74LVQ273 OCTAL D-TYPE FLIP FLOP WITH CLEAR

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1 74LVQ273 OCTAL D-TYPE FLIP FLOP WITH CLEAR HIGH SPEED: fmax = 150 MHz (TYP.) at VCC = 3.3V COMPATIBLE WITH TTL OUTPUT LOW POWER DISSIPATION: ICC =4 µa (MAX.) at TA =25 o C LOW NOISE: VOLP = 0.4 V (TYP.) at VCC =3.3V 75Ω TRANSMISSION LINE DRIVING CAPABILITY SYMMETRICAL OUTPUT IMPEDANCE: I OH =I OL = 12 ma (MIN) PCI BUS LEVELS GUARANTEED AT 24mA BALANCED PROPAGATION DELAYS: tplh tphl OPERATING VOLTAGE RANGE: V CC (OPR) = 2V to 3.6V (1.2V Data Retention) PIN AND FUNCTION COMPATIBLE WITH 74 SERIES 273 IMPROVED LATCH-UP IMMUNITY DESCRIPTION The LVQ273 is a low voltage CMOS OCTAL D-TYPE FLIP FLOP WITH CLEAR fabricated with sub-micron silicon gate and double-layer metal wiring C 2 MOS technology. It is ideal for low power and low noise 3.3V applicatio. M (Micro Package) T (TSSOP Package) ORDER CODES : 74LVQ273M 74LVQ273T Information signals applied to D inputs are trafered to the Q outputs on the positive going edge of the clock pulse. When the CLEAR inputs is held low, the Q outputs are held low independentely of the other inputs. It has better speed performance at 3.3V than 5V LS-TTL family combined with the true CMOS low power coumption. All inputs and outputs are equipped with protection circuits agait static discharge, giving them 2KV ESD immunity and traient excess voltage. PIN CONNECTION AND IEC LOGIC SYMBOLS February /10

2 INPUT AND OUTPUT EQUIVALENT CIRCUIT PIN DESCRIPTION PIN No SYMBOL NAME AND FUNCTION 1 CLEAR Asyncronous Master Reset (Active LOW) 2, 5, 6, 9, 12, 15, 16, 19 Q0 to Q7 Flip-Flop Outputs 3, 4, 7, 8, 13, 14, 17, 18 D0 to D7 Data Inputs 11 CLOCK Clock Input (LOW-to-HIGH, Edge- Triggered) 10 GND Ground (0V) 20 V CC Positive Supply Voltage TRUTH TABLE INPUTS OUTPUTS FUNCTION CLEAR D CLOCK Q L X X L CLEAR H L L H H H H X Q n NO CHANGE X:Don t Care LOGIC DIAGRAM Thislogicdiagram has notbe used to esimate propagation delays 2/10

3 ABSOLUTE MAXIMUM RATINGS Symbol Parameter Value Unit V CC Supply Voltage -0.5 to +7 V V I DC Input Voltage -0.5 to V CC V V O DC Output Voltage -0.5 to V CC V I IK DC Input Diode Current ± 20 ma I OK DC Output Diode Current ± 20 ma I O DC Output Current ± 50 ma I CC or I GND DC V CC or Ground Current ± 400 ma T stg Storage Temperature -65 to +150 T L Lead Temperature (10 sec) 300 o C AbsoluteMaximum Ratingsarethose values beyond whichdamage to the device may occur. Functional operation under these condition isnot implied. o C RECOMMENDED OPERATING CONDITIONS Symbol Parameter Value Unit V CC Supply Voltage (note 1) 2 to 3.6 V V I Input Voltage 0 to V CC V V O Output Voltage 0 to V CC V T op Operating Temperature: -40 to +85 o C dt/dv Input Rise and Fall Time (VCC = 3V) (note 2) 0 to 10 /V 1) TruthTable guaranteed: 1.2V to 3.6V 2) VIN from 0.8V to 2V 3/10

4 DC SPECIFICATIONS Symbol Parameter Test Conditio Value Unit V CC T A =25 o C -40 to 85 o C (V) Min. Typ. Max. Min. Max. V IH High Level Input Voltage 3.0 to V VIL Low Level Input Voltage V V OH High Level Output 3.0 V (*) I = I O =-50 µa Voltage V IH or I O =-12 ma V VIL I O =-24 ma 2.2 V OL Low Level Output 3.0 V (*) I = I O =50 µa Voltage VIH or I O =12 ma V V IL I O =24 ma 0.55 I I Input Leakage Current 3.6 V I =V CC or GND ±0.1 ±1 µa I CC Quiescent Supply Current 3.6 V I =V CC or GND 4 40 µa I OLD Dynamic Output Current 3.6 V OLD = 0.8 V max 36 ma I OHD (note 1, 2) V OHD = 2 V min -25 ma 1) Maximum test duration 2ms, one output loaded attime 2) Incident wave switching is guaranteed on tramission lines withimpedances aslow as 50 Ω. (*) Alloutputs loaded. DYNAMIC SWITCHING CHARACTERISTICS Symbol Parameter Test Conditio Value Unit V CC T A =25 o C -40 to 85 o C (V) Min. Typ. Max. Min. Max. V OLP Dynamic Low Voltage V OLV Quiet Output (note 1, 2) V IHD Dynamic High Voltage Input (note 1, 3) 3.3 CL =50pF 2 V V ILD Dynamic Low Voltage Input (note 1, 3) ) Worst case package 2) Max number of outputs defined as (n). Data inputs aredriven 0V to 3.3V, (n -1) outputs switching and one output at GND 3) max number of datainputs (n) switching. (n-1) switching 0V to3.3v. Inputs under test switching: 3.3V to threshold (VILD), 0V tothreshold (VIHD). f=1mhz 4/10

5 AC ELECTRICAL CHARACTERISTICS (CL = 50 pf, RL = 500 Ω, Input tr = tf =3 ) Symbol Parameter Test Condition Value Unit V CC T A =25 o C -40 to 85 o C (V) Min. Typ. Max. Min. Max. t PLH t PHL Propagation Delay Time CK to Q (*) t PHL Propagation Delay Time CLR to Q 3.3 (*) t w(l) CLR pulse Width, LOW (*) t w CK pulse Width t sl t sh thl t hh Setup Time D to CK HIGH or LOW Hold Time D to CK HIGH or LOW 3.3 (*) (*) (*) t REM Recovery Time CLR to CK 3.3 (*) f MAX Maximum Clock Frequency 3.3 (*) MHz t OSLH Output to Output Skew toshl Time (note 1, 2) 3.3 (*) ) Skew is defined as theabsolute value of the difference between theactual propagation delay for any twooutputs of thesame device switching in the same direction, either HIGHor LOW (t OSLH = t PLHm -t PLHn, t OSHL = t PHLm -t phln ) 2) Parameter guaranteed bydesign (*) Voltagerange is 3.3V ± 0.3V CAPACITIVE CHARACTERISTICS Symbol Parameter Test Conditio Value Unit V CC T A =25 o C -40 to 85 o C (V) Min. Typ. Max. Min. Max. C IN Input Capacitance pf C PD Power Dissipation Capacitance (note 1) 3.3 f IN = 10 MHz 30 pf 1) C PD isdefined as the value of the IC sinternal equivalent capacitance which is calculated fromthe operating current coumption without load. (Referto Test Circuit).Average operting current can be obtained bythe followingequation. ICC(opr) = CPD VCC fin + ICC/8(per FlipFlop) 5/10

6 TEST CIRCUIT C L = 50 pf or equivalent (includes jigand probe capacitance) R L =R 1=500Ωorequivalent RT =ZOUT of pulse generator (typically 50Ω) WAVEFORM 1: PROPAGATION DELAYS, SETUP AND HOLD TIMES, CLOCK PULSE WIDTH (f=1mhz; 50% duty cycle) 6/10

7 WAVEFORM 2: PROPAGATION DELAYS (f=1mhz; 50% duty cycle) WAVEFORM 3: RECOVERY TIME, CLEAR PULSE WIDTH (f=1mhz; 50% duty cycle) 7/10

8 SO-20 MECHANICAL DATA DIM. mm inch MIN. TYP. MAX. MIN. TYP. MAX. A a a b b C c1 45 (typ.) D E e e F L M S 8 (max.) P013L 8/10

9 TSSOP20 MECHANICAL DATA DIM. mm inch MIN. TYP. MAX. MIN. TYP. MAX. A A A b c D E E e 0.65 BSC BSC K 0 o 4 o 8 o 0 o 4 o 8 o L A A2 A1 b e c K L E D E1 PIN 1 IDENTIFICATION 1 9/10

10 Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no respoibility for the coequences of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No licee is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specification mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics. The ST logo is a trademark of STMicroelectronics 1999 STMicroelectronics Printed in Italy All Rights Reserved STMicroelectronics GROUP OF COMPANIES Australia - Brazil - Canada - China - France - Germany - Italy - Japan - Korea - Malaysia - Malta - Mexico - Morocco - The Netherlands - Singapore - Spain - Sweden - Switzerland - Taiwan - Thailand - United Kingdom - U.S.A. 10/10

74LVQ11TTR TRIPLE 3-INPUT AND GATE

74LVQ11TTR TRIPLE 3-INPUT AND GATE TRIPLE 3-INPUT AND GATE HIGH SPEED: t PD = 4.7ns (TYP.) at V CC = 3.3 V COMPATIBLE WITH TTL OUTPUTS LOW POWER DISSIPATION: I CC = 2µA (MAX.) at T A =25 C LOW NOISE: V OLP = 0.3V (TYP.) at V CC = 3.3V 75Ω