PXI Maestro PXI Maestro, software that accelerates wireless device test speed and reduces ATE system development time.

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1 PXI Maestro PXI Maestro, software that accelerates wireless device test speed and reduces ATE system development time. Highlights End-to-end ATE for multi-up non signalling RF test Supports single or dual RF channel PXI 3000 module configurations Configurable to test from multiple 4 devices in parallel Fully integrated with chipset specific device control and calibration methods RF performance verification in accordance with published radio standards Transmit and receive RF measurements for GSM, EDGE, W-CDMA, LTE and WLAN Parallel processing of multiple measurement parameters Simple to integrate within any automated test system and software environment Support for PSU system integration Easy to use GUI for test sequence generation and editing Reference implementations for Qualcomm, Quantenna and Broadcom Introduction PXI Maestro extends the PXI 3000 Series RF modular platform to provide a production-ready test system with integrated device under test control and the ability to test multiple devices in parallel. PXI Maestro provides the ideal solution to accelerate test system development, reduce test time and lower the cost of test. Reducing the Cost of Test The cost of test is both a capital expense dominated by RF test equipment selection and an operating expense dominated by test system engineering overhead. Using PXI Maestro with PXI 3000 RF modular instruments reduces both. Compared to conventional solutions, the capital costs are lowered by as much as 75%. This is achieved by reducing both the cost per system and the number of testers required for a given manufacturing throughput. Operating expenses are dramatically reduced by enabling faster system integration into any existing or new production test line. Reducing Integration Complexity Production test system engineers face a constant challenge posed by the ever increasing complexity of wireless mobile devices. Developing, adapting and optimising RF test systems can be time consuming and requires highly skilled staff with detailed knowledge of their test tools. PXI Maestro lowers test engineering complexity. It provides an optimised ATE solution out of the box, ready for testing multi-com devices. It simplifies the process of test system integration to accelerate new product introduction and help save cost.

2 PXI Maestro provides the user with a simple graphical user interface to select, generate and execute or edit test plans. While the test plan is running, all tester and device control commands are executed as an uninterrupted measurement sequence with no further user input. Measurement results are displayed as they are executed with a final test report available in a user friendly format. Facilities exist to integrate PSU control and current measurement at specific points within the measurement sequence. The effort to develop and maintain test system code is radically reduced leading to much faster new product introduction cycles. Reducing Test Time PXI Maestro uses innovative methods to reduce test time and so maximise production throughput. This is achieved by first understanding that the key to RF test system efficiency is not only raw measurement speed but more importantly optimising test equipment utilisation. Inefficient test system development can too often lead to high value capital assets being idle for significant periods of time both between successive test steps and within a measurement step. PXI Maestro addresses this in a variety of ways. Firstly, PXI Maestro includes a multi threaded intelligent sequencer designed to take full advantage of modern multi-core CPUs. This ensures different tasks within a measurement sequence or step are overlapped or executed concurrently rather than sequentially as with conventional instrumentation. Where multiple RF measurements are required for a single test condition, PXI Maestro uses it s intelligence to perform them in parallel on the same captured data and hence save time. PXI Maestro takes advantage of the benefits of PXI 3000 Series where signal acquisition and signal processing are decoupled. Data processing is performed in parallel while the hardware is busy changing states or acquiring a new event. Transferring the acquired for processing is pipelined i.e. as the event occurs. Fig 2. PXI Maestro software made simple to integrate Fig 3. PXI Maestro User Interface example

3 Testing Devices in Parallel Fig 4. PXI Maestro Parallel Test of 4 UEs PXI Maestro makes it possible to test multiple devices in parallel with a single tester comprising a single vector signal analyzer (VSA), a single vector signal generator (VSG) channel, an RF conditioning interface and a test system controller. PXI Maestro supports customization of the interconnection between the device or devices under test and the test resources. For multiple device testing PXI Maestro can use the PXI 3066 Multi-way Active RF Combiner, from Aeroflex that supports multiple device connection and parallel testing. Using the 3066 it is possible to connect to and test 4 devices in approximately the same time as required to test one. This is made possible by supporting and multiplexing of PXI resources between each DUT to maximize test efficiency. Fig 5. Aeroflex PXI 3066 Multi Way RF Combiner Module Using PXI 3066 provides PXI Maestro a range of different connection models to chose from for single or multiple device testing. In Figure 6, 3066 is used to sequentially multiplex between four transmit signals while broadcasting a common downlink signal for execution of parallel Rx sensitivity measurements across four devices. PXI Maestro can also be used with a PXI 3061 or PXI 3065A RF Combiner modules. PXI 3065A provides VSA and VSG interconnection to a DUT with a main and auxiliary antenna. PXI 3061 supports switched interconnection between VSA and VSG resources and up to 3 device antennas. This feature is exposed in PXI Maestro s WLAN test capability for 3x3 MIMO testing. For cellular device testing PXI 3061 can be used for a single antenna connection. Fig 6. Switched uplink, broadcast downlink use model using PXI 3066

4 PXI Maestro Measurement Modules are a collection of optional radio standard specific measurement modules designed to optimize the speed of characterising the RF parameters using methods in accordance with the relative conformance specification. Each measurement module is distributed separately and enabled with soft-key password on the 303x PXI RF Digitizer module. A device under test manager controls communication with the device under test. This generic interface permits control for any device type to be inserted. Fig 7. Aeroflex PXI 3065A RF Combiner Module PXI Maestro will also support integrated control of user supplied customised RF connection models. Summarising the Benefits of Using PXI Maestro Simplifies automated test software development and maintenance and so lowers the cost of test development Improves production throughput and lowers the cost per unit tested Lowers test system capital and operating expenses by using a single tester to measure multiple devices Reduces production line test station footprint, energy costs and through life operating expense using modular instrumentation. Provides a simple software upgrade path for all compatible PXI 3000 systems PXI Maestro Software Architecture PXI Maestro comprises a number of constituent parts The DUT connection manager provides control of the RF interfacing between DUT and PXI modules. Use Cases PXI Maestro can be used in any automated test application for wireless devices including design verification/regression test, pilot or routine production and high volume servicing. PXI Maestro can be used as a reference test system in R&D to assist debugging problems as new products enter manufacturing. Reference Designs PXI Maestro is supplied as standard with reference implementation models for controlling devices from Qualcomm, Quantenna and Broadcom. These reference designs can be used directly as supplied. Customisable versions of these reference designs can be made available upon request. Silicon Vendor Device Models Technologies Qualcomm Technologies Inc All devices supported by QMSL version GSM/EDGE, WCDMA, LTE (FDD) Broadcom BCM4360 WLAN ac Quantenna Communications QHS710 WLAN n Fig 8. PXI Maestro software architecture Executive; a simple programming and user customizable result capture interface. The core of PXI Maestro comprises a generic measurement sequencer to insert, edit or delete measurement groups within the test plan, organise the measurement sequence order and provide methods to execute operation and query progress.

5 SPECIFICATION COMMUNICATION STANDARD OPTIONS LTE FDD (1) W-CDMA (1) GSM / EGPRS (1) WLAN (1) See below for PXI 3000 module compatibility and configuration requirements TEST COVERAGE GSM GSM measurement suite version or later 3GPP TS Required options Recommended options 3030 option 100, 200 None Measurements 3GPP TS Reference Max Output Power 5.2 Frequency Error 5.3 ILPC A-H Minimum Output Power OBW 5.8 SEM 5.9 ACLR 5.10 EVM PCDE Reference sensitivity 6.2 Max input level 6.3 LTE LTE FDD Measurement Suite version GPP TS Frequency Bands 850 MHz 900 MHz 1800 MHz 1900 MHz Required options Recommended options 3030 option 107, 207 None Frequency Bands 1 to 21 and 25 Measurements 3GPP TS reference Phase/Freq error 13.1, Tx Power & burst timing 13.3, EVM & IQ offset ORFS 13.4, Rx sensitivity , , W-CDMA UMTS UL Measurement Suite version or later 3GPP TS version ( ) Required options Recommended options 3030 option 101, 201 None Frequency Bands I to XIV Measurements 3GPP TS Reference Ue Max power MPR Additional MPR Minimum Output Power Freq error EVM Carrier leak In band emission in non allocated RC Spectral Flatness OBW SEM /2 ACLR Reference sensitivity 7.3 Max Input Level 7.4 Version ( ) ( ) ( )

6 CONNECTIVITY WLAN measurement suite version or later IEEE and P802.11ac D4.0 Required options Recommended options 3030 option 103, 203 Add 3030 option 113 for ac Measurements NON HT HT VHT The above table shows the supported test clause references for IEE and P802.11ac QUALCOMM DEVICE TUNING GSM / EDGE Qualcomm Calibration GSM Kvco 2.1 GSM Kvco2 2.2 GSM Rx calibration 2.3 GSM carrier suppression (CS) calibration 2.4 GSM external polar TX calibration 2.5 GSM delay calibration 2.6 GSM linear Tx calibration W-CDMA Qualcomm Calibration DSSS Mbps 1 & & 11 W-CDMA TxLinearizer calibration 2.1 W-CDMA composite Tx/Rx vs. frequency calibration 80 VA C Section 2.4 W-CDMA IM2 calibration VA360-6 C Section OFDM Tx Power / Tx power on and off ramp Transmit Spectral Mask NA Spectral Flatness NA Transmit Centre Frequency Tolerance Chip / Symbol clock frequency tolerance Transmit Centre Frequency Leakage Transmit modulation accuracy / Constellation Error Receiver minimum input level sensitivity Receiver maximum input level sensitivity / / LTE Other Qualcomm Calibration LTE Tx Linearizer calibration 2.1 LTE composite Tx/Rx vs. frequency calibration Qualcomm Calibration Reference Section XO calibration 5.2 Thermistor cal 80-VR DC Cal PXI 3000 Series Compatibility PXI 3000 Series Module Type Signal Generator RF I/O RF Digitizer Bandwidth (MHz) Frequency Band (GHz) 3020A GSM, UMTS, LTE WLAN C 3021C (Items marked as blue indicate Aeroflex s preferred recommendations) Notes (1) Single device single antenna Dependencies The following items are required to be installed on the PC controller: PXI 3000 module drivers and required options (see ordering information) Installed radio standard measurement suite Device under test driver dll Device under test connection control dll Minimum Controller PC Requirements Operating System Windows 7/32 bit, XP CPU Quad core is recommended Memory 2 G Byte (4 G Byte recommended) C 3026C 3050A/ A 3030C C A A 80 VA C Section 2.4 (1) 3066 (1) (1) (1) (1) (1) (1)

7 System Configuration Guidance for using PXI Maestro Step 1: Select PXI Chassis and controller e.g slot compact half rack width chassis or slot full rack width chassis (1) 46885/416 Remote PC control via PCIe-PXI interface or 46885/598 Remote PC control via PCI-PXI interface or 3001C Dual Core Embedded PC Step 2: Select VSG module from any of: 3020A (6) PXI Digital RF Signal Generator 1 MHz- 2.7 GHz 3025 (6) PXI Digital RF Signal Generator 80 MHz-6 GHz 3020C (3) PXI Digital RF Signal Generator 1 MHz 3 GHz 3021C (3) PXI High Power RF Signal Generator 100 khz 3 GHz (2) 3025C (3) PXI Digital RF Signal Generator 1 MHz 6 GHz Notes 1. A full rack width PXI chassis can support 1 or 2 RF channels each comprising a VSA, VSG and RF Combiner 2. Not compatible for use with PXI Chassis model Add 3010 or 3011 RF synthesizer module x1 per MHz -1 db instantaneous bandwidth MHz -1 db instantaneous bandwidth above 1 GHz 3026C (3) PXI High Power RF Signal Generator 1 MHz-6 GHz (2) 3050A/3320 PXI Low Noise Signal Generator and Dual AWG (7) Step 3: Select VSA module from any of: 3030A (3) PXI Wideband RF Digitizer 330 MHz 3 GHz (4) 3030C (3) PXI Wideband RF Digitizer 250 khz 3 GHz (5) 3035 (3) PXI Wideband RF Digitizer 330 MHz 6 GHz (4) 3035C (3) PXI Wideband RF Digitizer 250 khz 6 GHz (2,5) 3036 (3) PXI Wideband RF Digitizer 250 khz 13 GHz (2,5) 3070A PXI High Performance RF Digitizer (2) Step 4: Select RF Combiner module: MHz 6 GHz RF Combiner with Switched output 3065A 80 MHz 6 GHz RF Combiner MHz 6 GHz Multi Way Active RF Combiner (1) Step 5: Select Software Configuration: 3030 option 100 GSM / EDGE Measurement suite 3030 option 200 GSM Test Sequencing (requires option 100) 3030 option 101 UMTS UL Measurement suite 3030 option 201 UMTS UL Test Sequencing (requires opt 101) 3030 option 107 LTE FDD Measurement suite 3030 option 207 LTE Test Sequencing (requires opt 107) 3030/3070 opt 103 WLAN a,b,g,n Measurement suite 3030/3070 opt 113 WLAN ac Measurement suite (requires opt 103) 3030/3070 opt 203 Connectivity Test sequencing (requires opt 103)

8 PXI MAESTRO ORDERING INFORMATION PXI Maestro core software is supplied free of charge. PXI Maestro is supplied together with other software on CD ROM or can be downloaded from the Aeroflex website PXI Maestro Radio standard specific sequencer functions are installed together with the respective Measurement Suite. A software enable option key is required to activate the 303x or 3070A RF Digitizer module retrospectively to utilize these function. Standard Measurement Suite PXI Maestro Test Sequencing functions GSM/EDGE 3030 opt opt 200 UMTS UL 3030 opt opt 201 LTE FDD 3030 opt opt 207 WLAN a,b,g,n 3030 opt opt opt opt 203 WLAN ac 3030 opt opt opt opt 203 PXI Maestro measurement sequencing options can be added retrospectively as: RTROPT200/3030 RTROPT201/3030 RTROPT207/3030 RTROPT203/30x0 GSM / EDGE Test Sequencing UMTS UL Test Sequencing LTE Test Sequencing Connectivity Test Sequencing (where x is 3 for 3030 Series or 7 for 3070A) Distributed By: Signal Test, Inc 1529 Santiago Ridge Way San Diego, CA Tel USA Sales@SignalTestInc.com Our passion for performance is defined by three attributes represented by these three icons: solution-minded, performance-driven and customer-focused. Part No /010, Issue 4, 09/13