CTP3110 Universal Tester

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1 CTP3110 Universal Tester Flexible expansion capability and leading test efficiency Datang LinkTester Technology Co., Ltd. Page 1 of 20

2 1. Overview Manual of CTP3110 Universal Tester CTP3110 Universal Tester is a powerful instrument that can accurately measure the radio frequency (RF) of multi-mode terminals. Highly scalable, fast, accurate and stable, its integrated system architecture features communication protocol simulator, signal generator and spectrum analyzer. The tester is widely used in calibration and test during terminal manufacturing, terminal and chip R&D /design, as well as terminal RF conformance test. It greatly reduces test costs by improving test efficiency. 2. Main Features A scalable and universal platform supporting multi-standard communication systems The Datang LinkTester s proprietary PCI-E architecture platform is what enables its industry-leading scalability. With customized software and hardware configuration, CTP3110 can measure the specifications of transmitter and receiver of radio terminals such as TD-LTE, LTE FDD, TD-SCDMA/HSDPA, GSM/EDGE and WCDMA. Dual-channel parallel testing It achieves higher test efficiency and incurs lower manufacturing test costs by enabling dual GPIB/LAN remote control automatic testing and parallel testing, each channel being tested independently. Due to its unique dual-port design, the single-channel model can be easily upgraded to dual-channel by incorporating a simple board-card. Page 2 of 20

3 T+G dual-channel parallel test LTE system simulator The abundant physical layer parameter configuration interfaces and high speed data transmission testing enables the user to simulate actual environments for terminal performance tests. It can simulate different protocol requirements. Wide inter-cell switching tests CTP3110 utilizes a medium-frequency broadband control board to achieve a one-time simple frequency-sweep broadband measurement; the LTE/EUTRAN technology is capable of processing transmission bandwidth of up to 20MHz. It can run simultaneously on dual cells, enabling re-selection and switching between LTE and LTE cells. The updated version will allow switching between LTE and 3G/2G cells (to be released soon). Optional analysis and automation software GTP software for RF automatic tests MONITOR software for network parameter detection and analysis Page 3 of 20

4 Quick measurement characteristic The tester supports fast calibration, non-signaling integrated tests and fast combined tests, reducing test times significantly while improving manufacturing efficiency. Combined test of measurement items GPIB/LAN remote control CTP3110 supports a standard GPIB/LAN bus control interface and has two independent GPIB ports, consequently enabling the incorporation of a fully automatic testing platform and testing system. Separate transmission and reception RF channels The tester supports separate transmission/reception RF channels. so that the user is able to make independent configurations of uplink frequencies, downlink frequencies as well as gains. This kind of flexibility facilitates the setup of RF conformance-test system, while supporting both FDD and TDD standards. Page 4 of 20

5 3. Main functions Manual of CTP3110 Universal Tester Multi-mode wireless communication test system The CTP3110 integrated terminal tester supports multi-mode wireless communication testing for TD-LTE, LTE FDD, TD-SCDMA/HSDPA, GSM/EDGE and WCDMA. LTE test The tester meets the LTE UE testing requirements described in 3GPP TS It also supports both throughput and video-on-demand (VOD) functions. This equipment can also check the specifications of the transmitter: maximum output power, minimum output power, absolute power control tolerance, relative power control tolerance, aggregate power control tolerance, transmitter ON/OFF time mask, physical random access channel (PRACH) ON/OFF time mask, SRS ON/OFF time mask, occupied bandwidth (OBW), spectrum emission mask (SEM), adjacent channel leakage ratio (ACLR) and /signal quality. LTE transmitter specification test: the PRACH ON/OFF time mask Receiver specification testing for reference sensitivity, maximum input level, adjacent channel selectivity, in-band blocking and narrow band blocking. TD-SCDMA/HSDPA testing Page 5 of 20

6 The tester meets the TD-SCDMA UE testing requirements described within 3GPP TS It can simulate the TD-SCDMA communication system protocol stack function. This equipment can also check the specifications of the transmitter: maximum power, minimum power, closed loop power control, open loop power control, transmitter off power, ON/OFF time mask, out-of-synchronization handling, occupied bandwidth (OBW), spectrum emission mask (SEM), adjacent channel leakage ratio (ACLR), error vector magnitude (EVM) and peak code domain error (PCDE). TD-SCDMA transmitter specification test: ACLR Testing of transmitter specifications: reference sensitivity level, maximum input level, HS-DSCK throughput, CQI reporting, HS-SCCH detection performance. WCDMA testing The equipment meets the testing requirements for WCDMA specified in the 3GPP TS protocol. terminals as This equipment can perform the following WCDMA performance testing items: maximum power, minimum power, inner loop power control, time mask, frequency error, occupied bandwidth (OBW), spectrum emission masking (SEM), adjacent channel leakage ratio (ACLR), error vector magnitude (EVM), peak code domain error (PCDE) and reference sensitivity Page 6 of 20

7 WCDMA transmitter specification test: ACLR (Adjacent Channel Leakage Ratio) GSM/GPRS/EGPRS testing The tester meets GSM/GPRS/EGPRS terminals/ue testing requirements described in 3GPP TS protocol. GSM testing items include: transmitter output power, time mask, phase error, frequency error, Modulation Accuracy, RF modulation spectrum, RF switching spectrum and reference sensitivity Page 7 of 20

8 GSM transmitter specification test: modulation spectrum and switching spectrum GPRS/EGPRS performance testing for Transmitter output power, error vector magnitude (EVM), RF modulation spectrum, RF switching spectrum, origin offset and I/Q error. EDGE specification test: EDGE Analysis Page 8 of 20

9 Stable and efficient production testing Manual of CTP3110 Universal Tester Dual-channels for testing two terminals simultaneously, thereby reducing production costs and saving time/manpower. Support one-stop calibration and testing, enabling the calibration and testing of a multi-mode and multi-frequency improving production efficiency. Capable of setting up a fully automated remote testing platform and testing system via standard GPIB and LAN bus control interfaces, thereby facilitating batch production. Guarantee stable and consistent testing of production processes over extended period of time, ensuring a high First Pass Yield(FPY). LTE system simulator Wide-variety of physical layer configuration options are available: support for TM1~TM8, support for various types of transmitters, open loop and closed loop MIMO, switching inter-mimo switching, all downlink resource distribution modes (type 0 ~ type 2), a-periodic CQI reporting, ACK multiplexing feedback test, hybrid automatic repeat request (HARQ) and adaptive modulation and coding ( AMC). Support for fading channel, including additional AWGN multipath fading channel simulation and OTA test. Access control: support for authentication requests, GUTI distribution, encryption and protection of signals and data. Mobility management: support for mobile timer management, attachment and detachment, tracking area updates (TAU),handover and service request function (SRF). Session management: support for establishing, modifying and releasing EPS bearers, releasing and establishing the access-side bearers. Testing of communication data packet transmission This equipment supports the testing of data packet transmission taking place between UE and the integrated terminal tester. Here are a couple of examples: - test of LTE-compliant end-to-end IP data transmission up to 110Mbps - lower-layer data transmission (150Mbps and above) - HD VOD service (1080P). Page 9 of 20

10 网线 Server Server IP: Subnet Mask: Default Getway: Client IP: Client PC 射频线 终端数据线 UE Call processing Data transmission service testing The call processing function can be used for various connection tests, such as registration, MOC, MTC, handover and hang up. Additionally, the loopback of a mobile terminal voice is used for AMR tests. 4. CTP3110 Performance Indexes Basic parameters Frequency scope: 700MHz~2700MHz Max. input level: +33dBm CTP3110 universal specifications Main inputs and outputs Impedance: 50Ω VSWR: 1.3 interface: N type(rf1 COM, RF2 COM, RF OUT) Reference oscillator Frequency:10 MHz Page 10 of 20

11 Electric level: TTL Starting characteristic: ± e-9/sec (heating for 60 minutes at ambient temperature) Aging rate: ±0.3 10e-9/day, ±50 10e-9/a (15 years) Temperature characteristic: ±3 10e-9 (-10 ~70, reference 25 ) Interface: BNC type External reference input Frequency: 10 MHz Impedance: 50 Ω Interface: BNC type Interface: RF1 COM,RF2 COM Frequency Frequency range:700mhz~2700 MHz Input level Level scope:-65~+33dbm CTP3110 RF input specifications Resolution: 0.1 db Accuracy: ±0.5dB (-65~+33dBm) Local oscillator phase noise Output MHz Output MHz Output MHz Output MHz Output MHz Interface: RF1 COM, RF2 COM, RF OUT CTP3110 RF output specifications Frequency Frequency scope: 700MHz~2700MHz Output level Page 11 of 20

12 Level scope: -120dBm~-5dBm (RF1 COM, RF2 COM), -120dBm~ 0dBm (RF OUT) Accuracy: ±0.5dB (-120dBm~0dBm) Signal purity Anharmonic wave stray: -50dBc Harmonic quantity: -40dBc Adjacent channel suppression: -55dBc Non-adjacent channel suppression: -60dBc EVM: <1.5% Local oscillator phase noise Output MHz Output MHz Output MHz Output MHz Output MHz Power supply Power Consumption Dimensions and weight Other Environment conditions 100~120VAC/200~240VAC, 50~60 Hz 120W 426(W) 177(H) 437(D)mm, (not including projecting part) Weight: 15kg Display: 8.4 TFT-LCD, 170.4mm 127.8mm (8.4 ), 262k (6bit/color), 16.7M (8bit/color) GPIB: controlled by an external host, no external equipment control function Working temperature and humidity: 0 ~+40, 95% (no condensation) Storage temperature and humidity: -20 ~+60, 95% ( no condensation) Interface unit Page 12 of 20

13 Schematic diagram of front panel NO. Name Function Operation keys 1 PRST key PRESET function, SS software reset, initiate initialization configuration 2 HELP key Activate help file 3 PRINT key Take a screenshot of the current testing interface and save it to a specified folder 4 SETUP key Setup of system functions 5 LOCAL key Switch between remote control and manual control 6 Power key Turn the tester ON/OFF 7 Bottom function key Expand the function menu displayed at the bottom of the screen 8 Switch key Switch between Windows operation system interface and SS interface 9 Right-side function key 10 Digital and cursor zone 11 Window control zone Expand the function menu displayed on the right side of the screen Set parameters and move the cursor Activate window control operation 12 Common function Test commonly-used functional operations Page 13 of 20

14 key External interface 13 LAN interface Connect the CTP3110 and outside network 14 USB interface Connect a USB device 15 Audio interface Audio input and output interface 16 RF interface RF 1 COM, RF 2 COM and RF 1 OUT Interface Status indicators 17 Indicator of instrument status 18 Indicator of RF channel status Indicate instrument operation status Indicate RF channel status Schematic diagram of rear panel No. Name Function 19 Reference signal input and output port 10MHz and 5ms input and output port, BNC interface 20 Power supply port AC power access port and switching 21 GPIB Interface For the remote control of CTP Grounding screw Grounding protection 23 PCI-E interface IQ data output 24 LAN interface Connecting the CTP3110 with an external network 25 USB interface Connecting a USB device Page 14 of 20

15 26 VGA interface Connecting an external display device 27 RS232 interface For data packet communication testing 5. Testing Items LTE testing items Measurement type No. in 3GPP TS Measurement item UE maximum power output Maximum power back-off Extra maximum power back-off Configuration of UE output power Minimum output power Absolute power control tolerance Relative power control tolerance Integrated power control tolerance Transmitter ON/OFF time mask Transmitter specification measurement PRACH ON/OFF time mask SRS ON/OFF time mask Frequency error Error vector magnitude Carrier leak In-band emission of any undistributed resource blocks EVM equalizer spectrum flatness Occupied bandwidth Spectrum emission mask Extra spectrum emission mask Adjacent channel leakage ratio Transmitter specification 7.3 Reference sensitivity 7.4 Maximum Input level Page 15 of 20

16 measurement 7.5 Adjacent channel selectivity In-band blocking Narrow band blocking TD-SCDMA testing items Measurement type No. in 3GPP TS Measurement item 5.2 UE maximum output power 5.3 UE frequency stability Open loop power control Closed loop power control Minimum output power Transmitter off power Transmit ON/OFF time mask Transmitter specification measurement Out-of-synchronization handling of output power for continuous transmission Out-of-synchronization handling of output power for discontinuous transmission Occupied bandwidth Spectrum emission mask Adjacent channel leakage ratio Error vector magnitude A Measurement of error vector magnitude for E-DCH16QAM Peak code domain error 6.2 Reference sensitivity Receiver specification measurement 6.3 Maximum input level 6.3A HS-PDSCH maximum input level (16QAM) 6.3B HS-PDSCH maximum input level (64QAM) Measurement of HS-DSCH throughput on the fixed reference channel Page 16 of 20

17 9.3.2 Measurement of HS-DSCH throughput on the variable reference channel Measurement of CQI reporting Measurement of HS-SCCH channel detection performance WCDMA testing items Measurement type No. in 3GPP TS Measurement item 5.2 Maximum output power 5.3 Frequency error Uplink inner loop power control Minimum output power Transmitter specification measurement Transmit ON/OFF time mask 5.8 Occupied bandwidth 5.9 Spectrum emission mask 5.10 Adjacent channel leakage ratio Error vector magnitude Peak code domain error Receiver specification measurement 6.2 Reference sensitivity GGE testing items Measurement type System No. in 3GPP TS Measurement item Transmitter specification measurement GSM 13.3 Transmission power 13.3 Time mask 13.1 RMS phase error 13.1 Maximum phase error 13.1 Frequency error 13.4 RF modulation spectrum Page 17 of 20

18 13.4 RF switching spectrum Transmission power Time mask RMS error vector magnitude Peak error vector magnitude EDGE % Error vector magnitude Origin offset Frequency error RF modulation spectrum RF switching spectrum Receiver specification measurement GSM 14.2 Reference sensitivity 6. Ordering Information No. Item Unit Required 1 Hardware Required hardware CTP_H001 Master control hardware platform Unit CTP_H002 RF transmission/reception handling module Set CTP_A001 Standard accessory material package Set Optional hardware CTP_H003 Dual-channel option Set CTP_H004 TD-SCDMA measurement hardware Set CTP_H005 GSM measurement hardware Set CTP_H006 WCDMA measurement hardware Set CTP_H007 LTE measurement hardware Set CTP_A002 Extended accessory material package Set 2 Software Required software CTP_S001 Master control software platform Set Optional software Options for basic performance testing CTP_TS001 TD-SCDMA RF transmission/reception Set CTP_GS001 GSM RF transmission/reception measurement Set CTP_GS002 EDGE RF transmission/reception measurement Set CTP_WS001 WCDMA RF transmission/reception Set CTP_LS001 TD-LTE RF transmission/reception measurement Set CTP_LS101 LTE FDD RF transmission/reception Set Options for extended performance testing CTP_TS002 TD-SCDMA dual-port toolkit Set CTP_TS003 TD-SCDMA rapid calibration software Set CTP_TS004 TD-SCDMA non-signaling integrated testing Set Page 18 of 20

19 CTP_TS005 TD-SCDMA HSDPA measurement software Set CTP_GS003 GSM dual-port toolkit Set CTP_GS004 GSM rapid calibration software Set CTP_GS005 GSM non-signaling integrated testing software Set CTP_WS002 WCDMA dual-port toolkit Set CTP_WS003 WCDMA rapid calibration software Set CTP_WS004 WCDMA non-signaling integrated testing Set CTP_WS005 WCDMA HSDPA measurement software Set CTP_LS002 TD-LTE dual-port toolkit Set CTP_LS003 TD-LTE rapid calibration software Set CTP_LS004 TD-LTE non-signaling integrated testing software Set CTP_LS102 LTE FDD dual-port toolkit Set CTP_LS103 LTE FDD rapid calibration software Set CTP_LS104 LTE FDD non-signaling integrated testing Set Options for professional testing CTP_LS005 Testing software for LTE inter-cell switching and Set CTP_LS006 TD-LTE IP data transmission testing software Set CTP_LS007 TD-LTE MIMO2 2 DL testing software Set CTP_LS008 TD-LTE FADDING channel simulator software Set CTP_LS105 LTE FDD IP data transmission testing software Set CTP_LS106 LTE FDD MIMO2 2 DL testing software Set CTP_LS107 LTE FDD FADDING channel simulator Set Testing tool software CTP_S002 Automatic test platform software (GTP) Set CTP_S003 MONITOR software Set 3 Service CTP_E001 Warranty service Set CTP_E002 Calibration service Set 7. Service A comprehensive pre-sales product demonstration plan Strict and reliable equipment delivery processes and technical support Flexible and exemplary post-sales service: various types of 24X7 technical support ( , phone and site support) Regular follow-up visits Datang LinkTester Technology Co., Ltd. Address: 3F Innov Mansion Tower A, No. 12, Xueyuan South Road, Haidian District, Beijing, China (100082) Tel.: Fax: Website: Page 19 of 20

20 South China office room A02,W2-A 4th floor, High-tech Industrial Park, Nanshan District, Shenzhen, China ( ) Tel: Tel: East China office 601-2, Dongkehuayuan, Zhangyang Road, Pudong New District, Shanghai, China Tel: Page 20 of 20

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