ELECTRONICS TESTING CENTER, TAIWAN

Transcription

1 Report No.: MAS EMC TESTING DEPARTMENT Page: 1/27 CONFORMANCE TEST REPORT FOR ECE R10(REV.05) Report No.: MAS-233 Client: Product: Model No.: Comment Issues: Trade Name: Manufacturer/supplier: Double Intelligence Technology Co. Multimedia Interface for vehicle DITPSA208 PSA208xxx(x=a~z,0-9 or space to denote for marketing purpose),nik-psa01 N/A Double Intelligence Technology Co. Date test item received: 2014/06/05 Date test campaign completed: 2014/12/30 Date of issue 2015/03/06 The test result only corresponds to the tested sample. It is not permitted to copy this report, in part or in full, without the permission of the test laboratory. Total number of pages of this test report: 27 pages Total number of pages of this test annex: 12 pages Test Engineer Checked By Approved By Chris Liu Kevin Lin Jerry Huang ELECTRONICS TESTING CENTER, TAIWAN NO.8, LANE 29, WEN-MING RD., LO-SHAN TSUN, KUI-SHAN HSIANG, TAOYUAN HSIEN 333 TAIWAN, R.O.C. TEL: (03) ~4 INT: ~4 FAX: (03) INT:

2 Report No.: MAS EMC TESTING DEPARTMENT Page: 2/27 CONTENTS EMC TEST REPORT... 1 CONTENTS TEST REPORT CERTIFICATION Test Information TEST EQUIPMENT TEST Level Modification Record TEST SETUP CONFIGURATION OF THE EUT EUT OPERATING CONDITION RADIATED EMISSION TEST RESULTS ISO Classification of Functional Status Presentation of Results TEST DATA & RELATED INFORMATIONS Voltage Transient Emissions Test ANNEX A: PHOTOS OF TESTING... A1~A7 ANNEX B: CONSTRUCTION PHOTOS OF EUT... B1~B4 ANNEX C: DIFFERENCE INFORMATIONS OF SERIES MODEL..C1

3 Report No.: MAS EMC TESTING DEPARTMENT Page: 3/27 1. TEST REPORT CERTIFICATION Applicant: Double Intelligence Technology Co. Manufacturer: Double Intelligence Technology Co. Description of EUT: a) Type of EUT : Multimedia Interface for vehicle b) Model No. : DITPSA208 c) Comment Issues : PSA208xxx(x=a~z,0-9 or space to denote for marketing purpose),nik-psa01 d) Power Supply : DC 12V MEASUREMENT PROCEDURE USED :ECE R10(Rev.05) We hereby certify that : The measurements contained in this report were made in accordance with the procedures indicated, and the energy emitted by the equipment was found to be within the limits applicable. Laboratory Introduction: Electronics Testing Center, Taiwan is recognized, filed and mutual recognition arrangement as following: ISO9001: TüV Product Service ISO/IEC 17025: BSMI, TAF, NCC, NVLAP, CCIBLAC, UL, Compliance Filing: FCC, Industry Canada, VCCI MRA: Australia, Hong Kong, New Zealand, Singapore, USA, Japan, Korea, China, APLAC through NCC

4 Report No.: MAS EMC TESTING DEPARTMENT Page: 4/ TEST EQUIPMENT EQIPMENT / FACILITIES TEST RECEIVER BI-LOG ANTENNA Artifical mains Network Artifical mains Network Voltage Generator Drop Ultra Compact Simulator Voltage Probe Artifical mains Network Artifical mains Network SPECIFICA- TIONS 20 khz TO 8.0 GHz 30 MHz TO 1 GHz 0.1MHz TO 150MHz 0.1MHz TO 150MHz 2. TEST INFORMATION MANUFACTU R - ER MODEL # / SERIAL # DATE OF CAL. & CAL. CENTER Recommended Recal. Date DUE DATE FINAL TEST R&S ESU Aug.06, 2014 Aug.05, Y V SCHAFFNER VULB9160 Sep. 23, 2014 Sep.22, Y V SCHWARZBE CK SCHWARZBE CK NNBM A NNBM A Apr.29, 2014 Apr. 28, Y V Apr.29, 2014 Apr. 28, Y V N/A EM TEST VDS 200 B1 Jan Jan Y V N/A EM TEST UCS 200 M Jan Jan Y V 500MHz,10M Ω,10X, 1.3m 0.01MHz TO 1000MHz 0.01MHz TO 1000MHz Tektrenix P6139A N/A N/A 1Y V FCC FCC FCC-LISN T FCC-LISN T May.09, 2014 May.08, Y V May.09, 2014 May.08, Y V 2.2 TEST LEVEL CISPR25

5 Report No.: MAS EMC TESTING DEPARTMENT Page: 5/ ISO7637-2

6 Report No.: MAS EMC TESTING DEPARTMENT Page: 6/ ISO11452 The immunity test levels shall be 60 volts/m rms for the 150 mm stripline testing method, 15 volts/m rms for the 800 mm stripline testing method, 75 volts/m rms for the Transverse Electromagnetic Mode (TEM) cell testing method, 60 ma rms for the bulk current injection (BCI) testing method and 30 volts/m rms for the free field testing method in over 90 per cent of the 20 to 2,000 MHz frequency band, and to a minimum of 50 volts/m rms for the 150 mm stripline testing method, 12.5 volts/m rms for the 800 mm stripline testing method, 62.5 volts/m rms, for the TEM cell testing method, 50 ma rms for the bulk current injection (BCI) testing method and 25 volts/m rms for the free field testing method over the whole 20 to 2,000 MHz frequency band. 2.3 MODIFICATION RECORD No modifications were required. (That is the EUT complied with the requirement as tested.) 2.4 TEST SETUP CISPR25

7 Report No.: MAS EMC TESTING DEPARTMENT Page: 7/ ISO Transient immunity test Transient Emssion test

8 Report No.: MAS EMC TESTING DEPARTMENT Page: 8/ ISO11452 ISO ISO

9 Report No.: MAS EMC TESTING DEPARTMENT Page: 9/ CONFIGURATION OF THE EUT The EUT was configured according to ECE R10. All interface ports were connected to the appropriate peripherals. All peripherals and cables are listed below. (1).EUT DEVICE MANUFACTURER MODEL # REMARK PSA Double Intelligence Technology Co. DITPSA208 N/A (2). INTERNAL DEVICES DEVICE MANUFACTURER MODEL # REMARK (3). PERIPHERALS DEVICE MANUFACTURER MODEL # SERIAL # CABLE Battery YUASA 55D23L N/A REMARK: 1. Cables - All 1m or greater in length - bundled according to regulations.

10 Report No.: MAS EMC TESTING DEPARTMENT Page: 10/ EUT OPERATING CONDITION Operating condition is according to ECE R EUT Power ON. 2. Set-up the EUT under recording working function.

11 Report No.: MAS EMC TESTING DEPARTMENT Page: 11/27 3. RADIATED EMISSION TEST RESULTS 3.1 BROADBAND TEST The frequency spectrum from 30 MHz to 1 GHz was investigated. Under 1 GHz, ESA Narrowband readings are AV values. Values with a resolution bandwidth of 120 KHz. Measurement were made at 1 meter. Test Date : Dec. 29, 2014 Temperature : 22 Humidity : 63 % Test Mode : Broadband Test Voltage : DC 12V Test Result : Pass EUT Mode : Operation

12 Report No.: MAS EMC TESTING DEPARTMENT Page: 12/27 Antenna Polarization: Horizontal No. Frequency Reading Corrected Result Limit Margin (MHz) (dbuv/m) Factor(dB) (dbuv/m) (dbuv/m) (db) REMARKS : 1. The Expanded Uncertainty : + 4.5dB / - 4.6dB (30MHz ƒ 300MHz),Confidence level 95%, Coverage factor K= dB / - 4.3dB (300MHz ƒ 1GHz), Confidence level 95%, Coverage factor K=2. 2. If an ESA broadband test applies, the results of measurement shall find the maximum values in the 14 frequencies:30~34, 34~45, 45~60, 60~80, 80~100, 100~130, 130~170, 170~225, 225~300, 300~400, 400~525, 525~700, 700~850, 850~1000 with AVG detector. 3. Place of Measurement: Measuring site of the ETC 4. Measurement Distance: 1 m 5. Height of table on which the EUT was placed: 1.0 m 6. Height of Receiving Antenna: 1.15 m 7. If the data table appeared symbol of "***" means the value was too low to be measured. If the data table appeared symbol of # means the noise was low, so record the peak value.

13 Report No.: MAS EMC TESTING DEPARTMENT Page: 13/27 Antenna Polarization: Vertical No. Frequency Reading Corrected Result Limit Margin (MHz) (dbuv/m) Factor(dB) (dbuv/m) (dbuv/m) (db) REMARKS : 1. The Expanded Uncertainty : + 4.5dB / - 4.6dB (30MHz ƒ 300MHz),Confidence level 95%, Coverage factor K= dB / - 4.3dB (300MHz ƒ 1GHz), Confidence level 95%, Coverage factor K=2. 2. If an ESA broadband test applies, the results of measurement shall find the maximum values in the 14 frequencies:30~34, 34~45, 45~60, 60~80, 80~100, 100~130, 130~170, 170~225, 225~300, 300~400, 400~525, 525~700, 700~850, 850~1000 with AVG detector. 3. Place of Measurement: Measuring site of the ETC 4. Measurement Distance: 1 m 5. Height of table on which the EUT was placed: 1.0 m 6. Height of Receiving Antenna: 1.15 m 7. If the data table appeared symbol of "***" means the value was too low to be measured. If the data table appeared symbol of # means the noise was low, so record the peak value.

14 Report No.: MAS EMC TESTING DEPARTMENT Page: 14/ NARROWBAND TEST The frequency spectrum from 30 MHz to 1 GHz was investigated. Under 1 GHz, Broadband readings are QP values. Values with a resolution bandwidth of 120 KHz. Measurement were made at 1 meter. Test Date : Dec. 29, 2014 Temperature : 22 Humidity : 63 % Test Mode : Narrowband Test Voltage : DC 12V Test Result : Pass EUT Mode : Operation

15 Report No.: MAS EMC TESTING DEPARTMENT Page: 15/27 Antenna Polarization: Horizontal No. Frequency Reading Corrected Result Limit Margin (MHz) (dbuv/m) Factor(dB) (dbuv/m) (dbuv/m) (db) REMARKS : 1. The Expanded Uncertainty : + 4.5dB / - 4.6dB (30MHz ƒ 300MHz),Confidence level 95%, Coverage factor K= dB / - 4.3dB (300MHz ƒ 1GHz), Confidence level 95%, Coverage factor K=2. 2. If an ESA broadband test applies, the results of measurement shall find the maximum values in the 14 frequencies:30~34, 34~45, 45~60, 60~80, 80~100, 100~130, 130~170, 170~225, 225~300, 300~400, 400~525, 525~700, 700~850, 850~1000 with QP detector. 3. Place of Measurement: Measuring site of the ETC 4. Measurement Distance: 1 m 5. Height of table on which the EUT was placed: 1.0 m 6. Height of Receiving Antenna: 1.15 m 7. If the data table appeared symbol of "***" means the value was too low to be measured. If the data table appeared symbol of # means the noise was low, so record the peak value.

16 Report No.: MAS EMC TESTING DEPARTMENT Page: 16/27 Antenna Polarization: Vertical No. Frequency Reading Corrected Result Limit Margin (MHz) (dbuv/m) Factor(dB) (dbuv/m) (dbuv/m) (db) REMARKS : 1. The Expanded Uncertainty : + 4.5dB / - 4.6dB (30MHz ƒ 300MHz),Confidence level 95%, Coverage factor K= dB / - 4.3dB (300MHz ƒ 1GHz), Confidence level 95%, Coverage factor K=2. 2. If an ESA broadband test applies, the results of measurement shall find the maximum values in the 14 frequencies:30~34, 34~45, 45~60, 60~80, 80~100, 100~130, 130~170, 170~225, 225~300, 300~400, 400~525, 525~700, 700~850, 850~1000 with QP detector. 3. Place of Measurement: Measuring site of the ETC 4. Measurement Distance: 1 m 5. Height of table on which the EUT was placed: 1.0 m 6. Height of Receiving Antenna: 1.15 m 7. If the data table appeared symbol of "***" means the value was too low to be measured. If the data table appeared symbol of # means the noise was low, so record the peak value.

17 Report No.: MAS EMC TESTING DEPARTMENT Page: 17/27 4. ISO CLASSIFICATION OF FUNCTIONAL STATUS All classifications given below are for the total device / system functional status. Class A: All functions of a device / system perform as designed during and after exposure to disturbance. Class B: All functions of a device / system perform as designed during exposure: however, one or more of them can go beyond specified tolerance. All function return automatically to within normal limits after exposure is removed. Memory functions shall remain Class A. Class C: A function of a device / system does not perform as designed during exposure but returns automatically to normal operation after exposure is removed. Class D: A function of a device / system does not perform as designed during exposure and does not return to normal operation until exposure is removed and the device system is reset by simple "operator / use" action. Class E: One or more function of a device / system does not perform as designed during and after exposure and cannot be returned to proper operation without repairing or replacing the device / system. 4.2 PRESENTATION OF RESULTS 4.2.1TEST PULSE 1 - Satisfies Class A - Satisfies Class B - Satisfies Class C - Satisfies Class D - Satisfies Class E Requirement: TEST PULSE 2a - Satisfies Class A - Satisfies Class B - Satisfies Class C - Satisfies Class D - Satisfies Class E Requirement: --

18 Report No.: MAS EMC TESTING DEPARTMENT Page: 18/ TEST PULSE 2b - Satisfies Class A - Satisfies Class B - Satisfies Class C - Satisfies Class D - Satisfies Class E Requirement: TEST PULSE 3a - Satisfies Class A - Satisfies Class B - Satisfies Class C - Satisfies Class D - Satisfies Class E Requirement: TEST PULSE 3b - Satisfies Class A - Satisfies Class B - Satisfies Class C - Satisfies Class D - Satisfies Class E Requirement: TEST PULSE 4 - Satisfies Class A - Satisfies Class B - Satisfies Class C - Satisfies Class D - Satisfies Class E Requirement: --

19 Report No.: MAS EMC TESTING DEPARTMENT Page: 19/ TEST DATA & RELATED INFORMATIONS 4.3.1TEST PULSE 1 TEST DATA A. Operating Conditions of the EUT: Operating mode Test Date: Dec. 30, 2014 Test Specification ISO (2004) Test Pulse 1 Climatic Condition Ambient Temperature Pressure Humidity Application : 21 C : 990 mpa : 61 %RH : 12V System T e s t P r o c e d u r e Pulse Name: ISO : 2004 : Pulse 1 Test generator: UCS200M Software No.: Serial No.: Coupling network: UCS200M Serial No.: Va (Alternator): 13.5 V Current limit: 30 A T e s t S e t u p Vs: -75 V t1: 0.5 s t2: 200 ms tr: 1 us td: 2000 us Ri: 10 Ohm Coupling: Battery Events: 5000 Test duration: 00:41:40 h T e s t R e s u l t Pulses: 5000 Result: Test passed! Criteria C Note: C means the function of a device / system does not perform as designed during exposure but returns automatically to normal operation after exposure is removed.

20 Report No.: MAS EMC TESTING DEPARTMENT Page: 20/ TEST PULSE 2A TEST DATA A. Operating Conditions of the EUT: Operating mode Test Date: Dec. 30, 2014 Test Specification ISO : 2004 : Pulse 2a Climatic Condition Ambient Temperature Pressure Humidity Application : 21 C : 990 mpa : 61 %RH : 12V System T e s t P r o c e d u r e Pulse Name: ISO : 2004 : Pulse 2a Test generator: UCS200M Software No.: Serial No.: Coupling network: UCS200M Serial No.: Va (Alternator): 13.5 V Current limit: 30 A T e s t S e t u p Vs: +37 V t1: 0.2 s tr: 1 us td: 50 us Ri: 2 Ohm Coupling: Battery Events: 5000 Test duration: 00:16:40 h T e s t R e s u l t Pulses: 5000 Result: Test passed! Criteria A Note: A means the functions of a device / system perform as designed during and after exposure to disturbance.

21 Report No.: MAS EMC TESTING DEPARTMENT Page: 21/ TEST PULSE 2B TEST DATA A. Operating Conditions of the EUT: Operating mode Test Date: Dec. 30, 2014 Test Specification ISO : 2004 : Pulse 2b Climatic Condition Ambient Temperature Pressure Humidity Application : 21 C : 990 mpa : 61 %RH : 12V System T e s t P r o c e d u r e Pulse Name: ISO : 2004 : Pulse 2b Test generator: VDS200B1 Software No.: Serial No.: Coupling network: UCS200M Serial No.: Va (Alternator): 13.5 V Current limit: 70 A T e s t S e t u p Vs: 10.0 V t1: 1.0 s t6: 1 ms td: 200 ms Int: 1.0 s Ri: 0.05 Ohm t12: 1 ms tr: 1 ms Events: 10 Test duration: 00:00:30 h T e s t R e s u l t Pulses: 10 Result: Test passed! Criteria C Note: C means the function of a device / system does not perform as designed during exposure but returns automatically to normal operation after exposure is removed.

22 Report No.: MAS EMC TESTING DEPARTMENT Page: 22/ TEST PULSE 3A TEST DATA A. Operating Conditions of the EUT: Operating mode Test Date: Dec. 30, 2014 Test Specification ISO : 2004 : Pulse 3a Climatic Condition Ambient Temperature Pressure Humidity Application : 21 C : 990 mpa : 61 %RH : 12V System T e s t P r o c e d u r e Pulse Name: ISO : 2004 : Pulse 3a Test generator: UCS200M Software No.: Serial No.: Va (Alternator): 13.5 V Current limit: 30 A T e s t S e t u p Vs: -112 V f1: 10 khz t4: 10 ms t5: 90 ms tr: 5 ns td: 100 ns Ri: 50 Ohm Coupling: Battery Test duration: 1 h T e s t R e s u l t Test duration: 01:00:01 h Result: Test passed! Criteria A Note: A means the functions of a device / system perform as designed during and after exposure to disturbance.

23 Report No.: MAS EMC TESTING DEPARTMENT Page: 23/ TEST PULSE 3B TEST DATA A. Operating Conditions of the EUT: Operating mode Test Date: Dec. 30, 2014 Test Specification ISO : 2004 : Pulse 3b Climatic Condition Ambient Temperature Pressure Humidity Application : 21 C : 990 mpa : 61 %RH : 12V System T e s t P r o c e d u r e Pulse Name: ISO : 2004 : Pulse 3b Test generator: UCS200M Software No.: Serial No.: Va (Alternator): 13.5 V Current limit: 30 A T e s t S e t u p Vs: +75 V f1: 10 khz t4: 10 ms t5: 90 ms tr: 5 ns td: 100 ns Ri: 50 Ohm Coupling: Battery Test duration: 1 h T e s t R e s u l t Test duration: 01:00:01 h Result: Test passed! Criteria A Note: A means the functions of a device / system perform as designed during and after exposure to disturbance.

24 Report No.: MAS EMC TESTING DEPARTMENT Page: 24/ TEST PULSE 4 TEST DATA A. Operating Conditions of the EUT: Operating mode Test Specification ISO : 2004 : Pulse 4 Test Date: Dec. 30, 2014 Climatic Condition Ambient Temperature Pressure Humidity Application : 21 C : 990 mpa : 61 %RH : 12V System T e s t P r o c e d u r e Pulse Name: ISO : 2004 : Pulse 4 Test generator: VDS200B1 Software No.: Serial No.: Coupling network: UCS200M Serial No.: Vb (Battery): 12.0 V Current limit: 30 A T e s t S e t u p Va1: -6.0 V Va2: -2.5 V t1: 1.0 s t6: 5 ms t7: 15 ms t8: 50 ms t9: 0.5 s t11: 5 ms Events: 1 Test duration: 00:00:02 h T e s t R e s u l t Pulses: 1 Result: Test passed! Criteria C Note: C means the function of a device / system does not perform as designed during exposure but returns automatically to normal operation after exposure is removed.

25 Report No.: MAS EMC TESTING DEPARTMENT Page: 25/27 5. VOLTAGE TRANSIENT EMISSIONS TEST 5.1 EMISSION OF CONDUCTED DISTURBANCES A. Switch ON(Slow)-DC 12V B. Switch OFF (Slow) -DC 12V

26 Report No.: MAS EMC TESTING DEPARTMENT Page: 26/27 C. Switch ON (Fast) -DC 12V D. Switch OFF (Fast) -DC 12V

27 Report No.: MAS EMC TESTING DEPARTMENT Page: 27/27 Test Result Model(s): DITPSA208 Date of test: Test Mode: 12VDC input, Switch On and Switch Off Test Result: Pass Measurement result: 12 VDC input Polarity of pulse amplitude Maximum allowed value for vehicles with 12V systems Slow pulses Test results Fast pulses Positive Negative

28 Report No.: MAS EMC TESTING DEPARTMENT Page: A7/A7 ANNEX A: PHOTOS OF TESTING (1.)Radiated emission test front view (2.) Radiated emission test back view

29 Report No.: MAS EMC TESTING DEPARTMENT Page: A7/A7 (3.)ISO test setup photo (4.)Voltage transient slow setup photo

30 Report No.: MAS EMC TESTING DEPARTMENT Page: A7/A7 (5.)Voltage transient fast setup photo

31 Report No.: MAS EMC TESTING DEPARTMENT Page: B1/B4 ANNEX B: CONSTRUCTION PHOTOS OF EUT (1).Outside View 1 of EUT (2). Outside View 2 of EUT

32 Report No.: MAS EMC TESTING DEPARTMENT Page: B2/B4 (3).Outside View 3 of EUT (4). Outside View 4 of EUT

33 Report No.: MAS EMC TESTING DEPARTMENT Page: B3/B4 (5). Inside View 1 of EUT (6). Inside View 2 of EUT

34 Report No.: MAS EMC TESTING DEPARTMENT Page: B4/B4 (7). Inside View 3 of EUT

35 Report No.: MAS EMC TESTING DEPARTMENT Page: C1/C1 ANNEX C:DIFFERENCE INFORMATIONS OF SERIES MODEL 1. Tested variant: DITPSA The variants without tested: PSA208xxx(x=a-z, 0-9 or space to denote for marketing purpose.), NIK-PSA01