R1TRFTTE. Nemko Canada Inc. 303 River Road Ottawa, Ontario, Canada, K1V 1H2 +1 (613) Sangoma Technologies
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1 Report reference No R1TRFTTE Test item description Model ISDN Gateway A101 / A101D./ A101E / A101DE / RSVLC-1002A A102 / A102D / A102E / A102DE / RSVLC-1002A Testing Laboratory Address Nemko Canada Inc. 303 River Road Ottawa, Ontario, Canada, K1V 1H2 +1 (613) Applicant's Name Address Sangoma Technologies 50 McIntosh Drive, Suite 120, Markham, Ontario L3R 9T3 CANADA Test specification Tested by TBR 4. Integrated Services Digital Network (ISDN); Attachment requirements for terminal equipment to connect to an ISDN using ISDN primary rate access Approved: November 1995 TBR 4 A1. Amendment A1 modifies the Technical Basis for Regulation TBR 4 (1995) Approved: December 1997 ITAAB notes: 66, 80, 83, 84, 87 Kurt Mikolajewski Telecom specialist Approved by Stuart Beck Director of Certification Date of issue February 1, 2010 Number of Pages 61 This test report shall not be reproduced in any form except in full without the written approval of the Test Laboratory.
2 Project No.: R1TRFTTE Table of contents 1 Client information Equipment details Test project performance Test report summary Revision History Equipment under test EUT Description Technical judgement Modification performed during the assessment Additional observations Samples Submitted for testing Test laboratory description Test equipment used Photographs of test samples A102DE top view A102DE bottom view A102DE connector view A102 daughter card bottom view Test results summary Detailed test results...12 Page 2 of 61
3 Project No.: R1TRFTTE 1 Client information Client name: Sangoma Technologies Address: 50 McIntosh Drive, Suite 120, Markham, Ontario L3R 9T3 CANADA Telephone: ext 125 Fax: bruno@sangoma.com Contact name: Bruno Fagundes 2 Equipment details Product name: Product type: Model(s): T1 / E1 / J1 Digital interface cards ISDN Gateway A101 / A101D./ A101E / A101DE / RSVLC-1002A A102 / A102D / A102E / A102DE / RSVLC-1002A 3 Test project performance Project ID: Location: Test started: Test specification(s): Test suite: TRFTTE Nemko Canada 303 River Road, Ottawa, Ontario K1V 1H2 1/26/ :19:00 AM TBR 4. Integrated Services Digital Network (ISDN); Attachment requirements for terminal equipment to connect to an ISDN using ISDN primary rate access Approved: November 1995 TBR 4 A1. Amendment A1 modifies the Technical Basis for Regulation TBR 4 (1995) Approved: December 1997 ITAAB notes: 66, 80, 83, 84, 87 TBR4 (ISDN PRI) (1/27/2010 9:25:47 AM, modified) Page 3 of 61
4 Project No.: R1TRFTTE 4 Test report summary Testing was completed against all relevant requirements of the test standard. The results obtained indicate that the product under test complies in full with the requirements tested. The test results relate only to the items tested. 4.1 Revision History R1TRFTTE, Febuary 1, 2010 Corrected part numbers on page 1 and 3 to correct RSVLC-102A to RSVLC- 1002A. 5 Equipment under test 5.1 EUT Description The EUT is a PC based VoIP Gateway card. It provides public telecommunication network access via up to 2 Primary Rate ISDN ports. The card has different variants which allows the card to host the following configurations: 1 port Model A101. The differences between models are the addition of a DSP for echo cancellation or the use of PCI Express as opposed to PCI architecture 2 ports Model A102. The differences between models are the addition of a DSP for echo cancellation or the use of PCI Express as opposed to PCI architecture The A101 is a depopulated version of the A102. The A101/A102 shares the same drivers, F/W and H/W with the A104/A108 product evaluated in project TRFTTE. The exception is the number of ports on the framer/transceiver chip(s) and the line transformer. 5.2 Technical judgement The following technical judgements were made during the assessment: Technical judgement 1 The drivers, F/W and H/W are of the same family for the A102 and A104. The difference from the previously evaluated A104 is the layout of the analog portion of the circuit the number of ports in the framer (1 vs. 4) and the line transformer brand and number of ports. It was judged that the layers 2 and 3 did not have to be retested on the A102 / A101 and compliance to the requirement would be based on Nemko Report TRFTTE. It was further judged that only the electrical portions of the layer one tests were required to fully evaluate this variant of the product Technical judgement 2 The bus interface of the base card was judged as not affecting the evaluation; therefore only one variant was tested. As the A04 report used the PCI version this test used the PCI express version for completeness Technical judgement 3 The A102 board has 2 variants with one or two ports populated. It was judged that only one port of one variant required testing. The two-port card was tested on port one (labeled as A ). 5.3 Modification performed during the assessment No modifications were made during the assessment. Page 4 of 61
5 Project No.: R1TRFTTE 5.4 Additional observations Software Versions: NBE Gateway Windows Driver version SngBus.sys & WANPIPE version F/W version 36. (A102 card) Connector: 8 pin modular type Transformer: MIDCOM, PN: Framer / Transceiver: DALLAS, PN: DS26521 Page 5 of 61
6 Project No.: R1TRFTTE 5.5 Samples Submitted for testing The following samples have been for type assessment: Sample Description Model Number Serial Number 2 Dual T1/E1 PCIe card with DSP A102DE 102E2DM Host PC windows based The first samples were received on: January 15, Test laboratory description Nemko Canada Inc., a testing laboratory, is accredited by the Standards Council of Canada. The tests included in this report are within the scope of this accreditation. 7 Test equipment used Description Model S/N Hardware Rev. Software Rev. Last Calibration Telecom Conformance Analyzer Surge Generator Dielectric Analyzer Hermon Laboratories TCA 8200 KeyTek ECAT AR Inc. 7530DT FA A /5/2010 9:45:53 AM FA Aug 2008 FA Jan 2010 Page 6 of 61
7 Project No.: R1TRFTTE 8 Photographs of test samples Photographs were taken of relevant samples during the assessment. These are detailed below and are included in this section. 8.1 A102DE top view 8.2 A102DE bottom view 8.3 A102DE connector view 8.4 A102 daughter card bottom view The photographs depict the samples as originally submitted state. Page 7 of 61
8 Project No.: R1TRFTTE 8.1 A102DE top view 8.2 A102DE bottom view Page 8 of 61
9 Project No.: R1TRFTTE 8.3 A102DE connector view 8.4 A102 daughter card bottom view Page 9 of 61
10 Project No.: R1TRFTTE 9 Requirement conditions table Condition Is the TE mains powered? Is the TE intended for timing derived from the same primary rate access? Is the TE intended for timing derived from a different primary rate access? Is the TE intended for timing derived from a non-isdn kbit/s access? Is the TE intended for timing derived from internal source? Is the TE intended for timing derived from dedicated external reference? Is the TE intended to respond to three consecutive BIT 2=0 received as to an error? Applies No es es No es No es Parameter Layer 2 test selection criteria TE supports Automatic TEI assignment (PC_AUTOMAT_TEI) TE does not use a single point to point data link (PC_PTMP_L2) TE is stable in state 4 for at least 6 seconds (PX_IUT_STA_S4) TE is stable in state 1 for at least 6 seconds (PX_IUT_STA_S1) Value NO FALSE ES FALSE Layer 3 test selection criteria TE performs Bearer capability checking (IBCC) TE performs High layer compatibility checking (IHLCC) TE includes the Sending complete IE in SETUP (EBS) TE supports the Overlap receiving procedure (OVR) TE is capable of sending the ALERT PDU (BAL) TE maintains state U7 for more than 3 seconds (U7_MAINT) TE is capable of sending the CALL PROCEEDING PDU (BCP) TE maintains state U9 for more than 3 seconds (U9_MAINT) TE supports only a single point-to-point data link (PTP) TRUE FALSE TRUE FALSE TRUE TRUE ES FALSE TRUE Bearer capabilities supported Speech G.711 A-Law Protocol layers test equipment Acacia Clarinet Protocol Tester Test software used KTL ISDN TBR 4 software version 2.0 Page 10 of 61
11 Project No.: R1TRFTTE 10 Test results summary Test Status 8 Overvoltage protection requirements 8.1 Impulse transfer from mains, common mode Not required 8.2 Impulse transfer from mains, transverse mode Not required 8.3 Conversion of common mode to transverse mode 9.1 Physical characteristics Hardwired connection Alternative means of connection 9.2 Specification at the output port Waveform shape Impedance towards ground Clock accuracy 9.2.4a Output jitter 9.2.4b Output jitter 9.2.4c Output jitter Not required 9.2.4d Output jitter 9.2.4e Output jitter (external clock) Not required 9.3 Specification at the input port Return loss Immunity to attenuation and reflections Jitter tolerance Tolerable longitudinal voltage (B.3.4) Impedance towards ground 9.4 Frame structure (Assignment of bits in ts 0), (Use of bit 1 in 2048 kbit/s CRC-4 multiframe) (per B.4.1) 9.5 Operational functions Maintenance functions (per B.5.1) * Loss of frame alignment, Strategy for frame alignment recovery (per B.5.2)-1 * Loss of frame alignment, Strategy for frame alignment recovery (per B.5.2)-2 * CRC multiframe alignment using information in bit 1 of the basic frame, (per B.5.3) * CRC bit monitoring, Monitoring for false frame alignment (per B.4.2) * 10 Layer 2 requirements TBR4 Layer 2 * 11 Layer 3 requirements TBR4 Layer 3 * Notes: 1) * - Indicates result of judgement 1 Ref Nemko report: TRFTTE. Page 11 of 61
12 Project No.: R1TRFTTE 11 Detailed test results Page 12 of 61
13 Test specification: 8.3 Conversion of common mode to transverse mode Project No.: TRFTTE The transverse mode voltage shall not be more than 250 V peak when 2 common mode surges of 1kV (1.2/50 us) (one of each polarity) are applied to the TE interface. 1/27/ :59:11 AM Temperature: 24.2 C Air Pressure: kpa Relative Humidity: 31.1 % Mains Power Supply: DC Remarks: Test results: Test voltage Measurements points Measured voltage, V /Fail 1 kv, positive C1 to D1&D2 14 Vp 1 kv, negative C1 to D1&D2 42 Vp Comments: See plots attached. Block diagram: CH 1 CH 2 SCOPE C1 D1 D2 L1 L2 E A N1 PE mains Matching network N2 PE2 EUT F G H Coupling network B Test generator reference plane Test equipment used Serial No. Description Manufactur er Model No. Due Calibr. FA Oscilloscope, Digital storage 500 MHz Tektronix TDS 544A Jan 13, 2011 FA High Voltage Diff probe x100 scale Schaffner MC 200A Nov 2, 2010 FA Matching Network EM Test MN N/A FA Coupling-Decoupling Networks EM Test CN N/A FA Surge Generator 1.2/50 us, 2 kv ECAT 501B N/A Page 13 of 61
14 Test specification: 8.3 Conversion of common mode to transverse mode Project No.: TRFTTE The transverse mode voltage shall not be more than 250 V peak when 2 common mode surges of 1kV (1.2/50 us) (one of each polarity) are applied to the TE interface. 1/27/ :59:11 AM Temperature: 24.2 C Air Pressure: kpa Relative Humidity: 31.1 % Mains Power Supply: DC Remarks: Voltage between C and D1&D2, positive pulse Voltage between C and D1&D2, negative pulse Page 14 of 61
15 Test specification: 8.3 Conversion of common mode to transverse mode Project No.: TRFTTE The transverse mode voltage shall not be more than 250 V peak when 2 common mode surges of 1kV (1.2/50 us) (one of each polarity) are applied to the TE interface. 1/27/ :59:11 AM Temperature: 24.2 C Air Pressure: kpa Relative Humidity: 31.1 % Mains Power Supply: DC Remarks: Notes: 1) Plot trace 1 is from Diff probe 1 V = 100 V 2) Plot trace 4 is from generator 1 V =1 kv Page 15 of 61
16 Test specification: Hardwired connection Project No.: TRFTTE The terminal equipment shall provide a set of connection contacts to which solid wire conductors with diameters in the range 0,4 mm to 0,6 mm may be connected; or a wiring arrangement connected by any means to the terminal equipment, with unterminated solid wire conductors with diameters in the range 0,4 mm to 0,6 mm at the end distant from the terminal equipment. 1/27/ :15:59 PM Temperature: 24.2 C Air Pressure: kpa Relative Humidity: 31.1 % Mains Power Supply: DC Remarks: Test results: The EUT presents a standard 8 pin modular jack. A standard Ethernet cable when cut will provide the solid core conductors required for Hard-Wire terminations. Page 16 of 61
17 Test specification: Alternative means of connection Project No.: TRFTTE Any alternative means of connection may be provided in addition to the connection arrangements under /27/ :10:41 PM Temperature: 24.2 C Air Pressure: kpa Relative Humidity: 31.1 % Mains Power Supply: DC Remarks: Results: The EUT presents an 8 pin modular connector with pins 1, 2, 4, 5 used Page 17 of 61
18 Test specification: Waveform shape Project No.: TRFTTE The pulse shape at the output port shall conform with the limit mask of Figure 9.2. The peak voltage of a space shall be 0 +/- 0.3 volts. The ratio of the amplitudes of positive and negative pulses at the centre of the pulse interval shall be 0.95 to The ratio of the widths of positive and negative pulses at the nominal half amplitude shall be 0.95 to Evaluation 1/26/2010 1:51:04 PM Temperature: 25.3 C Air Pressure: 98.4 kpa Relative Humidity: 30.1 % Mains Power Supply: DC Measurement uncertainty Expanded uncertainty, k=2 (95% confidence): Pulse amplitude ±2.2% Timing ±0.35% General parameters Parameter Value Digital Termination 120 ohm Overall meas. time 120 s Frame format CCS & CRC BER Pattern 1:1 External Attenuation 1 Positive pulse shape Voltage (V) m m n n 200 n 300 n 400 n 500 n 600 n Time (s) Limit Result Page 18 of 61
19 Test specification: Waveform shape Project No.: TRFTTE The pulse shape at the output port shall conform with the limit mask of Figure 9.2. The peak voltage of a space shall be 0 +/- 0.3 volts. The ratio of the amplitudes of positive and negative pulses at the centre of the pulse interval shall be 0.95 to The ratio of the widths of positive and negative pulses at the nominal half amplitude shall be 0.95 to Evaluation 1/26/2010 1:51:04 PM Temperature: 25.3 C Air Pressure: 98.4 kpa Relative Humidity: 30.1 % Mains Power Supply: DC Negative pulse shape m m Voltage (V) n n 200 n 300 n 400 n 500 n 600 n Limit Result Time (s) Space shape 400 m 300 m 200 m 100 m Voltage (V) m -200 m -300 m -400 m 0 50 n 100 n 150 n 200 n 250 n 300 n 350 n 400 n 450 n 500 n Time (s) Limit Result Page 19 of 61
20 Test specification: Waveform shape Project No.: TRFTTE The pulse shape at the output port shall conform with the limit mask of Figure 9.2. The peak voltage of a space shall be 0 +/- 0.3 volts. The ratio of the amplitudes of positive and negative pulses at the centre of the pulse interval shall be 0.95 to The ratio of the widths of positive and negative pulses at the nominal half amplitude shall be 0.95 to Evaluation 1/26/2010 1:51:04 PM Temperature: 25.3 C Air Pressure: 98.4 kpa Relative Humidity: 30.1 % Mains Power Supply: DC Positive pulse shape fail ratio Ratio Limit Verdict 0.00% 1 % Negative pulse shape fail ratio Ratio Limit Verdict 0.00% 1 % Worst-case space peak voltage Space peak voltage Verdict mv - Worst-case pulse amplitude ratio Amplitude ratio Limit min Limit max Verdict m 1.05 Worst-case pulse width ratio Width ratio Limit min Limit max Verdict m 1.05 Page 20 of 61
21 Project No.: TRFTTE Test specification: Impedance towards ground To verify that the impedance towards ground of the transmitter output is greater than the following limit. 1/26/ :19:20 PM Temperature: 25.3 C Air Pressure: 98.4 kpa Relative Humidity: 30.1 % Mains Power Supply: DC Measurement uncertainty Expanded uncertainty, k=2 (95% confidence): Impedance Towards Ground with Stimulus level VRms, Frequency Range 10 Hz - 1 MHz ±3.6% General parameters Parameter Stimulus Level Value 2.00 Vrms Test ranges Frequency Start Stop Step Hz Hz 1 x F Hz Hz 1 x F Hz Hz 1 x F Hz Hz 1 x F Hz Hz 1 x F Hz Hz 1 x F Hz Hz 1 x F Hz Hz 1 x F 1.50 khz 1.50 khz 1 x F 3.10 khz 3.10 khz 1 x F 6.30 khz 6.30 khz 1 x F khz khz 1 x F khz khz 1 x F khz khz 1 x F khz khz 1 x F khz khz 1 x F khz khz 1 x F khz khz 1 x F khz khz 1 x F khz khz 1 x F khz khz 1 x F khz khz 1 x F 1.00 MHz 1.00 MHz 1 x F Page 21 of 61
22 Project No.: TRFTTE Test specification: Impedance towards ground To verify that the impedance towards ground of the transmitter output is greater than the following limit. 1/26/ :19:20 PM Temperature: 25.3 C Air Pressure: 98.4 kpa Relative Humidity: 30.1 % Mains Power Supply: DC k Impedance k Impedance (Ohm) k k k k k k k 1.00 M Limit Result Frequency (Hz) Impedance Frequency Impedance Limit Verdict Hz kohm 1 kohm Hz kohm 1 kohm Hz kohm 1 kohm Hz kohm 1 kohm Hz kohm 1 kohm Hz kohm 1 kohm Hz kohm 1 kohm Hz kohm 1 kohm 1.50 khz kohm 1 kohm 3.10 khz kohm 1 kohm 6.30 khz kohm 1 kohm khz kohm 1 kohm khz kohm 1 kohm khz kohm 1 kohm khz 9.78 kohm 1 kohm khz 5.19 kohm 1 kohm khz 3.54 kohm 1 kohm khz 2.51 kohm 1 kohm khz 1.78 kohm 1 kohm Page 22 of 61
23 Project No.: TRFTTE Test specification: Impedance towards ground To verify that the impedance towards ground of the transmitter output is greater than the following limit. 1/26/ :19:20 PM Temperature: 25.3 C Air Pressure: 98.4 kpa Relative Humidity: 30.1 % Mains Power Supply: DC Frequency Impedance Limit Verdict khz 1.58 kohm 1 kohm khz 1.25 kohm Ohm khz 1.00 kohm Ohm 1.00 MHz Ohm 500 Ohm Page 23 of 61
24 Project No.: TRFTTE Test specification: Clock accuracy To verify that in the absence of any external reference signal timing, the output signal shall have a bit rate within the limits of 2048 kbit/s ± 50 ppm. 1/26/ :27:11 AM Temperature: 25.3 C Air Pressure: 98.4 kpa Relative Humidity: 30.1 % Mains Power Supply: DC Measurement uncertainty Expanded uncertainty, k=2 (95% confidence): Measured bit rate ± 1 ppm General parameters Parameter Overall meas. time Value 60 s Minimum bit rate Bit rate Limit min Limit max Verdict bit/s 2.05 M bit/s 2.05 M bit/s Maximum bit rate Bit rate Limit min Limit max Verdict bit/s 2.05 M bit/s 2.05 M bit/s Minimum bit rate offset, Maximum bit rate offset Minimum bit rate offset Maximum bit rate offset Limit min Limit max Verdict 0.5 ppm 1.5 ppm -50 ppm 50 ppm Page 24 of 61
25 Project No.: TRFTTE Test specification: Clock accuracy To verify that in the absence of any external reference signal timing, the output signal shall have a bit rate within the limits of 2048 kbit/s ± 50 ppm. 1/27/2010 4:31:02 PM Temperature: 25.3 C Air Pressure: kpa Relative Humidity: 28.1 % Mains Power Supply: DC Remarks: A.E.S. Measurement uncertainty Expanded uncertainty, k=2 (95% confidence): Measured bit rate ± 1 ppm General parameters Parameter Overall meas. time Value 60 s Minimum bit rate Bit rate Limit min Limit max Verdict bit/s 2.05 M bit/s 2.05 M bit/s Maximum bit rate Bit rate Limit min Limit max Verdict bit/s 2.05 M bit/s 2.05 M bit/s Minimum bit rate offset, Maximum bit rate offset Minimum bit rate offset Maximum bit rate offset Limit min Limit max Verdict 2.4 ppm 2.9 ppm -50 ppm 50 ppm Page 25 of 61
26 Test specification: 9.2.4a Output jitter Project No.: TRFTTE To measure the peak-to-peak output jitter in the presence of input jitter when IUT is synchronized from simulator using input of the same primary rate access, with the maximum tolerable jitter at frequencies in the range 1 Hz to 100 khz as specified in figure 9.3 and table /26/2010 4:34:15 PM Temperature: 26.2 C Air Pressure: 98.8 kpa Relative Humidity: 29.9 % Mains Power Supply: DC Measurement uncertainty Expanded uncertainty, k=2 (95% confidence): Jitter measurement 1.6 UI range 2.5% ± 0.25UI 6.4 UI range 5.44 % ± 0.25 UI 12.8 UI range 6.35 % ± 0.25UI Jitter attenuation measurement Rx jitter > 0.5 UI 0.1 db Rx jitter UI 0.5dB Rx jitter UI 1dB Rx jitter UI 2.5dB General parameters Parameter Value Frame format CCS & CRC Line coding HDB3 Tx / Rx Jitter source Tx: Data / Rx: Data BER Pattern PRBS 2^15-1 Low pass filter 100 khz Test ranges Frequency Start Stop Step Tx Jitter 1.00 Hz 1.00 Hz 1 x F UIpp 2.00 Hz 2.00 Hz 1 x F UIpp 3.00 Hz 3.00 Hz 1 x F UIpp 6.00 Hz 6.00 Hz 1 x F UIpp Hz Hz 1 x F UIpp Hz Hz 1 x F UIpp Hz Hz 1 x F UIpp Hz Hz 1 x F UIpp Hz Hz 1 x F UIpp Hz Hz 1 x F UIpp Hz Hz 1 x F UIpp 1.00 khz 1.00 khz 1 x F UIpp 2.00 khz 2.00 khz 1 x F UIpp 3.60 khz 3.60 khz 1 x F UIpp 4.00 khz 4.00 khz 1 x F UIpp 8.00 khz 8.00 khz 1 x F UIpp Page 26 of 61
27 Test specification: 9.2.4a Output jitter Project No.: TRFTTE To measure the peak-to-peak output jitter in the presence of input jitter when IUT is synchronized from simulator using input of the same primary rate access, with the maximum tolerable jitter at frequencies in the range 1 Hz to 100 khz as specified in figure 9.3 and table /26/2010 4:34:15 PM Temperature: 26.2 C Air Pressure: 98.8 kpa Relative Humidity: 29.9 % Mains Power Supply: DC khz khz 1 x F UIpp khz khz 1 x F UIpp khz khz 1 x F UIpp khz khz 1 x F UIpp khz khz 1 x F UIpp Tx Jitter, Rx Jitter vs frequency (pp) Jitter frequency, Hz Tx Jitter Rx Jitter Limit Verdict Condition 1: Tx Frequency offset: -1 ppm, High pass filter: 20 Hz 1.00 Hz UIpp UI pp 1.1 UI pp 2.00 Hz UIpp UI pp 1.1 UI pp 3.00 Hz UIpp UI pp 1.1 UI pp 6.00 Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp 1.00 khz UIpp UI pp 1.1 UI pp 2.00 khz UIpp UI pp 1.1 UI pp 3.60 khz UIpp UI pp 1.1 UI pp 4.00 khz UIpp UI pp 1.1 UI pp 8.00 khz UIpp UI pp 1.1 UI pp khz UIpp UI pp 1.1 UI pp khz UIpp UI pp 1.1 UI pp khz UIpp UI pp 1.1 UI pp khz UIpp UI pp 1.1 UI pp khz UIpp UI pp 1.1 UI pp Condition 2: Tx Frequency offset: -1 ppm, High pass filter: 400 Hz 1.00 Hz UIpp UI pp 110 mui pp 2.00 Hz UIpp UI pp 110 mui pp 3.00 Hz UIpp UI pp 110 mui pp 6.00 Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp Page 27 of 61
28 Test specification: 9.2.4a Output jitter Project No.: TRFTTE To measure the peak-to-peak output jitter in the presence of input jitter when IUT is synchronized from simulator using input of the same primary rate access, with the maximum tolerable jitter at frequencies in the range 1 Hz to 100 khz as specified in figure 9.3 and table /26/2010 4:34:15 PM Temperature: 26.2 C Air Pressure: 98.8 kpa Relative Humidity: 29.9 % Mains Power Supply: DC Jitter frequency, Hz Tx Jitter Rx Jitter Limit Verdict Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp 1.00 khz UIpp UI pp 110 mui pp 2.00 khz UIpp UI pp 110 mui pp 3.60 khz UIpp UI pp 110 mui pp 4.00 khz UIpp UI pp 110 mui pp 8.00 khz UIpp UI pp 110 mui pp khz UIpp UI pp 110 mui pp khz UIpp UI pp 110 mui pp khz UIpp UI pp 110 mui pp khz UIpp UI pp 110 mui pp khz UIpp UI pp 110 mui pp Condition 3: Tx Frequency offset: 0 ppm, High pass filter: 20 Hz 1.00 Hz UIpp UI pp 1.1 UI pp 2.00 Hz UIpp UI pp 1.1 UI pp 3.00 Hz UIpp UI pp 1.1 UI pp 6.00 Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp 1.00 khz UIpp UI pp 1.1 UI pp 2.00 khz UIpp UI pp 1.1 UI pp 3.60 khz UIpp UI pp 1.1 UI pp 4.00 khz UIpp UI pp 1.1 UI pp 8.00 khz UIpp UI pp 1.1 UI pp khz UIpp UI pp 1.1 UI pp khz UIpp UI pp 1.1 UI pp khz UIpp UI pp 1.1 UI pp khz UIpp UI pp 1.1 UI pp khz UIpp UI pp 1.1 UI pp Condition 4: Tx Frequency offset: 0 ppm, High pass filter: 400 Hz 1.00 Hz UIpp UI pp 110 mui pp 2.00 Hz UIpp UI pp 110 mui pp 3.00 Hz UIpp UI pp 110 mui pp Page 28 of 61
29 Test specification: 9.2.4a Output jitter Project No.: TRFTTE To measure the peak-to-peak output jitter in the presence of input jitter when IUT is synchronized from simulator using input of the same primary rate access, with the maximum tolerable jitter at frequencies in the range 1 Hz to 100 khz as specified in figure 9.3 and table /26/2010 4:34:15 PM Temperature: 26.2 C Air Pressure: 98.8 kpa Relative Humidity: 29.9 % Mains Power Supply: DC Jitter frequency, Hz Tx Jitter Rx Jitter Limit Verdict 6.00 Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp 1.00 khz UIpp UI pp 110 mui pp 2.00 khz UIpp UI pp 110 mui pp 3.60 khz UIpp UI pp 110 mui pp 4.00 khz UIpp UI pp 110 mui pp 8.00 khz UIpp UI pp 110 mui pp khz UIpp UI pp 110 mui pp khz UIpp UI pp 110 mui pp khz UIpp UI pp 110 mui pp khz UIpp UI pp 110 mui pp khz UIpp UI pp 110 mui pp Condition 5: Tx Frequency offset: 1 ppm, High pass filter: 20 Hz 1.00 Hz UIpp UI pp 1.1 UI pp 2.00 Hz UIpp UI pp 1.1 UI pp 3.00 Hz UIpp UI pp 1.1 UI pp 6.00 Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp 1.00 khz UIpp UI pp 1.1 UI pp 2.00 khz UIpp UI pp 1.1 UI pp 3.60 khz UIpp UI pp 1.1 UI pp 4.00 khz UIpp UI pp 1.1 UI pp 8.00 khz UIpp UI pp 1.1 UI pp khz UIpp UI pp 1.1 UI pp khz UIpp UI pp 1.1 UI pp khz UIpp UI pp 1.1 UI pp khz UIpp UI pp 1.1 UI pp Page 29 of 61
30 Test specification: 9.2.4a Output jitter Project No.: TRFTTE To measure the peak-to-peak output jitter in the presence of input jitter when IUT is synchronized from simulator using input of the same primary rate access, with the maximum tolerable jitter at frequencies in the range 1 Hz to 100 khz as specified in figure 9.3 and table /26/2010 4:34:15 PM Temperature: 26.2 C Air Pressure: 98.8 kpa Relative Humidity: 29.9 % Mains Power Supply: DC Jitter frequency, Hz Tx Jitter Rx Jitter Limit Verdict khz UIpp UI pp 1.1 UI pp Condition 6: Tx Frequency offset: 1 ppm, High pass filter: 400 Hz 1.00 Hz UIpp UI pp 110 mui pp 2.00 Hz UIpp UI pp 110 mui pp 3.00 Hz UIpp UI pp 110 mui pp 6.00 Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp 1.00 khz UIpp UI pp 110 mui pp 2.00 khz UIpp UI pp 110 mui pp 3.60 khz UIpp UI pp 110 mui pp 4.00 khz UIpp UI pp 110 mui pp 8.00 khz UIpp UI pp 110 mui pp khz UIpp UI pp 110 mui pp khz UIpp UI pp 110 mui pp khz UIpp UI pp 110 mui pp khz UIpp UI pp 110 mui pp khz UIpp UI pp 110 mui pp Page 30 of 61
31 Test specification: 9.2.4b Output jitter Project No.: TRFTTE To measure the peak-to-peak output jitter in the presence of input jitter when IUT is synchronized from simulator using input of the another primary rate access, with the maximum tolerable jitter at frequencies in the range 1 Hz to 100 khz as specified in figure 9.3 and table /27/2010 7:29:16 AM Temperature: 26.2 C Air Pressure: 98.8 kpa Relative Humidity: 29.9 % Mains Power Supply: DC Measurement uncertainty Expanded uncertainty, k=2 (95% confidence): Jitter measurement 1.6 UI range 2.5% ± 0.25UI 6.4 UI range 5.44 % ± 0.25 UI 12.8 UI range 6.35 % ± 0.25UI Jitter attenuation measurement Rx jitter > 0.5 UI 0.1 db Rx jitter UI 0.5dB Rx jitter UI 1dB Rx jitter UI 2.5dB General parameters Parameter Value Frame format CCS & CRC Line coding HDB3 Tx / Rx Jitter source Tx: Data / Rx: Data BER Pattern PRBS 2^15-1 Low pass filter 100 khz Test ranges Frequency Start Stop Step Tx Jitter 1.00 Hz 1.00 Hz 1 x F UIpp 2.00 Hz 2.00 Hz 1 x F UIpp 3.00 Hz 3.00 Hz 1 x F UIpp 6.00 Hz 6.00 Hz 1 x F UIpp Hz Hz 1 x F UIpp Hz Hz 1 x F UIpp Hz Hz 1 x F UIpp Hz Hz 1 x F UIpp Hz Hz 1 x F UIpp Hz Hz 1 x F UIpp Hz Hz 1 x F UIpp 1.00 khz 1.00 khz 1 x F UIpp 2.00 khz 2.00 khz 1 x F UIpp 3.60 khz 3.60 khz 1 x F UIpp 4.00 khz 4.00 khz 1 x F UIpp 8.00 khz 8.00 khz 1 x F UIpp Page 31 of 61
32 Test specification: 9.2.4b Output jitter Project No.: TRFTTE To measure the peak-to-peak output jitter in the presence of input jitter when IUT is synchronized from simulator using input of the another primary rate access, with the maximum tolerable jitter at frequencies in the range 1 Hz to 100 khz as specified in figure 9.3 and table /27/2010 7:29:16 AM Temperature: 26.2 C Air Pressure: 98.8 kpa Relative Humidity: 29.9 % Mains Power Supply: DC khz khz 1 x F UIpp khz khz 1 x F UIpp khz khz 1 x F UIpp khz khz 1 x F UIpp khz khz 1 x F UIpp Tx Jitter, Rx Jitter vs frequency (pp) Jitter frequency, Hz Tx Jitter Rx Jitter Limit Verdict Condition 1: Tx Frequency offset: -1 ppm, High pass filter: 20 Hz 1.00 Hz UIpp UI pp 1.1 UI pp 2.00 Hz UIpp UI pp 1.1 UI pp 3.00 Hz UIpp UI pp 1.1 UI pp 6.00 Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp 1.00 khz UIpp UI pp 1.1 UI pp 2.00 khz UIpp UI pp 1.1 UI pp 3.60 khz UIpp UI pp 1.1 UI pp 4.00 khz UIpp UI pp 1.1 UI pp 8.00 khz UIpp UI pp 1.1 UI pp khz UIpp UI pp 1.1 UI pp khz UIpp UI pp 1.1 UI pp khz UIpp UI pp 1.1 UI pp khz UIpp UI pp 1.1 UI pp khz UIpp UI pp 1.1 UI pp Condition 2: Tx Frequency offset: -1 ppm, High pass filter: 400 Hz 1.00 Hz UIpp UI pp 110 mui pp 2.00 Hz UIpp UI pp 110 mui pp 3.00 Hz UIpp UI pp 110 mui pp 6.00 Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp Page 32 of 61
33 Test specification: 9.2.4b Output jitter Project No.: TRFTTE To measure the peak-to-peak output jitter in the presence of input jitter when IUT is synchronized from simulator using input of the another primary rate access, with the maximum tolerable jitter at frequencies in the range 1 Hz to 100 khz as specified in figure 9.3 and table /27/2010 7:29:16 AM Temperature: 26.2 C Air Pressure: 98.8 kpa Relative Humidity: 29.9 % Mains Power Supply: DC Jitter frequency, Hz Tx Jitter Rx Jitter Limit Verdict Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp 1.00 khz UIpp UI pp 110 mui pp 2.00 khz UIpp UI pp 110 mui pp 3.60 khz UIpp UI pp 110 mui pp 4.00 khz UIpp UI pp 110 mui pp 8.00 khz UIpp UI pp 110 mui pp khz UIpp UI pp 110 mui pp khz UIpp UI pp 110 mui pp khz UIpp UI pp 110 mui pp khz UIpp UI pp 110 mui pp khz UIpp UI pp 110 mui pp Condition 3: Tx Frequency offset: 0 ppm, High pass filter: 20 Hz 1.00 Hz UIpp UI pp 1.1 UI pp 2.00 Hz UIpp UI pp 1.1 UI pp 3.00 Hz UIpp UI pp 1.1 UI pp 6.00 Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp 1.00 khz UIpp UI pp 1.1 UI pp 2.00 khz UIpp UI pp 1.1 UI pp 3.60 khz UIpp UI pp 1.1 UI pp 4.00 khz UIpp UI pp 1.1 UI pp 8.00 khz UIpp UI pp 1.1 UI pp khz UIpp UI pp 1.1 UI pp khz UIpp UI pp 1.1 UI pp khz UIpp UI pp 1.1 UI pp khz UIpp UI pp 1.1 UI pp khz UIpp UI pp 1.1 UI pp Condition 4: Tx Frequency offset: 0 ppm, High pass filter: 400 Hz 1.00 Hz UIpp UI pp 110 mui pp 2.00 Hz UIpp UI pp 110 mui pp 3.00 Hz UIpp UI pp 110 mui pp Page 33 of 61
34 Test specification: 9.2.4b Output jitter Project No.: TRFTTE To measure the peak-to-peak output jitter in the presence of input jitter when IUT is synchronized from simulator using input of the another primary rate access, with the maximum tolerable jitter at frequencies in the range 1 Hz to 100 khz as specified in figure 9.3 and table /27/2010 7:29:16 AM Temperature: 26.2 C Air Pressure: 98.8 kpa Relative Humidity: 29.9 % Mains Power Supply: DC Jitter frequency, Hz Tx Jitter Rx Jitter Limit Verdict 6.00 Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp 1.00 khz UIpp UI pp 110 mui pp 2.00 khz UIpp UI pp 110 mui pp 3.60 khz UIpp UI pp 110 mui pp 4.00 khz UIpp UI pp 110 mui pp 8.00 khz UIpp UI pp 110 mui pp khz UIpp UI pp 110 mui pp khz UIpp UI pp 110 mui pp khz UIpp UI pp 110 mui pp khz UIpp UI pp 110 mui pp khz UIpp UI pp 110 mui pp Condition 5: Tx Frequency offset: 1 ppm, High pass filter: 20 Hz 1.00 Hz UIpp UI pp 1.1 UI pp 2.00 Hz UIpp UI pp 1.1 UI pp 3.00 Hz UIpp UI pp 1.1 UI pp 6.00 Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp Hz UIpp UI pp 1.1 UI pp 1.00 khz UIpp UI pp 1.1 UI pp 2.00 khz UIpp UI pp 1.1 UI pp 3.60 khz UIpp UI pp 1.1 UI pp 4.00 khz UIpp UI pp 1.1 UI pp 8.00 khz UIpp UI pp 1.1 UI pp khz UIpp UI pp 1.1 UI pp khz UIpp UI pp 1.1 UI pp khz UIpp UI pp 1.1 UI pp khz UIpp UI pp 1.1 UI pp Page 34 of 61
35 Test specification: 9.2.4b Output jitter Project No.: TRFTTE To measure the peak-to-peak output jitter in the presence of input jitter when IUT is synchronized from simulator using input of the another primary rate access, with the maximum tolerable jitter at frequencies in the range 1 Hz to 100 khz as specified in figure 9.3 and table /27/2010 7:29:16 AM Temperature: 26.2 C Air Pressure: 98.8 kpa Relative Humidity: 29.9 % Mains Power Supply: DC Jitter frequency, Hz Tx Jitter Rx Jitter Limit Verdict khz UIpp UI pp 1.1 UI pp Condition 6: Tx Frequency offset: 1 ppm, High pass filter: 400 Hz 1.00 Hz UIpp UI pp 110 mui pp 2.00 Hz UIpp UI pp 110 mui pp 3.00 Hz UIpp UI pp 110 mui pp 6.00 Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp Hz UIpp UI pp 110 mui pp 1.00 khz UIpp UI pp 110 mui pp 2.00 khz UIpp UI pp 110 mui pp 3.60 khz UIpp UI pp 110 mui pp 4.00 khz UIpp UI pp 110 mui pp 8.00 khz UIpp UI pp 110 mui pp khz UIpp UI pp 110 mui pp khz UIpp UI pp 110 mui pp khz UIpp UI pp 110 mui pp khz UIpp UI pp 110 mui pp khz UIpp UI pp 110 mui pp Page 35 of 61
36 Test specification: 9.2.4d Output jitter Project No.: TRFTTE To measure the peak-to-peak output jitter when IUT is synchronized using internal reference clock (free running mode). 1/26/2010 4:49:09 PM Temperature: 26.2 C Air Pressure: 98.8 kpa Relative Humidity: 29.9 % Mains Power Supply: DC Measurement uncertainty Expanded uncertainty, k=2 (95% confidence): Jitter measurement 1.6 UI range 2.5% ± 0.25UI 6.4 UI range 5.44 % ± 0.25 UI 12.8 UI range 6.35 % ± 0.25UI Jitter attenuation measurement Rx jitter > 0.5 UI 0.1 db Rx jitter UI 0.5dB Rx jitter UI 1dB Rx jitter UI 2.5dB General parameters Parameter Value Frame format CCS & CRC Tx / Rx Jitter source Rx: Data (EUT set to Internal Clk) BER Pattern PRBS 2^15-1 Low pass filter 100 khz Test ranges Frequency Start Stop Step Tx Jitter Hz Hz 1 x F UIpp Rx Jitter (pp) Rx Jitter Limit Verdict Condition 1: High pass filter: 20 Hz UI pp 1.1 UI pp Condition 2: High pass filter: 400 Hz UI pp 110 mui pp Page 36 of 61
37 Project No.: TRFTTE Test specification: Return loss The return loss at the input port of the EUT with respect to the nominal input impedance of 120 ohm shall be greater than the limit values of table 9.4 1/26/ :21:44 PM Temperature: 25.3 C Air Pressure: 98.4 kpa Relative Humidity: 30.1 % Mains Power Supply: DC Measurement uncertainty Expanded uncertainty, k=2 (95% confidence): At stimulus level -10 to +6.5 dbv Return loss in the range 0 to 35 db, 100 Ohm interface Return loss in the range 0 to 35 db, 120 Ohm interface Return loss in the range 0 to 35 db, 75 Ohm interface ±0.35dB ±0.24dB ±0.54dB General parameters Parameter Digital Termination Stimulus level Value 120 ohm 6.50 dbv Test ranges Frequency Start Stop Step khz khz 1 x F khz khz 1 x F khz khz 1 x F khz khz 1 x F khz khz 1 x F 1.02 MHz 1.02 MHz 1 x F 2.05 MHz 2.05 MHz 1 x F 3.07 MHz 3.07 MHz 1 x F Page 37 of 61
38 Project No.: TRFTTE Test specification: Return loss The return loss at the input port of the EUT with respect to the nominal input impedance of 120 ohm shall be greater than the limit values of table 9.4 1/26/ :21:44 PM Temperature: 25.3 C Air Pressure: 98.4 kpa Relative Humidity: 30.1 % Mains Power Supply: DC Return loss Return loss (db) k 1.00 M Frequency (Hz) Limit Result Return loss Frequency Return loss Limit Verdict khz db 12 db khz db 12 db khz db 18 db khz db 18 db khz db 18 db 1.02 MHz db 18 db 2.05 MHz db 18 db 3.07 MHz db 14 db Page 38 of 61
39 Test specification: Immunity to attenuation and reflections Project No.: TRFTTE The IUT shall operate without errors, when its input port is subject to a -18 dbsx interfering signal combined with the nominal input signal with a cable attenuation of 0 to 6 db. 1/26/ :47:46 AM Temperature: 25.3 C Air Pressure: 98.4 kpa Relative Humidity: 30.1 % Mains Power Supply: DC Measurement uncertainty Expanded uncertainty, k=2 (95% confidence): Cable simulator accuracy: ±0.2 db Amplitude accuracy: ±1% General parameters Parameter Value Tx Clock source Internal Clk Line coding HDB3 Frame format CCS & CRC BER Pattern PRBS 2^15-1 Overall meas. time 60 s Line status history, E-bit alarms Line status history Alarms Limit Verdict Condition 1: Interfering clock offset: -50 ppm, Simulator amplitude: Max Level, Cable simulator: Off (0 db) Line Sync 0 0 Condition 2: Interfering clock offset: 0 ppm, Simulator amplitude: Max Level, Cable simulator: Off (0 db) Line Sync 0 0 Condition 3: Interfering clock offset: 50 ppm, Simulator amplitude: Max Level, Cable simulator: Off (0 db) Line Sync 0 0 Condition 4: Interfering clock offset: -50 ppm, Simulator amplitude: Min Level, Cable simulator: On (6 db) Line Sync 0 0 Condition 5: Interfering clock offset: 0 ppm, Simulator amplitude: Min Level, Cable simulator: On (6 db) Line Sync 0 0 Condition 6: Interfering clock offset: 50 ppm, Simulator amplitude: Min Level, Cable simulator: On (6 db) Line Sync 0 0 Page 39 of 61
40 Test specification: Jitter tolerance Project No.: TRFTTE To check the ability of IUT to tolerate on the 2048 kbit/s incoming signal a sinusoidal jitter/wander in accordance with subclause /26/2010 2:10:11 PM Temperature: 26.2 C Air Pressure: 98.8 kpa Relative Humidity: 29.9 % Mains Power Supply: DC Measurement uncertainty Expanded uncertainty, k=2 (95% confidence): Jitter measurement 1.6 UI range 2.5% ± 0.25UI 6.4 UI range 5.44 % ± 0.25 UI 12.8 UI range 6.35 % ± 0.25UI Jitter attenuation measurement Rx jitter > 0.5 UI 0.1 db Rx jitter UI 0.5dB Rx jitter UI 1dB Rx jitter UI 2.5dB General parameters Parameter Value Frame format CCS & CRC Line coding HDB3 Tx / Rx Jitter source Tx: Data / Rx: Data BER Pattern PRBS 2^15-1 Dwell time 10 s Test ranges Frequency Start Stop Step Tx Jitter Hz Hz 1 x F UIpp Hz Hz 1 x F UIpp Hz Hz 1 x F UIpp Hz Hz 1 x F UIpp Hz Hz 1 x F UIpp Hz Hz 1 x F UIpp 1.00 khz 1.00 khz 1 x F UIpp 2.00 khz 2.00 khz 1 x F UIpp 3.60 khz 3.60 khz 1 x F UIpp 4.00 khz 4.00 khz 1 x F UIpp 8.00 khz 8.00 khz 1 x F UIpp khz khz 1 x F UIpp khz khz 1 x F UIpp khz khz 1 x F UIpp khz khz 1 x F UIpp khz khz 1 x F UIpp Page 40 of 61
41 Test specification: Jitter tolerance Project No.: TRFTTE To check the ability of IUT to tolerate on the 2048 kbit/s incoming signal a sinusoidal jitter/wander in accordance with subclause /26/2010 2:10:11 PM Temperature: 26.2 C Air Pressure: 98.8 kpa Relative Humidity: 29.9 % Mains Power Supply: DC Tx Jitter, Line status history, Frame errors, CRC errors, E-bit alarms Jitter frequency, Hz Tx Jitter Line status history Frame errors CRC errors E-bit alarms Verdict Hz UIpp Line Sync Hz UIpp Line Sync Hz UIpp Line Sync Hz UIpp Line Sync Hz UIpp Line Sync Hz UIpp Line Sync khz UIpp Line Sync khz UIpp Line Sync khz UIpp Line Sync khz UIpp Line Sync khz UIpp Line Sync khz UIpp Line Sync khz UIpp Line Sync khz UIpp Line Sync khz UIpp Line Sync khz UIpp Line Sync Page 41 of 61
42 Project No.: TRFTTE Test specification: Tolerable longitudinal voltage (B.3.4) The receiver shall operate without errors with any valid input signal in the presence of a longitudinal voltage of 2 Vrms over the frequency range 10 Hz to 150 khz. 1/27/2010 9:29:13 AM Temperature: 25.3 C Air Pressure: kpa Relative Humidity: 28.1 % Mains Power Supply: DC Measurement uncertainty Expanded uncertainty, k=2 (95% confidence): Amplitude accuracy (in the 1.5 to 2.5 Vrms range ) ± 3% General parameters Parameter Value Line coding HDB3 Frame format CCS & CRC Stimulus Level 2.00 Vrms BER Pattern PRBS 2^15-1 Test ranges Frequency Start Stop Step Hz Hz 0.00 Hz Hz Hz 0.00 Hz Hz Hz 0.00 Hz Hz Hz 0.00 Hz Hz Hz 0.00 Hz Hz Hz 0.00 Hz Hz Hz 0.00 Hz 1.00 khz 1.00 khz 0.00 Hz 2.00 khz 2.00 khz 0.00 Hz 4.00 khz 4.00 khz 0.00 Hz 8.00 khz 8.00 khz 0.00 Hz khz khz 0.00 Hz khz khz 0.00 Hz khz khz 0.00 Hz khz khz 0.00 Hz khz khz 0.00 Hz Line status history, Frame errors, E-bit alarms, RAI, CRC errors Frequency Line status history Frame errors E-bit alarms A-bit alarms CRC errors Limit Verdict Hz Line Sync Hz Line Sync Hz Line Sync Page 42 of 61
43 Test specification: Tolerable longitudinal voltage (B.3.4) The receiver shall operate without errors with any valid input signal in the presence of a longitudinal voltage of 2 Vrms over the frequency range 10 Hz to 150 khz. 1/27/2010 9:29:13 AM Project No.: TRFTTE Temperature: 25.3 C Air Pressure: kpa Relative Humidity: 28.1 % Mains Power Supply: DC Frequency Line status history Frame errors E-bit alarms A-bit alarms CRC errors Limit Verdict Hz Line Sync Hz Line Sync Hz Line Sync Hz Line Sync khz Line Sync khz Line Sync khz Line Sync khz Line Sync khz Line Sync khz Line Sync khz Line Sync khz Line Sync khz Line Sync Page 43 of 61
44 Project No.: TRFTTE Test specification: Impedance towards ground The impedance towards ground of the receiver input shall be greater than the limit 1/26/ :21:11 PM Temperature: 25.3 C Air Pressure: 98.4 kpa Relative Humidity: 30.1 % Mains Power Supply: DC Measurement uncertainty Expanded uncertainty, k=2 (95% confidence): Impedance Towards Ground with Stimulus level VRms, Frequency Range 10 Hz - 1 MHz ±3.6% General parameters Parameter Stimulus Level Value 2.00 Vrms Test ranges Frequency Start Stop Step Hz Hz 1 x F Hz Hz 1 x F Hz Hz 1 x F Hz Hz 1 x F Hz Hz 1 x F Hz Hz 1 x F Hz Hz 1 x F Hz Hz 1 x F 1.50 khz 1.50 khz 1 x F 3.10 khz 3.10 khz 1 x F 6.30 khz 6.30 khz 1 x F khz khz 1 x F khz khz 1 x F khz khz 1 x F khz khz 1 x F khz khz 1 x F khz khz 1 x F khz khz 1 x F khz khz 1 x F khz khz 1 x F khz khz 1 x F khz khz 1 x F 1.00 MHz 1.00 MHz 1 x F Page 44 of 61
45 Project No.: TRFTTE Test specification: Impedance towards ground The impedance towards ground of the receiver input shall be greater than the limit 1/26/ :21:11 PM Temperature: 25.3 C Air Pressure: 98.4 kpa Relative Humidity: 30.1 % Mains Power Supply: DC k Impedance k Impedance (Ohm) k k k k k k k 1.00 M Limit Result Frequency (Hz) Impedance Frequency Impedance Limit Verdict Hz kohm 1 kohm Hz kohm 1 kohm Hz kohm 1 kohm Hz kohm 1 kohm Hz kohm 1 kohm Hz kohm 1 kohm Hz kohm 1 kohm Hz kohm 1 kohm 1.50 khz kohm 1 kohm 3.10 khz kohm 1 kohm 6.30 khz kohm 1 kohm khz kohm 1 kohm khz kohm 1 kohm khz kohm 1 kohm khz 9.76 kohm 1 kohm khz 5.19 kohm 1 kohm khz 3.54 kohm 1 kohm khz 2.50 kohm 1 kohm khz 1.78 kohm 1 kohm khz 1.58 kohm 1 kohm Page 45 of 61
Jason Nixon, Telecom Specialist
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