Stop Worrying About Interferences With These ICP-OES Solutions
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1 ASTS 2013 Agilent Science & Technology Symposium Stop Worrying About Interferences With These ICP-OES Solutions Steve Wall Agilent Technologies Page 1
2 Agilent ICP-OES The world's most productive high performance simultaneous ICP-OES Continuous wavelength coverage provides extended dynamic range and reduced interferences, giving you maximum confidence in your results Robust plasma ensures reliable and reproducible results even with the most complex matrices One view, one step measurement of major, minor, and trace elements, plus the fastest warm-up, increases throughput and productivity Unique FBC (fitted background correction) simplifies method development by eliminating correction point selection Page 2
3 Agilent ICP-OES - Computer-optimized echelle optical and detector design Thermostatted to 35 o C for stability and fast start-up All wavelengths captured in one reading Fewer optical components High light throughput Excellent signal-to-noise Thermostatted to -35 o C for low noise Adaptive Integration Technology (AIT) Provides true simultaneous measurement All wavelengths irrespective of signal intensity Background signal and internal standards Page 3 USP Webinar Dec. 08, 2010
4 % Recovery of CCV ICP-OES Long Term Stability Continuing Calibration Verification (CCV) Time (Hours) Ag Al As Ba Be Ca Cd Co Cr Cu Fe K M g M n Na Ni Pb Sb Se Tl V Zn Lower limit Upper limit Long-term precision (RSD): 0.98% MAX Page 4 USP Webinar Dec. 08, 2010
5 700-ES Interference Avoidance and Removal Tools Wavelength Database Confirmation and Qualifier Wavelengths Hidden Wavelengths Semi Quant Echellogram (720 and 725-ES) Fitted Background Correction (FBC) FACT Spectral Deconvolution Optimization Strategy Page 5
6 700-ES Interference Avoidance and Removal Tools Wavelength Database Confirmation and Qualifier Wavelengths Hidden Wavelengths Semi Quant Echellogram (720 and 725-ES) Fitted Background Correction (FBC) FACT Spectral Deconvolution Optimization Strategy Page 6
7 Wavelength Database Wavelength database: - Access to all wavelengths. Potential interferences have been identified and appear in this database. - Choose wavelengths based on freedom from interferences as well as required sensitivity. - Helps to know what elements are present in your sample, although this is often not the case! - Wavelengths are ranked as most commonly used Page 7
8 Wavelength Database Page 8
9 700-ES Interference Avoidance and Removal Tools Wavelength Database Confirmation and Qualifier Wavelengths Hidden Wavelengths Semi Quant Echellogram (720 and 725-ES) Fitted Background Correction (FBC) FACT Spectral Deconvolution Optimization Strategy Page 9
10 Confirmation and Qualifier Wavelengths
11 Confirmation and Qualifier Wavelengths Element Result Element Result Er P Er P Fe Si Fe Si Mn Sn Mn Sn Ni Sr Ni Sr
12 Confirmation and Qualifier Wavelengths Table shows likely cause is Fe overlap Make use of interference free wavelength If no alternate line, use FACT modeling 12
13 700-ES Interference Avoidance and Removal Tools Wavelength Database Confirmation and Qualifier Wavelengths Hidden Wavelengths Semi Quant Echellogram (720 and 725-ES) Fitted Background Correction (FBC) FACT Spectral Deconvolution Optimization Strategy Page 13
14 Hidden Wavelengths
15 Hidden Wavelengths
16 Hidden Wavelengths
17 700-ES Interference Avoidance and Removal Tools Wavelength Database Confirmation and Qualifier Wavelengths Hidden Wavelengths Semi Quant Echellogram (720 and 725-ES) Fitted Background Correction (FBC) FACT Spectral Deconvolution Optimization Strategy Page 17
18 Method Editor for Semi Quant Method
19 700-ES Interference Avoidance and Removal Tools Wavelength Database Confirmation and Qualifier Wavelengths Hidden Wavelengths Semi Quant Echellogram (720 and 725-ES) Fitted Background Correction (FBC) FACT Spectral Deconvolution Optimization Strategy Page 19
20 Echellogram Multi Element Solution
21 Echellogram Blank
22 Echellogram Multi-Element Solution - Blank
23 700-ES Interference Avoidance and Removal Tools Wavelength Database Confirmation and Qualifier Wavelengths Hidden Wavelengths Semi Quant Echellogram (720 and 725-ES) Fitted Background Correction (FBC) FACT Spectral Deconvolution Optimization Strategy Page 23
24 Background Correction Options Off Peak, Manually Selected Correction Points FBC Fitted Background Correction FACT (Fast Automated Curve-Fitting Technique)
25 25 FBC (Fitted Background Correction) Improved accuracy Requires no user input Truly simultaneous correction Peak shaped functions applied to the analyte peak Pb 220 with 1000ppm Mo Polynomial Interpolation of background signal Only Agilent offers Fitted Background Correction!
26 700-ES Interference Avoidance and Removal Tools Wavelength Database Confirmation and Qualifier Wavelengths Hidden Wavelengths Semi Quant Echellogram (720 and 725-ES) Fitted Background Correction (FBC) FACT Spectral Deconvolution Optimization Strategy Page 26
27 FACT (Fast Automated Curve-fitting Technique) 27 Resolves extremely complex spectral interferences Gives access to extra wavelengths for improved validation Allows resolution of interferences as close as 3 pm Peak modeling approach - Uses spectral data from analyte and interference standards to de-convolve the analyte peak from nearby interference peaks
28 700-ES Interference Avoidance and Removal Tools Wavelength Database Confirmation and Qualifier Wavelengths Hidden Wavelengths Semi Quant Echellogram (720 and 725-ES) Fitted Background Correction (FBC) FACT Spectral Deconvolution Optimization Strategy Page 28
29 Optimization Strategy Condition Set A Low Power, High Neb Flow, Low viewing height Condition Set B High Power, Low Neb Flow, Mid viewing height Page 22
30 Optimization Strategy: AutoMax Choice of three different optimization criteria Signal to Background Ratio (SBR), Intensity, Signal to Root Background ratio (SRBR). Optimize all or sub-set of 30
31 Agilent s Atomic Spectroscopy Portfolio ICP-OES ICP-MS ICP-QQQ Flame AAS Graphite Furnace AAS 4100 MP-AES AAS instruments can be flame only, furnace only, or combined (switchable) Page 31
32 Page 32
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