2004/104/EC Measurement and Test Report
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1 2004/104/EC Measurement and Test Report For LM Technologies Ltd. Unit19, Spectrum House, 32-34, Gordon House Road, London, NW5 1LP, United Kingdom Compliance Directive: Product Description: 2004/104/EC LM048 Bluetooth Serial Adapter Tested Model: Report No.: STR E Tested Date: to Issued Date: Tested By: Seven Song / Engineer Reviewed By: Lahm Peng / EMC Manager Approved & Authorized By: Jandy so / PSQ Manager Prepared By: SEM.Test Compliance Service Co., Ltd 3/F, Jinbao Commerce Building, Xin'an Fanshen Road, Bao'an District, Shenzhen, P.R.C.(518101) Tel.: Fax.: Website: Note: This test report is limited to the above client company and the product model only. It may not be duplicated without prior permitted by SEM.Test Compliance Service Co., Ltd REPORT NO.: STR E PAGE 1 OF 22 EMC REPORT
2 TABLE OF CONTENTS 1. GENERAL INFORMATION PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) TEST STANDARDS TEST METHODOLOGY TEST FACILITY EUT SETUP AND OPERATION MODE SUMMARY OF TEST RESULTS BROADBAND/NARROWBAND RADIATED DISTURBANCES MEASUREMENT UNCERTAINTY TEST EQUIPMENT LIST AND DETAILS TEST PROCEDURE TEST RECEIVER SETUP TEST RESULTS CONDUCTED TRANSIENT DISTURBANCES TEST EQUIPMENT TEST PROCEDURE TEST DATA/PLOTS CONDUCTED TRANSIENT IMMUNITY TEST EQUIPMENT TEST PROCEDURE TEST DATA/PLOTS...13 EXHIBIT 1 - EUT PHOTOGRAPHS...18 EXHIBIT 2 - TEST SETUP PHOTOGRAPHS...21 REPORT NO.: STR E PAGE 2 OF 22 EMC REPORT
3 1. GENERAL INFORMATION 1.1 Product Description for Equipment Under Test (EUT) Client Information Applicant: Address of applicant: LM Technologies Ltd. Unit19, Spectrum House, 32-34, Gordon House Road, London, NW5 1LP, United Kingdom Manufacturer: Address of manufacturer: LM Technologies Ltd. Unit19, Spectrum House, 32-34, Gordon House Road, London, NW5 1LP, United Kingdom General Description of EUT Product Name: LM048 Bluetooth Serial Adapter Trade Name: LM Model No.: Adding Model(s): / Note: The test data is gathered from a production sample, provided by the manufacturer. Technical Characteristics of EUT Rated Voltage: Rated Current: DC 5V 90mA REPORT NO.: STR E PAGE 3 OF 22 EMC REPORT
4 1.2 Test Standards The following report is prepared on behalf of LM Technologies Ltd. in accordance with EMC requirements of COMMISSION DIRECTIVE 2004/104/EC of 14 October 2004, Section 6.5, 6.6, 6.7, 6.8, 6.9, defined by the manufacture. The objective of the manufacturer is to demonstrate compliance with EMC requirements of COMMISSION DIRECTIVE 2004/104/EC of 14 October 2004, Section 6.5, 6.6, 6.7, 6.8, 6.9. Maintenance of compliance is the responsibility of the manufacturer. Any modification of the product, which result in lowering the emission/immunity, should be checked to ensure compliance has been maintained. 1.3 Test Methodology All measurements contained in this report were conducted with EMC requirements of COMMISSION DIRECTIVE 2004/104/EC of 14 October 2004, Section 6.5, 6.6, 6.7, 6.8, 6.9. Annex VII, Annex VIII and ISO :DIS2002 Annex X. 1.4 Test Facility FCC Registration No.: SEM.Test Compliance Services Co., Ltd. EMC Laboratory has been registered and fully described in a report filed with the (FCC) Federal Communications Commission. The acceptance letter from the FCC is maintained in our files and the Registration is Industry Canada (IC) Registration No.: 7673A The 3m Semi-anechoic chamber of SEM.Test Compliance Services Co., Ltd. has been registered by Certification and Engineering Bureau of Industry Canada for radio equipment testing with Registration No.: 7673A. CNAS Registration No.: L4062 Shenzhen SEM.Test Electronics Service Co., Ltd. is a testing organization accredited by China National Accreditation Service for Conformity Assessment (CNAS) according to ISO/IEC The accreditation certificate number is L4062. All measurement facilities used to collect the measurement data are located at 3/F, Jinbao Commerce Building, Xin an Fanshen Road, Bao an District, Shenzhen, P.R.C (518101) REPORT NO.: STR E PAGE 4 OF 22 EMC REPORT
5 1.5 EUT Setup and Operation Mode The equipment under test (EUT) was configured to measure its highest possible emission/immunity level. The test modes were adapted according to the operation manual for use, more detailed description as follows: Test Mode List: Test Mode Description Remark TM1 Connect to BT Device / TM2 / / EUT Cable List and Details Cable Description Length (M) Shielded/Unshielded With Core/Without Core USB Cable 0.7 Shielded Without Core RS232-USB Cable 1.8 Shielded Without Core Auxiliary Equipment List and Details Description Manufacturer Model Serial Number Notebook SAMSUNG NP-R20 124V93FP30082V Special Cable List and Details Cable Description Length (M) Shielded/Unshielded With Core/Without Core / / / / REPORT NO.: STR E PAGE 5 OF 22 EMC REPORT
6 2. SUMMARY OF TEST RESULTS Standards Description of Test Item Result 6.5 Specification concerning broadband electromagnetic interference generated by ESAs Compliant 6.6 Specifications concerning narrowband electromagnetic interference generated by ESAs Compliant 2004/104/EC 6.7 Specifications concerning immunity of ESAs to electromagnetic radiation N/A 6.8 Specifications concerning the immunity to transient disturbances conducted along supply lines Compliant 6.9 Specifications concerning the emission of conducted disturbances Compliant REPORT NO.: STR E PAGE 6 OF 22 EMC REPORT
7 3. Broadband/Narrowband Radiated Disturbances 3.1 Measurement Uncertainty Base on NIS 81, The Treatment of Uncertainty in EMC Measurements, the best estimate of the uncertainty of any conducted emissions measurement is db. 3.2 Test Equipment List and Details Description Manufacturer Model Serial Number Cal. Date Due. Date Spectrum Analyzer R&S FSP / EMI Test Receiver R&S ESVB / Pre-amplifier Agilent 8447F 3113A Pre-amplifier Compliance Direction PAP Trilog Broadband Antenna SCHWARZBECK VULB Horn Antenna ETS Test Procedure Test is conducting under the description of 6.5 Specification concerning broadband electromagnetic interference generated by ESAs and 6.6 Specifications concerning narrowband electromagnetic interference generated by ESAs of EMC directive 2004/104/EC. 3.4 Test Receiver Setup During the conducted emission test, the test receiver was set with the following configurations: Start Frequency MHz Stop Frequency MHz Sweep Speed... Auto RBW khz (for Broadband) VBW khz (for Broadband) RBW khz (for Narrowband) VBW khz (for Narrowband) 3.5 Test Results dbμv at MHz in the Horizontal polarization (Narrowband), 30 MHz to 1 GHz, 3Meters REPORT NO.: STR E PAGE 7 OF 22 EMC REPORT
8 Plot of Radiated Emissions Test Data EUT: LM048 Bluetooth Serial Adapter Tested Model: Operating Condition: Operating Comment: Connect to other Bluetooth device Test Specification: Horizontal No. Frequency Reading Correct Result Limit Margin Degree Height Remark (MHz) (dbuv/m) db/m (dbuv/m) (dbuv/m) (db) ( ) (cm) Broadband Broadband Broadband Narrowband Narrowband Narrowband REPORT NO.: STR E PAGE 8 OF 22 EMC REPORT
9 Test Specification: Horizontal No. Frequency Reading Correct Result Limit Margin Degree Height Remark (MHz) (dbuv/m) db/m (dbuv/m) (dbuv/m) (db) ( ) (cm) Broadband Broadband Broadband Narrowband Narrowband Narrowband REPORT NO.: STR E PAGE 9 OF 22 EMC REPORT
10 4. Conducted Transient Disturbances 4.1 Test Equipment Item Model Manufacturer Description Cal. Date Due. Date 1 DL9140 Yokogawa Digital Oscilloscope ESH3-Z6 AMN Rohde & Schwarz NSG 417 Switch simulator Schaffner Test Procedure Test is conducting under the description of ISO/DIS Test Data/Plots REPORT NO.: STR E PAGE 10 OF 22 EMC REPORT
11 Applicant: LM Technologies Ltd Manufacturer: LM Technologies Ltd Type / Model: Serial Number: / Report Number: STR Athmospheric pressure: hpa Temperature: Humidity: 40-60% Test according to: 2004/104/EC Engineer: Seven Operation mode: On Test Place: Shield room B Date of test: Limits for the classification of 12V equipment (Grenzwrte fur die klassifizierung von 12V Geraten) Polarity Limits for class III equipment Max. measured voltage Test Result: Positive +75V Passed Negative -100V Passed Remarks: Fast on/off REPORT NO.: STR E PAGE 11 OF 22 EMC REPORT
12 Slow on/off REPORT NO.: STR E PAGE 12 OF 22 EMC REPORT
13 5. Conducted Transient Immunity 5.1 Test Equipment Item Model Manufacturer Description Cal. Date Due. Date 1 EFT 200 EM TEST ISO 7637 test system MPG 200 EM TEST ISO 7637 test system LD 200 EM TEST ISO 7637 test system CAN 200 EM TEST ISO 7637 test system VDS 200 EM TEST ISO 7637 test system Test Procedure Test is conducting under the description of ISO/DIS Test Data/Plots Transients and Surges in the Vehicle Environment Test Method: ISO Test date: Test Level: Pluse 1, 2a, 2b, 3a and 3b and 4. Polarity: EUT Operation: Positive & Negative Test in FM receiving mode and Cassette playing mode Ambient: Temp.: 25 C, Humid.: 57 % Press.: 1011 mbar Status: Test in FM receiving mode and Cassette playing mode Test Procedure: Compliance test was performed in mode 1) Equipment Used: Refer to section 5 for details. Test Procedure: ISO/DIS : Pulse 1 REPORT NO.: STR E PAGE 13 OF 22 EMC REPORT
14 Test generator: MPG200B Software No.: Serial No.: Coupling network: CNA200 Serial No.: Va (Alternator): 13.2 V Current limit: 10 D Test setup: Vs: -75 V t1: 0.5 s t2: 200 ms Impedance: 10 Ohm Connection: +/- Events: 10 Test duration: 5 s REPORT NO.: STR E PAGE 14 OF 22 EMC REPORT
15 T e s t P r o c e d u r e ISO/DIS : Pulse 2a Test generator: MPG200B Software No.: Serial No.: Coupling network: CNA200 Serial No.: Va (Alternator): 13.2 V Current limit: 10 D Test setup: Vs: +37 V t1: 0.5 s Impedance: 2 Ohm Connection: +/- Events: 10 Test duration: 5 s T e s t P r o c e d u r e ISO/DIS : Pulse 2b Test generator: VDS200B PF Software No.: Serial No.: Coupling network: CNA200 Serial No.: Va (Alternator): 13.2 V Current limit: 15 D Test setup: Vs: 10.0 V t1: 0.5 s t6: 1 ms td: 1000 ms Int: 0.5 s Ri: 0.05 Ohm Events: 10 Test duration: 38 s REPORT NO.: STR E PAGE 15 OF 22 EMC REPORT
16 T e s t P r o c e d u r e ISO/DIS : Pulse 3a Test generator: EFT200A Software No.: Serial No.: Coupling network: CNA200 Serial No.: Va (Alternator): 13.2 V Current limit: 10 D Test setup: Vs: -112 V f1: 10 khz t4: 10 ms t5: 90 ms Coupling: + Test duration: 20 m Time between Tests: 1 s T e s t P r o c e d u r e GM 9105 P : Pulse 3b Test generator: EFT200A Software No.: Serial No.: Coupling network: CNA200 Serial No.: Va (Alternator): 13.2 V Current limit: 10 D Test setup: Vs: +100 V f1: 10 khz t4: 10 ms t5: 90 ms Coupling: + Test duration: 20 m Time between Tests: 1 s REPORT NO.: STR E PAGE 16 OF 22 EMC REPORT
17 T e s t P r o c e d u r e ISO/DIS : Pulse 4 Test generator: VDS200B PF Software No.: Serial No.: Coupling network: CNA200 Serial No.: Vb (Battery): 13.2 V Current limit: 10 D Test setup: Va1: -6.0 V Va2: -2.5 V t1: 1.0 s t7: 15 ms t8: 50 ms t9: 0.5 s t11: 5 ms Events: 10 Test duration: 19 s Test Results Test Level, Us (V) Requirement Pulse No. or test time Result / Observations -75 Pulse 1 10 with 2.5s interval C +37 Pulse 2a 10 with 2.5s interval B +10V Pulse 2b 10 with 2.5s interval C -112 Pulse 3a 20 minutes B +75 Pulse 3b 20 minutes B -6 Pulse 4 5 with 60 seconds cycle B REPORT NO.: STR E PAGE 17 OF 22 EMC REPORT
18 EXHIBIT 1 - EUT PHOTOGRAPHS EUT View 1 EUT View 2 REPORT NO.: STR E PAGE 18 OF 22 EMC REPORT
19 EUT View 3 Solder Board-Component View 1 REPORT NO.: STR E PAGE 19 OF 22 EMC REPORT
20 Solder Board-Component View 2 Solder Board-Component View 3 REPORT NO.: STR E PAGE 20 OF 22 EMC REPORT
21 EXHIBIT 2 - TEST SETUP PHOTOGRAPHS Narrowband/Broadband Emission Front View Conducted Transient Disturbances REPORT NO.: STR E PAGE 21 OF 22 EMC REPORT
22 Conducted Transient Immunity ***** END OF REPORT **** REPORT NO.: STR E PAGE 22 OF 22 EMC REPORT
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