TEST REPORT Nº 2416/0761

Transcription

1 TEST REPORT Nº 2416/0761 NOT CUANTITAVE GENERAL CONCLUSION IS REFERRED TO THE ACCREDITED TESTING. Page 1 of 1 Test site... : EMC Laboratory of SGS Tecnos, Madrid, Spain Test date... : 2016/11/07 to 2016/12/16 Client... : LEXTER MICROELECTRONIC ENGINEERING SYSTEMS S.L. Address... : c/ Larrano, 7, 28200, San Lorenzo del Escorial, Madrid (Spain) Equipment tested... : WIRELESS ELECTROSTIMULATION EQUIPMENT(1) State and reception date... : CORRECT, 2016 / 10 / 10 Supplier... : LEXTER MICROELECTRONIC ENGINEERING SYSTEMS S.L. Trade-mark... : AQ8 SYSTEM Model tested... : AQ8 SYSTEM - WHOLE BODY EMS TRAINING DEVICE (1) Serial Number... : Nominal Ratings... : AC/DC Adapter (battery of the suit): POWER UNIT / 3P10-L1012 Input: V~; Hz // Output: 12,6 Vdc; 1,0 A AC/DC Adapter (monitor): FSP GROUP INC. / FSP060-DBAE1 Input: V~; Hz; 1,5 A // Output: 12 Vdc; 5,0 A Derived model not tested... : No Standards applied... : - UNE-EN :2008+ERR:2009+A1:2009+A2: Conducted emission - Power disturbance - Radiated emission (*) - UNE-EN : UNE-EN : UNE-EN :2015 UNE-EN :2010 UNE-EN :2007+A1:2008+A2:2011 UNE-EN :2013 UNE-EN :2015 UNE-EN :2014 UNE-EN :2005 (*) Radiated Emission test outside of the accreditation scope ENAC 5/LE011 (1) Equipment modified after initial tests (see next page). Results... : Results obtained refer to the sample tested which is the subject of this Report, considering worst case values from tests and verifications carried out. Measurement uncertainties associated with variables determined during tests are available from the Laboratory at Customer s request. Conclusion... : Based upon results obtained the tested sample COMPLIES with the specified requirements indicated in the applied test specifications. Madrid, 20 January 2017 Tested by EMC Project Engineer Verified by EMC Reviewer Approved by Technical Manager of Test Laboratory JOSE CARLOS CARRO MARTÍN JAVIER MORGADO DURÁN FERNANDO MONTES CLAVER The present test report, with 2 pages, and Annex TRF 2416/0761, can not be copy partially without the written consent of SGS SGS Tecnos, S.A. C/ Trespaderne, 29 - Edif. Barajas 1 ( MADRID) LABORATORIO DE ENSAYOS ELÉCTRICOS Tfno: Fax:

2 TEST REPORT Nº 2416/0761 Page 2 of 2 OBSERVATIONS: Nº Cl. COMMENTS To comply with the requirements of the Clause 4.1 (terminal disturbance voltages, see pages 10 to 13 of TRF 2416/0880) the equipment were modified after initials tests on the following: Change of AC/DC adapter of the monitor by the next: VALUATION: IN CONFORMITY (2016/11/29)

3 Test Report issued under the responsibility of: TEST REPORT SGS Tecnos, S.A. EMC Household appliances, electrical tools & similar apparatus Laboratory Accredited by ENAC, with Accreditation Nº 5/LE011. THE TESTING MARKED (*) ARE NOT COVERED BY THE MENTIONED ACCREDITATION OF ENAC. Report Reference No.... : 2416/0761 Date of issue:... : 20/01/2017 Total number pages:... : 55 Applicant s name... : LEXTER MICROELECTRONIC ENGINEERING SYSTEMS S.L. Address... : c/ Larrano, 7, 28200, San Lorenzo del Escorial, Madrid (Spain) Test specification: Emission and Immunity tests according to the following Standards Standard... : CISPR 14-1 (Fifth Edition) + A1 + A2 in conjunction with CISPR 14-2 (Second Edition), IEC (Fourth Edition), IEC (Third Edition) Test procedure... : CE Examination Non-standard test method... : N/A Supplementary information... : -- Test Report Form No.... : IECCISPR14_1&2_IEC61000_3_2&3F Test Report Form(s) Originator... : VDE Testing and Certification Institute Master TRF... : Copyright 2015 IEC System of Conformity Assessment Schemes for Electrotechnical Equipment and Components (IECEE System). All rights reserved. This publication may be reproduced in whole or in part for non-commercial purposes as long as the IECEE is acknowledged as copyright owner and source of the material. IECEE takes no responsibility for and will not assume liability for damages resulting from the reader's interpretation of the reproduced material due to its placement and context. If this Test Report Form is used by non-iecee members, the IECEE/IEC logo and the reference to the CB Scheme procedure shall be removed. This report is not valid as a CB Test Report unless signed by an approved CB Testing Laboratory and appended to a CB Test Certificate issued by an NCB in accordance with IECEE 02. General disclaimer: The test results presented in this report relate only to the object tested. This report shall not be reproduced, except in full, without the written approval of the Issuing CB testing laboratory. The authenticity of this Test Report and its contents can be verified by contacting the NCB, responsible for this Test Report. Test item description... : WIRELESS ELECTROSTIMULATION EQUIPMENT Trademark... : AQ8 SYSTEM Manufacturer... : LEXTER MICROELECTRONIC ENGINEERING SYSTEMS S.L. Model/Type reference... : AQ8 SYSTEM - WHOLE BODY EMS TRAINING DEVICE Derived models no tested... : No S/N... : Rating(s)... : AC/DC Adapter (battery of the suit): POWER UNIT / 3P10-L1012 Input: V~; Hz // Output: 12,6 Vdc; 1,0 A AC/DC Adapter (monitor): FSP GROUP INC. / FSP060-DBAE1 Input: V~; Hz; 1,5 A // Output: 12 Vdc; 5,0 A

4 Page 2 of 55 Report No.: 2416/0761 Testing procedure and testing location: CE Testing Laboratory.. : SGS Tecnos, S.A.U. (Electric Test Laboratory) Testing location / address... : C/ Trespaderne, 29 Edificio Barajas MADRID (Spain) Testing location/ address... : Associated CB Test Laboratory... : Testing location/ address... : Tested by (name + signature)... : José Carlos Carro Martín Approved by (name + signature)... : Javier Morgado Durán Testing procedure TMP/CTF stage 1... : Testing procedure WMT/CTF stage 2... : Testing procedure SMT/CTF Stage 3 or 4... :

5 Page 3 of 55 Report No.: 2416/0761 List of Attachments (including a total number of pages in each attachment): Summary of testing... : See Verdict summary section 2 below. Summary of compliance with National Differences... : N/A List of countries addressed... : The product fulfils the requirements of... : UNE-EN : ERR.: A1: A2:2012; UNE-EN :2015; UNE-EN :2014; UNE-EN :2013 Copy of marking plate... : See section 1.1 on page 7. Testing... : Date of receipt of test item... : 2016/09/15 Date(s) of performance of tests.. : 2016/11/07 to 2016/12/16 (See dates for each test case) Manufacturer s Declaration regarding factories... : The application for obtaining a Certificate includes more than one factory location and a declaration from the manufacturer stating that the sample(s) submitted for evaluation is (are) representative of the products from each factory has been provided... : Name and address of factory(ies)... Not Applicable Yes (When differences exist, they shall be identified in the General Product Information section.) LEXTER MICROELECTRONIC ENGINEERING SYSTEMS S.L. c/ Larrano, 7, 28200, San Lorenzo del Escorial, Madrid (Spain)

6 Page 4 of 55 Report No.: 2416/0761 General remarks: The test results presented in this report relate only to the object tested. The results contained in this report reflect the results for this particular model and serial number. It is the responsibility of the manufacturer to ensure that all production models meet the intent of the requirements detailed within this report. This document is issued by the Company subject to its General Conditions of Service printed overleaf, available on request or accessible at and, for electronic format documents, subject to Terms and Conditions for Electronic Documents at Attention is drawn to the limitation of liability, indemnification and jurisdiction issues defined therein. Any holder of this document is advised that information contained hereon reflects the Company s findings at the time of its intervention only and within the limits of Client s instructions, if any. The Company s sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents. This document cannot be reproduced except in full, without prior written approval of the Company. Any unauthorized alteration, forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law. Unless otherwise stated the results shown in this test report refer only to the sample(s) tested. This report shall not be reproduced, except in full, without the written approval of the Issuing testing laboratory. "(see Enclosure #)" refers to additional information appended to the report. "(see appended table)" refers to a table appended to the report. A cross in a rectangular shape means that this option is applied. Possible test case verdicts: - test case does not apply to test object.. : N/A - test object does meet requirement... : P (Pass) - test object does not meet requirement.. : F (Fail) Definition of symbols used in this test report: Indicates that the listed condition, standard or equipment is applicable for this report. Indicates that the listed condition, standard or equipment is not applicable for this report. Decimal separator used in this report... : Comma (,) Point (.) AQ8 System is a whole body EMS training device for ElectroFitness treatments.

7 Page 5 of 55 Report No.: 2416/0761 Table of Contents: 1 General description of test item(s) Photos of the test item Verdict summary section Test conditions General Emission Terminal disturbance voltages (148,5 khz to 30 MHz) Terminal disturbance voltages (9 khz to 30 MHz) Disturbance power (30 MHz to 300 MHz) Radiated emission (30 MHz to 1000 MHz) Magnetic field induced current for induction cooking appliances Discontinuous disturbance (clicks) Discontinuous disturbances result table(s) Harmonic current emissions Voltage changes, voltage fluctuations and flicker Immunity General information Specific information CISPR Electrostatic discharge Fast transients Injected currents, 0,15 MHz to 80 MHz (0,15 MHz to 230 MHz) Radio-frequency electromagnetic fields Surges Voltage dips and interruptions List of test equipment Measurement instrumentation uncertainties Annex Critical components table Type designation code... 55

8 Page 6 of 55 Report No.: 2416/ General description of test item(s) Description... : WIRELESS ELECTROSTIMULATION EQUIPMENT Model/Type reference... : AQ8 SYSTEM - WHOLE BODY EMS TRAINING DEVICE Serial Number... : Brand name... : AQ8 SYSTEM Ports... : Port name and description Cable Specified Attached Shielded length [m] during test Power supply -- X No Supplemental information to the ports... : Rated power supply... : Voltage and Frequency Reference poles X AC: 230V~ 50 Hz X X N L1 L2 L3 DC: Rated Power... : 360 W Protection Class... : I Clock frequencies... : Information not provide by applicant Other parameters... : None Software version... : -- Hardware version... : -- Dimensions in cm (W x H x D)... : 34x33x7(monitor) Mounting position... : X Table top equipment Wall/Ceiling mounted equipment Floor standing equipment Hand-held equipment Other: Modules/parts... : Module/parts of test item Type Manufacturer Suit Not electrical Receiver module DC AQ8 SYSTEM Monitor DC AQ8 SYSTEM AC/DC adapter (receiver module) AC/DC Power Unit AC/DC adapter (monitor) AC/DC FSP Group INC. Operating modes... : No. Operating mode of test item Applied for testing Emission Immunity 1 Standby (charging battery of the receiver module) X X 2 Standby (without treatment) X X 3 Operative (fitness treatment, monitor supplied with AC/DC X X adapter) 4 Manual switching ON/OFF (receiver module and monitor) X Supplemental information to the operating modes... : Accessories (not part of the test Accessory Type Manufacturer item)... : NONE Documents as provided by the Description File name Issue date applicant... : User manual Manual de uso -- Modifications to the test item during testing... : See page 2 of TEST REPORT

9 Page 7 of 55 Report No.: 2416/ Photos of the test item Copy of marking plate... : Monitor AC/DC adapter (monitor) AC/DC adapter (battery of the suit) Photo of test item... :

10 Page 8 of 55 Report No.: 2416/ Verdict summary section CISPR-14-1 Clause Requirement Test case Basic standard Verdict 5 Terminal disturbance voltages CISPR (ed. 1) (148,5 khz to 30 MHz) B.1 Terminal disturbance voltages (9 khz to 30 MHz) 6 Disturbance power (30 MHz to 300 MHz) 9 Radiated emission B.2 and B.3 (30 MHz to 1000 MHz) Magnetic field induced current for induction cooking appliances CISPR (ed. 1) CISPR (ed. 1) CISPR (ed. 1) CISPR (ed. 1) CISPR (ed. 1) CISPR (ed. 1) CISPR (ed. 2) CISPR (ed. 1) CISPR (ed. 1) CISPR (ed. 2) + am1 CISPR (ed. 2) CISPR (ed. 2) + am1 CISPR (ed. 2) 4.2 Discontinuous disturbance (clicks) CISPR (ed. 1) CISPR 14-1 (ed. 5) + am1 + am2 IEC Clause Requirement Test case Basic standard Verdict 6.1 Control principle shall be allowed for the application according to the clause 6.1 IEC (ed. 3) 6.2 Harmonic current emissions IEC (ed. 2) + am1 P IEC Clause Requirement Test case Basic standard Verdict 4 Voltage changes, voltage fluctuations and IEC (ed. 2) P flicker CISPR-14-2 Clause Requirement Test case Basic standard Verdict 5.1 Electrostatic discharge IEC (ed. 1) P 5.2 Fast transients IEC (ed. 1) P 5.3 Injected currents, 0,15 MHz to 230 MHz IEC (ed. 1) N/A 5.4 Injected currents, 0,15 MHz to 80 MHz IEC (ed. 1) P 5.5 Radio frequency electromagnetic fields, 80 MHz to 1000 MHz IEC (ed. 1) 5.6 Surges IEC (ed. 1) P 5.7 Voltage dips and interruptions IEC (ed. 1) P Supplementary information: (*) Test outside the scope of accreditation ENAC Nº 5/LE011 P N/A P P* N/A P P P

11 Page 9 of 55 Report No.: 2416/ Test conditions 3.1 General Environmental reference conditions... : Measurement uncertainties... : The climatic conditions during the tests are within the limits specified by the manufacturer for the operation of the EUT and the test equipment. The climatic conditions during the tests were within the following limits: Temperature Humidity Atmospheric pressure 20 C 25 C 20 % - 40 % 945 hpa 960 hpa For all measurements where guidance for the calculation of the instrumentation uncertainty of a measurement is specified in CISPR , IEC series or a product standard, the measurement instrumentation uncertainty has been calculated an applied in accordance with these standards. In all cases if the test laboratory uncertainty is larger than the value for UCISPR given in CISPR the uncertainty are included in the test report annex. In case the standards in the IEC series or the product standard requires the indication of the uncertainty in the report these uncertainty values are included in the annex.

12 Page 10 of 55 Report No.: 2416/ Emission 4.1 Terminal disturbance voltages (148,5 khz to 30 MHz) Tested by... : JCC Test date... : 2016/11/29 Test Location (stand)... : EMC Shielded Room, SGS Tecnos, Madrid, Spain Applied limit class or environment... : Test set-up description... : Supplementary Test set-up description... : Test method applied... : Used mains voltage/frequency for the test. Evaluated at 160 khz (0,9 1,1 of U N )... : Supplementary information... : Test set-up... : -- X Table 1 (Columns 2 and 3); Mains terminals X Table 1 (Columns 4 and 5); Load terminals and additional terminals Table 1 (Columns 6 and 7); Mains terminals of tools 700 W Table 1 (Columns 8 and 9); Mains terminals of tools 700 W < P 1000 W Table 1 (Columns 10 and 11); Mains terminals of tools > 1000 W Other: Set-up Type A (40 cm distance to vertical ground plane, 80 cm o ground plane) Set-up Type B (40 cm distance to horizontal ground plane) Floor standing equipment set-up (10 cm over ground plane) Other: Artificial hand applied Set up for test, clause of the Standard X Artificial mains network Artificial mains network used as voltage probe Voltage probe CDN according to IEC Current probe and capacitive voltage probe (CVP) ISN In situ CDN (150 Ohm and current probe) Other: 230 V~ 50 Hz To comply with the requirements the equipment was modified after the initial test (see page 2 of TEST REPORT). During charging mode the battery was empty. Table: Measurement data for disturbance voltage Frequency [MHz] Reading QP [db µv] Reading AV [db µv] Limit QP [db µv] Limit AV [db µv] 2,835 43,94 43,82 56,00 46,00 Supplementary information:

13 Page 11 of 55 Report No.: 2416/0761 Operation mode 1 Port measured Input AC/DC adapter (battery of the receiver module) (Phase and Neutral) Mains voltage and frequency at which the test has been done 230 V~ 50 Hz Verdict Pass Graphic Representation Limits: QPK (red line); AV (yellow line) Sweeps QPK (blue); AV (red) Neutral: Phase:

14 Page 12 of 55 Report No.: 2416/0761 Operation mode 2 Port measured Input AC/DC adapter (monitor) (Phase and Neutral) Mains voltage and frequency at which the test has been done 230 V~ 50 Hz Verdict Pass Graphic Representation Limits: QPK (red line); AV (yellow line) Sweeps QPK (blue); AV (red) Neutral: Phase:

15 Page 13 of 55 Report No.: 2416/0761 Operation mode 3 Port measured Input AC/DC adapter (monitor) (Phase and Neutral) Mains voltage and frequency at which the test has been done 230 V~ 50 Hz Verdict Pass Graphic Representation Limits: QPK (red line); AV (yellow line) Sweeps QPK (blue); AV (red) Neutral: Phase:

16 Page 14 of 55 Report No.: 2416/ Terminal disturbance voltages (9 khz to 30 MHz) Tested by... : Test date... : Test Location (stand)... : Applied limit class or environment... : Test set-up description... : Table B.1; Induction cooking appliances Table B.1; Induction cooking appliances rated voltage 100 V and without earth connection Set-up Type A (40 cm distance to vertical ground plane, 80 cm o ground plane) Set-up Type B (40 cm distance to horizontal ground plane) Supplementary Test set-up description... : Test method applied... : Used mains voltage/frequency for the test. Evaluated at 160 khz (0,9 1,1 of U N )... : Floor standing equipment set-up (10 cm over ground plane) Other: Artificial hand applied Artificial mains network Artificial mains network used as voltage probe Voltage probe Other: Supplementary information... : Only applied on induction cooking appliances Test set-up... : -- Operation mode Ports measured Mains voltage and frequency at which the test has been done Verdict Graphic Representation N/A (only applied on induction cooking appliances) Table: Measurement data for disturbance voltage Frequency [MHz] Reading QP [db µv] Reading AV [db µv] Limit QP [db µv] Limit AV [db µv] Supplementary information:

17 Page 15 of 55 Report No.: 2416/ Disturbance power (30 MHz to 300 MHz) Tested by... : JCC Test date... : 2016/11/29 Test Location (stand)... : EMC Shielded Room, SGS Tecnos, Madrid, Spain Applied limit class or environment... : X Table 2a (Columns 2 and 3); Mains terminals Table 2a (Columns 4 and 5); Mains terminals of tools 700 W Table 2a (Columns 6 and 7); Mains terminals of tools 700 W < P 1000 W Table 2a (Columns 8 and 9); Mains terminals of tools > 1000 W Test set-up description... : X Equipment on table of 80 cm height Supplementary test set-up description... : Used mains voltage/frequency for the test. Evaluated at 50 MHz (0,9 1,1 of U N )... : Conditions for exemption from measurements above 300 MHz. : Equipment on support of 10 cm height Other: Set up for test, clause 6.2 of the Standard 230 V~ 50 Hz X Table 2 a limits reduced by Table 2 b applied and passed Maximum clock frequency < 30 MHz Supplementary information... : Measure performed on power supply cable with the absorbing clamp positioned beside the EUT. To comply with the requirements the equipment was modified after the initial test (see page 2 of TEST REPORT). Test set-up... : -- Table: Measurement data for disturbance voltage Frequency [MHz] Reading QP [db µv] Reading AV [db µv] Limit QP [db µv] Limit AV [db µv] 44,2 32,14 32,11 46,68 36,68 66,4 34,61 34,54 48,45 38,45 79,0 34,35 34,28 49,21 39,21 Supplementary information:

18 Page 16 of 55 Report No.: 2416/0761 Operation mode 1 Port measured Input AC/DC adapter (battery of the receiver module) Mains voltage and frequency at which the test has been done 230 V~ 50 Hz Verdict Graphic Representation Pass Limits: QPK (red line); AV (yellow line) Sweeps QPK (blue); AV (red)

19 Page 17 of 55 Report No.: 2416/0761 Operation mode 2 Port measured Input AC/DC adapter (monitor) Mains voltage and frequency at which the test has been done Verdict Graphic Representation 230 V~ 50 Hz Pass Limits: QPK (red line); AV (yellow line) Sweeps QPK (blue); AV (red)

20 Page 18 of 55 Report No.: 2416/0761 Operation mode 3 Port measured Mains voltage and frequency at which the test has been done Verdict Graphic Representation Input AC/DC adapter (monitor) 230 V~ 50 Hz Pass Limits: QPK (red line); AV (yellow line) Sweeps QPK (blue); AV (red)

21 Page 19 of 55 Report No.: 2416/ Radiated emission (30 MHz to 1000 MHz) Tested by... : JCC Test date... : 2016/11/29 Test Location (stand)... : EMC Shielded Room, SGS Tecnos, Madrid, Spain Applied limit class... : X Table 3 Radiated disturbance limits Other: Test set-up description... : X Equipment on a table of 80 cm height Equipment on the floor (insulated from ground plane) Other: Supplementary test set-up description... : -- Test method applied... : X OATS or SAC with measurement distance [m]: FAR with measurement distance [m]: 3 TEM Waveguide Starting frequency for radiated emission measurement... : X 30 MHz 300 MHz Supplementary information: According 2nd paragraph of clause a) of standard UNE-EN :2008+A1:09, is assumed that equipments are in conformity in the range frequency from 30 to 1000MHz, if following conditions are fulfilled. 1) Emissions of EUT for testing continuous power are below limit of table 2a of standard reduced by the margin of table 2b (10dB). 2) Maximum clock frequency is lower than 30 MHz. Considering the above conditions mentioned, this test is performed in the range 300 MHz to 1GHz due to one of the conditions: - Clock frequency of the equipment under test is higher than 30 MHz. - Emission of EUT is lower than requested by tables 2a and 2b, (10 db lower than limit of table 2a), It can be observed on pages 13 to 16 of this report. According to the above exposed and the graphics showed on the Annex, the equipment under test is IN CONFORMITY in the range frequency from 30 MHz to 1 GHz. According to the Standard clock frequency is defined as: The fundamental frequency of any signal used in the device excluding those which are solely used inside integrated circuits (IC). NOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits from lower clock oscillator frequencies outside the IC. Note: Test outside the scope of accreditation ENAC Nº 5/LE011

22 Page 20 of 55 Report No.: 2416/0761 Test set-up... : Table: Measurement data for disturbance voltage Frequency [MHz] Reading QP [db µv] Limit QP [db µv] 316,0 42,69 47,00 355,4 41,78 47,00 Supplementary information: See graphical representation.

23 Page 21 of 55 Report No.: 2416/0761 Operation mode 1 Port measured Enclosure Mains voltage and frequency at which the test has been 230 V~50 Hz done Verdict P Graphic Representation Limits: QPK (red line) Sweeps QPK (blue) Vertical Polarization Horizontal Polarization

24 Page 22 of 55 Report No.: 2416/0761 Operation mode 2 Port measured Enclosure Mains voltage and frequency at which the test has been 230 V~50 Hz done Verdict P Graphic Representation Limits: QPK (red line) Sweeps QPK (blue) Vertical Polarization Horizontal Polarization

25 Page 23 of 55 Report No.: 2416/0761 Operation mode 3 Port measured Enclosure Mains voltage and frequency at which the test has been 230 V~50 Hz done Verdict P Graphic Representation Limits: QPK (red line) Sweeps QPK (blue) Vertical Polarization Horizontal Polarization

26 Page 24 of 55 Report No.: 2416/ Magnetic field induced current for induction cooking appliances Tested by... : Test date... : Test Location (stand)... : Applied limit class... : Test set-up description... : Supplementary test set-up description... : Table B.2; Induction cooking appliances intended for commercial use and those for domestic use with diameter more than 1,6 m Table B.3; Induction cooking appliances for domestic use (diameter less than 1,6 m) Other: Equipment on a table of 80 cm height Equipment on the floor (insulated from ground plane) Equipment placed in the centre of the loop antenna system (LAS) according CISPR Other: Test method applied... : 3 m distance with 0,6 m loop antenna according CISPR m loop antenna system (LAS) according CISPR Supplementary information... : Only for induction cooking appliances Test set-up:... : Operation mode Port measured Mains voltage and frequency at which the test has been done Verdict Graphic Representation N/A Table: Measurement data for disturbance voltage Frequency [MHz] Reading QP [db µa] Limit QP [db µa] Supplementary information:

27 Page 25 of 55 Report No.: 2416/ Discontinuous disturbance (clicks) Tested by... : JCC Test date... : 2016/11/29 Test Location (stand)... : EMC Shielded Room, SGS Tecnos, Madrid, Spain Applied limit class or environment... : X Table 2a (Columns 2 and 3); Mains terminals Other: Test set-up description... : X Equipment on table of 80 cm height Supplementary Test set-up description... : -- Equipment on support of 10 cm height Other: Used mains voltage for the test measured at 160 khz (0,9 1,1 of UN)... : Used mains frequency for the test measured at 160 khz (50 Hz / 60 Hz)... : 230 V ~ 50 Hz Test set-up... : Discontinuous disturbances result table(s) Operating mode... : 1 and 3 Click rate at 150 khz... : 0 Click rate at 500 khz... : 0 Click rate based on number of switching events... : N/A Applied factor f Clause (7.X) according to which the click rate has been determined... : Clause Are individual switching operations applicable?... : No Combination of clicks in a time frame less than 600 ms... : -- Instantaneous switching? Click rate < 0,2 and duration of clicks less than 10 (20) ms... : Exemptions from click measurements applicable (No upper quartile method)?... : Supplementary information:

28 Page 26 of 55 Report No.: 2416/0761 Measurement results: Frequency (MHz) Limit L (dbµv) First Measurement: Determination of the limit L q Quasi-peak Number of clicks N 1 Time of measurement (min.) Click rate N Increased limit (db) Increased Limit L q 0,15 0,5 1,4 30 Frequency (MHz) Limit Lq (dbµv) Second measurement with Limit = L q (Upper quartile method): Number of clicks N 2 Number of authorized clicks N2 N1/4 Verdict 0,15 0,5 1,4 30 Supplementary information: See Tables below. According with the indications of sub-clause of the Standard, the perturbations by individual switching operations, caused by direct and manual operation of switch integrated in the appliance intended to be used for connections and disconnection only, are excluded to comply with the corresponding limits. As indicated in of the Standard, the repetition rate of clicks N, is determined for the frequency of 0,15 MHz for the frequency range of 148,5 to 500 khz and 0,5 MHz for the range of 0,5 to 30 MHz Given the results at these frequencies we obtain a rate N <5 and the duration of the clicks is less than 10 ms to 500 KHz. According to the indicated in and C4.2 the equipment complies with the limits without additional measures. Operating mode 1: Operating mode 3:

29 Page 27 of 55 Report No.: 2416/ Harmonic current emissions Tested by... : JCC Test date... : 2016/12/05 Test Location (stand)... : Test set-up description... : EMC Shielded Room, SGS Tecnos, Madrid, Spain Test set up according clause of the Standard Operating modes of EUT... : 1 and 3 Limit classification in accordance with the standard... : X Class A Class B Class C with active input power > 25 W Class C with active input power 25 W (First requirement, Table 3 column 2) Class C with active input power 25 W (Second requirement) Class D Observation period... : Description Period selected T obs X Quasi stationary 2.5 min Short cyclic Tobs 10 cycles = Random Tobs = Long cyclic Full program cycle or 2.5 min. with highest THC Tobs = Version of measurement instrument standard used IEC (Clause 7)... : Control principle used in the sample... : Supplementary information... : IEC :1991 X IEC : A1:2008 The EUT contains no power control for the active input power. The limit values according to the classification are applicable. (1) According to section 7 of the standard UNE-EN :2014, for equipments under test with measured power consumption < 75 W, the limits of harmonic disturbances are not applied. The results are showed for information purposes.

30 Page 28 of 55 Report No.: 2416/0761 Operation mode 1 Port measured Mains voltage and frequency at which the test has been done Input AC/DC adapter (battery of the receiver module) 230V~ / 50 Hz Verdict N/A (1)

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36 Page 34 of 55 Report No.: 2416/0761 Operation mode 3 Port measured Mains voltage and frequency at which the test has been done Verdict N/A (1) Input AC/DC adapter (monitor) 230V~ / 50 Hz (*)

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42 Page 40 of 55 Report No.: 2416/ Voltage changes, voltage fluctuations and flicker Tested by... : JCC Test date... : 2016/12/05 Test Location (stand)... : EMC Shielded Room, SGS Tecnos, Madrid, Spain Test set-up description... : Test set up according clause 6 of the Standard Test method... : X Flickermeter according IEC Simulation Analytical method Use of Pst = 1 curve 4.3 Long-Term flicker value Plt Observation time selected... : X 20 Minutes 60 Minutes 120 Minutes X 24 times switching according to Annex B Limit for dmax applied... : X 4 % X 6 % 7 % AC Mains voltage during test : 230 V~ Supplementary information... : -- Operation mode 1, 3 and 4 Mains voltage and frequency at which the test has been done Verdict Impedance used for measurement 230 V~ / 50 Hz Pass Zref=0,40+j0,25

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46 Page 44 of 55 Report No.: 2416/ Immunity 7.1 General information Criterion A B C Other: -- Description from standard Performance criteria as defined by the standard The apparatus shall continue to operate as intended during the test. No degradation of performance or loss of function is allowed below a performance level (or permissible loss of performance) specified by the manufacturer, when the apparatus is used as intended. If the minimum performance level or the permissible performance loss is not specified by the manufacturer, then either of these may be derived from the product description and documentation, and from what the user may reasonably expect from the apparatus if used as intended. The apparatus shall continue to operate as intended after the test. No degradation of performance or loss of function is allowed below a performance level (or permissible loss of performance) specified by the manufacturer, when the apparatus is used as intended. During the test, degradation of performance is allowed, however no change of actual operating state or stored data is allowed to persist after the test. If the minimum performance level or the permissible performance loss is not specified by the manufacturer, then either of these may be derived from the product description and documentation, and from what the user may reasonably expect from the apparatus if used as intended. Temporary loss of function is allowed, provided the function is self-recoverable or can be restored by the operation of the controls, or by any operation specified in the instructions for use. Manufacturer defined performance criteria... : Same as standard Monitoring during the tests... : Verifying LEDs indicators and screen of the monitor. 7.2 Specific information CISPR 14-2 Category acc. CISPR 14-2 (7.2). : CAT I (Category I) CAT II (Category II) X CAT III (Category III) CAT IV (Category IV)

47 Page 45 of 55 Report No.: 2416/ Electrostatic discharge Tested by... : JCC Test date... : 2016/12/16 Test Location(Stand)... : EMC Shielded Room, SGS Tecnos, Madrid, Spain Test set-up... : X Table top equipment Floor standing equipment Wall or ceiling mounted equipment (Treated as table top) Supplementary test set-up description... : See clause of the Standard Size of horizontal coupling plate. : 1,6 x 0,8 m Size of vertical coupling plate... : 0,5 x 0,5 m Number of discharges for each test point... : 10 Discharge interval... : 1s Performance criterion... : B Supplementary information... : Temperature: 23ºC Relative Humidity: 40 % Test set-up... : Photo of selected test points... :

48 Page 46 of 55 Report No.: 2416/0761 Table: Test results for electrostatic discharges No. Location of discharge Polarity Discharge Number of discharge s Test level [kv] Operating mode Observations 1 HCP top side P C , 2 & 3 No degradation or loss of function is appreciated 2 HCP top side N C , 2 & 3 No degradation or loss of function is appreciated 3 HCP bottom side P C , 2 & 3 No degradation or loss of function is appreciated 4 HCP bottom side N C , 2 & 3 No degradation or loss of function is appreciated 5 VCP right side P C , 2 & 3 No degradation or loss of function is appreciated 6 VCP right side N C , 2 & 3 No degradation or loss of function is appreciated 7 VCP left side P C , 2 & 3 No degradation or loss of function is appreciated 8 VCP left side N C , 2 & 3 No degradation or loss of function is appreciated 9 Points on conductive surface as indicated in the picture above (blue ray) 10 Points on conductive surface as indicated in the picture above(blue ray) 11 Points on non-conductive surface as indicated in the picture above (red ray) 12 Points on non-conductive surface as indicated in the picture above (red ray) P C , 2 & 3 N C , 2 & 3 P A , 2 & 3 N A , 2 & 3 No degradation or loss of function is appreciated No degradation or loss of function is appreciated No degradation or loss of function is appreciated No degradation or loss of function is appreciated HCP = Horizontal coupling plate VCP = Vertical coupling plate Supplementary information: Test performed in operating modes 1, 2 and 3 N = Negative P = Positive A = Air discharge C = Contact discharge

49 Page 47 of 55 Report No.: 2416/ Fast transients Tested by... : JCC Test date... : 2016/12/12 Test location (stand)... : EMC Shielded Room, SGS Tecnos, Madrid, Spain Test set-up... : Supplementary test set-up description... : Repetition frequency... : 5 KHz Test time... : 2 min Performance criterion... : B X Equipment on the table (0,1 ± 0,01) m above ground plane Equipment standing on floor at (0,1 ± 0,01) m above ground plane Artificial hand applied. Location see photo. See Clause 7.3 of the Standard Supplementary information... : Signal cables < 3m. Test set-up... : Test results fast transients Port AC/DC adapter (receiver module and monitor) AC/DC adapter (receiver module and monitor) Coupling Supplementary information: Level [kv] Polarity Operating mode Mains voltage/ frequency Direct 1 + 1, 2 & V~ / 50 Hz Direct 1-1, 2 & V~ / 50 Hz Observation No degradation or loss of function is appreciated. EUT not becomes dangerous No degradation or loss of function is appreciated. EUT not becomes dangerous

50 Page 48 of 55 Report No.: 2416/ Injected currents 0,15 MHz to 80 MHz Tested by... : JCC Test date... : 2016/12/16 Test location (Stand)... : Test set-up... : Supplementary test set-up description... : Modulation... : Step size... : 1% Performance criterion... : Mains voltage / frequency during test: EMC Shielded Room, SGS Tecnos, Madrid, Spain X Equipment located (0,1 ± 0,05) m above ground plane Elevated ground plane according to Annex F Artificial hand applied. Location see photo. Other: See clause 7 of the Standard A X 80 % AM with 1 khz 100 % PM with 222 Hz Other: 230 V~ / 50 Hz Supplementary information... : Signal cables < 3m. Test set-up... : Test results for conducted disturbances, induced by radio-frequency fields Frequency range 0,15-80 MHz 0,15-80 MHz Test Level [V] Supplementary information: 3 3 Port under test AC/DC adapter (receiver module and monitor) AC/DC adapter (receiver module and monitor) CDN type Port with terminate d CDN Operating mode Dwell time [s] M M & 3 1 Observations No degradation or loss of function is appreciated. EUT not becomes dangerous No degradation or loss of function is appreciated. EUT not becomes dangerous

51 Page 49 of 55 Report No.: 2416/ Radio-frequency electromagnetic fields Tested by... : JCC Test date... : 2016/12/15 Test location (Stand)... : EMC Shielded Room, SGS Tecnos, Madrid, Spain Test set-up... : Supplementary test set up description... : Exposed side of EUT... : X Equipment on the table (0,8 m height) Equipment standing on floor (0,05 0,15 m height) See clause 5.5 of the Standard X 0 (Front) (Rear) 270 Top side Bottom side Reason for not exposing a side.. : Front side is considered the worst side Distance Antenna to EUT... : 3 m Test method... : X IEC Step size [%]... : 1 Performance criterion... : A IEC Mains voltage / frequency during test... : 230 V~/ 50 Hz Supplementary information... :

52 Page 50 of 55 Report No.: 2416/0761 Test set-up... : Test results for radiated electromagnetic field Frequency range [MHz] Test Level [V/m] Polarization Modulation Operation mode Dwell time [s] Observations V 80% AM 1, 2 & H 80% AM 1, 2 & 3 1 No degradation or loss of function is appreciated. EUT not becomes dangerous No degradation or loss of function is appreciated. EUT not becomes dangerous Supplementary information: H = Horizontal; V = Vertical

53 Page 51 of 55 Report No.: 2416/ Surges Tested by... : JCC Test date... : 2016/12/12 Test location(stand)... : EMC Shielded Room, SGS Tecnos, Madrid, Spain Test set-up description... : Floor standing equipment. See clause 7.2 of the Standard Repetition rate... : 1 pulse/min Number of pulses for each coupling... : 5 Performance criterion... : B Supplementary information... : Test set-up... : Test setup similar to Electrical Fast Transients for supply line coupling Test results for surges Port Coupling CDN AC/DC adapter (receiver module and monitor) AC/DC adapter (receiver module and monitor) AC/DC adapter (receiver module and monitor) AC/DC adapter (receiver module and monitor) AC/DC adapter (receiver module and monitor) Phase- Neutral Phase- Neutral Phase-PE Neutral-PE Phase- Neutral Phase-PE Neutral-PE Lower test levels... : P = Positive N = Negative L = Phase (L1 = Phase 1) NE = Neutral Supplementary information: Level [kv] Polarity Phase angles [ ] Operating mode Mains voltage/ frequency MCN 1 P/N 90/ V~/50 Hz MCN 1 P/N 90/ V~/50 Hz MCN 1 P/N 90/ V~/50 Hz MCN 1 P/N 90/ V~/50 Hz MCN 1 P/N 90/ V~/50 Hz X Tested Not tested PE = Ground MCN = Mains Coupling Network ICN = Coupling Network for interconnection lines D = Direct Coupling (shielded lines) Observation No degradation or loss of function is appreciated No degradation or loss of function is appreciated No degradation or loss of function is appreciated No degradation or loss of function is appreciated No degradation or loss of function is appreciated

54 Page 52 of 55 Report No.: 2416/ Voltage dips and interruptions Tested by... : JCC Test date... : 2016/12/15 Test Location (Stand)... : EMC Shielded Room, SGS Tecnos, Madrid, Spain Test set-up description... : See clause 7 of the Standard Repetition rate... : 1s Number of dips or interruptions.. : 3 Performance criterion... : C Supplementary information... : Test performed on AC/DC adapter of monitor and AC/DC adapter of receiver module. Test results voltage dips and interruptions U N [V] Frequency in Hz Test Level [% of U N ] Phase angle Duration [Cycles] Operating mode ,5 1, 2 and ,5 1, 2 and , 2 and , 2 and 3 Observations No degradation or loss of function is appreciated No degradation or loss of function is appreciated No degradation or loss of function is appreciated No degradation or loss of function is appreciated Supplementary information: Test set-up... :

55 Page 53 of 55 Report No.: 2416/ List of test equipment Equipment Test Stand: Type Equipment used Inventory Manufacturer number For all tests Last calibration Calibration due* Weather Station Testo 622 DIE TESTO 29/02/ /03/2017 Test Stand: Terminal disturbance voltage EMI Receiver 9010 DIE PMM 29/12/ /12/2016 LISN ESH2-Z5 DIE ROHDE & SCHWARZ 20/06/ /06/2017 Pulse Limiter ESH3-Z2 DIE ROHDE & SCHWARZ 20/02/ /02/2017 Test Stand: Disturbance power EMI Receiver 9010 DIE PMM 29/12/ /12/2016 EMI Receiver 9060 DIE B PMM 29/12/ /12/2016 Absorbing clamp MDS21 MIE ROHDE & SCHWARZ 16/07/ /07/2017 Test Stand: Radiated emission EMI Receiver 9010 DIE PMM 29/12/ /12/2016 EMI Receiver 9060 DIE B PMM 29/12/ /12/2016 Antenna SAS-521F-7 DIE AH SYSTEMS Test Stand: Discontinuous disturbances EMI Receiver 9010 DIE PMM 29/12/ /12/2016 LISN ESH2-Z5 DIE ROHDE & SCHWARZ 20/06/ /06/2017 Test Stand: AC Mains Harmonics AC Power supply 360-AMX DIE PACIFIC 25/06/ /07/2017 Power analyser PM3000A DIE VOLTECH 27/11/ /11/ /01/2017 (2) 19/01/2018 (2) Test Stand: AC Mains Voltage fluctuation and flicker (DC 2 khz) AC Power supply 360-AMX DIE PACIFIC 25/06/ /07/2017 Flicker meter PM3000A DIE VOLTECH Series impedance network IEC555 DIE VOLTECH 27/11/ /01/2017 (2) 27/11/ /01/2017 (2) 27/11/ /01/2018 (2) 27/11/ /01/2018 (2) Test Stand: Electrostatic discharge according IEC ESD 0-30 KV ONYX30 DIE HAEFELY 12/01/ /01/2017 Test Stand: Radio-frequency electromagnetic fields according IEC Signal generator DIE PMM 29/12/ /12/2016 RF Amplifier FLH-70B DIE A FRANKONIA 13/07/ /07/2017 Field probe EMR-300 DIE WANDEL & GOLTERMANN 30/09/ /09/2017 Antenna SAS-521F-7 DIE AH SYSTEMS Test Stand: Fast transients acc. IEC EFT Generator TRA-3000 DIE EMC PARTNER 16/08/ /08/2017 Test Stand: Injected currents (radio frequency common mode) IEC Signal generator DIE PMM 29/12/ /12/2016 RF Amplifier FLL-25 DIE FRANKONIA 02/09/ /09/2017 Supply line coupling network FCC-801-M2-25 DIE FCC 17/11/ /11/2018 Supply line coupling network FCC-801-M3-25 DIE FCC 17/11/ /11/2018 Test Stand: Surges acc. IEC SURGE Generator TRA-3000 DIE EMC PARTNER 16/08/ /08/2017 Test Stand: Voltage dips and short interruptions acc. IEC AC Power supply 360-AMX DIE PACIFIC 25/06/ /07/2017 Supplementary information: (2) Test performed on period of requesting calibration process. Extended calibration period does not exceed more than 50% of prior calibration interval according CTL documents. Tested Results validated after last calibration date. * Calibration interval extended based on sufficient calibration data and experience of use (see CTL-OP111 Ed.2.0 sub-clause 6.2.5c)

56 Page 54 of 55 Report No.: 2416/ Measurement instrumentation uncertainties Type of disturbance test method Used test equipment (only main instruments, no details) Calculated uncertainty U CISPR Disturbance voltage Mains terminals 9 khz 150 khz 150 khz 30 MHz Disturbance voltage Unsym. load terminals and others 150 khz 30 MHz Disturbance power Power cables and others 30 MHz 300 MHz EMI Receiver LISN Pulse limiter EMI Receiver LISN Pulse limiter EMI Receiver LISN Absorbing clamp ± 3 db 4.0 db 3.6 db ± 3 db not specified ± 3 db 4.5 db Magnetic field strength 9 khz 30 MHz EMI Receiver Antenna loop N/A not specified Magnetic field strength (Induced RF current) 9 khz 30 MHz EMI Receiver Antenna loop N/A not specified Electric field strength Horiz. 30 MHz 200 MHz Horiz. 200 MHz 1000 MHz Vert. 30 MHz 200 MHz Vert. 200 MHz 1000 MHz ± 5 db 5.2 db Electric field strength 1 GHz 3.5 GHz 3.5 GHz 7 GHz 7 GHz 18 GHz N/A not specified Harmonic currents EN EN AC Power supply Power analyser ± 2,91 % not applicable Flicker EN EN AC Power supply Flicker meter Series impedance network dc = ± 3,22 % dmax= ± 3,22 % Plt= ± 2,74 % Pst= ± 2,74 % not applicable Uncertainties of immunity measurements: There is no procedure how to deal with the results of immunity uncertainty calculations during the testing. Therefore the uncertainties of the immunity test set-ups have not been published here. All instrumentation used for immunity tests is calibrated and within the specifications required by the basic standards (IEC X). Measurement uncertainties associated with other parameters variables determined during tests are available from the Laboratory at Customer s request.

57 Page 55 of 55 Report No.: 2416/ Annex 10.1 Critical components table Table: Critical components information N/A Object Manufacturer/ Trademark Type/Model Remark 10.2 Type designation code No type designation code