Preliminary. PXI PRELIMINARY 3041 Small Cell RF Tester Data Sheet. The most important thing we build is trust. Test up to 4 small cells in parallel

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1 PXI PRELIMINARY 3041 Small Cell RF Tester Data Sheet The most important thing we build is trust Turnkey production ATE solution for testing Small Cell base stations Automated Tx and Rx RF alignment and verification measurements Multiple Communications standards o Introduction LTE-A, UMTS and WLAN Test up to 4 small cells in parallel Industry leading measurement speed Supplied with a software Toolkit for Qualcomm FSM powered devices. Developing an in house ATE system for production is time consuming, costly and requires a high test engineering technical competency. Similarly, outsourcing such development to a 3rd party system integrator can be just as time consuming, costly and not without risk. In either case the through life technical support, adaptation and maintenance of custom solutions is very challenging and unless designed with care can result in premature obsolescence. What if a ready-made product was available that could not only accelerate time to volume, lower cost and eliminate risk but also be easily supported, maintained and adapted to serve for future needs? At Cobham Wireless we have a long standing tradition of delivering production ATE equipment and solutions to our customers. We recognise the combined challenges of ever increasing product complexity, acute commercial pressures and maintaining test engineering competencies are the key issues faced by our customers and addressing them demands a solutions oriented approach. The experience has resulted in a portfolio of configurable hardware and software tools based on an industry standard PXI modular architecture that can be easily tailored to customer specific needs across a variety of markets and use cases. Cobham s 3041 Small Cell RF Tester is a prime example of our ability to deliver a well proven test solution designed specifically to address the needs of Small Cell manufacturers. The 3401 Small Cell RF Tester eliminates the need for costly and risky in house test system development and replaces it with a cost effective production ready solution, easily adapted to your specific needs and reducing your time to ramp to high volume.

2 To save test time and lower cost the solution is able to test multiple small cells in parallel. It does this through innovative software that manages the utilisation of the equipment to ensure the shortest test times. It performs accurate calibration and standards compliant RF performance verification of LTE, UMTS or WLAN transceivers and other RF broadcast receivers such as GPS or Network Listening receivers. It comes with a test sequencer fully integrated with device control for Qualcomm FSM99xx family of devices and can be easily expanded to support other silicon vendor devices. The solution uniquely achieves all this whilst retaining the inherent flexibility of its PXI modular architecture to expand test coverage beyond just the RF functionality. The critical difference is in Cobham s Software. The 3041 Small Cell RF Tester uses Cobham s PXI Maestro innovative test sequencing software; the ideal solution to accelerate test system development, reduce test time and so lower the cost of test. Reducing the cost of test Up to 400% productivity gains can be achieved with the 3041 Small Cell RF Tester used with PXI Maestro to test 4 devices in parallel. Test engineering costs are almost eliminated. Using Maestro software and Cobham s solutions expertise with the Small Cell RF Tester requires virtually no customer integration effort irrespective of whether it is incorporated within an existing production line or new installations. Reducing Integration Complexity Production test system engineers face a constant challenge posed by the ever increasing complexity of wireless mobile devices. Developing, adapting and optimising RF test systems is time consuming and requires highly skilled staff with detailed knowledge of their test tools and the communications control interface to third party chipset suppliers. PXI Maestro lowers test engineering complexity. It provides an optimised ATE solution ready for testing multi-standard devices. It simplifies the process of test system integration to accelerate new product introduction and help save cost. PXI Maestro provides the test engineer with a simple graphical user interface to generate and execute test plans. This UI permit users to make application changes without knowing anything about how to control instrumentation or the DUT. At runtime, all tester and device control commands are executed as an uninterrupted measurement sequence with no further user input. Measurement results are displayed as they are executed with a final test report available in a user friendly format. The effort to develop and maintain test system code is eliminated leading to much faster new product introduction cycles and test system optimisation. Fig 1. PXI Maestro Test Engineering User Interface example

3 Reducing Test Time Fig 2. PXI Maestro software high level architecture PXI Maestro uses innovative methods to reduce test time and so maximise production throughput. This is achieved by highly efficient test flow management. Inefficient test system development can too often lead to high value capital assets being unnecessarily idle for significant periods of time between successive test steps. PXI Maestro includes a multi-threaded intelligent sequencer designed to take full advantage of modern multi-core computers. This ensures different tasks within a measurement sequence or measurement step are overlapped or executed concurrently rather than sequentially as with conventional instrumentation. Where multiple RF measurements are required for a single test condition, PXI Maestro uses it s intelligence to perform them in parallel on the same captured data and hence save time. Acquiring a signal for measurement and processing results are decoupled which means signal captures can be queued for processing and thereby accelerate test time.

4 Testing devices in parallel Pre lim ina ry Testing multiple devices in parallel with a single tester is made easy with no reconfiguration or additional hardware or software elements. Solutions can be configured to test from 1 to 4 devices connected at the same time and tested synchronously. Synchronous testing can be used to gain even higher throughput benefits by enabling all devices to be tested concurrently. This is especially beneficial for time consuming receiver sensitivity test cases or where device initialisation times are long by comparison to measurement times. Figure 3. Parallel testing with 3041 and PXI Maestro Figure 4. Operator test result display when testing 4 devices

5 Efficient production process flow Pre lim ina ry Devices can also be tested in two groups of two with the first group undergoing test while the operator loads the second group into their fixtures. This approach can prove highly efficient especially where device handling times are a significant portion of the overall test cycle time as the handling time is effectively eliminated yet an even flow rate into and out of the test station is maintained. Figure 5. Eliminate device handling time by alternating between parallel testing of 2 groups of 2 devices. Figure 6. PXI Maestro configured for test execution of two groups of two devices tested in parallel Silicon Vendor Toolkits The Small Cell RF tester is supplied as standard with a software Toolkit for testing Qualcomm FSM powered devices. Toolkits supporting other device types are available on request. Platform Hardware Description The Small Cell RF Tester is a 4U high compact rack mountable instrument containing high performance RF instrumentation covering the entire frequency range 250 MHz to 6 GHz catering for all cellular and WLAN bands with the ability to test from one to four small cell radios connected simultaneously. The basic instrument provides an expansion capability to add 3 additional instrument cards. Cobham solutions can use these slots to expand system functionality according to specific customer needs.

6 3041 TECHNICAL SPECIFICATION 1 Specifications are defined following 30 minute warm up time (after PXI Maestro has booted all modules) and following the application of path loss correction data derived using PXI Maestro. Specifications are defined over the full operating temp range unless otherwise stated. Specifications are valid with the instrument fan speed set to high. Frequency Parameters Units Specification Frequency Range MHz 250 to 6000 Frequency Resolution Hz 1 Spectral Purity 2 20 khz offset < -99 below 3 GHz Internal Frequency Reference Parameters Units Specification Reference Clock MHz 10 Initial accuracy ppm +/- 0.2 Aging Rate ppm/yr +/- 1 Temperature Stability ppm +/- 1 Output Level V pk-pk in 50 ohms 1.65 Impedance ohms 50 nominal Coupling < -93 below 6 GHz 1 For full technical specifications refer to NI model 5646r VST specification available from and 3066 Multiway Active RF Combiner specification available from These specifications may be invalidated in cases where a customer supplied PXI instrument card is fitted to a vacant slot. Please check with Cobham sales. 2 Loop bandwidth low AC

7 RF Input 1 to 4 Parameters Units Specification Maximum Input Level 3 Applies when all active source paths set to same gain mode and all active receiver paths set to same gain mode. Only 1 DUT port active. Unused ports terminated in 50 ohms 4 Self Calibration C +/- 1 C measured relative to set reference >-30 dbm 5 Self Calibration C +/- 1 C reference level >-30 dbm 6 Self Calibration C +/- 1 C reference level >-30 dbm dbm VDC 34 (rms/cw), 38 (PEP) Input Level Range/Resolution db >60 with a nominal step size 1 Input Level Accuracy 3 db +/-0.7 db below 375 MHz 0 +/ db below 2 GHz +/- 0.7 db below 4 GHz +/- 0.9 db below 6 GHz Input Impedance ohms 50 (nominal) Input Return Loss db >20 below 3 GHz Isolation between DUT test ports 4 db >60 >19, (20 typ) above 3 GHz Frequency Response +/-0.5 db MHz 80, 200 (typ) Non Harmonic Spurious dbc Offset <100 khz, -55 typ Offset >100 khz, <3 GHz <-60, > 3 GHz <-55 Offset >1 MHz, <3 GHz <-75, >3 GHz <-70 LO Residual Power 5 dbr -65 (typ) below 2 GHz -60 (typ) below 3 GHz -56 (typ) above 3 GHz Residual Sideband Image 6 dbc -75 (typ) 500 MHz to 3 GHz -70 (typ) above 3 GHz

8 RF Output 1 to 4 Parameters Units Specification Maximum Output Level (CW) dbm 2 Level Resolution db Level Accuracy 8 (self calibration +/- 5 deg C) External Timebase Parameters Units Specification Frequency MHz 10 Accuracy ppm +/-10 Input Level V pk-pk in 50 ohm Square: 0.7 to 5.0 typ 7 CW, >-70 dbm Impedance ohm 50 nominal 8 Self Calibration o C +/- 1 o C measured relative to set reference >-30 dbm 9 Self Calibration o C +/- 1 o C reference level >-30 dbm db Port to Port Relative Level Accuracy 9 db +/-0.25 (typ) Port to Port Isolation db 60 Output Impedance ohm 50 <+/-0.7, (0.4 typ) below 375 MHz <+/-0.75, (0.4 typ) below 4 GHz <+/-1.0, (0.4 typ) below 6 GHz Output Return Loss db >20 below 3 GHz, >19 above 3 GHz, Non Harmonic Spurious dbc Offset <100 khz, -55 typ Harmonics 10 dbc <-26, (-28 typ) Offset >100 khz, <3 GHz <-62, >3 GHz <-57 Offset >1 MHz, <3 GHz <-75, >3 GHz <-70 <-26, (-31 typ) below 6GHz 0.5 db Frequency Response 11 MHz 80, (200 typ) Sine: 1.4 to 5.0 typ 10 CW, >-70 dbm 11 Operating temp range 18 to 28 degrees C and following PXI Maestro path loss calibration

9 General Parameters Units Specification Operating Voltage Range VAC 90 to 264 Operating frequency range Hz 47 to 63 PXI Module Power Consumption W <100 Total power available W 288 Dimensions HxWxD Weight kg <11 Cooling Operating Range Temperature 12 C 0 to 50 Operating Range Humidity (non % 10 to 90 condensing) 13 Storage 14 Range Temperature 12 IEC and IEC IEC and IEC IEC mm C -20 to x x Storage Range Humidity (non condensing) % 5% to 93% Shock 15 Vibration 16 Auto/High fan speed control 30 g peak half sine, 11 ms pulse Non Operating 5 Hz to 500 Hz 2.4grms EMC EN , Safety Calibration Interval EN , LVD 2006/95/EC 12 months 24 months, add 0.2 db uncertainty to level accuracy and frequency response.

10 Measurements LTE Tx Measurements Per 3GPP TS release 10 section Base Station Output Power Frequency Error Error Vector Magnitude (EVM) Occupied bandwidth (OBW) Adjacent Channel Leakage Power (ACLP) Operating band unwanted emissions LTE Rx Measurements Per 3GPP TS release 10 section Reference Sensitivity WCDMA Measurements Per 3GPP TS release 10 section Base Station Power P-CPICH Power 6.3 Frequency Error Occupied Bandwidth (OBW) Spectral Emission Mask (SEM) Adjacent Channel leakage Ratio (ACLR) Error Vector Magnitude (EVM) Peak Code Domain Error (PCDE) RCDE WCDMA Rx Measurements Per 3GPP TS release 10 section Reference Sensitivity WLAN Tx Measurements Per IEEE (2012) 21 (with option 113 enabled) Power Frequency Modulation Quality 22 SEM 17 LTE bands 1 to LTE bands 1 to 44 WLAN Rx Measurements Per IEEE (2012) UMTS bands UMTS bands Frequency range 2412 to 2472 MHz and 5200 to 5800 MHz 22 Channel tracking enabled, preamble and data, MSC9 256 QAM, 20 packets, 16 OFDM data symbols 23 Frequency range 2412 to 2472 MHz and 5200 to 5800 MHz

11 Inputs and Output Port Description Connection Type DUT 1 to 4 (RF in/out) TTL Trigger Out Sync In V to 4.5V, VIL 0.8V, VIH 2.0V, VOL 0.2V, VOH 2.9V, Zin10 kohm, Zout 50 ohm Minimum PC Requirements Operating System RAM Expansion Slots SMA 50 ohm VHDCI 24 cable accessory required VHDCI cable accessory required Windows 64 bit 4 GB ½ or full height vacant PCIe slot

12 ORDERING INFORMATION Model Number Description 3041 Small Cell RF Tester Supplied with: CD-ROMs containing module driver software, applications and measurement software and toolkits driver for QTI FSM99xx OPTIONS Part Number Description 113 WLAN a,b,g,n,p,ac Transceiver RF Measurements and Test Sequencer ACCESSORIES Part Number Description 22361/501 Rack Mount Kit 43139/973 Multi Way Synch Cable Assembly

13

14 Cobham Wireless - Validation Part No.46900/091, Issue 1, 02/16

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