Supporting Information. Fabrication of Strain Gauges via Contact Printing: A Simple Route to Healthcare Sensors Based on Cross-Linked Gold

Size: px
Start display at page:

Download "Supporting Information. Fabrication of Strain Gauges via Contact Printing: A Simple Route to Healthcare Sensors Based on Cross-Linked Gold"

Transcription

1 Supporting Information Fabrication of Strain Gauges via Contact Printing: A Simple Route to Healthcare Sensors Based on Cross-Linked Gold Nanoparticles Bendix Ketelsen #,&, Mazlum Yesilmen #,&, Hendrik Schlicke #,, Heshmat Noei, % Chun-Hao Su, Ying-Chih Liao, and Tobias Vossmeyer*,# # Institute of Physical Chemistry, University of Hamburg, Grindelallee 117, Hamburg, Germany % DESY NanoLab, Deutsches Elektronen-Synchrotron DESY, Hamburg, Germany Department of Chemical Engineering, National Taiwan University, Taipei 10617, Taiwan & these authors contributed equally present address: Fraunhofer Center for Applied Nanotechnology CAN, Grindeallee 117, Hamburg, Germany * tobias.vossmeyer@chemie.uni-hamburg.de S-1

2 1. Four Point Flexural Bending Test Setup The setup consisted of a Nema 23 stepper motor which was connected to a threaded rod with a pitch of 1 mm. The rod was mounted on a stamp with two adjustable pins which could be pressed towards two other pins attached to a ground plate. The stepper motor was triggered by a TB6560 stepper motor drivers board which was connected to a micro controller (Elegoo, MEGA 2560 R3). A voltage of 24 V was applied to the stepper motor. A Python script executed on a PC was used to set the test parameters. The resistance measurements were done using two Keithley 2601A Sourcemeters. For performing the bending tests the GNP films were glued onto FR4 circuit board bars using Loctite 401. Before usage, each circuit board was freed from photo-resist with acetone and the underlying copper layer was removed in an etchant bath (77 vol% demineralized water, 20 vol% hydrochloric acid (37 %), 3 vol% hydrogen peroxide (30 %)). The circuit board was cut into 16 cm long and 1 to 3 cm wide bars. The central part of the circuit board bar was then roughened with abrasive paper (grain size: 380) and cleaned with acetone. The sensor probe was attached to the very center of the bar and small tabs at both ends were kept to contact the sensor via crocodile clips. The electrode gap was placed perpendicular to the long axis of the circuit board bar. A commercial strain gauge (SGT-1/350-TY11, Omega, gauge factor: 2.14) was used as reference sensor. The spacing of the top and lower pins of the bending machine was set to 4 cm and 8 cm, respectively. During a typical measurement the top pins were lowered by one millimeter, resulting in a total strain of the sensor of ~0.12 %.To ensure a smooth movement of the pins the step size of the stepper motor was set to 1/16 steps. Photographs of the setup are shown in Figure S1. S-2

3 Figure S1. Photographs of the custom-built flexural bending setup. a) Keithley 2601A source meters for resistance measurements, b) stepper motor drivers board, c) stepper motor mounted on top of the testing case, d) power source for stepper motor, e) computer for data acquisition, f) open test chamber with inserted sample and commercial sensor, both glued onto a circuit board bar, g) circuit board bar with glued GNP/PI sample. S-3

4 2. X-Ray Photoelectron Spectroscopy To confirm the exchange of the GNPs original dodecylamine ligands by 9DT cross-linker molecules during film preparation, X-ray photoelectron spectroscopy (XPS) measurements were performed on a GNP 4nm film deposited onto a silicon wafer following the LbL spin-coating procedure. Figure S2a, b and c show N 1s, Br 3d and Cl 2p regions, respectively. No signals were observed in the nitrogen N 1s core level region ( ev), confirming that the original dodecylamine ligands of the GNPs were efficiently exchanged by the 9DT cross-linker. Further, no signals were observed in the energy range around 70 ev for bromine Br 3d and around 198 ev for chlorine Cl 2p. These findings indicate that also reaction precursors (tetrachloroauric acid, tetraoctylammonium bromide) were efficiently removed during GNP synthesis, subsequent work-up, and GNP film preparation. Figure S2. XPS spectra of a) the N 1s, b) the Br 3d, and c) the Cl 2p core levels. No signals were observed for the respective elements. d) Deconvoluted XPS spectrum of sulfur S 2p. The solid red and blue lines correspond to fits of doublets (S 2p 3/2 and S 2p 1/2 ) assigned to free thiols and gold-bound sulfur. The darker gray solid line represents the envelope function. S-4

5 Figure S2d depicts the deconvoluted XPS spectrum of sulfur S 2p. In agreement with Han et al.,[1] who used the LbL spin-coating procedure in a recent study, both, gold bound (S 2p 3/2 / S 2p 1/2 doublet at ~162 ev, S-Au) as well as hydrogen-bound (S 2p 3/2 / S 2p 1/2 doublet at ~164 ev, thiol S-H) sulfur were observed. We assign the dominating fraction of free thiols in our samples to the presence of a significant amount of only partly bonded and free cross-linker molecules trapped within the final composite film. S-5

6 3. SEM Images of GNP 4nm and GNP 7nm Films Before and After Transfer Figures S3 and S4 show SEM micrographs of GNP films prepared from both particle samples, i.e., GNP 4nm and GNP 7nm. The films, which were deposited onto glass slides and then transferred onto PI foil, were imaged at 5.000x (Figure S3) and x (Figure S4) magnification. Figure S3. Low magnification images of GNP 4nm (left) and GNP 7nm (right) films before and after transfer from glass slides onto PI foil. The contamination on the GNP 4nm film observed after transfer onto PI foil may consist of PMMA residues, which were not removed completely by washing the films with acetone. S-6

7 Figure S4. High magnification images of GNP 4nm and GNP 7nm films on glass and PI. Obvious changes of the film s morphology upon transfer from glass substrates onto PI foil are not observable. S-7

8 4. Sensor Stability Figure S5 shows the data of strain-response measurements of the PI foil supported sensors. The sensors were stored under ambient conditions for ~3 weeks and measurements were performed on the dates indicated in the figure. The GNP 4nm as well as the GNP 7nm films did not show significant changes of the gauge factor (slope of curves). Hence, aging related to storing under ambient conditions for a period of ~3 weeks has no significant influence on the sensors sensitivity. Only a faint decrease in sensitivity is indicated in case of the GNP 4nm film. The gauge factors were determined as the slopes of the strain-response curves with average values of (16.1 ± 0.6) and (24.3 ± 0.3) for the GNP 4nm and GNP 7nm film, respectively. Figure S5. Resistive strain-response curves of a) the GNP 4nm and b) the GNP 7nm sensor supported on PI foil. The unprotected GNP films were stored for a period of ~3 weeks under ambient air and measurements were done on the dates indicated. S-8

9 5. Resistive Responses of PDMS Supported GNP 7nm Strain Gauges Figure S6 shows the resistive responses of a PDMS supported GNP 7nm film to tensile strain. A fairly linear resistive response is observed. Three consecutive strain-relaxation curves were recorded. For these measurements the sensor was fixed onto the PCB stripe using adhesive tape. The measurements reveal a gauge factor of ~25, nearly the same as in case of the PI-supported GNP 7nm sensor. Due to inhomogeneous deformations of the rather thick (~0.5 mm) PDMS substrate, as well as delamination problems of the tape used to fix the sensor during the bending test, the data points show broader scattering than those measured for the PI supported sensors. Figure S6. Resistive strain-response curves of a PDMS supported GNP 7nm film. [1] C. Han, S. J. Percival, B. Zhang, Langmuir 2016, 32, S-9

Nanofluidic Diodes based on Nanotube Heterojunctions

Nanofluidic Diodes based on Nanotube Heterojunctions Supporting Information Nanofluidic Diodes based on Nanotube Heterojunctions Ruoxue Yan, Wenjie Liang, Rong Fan, Peidong Yang 1 Department of Chemistry, University of California, Berkeley, CA 94720, USA

More information

Magnesium and Magnesium-Silicide coated Silicon Nanowire composite Anodes for. Lithium-ion Batteries

Magnesium and Magnesium-Silicide coated Silicon Nanowire composite Anodes for. Lithium-ion Batteries Magnesium and Magnesium-Silicide coated Silicon Nanowire composite Anodes for Lithium-ion Batteries Alireza Kohandehghan a,b, Peter Kalisvaart a,b,*, Martin Kupsta b, Beniamin Zahiri a,b, Babak Shalchi

More information

Enameled Wire Having Polyimide-silica Hybrid Insulation Layer Prepared by Sol-gel Process

Enameled Wire Having Polyimide-silica Hybrid Insulation Layer Prepared by Sol-gel Process Journal of Photopolymer Science and Technology Volume 28, Number 2 (2015) 151 155 2015SPST Enameled Wire Having Polyimide-silica Hybrid Insulation Layer Prepared by Sol-gel Process Atsushi Morikawa 1,

More information

Supplementary information for Stretchable photonic crystal cavity with

Supplementary information for Stretchable photonic crystal cavity with Supplementary information for Stretchable photonic crystal cavity with wide frequency tunability Chun L. Yu, 1,, Hyunwoo Kim, 1, Nathalie de Leon, 1,2 Ian W. Frank, 3 Jacob T. Robinson, 1,! Murray McCutcheon,

More information

Atomristor: Non-Volatile Resistance Switching in Atomic Sheets of

Atomristor: Non-Volatile Resistance Switching in Atomic Sheets of Atomristor: Non-Volatile Resistance Switching in Atomic Sheets of Transition Metal Dichalcogenides Ruijing Ge 1, Xiaohan Wu 1, Myungsoo Kim 1, Jianping Shi 2, Sushant Sonde 3,4, Li Tao 5,1, Yanfeng Zhang

More information

Supporting Information

Supporting Information Solution-processed Nickel Oxide Hole Injection/Transport Layers for Efficient Solution-processed Organic Light- Emitting Diodes Supporting Information 1. C 1s high resolution X-ray Photoemission Spectroscopy

More information

Supporting Information. Single-Nanowire Electrochemical Probe Detection for Internally Optimized Mechanism of

Supporting Information. Single-Nanowire Electrochemical Probe Detection for Internally Optimized Mechanism of Supporting Information Single-Nanowire Electrochemical Probe Detection for Internally Optimized Mechanism of Porous Graphene in Electrochemical Devices Ping Hu, Mengyu Yan, Xuanpeng Wang, Chunhua Han,*

More information

Supporting Information. for. Visualization of Electrode-Electrolyte Interfaces in LiPF 6 /EC/DEC Electrolyte for Lithium Ion Batteries via In-Situ TEM

Supporting Information. for. Visualization of Electrode-Electrolyte Interfaces in LiPF 6 /EC/DEC Electrolyte for Lithium Ion Batteries via In-Situ TEM Supporting Information for Visualization of Electrode-Electrolyte Interfaces in LiPF 6 /EC/DEC Electrolyte for Lithium Ion Batteries via In-Situ TEM Zhiyuan Zeng 1, Wen-I Liang 1,2, Hong-Gang Liao, 1 Huolin

More information

Electronic Supplementary Information

Electronic Supplementary Information Electronic Supplementary Material (ESI) for Energy & Environmental Science. This journal is The Royal Society of Chemistry 2014 Submitted to Electronic Supplementary Information Scalable Fabrication of

More information

Standard Operating Procedure of Atomic Force Microscope (Anasys afm+)

Standard Operating Procedure of Atomic Force Microscope (Anasys afm+) Standard Operating Procedure of Atomic Force Microscope (Anasys afm+) The Anasys Instruments afm+ system incorporates an Atomic Force Microscope which can scan the sample in the contact mode and generate

More information

Electronic Supplementary Information. Self-assembled Gold Nanorime Mesh Conductor for Invisible Stretchable Supercapacitor

Electronic Supplementary Information. Self-assembled Gold Nanorime Mesh Conductor for Invisible Stretchable Supercapacitor Electronic Supplementary Material (ESI) for Nanoscale. This journal is The Royal Society of Chemistry 2018 Electronic Supplementary Information Self-assembled Gold Nanorime Mesh Conductor for Invisible

More information

Defining Rules for the Shape Evolution of Gold Nanoparticles

Defining Rules for the Shape Evolution of Gold Nanoparticles Supporting Information for Defining Rules for the Shape Evolution of Gold Nanoparticles Mark R. Langille, Michelle L. Personick, Jian Zhang, Chad A. Mirkin* Department of Chemistry and International Institute

More information

MICROSTRUCTURING OF METALLIC LAYERS FOR SENSOR APPLICATIONS

MICROSTRUCTURING OF METALLIC LAYERS FOR SENSOR APPLICATIONS MICROSTRUCTURING OF METALLIC LAYERS FOR SENSOR APPLICATIONS Vladimír KOLAŘÍK, Stanislav KRÁTKÝ, Michal URBÁNEK, Milan MATĚJKA, Jana CHLUMSKÁ, Miroslav HORÁČEK, Institute of Scientific Instruments of the

More information

Electronic supplementary material

Electronic supplementary material Electronic supplementary material Three-dimensionally Deformable, Highly Stretchable, Permeable, Durable and Washable Fabric Circuit Boards Qiao Li 1, and Xiao Ming Tao 1,2 * 1 Institute of Textiles and

More information

plasmonic nanoblock pair

plasmonic nanoblock pair Nanostructured potential of optical trapping using a plasmonic nanoblock pair Yoshito Tanaka, Shogo Kaneda and Keiji Sasaki* Research Institute for Electronic Science, Hokkaido University, Sapporo 1-2,

More information

Characterization of Silicon-based Ultrasonic Nozzles

Characterization of Silicon-based Ultrasonic Nozzles Tamkang Journal of Science and Engineering, Vol. 7, No. 2, pp. 123 127 (24) 123 Characterization of licon-based Ultrasonic Nozzles Y. L. Song 1,2 *, S. C. Tsai 1,3, Y. F. Chou 4, W. J. Chen 1, T. K. Tseng

More information

SPECIFICATION FOR APPROVAL. 1/8W, 0402, Low Resistance Chip Resistor (Lead / Halogen Free)

SPECIFICATION FOR APPROVAL. 1/8W, 0402, Low Resistance Chip Resistor (Lead / Halogen Free) DOCUMENT REVISION : SRK220000NH : A2 SPECIFICATION FOR APPROVAL PAGE : 1 OF 9 1/8W, 0402, Low Resistance Chip Resistor (Lead / Halogen Free) 1. Scope This specification applies to1.0mm x 0.5mm size 1/8W,

More information

Supplementary Materials for

Supplementary Materials for www.sciencemag.org/cgi/content/full/science.1234855/dc1 Supplementary Materials for Taxel-Addressable Matrix of Vertical-Nanowire Piezotronic Transistors for Active/Adaptive Tactile Imaging Wenzhuo Wu,

More information

Supplementary Figures

Supplementary Figures Supplementary Figures Supplementary Figure 1 The diameter and length of AgNWs. (a) SEM image and (b) AFM image of AgNWs coated on a SiO2/Si wafer at 500 rpm for 30 sec. The diameter and length of the AgNWs

More information

Jian-Wei Liu, Jing Zheng, Jin-Long Wang, Jie Xu, Hui-Hui Li, Shu-Hong Yu*

Jian-Wei Liu, Jing Zheng, Jin-Long Wang, Jie Xu, Hui-Hui Li, Shu-Hong Yu* Supporting Information Ultrathin 18 O 49 Nanowire Assemblies for Electrochromic Devices Jian-ei Liu, Jing Zheng, Jin-Long ang, Jie Xu, Hui-Hui Li, Shu-Hong Yu* Experimental Section Synthesis and Assembly

More information

pattern. (c-e) TEM and HRTEM images of the nanowire (SAED pattern in inset).

pattern. (c-e) TEM and HRTEM images of the nanowire (SAED pattern in inset). Figure S1. The pristine Co 2 (OH) 2 CO 3 nanowire arrays. (a) Low-magnification SEM image of the Co 2 (OH) 2 CO 3 nanowire arrays on nickel foam and (b) corresponding XRD pattern. (c-e) TEM and HRTEM images

More information

Structural, optical, and electrical properties of phasecontrolled cesium lead iodide nanowires

Structural, optical, and electrical properties of phasecontrolled cesium lead iodide nanowires Electronic Supplementary Material Structural, optical, and electrical properties of phasecontrolled cesium lead iodide nanowires Minliang Lai 1, Qiao Kong 1, Connor G. Bischak 1, Yi Yu 1,2, Letian Dou

More information

Transparent p-type SnO Nanowires with Unprecedented Hole Mobility among Oxide Semiconductors

Transparent p-type SnO Nanowires with Unprecedented Hole Mobility among Oxide Semiconductors Supplementary Information Transparent p-type SnO Nanowires with Unprecedented Hole Mobility among Oxide Semiconductors J. A. Caraveo-Frescas and H. N. Alshareef* Materials Science and Engineering, King

More information

Soft Electronics Enabled Ergonomic Human-Computer Interaction for Swallowing Training

Soft Electronics Enabled Ergonomic Human-Computer Interaction for Swallowing Training Supplementary Information Soft Electronics Enabled Ergonomic Human-Computer Interaction for Swallowing Training Yongkuk Lee 1,+, Benjamin Nicholls 2,+, Dong Sup Lee 1, Yanfei Chen 3, Youngjae Chun 3,4,

More information

Low-power carbon nanotube-based integrated circuits that can be transferred to biological surfaces

Low-power carbon nanotube-based integrated circuits that can be transferred to biological surfaces SUPPLEMENTARY INFORMATION Articles https://doi.org/10.1038/s41928-018-0056-6 In the format provided by the authors and unedited. Low-power carbon nanotube-based integrated circuits that can be transferred

More information

Supplementary Information. The origin of discrete current fluctuations in a fresh single molecule junction

Supplementary Information. The origin of discrete current fluctuations in a fresh single molecule junction Electronic Supplementary Material (ESI) for Nanoscale. This journal is The Royal Society of Chemistry 2014 Supplementary Information The origin of discrete current fluctuations in a fresh single molecule

More information

High-Speed Scalable Silicon-MoS 2 P-N Heterojunction Photodetectors

High-Speed Scalable Silicon-MoS 2 P-N Heterojunction Photodetectors High-Speed Scalable Silicon-MoS 2 P-N Heterojunction Photodetectors Veerendra Dhyani 1, and Samaresh Das 1* 1 Centre for Applied Research in Electronics, Indian Institute of Technology Delhi, New Delhi-110016,

More information

attosnom I: Topography and Force Images NANOSCOPY APPLICATION NOTE M06 RELATED PRODUCTS G

attosnom I: Topography and Force Images NANOSCOPY APPLICATION NOTE M06 RELATED PRODUCTS G APPLICATION NOTE M06 attosnom I: Topography and Force Images Scanning near-field optical microscopy is the outstanding technique to simultaneously measure the topography and the optical contrast of a sample.

More information

Measurement of Microscopic Three-dimensional Profiles with High Accuracy and Simple Operation

Measurement of Microscopic Three-dimensional Profiles with High Accuracy and Simple Operation 238 Hitachi Review Vol. 65 (2016), No. 7 Featured Articles Measurement of Microscopic Three-dimensional Profiles with High Accuracy and Simple Operation AFM5500M Scanning Probe Microscope Satoshi Hasumura

More information

Lesson Plan Title Primary Subject Area Grade Level Overview Approximate Duration MA Frameworks Interdisciplinary Connections Lesson Objectives

Lesson Plan Title Primary Subject Area Grade Level Overview Approximate Duration MA Frameworks Interdisciplinary Connections Lesson Objectives Lesson Plan Title Screenprinting/photolithography and understanding MEMS production and their application Primary Subject Area Chemistry Grade Level High School (10) Overview Students will learn about

More information

AN INEXPENSIVE ARDUINO-BASED SILAR COATING MACHINE FOR RESEARCH IN THIN FILM COATING

AN INEXPENSIVE ARDUINO-BASED SILAR COATING MACHINE FOR RESEARCH IN THIN FILM COATING AN INEXPENSIVE ARDUINO-BASED SILAR COATING MACHINE FOR RESEARCH IN THIN FILM COATING 1 M. S. PATIL, 2 SOMNATH K. JATHAR 1,2 Department of Mechanical Engineering,KLS Gogte Institute of Technology Belagavi,Karnataka,

More information

Multi-Wire Drift Chambers (MWDC)

Multi-Wire Drift Chambers (MWDC) Multi-Wire Drift Chambers (MWDC) Mitra Shabestari August 2010 Introduction The detailed procedure for construction of multi-wire drift chambers is presented in this document. Multi-Wire Proportional Counters

More information

Development of a Capacitive Humidity Sensor for Physiological Activity Monitoring Applications

Development of a Capacitive Humidity Sensor for Physiological Activity Monitoring Applications Abstract Development of a Capacitive Humidity Sensor for Physiological Activity Monitoring Applications Steven Shapardanis a and Dr. Tolga Kaya a a Central Michigan University, Mount Pleasant, MI 48859

More information

IGPG Car Wash Round Robin Test Procedure

IGPG Car Wash Round Robin Test Procedure 1. Scope The intension of this round robin test is to investigate whether the car wash test described in ISO 20566 and used to validate the abrasion performance of exterior car body parts is suitable as

More information

Gigahertz Ambipolar Frequency Multiplier Based on Cvd Graphene

Gigahertz Ambipolar Frequency Multiplier Based on Cvd Graphene Gigahertz Ambipolar Frequency Multiplier Based on Cvd Graphene The MIT Faculty has made this article openly available. Please share how this access benefits you. Your story matters. Citation As Published

More information

Monolithically integrated InGaAs nanowires on 3D. structured silicon-on-insulator as a new platform for. full optical links

Monolithically integrated InGaAs nanowires on 3D. structured silicon-on-insulator as a new platform for. full optical links Monolithically integrated InGaAs nanowires on 3D structured silicon-on-insulator as a new platform for full optical links Hyunseok Kim 1, Alan C. Farrell 1, Pradeep Senanayake 1, Wook-Jae Lee 1,* & Diana.

More information

Supplementary Information: Nanoscale. Structure, Dynamics, and Aging Behavior of. Metallic Glass Thin Films

Supplementary Information: Nanoscale. Structure, Dynamics, and Aging Behavior of. Metallic Glass Thin Films Supplementary Information: Nanoscale Structure, Dynamics, and Aging Behavior of Metallic Glass Thin Films J.A.J. Burgess,,, C.M.B. Holt,, E.J. Luber,, D.C. Fortin, G. Popowich, B. Zahiri,, P. Concepcion,

More information

Cold curing adhesive K-X280

Cold curing adhesive K-X280 Instructions for use English Cold curing adhesive K-X280 A4048-1.0 en English 1 Safety instructions... 3 2 General information... 3 2.1 Scope of delivery for K-X280... 3 2.2 Accessories required for installation...

More information

Underground M3 progress meeting 16 th month --- Strain sensors development IMM Bologna

Underground M3 progress meeting 16 th month --- Strain sensors development IMM Bologna Underground M3 progress meeting 16 th month --- Strain sensors development IMM Bologna Matteo Ferri, Alberto Roncaglia Institute of Microelectronics and Microsystems (IMM) Bologna Unit OUTLINE MEMS Action

More information

*Corresponding author.

*Corresponding author. Supporting Information for: Ligand-Free, Quantum-Confined Cs 2 SnI 6 Perovskite Nanocrystals Dmitriy S. Dolzhnikov, Chen Wang, Yadong Xu, Mercouri G. Kanatzidis, and Emily A. Weiss * Department of Chemistry,

More information

Microsystem Technology for Eddy Current Testing Johannes PAUL, Roland HOLZFÖRSTER

Microsystem Technology for Eddy Current Testing Johannes PAUL, Roland HOLZFÖRSTER 11th European Conference on Non-Destructive Testing (ECNDT 2014), October 6-10, 2014, Prague, Czech Republic More Info at Open Access Database www.ndt.net/?id=16638 Microsystem Technology for Eddy Current

More information

Supplementary Information

Supplementary Information DOI: 1.138/NPHOTON.212.19 Supplementary Information Enhanced power conversion efficiency in polymer solar cells using an inverted device structure Zhicai He, Chengmei Zhong, Shijian Su, Miao Xu, Hongbin

More information

Conductance switching in Ag 2 S devices fabricated by sulphurization

Conductance switching in Ag 2 S devices fabricated by sulphurization 3 Conductance switching in Ag S devices fabricated by sulphurization The electrical characterization and switching properties of the α-ag S thin films fabricated by sulfurization are presented in this

More information

MECHANICAL PROPERTY OF CARBON NANOTUBE YARN REINFORCED EPOXY

MECHANICAL PROPERTY OF CARBON NANOTUBE YARN REINFORCED EPOXY THE 19 TH INTERNATIONAL CONFERENCE ON COMPOSITE MATERIALS MECHANICAL PROPERTY OF CARBON NANOTUBE YARN REINFORCED EPOXY Y. Shimamura 1*, K. Oshima 2, M. Ishihara 2, K. Tohgo 1, T. Fujii 1 and Y. Inoue 3

More information

Optical Bus for Intra and Inter-chip Optical Interconnects

Optical Bus for Intra and Inter-chip Optical Interconnects Optical Bus for Intra and Inter-chip Optical Interconnects Xiaolong Wang Omega Optics Inc., Austin, TX Ray T. Chen University of Texas at Austin, Austin, TX Outline Perspective of Optical Backplane Bus

More information

Supporting Information

Supporting Information Supporting Information Single-walled carbon nanotubes spontaneous loading into exponentially-grown LBL films** Materials used: Sudhanshu Srivastava, Paul Podsiadlo, Kevin Critchley, Jian Zhu, Ming Qin,

More information

C.Vinothini, DKM College for Women. Abstract

C.Vinothini, DKM College for Women. Abstract (Impact Factor- 5.276) CHARACTERISTICS OF PULSE PLATED COPPER GALLIUM TELLURIDE FILMS C.Vinothini, DKM College for Women. Abstract Copper Gallium Telluride films were deposited for the first time by the

More information

Extending Acoustic Microscopy for Comprehensive Failure Analysis Applications

Extending Acoustic Microscopy for Comprehensive Failure Analysis Applications Extending Acoustic Microscopy for Comprehensive Failure Analysis Applications Sebastian Brand, Matthias Petzold Fraunhofer Institute for Mechanics of Materials Halle, Germany Peter Czurratis, Peter Hoffrogge

More information

Supplementary Materials for

Supplementary Materials for advances.sciencemag.org/cgi/content/full/1/10/e1500533/dc1 Supplementary Materials for Origami-inspired active graphene-based paper for programmable instant self-folding walking devices Jiuke Mu, Chengyi

More information

SUPPLEMENTARY INFORMATION

SUPPLEMENTARY INFORMATION Enhanced Thermoelectric Performance of Rough Silicon Nanowires Allon I. Hochbaum 1 *, Renkun Chen 2 *, Raul Diaz Delgado 1, Wenjie Liang 1, Erik C. Garnett 1, Mark Najarian 3, Arun Majumdar 2,3,4, Peidong

More information

EMBEDDED FBG SENSORS AND AWG-BASED WAVELENGTH INTERROGATOR FOR HEALTH MONITORING OF COMPOSITE MATERIALS

EMBEDDED FBG SENSORS AND AWG-BASED WAVELENGTH INTERROGATOR FOR HEALTH MONITORING OF COMPOSITE MATERIALS 16 TH INTERNATIONAL CONFERENCE ON COMPOSITE MATERIALS EMBEDDED FBG SENSORS AND AWG-BASED WAVELENGTH INTERROGATOR FOR HEALTH MONITORING OF COMPOSITE MATERIALS Shinji Komatsuzaki*, Seiji Kojima*, Akihito

More information

CHAPTER 9 CURRENT VOLTAGE CHARACTERISTICS

CHAPTER 9 CURRENT VOLTAGE CHARACTERISTICS CHAPTER 9 CURRENT VOLTAGE CHARACTERISTICS 9.1 INTRODUCTION The phthalocyanines are a class of organic materials which are generally thermally stable and may be deposited as thin films by vacuum evaporation

More information

POLYMER MICROSTRUCTURE WITH TILTED MICROPILLAR ARRAY AND METHOD OF FABRICATING THE SAME

POLYMER MICROSTRUCTURE WITH TILTED MICROPILLAR ARRAY AND METHOD OF FABRICATING THE SAME POLYMER MICROSTRUCTURE WITH TILTED MICROPILLAR ARRAY AND METHOD OF FABRICATING THE SAME Field of the Invention The present invention relates to a polymer microstructure. In particular, the present invention

More information

MIL-STD-1580B REQUIREMENT 11 DETAILED REQUIREMENTS FOR CONNECTORS

MIL-STD-1580B REQUIREMENT 11 DETAILED REQUIREMENTS FOR CONNECTORS DETAILED REQUIREMENTS FOR CONNECTORS 11. General. This section describes detailed requirements for a DPA of commonly used connectors. These requirements supplement the general requirements in section 4.

More information

shaping global nanofuture ULTRA-PRECISE PRINTING OF NANOMATERIALS

shaping global nanofuture ULTRA-PRECISE PRINTING OF NANOMATERIALS shaping global nanofuture ULTRA-PRECISE PRINTING OF NANOMATERIALS WHO ARE WE? XTPL S.A. is a company operating in the nanotechnology segment. The interdisciplinary team of XTPL develops on a global scale

More information

Supporting Information. Air-stable surface charge transfer doping of MoS 2 by benzyl viologen

Supporting Information. Air-stable surface charge transfer doping of MoS 2 by benzyl viologen Supporting Information Air-stable surface charge transfer doping of MoS 2 by benzyl viologen Daisuke Kiriya,,ǁ, Mahmut Tosun,,ǁ, Peida Zhao,,ǁ, Jeong Seuk Kang, and Ali Javey,,ǁ,* Electrical Engineering

More information

End-of-line Standard Substrates For the Characterization of organic

End-of-line Standard Substrates For the Characterization of organic FRAUNHOFER INSTITUTe FoR Photonic Microsystems IPMS End-of-line Standard Substrates For the Characterization of organic semiconductor Materials Over the last few years, organic electronics have become

More information

School of Materials Science and Engineering, Beihang University, Beijing , China.

School of Materials Science and Engineering, Beihang University, Beijing , China. EFFECT OF SIZING AGENT ON THE INTERFACIAL ADHESION OF CARBON FIBER-REINFORCED POLYAMIDE 6 COMPOSITES Tao Zhang 1, Yueqing Zhao 2, Hongfu Li 3, Boming Zhang 4 1 School of Materials Science and Engineering,

More information

Copyright WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim, Germany, Particle. Particle Systems Characterization. Supporting Information

Copyright WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim, Germany, Particle. Particle Systems Characterization. Supporting Information Copyright WILEY-VCH Verlag GmbH & Co. KGaA, 69469 Weinheim, Germany, 2013. Particle Particle Systems Characterization Supporting Information for Part. Part. Syst. Charact., DOI: 10.1002/ppsc. 201300175

More information

S.Vidhya by, Published 4 Feb 2014

S.Vidhya by, Published 4 Feb 2014 A Wearable And Highly Sensitive Pressure Sensor With Ultrathin Gold Nanowires Shu Gong1,2, Willem Schwalb3, Yongwei Wang1,2, Yi Chen1, Yue Tang1,2, Jye Si1, Bijan Shirinzadeh3 & Wenlong Cheng1,2 1 Department

More information

DK Guard Ring Polarographic Cell

DK Guard Ring Polarographic Cell REHDER DEVELOPMENT COMPANY 2139 Klondike Rd W Lafayette, IN 47906 USA Tel: (765) 418-1997 Fax: (765) 463-3779 Web: http://www.rehder-dev.com Email: t.houck@rehder-dev.com Technical Innovations DK Guard

More information

SPECIFICATION FOR APPROVAL 1/8W 0816 LOW RESISTNACE CHIP RESISTOR

SPECIFICATION FOR APPROVAL 1/8W 0816 LOW RESISTNACE CHIP RESISTOR PAGE : 1 OF 11 1/8W 0816 LOW RESISTNACE CHIP RESISTOR 1. Scope This specification applies to 0.8mm x 1.60mm size 1/8W, fixed metal film chip resistors rectangular type for use in electronic equipment.

More information

CHAPTER 11: Testing, Assembly, and Packaging

CHAPTER 11: Testing, Assembly, and Packaging Chapter 11 1 CHAPTER 11: Testing, Assembly, and Packaging The previous chapters focus on the fabrication of devices in silicon or the frontend technology. Hundreds of chips can be built on a single wafer,

More information

Obducat NIL 6. Nanoimprinting with NRF s NIL 6

Obducat NIL 6. Nanoimprinting with NRF s NIL 6 Obducat NIL 6 Substrates: pieces to 6 inch, hard or soft Thermal cure with PMMA, MR I 7010 etc Alignment to about 3 microns Temperature to 300 HC Pressure 15 to 80 bars Resolution < 50 nm possible Up to

More information

Supporting Information. Epitaxially Aligned Cuprous Oxide Nanowires for All-Oxide, Single-Wire Solar Cells

Supporting Information. Epitaxially Aligned Cuprous Oxide Nanowires for All-Oxide, Single-Wire Solar Cells Supporting Information Epitaxially Aligned Cuprous Oxide Nanowires for All-Oxide, Single-Wire Solar Cells Sarah Brittman, 1,2 Youngdong Yoo, 1 Neil P. Dasgupta, 1,3 Si-in Kim, 4 Bongsoo Kim, 4 and Peidong

More information

The Department of Advanced Materials Engineering. Materials and Processes in Polymeric Microelectronics

The Department of Advanced Materials Engineering. Materials and Processes in Polymeric Microelectronics The Department of Advanced Materials Engineering Materials and Processes in Polymeric Microelectronics 1 Outline Materials and Processes in Polymeric Microelectronics Polymeric Microelectronics Process

More information

SUPPLEMENTARY INFORMATION

SUPPLEMENTARY INFORMATION A transparent bending-insensitive pressure sensor Sungwon Lee 1,2, Amir Reuveny 1,2, Jonathan Reeder 1#, Sunghoon Lee 1,2, Hanbit Jin 1,2, Qihan Liu 5, Tomoyuki Yokota 1,2, Tsuyoshi Sekitani 1,2,3, Takashi

More information

Supporting Information for. Stretchable Microfluidic Radio Frequency Antenna

Supporting Information for. Stretchable Microfluidic Radio Frequency Antenna Supporting Information for Stretchable Microfluidic Radio Frequency Antenna Masahiro Kubo 1, Xiaofeng Li 2, Choongik Kim 1, Michinao Hashimoto 1, Benjamin J. Wiley 1, Donhee Ham 2 and George M. Whitesides

More information

Additional information Indium-free, highly transparent, flexible Cu2O/Cu/Cu2O mesh electrodes for flexible touch screen panels

Additional information Indium-free, highly transparent, flexible Cu2O/Cu/Cu2O mesh electrodes for flexible touch screen panels Additional information Indium-free, highly transparent, flexible Cu2O/Cu/Cu2O mesh electrodes for flexible touch screen panels By Don-Ju Kim 1, Hyo-Joong Kim 1, Ki-Won Seo 1, Ki-Hyun Kim 2, Tae-Wong Kim

More information

Technical data for Brother TZe Tapes

Technical data for Brother TZe Tapes Technical data for Brother TZe Tapes Why do Brother P-Touch laminated labels last longer? Unlike ordinary labels, our unique laminated tape technology ensures that a layer of superclear polyethylene laminate

More information

Title detector with operating temperature.

Title detector with operating temperature. Title Radiation measurements by a detector with operating temperature cryogen Kanno, Ikuo; Yoshihara, Fumiki; Nou Author(s) Osamu; Murase, Yasuhiro; Nakamura, Masaki Citation REVIEW OF SCIENTIFIC INSTRUMENTS

More information

M. Senoner 1), Th. Wirth 1), W. E. S. Unger 1), M. Escher 2), N. Weber 2), D. Funnemann 3) and B. Krömker 3) INTRODUCTION

M. Senoner 1), Th. Wirth 1), W. E. S. Unger 1), M. Escher 2), N. Weber 2), D. Funnemann 3) and B. Krömker 3) INTRODUCTION Testing of Lateral Resolution in the Nanometre Range Using the BAM-L002 - Certified Reference Material: Application to ToF-SIMS IV and NanoESCA Instruments M. Senoner 1), Th. Wirth 1), W. E. S. Unger 1),

More information

This writeup is adapted from Fall 2002, final project report for by Robert Winsor.

This writeup is adapted from Fall 2002, final project report for by Robert Winsor. Optical Waveguides in Andreas G. Andreou This writeup is adapted from Fall 2002, final project report for 520.773 by Robert Winsor. September, 2003 ABSTRACT This lab course is intended to give students

More information

32nm High-K/Metal Gate Version Including 2nd Generation Intel Core processor family

32nm High-K/Metal Gate Version Including 2nd Generation Intel Core processor family From Sand to Silicon Making of a Chip Illustrations 32nm High-K/Metal Gate Version Including 2nd Generation Intel Core processor family April 2011 1 The illustrations on the following foils are low resolution

More information

1. Scope. 2. Apparatus The apparatus shall comprise at least the following individual components: IGPG Car Wash Round Robin Test Procedure

1. Scope. 2. Apparatus The apparatus shall comprise at least the following individual components: IGPG Car Wash Round Robin Test Procedure 1. Scope The intension of this round robin test is to investigate whether the car wash test described in ISO 20566 and used to validate the abrasion performance of exterior car body parts is suitable as

More information

HipoCIGS: enamelled steel as substrate for thin film solar cells

HipoCIGS: enamelled steel as substrate for thin film solar cells HipoCIGS: enamelled steel as substrate for thin film solar cells Lecturer D. Jacobs*, Author S. Efimenko, Co-author C. Schlegel *:PRINCE Belgium bvba, Pathoekeweg 116, 8000 Brugge, Belgium, djacobs@princecorp.com

More information

Supplemental information for Selective GaSb Radial Growth on Crystal Phase Engineered InAs Nanowires

Supplemental information for Selective GaSb Radial Growth on Crystal Phase Engineered InAs Nanowires Electronic Supplementary Material (ESI) for Nanoscale. This journal is The Royal Society of Chemistry 2015 Supplemental information for Selective GaSb Radial Growth on Crystal Phase Engineered InAs Nanowires

More information

ADVANCES IN USING A POLYMERIC TAPE FOR LASER-INDUCED DEPOSITION AND ABLATION

ADVANCES IN USING A POLYMERIC TAPE FOR LASER-INDUCED DEPOSITION AND ABLATION ADVANCES IN USING A POLYMERIC TAPE FOR LASER-INDUCED DEPOSITION AND ABLATION Arne Koops, tesa AG, Hamburg, Germany Sven Reiter, tesa AG, Hamburg, Germany 1. Abstract Laser systems for industrial materials

More information

Supporting Information

Supporting Information Strength of recluse spider s silk originates from nanofibrils Supporting Information Qijue Wang, Hannes C. Schniepp* Applied Science Department, The College of William & Mary, P.O. Box 8795, Williamsburg,

More information

Nanovie. Scanning Tunnelling Microscope

Nanovie. Scanning Tunnelling Microscope Nanovie Scanning Tunnelling Microscope Nanovie STM Always at Hand Nanovie STM Lepto for Research Nanovie STM Educa for Education Nanovie Auto Tip Maker Nanovie STM Lepto Portable 3D nanoscale microscope

More information

PCB Fabrication Processes Brief Introduction

PCB Fabrication Processes Brief Introduction PCB Fabrication Processes Brief Introduction AGS-Electronics, Ph: +1-505-550-6501 or +1-505-565-5102, Fx: +1-505-814-5778, Em: sales@ags-electronics.com, Web: http://www.ags-electronics.com Contents PCB

More information

Major Fabrication Steps in MOS Process Flow

Major Fabrication Steps in MOS Process Flow Major Fabrication Steps in MOS Process Flow UV light Mask oxygen Silicon dioxide photoresist exposed photoresist oxide Silicon substrate Oxidation (Field oxide) Photoresist Coating Mask-Wafer Alignment

More information

SMT Ferrite Chip Inductor SFI201212S Series

SMT Ferrite Chip Inductor SFI201212S Series Part : SFI201212S SERIES Version : AD Page : 1 / 7 Feature SMT Ferrite Chip Inductor SFI201212S Series Utilizing a miniaturized winding structure. These products provide high Q characteristics. Resin coated

More information

Module - 2 Lecture - 13 Lithography I

Module - 2 Lecture - 13 Lithography I Nano Structured Materials-Synthesis, Properties, Self Assembly and Applications Prof. Ashok. K.Ganguli Department of Chemistry Indian Institute of Technology, Delhi Module - 2 Lecture - 13 Lithography

More information

William Reiniach 5th Year Microelectronic Engineering Student Rochester Institute of Technology

William Reiniach 5th Year Microelectronic Engineering Student Rochester Institute of Technology DEVELOPMENT OF A PHOTOSENSITIVE POLYIMIDE PROCESS William Reiniach 5th Year Microelectronic Engineering Student Rochester Institute of Technology 1~BS TRACT A six step lithographic process has been developed

More information

Supplementary Information

Supplementary Information Supplementary Information For Nearly Lattice Matched All Wurtzite CdSe/ZnTe Type II Core-Shell Nanowires with Epitaxial Interfaces for Photovoltaics Kai Wang, Satish C. Rai,Jason Marmon, Jiajun Chen, Kun

More information

Supporting Information

Supporting Information Electronic Supplementary Material (ESI) for RSC Advances. This journal is The Royal Society of Chemistry 2015 Supporting Information All-direction energy harvester based on nano/micro fibers as flexible

More information

Supporting Information. High-Resolution Organic Light Emitting Diodes Patterned via Contact Printing

Supporting Information. High-Resolution Organic Light Emitting Diodes Patterned via Contact Printing Supporting Information High-Resolution Organic Light Emitting Diodes Patterned via Contact Printing Jinhai Li, Lisong Xu, Ching W. Tang and Alexander A. Shestopalov* Department of Chemical Engineering,

More information

Thin Film Resistor Integration into Flex-Boards

Thin Film Resistor Integration into Flex-Boards Thin Film Resistor Integration into Flex-Boards 7 rd International Workshop Flexible Electronic Systems November 29, 2006, Munich by Dr. Hans Burkard Hightec H MC AG, Lenzburg, Switzerland 1 Content HiCoFlex:

More information

SCANNING ELECTRON MICROSCOPE (SEM) INSPECTION OF SEMICONDUCTOR DICE. ESCC Basic Specification No

SCANNING ELECTRON MICROSCOPE (SEM) INSPECTION OF SEMICONDUCTOR DICE. ESCC Basic Specification No Page 1 of 24 SCANNING ELECTRON MICROSCOPE (SEM) INSPECTION OF SEMICONDUCTOR DICE ESCC Basic Specification Issue 2 February 2014 Document Custodian: European Space Agency see https://escies.org PAGE 2 LEGAL

More information

NITROGEN DIOXIDE NO2 SS SOLID ELECTROCHEMICAL SENSOR

NITROGEN DIOXIDE NO2 SS SOLID ELECTROCHEMICAL SENSOR 1. DESCRIPTION OF TECHNOLOGY The NO 2 sensor is based on the principle of electrochemical gas detection. This technology is suitable for the detection of gases which can be oxidised or reduced by an electrochemical

More information

i- Line Photoresist Development: Replacement Evaluation of OiR

i- Line Photoresist Development: Replacement Evaluation of OiR i- Line Photoresist Development: Replacement Evaluation of OiR 906-12 Nishtha Bhatia High School Intern 31 July 2014 The Marvell Nanofabrication Laboratory s current i-line photoresist, OiR 897-10i, has

More information

A Parallel Radial Mirror Energy Analyzer Attachment for the Scanning Electron Microscope

A Parallel Radial Mirror Energy Analyzer Attachment for the Scanning Electron Microscope 142 doi:10.1017/s1431927615013288 Microscopy Society of America 2015 A Parallel Radial Mirror Energy Analyzer Attachment for the Scanning Electron Microscope Kang Hao Cheong, Weiding Han, Anjam Khursheed

More information

Basic Measurements for Pipe Inspections

Basic Measurements for Pipe Inspections Basic Measurements for Pipe Inspections Period 7 Basic Corrosion Course 2017 February 21-23, 2017 Mark Anderson-MTS 1 DOT 192.459 External corrosion control: Examination of buried pipeline when exposed.

More information

Surface Topography and Alignment Effects in UV-Modified Polyimide Films with Micron Size Patterns

Surface Topography and Alignment Effects in UV-Modified Polyimide Films with Micron Size Patterns CHINESE JOURNAL OF PHYSICS VOL. 41, NO. 2 APRIL 2003 Surface Topography and Alignment Effects in UV-Modified Polyimide Films with Micron Size Patterns Ru-Pin Pan 1, Hua-Yu Chiu 1,Yea-FengLin 1,andJ.Y.Huang

More information

SPACER APPLICATION: KEY POİNTS FOR HİGH QUALİTY İG UNİTS

SPACER APPLICATION: KEY POİNTS FOR HİGH QUALİTY İG UNİTS SPACER APPLICATION: KEY POİNTS FOR HİGH QUALİTY İG UNİTS Application of spacer should be in clean and indoor area. Glass washing machine, hot press machine and spacer application table should be in the

More information

Application Bulletin 240

Application Bulletin 240 Application Bulletin 240 Design Consideration CUSTOM CAPABILITIES Standard PC board fabrication flexibility allows for various component orientations, mounting features, and interconnect schemes. The starting

More information

Inspection Method Sheet

Inspection Method Sheet Inspection Method Sheet Part Number: Generic Part Name: PCB Filters Drawing Number: Generic Operation: In Process / Final Page 1 of 10 Written By: Myra Cope Doc. #: TT-PC-0378 Rev. 14 Date: 10-15-08 Applicable

More information

Supplementary Figure 1 Schematic illustration of fabrication procedure of MoS2/h- BN/graphene heterostructures. a, c d Supplementary Figure 2

Supplementary Figure 1 Schematic illustration of fabrication procedure of MoS2/h- BN/graphene heterostructures. a, c d Supplementary Figure 2 Supplementary Figure 1 Schematic illustration of fabrication procedure of MoS 2 /hon a 300- BN/graphene heterostructures. a, CVD-grown b, Graphene was patterned into graphene strips by oxygen monolayer

More information

Hierarchical CoNiSe2 nano-architecture as a highperformance electrocatalyst for water splitting

Hierarchical CoNiSe2 nano-architecture as a highperformance electrocatalyst for water splitting Nano Res. Electronic Supplementary Material Hierarchical CoNiSe2 nano-architecture as a highperformance electrocatalyst for water splitting Tao Chen and Yiwei Tan ( ) State Key Laboratory of Materials-Oriented

More information