Microwave/Millimeter-Wave RCS Test System

Transcription

1 Microwave/Millimeter-Wave RCS Test System Product Overview Microwave/millimeter-wave RCS test system is mainly used for radar stealth performance test and evaluation of equipment like aircrafts, vehicles, missiles and warships. The test system is capable of accurate RCS test and evaluation, imaging and diagnosis of target strong scattering and distribution, imaging and diagnosis of target local scattering property, evaluation of stealth coating repair effect etc. Taking the vector network analyzer as the core, the system can test radar scattering property at 1 ~ 40GHz by configuring external antennas, calibration kits and motion devices etc. 325GHz millimeter-wave band coverage is achievable after it works together with frequency extension equipment. Highlights of the system are high level of intellectualization,

2 flexible configuration, fast measurement speed, high precision, complete test parameters and so on. Based on the platform, China Electronics Technology Instruments can offer near/far-field test methods, darkroom/outdoor field test plans and filed environment design, integrated system design and construction as well as scanner/turntable and test equipment comparison and selection service to comprehensively meet customers needs. Main Characteristics One/two/three-dimensional RCS imaging, capable of imaging diagnosis and analysis of target strong scattering distribution; Fast imaging of target local scattering property, can achieve fast imaging at a near distance in the working environment; Technology utilizing near-field measurements to characterize far filed RCS, which expands customers test scopes; Flexible system configuration enables free selection of local oscillator and emitter type, frequency extension is fast and convenient; Multi-domain measurement functionality offers three modes: frequency domain, time domain and angle domain; RCS measurement and calibration can eliminate impact on measurement results by errors and improve measurement precision; Time domain gate of hardware can compress background interference by pulse measurement technology and enhance measurement precision; Independent external IF input interface can realize external IF input and increase application flexibility. One/two/three-dimensional RCS imaging They system is capable of one/two/three-dimensional RCS imaging to meet customers demands on analysis and diagnosis of various kinds of complex targets scattering points distribution.

3 Fast imaging of local scattering property The system implements antenna array electric sweep control, near-field multi-dimensional space scattering imaging and interference filtering treatment technologies to realize fast imaging in non-standard outdoor field environment, and the imaging resolution reaches centimeter grade. Millimeter-wave imaging with high resolution Making use of high frequency and wide bandwidth of millimeter-wave, the platform uses linear frequency modulation working mechanism to perform fast two-dimensional scanning together with a scanner, acquire whole 3D information of the target under test, and realize high resolution three-dimensional imaging or two-dimensional tomography. It can be widely applied in composite material test, internal defect diagnosis, food test and other non-destructive tests. Near-field to far-field RCS transformation technology The platform is capable of near filed test transforming far-field RCS, which can perform test on scattering property of target with larger size and higher working band, and provide test

4 solutions for users limited by field circumstances. Multi-domain measurement Besides fundamental sweep measurement, the platform is capable of time-domain display of test results by conversion technology from time to frequency domain, for convenient check on one-dimensional distribution regularity of target scattering property. It supports angle domain measurement, which can test target scattering data at different angles in the mode of CW, for test and evaluation convenience of target scattering property in different directions. RCS measurement and calibration The system software offers complete RCS calibration algorithm, can eliminate impact on measurement results by system error and isolation error, and improve measurement precision. The software supports many regular calibration kits like metal ball, trihedral corner reflector, dihedral corner reflector, metal sheet, metal cylinder etc, enhances users selection flexibility. Hardware time-domain gate functionality The built-in pulse modulator and pulse signal generator inside the host work together with the IF receiving hardware pulse gating circuit and dedicated pulse measurement control software to achieve generation and measurement of pulse modulation signals, to separate interference signals from hardware time-domain of and target echo, so as to increase RCS measurement precision

5 to a great extent. Independent external IF input interface The host possesses a dedicated external IF signal input hardware interface and software control menu, which can receive and process IF signals at 7.606MHz directly. The system can configure flexible external mixing solutions as per customers demands, to make the system more universal and flexible. Typical Applications and Examples The microwave/millimeter-wave RCS test system possesses radar scattering cross section measurement functionality, scattering imaging functionality, rich hardware interfaces and universal and flexible software platform, provides a basic-type universal platform for radar scattering cross section test and imaging system buildup for various applications, to meet test demands of radar scattering property in many situations, like microwave darkroom, standard external field, indoor compact field, experiment external field and so on. Far-field RCS test

6 Near-field RCS test Compact field RCS test Technical Specifications Parameters Frequency range Measurement mode Polarization mode Peak power Receiving sensitivity emitting Support calibration kits Power Specifications 1GHz~20GHz/40GHz(frequency can be expanded to 325GHz) Standard single-station, double-station HH,VV,HV,VH Power <1500W +10dBm(typical value, without power amplifier) -110dBm(typical value, without low-noise amplifier) Metal ball, metal sheet, metal corner reflector, comparable physical object with calibrated RCS value 220Vac 10%;50Hz 5%

7 consumption Structure Dimension 1.6M standard cabinet(without turntable and antenna equipment) W H D= 600mm 1600mm 800mm Ordering Information Standard 1 No. Description Model Qty. 1 Vector analyzer 2 Standard antenna 3 4 network Host computer and printer System control and analysis software AV3672 series 1 unit for each band M cabinet AV each 6 System cable 7 Turntable 8 Scanner connection Configured as per customers requirements Configured as per customers requirements 9 User s Manual 10 Certificate conformity of 1 each Options 1 AV Near-field test options AV Frequency extension test options AV Power amplifiers AV Low-noise amplifiers AV RCS calibration kits AV Fast imaging options of local scattering property AV Millimeter-wave high resolution imaging options Note 1:Specific system configurations are customer-oriented, please consult our engineers.