N - CHANNEL ENHANCEMENT MODE ULTRA HIGH DENSITY POWER MOS TRANSISTOR

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1 N - CHANNEL ENHANCEMENT MODE ULTRA HIGH DENSITY POWER MOS TRANSISTOR TYPE VDSS RDS(on) ID STP38N06 60 V < 0.03 Ω 38 A (*) PRELIMINARY DATA TYPICAL RDS(on) = Ω AVALANCHE RUGGED TECHNOLOGY 100% AVALANCHE TESTED REPETITIVE AVALANCHE DATA AT 100 o C HIGH CURRENT CAPABILITY 175 o C OPERATING TEMPERATURE HIGH dv/dt RUGGEDNESS APPLICATION ORIENTED CHARACTERIZATION APPLICATIONS HIGH CURRENT, HIGH SPEED SWITCHING POWER MOTOR CONTROL DC-DC & DC-AC CONVERTERS SYNCRONOUS RECTIFICATION TO INTERNAL SCHEMATIC DIAGRAM ABSOLUTE MAXIMUM RATINGS Symbol Parameter Value Unit VDS Drain-source Voltage (VGS =0) 60 V VDGR Drain- gate Voltage (RGS =20kΩ) 60 V VGS Gate-source Voltage ± 20 V I D Drain Current (continuous) at T c =25 o C 38 A I D Drain Current (continuous) at T c =100 o C 26 A IDM( ) Drain Current (pulsed) 152 A Ptot Total Dissipation at Tc =25 o C 90 W Derating Factor 0.6 W/ o C dv/dt(1) Peak Diode Recovery voltage slope 7 V/ Tstg Storage Temperature -65 to 175 Tj Max. Operating Junction Temperature 175 ( ) Pulse width limited by safe operating area o C o C March /11

2 THERMAL DATA R thj-case R t hj- amb R thc-sink Tl Thermal Resistance Junction-case Max Thermal Resistance Junction-ambient Max Thermal Resistance Case-sink Typ Maximum Lead Temperature For Soldering Purpose o C/W o C/W o C/W o C AVALANCHE CHARACTERISTICS Symbol Parameter Max Value Unit IAR E AS EAR I AR Avalanche Current, Repetitive or Not-Repetitive (pulse width limited by T j max, δ <1%) Single Pulse Avalanche Energy (starting T j =25 o C, I D =I AR,V DD =25V) Repetitive Avalanche Energy (pulse width limited by Tj max, δ <1%) Avalanche Current, Repetitive or Not-Repetitive (Tc =100 o C, pulse width limited by Tj max, δ < 1%) 38 A 300 mj 75 mj 26 A ELECTRICAL CHARACTERISTICS (Tcase =25 o C unless otherwise specified) OFF Symbol Parameter Test Conditio Min. Typ. Max. Unit V(BR)DSS Drain-source Breakdown Voltage ID = 250 µa VGS =0 60 V IDSS IGSS Zero Gate Voltage Drain Current (V GS =0) Gate-body Leakage Current (V DS =0) VDS =MaxRating V DS =MaxRatingx0.8 T c = 125 o C VGS = ± 20 V ± 100 na µa µa ON ( ) Symbol Parameter Test Conditio Min. Typ. Max. Unit V GS(th) Gate Threshold Voltage V DS =V GS I D =250µA V RDS(on) Static Drain-source On Resistance VGS = 10V ID =19A V GS = 10V I D =19A T c =100 o C I D(on) On State Drain Current V DS >I D(on) xr DS(on)max VGS =10V Ω Ω 38 A DYNAMIC Symbol Parameter Test Conditio Min. Typ. Max. Unit g fs ( ) Forward Traconductance V DS >I D(on) xr DS(on)max I D =19A S C iss Coss Crss Input Capacitance Output Capacitance Reverse Trafer Capacitance V DS =25V f=1mhz V GS = pf pf pf 2/11

3 ELECTRICAL CHARACTERISTICS (continued) SWITCHING ON Symbol Parameter Test Conditio Min. Typ. Max. Unit t d(on) tr Turn-on Time Rise Time V DD =30V I D =19A RG=50 Ω VGS =10V (see test circuit, figure 3) (di/dt)on Turn-on Current Slope VDD =48V ID=38A R G =50 Ω V GS =10V (see test circuit, figure 5) Q g Q gs Q gd Total Gate Charge Gate-Source Charge Gate-Drain Charge V DD =40V I D =38A V GS =10V A/µs 80 nc nc nc SWITCHING OFF Symbol Parameter Test Conditio Min. Typ. Max. Unit t r(voff) tf t c Off-voltage Rise Time Fall Time Cross-over Time V DD =48V I D =38A RG=50 Ω VGS =10V (see test circuit, figure 5) SOURCE DRAIN DIODE Symbol Parameter Test Conditio Min. Typ. Max. Unit I SD ISDM( ) Source-drain Current Source-drain Current (pulsed) VSD ( ) Forward On Voltage ISD =38A VGS =0 1.5 V t rr Reverse Recovery I SD = 38 A di/dt = 100 A/µs 85 Time VDD =40V Tj = 150 o C Q rr I RRM Reverse Recovery Charge Reverse Recovery Current (see test circuit, figure 5) µc A ( ) Pulsed: Pulse duration = 300 µs, duty cycle 1.5 % ( ) Pulse width limited by safe operating area (1) ISD 20 A, di/dt 300 A/µs, VDD V(BR)DSS, Tj TJMAX A A Safe Operating Area Thermal Impedance 3/11

4 Derating Curve Output Characteristics Trafer Characteristics Traconductance Static Drain-source On Resistance Gate Charge vs Gate-source Voltage 4/11

5 Capacitance Variatio Normalized Gate Threshold Voltage vs Temperature Normalized On Resistance vs Temperature Turn-on Current Slope Turn-off Drain-source Voltage Slope Cross-over Time 5/11

6 Switching Safe Operating Area Accidental Overload Area Source-drain Diode Forward Characteristics Fig. 1: Unclamped Inductive Load Test Circuit Fig. 2: Unclamped Inductive Waveform 6/11

7 Fig. 3: Switching Times Test Circuits For Resistive Load Fig. 4: Gate Charge test Circuit Fig. 5: Test Circuit For Inductive Load Switching And DIode Recovery Times 7/11

8 PSPICE PARAMETERS SUBCIRCUIT COMPONENTS Symbol Parameter Value Unit S1 (V14_16<0) (See Power Mosfet Model Subcircuit) ON S2 (V16_11<0) (See Power Mosfet Model Subcircuit) ON LD Drain Inductance 8 nh LG Gate Inductance 10 nh LS Source Inductance 10 nh RDRAIN Drain Resistance 1.9E -2 Ω RGATE Gate Resistance 1 Ω CGD Gate Drain Capacitance 3.92 nf CGS Gate Source Capacitance 1.9 nf ALFA Drift Coeficient 1E -3 V -1 RGN Negative Bias Resistance 10 KΩ DIODE DRAIN GATE (Depletion Capacitance) Symbol Parameter Value Unit CJO Zero Bias p-n Capacitance 2.6 nf VJ p-n Potential 0.1 V M p-n Grading Coefficient 0.6 DIODE DRAIN SOURCE Symbol Parameter Value Unit CJO Zero Bias p-n Capacitance 7.8 nf VJ p-n Potential 0.1 V M p-n Grading Coefficient 0.6 TT Trait Time 20 ec N MOSFET Symbol Parameter Value Unit L Channel Length 1 µmeter W Channel Width 1 µmeter LEVEL Model Index 3 TOX Oxide Thickness 1 Meter VTO Zero Bias Threshold Voltage 3.25 V U0 Surface Mobility 600 cm 2 /VS THETA Mobility Modulation V -1 Vmax Maximum Drift Velocity 0 Meter/sec KP Tra Conductance Coefficient 28 Amp/V 2 For Traient Simulation Applicate U.I.C. (Use Initial Condition) Option 8/11

9 PSPICE NETLIST OF THE SUBCIRCUIT.SUBCKT STP38N *VALUE OF THE PACKAGE INDUCTANCES LS n LG n LD n *RESISTANCE OF THE GATE POLYSILICON RG *EPY AND DRIFT RESISTANCES RD e-02 EDRI POLY(2) (13 14) (13 11) e-3 *CAPACITANCE GATE SOURCE CGS n *OPTIONAL FOR NEGATIVE GATE BIAS *S SWITCH *CGN n *RGN k *MILLER CAPACITANCE CGD n Power Mosfet Model Subcircuit * DEPLETION CAPACITANCE DGD DGD S SWITCH.MODEL DGD D +IS= +CJO=2.6n +Vj=.1 +M=.6.MODEL SWITCH VSWITCH +RON=1m +ROFF=1MEG +VON=0.1 * OUTPUT CAPACITANCE AND BODY DRAIN DIODE DBD DBD.MODEL DBD D +TT=20n +CJO=7.8n +VJ=.1 +M=.6 * MODEL OF THE MOSFET MMAIN MMAIN L=1u W=1u.MODEL MMAIN NMOS +LEVEL=3 +TOX=1 +VTO=3.25 +uo=600 +THETA= VMAX=5e7 +KP=28.ENDS 9/11

10 TO-220 MECHANICAL DATA DIM. mm inch MIN. TYP. MAX. MIN. TYP. MAX. A C D D E F F F G G H L L L L L L DIA D1 F G C D A E L2 G1 H2 F1 Dia. L5 L7 L9 F2 L6 L4 P011C 10/11

11 Information furnished is believed to be accurate and reliable. However, SGS-THOMSON Microelectronics assumes no respoability for the coequences of use of such information nor for any infringement of patents or other rights of third parties which may results from its use. No licee is granted by implication or otherwise underany patent or patent rights of SGS-THOMSON Microelectronics. Specificatio mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied. SGS-THOMSON Microelectronics products are not authorized for use as critical components in life supportdevices or systems withoutexpress written approval of SGS-THOMSON Microelectonics SGS-THOMSON Microelectronics - All Rights Reserved SGS-THOMSON Microelectronics GROUP OF COMPANIES Australia - Brazil - France - Germany - Hong Kong - Italy - Japan - Korea - Malaysia - Malta - Morocco - The Netherlands - Singapore - Spain - Sweden - Switzerland - Taiwan - Thailand - United Kingdom - U.S.A... 11/11

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