Operations Management
|
|
- Janice Haynes
- 6 years ago
- Views:
Transcription
1 10-1 Quality Control Operations Management William J. Stevenson 8 th edition 10-2 Quality Control CHAPTER 10 Quality Control McGraw-Hill/Irwin Operations Management, Eighth Edition, by William J. Stevenson Copyright 2005 by The McGraw-Hill Companies, Inc. All rights reserved Quality Control Phases of Quality Assurance Figure 10.1 Inspection before/after production Acceptance sampling Inspection and corrective action during production Process control Quality built into the process Continuous improvement The least progressive The most progressive
2 10-4 Quality Control Figure 10.2 Inspection How Much/How Often Where/When Centralized vs. On-site Inputs Transformation Outputs Acceptance sampling Process control Acceptance sampling 10-5 Quality Control Figure 10.3 Inspection Costs Cost Total Cost Cost of inspection Optimal Amount of Inspection Cost of passing defectives 10-6 Quality Control Where to Inspect in the Process Raw materials and purchased parts Finished products Before a costly operation Before an irreversible process Before a covering process
3 10-7 Quality Control Examples of Inspection Points Table 10.1 Type of business Fast Food Hotel/motel Inspection points Cashier Counter area Eating area Building Kitchen Parking lot Accounting Building Main desk Supermarket Cashiers Deliveries Characteristics Accuracy Appearance, productivity Cleanliness Appearance Health regulations Safe, well lighted Accuracy, timeliness Appearance, safety Waiting times Accuracy, courtesy Quality, quantity 10-8 Quality Control Statistical Process Control: Statistical evaluation of the output of a process during production Quality of Conformance: A product or service conforms to specifications 10-9 Quality Control Control Chart Control Chart Purpose: to monitor process output to see if it is random A time ordered plot representative sample statistics obtained from an on going process (e.g. sample means) Upper and lower control limits define the range of acceptable variation
4 10-10 Quality Control Figure 10.4 Control Chart Abnormal variation due to assignable sources Out of control UCL Normal variation due to chance Abnormal variation due to assignable sources Mean LCL Sample number Quality Control Statistical Process Control The essence of statistical process control is to assure that the output of a process is random so that future output will be random Quality Control Statistical Process Control The Control Process Define Measure Compare Evaluate Correct Monitor results
5 10-13 Quality Control Statistical Process Control Variations and Control Random variation: Natural variations in the output of a process, created by countless minor factors Assignable variation: A variation whose source can be identified Quality Control Sampling Distribution Figure 10.5 Sampling distribution Process distribution Mean Quality Control Figure 10.6 Normal Distribution σ = Standard deviation 3σ 2σ Mean +2σ +3σ 95.44% 99.74%
6 10-16 Quality Control Figure 10.7 Control Limits Sampling distribution Process distribution Mean Lower control limit Upper control limit Quality Control SPC Errors Type I error Concluding a process is not in control when it actually is. Type II error Concluding a process is in control when it is not Quality Control Figure 10.8 Type I Error α/2 α/2 α = Probability of Type I error LCL Mean UCL
7 10-19 Quality Control Observations from Sample Distribution Figure 10.9 UCL LCL Sample number Quality Control Control Charts for Variables Variables generate data that are measured. Mean control charts Used to monitor the central tendency of a process. X bar charts Range control charts Used to monitor the process dispersion R charts Quality Control Mean and Range Charts Figure 10.10A Sampling Distribution (process mean is shifting upward) UCL x-chart Detects shift LCL R-chart UCL LCL Does not detect shift
8 10-22 Quality Control Figure 10.10B Mean and Range Charts Sampling Distribution (process variability is increasing) x-chart UCL LCL Does not reveal increase UCL R-chart LCL Reveals increase Quality Control Control Chart for Attributes p-chart - Control chart used to monitor the proportion of defectives in a process c-chart - Control chart used to monitor the number of defects per unit Attributes generate data that are counted Quality Control Table 10.3 Use of p-charts When observations can be placed into two categories. Good or bad Pass or fail Operate or don t operate When the data consists of multiple samples of several observations each
9 10-25 Quality Control Table 10.3 Use of c-charts Use only when the number of occurrences per unit of measure can be counted; nonoccurrences cannot be counted. Scratches, chips, dents, or errors per item Cracks or faults per unit of distance Breaks or Tears per unit of area Bacteria or pollutants per unit of volume Calls, complaints, failures per unit of time Quality Control Use of Control Charts At what point in the process to use control charts What size samples to take What type of control chart to use Variables Attributes Quality Control Run Tests Run test a test for randomness Any sort of pattern in the data would suggest a non-random process All points are within the control limits - the process may not be random
10 10-28 Quality Control Nonrandom Patterns in Control charts Figure Trend Cycles Bias Mean shift Too much dispersion Quality Control Counting Runs Figure Counting Above/Below Median Runs (7 runs) B A A B A B B B A A B Figure Counting Up/Down Runs (8 runs) U U D U D U D U U D Quality Control Process Capability Tolerances or specifications Range of acceptable values established by engineering design or customer requirements Process variability Natural variability in a process Process capability Process variability relative to specification
11 10-31 Quality Control Figure Lower Specification Process Capability Upper Specification A. Process variability matches specifications Lower Specification Upper Specification B. Process variability well within specifications Lower Upper Specification Specification C. Process variability exceeds specifications Quality Control Process Capability Ratio Process capability ratio, Cp = specification width process width Cp = Upper specification lower specification 6σ Quality Control 3 Sigma and 6 Sigma Quality Lower specification Upper specification 1350 ppm 1350 ppm 1.7 ppm 1.7 ppm Process mean +/- 3 Sigma +/- 6 Sigma
12 10-34 Quality Control Improving Process Capability Simplify Standardize Mistake-proof Upgrade equipment Automate Quality Control Taguchi Loss Function Figure Cost Traditional cost function Taguchi cost function Lower spec Target Upper spec Quality Control Limitations of Capability Indexes 1. Process may not be stable 2. Process output may not be normally distributed 3. Process not centered but C p is used
13 10-37 Quality Control CHAPTER 10 Additional PowerPoint slides contributed by Geoff Willis, University of Central Oklahoma Quality Control Statistical Process Control (SPC) Invented by Walter Shewhart at Western Electric Distinguishes between common cause variability (random) special cause variability (assignable) Based on repeated samples from a process Quality Control Empirical Rule % 95% 99.7%
14 10-40 Quality Control Control Charts in General Are named according to the statistics being plotted, i.e., X bar, R, p, and c Have a center line that is the overall average Have limits above and below the center line at ± 3 standard deviations (usually) Upper Control Limit (UCL) Center line Lower Control Limit (LCL) Quality Control Variables Data Charts Process Centering X bar chart X bar is a sample mean Process Dispersion (consistency) R chart R is a sample range X n i= = 1 n X R = max( X i ) min( X ) i i Quality Control X bar charts Center line is the grand mean (X double bar) Points are X bars UCL = X + zσ x -OR- σ = σ / x n X LCL = X zσ UCL = X + A2 R LCL = X A2 R x m j= = 1 m X j
15 10-43 Quality Control R Charts Center line is the grand mean (R bar) Points are R D 3 and D 4 values are tabled according to n (sample size) UCL = D4 R LCL = D3 R Quality Control Use of X bar & R charts Charts are always used in tandem Data are collected (20-25 samples) Sample statistics are computed All data are plotted on the 2 charts Charts are examined for randomness If random, then limits are used forever Quality Control Attribute Charts c charts used to count defects in a constant sample size c = n m c i =1 = centerline UCL = c + z LCL = c z c c
16 10-46 Quality Control Attribute Charts p charts used to track a proportion (fraction) defective p n i= i = 1 n x i p = m p j =1 ij = = m x nm centerline UCL = p + z p( 1 p) n LCL = p z p( 1 p) n Quality Control Process Capability The ratio of process variability to design specifications Natural data spread -1σ +2σ -2σ +1σ +3σ -3σ µ The natural spread of the data is 6σ Lower Spec Upper Spec
Assignment 8 Sampling, SPC and Control chart
Instructions: Assignment 8 Sampling, SPC and Control chart 1. Total No. of Questions: 25. Each question carries one point. 2. All questions are objective type. Only one answer is correct per numbered item.
More informationIntroduction to Statistical Process Control. Managing Variation over Time
EE9H F3 Introduction to Statistical Process Control The assignable cause. The Control Chart. Statistical basis of the control chart. Control limits, false and true alarms and the operating characteristic
More informationAdvanced Engineering Statistics. Jay Liu Dept. Chemical Engineering PKNU
Advanced Engineering Statistics Jay Liu Dept. Chemical Engineering PKNU Statistical Process Control (A.K.A Process Monitoring) What we will cover Reading: Textbook Ch.? ~? 2012-06-27 Adv. Eng. Stat., Jay
More informationOutline Process Control. Variation: Common and Special Causes. What is quality? Common and Special Causes (cont d)
. Process Control Outline. Optimization. Statistical Process Control 3. In-Process Control What is quality? Variation: Common and Special Causes Pieces vary from each other: But they form a pattern that,
More informationIE 361 Module 13. Control Charts for Counts ("Attributes Data") Reading: Section 3.3 of Statistical Quality Assurance Methods for Engineers
IE 361 Module 13 Control Charts for Counts ("Attributes Data") Reading: Section 3.3 of Statistical Quality Assurance Methods for Engineers Prof. Steve Vardeman and Prof. Max Morris Iowa State University
More informationProcess Behavior Charts
CHAPTER 8 Process Behavior Charts Control Charts for Variables Data In statistical process control (SPC), the mean, range, and standard deviation are the statistics most often used for analyzing measurement
More informationExploring Data Patterns. Run Charts, Frequency Tables, Histograms, Box Plots
Exploring Data Patterns Run Charts, Frequency Tables, Histograms, Box Plots 1 Topics I. Exploring Data Patterns - Tools A. Run Chart B. Dot Plot C. Frequency Table and Histogram D. Box Plot II. III. IV.
More informationAssessing Measurement System Variation
Assessing Measurement System Variation Example 1: Fuel Injector Nozzle Diameters Problem A manufacturer of fuel injector nozzles installs a new digital measuring system. Investigators want to determine
More informationFundamentals of Statistical Monitoring: The Good, Bad, & Ugly in Biosurveillance
Fundamentals of Statistical Monitoring: The Good, Bad, & Ugly in Biosurveillance Galit Shmuéli Dept of Decision & Info Technologies Robert H Smith School of Business University of Maryland, College Park
More informationSeven Basic Quality Control Tools HISTOGRAM TOOL
Frequency Frequency Seven Basic Quality Control Tools HISTOGRAM TOOL QUALITY TOOLS Histogram Description of Histogram: The frequency histogram (or distribution) is a statistical tool for presenting numerous
More informationChapter 6 Introduction to Statistical Quality Control, 6 th Edition by Douglas C. Montgomery. Copyright (c) 2009 John Wiley & Sons, Inc.
1 2 Learning Objectives Chapter 6 Introduction to Statistical Quality Control, 6 th Edition by Douglas C. Montgomery. 3 4 5 Subgroup Data with Unknown μ and σ Chapter 6 Introduction to Statistical Quality
More informationThe Intraclass Correlation Coefficient
Quality Digest Daily, December 2, 2010 Manuscript No. 222 The Intraclass Correlation Coefficient Is your measurement system adequate? In my July column Where Do Manufacturing Specifications Come From?
More informationGage Repeatability and Reproducibility (R&R) Studies. An Introduction to Measurement System Analysis (MSA)
Gage Repeatability and Reproducibility (R&R) Studies An Introduction to Measurement System Analysis (MSA) Agenda Importance of data What is MSA? Measurement Error Sources of Variation Precision (Resolution,
More informationCase Study: Dry Cast Molding Rejects
Case Study: Dry Cast Molding Rejects James F. Leonard, Consultant Jim Leonard Process Improvement In late 2000, Biocompatibles plc emerged from years of biomedical research in their laboratories outside
More informationMeasurement Systems Analysis
Measurement Systems Analysis Measurement Systems Analysis (MSA) Reference Manual, AIAG, 1995. (www.aiag.org) Copyright, Pat Hammett, University of Michigan. All Rights Reserved. 1 Topics I. Components
More informationAcceptance Charts. Sample StatFolio: acceptance chart.sgp
Acceptance Charts Summary The Acceptance Charts procedure creates control charts with modified control limits based on both the standard deviation of the process and on specification limits for the variable
More informationAssessing Measurement System Variation
Example 1 Fuel Injector Nozzle Diameters Problem A manufacturer of fuel injector nozzles has installed a new digital measuring system. Investigators want to determine how well the new system measures the
More informationANALYZE. Lean Six Sigma Black Belt. Chapter 2-3. Short Run SPC Institute of Industrial Engineers 2-3-1
Chapter 2-3 Short Run SPC 2-3-1 Consider the Following Low production quantity One process produces many different items Different operators use the same equipment These are all what we refer to as short
More informationDescribing Data Visually. Describing Data Visually. Describing Data Visually 9/28/12. Applied Statistics in Business & Economics, 4 th edition
A PowerPoint Presentation Package to Accompany Applied Statistics in Business & Economics, 4 th edition David P. Doane and Lori E. Seward Prepared by Lloyd R. Jaisingh Describing Data Visually Chapter
More informationThe Statistical Cracks in the Foundation of the Popular Gauge R&R Approach
The Statistical Cracks in the Foundation of the Popular Gauge R&R Approach 10 parts, 3 repeats and 3 operators to calculate the measurement error as a % of the tolerance Repeatability: size matters The
More informationOne-Sample Z: C1, C2, C3, C4, C5, C6, C7, C8,... The assumed standard deviation = 110
SMAM 314 Computer Assignment 3 1.Suppose n = 100 lightbulbs are selected at random from a large population.. Assume that the light bulbs put on test until they fail. Assume that for the population of light
More informationChapter 11. Sampling Distributions. BPS - 5th Ed. Chapter 11 1
Chapter 11 Sampling Distributions BPS - 5th Ed. Chapter 11 1 Sampling Terminology Parameter fixed, unknown number that describes the population Example: population mean Statistic known value calculated
More informationSteady-State zone and control chart for process parameters of a powder compactor
Steady-State zone and control chart for process parameters of a powder compactor Non Clinical Statistics Conference Lyon, 28 September 2010 Henri Da-Cruz (*), Cécile Gabaude-Renou (*), Céline Giroud (**),
More informationMeasurement over a Short Distance. Tom Mathew
Measurement over a Short Distance Tom Mathew Outline Introduction Data Collection Methods Data Analysis Conclusion Introduction Determine Fundamental Traffic Parameter Data Collection and Interpretation
More informationAn Evaluation of Artifact Calibration in the 5700A Multifunction Calibrator
An Evaluation of Artifact Calibration in the 57A Multifunction Calibrator Application Note Artifact Calibration, as implemented in the Fluke Calibration 57A Multifunction Calibrator, was a revolutionary
More informationProcess Control Limits in a CMOS ASIC Fabrication Process K. Jayavel, K.S.R.C.Murthy
Process Control Limits in a CMOS ASIC Fabrication Process K. Jayavel, K.S.R.C.Murthy Society for Integrated circuit Technology and Applied Research Centre (SITAR), 1640, Doorvaninagar, Bangalore, Karnataka,
More informationI STATISTICAL TOOLS IN SIX SIGMA DMAIC PROCESS WITH MINITAB APPLICATIONS
Six Sigma Quality Concepts & Cases- Volume I STATISTICAL TOOLS IN SIX SIGMA DMAIC PROCESS WITH MINITAB APPLICATIONS Chapter 7 Measurement System Analysis Gage Repeatability & Reproducibility (Gage R&R)
More informationDetection of Non-Random Patterns in Shewhart Control Charts: Methods and Applications
Detection of Non-Random Patterns in Shewhart Control Charts: Methods and Applications A. Rakitzis and S. Bersimis Abstract- The main purpose of this article is the development and the study of runs rules
More informationI STATISTICAL TOOLS IN SIX SIGMA DMAIC PROCESS WITH MINITAB APPLICATIONS
Six Sigma Quality Concepts & Cases- Volume I STATISTICAL TOOLS IN SIX SIGMA DMAIC PROCESS WITH MINITAB APPLICATIONS Chapter 7 Measurement System Analysis Gage Repeatability & Reproducibility (Gage R&R)
More informationQUALITY CONTROL INSTRUCTIONS
QUALITY CONTROL INSTRUCTIONS QCI NO. 100 REVISION E SPC PROCEDURE WRITTEN BY: R. Zielinski DATE: 2/3/92 APPROVED BY: APPROVED BY: Department Manager Quality Assurance Manager DATE: DATE: SF 118 1 CHANGE
More informationToolwear Charts. Sample StatFolio: toolwear chart.sgp. Sample Data: STATGRAPHICS Rev. 9/16/2013
Toolwear Charts Summary... 1 Data Input... 2 Toolwear Chart... 5 Analysis Summary... 6 Analysis Options... 7 MR(2)/R/S Chart... 8 Toolwear Chart Report... 10 Runs Tests... 10 Tolerance Chart... 11 Save
More informationModule 5 Design for Reliability and Quality. IIT, Bombay
Module 5 Design for Reliability and Quality Lecture 2 Design for Quality Instructional Objectives By the end of this lecture, the students are expected to learn how to define quality, the importance of
More informationCUMULATIVE SUM CONTROL CHARTS FOR MONITORING PROCESS MEAN AND/OR VARIANCE
CUMULATIVE SUM CONTROL CHARTS FOR MONITORING PROCESS MEAN AND/OR VARIANCE YANG MEI 2012 CUMULATIVE SUM CONTROL CHARTS FOR MONITORING PROCESS MEAN AND/OR VARIANCE YANG MEI SCHOOL OF MECHANICAL AND AEROSPACE
More informationSummary... 1 Sample Data... 2 Data Input... 3 C Chart... 4 C Chart Report... 6 Analysis Summary... 7 Analysis Options... 8 Save Results...
C Chart Summary... 1 Sample Data... 2 Data Input... 3 C Chart... 4 C Chart Report... 6 Analysis Summary... 7 Analysis Options... 8 Save Results... 9 Summary The C Chart procedure creates a control chart
More informationStatistical Process Control and Computer Integrated Manufacturing. The Equipment Controller
Statistical Process Control and Computer Integrated Manufacturing Run to Run Control, Real-Time SPC, Computer Integrated Manufacturing. 1 The Equipment Controller Today, the operation of individual pieces
More informationChapter 5 Exercise Solutions
-bar R Chapter Eercise Solutions Notes:. Several eercises in this chapter differ from those in the th edition. An * indicates that the description has changed. A second eercise number in parentheses indicates
More informationshortcut Tap into learning NOW! Visit for a complete list of Short Cuts. Your Short Cut to Knowledge
shortcut Your Short Cut to Knowledge The following is an excerpt from a Short Cut published by one of the Pearson Education imprints Short Cuts are short, concise, PDF documents designed specifically for
More informationTrial version. Resistor Production. How can the outcomes be analysed to optimise the process? Student. Contents. Resistor Production page: 1 of 15
Resistor Production How can the outcomes be analysed to optimise the process? Resistor Production page: 1 of 15 Contents Initial Problem Statement 2 Narrative 3-11 Notes 12 Appendices 13-15 Resistor Production
More informationPossible responses to the 2015 AP Statistics Free Resposne questions, Draft #2. You can access the questions here at AP Central.
Possible responses to the 2015 AP Statistics Free Resposne questions, Draft #2. You can access the questions here at AP Central. Note: I construct these as a service for both students and teachers to start
More informationPixel Response Effects on CCD Camera Gain Calibration
1 of 7 1/21/2014 3:03 PM HO M E P R O D UC T S B R IE F S T E C H NO T E S S UP P O RT P UR C HA S E NE W S W E B T O O L S INF O C O NTA C T Pixel Response Effects on CCD Camera Gain Calibration Copyright
More informationSoftware Testing for Developer Introduction. Duvan Luong, Ph.D. Operational Excellence Networks
Software for Developer Introduction Duvan Luong, Ph.D. Operational Excellence Networks Contents Expectations for the class The software development model The reality of software defects The purpose of
More informationDesign For Manufacturing. Design Documents. Gage R&R DFM
rev.8. 1 Contents Purpose of the Abloy Part Approval Process is: 1. To provide the evidence that all customer engineering designs and required specifications are properly understood and fulfilled by manufacturing..
More informationMeasurement System Assurance (MSA) Notebook Pages IV-32 to 43 (Based on ASTM (American Society for Testing and Materials) Definitions)
Measurement System Assurance (MSA) Notebook Pages IV-32 to 43 (Based on ASTM (American Society for Testing and Materials) Definitions) PRECISION: The extent to which an instrument or person repeats its
More information(Notice that the mean doesn t have to be a whole number and isn t normally part of the original set of data.)
One-Variable Statistics Descriptive statistics that analyze one characteristic of one sample Where s the middle? How spread out is it? Where do different pieces of data compare? To find 1-variable statistics
More informationmicro-gloss The new intelligence in gloss measurement Brilliant color display: easy to read - easy to use Auto diagnosis: Standard OK - Calibration OK
micro-gloss The new intelligence in gloss measurement The micro-gloss has been the unsurpassed industry standard in gloss measurement for many years. It is the only glossmeter combining the highest accuracy,
More informationSection 6.4. Sampling Distributions and Estimators
Section 6.4 Sampling Distributions and Estimators IDEA Ch 5 and part of Ch 6 worked with population. Now we are going to work with statistics. Sample Statistics to estimate population parameters. To make
More informationQuality Control Analysis: Printed Circuit Board Thickness
Aaron Bennett Joseph Escobar BSAD/STAT 127 06/06/03 Quality Control Analysis: Printed Circuit Board Thickness ABSTRACT: This report identifies the problem encountered by a printed-board manufacturer in
More informationControl of Manufacturing Processes. Spring 2004 Lecture #1 Introduction
Control of Manufacturing Processes Subject Subject 2.830 2.830 6303 Spring 2004 Lecture #1 Introduction February 3, 2004 Background Pre-requisites requisites Your Background and Interests Relevant Experience
More informationSeparating the Signals from the Noise
Quality Digest Daily, October 3, 2013 Manuscript 260 Donald J. Wheeler The second principle for understanding data is that while some data contain signals, all data contain noise, therefore, before you
More informationIE 361 Module 4. Metrology Applications of Some Intermediate Statistical Methods for Separating Components of Variation
IE 361 Module 4 Metrology Applications of Some Intermediate Statistical Methods for Separating Components of Variation Reading: Section 2.2 Statistical Quality Assurance for Engineers (Section 2.3 of Revised
More informationChapter 11. Sampling Distributions. BPS - 5th Ed. Chapter 11 1
Chapter 11 Sampling Distributions BPS - 5th Ed. Chapter 11 1 Sampling Terminology Parameter fixed, unknown number that describes the population Statistic known value calculated from a sample a statistic
More informationInspection and Measurement
Inspection and Measurement Inspection An action to insure what is being manufactured conforms to the specifications by attributes use of gages: go or no-go by variables use of calibrated instruments Measurement
More informationDetermining Dimensional Capabilities From Short-Run Sample Casting Inspection
Determining Dimensional Capabilities From Short-Run Sample Casting Inspection A.A. Karve M.J. Chandra R.C. Voigt Pennsylvania State University University Park, Pennsylvania ABSTRACT A method for determining
More informationIE 361 Module 50. Design and Analysis of Experiments Part 10 (Fractional Factorial Studies With 2-Level Factors)
IE 361 Module 50 Design and Analysis of Experiments Part 10 (Fractional Factorial Studies With 2-Level Factors) Reading: Section 6.1 Statistical Methods for Quality Assurance ISU and Analytics Iowa LLC
More informationProbability. The Bag Model
Probability The Bag Model Imagine a bag (or box) containing balls of various kinds having various colors for example. Assume that a certain fraction p of these balls are of type A. This means N = total
More informationx y
1. Find the mean of the following numbers: ans: 26.25 3, 8, 15, 23, 35, 37, 41, 48 2. Find the median of the following numbers: ans: 24 8, 15, 2, 23, 41, 83, 91, 112, 17, 25 3. Find the sample standard
More informationApplications of Statistical Quality Control Tools in Construction Industry a Quality Approach
Applications of Statistical Quality Control Tools in Construction Industry a Quality Approach 1 Arshad Rashid, 2 Dr.Pradeep Patil Department of Mechanical Engineering, SVCE, Indore. Abstract: It has been
More informationMEASUREMENT SYSTEMS ANALYSIS AND A STUDY OF ANOVA METHOD
MEASUREMENT SYSTEMS ANALYSIS AND A STUDY OF ANOVA METHOD Abhimanyu Yadav QA Engineer, Amtek Group, National Institute of Foundry and Forge Technology Abstract Instruments and measurement systems form the
More informationMECH 311 Manufacturing Processes Section X
MECH 311 Manufacturing Processes Section X Time: W _ F 13:15-14:30 Credits: 3.75 Session: Fall Introduction Lecture 1 Instructor: Sivakumar Narayanswamy Mech 311 Lecture 1 1 Objective of the course To
More informationEconomic Design of Control Chart Using Differential Evolution
Economic Design of Control Chart Using Differential Evolution Rukmini V. Kasarapu 1, Vijaya Babu Vommi 2 1 Assistant Professor, Department of Mechanical Engineering, Anil Neerukonda Institute of Technology
More informationEnhanced Low Dose Rate Sensitivity (ELDRS) Radiation Testing of the RH1498MW Dual Precision Op Amp for Linear Technology
Enhanced Low Dose Rate Sensitivity (ELDRS) Radiation Testing of the RH1498MW Dual Precision Op Amp for Linear Technology Customer: Linear Technology (PO# 54873L) RAD Job Number: 09-579 Part Type Tested:
More informationTutorial on the Statistical Basis of ACE-PT Inc. s Proficiency Testing Schemes
Tutorial on the Statistical Basis of ACE-PT Inc. s Proficiency Testing Schemes Note: For the benefit of those who are not familiar with details of ISO 13528:2015 and with the underlying statistical principles
More informationGranite State ASQ 0104 MSA an alternative method for estimating % Tolerance April 18, 2012 Jack Meagher - NHBB
Granite State ASQ 00 MSA an alternative method for estimating % Tolerance April 8, 0 Jack Meagher - NHBB New Hampshire Ball Bearings Founded in 96 in Peterborough, NH Acquired by Minebea (Japan) in 98
More informationHistory of Control Charts
History of Control Charts 1920 s Walter Shewhart of Bell Labs working to improve reliability of telephone transmission systems. 1925 W. Edward Demmings, U.S. Dept. of Agriculture and later U.S Census Bureau,
More informationThis page intentionally left blank
Appendix E Labs This page intentionally left blank Dice Lab (Worksheet) Objectives: 1. Learn how to calculate basic probabilities of dice. 2. Understand how theoretical probabilities explain experimental
More informationEnhanced Low Dose Rate Sensitivity (ELDRS) Radiation Testing of the RH1086MK Low Dropout Positive Adjustable Regulator for Linear Technology
Enhanced Low Dose Rate Sensitivity (ELDRS) Radiation Testing of the RH1086MK Low Dropout Positive Adjustable Regulator for Linear Technology Customer: Linear Technology, PO# 54886L RAD Job Number: 10-006
More informationMath Exam 2 Review. NOTE: For reviews of the other sections on Exam 2, refer to the first page of WIR #4 and #5.
Math 166 Fall 2008 c Heather Ramsey Page 1 Math 166 - Exam 2 Review NOTE: For reviews of the other sections on Exam 2, refer to the first page of WIR #4 and #5. Section 3.2 - Measures of Central Tendency
More informationMath Exam 2 Review. NOTE: For reviews of the other sections on Exam 2, refer to the first page of WIR #4 and #5.
Math 166 Fall 2008 c Heather Ramsey Page 1 Math 166 - Exam 2 Review NOTE: For reviews of the other sections on Exam 2, refer to the first page of WIR #4 and #5. Section 3.2 - Measures of Central Tendency
More informationDesign Choice: Crystal vs. Crystal Oscillator
A B S T R A C T When doing a new design that requires controlled timing, a common consideration is to determine if the timing device is to be a crystal or an oscillator. This Application Note compares
More informationLabVIEW Statistical Process Control Toolkit Reference Manual
LabVIEW Statistical Process Control Toolkit Reference Manual Copyright 1994 National Instruments Corporation. All rights reserved. Part Number 320753A-01 September 1994 National Instruments Corporate Headquarters
More informationOFF THE WALL. The Effects of Artist Eccentricity on the Evaluation of Their Work ROUGH DRAFT
OFF THE WALL The Effects of Artist Eccentricity on the Evaluation of Their Work ROUGH DRAFT Hannah Thomas AP Statistics 2013 2014 Period 6 May 29, 2014 This study explores the relationship between perceived
More informationMeasurement Statistics, Histograms and Trend Plot Analysis Modes
Measurement Statistics, Histograms and Trend Plot Analysis Modes Using the Tektronix FCA and MCA Series Timer/Counter/Analyzers Application Note How am I supposed to observe signal integrity, jitter or
More informationCapability Control Chart for Variables
Capability Control Chart for Variables Revised: 10/10/2017 Summary... 1 Data Input... 3 Analysis Options... 4 Analysis Summary... 5 Control Chart... 6 Chart Report... 8 Runs Tests... 9 OC Curve... 11 ARL
More informationQuality Digest November
Quality Digest November 2002 1 By Stephen Birman, Ph.D. I t seems an easy enough problem: Control the output of a metalworking operation to maintain a CpK of 1.33. Surely all you have to do is set up a
More informationMicroarray Data Pre-processing. Ana H. Barragan Lid
Microarray Data Pre-processing Ana H. Barragan Lid Hybridized Microarray Imaged in a microarray scanner Scanner produces fluorescence intensity measurements Intensities correspond to levels of hybridization
More informationControl charts. Overview. 5.1 Shewhart charts for measurement data I and MR charts for individual measurements
5 Control charts The fact that the criterion which we happen to use has a fine ancestry in highbrow statistical theorems does not justify its use. Such justification must come from empirical evidence that
More informationCHAPTER MACHINE TOOL ACCURACY
CHAPTER 12 MACHINE TOOL ACCURACY 12.1 Introduction 12.2 Glossary 12.3 Measuring Tools 12.4 Coordinate Measuring Machines 12.5 Machine Tool Accuracy 12.6 Workpiece Accuracy & Processing Considerations 12.7
More informationCHAPTER 6 ON-LINE TOOL WEAR COMPENSATION AND ADAPTIVE CONTROL
98 CHAPTER 6 ON-LINE TOOL WEAR COMPENSATION AND ADAPTIVE CONTROL 6.1 INTRODUCTION There is lot of potential for improving the performance of machine tools. In order to improve the performance of machine
More informationLens Impact Resistance Testing Plan Revised,
Forward Lens Impact Resistance Testing Plan Revised, 2013-12 The Vision Council (TVC) has developed a plan for labs that need to impact test plastic lenses in accordance with FDA requirements. The step-by-step
More informationAutomotive core tool: MSA. Everyone is muted. We will start at 7pm EST. Kush Shah, Chairman ASQ Automotive Division
Automotive core tool: MSA Everyone is muted. We will start at 7pm EST. Kush Shah, Chairman ASQ Automotive Division Agenda Housekeeping Items About ASQ Automotive Division Our Vision Webinar Series Automotive
More informationLink Models for Circuit Switching
Link Models for Circuit Switching The basis of traffic engineering for telecommunication networks is the Erlang loss function. It basically allows us to determine the amount of telephone traffic that can
More informationFIBER OPTICS. Prof. R.K. Shevgaonkar. Department of Electrical Engineering. Indian Institute of Technology, Bombay. Lecture: 22.
FIBER OPTICS Prof. R.K. Shevgaonkar Department of Electrical Engineering Indian Institute of Technology, Bombay Lecture: 22 Optical Receivers Fiber Optics, Prof. R.K. Shevgaonkar, Dept. of Electrical Engineering,
More informationExcellence in Engineering Since 1946
Excellence in Engineering Since 1946 Strand Associates, Inc. ( ) Lessons Learned Out In The Collection System Tom Brankamp, PE OWEA State Collection Systems Committee Specialty Conference May 18, 2016
More informationEnhanced Resonant Inspection Using Component Weight Compensation. Richard W. Bono and Gail R. Stultz The Modal Shop, Inc. Cincinnati, OH 45241
Enhanced Resonant Inspection Using Component Weight Compensation Richard W. Bono and Gail R. Stultz The Modal Shop, Inc. Cincinnati, OH 45241 ABSTRACT Resonant Inspection is commonly used for quality assurance
More informationTo Develop a Quality Control/Quality Assurance Plan For Hot Mix Asphalt. AASHTO PP qq
1. Introduction Proposed Standard Practice To Develop a Quality Control/Quality Assurance Plan For Hot Mix Asphalt AASHTO PP qq 1.1. This standard practice presents specific details necessary to effectively
More informationThe Problem of Long-Term Capability
Quality Digest Daily, July 8, 2013 Manuscript 257 The Problem of Long-Term Capability Poor labels lead to incorrect ideas Donald J. Wheeler Based on some recent inquiries there seems to be some need to
More informationGenePix Application Note
GenePix Application Note Biological Relevance of GenePix Results Shawn Handran, Ph.D. and Jack Y. Zhai, Ph.D. Axon Instruments, Inc. 3280 Whipple Road, Union City, CA 94587 Last Updated: Aug 22, 2003.
More informationCharacterization of a PLL circuit used on a 65 nm analog Neuromorphic Hardware System
Internship-Report Characterization of a PLL circuit used on a 65 nm analog Neuromorphic Hardware System Aron Leibfried May 14, 2018 Contents 1 Introduction 2 2 Phase Locked Loop (PLL) 3 2.1 General Information..............................
More information26 June 2013 copyright 2013 G450C
450 mm Equipment Demonstrations at G450C Statistics Used During Tests of the Semiconductor Industry s Latest Fab Equipment Transition Lorn Christal, G450C Program Manager Demonstration Test Execution 26
More information3. Data and sampling. Plan for today
3. Data and sampling Business Statistics Plan for today Reminders and introduction Data: qualitative and quantitative Quantitative data: discrete and continuous Qualitative data discussion Samples and
More informationRESISTOR, FIXED, CHIP, METAL FOIL BASED ON TYPE SMP-PW, SMS-PW, SMT-PW. ESCC Detail Specification No. 4001/027
Page 1 of 14 RESISTOR, FIXED, CHIP, METAL FOIL BASED ON TYPE SMP-PW, SMS-PW, SMT-PW ESCC Detail Specification Issue 5 November 2017 Document Custodian: European Space Agency see https://escies.org PAGE
More informationEnhanced Low Dose Rate Sensitivity (ELDRS) Radiation Testing of the RH117H-Positive Adjustable Regulator for Linear Technology
Enhanced Low Dose Rate Sensitivity (ELDRS) Radiation Testing of the RH117H-Positive Adjustable Regulator for Linear Technology Customer: Linear Technology (PO# 55339L) RAD Job Number: 10-121 Part Type
More informationSoftware Engineering. Slides copyright 1996, 2001, 2005, 2009, 2014 by Roger S. Pressman. For non-profit educational use only
Chapter 2 Software Engineering Slide Set to accompany Software Engineering: A Practitioner s Approach, 8/e by Roger S. Pressman and Bruce R. Maxim Slides copyright 1996, 2001, 2005, 2009, 2014 by Roger
More informationUnivariate Descriptive Statistics
Univariate Descriptive Statistics Displays: pie charts, bar graphs, box plots, histograms, density estimates, dot plots, stemleaf plots, tables, lists. Example: sea urchin sizes Boxplot Histogram Urchin
More informationEXPERIMENTAL ERROR AND DATA ANALYSIS
EXPERIMENTAL ERROR AND DATA ANALYSIS 1. INTRODUCTION: Laboratory experiments involve taking measurements of physical quantities. No measurement of any physical quantity is ever perfectly accurate, except
More informationRelationship to theory: This activity involves the motion of bodies under constant velocity.
UNIFORM MOTION Lab format: this lab is a remote lab activity Relationship to theory: This activity involves the motion of bodies under constant velocity. LEARNING OBJECTIVES Read and understand these instructions
More informationLessons Learned in Integrating Risk Management and Process Validation
Lessons Learned in Integrating Risk Management and Process Validation Medical Device Congress Harvard March 2007 Jim Handzo Senior Manager QA Innovative Spinal Technologies Fran Akelewicz Principal Practical
More informationData Analysis and Numerical Occurrence
Data Analysis and Numerical Occurrence Directions This game is for two players. Each player receives twelve counters to be placed on the game board. The arrangement of the counters is completely up to
More informationEnhanced Low Dose Rate Sensitivity (ELDRS) Radiation Testing of the RH1814MW Quad Op Amp for Linear Technology
Enhanced Low Dose Rate Sensitivity (ELDRS) Radiation Testing of the RH1814MW Quad Op Amp for Linear Technology Customer: Linear Technology (PO 57472L) RAD Job Number: 10-417 Part Type Tested: Linear Technology
More information7.1 Sampling Distribution of X
7.1 Sampling Distribution of X Definition 1 The population distribution is the probability distribution of the population data. Example 1 Suppose there are only five students in an advanced statistics
More information