Report

27 Test Results Comparison of Power Life Test

28 Temperature Cycle Test -as shown in chart below Products are subjected to temperature cycle test after reliability testing completed. Programmable Temperature Control Tank RS232 Sample Units GPIB RF Cable Test Computer Agilent E5071B Vector Network Analyzer

29 Test Report --- T t C l RF T t ft --- Temperature Cycle RF Test after Reliability Test

30 Report-1 Test after temperature Cycle

31 Report-2 Test after temperature Cycle

32 Overload Test Overload test per testing requirements: Power Supply RF Signals Center frequency 1GHz RF Cable Power Amplifier Sample Units Power Meter

33 Overload Test Report

34 Comparison of Pre- and-post Overload Test

35 Solderability Test Solder dip once

36 Solderability Test Solder dip twice

37 Solderability Test Report Products are subjected to one time solder dip in the solder pot held at 250 5, no defects are allowed.

38 Adhesion Test-1 Pic. 1: Set pull meter to zero, ready for testing. Pic. 2: In testing ti

39 Adhesion Test-2

40 Adhesion Test Report