SKiiP 3 Testing of SKiiP modules is service department Joachim Lamp, Semikron Elektronik GmbH & Co. KG
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1 SKiiP 3 Testing of SKiiP modules is service department Joachim Lamp, Semikron Elektronik GmbH & Co. KG
2 The SKiiP module 3 in 1 Cooling Power section + Sensors Gate driver + protection
3 The SKiiP module - Pressure Technology Mounting Screws G/E Springs Pressure part with steel inlay Spring Pad Driver PCB Current sensor AC/ DC - Terminal Isolation foil Bridge element Case DCB Thermal Paste Heatsink
4 The SKiiP module - SKiiP types 2GB SKiiP1203GB123 4GB SKiiP2403GB123 GD SKiiP603GD123 3GB SKiiP1803GB123
5 The SKiiP module - Driver board Driver features Two isolated output stages for driving TOP and BOT IGBT AC Current sensing including over current trip DC voltage measurement including over voltage trip (min 900V) Temperature measurement including temperature trip (115 C DCB) Supply voltage monitoring IGBT desaturation monitoring Interlock logic (high / low side IGBT) Dead time generation (3,3µs) Short pulse suppression (750ns)
6 The SKiiP module - Driver board t TD = Dead time, t d(on/off)io = Driver input output propagation delay time Pulse pattern - Dead time generation The propagation delay of the driver is the sum of interlock dead time (t TD ) and driver Input output signal propagation delay of the driver (t d(on/off)io ) Signal Logic behavior for both input pulses in ON state. The interlock circuit prevents that the TOP and the BOT IGBT of one half bridge are switched on at the same time
7 The SKiiP module - Driver board Error management Any error condition will cause the error signal to go to high on the open collector output. Error type Failure causes Trip levels 1700 / 1200 Over current protection (OCP) Temperature protection Load short circuit Too high load Too high load Not efficient cooling GD = 625A / 750A 2GB = 1250A / 1500A, 3GB = 1875A / 2250A, 4GB = 2500A / 3000A Corresponds to 10V on pin C Corresponds to 10V on pin 14 DC-link overvoltage protection VCE protection Surge currents from rotor in case of grid short circuit Load or grid switch off Unstable operation Terminal short circuit. IGBT defect, end of life Driver board malfunction. 1200V (1300V) / Min 900V Corresponds to 9V on pin 14 ERROR (pin 2) and TEMP ERROR (pin3) are set. VCE=7V Internal supply voltage error Too low input voltage Driver defect components <13V
8 Testing of SKiiP modules in service 1. Test of power part with digital volt meter in diode mode (DVM) Goal: Detection of defect on power part (short circuit, burned chips) Good criteria: All voltages within specified range and low differences between halfbridges. Limitation of this test method: The internal power supply of the DVM is used for the test which has only battery voltage and milliampere for forward current. So this test shows not that the SKiiP has the full blocking capability and that the diodes are o.k. But a short circuit can clear be detected. Measured value depends on the type of the used DVM 2. Test of driver input current and error LED with SKiiP test box Goal: Detection of IGBT defects and driver board errors which causes too high input current Good criteria: Input current in specified range and no switching and switching. Green error signal. Limit of this test method: Driver sensing failures can not be detected. From experiences we know that this test method detects failures in more than 90% of the cases. Failures in driver sensing circuit or sporadic failures can not be detected in this test. This has to be done in SKiiP test facility at Semikron. Failures in power part can not be detected if just some bond wires of diodes are burned. But these are seldom cases. J. 28. Jan 2010
9 1. Test of power part with digital volt meter in diode mode (DVM) 1.1 Test of TOP and BOT diode forward voltage of each halfbridge Good: Voltage between 0,200 to 0,400V. Low variation of voltage between halfbridges of the same switch (<0,05mV) DC+ Driver board COM TOP + V Good: 0.200V to 0.400V AC Fail: 0V BOT DC - DC+ Driver board TOP AC COM + BOT V Good: 0.200V to 0.400V Fail: 0V DC -
10 1. Test of power part with digital volt meter in diode mode (DVM) 1.2 Test of TOP and BOT switch blocking capability of each halfbridge Good: OL (overload, that means that the switch blocks the voltage from the DVM) Driver board DC+ + TOP COM AC V Good: OL Fail: 0V BOT DC - DC+ Driver board TOP AC + COM BOT V Good: OL Fail: 0V DC -
11 The Billmann SKiiP test box Developed and produced by Ing. Büro M.Billmann, Lerchensteige Emskirchen, The functionality is described in the manual L23005_SKiiP- Tester_Bed_Anleitung_v1.10_eng_oce Designed for all standard SKiiP modules. Has therefore different interfaces (GB=14pol, GH=20pol and GD=26pol flatwire) as well as fiber optic. Test functions Supply current measurement via 0,1Ohm resistor in suppply path. 10mV correspond to 100mA 10KHz generator for input signals Measurement of analogue values Internal current source of 1,3A for measuring of diode forward voltage and IGBT saturation voltage. Voltage generator of 170V to measure blocking capability. Semikron recommends to use only the supply current measurement because this values are specified in the data sheet and reproducible. The diode forward voltage and IGBT saturation voltage measurement at 1,3A is not specified in the data sheet.
12 2. Test of driver input current and error LED with SKiiP test box 2.1 Test setup SKiiP tester connected to SKiiP via D-SUB -> 14pol flat wire adapter Digital volt meter (DVM) connected to SKiiP test box via special cable
13 2.2 Setting of SKiiP test box and DVM Set DVM to mv range Read value: Good <1mV Supply select off Supply monitor signal path Primary side Six switches HB1, HB2, HB3 24V I_supply off Primary signals All upper position
14 2.2.1 Input current test at no switching Set Supply select switch to +24V Check: LED TEMP and HB1 are green. Read DVM value Input current test at switching > Press botton A, applies 10kHz to TOP Read DVM value > Press botton B, applies 10kHz to TOP Read DVM value > Set Supply select switch to off
15 Input current caules for different SKiiP types with Billmann SKiiP Tester Values in ma. No data sheet values. The table shown Semikron experiences values with this tester including margin. Reading of DVM is one tenth of these values because of the used 0,1Ohm shunt resistor for measurements. 1200V SKiiP 603GB123 GD 613GB GB123 2-fold 1213GB GB123 3-fold 1813GB GB123 4-fold 2403GB123 No switching (2.2.1) Switching (2.2.2) Min Max Min Max V SKiiP 603GB173 GD 513GB GB173 2-fold 1013GB GB173 3-fold 1513GB GB173 4-fold 2403GB173 No switching (2.2.1) Switching (2.2.2) Min Max Min Max
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How to use a SKiiP - Tester Application note Bild 1: Bedienungsanleitung Application - how to use type: L23005 version: 1.1_eng document: 1.1 date: 30.08.2013 Ing. Büro M.Billmann 08/2013 Lerchensteige
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