DETERMINATION OF PERMEABILITY FROM IMPEDANCE MEASUREMENT USING VECTOR NETWORK ANALYZER

Size: px
Start display at page:

Download "DETERMINATION OF PERMEABILITY FROM IMPEDANCE MEASUREMENT USING VECTOR NETWORK ANALYZER"

Transcription

1 Journal of ELECTRICAL ENGINEERING, VOL 63. NO 7s,, 97- DETERMINATION OF PERMEABILITY FROM IMPEDANCE MEAUREMENT UING VECTOR NETWORK ANALYER Rastislav Dosoudil This study treats the optimised one-port (reflection coefficient) and two-port (shunt-through/series-through) measurement s for complex permeaility determination of solid soft magnetic materials using a vector network analyzer (VNA) at frequencies from 9 khz to 6.5 GHz. The principle of measurement s, the relationships of measured phasor voltage ratio ( - parameter) to complex impedance, and permeaility calculation equations are presented. Each gives good measurement sensitivity at the impedance range where the measured ac voltage at the VNA s receiver significantly varies. For permeaility evaluation, the shunt-through provides the est sensitivity and staility and thus is suitale for oth low and high permeaility materials. Keywords: impedance, permeaility, network analyzer, measurement, scattering parameter INTRODUCTION EXPERIMENTAL ET-UP With the trend of wireless communications and digital equipment operating at higher frequencies, the need to evaluate high frequency electronic components (such as RF inductors with cores made of soft ferrites and/or ferrite polymer composites) under higher and wider frequencies is increasingly important not only for research and development engineers of component manufacturers ut also circuit designers of equipment producers. For such electronic components, the frequency dependence of and parts of complex permeaility = j is a significantly important material parameter. At high frequencies, however, the direct measurement of permeaility is difficult. ome reviews on the measurement s for high frequency component/material characterization have een reported [, ]. The permeaility can e determined via impedance analysis using the inductance and/or equivalent circuit model [3] or network analysis using the reflection wave [4], transmission/reflection [5], cavity resonator [6], free space [7], etc. The impedance analysis provides higher measurement accuracy and staility ut requires an expensive impedance analyzer and is suitale only for lower frequency range (up to aout MHz). The work reported here focuses on the network analysis of otaining the permeaility of solid soft magnetic materials (such as ferrites and/or composite materials) over a wide range of frequencies (9 khz 6.5 GHz) y means of a common instrument such as a vector network analyzer (VNA). The descried approach uses the advantages of oth impedance as well as network analysis: ( wide scale of measured impedances (from milliohms to kiloohms), () road frequency range, and (c) higher measurement accuracy (etter than 5 %). Both, the low as well as high permeaility materials can e tested. The relevance of the proposed approach is verified on some soft magnetic materials, namely sintered ferrite and ferrite polymer composite. * Institute of Electrical Engineering, Department of Electromagnetic Theory, lovak University of Technology, Faculty of Electrical Engineering and Information Technology, Ilkovičova 3, 8 9 Bratislava, lovakia, rastislav.dosoudil@stua.sk IN FEI TU For purposes of this study a vector network analyzer (Agilent E57C) making swept high frequency stimulusresponse measurements from 9 khz to 6.5 GHz has een used [8]. The analyzer is equipped with a signal source, signal-separation devices, receivers for signal detection, and display/processing circuitry for reviewing responses, Fig.. Fig.. The view of experimental set-up (E57C analyzer, 6A adapter, and attached 6454A coaxial line holder) and the lock diagram of a vector network analyzer The source is usually a uilt-in phase-locked (synthesized) voltage-controlled oscillator. ignal-separation hardware allows measurements of a portion of the incident signal to provide a reference for ratio measurements and it separates the incident (forward) and reflected (reverse) signals preset at the input of the device under test (DUT). Hardware for this purpose includes power dividers (which are resistive and roadand ut have high insertion loss), directional couplers

2 98 R. Dosoudil: DETERMINATION OF PERMEABILITY FROM IMPEDANCE MEAUREMENT UING VECTOR NETWORK (which have low loss ut are usually limited in andwidth), and directional ridges (which are useful for measuring reflected signals over a road andwidth, ut may also have significant loss). The analyzer relies on a tuned-receiver architecture to provide high signal sensitivity and wide dynamic range ( db or etter), and works with -parameter test set. This test set provides oth forward and reverse measurements of a DUT. The high frequency power is availale from either port or port, and either test port can e connected to the vector network analyzer s receiver inputs. The test set also allows the use of full two-port error correction techniques (such as full two-port caliration procedure) for the highest measurement accuracy. The E57C analyzer is also equipped with an internal computer and Windows operating system, so that all the necessary measurement as well as post-processing routines may e performed without using an external PC. 3 CATTERING PARAMETER ince it is difficult to measure total voltage or current at higher frequencies, -parameters (or scattering parameters ) are generally measured instead [9]. These parameters relate to familiar measurements such as gain, loss, reflection/transmission coefficient, and impedance/admittance. They are relatively simple to measure, and do not require connection of undesirale loads to the DUT (short-circuit and/or open-circuit connections). The numer of - parameters for a given device is equal to the square of the numer of ports. For example, a two-port device has four - parameters. The numering convention for -parameters is that the first numer following the is the port at which energy emerges, and the second numer is the port at which energy enters. o the is a measure of power emerging from port as a result of applying a high frequency stimulus to port. When the numers are the same (e.g. ), a reflection measurement is indicated. l DUT l ) U I I two-port network (DUT) U Fig.. (- Device under test (two-port network) connected to the network analyzer, and, () - two-port network The scattering parameters are defined y the following equations: a a ( a a () where the travelling wave variales, at port and, at port of the two-port network (or device under test, DUT), Fig., are defined in terms of total voltage and current phasors (U, I and U, I ) and reference impedance as follows: U I U I a a (a,) U I U I (c,d) Note that the square of the magnitude of these wave variales has the dimension of power (W): power incident on port, power incident on port (or power reflected from the load), power reflected from port, power reflected from port (or power incident on the load). The -parameters can e measured y emedding the two-port network in a transmission line whose ends are connected to a network analyzer, Fig.a. In practice, the reference impedance is chosen to e = 5. The network analyzer can measure -parameters over a road frequency range and the results can e displayed either on a mith chart ( and/or ) and on a polar diagram ( and/or ) or as a conventional gain versus frequency graph. The two coaxial line segments of lengths l, l are assumed to have characteristic impedance equal to the reference impedance. We may replace the experimental set-up of Fig.a with the electric circuit shown in Fig.3 with the understanding that the generator and segment l have een replaced y their Thévenin s equivalents, and the load impedance has een replaced y its propagated version to distance l. It should e noted that the generator and load impedances, G and L, respectively, are configured y the network analyzer. The connections can also e reversed, with the generator connected to port and the load to port. U g G I I two-port U network U (DUT) Fig. 3. Two-port network connected to generator and load. Equivalent electric circuit to the experimental set-up of Fig.a The actual measurements of the -parameters are made y connecting to a matched load, L =. Then, there will e no reflected waves from the load, =, and the -parameter equations () will give: (3a,) a a a a Reversing the roles of the generator and load, one can measure in the same way the parameters and : (4a,) a a a a Parameter ( ) is equivalent to the input (output) reflection coefficient, while parameter ( ) is equivalent to the L

3 Journal of ELECTRICAL ENGINEERING, VOL 63. NO 7s, 99 forward (reverse) transmission coefficient. Note each scattering parameter is in general complex ij = ij e jij, with ij the ratio of amplitudes and ij the phase difference of travelling waves (, and, ). 4 IMPEDANCE MEAUREMENT WITH VNA Three major techniques used to perform impedance measurements with a network analyzer are ( the reflection coefficient using one-port configuration, () the shunt-through using two-port configuration, and (c) the series-through using two-port configuration, Fig.4, []. ) c) One-port reflection coefficient Two-port shunt-through Two-port series-through Fig. 4. Impedance measurement techniques for VNA: ( - one-port reflection, () - two-port shunt-through and (c) - twoport seriesthrough Each gives good measurement sensitivity at the impedance range where the measured ac voltage at the receiver significantly varies, Fig.5. (-) ensitive range hunt through ( ) hunt-through Reflection Reflection ( ) eries-through eries through ( ) () Fig. 5. Relationship etween impedance and scattering parameters for different measurements techniques The reflection coefficient measures the voltage ratio of the reflected voltage (U r ) and the incident voltage (U i ) from the DUT with impedance, which in turns corresponds to the parameter (equation (3, port is not used): Ur U i Note that U r, U i are phasors. Equation (5) may e inverted to express the impedance in terms of the scattering parameter: (5) (6) The parameter varies greatly with impedance near the reference impedance (5 ). The highest accuracy is otained at equal to, ecause the directional ridge (or coupler) for measuring reflection has a null alance point. However, when the impedance is not in the same vicinity as, the reflection is not suitale due to trace noise. The two-port techniques allow us measure impedance over a road impedance scale using shunt-through and/or series-through configuration. With the two-port technique, we can use either or parameter to perform measurements. However, parameter has a more limited noise floor than, and it is highly susceptile to VWR (voltage standing wave ratio) and other factors that exist etween the holder connector and ground (or sustrate). Because of this, generally parameter is preferred. The shunt-through is suitale for 5 or lower impedances (down to milliohm range) while the series-through is suitale for 5 or higher impedances (up to kiloohm range). port port ) port port = = Fig. 6. The electric circuit for ( - shunt-through and () - series-through connection We now derive the equations for impedance calculation from the measured parameter for oth shunt-through as well as series-through s. Using a shunt impedance and terminating the network in the characteristic impedance (i.e. connecting a matched load at port ), we sets =, Fig.6a. Then the parameter is given y: a a Equation (7) may e inverted to express the impedance in terms of the parameter: imilarly, using a series impedance and terminating the network in the characteristic impedance, we sets =, Fig.6. The scattering parameter is as follows: a a Inverting the equation (9), one can express the impedance in terms of parameter: (7) (8) (9) () The E57C analyzer is equipped with the Impedance parameter display software (which can e downloaded from the Agilent we site, []), Fig.7, that makes it possile to calculate the frequency dependences of impedance parame-

4 Complex permeaility Complex permeaility R. Dosoudil: DETERMINATION OF PERMEABILITY FROM IMPEDANCE MEAUREMENT UING VECTOR NETWORK ters (such as resistance R, reactance X, magnitude, phase,...) from measured scattering parameters and to plot them on the analyzer screen. shunt-through s were used to evaluate the permeaility responses. We oserved the typical resonance type of permeaility dispersion for sintered ferrite and relaxation one for composite. This ehaviour is attriuted to two asic magnetizing mechanisms: domain wall motion and magnetization rotation in domains, [3, 4, ] Reflection coefficient sintered ferrite Ni.5 n.5 Fe O 4 Fig. 7. The view of Impedance parameter display software The complex permeaility of the ring sample can e determined using the following relation []: air j jh f ln r / r o () where and air are the input complex impedances of the 6454A coaxial line holder with and without the ring sample, respectively, h is the height of the sample, f is the frequency, µ o is the permeaility of free space, and r and r are the outer and inner radiuses of the sample. The additional details may e found elsewhere [3, 4]. The impedances and air in equation () can e otained from equations (6), (8) or () according to the actual measurement. After setting several measuring conditions such as power level (from 85 to + dbm), frequency range (from 9 khz to 6.5 GHz), numer of measured points (etween and 6), type of sweep (logarithmic/linear/segment for frequency), numer of traces and channels, the full two-port caliration (with standard short-open-load-through connections) must e performed on the E57C analyzer to achieve the highest measurement accuracy. 4 EXPERIMENT, REULT AND DICUION Figures 8 and 9 show the frequency dependences of () and () parts of complex (relative) permeaility = j for sintered Nin ferrite (with the chemical composition Ni.5 n.5 Fe O 4 and synthesized using conventional ceramic process at C for 6 hours), Fig.8, and for ferrite polymer composite with Nin ferrite as a magnetic filler (with grain size 5 µm) and polyamide (PAD) as a nonmagnetic matrix, Fig.9. The composite sample was prepared y a hot-pressing at a temperature of 35C and a pressure of 5 MPa, and had the total volume concentration of magnetic filler 3 vol%. The prepared samples in the ring form had the outer and inner diameter of 7 and 3. mm, respectively, and the height of.3 mm. Because the permeaility of oth the samples (ferrite and composite) was elow 3, only the one-port reflection coefficient and the two-port ) hunt-through sintered ferrite Ni.5 n.5 Fe O Fig. 8. Complex permeaility versus frequency for sintered Nin ferrite measured y ( - reflection coefficient and () -shuntthrough From figures 8 and 9 it can e clearly seen that the parameter measurement (one-port reflection coefficient ) has a disadvantage in accuracy especially for low impedance measurement ecause the sintered ferrite and composite inserted into the coaxial holder provides very small impedance values, typically 5 m for ferrite (elow MHz) and m for composite (elow MHz). The est results were achieved using the two-port shunt-through, which is specifically targeted at very low impedance measurements down to milliohm range and therefore it is suitale mainly for low permeaility material characterization. It should e noted that the practical impedance measurement ranges for -parameter (one-port reflection and two-port shunt-through) also depend on the test port extension (the coaxial line holder can e attached to port and/or port only via coaxial cale or adapter, Fig.), the test holder characteristics (the lower impedance measurement range of the shunt-through is limited y the short

5 Complex permeaility Complex permeaility Journal of ELECTRICAL ENGINEERING, VOL 63. NO 7s, residual inductance, which is mainly caused y the coupling etween the holder s measurement terminal and analyzer s ports), and the caliration for eliminating the test holder induced errors (instead of full two-port caliration, it is possile to perform the enhanced-response caliration procedure, which is timeless ut it can cause additional induced errors). ) 4 3 Reflection coefficient Ferrite polymer composite Nin - PAD 3 vol% hunt-through Ferrite polymer composite Nin - PAD 3 vol% Fig. 9. Complex permeaility versus frequency for Nin - PAD composite measured y reflection coefficient and ) shunt-through 5 CONCLUION The study was focused on the determination of high frequency permeaility using impedance measurement techniques such as one-port reflection coefficient, two-port shunt-through and two-port seriesthrough y means of a vector network analyzer in the frequency range of 9 khz 6.5 GHz. The measurement principle of the used analyzer is given with emphasis on the extraction of sample holder s impedance from the measured scattering parameters. The shunt-through provided the est sensitivity for low impedance measurement, which in turns is typical for low permeaility materials testing. ome sintered ferrite as well as composite was chosen for verification and proofing of proposed approach. The descried technique provides good measurement accuracy and staility without the importance of an expensive and special instrument. Acknowledgement This work was financially supported y VEGA grants Nr. /63/ and /35/, and y APVV grant Nr. APVV6/. REFERENCE [] BAKER-JARVI, J. JANEIC, M.D. GROVENOR, J.. GEYER, R.G.: Transmission/Reflection and hort-circuit Methods for Measuring Permittivity and Permeaility, NIT Technical Note 355-R, Dec [] AFAR, M. BIRCH, J.B. CLARKE, R.N. CHANTRY, Ed.G.W.: Measurement of the Properties of Materials, Proc. of the IEEE 74, No., (986), [3] DOOUDIL, R. UŠÁK, E. OLAH, V.: Computer Controlled ystem for Complex Permeaility Measurement in the Frequency Range of 5 Hz GHz, Journal of Electrical Engineering 57, No. 8/, (6), 5-9. [4] DOOUDIL, R. OLAH, V.: Measurement of Complex Permeaility in the RF Band, Journal of Electrical Engineering 55, No. /, (4), 97-. l [5] HENHUI, J. DING, D. QUANXING, J.: Measurement of Electromagnetic Properties of Materials using Transmission/Reflection Method in Coaxial Line, CEEM 3, Hangzou, China, (3), [6] COURTNEY, W.E.: Analysis and Evaluation of a Method of Measuring the Complex Permittivity and Permeaility of Microwave Insulators, IEEE Trans. on Microwave Theory and Techniques 8, No. 8, (97), [7] GHODGAONKAR, D.K. VARADAN, V.V. VARADAN, V.K.: Free-space measurement of Complex Permittivity and Complex Permeaility of Magnetic Materials at Microwave Frequencies, IEEE Trans. Instrum. Meas. 39, No., (99), [8] Agilent E57C, Vector Network Analyzer 9 khz 6.5 GHz, Operation manual [9] -parameter Design, Agilent Application Note, No. AN 54 [] Advanced Impedance Measurement Capaility of the RF I-V Method Compared to the Network Analysis Method, Agilent Application Note, No [] Impedance Parameter Display oftware, Agilent Application Note, No [] DOOUDIL, R. UŠÁK, E. OLAH, V.: Automated Measurement of Complex Permeaility and Permittivity at High Frequencies, Journal of Electrical Engineering 6, No. 7/, (), -4. Received 5 August Rastislav Dosoudil (Doc, Ing, PhD) was orn in Bratislava, lovakia, in 97. He graduated from Faculty of Electrical Engineering and Information Technology, lovak University of Technology, in Bratislava, in Material Engineering ranch, 993 (technology of electronic equipments) and received the PhD degree in Theory of Electromagnetism in. At present, he is an Associate Professor (8) at the Institute of Electrical Engineering. He teaches electric circuits, electromagnetics and electronics. His research activities are mainly ferrite-polymer composite materials, complex permittivity/permeaility phenomena, electromagnetic wave asoring properties of composites, ferromagnetic resonance, and magnetic measurements.

Network Analysis Basics

Network Analysis Basics Adolfo Del Solar Application Engineer adolfo_del-solar@agilent.com MD1010 Network B2B Agenda Overview What Measurements do we make? Network Analyzer Hardware Error Models and Calibration Example Measurements

More information

VLSI Design Considerations of UWB Microwave Receiver and Design of a 20.1 GHz Low Noise Amplifier for on-chip Transceiver

VLSI Design Considerations of UWB Microwave Receiver and Design of a 20.1 GHz Low Noise Amplifier for on-chip Transceiver Daffodil International University Institutional Repository Proceedings of NCCI Feruary 009 009-0-4 VLI Design Considerations of UWB Microwave Receiver and Design of a 0. GHz Low Noise Amplifier for on-chip

More information

Reflection measurement methods for characterization of dielectric properties

Reflection measurement methods for characterization of dielectric properties Reflection measurement methods for characterization of dielectric properties M. Zimmermanns, B. Will, and I. Rolfes, Member, IEEE Index Terms Reflection measurements, dielectric materials, free space,

More information

Amateur Extra Manual Chapter 9.4 Transmission Lines

Amateur Extra Manual Chapter 9.4 Transmission Lines 9.4 TRANSMISSION LINES (page 9-31) WAVELENGTH IN A FEED LINE (page 9-31) VELOCITY OF PROPAGATION (page 9-32) Speed of Wave in a Transmission Line VF = Velocity Factor = Speed of Light in a Vacuum Question

More information

Scattering Parameters for the Keefe Clarinet Tonehole Model

Scattering Parameters for the Keefe Clarinet Tonehole Model Presented at the 1997 International Symposium on Musical Acoustics, Edinourgh, Scotland. 1 Scattering Parameters for the Keefe Clarinet Tonehole Model Gary P. Scavone & Julius O. Smith III Center for Computer

More information

Novel Method for Vector Mixer Characterization and Mixer Test System Vector Error Correction. White Paper

Novel Method for Vector Mixer Characterization and Mixer Test System Vector Error Correction. White Paper Novel Method for Vector Mixer Characterization and Mixer Test System Vector Error Correction White Paper Abstract This paper presents a novel method for characterizing RF mixers, yielding magnitude and

More information

MAGNETO-DIELECTRIC COMPOSITES WITH FREQUENCY SELECTIVE SURFACE LAYERS

MAGNETO-DIELECTRIC COMPOSITES WITH FREQUENCY SELECTIVE SURFACE LAYERS MAGNETO-DIELECTRIC COMPOSITES WITH FREQUENCY SELECTIVE SURFACE LAYERS M. Hawley 1, S. Farhat 1, B. Shanker 2, L. Kempel 2 1 Dept. of Chemical Engineering and Materials Science, Michigan State University;

More information

MICROWAVE MICROWAVE TRAINING BENCH COMPONENT SPECIFICATIONS:

MICROWAVE MICROWAVE TRAINING BENCH COMPONENT SPECIFICATIONS: Microwave section consists of Basic Microwave Training Bench, Advance Microwave Training Bench and Microwave Communication Training System. Microwave Training System is used to study all the concepts of

More information

Experimental measurements and numerical simulation of permittivity and permeability of Teflon in X band

Experimental measurements and numerical simulation of permittivity and permeability of Teflon in X band doi:.58/jatm..394 Adriano Luiz de Paula* Institute of Aeronautics and pace ão José dos Campos, Brazil adrianoalp@iae.cta.br Mirabel Cerqueira Rezende Institute of Aeronautics and pace ão José dos Campos,

More information

Agilent PNA Microwave Network Analyzers

Agilent PNA Microwave Network Analyzers Agilent PNA Microwave Network Analyzers Application Note 1408-1 Mixer Transmission Measurements Using The Frequency Converter Application Introduction Frequency-converting devices are one of the fundamental

More information

Vector Network Analyzer Application note

Vector Network Analyzer Application note Vector Network Analyzer Application note Version 1.0 Vector Network Analyzer Introduction A vector network analyzer is used to measure the performance of circuits or networks such as amplifiers, filters,

More information

Modelling of on-chip spiral inductors

Modelling of on-chip spiral inductors Modelling of on-chip spiral inductors Raul Blečić, Andrej Ivanković, ebastian Petrović, Boris Crnković, Adrijan Barić Faculty of Electrical Engineering and Computing University of Zagreb Address: Unska

More information

Hot S 22 and Hot K-factor Measurements

Hot S 22 and Hot K-factor Measurements Application Note Hot S 22 and Hot K-factor Measurements Scorpion db S Parameter Smith Chart.5 2 1 Normal S 22.2 Normal S 22 5 0 Hot S 22 Hot S 22 -.2-5 875 MHz 975 MHz -.5-2 To Receiver -.1 DUT Main Drive

More information

MEASUREMENT OF LARGE SIGNAL DEVICE INPUT IMPEDANCE DURING LOAD PULL

MEASUREMENT OF LARGE SIGNAL DEVICE INPUT IMPEDANCE DURING LOAD PULL Model M956D CORPORAION MEASUREMEN OF LARGE SIGNAL DEVICE INPU IMPEDANCE DURING LOAD PULL Abstract Knowledge of device input impedance as a function of power level and load matching is useful to fully understand

More information

Focusing in on W-band Absorbers

Focusing in on W-band Absorbers Focusing in on W-band Absorbers David Green, EMC Engineer Joel Marchand, Test Engineer Introduction Originally designed for use in military applications to deter enemy radar, electromagnetic absorbing

More information

Measurement of the Permeability in a Ferrite Core by Superimposing Bias Current

Measurement of the Permeability in a Ferrite Core by Superimposing Bias Current Journal of International Council on Electrical Engineering Vol. 4, No. 1, pp.67~73, 014 http://dx.doi.org/10.5370/jicee.014.4.1.067 Measurement of the Permeability in a Ferrite Core by Superimposing Bias

More information

ON THE STUDY OF LEFT-HANDED COPLANAR WAVEGUIDE COUPLER ON FERRITE SUBSTRATE

ON THE STUDY OF LEFT-HANDED COPLANAR WAVEGUIDE COUPLER ON FERRITE SUBSTRATE Progress In Electromagnetics Research Letters, Vol. 1, 69 75, 2008 ON THE STUDY OF LEFT-HANDED COPLANAR WAVEGUIDE COUPLER ON FERRITE SUBSTRATE M. A. Abdalla and Z. Hu MACS Group, School of EEE University

More information

MEASUREMENT OF COMPLEX PERMITTIVITY AND COMPLEX PERMEABILITY OF MATERIALS. H. Alenkowicz*, B. Levitas**

MEASUREMENT OF COMPLEX PERMITTIVITY AND COMPLEX PERMEABILITY OF MATERIALS. H. Alenkowicz*, B. Levitas** MEAUREMEN OF COMPLEX PERMIIVIY AND COMPLEX PERMEABILIY OF MAERIAL H. Alenkowicz*, B. Levitas** ime Domain measurement of complex permittivity and complex permeability in the 8 to 18 GHz frequency band

More information

On-Wafer Noise Parameter Measurements using Cold-Noise Source and Automatic Receiver Calibration

On-Wafer Noise Parameter Measurements using Cold-Noise Source and Automatic Receiver Calibration Focus Microwaves Inc. 970 Montee de Liesse, Suite 308 Ville St.Laurent, Quebec, Canada, H4T-1W7 Tel: +1-514-335-67, Fax: +1-514-335-687 E-mail: info@focus-microwaves.com Website: http://www.focus-microwaves.com

More information

RF AND MICROWAVE ENGINEERING

RF AND MICROWAVE ENGINEERING RF AND MICROWAVE ENGINEERING FUNDAMENTALS OF WIRELESS COMMUNICATIONS Frank Gustrau Dortmund University of Applied Sciences and Arts, Germany WILEY A John Wiley & Sons, Ltd., Publication Preface List of

More information

Validation & Analysis of Complex Serial Bus Link Models

Validation & Analysis of Complex Serial Bus Link Models Validation & Analysis of Complex Serial Bus Link Models Version 1.0 John Pickerd, Tektronix, Inc John.J.Pickerd@Tek.com 503-627-5122 Kan Tan, Tektronix, Inc Kan.Tan@Tektronix.com 503-627-2049 Abstract

More information

There is a twenty db improvement in the reflection measurements when the port match errors are removed.

There is a twenty db improvement in the reflection measurements when the port match errors are removed. ABSTRACT Many improvements have occurred in microwave error correction techniques the past few years. The various error sources which degrade calibration accuracy is better understood. Standards have been

More information

A MODEL FOR SHIELDING EFFECTIVENESS EVALUATION

A MODEL FOR SHIELDING EFFECTIVENESS EVALUATION 6 TH INTERNATIONAL CONFERENCE ON ELECTROMECHANICAL AND POWER SYSTEMS October 4-6, 2007 - Chiinu, Rep.Moldova A MODEL FOR SHIELDING EFFECTIVENESS EVALUATION Petre OGRUTAN, Lia Elena ACIU, Dan BIDIAN Transilvania

More information

The 2-Port Shunt-Through Measurement and the Inherent Ground Loop

The 2-Port Shunt-Through Measurement and the Inherent Ground Loop The Measurement and the Inherent Ground Loop The 2-port shunt-through measurement is the gold standard for measuring milliohm impedances while supporting measurement at very high frequencies (GHz). These

More information

772D coaxial dual-directional coupler 773D coaxial directional coupler. 775D coaxial dual-directional coupler 776D coaxial dual-directional coupler

772D coaxial dual-directional coupler 773D coaxial directional coupler. 775D coaxial dual-directional coupler 776D coaxial dual-directional coupler 72 772D coaxial dual-directional coupler 773D coaxial directional coupler 775D coaxial dual-directional coupler 776D coaxial dual-directional coupler 777D coaxial dual-directional coupler 778D coaxial

More information

INVESTIGATION AND DESIGN OF HIGH CURRENT SOURCES FOR B-H LOOP MEASUREMENTS

INVESTIGATION AND DESIGN OF HIGH CURRENT SOURCES FOR B-H LOOP MEASUREMENTS INVESTIGATION AND DESIGN OF HIGH CURRENT SOURCES FOR B-H LOOP MEASUREMENTS Boyanka Marinova Nikolova, Georgi Todorov Nikolov Faculty of Electronics and Technologies, Technical University of Sofia, Studenstki

More information

Fast and Accurate Simultaneous Characterization of Signal Generator Source Match and Absolute Power Using X-Parameters.

Fast and Accurate Simultaneous Characterization of Signal Generator Source Match and Absolute Power Using X-Parameters. Fast and Accurate Simultaneous Characterization of Signal Generator Source Match and Absolute Power Using X-Parameters. April 15, 2015 Istanbul, Turkey R&D Principal Engineer, Component Test Division Keysight

More information

PXIe Contents CALIBRATION PROCEDURE

PXIe Contents CALIBRATION PROCEDURE CALIBRATION PROCEDURE PXIe-5632 This document contains the verification and adjustment procedures for the PXIe-5632 Vector Network Analyzer. Refer to ni.com/calibration for more information about calibration

More information

New Approach for Temperature Characterization of Low Loss Dielectric Materials

New Approach for Temperature Characterization of Low Loss Dielectric Materials International Journal of Advances in Microwave Technology (IJAMT) Vol. 2, No.4, November 2017 136 New Approach for Temperature Characterization of Low Loss Dielectric Materials Jamal Rammal *, Farah Salameh,

More information

Agilent On-wafer Balanced Component Measurement using the ENA RF Network Analyzer with the Cascade Microtech Probing System. Product Note E5070/71-3

Agilent On-wafer Balanced Component Measurement using the ENA RF Network Analyzer with the Cascade Microtech Probing System. Product Note E5070/71-3 Agilent On-wafer Balanced Component Measurement using the ENA RF Network Analyzer with the Cascade Microtech Probing ystem Product Note E5070/71-3 Introduction The use of differential circuit topologies

More information

USE OF MICROWAVES FOR THE DETECTION OF CORROSION UNDER INSULATION

USE OF MICROWAVES FOR THE DETECTION OF CORROSION UNDER INSULATION USE OF MICROWAVES FOR THE DETECTION OF CORROSION UNDER INSULATION R. E. JONES, F. SIMONETTI, M. J. S. LOWE, IMPERIAL COLLEGE, London, UK I. P. BRADLEY, BP Exploration and Production Company, Sunbury on

More information

Introduction: Planar Transmission Lines

Introduction: Planar Transmission Lines Chapter-1 Introduction: Planar Transmission Lines 1.1 Overview Microwave integrated circuit (MIC) techniques represent an extension of integrated circuit technology to microwave frequencies. Since four

More information

Network Analyzer and Network Analysis

Network Analyzer and Network Analysis Part I Network Analyzer and Network Analysis 1 Objectives Upon completion of the lab experiment, the student will become familiar with the following topics: 1. Get acquainted with the major elements of

More information

A COMPACT, AGILE, LOW-PHASE-NOISE FREQUENCY SOURCE WITH AM, FM AND PULSE MODULATION CAPABILITIES

A COMPACT, AGILE, LOW-PHASE-NOISE FREQUENCY SOURCE WITH AM, FM AND PULSE MODULATION CAPABILITIES A COMPACT, AGILE, LOW-PHASE-NOISE FREQUENCY SOURCE WITH AM, FM AND PULSE MODULATION CAPABILITIES Alexander Chenakin Phase Matrix, Inc. 109 Bonaventura Drive San Jose, CA 95134, USA achenakin@phasematrix.com

More information

SIDDHARTH GROUP OF INSTITUTIONS :: PUTTUR (AUTONOMOUS) Siddharth Nagar, Narayanavanam Road QUESTION BANK (DESCRIPTIVE)

SIDDHARTH GROUP OF INSTITUTIONS :: PUTTUR (AUTONOMOUS) Siddharth Nagar, Narayanavanam Road QUESTION BANK (DESCRIPTIVE) SIDDHARTH GROUP OF INSTITUTIONS :: PUTTUR (AUTONOMOUS) Siddharth Nagar, Narayanavanam Road 517583 QUESTION BANK (DESCRIPTIVE) Suject : Electrical & Electronic Measurements(16EE224) Year & Sem: III-B.Tech

More information

Suppression Techniques using X2Y as a Broadband EMI Filter IEEE International Symposium on EMC, Boston, MA

Suppression Techniques using X2Y as a Broadband EMI Filter IEEE International Symposium on EMC, Boston, MA Suppression Techniques using X2Y as a Broadband EMI Filter Jim Muccioli Tony Anthony Dave Anthony Dale Sanders X2Y Attenuators, LLC Erie, PA 16506-2972 www.x2y.com Email: x2y@x2y.com Bart Bouma Yageo/Phycomp

More information

Measurements with Scattering Parameter By Joseph L. Cahak Copyright 2013 Sunshine Design Engineering Services

Measurements with Scattering Parameter By Joseph L. Cahak Copyright 2013 Sunshine Design Engineering Services Measurements with Scattering Parameter By Joseph L. Cahak Copyright 2013 Sunshine Design Engineering Services Network Analyzer Measurements In many RF and Microwave measurements the S-Parameters are typically

More information

Signal and Noise Measurement Techniques Using Magnetic Field Probes

Signal and Noise Measurement Techniques Using Magnetic Field Probes Signal and Noise Measurement Techniques Using Magnetic Field Probes Abstract: Magnetic loops have long been used by EMC personnel to sniff out sources of emissions in circuits and equipment. Additional

More information

EXPERIMENT EM3 INTRODUCTION TO THE NETWORK ANALYZER

EXPERIMENT EM3 INTRODUCTION TO THE NETWORK ANALYZER ECE 351 ELECTROMAGNETICS EXPERIMENT EM3 INTRODUCTION TO THE NETWORK ANALYZER OBJECTIVE: The objective to this experiment is to introduce the student to some of the capabilities of a vector network analyzer.

More information

Impedance 50 (75 connectors via adapters)

Impedance 50 (75 connectors via adapters) VECTOR NETWORK ANALYZER PLANAR 304/1 DATA SHEET Frequency range: 300 khz to 3.2 GHz Measured parameters: S11, S21, S12, S22 Dynamic range of transmission measurement magnitude: 135 db Measurement time

More information

Magnetic characterization of CoFe-based glass covered amorphous wires at high frequency. G. Ababei 1,2, H. Chiriac 1

Magnetic characterization of CoFe-based glass covered amorphous wires at high frequency. G. Ababei 1,2, H. Chiriac 1 Magnetic characterization of CoFe-based glass covered amorphous wires at high frequency G. Ababei 1,2, H. Chiriac 1 1 NIRDTP, Mangeron 47 Blvd, Iasi-700050, Tel. + 40 232 430680, e-mail: hchiriac@phys-iasi.ro

More information

Method and apparatus to measure electromagnetic interference shielding efficiency and its shielding characteristics in broadband frequency ranges

Method and apparatus to measure electromagnetic interference shielding efficiency and its shielding characteristics in broadband frequency ranges REVIEW OF SCIENTIFIC INSTRUMENTS VOLUME 74, NUMBER 2 FEBRUARY 2003 Method and apparatus to measure electromagnetic interference shielding efficiency and its shielding characteristics in broadband frequency

More information

S.E. =20log e. t P. t P

S.E. =20log e. t P. t P The effects of gaps introduced into a continuous EMI gasket When properly designed, a surface-mount EMI gasket can provide essentially the same shielding performance as continuous gasketing. THOMAS CLUPPER

More information

Circuit Characterization with the Agilent 8714 VNA

Circuit Characterization with the Agilent 8714 VNA Circuit Characterization with the Agilent 8714 VNA By: Larry Dunleavy Wireless and Microwave Instruments University of South Florida Objectives 1) To examine the concepts of reflection, phase shift, attenuation,

More information

Configuration of PNA-X, NVNA and X parameters

Configuration of PNA-X, NVNA and X parameters Configuration of PNA-X, NVNA and X parameters VNA 1. S-Parameter Measurements 2. Harmonic Measurements NVNA 3. X-Parameter Measurements Introducing the PNA-X 50 GHz 43.5 GHz 26.5 GHz 13.5 GHz PNA-X Agilent

More information

R.K.YADAV. 2. Explain with suitable sketch the operation of two-cavity Klystron amplifier. explain the concept of velocity and current modulations.

R.K.YADAV. 2. Explain with suitable sketch the operation of two-cavity Klystron amplifier. explain the concept of velocity and current modulations. Question Bank DEPARTMENT OF ELECTRONICS AND COMMUNICATION SUBJECT- MICROWAVE ENGINEERING(EEC-603) Unit-III 1. What are the high frequency limitations of conventional tubes? Explain clearly. 2. Explain

More information

CHAPTER 4. Practical Design

CHAPTER 4. Practical Design CHAPTER 4 Practical Design The results in Chapter 3 indicate that the 2-D CCS TL can be used to synthesize a wider range of characteristic impedance, flatten propagation characteristics, and place passive

More information

Accurate Models for Spiral Resonators

Accurate Models for Spiral Resonators MITSUBISHI ELECTRIC RESEARCH LABORATORIES http://www.merl.com Accurate Models for Spiral Resonators Ellstein, D.; Wang, B.; Teo, K.H. TR1-89 October 1 Abstract Analytically-based circuit models for two

More information

INFLUENCE OF COAXIAL CABLE ON RESPONSE OF HIGH- VOLTAGE RESISTIVE DIVIDERS

INFLUENCE OF COAXIAL CABLE ON RESPONSE OF HIGH- VOLTAGE RESISTIVE DIVIDERS The 2 th International Symposium on High Voltage Engineering, Buenos Aires, Argentina, August 27 Septemer 1, 217 INFLUENCE OF COAXIAL CABLE ON RESPONSE OF HIGH- VOLTAGE RESISTIVE DIVIDERS A. Bergman 1*,

More information

A Simplified Extension of X-parameters to Describe Memory Effects for Wideband Modulated Signals

A Simplified Extension of X-parameters to Describe Memory Effects for Wideband Modulated Signals Jan Verspecht bvba Mechelstraat 17 B-1745 Opwijk Belgium email: contact@janverspecht.com web: http://www.janverspecht.com A Simplified Extension of X-parameters to Describe Memory Effects for Wideband

More information

Experimental Analysis of Via-hole-ground Effects in Microwave Integrated Circuits at X-band

Experimental Analysis of Via-hole-ground Effects in Microwave Integrated Circuits at X-band h y POSTER 215, PRAGUE MAY 14 1 Experimental Analysis of Via-hole-ground Effects in Microwave Integrated Circuits at X-band Ghulam Mustafa Khan Junejo Microwave Electronics Lab, University of Kassel, Kassel,

More information

NATIONAL UNIVERSITY of SINGAPORE

NATIONAL UNIVERSITY of SINGAPORE NATIONAL UNIVERSITY of SINGAPORE Faculty of Engineering Electrical & Computer Engineering Department EE3104 Introduction to RF and Microwave Systems & Circuits Experiment 1 Familiarization on VNA Calibration

More information

Microwave Circuit Design and Measurements Lab. INTRODUCTION TO MICROWAVE MEASUREMENTS: DETECTION OF RF POWER AND STANDING WAVES Lab #2

Microwave Circuit Design and Measurements Lab. INTRODUCTION TO MICROWAVE MEASUREMENTS: DETECTION OF RF POWER AND STANDING WAVES Lab #2 EE 458/558 Microwave Circuit Design and Measurements Lab INTRODUCTION TO MICROWAVE MEASUREMENTS: DETECTION OF RF POWER AND STANDING WAVES Lab #2 The purpose of this lab is to gain a basic understanding

More information

Compact VNA - TR1300/1

Compact VNA - TR1300/1 Compact VNA - TR1300/1 TM Extended Specifications Frequency range: 300 khz - 1.3 GHz Wide output power adjustment range: -55 dbm to +3 dbm Dynamic range: 135 db (10 Hz IF bandwidth) typ. Measurement time

More information

Four-Element Dual-Band MIMO Antenna System for Mobile Phones

Four-Element Dual-Band MIMO Antenna System for Mobile Phones Progress In Electromagnetics Research C, Vol. 6, 47 56, 215 Four-Element Dual-Band MIMO Antenna ystem for Mobile Phones Lingsheng Yang *, Hongling Xu, Jianping Fang, and Tao Li Abstract A dual-band multiple-input-multiple-output

More information

Γ L = Γ S =

Γ L = Γ S = TOPIC: Microwave Circuits Q.1 Determine the S parameters of two port network consisting of a series resistance R terminated at its input and output ports by the characteristic impedance Zo. Q.2 Input matching

More information

Keysight Technologies Performing Impedance Analysis with the E5061B ENA Vector Network Analyzer. Application Note

Keysight Technologies Performing Impedance Analysis with the E5061B ENA Vector Network Analyzer. Application Note Keysight Technologies Performing Impedance Analysis with the E5061B ENA Vector Network Analyzer Application Note Introduction Whether you need to measure basic S-parameters or analyze device or circuit

More information

Department of Electrical and Computer Engineering ECE332. Lab 3: High Frequency Measurements

Department of Electrical and Computer Engineering ECE332. Lab 3: High Frequency Measurements Department of Electrical and Computer Engineering ECE332 Version: 1.3.1 Revised: April 30, 2011 Contents 1 Pre-Lab Assignment 2 2 Introduction 2 2.1 Vector Network Analyzer.............................

More information

Advanced Signal Integrity Measurements of High- Speed Differential Channels

Advanced Signal Integrity Measurements of High- Speed Differential Channels Advanced Signal Integrity Measurements of High- Speed Differential Channels September 2004 presented by: Mike Resso Greg LeCheminant Copyright 2004 Agilent Technologies, Inc. What We Will Discuss Today

More information

Two-Port Measurements and S-Parameters

Two-Port Measurements and S-Parameters TwoPort Measurements and SParameters Network analyzers are the fundamental instrument for characterization of the devices and components used in RF and microwave systems Network analyzers were briefly

More information

Dr.-Ing. Ulrich L. Rohde

Dr.-Ing. Ulrich L. Rohde Dr.-Ing. Ulrich L. Rohde Noise in Oscillators with Active Inductors Presented to the Faculty 3 : Mechanical engineering, Electrical engineering and industrial engineering, Brandenburg University of Technology

More information

A New Noise Parameter Measurement Method Results in More than 100x Speed Improvement and Enhanced Measurement Accuracy

A New Noise Parameter Measurement Method Results in More than 100x Speed Improvement and Enhanced Measurement Accuracy MAURY MICROWAVE CORPORATION March 2013 A New Noise Parameter Measurement Method Results in More than 100x Speed Improvement and Enhanced Measurement Accuracy Gary Simpson 1, David Ballo 2, Joel Dunsmore

More information

STUDY OF ARTIFICIAL MAGNETIC MATERIAL FOR MICROWAVE APPLICATIONS

STUDY OF ARTIFICIAL MAGNETIC MATERIAL FOR MICROWAVE APPLICATIONS International Journal of Advances in Materials Science and Engineering (IJAMSE) Vol., No.,July 3 STUDY OF ARTIFICIAL MAGNETIC MATERIAL FOR MICROWAVE APPLICATIONS H. Benosman, N.Boukli Hacene Department

More information

Agilent 86030A 50 GHz Lightwave Component Analyzer Product Overview

Agilent 86030A 50 GHz Lightwave Component Analyzer Product Overview Agilent 86030A 50 GHz Lightwave Component Analyzer Product Overview 2 Characterize 40 Gb/s optical components Modern lightwave transmission systems require accurate and repeatable characterization of their

More information

High Power, Magnet-free, Waveguide Based Circulator Using Angular-Momentum Biasing of a Resonant Ring

High Power, Magnet-free, Waveguide Based Circulator Using Angular-Momentum Biasing of a Resonant Ring SLAC-R-1080 High Power, Magnet-free, Waveguide Based Circulator Using Angular-Momentum Biasing of a Resonant Ring Jeffrey Neilson and Emilio Nanni August 18, 2017 Prepared for Calabazas Creek Research,

More information

Using the LC-Lumped Element Model for Transmission Line Experiments

Using the LC-Lumped Element Model for Transmission Line Experiments Session 2526 Using the LC-Lumped Element Model for Transmission Line Experiments F. Jalali Electronic Engineering Technology Department Fort Valley State University Introduction An array of cascaded lumped-element

More information

Experiment 03 - Automated Scalar Reectometry Using BenchVue

Experiment 03 - Automated Scalar Reectometry Using BenchVue ECE 451 Automated Microwave Measurements Laboratory Experiment 03 - Automated Scalar Reectometry Using BenchVue 1 Introduction After our encounter with the slotted line, we are now moving to a slightly

More information

MEASUREMENT AND QUANTITATIVE EVALUATION OF INVERTER-INDUCED BEARING CURRENTS

MEASUREMENT AND QUANTITATIVE EVALUATION OF INVERTER-INDUCED BEARING CURRENTS XX IMEKO World Congress Metrology for Green Growth Septemer 9 14, 2012, Busan, Repulic of Korea MEASUREMENT AND QUANTITATIVE EVALUATION OF INVERTER-INDUCED BEARING CURRENTS Dušan Agrež, Gregor Vidmar,

More information

Measurements 2: Network Analysis

Measurements 2: Network Analysis Measurements 2: Network Analysis Fritz Caspers CAS, Aarhus, June 2010 Contents Scalar network analysis Vector network analysis Early concepts Modern instrumentation Calibration methods Time domain (synthetic

More information

Application of the Ansoft Serenade 7.0 PC Software in a Wireless Course

Application of the Ansoft Serenade 7.0 PC Software in a Wireless Course Session 2520 Application of the Ansoft Serenade 7.0 PC Software in a Wireless Course Willie K. Ofosu Telecommunications Department Penn State Wilkes-Barre Abstract Wireless applications have experienced

More information

Investigation of a Voltage Probe in Microstrip Technology

Investigation of a Voltage Probe in Microstrip Technology Investigation of a Voltage Probe in Microstrip Technology (Specifically in 7-tesla MRI System) By : Mona ParsaMoghadam Supervisor : Prof. Dr. Ing- Klaus Solbach April 2015 Introduction - Thesis work scope

More information

Cobalt Series 20 GHz EXTEND YOUR REACH TM

Cobalt Series 20 GHz EXTEND YOUR REACH TM Cobalt Series 20 GHz TM Frequency range: 100 khz - 20 GHz Wide output power range: -60 dbm to +10 dbm Dynamic range: 135 db (10 Hz IF bandwidth) typ. Measurement time per point: 10 µs per point, min typ.

More information

VVM measurement with E5061B for replacing 8508A vector voltmeter. May 2013 Agilent Technologies

VVM measurement with E5061B for replacing 8508A vector voltmeter. May 2013 Agilent Technologies VVM measurement with E5061B for replacing 8508A vector voltmeter May 2013 Agilent Technologies Overview of VVM measurement with E5061B Application discussed here Measuring the phase difference (& magnitude

More information

Aries CSP microstrip socket Cycling test

Aries CSP microstrip socket Cycling test Aries CSP microstrip socket Cycling test RF Measurement Results prepared by Gert Hohenwarter 2/18/05 1 Table of Contents TABLE OF CONTENTS... 2 OBJECTIVE... 3 METHODOLOGY... 3 Test procedures... 6 Setup...

More information

Frequency and Time Domain Representation of Sinusoidal Signals

Frequency and Time Domain Representation of Sinusoidal Signals Frequency and Time Domain Representation of Sinusoidal Signals By: Larry Dunleavy Wireless and Microwave Instruments University of South Florida Objectives 1. To review representations of sinusoidal signals

More information

Six-port scattering parameters of a three-phase mains choke for consistent modelling of common-mode and differential-mode response

Six-port scattering parameters of a three-phase mains choke for consistent modelling of common-mode and differential-mode response Six-port scattering parameters of a three-phase mains choke for consistent modelling of common-mode and differential-mode response S. Bönisch, A. Neumann, D. Bucke Hochschule Lausitz, Fakultät für Ingenieurwissenschaften

More information

Compact VNA - TR7530. Extended Specifications EXTEND YOUR REACH TM

Compact VNA - TR7530. Extended Specifications EXTEND YOUR REACH TM Compact VNA - TR7530 TM Extended Specifications Frequency range: 20 khz - 3 GHz Wide output power adjustment range: -50 dbm to +5 dbm Dynamic range: 123 db (10 Hz IF bandwidth) typ. Measurement time per

More information

ElecEng 4/6FJ4 LABORATORY MODULE #4. Introduction to Scattering Parameters and Vector Network Analyzers: Measurements of 1- Port Devices

ElecEng 4/6FJ4 LABORATORY MODULE #4. Introduction to Scattering Parameters and Vector Network Analyzers: Measurements of 1- Port Devices ElecEng 4/6FJ4 LABORATORY MODULE #4 Introduction to Scattering Parameters and Vector Network Analyzers: Measurements of 1- Port Devices I. Objectives The purpose of this module is to help the students

More information

Millimeter Signal Measurements: Techniques, Solutions and Best Practices

Millimeter Signal Measurements: Techniques, Solutions and Best Practices New Network Analyzer platform Millimeter Signal Measurements: Techniques, Solutions and Best Practices Phase Noise measurements update 1 N522XA PNA Series Network Analyzer Introducing Highest Performance

More information

Expanding Impedance Measurement to Nanoscale:

Expanding Impedance Measurement to Nanoscale: Expanding Impedance Measurement to Nanoscale: Coupling the Power of Scanning Probe Microscopy with Performance Network Analyzer (PNA) Hassan Tanbakuchi Senior Research Scientist Agilent Technologies Agilent

More information

Simulation Analysis of the Filter with Frequency Dependent Coupling Coefficients

Simulation Analysis of the Filter with Frequency Dependent Coupling Coefficients 217 Asia-Pacific Engineering and Technology Conference (APETC 217) ISBN: 978-1-6595-443-1 Simulation Analysis of the Filter with Frequency Dependent Coupling Coefficients Gang Li ABSTRACT *This paper illustrates

More information

Grundlagen der Impedanzmessung

Grundlagen der Impedanzmessung Grundlagen der Impedanzmessung presented by Michael Benzinger Application Engineer - RF & MW Agenda Impedance Measurement Basics Impedance Basics Impedance Dependency Factors Impedance Measurement Methods

More information

A Novel Dual-Band Scheme for Magnetic Resonant Wireless Power Transfer

A Novel Dual-Band Scheme for Magnetic Resonant Wireless Power Transfer Progress In Electromagnetics Research Letters, Vol. 80, 53 59, 2018 A Novel Dual-Band Scheme for Magnetic Resonant Wireless Power Transfer Keke Ding 1, 2, *, Ying Yu 1, 2, and Hong Lin 1, 2 Abstract In

More information

EC Transmission Lines And Waveguides

EC Transmission Lines And Waveguides EC6503 - Transmission Lines And Waveguides UNIT I - TRANSMISSION LINE THEORY A line of cascaded T sections & Transmission lines - General Solution, Physical Significance of the Equations 1. Define Characteristic

More information

Characterizing Electromagnetic Properties of Materials. Making Reliable Measurements at mm and Sub-mm Wavelengths

Characterizing Electromagnetic Properties of Materials. Making Reliable Measurements at mm and Sub-mm Wavelengths Characterizing Electromagnetic Properties of Materials at 110GHz and Beyond Jeffrey Hesler Shelley Begley Suren Singh Phil Bartley Virginia Diodes Inc. Agilent Technologies Agilent Technologies IMS Agenda

More information

Power over Ethernet Consortium Clause # 33 PSE Conformance Test Suite v 2.2 Report

Power over Ethernet Consortium Clause # 33 PSE Conformance Test Suite v 2.2 Report Power over Ethernet Consortium Clause # 33 PSE Conformance Test Suite v 2.2 Report UNH-IOL 121 Technology Drive, Suite 2 Durham, NH 03824 +1-603- 862-4196 Consortium Manager: Gerard Nadeau grn@iol.unh.edu

More information

product note Using Power Leveling to Control Test Port Output Power Product Note 8510XF XF Network Analyzer

product note Using Power Leveling to Control Test Port Output Power Product Note 8510XF XF Network Analyzer This literature was published years prior to the establishment of Agilent Technologies as a company independent from Hewlett-Packard and describes products or services now available through Agilent. It

More information

Understanding the Fundamental Principles of Vector Network Analysis. Application Note

Understanding the Fundamental Principles of Vector Network Analysis. Application Note Understanding the Fundamental Principles of Vector Network Analysis Application Note Table of Contents Introduction... 3 Measurements in Communications Systems... 3 Importance of Vector Measurements...

More information

Bill Ham Martin Ogbuokiri. This clause specifies the electrical performance requirements for shielded and unshielded cables.

Bill Ham Martin Ogbuokiri. This clause specifies the electrical performance requirements for shielded and unshielded cables. 098-219r2 Prepared by: Ed Armstrong Zane Daggett Bill Ham Martin Ogbuokiri Date: 07-24-98 Revised: 09-29-98 Revised again: 10-14-98 Revised again: 12-2-98 Revised again: 01-18-99 1. REQUIREMENTS FOR SPI-3

More information

. /, , #,! 45 (6 554) &&7

. /, , #,! 45 (6 554) &&7 ! #!! % &! # ( )) + %,,. /, 01 2 3+++ 3, #,! 45 (6 554)15546 3&&7 ))5819:46 5) 55)9 3# )) 8)8)54 ; 1150 IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOL. 51, NO. 6, DECEMBER 2002 Effects of DUT

More information

(a) The insertion loss is the average value of the transmission coefficient, S12 (db), in the passband (Figure 1 Label A)

(a) The insertion loss is the average value of the transmission coefficient, S12 (db), in the passband (Figure 1 Label A) Lab 6-1: Microwave Multiport Circuits In this lab you will characterize several different multiport microstrip and coaxial components using a network analyzer. Some, but not all, of these components have

More information

QUADRI-FOLDED SUBSTRATE INTEGRATED WAVEG- UIDE CAVITY AND ITS MINIATURIZED BANDPASS FILTER APPLICATIONS

QUADRI-FOLDED SUBSTRATE INTEGRATED WAVEG- UIDE CAVITY AND ITS MINIATURIZED BANDPASS FILTER APPLICATIONS Progress In Electromagnetics Research C, Vol. 23, 1 14, 2011 QUADRI-FOLDED SUBSTRATE INTEGRATED WAVEG- UIDE CAVITY AND ITS MINIATURIZED BANDPASS FILTER APPLICATIONS C. A. Zhang, Y. J. Cheng *, and Y. Fan

More information

Agilent Accessories Selection Guide For Impedance Measurements. December 2008

Agilent Accessories Selection Guide For Impedance Measurements. December 2008 Agilent Accessories Selection Guide For Impedance Measurements December 2008 Table of Contents Introduction 1 1. What are Agilent Accessories? 1 2. Types of Accessories 1 3. The Benefits of Agilent Accessories

More information

CAD of Left-handed Transmission Line Bandpass Filters

CAD of Left-handed Transmission Line Bandpass Filters PIERS ONLINE, VOL. 3, NO. 1, 27 77 CAD of Left-handed Transmission Line Bandpass Filters L. Zhu, V. K. Devabhaktuni, and C. Wang Department of ECE, Concordia University 14 de Maisonneuve West, Montreal

More information

Many devices, particularly

Many devices, particularly From March 2003 High Frequency Electronics Copyright 2003, Summit Technical Media, LLC Techniques for Pulsed S-Parameter Measurements By David Vondran Anritsu Company Many devices, particularly power Pulsed

More information

A Very Wideband Dipole-Loop Composite Patch Antenna with Simple Feed

A Very Wideband Dipole-Loop Composite Patch Antenna with Simple Feed Progress In Electromagnetics Research Letters, Vol. 60, 9 16, 2016 A Very Wideband Dipole-Loop Composite Patch Antenna with Simple Feed Kai He 1, *, Peng Fei 2, and Shu-Xi Gong 1 Abstract By combining

More information

How the Braid Impedance of Instrumentation Cables Impact PI and SI Measurements

How the Braid Impedance of Instrumentation Cables Impact PI and SI Measurements How the Braid Impedance of Instrumentation Cables Impact PI and SI Measurements Istvan Novak (*), Jim Nadolny (*), Gary Biddle (*), Ethan Koether (**), Brandon Wong (*) (*) Samtec, (**) Oracle This session

More information

"FP", "FR", "FQ" Series Bandpass Filters

FP, FR, FQ Series Bandpass Filters Description "FP", "FR", "FQ" Series Bandpass Filters The tuning instructions described on the following pages apply to all 7, 8.5, and 10 Bandpass, Notch, and Q circuit filters. Typical models and electrical

More information

Applying and Measuring Ferrite Beads, Part III ~ Measurements Kurt Poulsen, Tom Hagen and Whitham D. Reeve

Applying and Measuring Ferrite Beads, Part III ~ Measurements Kurt Poulsen, Tom Hagen and Whitham D. Reeve Applying and Measuring Ferrite Beads, Part III ~ Measurements Kurt Poulsen, Tom Hagen and Whitham D. Reeve III-1. Introduction In Part I we described ferrite beads and their applications and simple test

More information

RF and Microwave Test and Design Roadshow 5 Locations across Australia and New Zealand

RF and Microwave Test and Design Roadshow 5 Locations across Australia and New Zealand RF and Microwave Test and Design Roadshow 5 Locations across Australia and New Zealand Advanced VNA Measurements Agenda Overview of the PXIe-5632 Architecture SW Experience Overview of VNA Calibration

More information