Technical Reference InfiniBand Serial Data Cmpliance and Analysis Applicatin Methds f Implementatin (MOI) 071-2043-01 www.tektrnix.cm
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Table f Cntents Table f Cntents 1 Intrductin t RT-Eye InfiniBand Cmpliance Mdule...1 1.1 InfiniBand DDR and QDR Cmpliance Testing...1 2 Backgrund n InfiniBand Cmpliance Testing...1 2.1 Cmpliance Statements and Test Definitins (TDs)...1 2.2 Integratr List Tests fr InfiniBand...4 3 InfiniBand Driver Cmpliance Measurements (MOIs)...5 3.1 Required Equipment...5 3.2 Cnnecting t the driver under test...5 3.2.1 SMA Cnnectin...6 3.2.2 ECB pad cnnectin...7 4 Cnfiguring a Device Under Test (DUT)...7 5 Initial Oscillscpe Setup...8 6 Running the RT-Eye Sftware...9 6.1 DC Cmmn Mde Measurement MOI...10 6.2 AC Cmmn Mde Measurement MOI...11 6.3 Transmitter Peak-Peak Measurement MOI...12 6.4 Rise/Fall Time Measurements...13 6.5 Driver Jitter Measurements...15 6.6 Cmbining Driver Measurements...17 7 InfiniBand Cable Measurements...18 7.1 Required Equipment...18 7.2 Cnnecting t the Driver Under Test...18 7.3 Cnfiguring the Device Under Test (DUT)...19 7.4 Initial Oscillscpe Setup...19 7.5 Running the RT-Eye Sftware...19 7.6 Cable Cnnected Minimum Differential Vltage...19 8 Giving a Device an ID...21 9 Creating a Cmpliance Reprt...21 10 Appendix A Measurement Algrithms...21 InfiniBand Cmpliance Measurements i
Table f Cntents ii InfiniBand Cmpliance Measurements
Methds f Implementatin 1 Intrductin t RT-Eye InfiniBand Cmpliance Mdule This dcument prvides the prcedures fr making InfiniBand SDR (Single Data Rate) cmpliance measurements with Tektrnix TDS/CSA7000, DSA/DPO 70000 and TDS6000 series real time scillscpes (4 GHz mdels and abve). The InfiniBand Cmpliance Mdule (Opt. IBA) is an ptinal sftware plug-in t the RT-Eye Serial Data Cmpliance and Analysis applicatin (Opt. RTE). The InfiniBand Cmpliance mdule prvides Amplitude, Timing, and Jitter measurements described in the electrical specificatin sectins f the InfiniBand Architecture Specificatin. The IBTA-CIWG (InfiniBand Trade Assciatin - Cmpliance and Interperability Wrking Grup) has defined a suite f electrical measurements that InfiniBand devices must pass t qualify fr the InfiniBand Integratrs List (IL). Manufacturers peridically perfrm these measurements n their InfiniBand devices at InfiniBand plugfests. The RT-Eye InfiniBand Cmpliance Mdule autmates and prvides Pass/Fail limit testing n many f these required IL measurements, as well as additinal measurements that appear in the electrical specificatin. In the subsequent sectins, step-by-step prcedures are described t help yu perfrm these measurements n yur InfiniBand devices. Measurements that are required t qualify fr the IL are nted as such and appear in the IBTA CIWG Subgrup Methd f Implementatin (MOI) dcument available fr dwnlad t IBTA members at www.infinibandta.cm. 1.1 InfiniBand DDR and QDR Cmpliance Testing This dcument prvides the prcedures fr making InfiniBand SDR (Single Data Rate 2.5Gb/s) cmpliance measurements. While the InfiniBand Cmpliance Mdule des nt supprt DDR and QDR rates, cmpliance testing fr DDR and QDR rates can be perfrmed by using the Serial Analysis Mdule f RT-Eye. Setup files fr these cmpliance pints can be fund in the RT-Eye cmpliance library by selecting File > Recall > Setup > InfiniBand while in the Serial Analysis Mdule f RT-Eye. Available cmpliance test pints are TP1 and TP6 as defined in the DDR and QDR sectins f Chapter 6 f the InfiniBand specificatin. 2 Backgrund n InfiniBand Cmpliance Testing 2.1 Cmpliance Statements and Test Definitins (TDs) Cmpliance statements appear in the InfiniBand architecture specificatin. Chapter 6 driver characteristics cmpliance statement are as fllws: C6-7: All utput prts SHALL cmply with the parameters and ntes f the Table 16 Driver Characteristics using apprpriate parameters as nted. Frm cmpliance statements, the CIWG-PHY (Cmpliance and Interperability Wrking Grup Physical Layer Subgrup) has develped Test Definitins (TDs) fr measurements in Table 16. Test Definitin assertins that have been given the fllwing designatins. InfiniBand Cmpliance Measurements 1
Methds f Implementatin Table 1 Chapter 6 Driver Test Definitins (TDs) frm Table 16 f the specificatin CIWG-PHY TD Assertin V2c6-007#01 V2c6-007#02 V2c6-007#03 V2c6-007#03 V2c6-007#04 V2c6-007#04 V2c6-007#05 V2c6-007#14 V2c6-007#14 Measurement Symbl in Chap. 6, Table 16 Min Max Cmmn Mde Vltage VCM 0.5 V 1.0 V Pk-Pk Differential Vltage Vdiff Table19 1 1.6 V Disable Mde Output pk-pk Vdisable 0 85 mv Disable Mde Output max Vdisable 0 1.6 V Standby Mde Output pk-pk Vstandby 0 85 mv Standby Mde Output max Vstandby 0 1.6 V Driver Rise/Fall Time (20-80%) tdrf 100 ps AC Cmmn Mde Vltage VACCM 25 mv Driver Ttal Jitter JT Table19* Driver Deterministic l Jitter JD 0.17UI 1 Minimum Differential Pk-Pk Vltage and Jitter @ 10-12 BER is dependent n Table 19 in Chapter 6 f the InfiniBand specificatin. Test Pints (cmpliance pints) are defined based n where in the system the measurement is being made. 2 InfiniBand Cmpliance Measurements
Methds f Implementatin Figure 1 Cmpliance Pints frm the InfiniBand Specificatin Chapter 7 Cable characteristics cmpliance statement is as fllws: C7-16: Cable assemblies t be used fr InfiniBand shall meet the electrical requirements listed in Table 30 fr all link widths fr prt type 1. Table 2 Chapter 7 Cable Test Definitins (TDs) frm Table 30 f the Specificatin CIWG-PHY TD Assertin Measurement Symbl in Min Max V2c7-002#09 Cable Cnnectr Near End Crss Talk V2c7-002#010 Cable Assembly Min Differential Vltage VCut 316mV V2c07-016#01 V2c07-016#02 Cable Differential Impedance Zdca(nm) V2c07-016#05 Cable Cnnectin Jitter Jca.25UI InfiniBand Cmpliance Measurements 3
Methds f Implementatin 2.2 Integratr List Tests fr InfiniBand Table 3 shws the measurements that are available in the RT-Eye InfiniBand Cmpliance Mdule and hw they map t electrical measurements in Chapter 6 and Chapter 7 f the InfiniBand Architecture Specificatin. Als shwn is whether r nt the measurement is an Integratr List (IL) test. IL tests are required t have yur device certified as InfiniBand cmpliant. Other measurements are useful, but nt required. Table 3 RT-Eye Measurements Mapped t Chapter 6 and Chapter 7 Measurements Measurement Integratr List Tests Electrical Driver Measurements (Chapter 6 f IBA Specificatin) Wavefrm Eye Height Yes Yes Wavefrm Eye Width N Yes Cmmn Mde DC Vltage N Yes Cmmn Mde AC Vltage N Yes Transmitter Peak-Peak Vltage Yes Yes Transmitter Transitin Time (20-80 Rise/FallTime) Driver Ttal Jitter @ e -12 BER Yes Yes Yes Electrical Cable Measurements (Chapter 7 f IBA Specificatin) Cable Cnnected Eye Height N Yes Cable Cnnected Eye Width N Yes Cable Cnnectin Jitter (TIE) Yes Yes Cable Cnnectr Minimum Differential Vltage Cable Cnnectr Near End CrssTalk Cable Differential Impedance Yes Yes Yes Available in RT-Eye InfiniBand Cmpliance Mdule Yes Yes N (Use TDS8000 series sampling scillscpes) 4 InfiniBand Cmpliance Measurements
Methds f Implementatin 3 InfiniBand Driver Cmpliance Measurements (MOIs) This sectin applies Methds f Implementatin (MOI) t the Test Definitins as they relate t Tektrnix real-time scillscpes, prbing slutins, and RT-Eye Serial Cmpliance and Analysis sftware. 3.1 Required Equipment The fllwing equipment is required t take the measurements in this dcument. Tektrnix TDS/CSA7000, DSA/DPO70000 and TDS6000 series real time scillscpe (6 GHz BW r abve) with RT-Eye sftware (Opt. RTE) and InfiniBand Cmpliance Mdule (IBA). Prbes prbing cnfiguratin is MOI specific. Refer t each MOI fr prper prbe cnfiguratin. InfiniBand breakut cable (available frm Fujikura Ltd.) Figure 2 Fujikura InfiniBand 4X Break-ut harness 3.2 Cnnecting t the driver under test The first step is t prbe the link. Cnnect yur prbes based n ne f the fur methds described belw. Table 4 Example prbing cnfiguratins fr an InfiniBand Link InfiniBand Cmpliance Measurements 5
Methds f Implementatin 3.2.1 SMA Cnnectin 1. Tw TCA-SMA inputs using SMA cables (Ch1) and (Ch3) The differential signal is created by the RT-Eye sftware frm the math wavefrm Ch1-Ch3. The Cmmn mde AC measurement is als available in this cnfiguratin frm the cmmn mde wavefrm (Ch1+Ch3)/2. This prbing technique requires breaking the link and terminating int the 50 Ω/side terminatin int the scillscpe. While in this mde, the InfiniBand SerDes will transmit the 320 bit Jitter test pattern designed t maximize data dependent jitter. Ch-Ch deskew is required using this technique because tw channels are used. 2. One P7300SMA Series differential active prbe (Ch1) The differential signal is measured acrss the terminatin resistrs inside the P7300SMA Series prbe. This prbing technique requires breaking the link. While in this mde, the InfiniBand SerDes will transmit the 320 bit Jitter test pattern designed t maximize data dependent jitter. Matched cables are prvided with the P7300SMA prbe t avid intrducing de-skew int the system. Only ne channel f the scillscpe is used. Prbe Cnfiguratin A SMA Psued-differential Prbe Cnfiguratin B SMA Input Differential Prbe 6 InfiniBand Cmpliance Measurements
Methds f Implementatin 3.2.2 ECB pad cnnectin 3. Tw single ended active prbes (Ch1) and (Ch3) The differential signal is created by the RT-Eye sftware frm the math wavefrm Ch1-Ch3. The Cmmn mde AC measurement is als available in this cnfiguratin frm the cmmn mde wavefrm (Ch1+Ch3)/2. This prbing technique can be used fr either a live link that is transmitting data, r a link terminated int a dummy lad. In bth cases, the single ended signals shuld be prbed as clse as pssible t the terminatin resistrs n bth sides with the shrtest grund cnnectin pssible. Ch-Ch deskew is required using this technique because tw channels are used. 4. One Differential prbe The differential signal is measured directly acrss the terminatin resistrs. This prbing technique can be used fr either a live link that is transmitting data, r a link terminated int a dummy lad. In bth cases, the signals shuld be prbed as clse as pssible t the terminatin resistrs. A single channel f the scillscpe is used, s de-skew is nt necessary. Tw differential prbes can be used t create prbing cnfiguratin shwn in cnfiguratin C abve. Prbe Cnfiguratin C Tw Single Ended Active Prbes Prbe Cnfiguratin D One Differential Active Prbe 4 Cnfiguring a Device Under Test (DUT) T perfrm cmpliance measurements n an InfiniBand link, it is required that the link be cnfigured t generate Back t Back TS1 (BTBTS1) test pattern. The fllwing describes varius methds f btaining a TS1 signal ut f nes HCA/TCA. Beacn Methd. The InfiniBand beacn signal is the default signal which is bradcast n a repeating basis when there is n frm f link established. The Beacn is cmprised f 100 msec f sleep state fllwed by 1 msec f TS1 s back t back. A simple edge trigger n an instrument is capable f triggering n the leading edge f this 1 msec interval f the TS1 s. It is recmmended, hwever that ne use a delayed trigger f at least 50 μsec ensure that the RC ramping fund n the leading edge f this TS1 beacn is excluded frm any measurement. The trigger menu setup frm TDS scillscpes t establish this delay is shwn in Figure 3. InfiniBand Cmpliance Measurements 7
Methds f Implementatin Figure 3 Beacn methd Lp-Back Methd. This methd lps back the transmit line frm an unused lane int the receive lane 0 (Figure 4). This results in a peridic (100 msec) link state training machine stimulus int IbtxIn(0) which triggers a state change int the LTSM s "cnfiguratin" state. The LTSM will bradcast 100 msec f TS1 s in a back t back frm. This is the simplest methd fr generating the BTBTS1 pattern. Nte: The LTSM s Cnfig.RcvrCfg state generally cycles back arund immediately int the Cnfig.debunce state in this cnfiguratin with n nn-deterministic intervals intrduced. Sme systems handle the transitin thrugh the LinkDwn Default Idle state differently, and this transitin can lead t a shrt nn-deterministic delay f ~30 msec befre recycling int the Cnfig.debunce state. In these systems, use the Instruments timeut trigger capability (dial in 10mSec timeut) cmbined with a trigger delay t ensure that this regin f nn-determinstic pre Dnfig.debunce idle state des nt appear in the regin f data ver which jitter cmputatins wuld ccur. Failure t d this can result in an insufficient number f pattern repeats warning. Figure 4 Lp back methd 5 Initial Oscillscpe Setup After hking up t the DUT with the prper prbing cnfiguratin fr the test, press the DEFAULT frntpanel buttn and then the AUTOSET buttn t display the serial data bit stream. 8 InfiniBand Cmpliance Measurements
Methds f Implementatin 6 Running the RT-Eye Sftware 1. G t File > Run Applicatin > RT-Eye Serial Cmpliance and Analysis. Figure 5 Default menu f the RT-Eye sftware Figure 5 shws the scillscpe display. The default mde f the sftware is the Serial Analysis mdule (Opt. RTE). This sftware is intended fr generalized Serial Data analysis n 8B/10B encded cpper links. 2. Select the InfiniBand Cmpliance Mdule frm the Mdules drpdwn list. Figure 6 Chsing the InfiniBand Cmpliance Mdule Nte: If InfiniBand des nt appear in the list, the InfiniBand Cmpliance Mdule (Opt. IBA) has nt been installed. The rest f this dcument details use f the RT-Eye InfiniBand Cmpliance Mdule t perfrm electrical cmpliance measurements. Online Help is available under the Help Menu fr the sftware when it is in the Serial Analysis Mdule. Fr infrmatin nt cntained in this dcument, refer t the RT-Eye nline help r the printable frmat. InfiniBand Cmpliance Measurements 9
Methds f Implementatin 6.1 DC Cmmn Mde Measurement MOI This test checks DC cmmn mde vltage frm the driver using Tektrnix real-time scillscpe, prbes, and RT-Eye cmpliance sftware. This test checks the cmmn mde vltage level f the transmitter utput signal, is defined fr a single physical bit lane, and must be repeated fr each bit lane f each prt n the DUT. TD Assertin cvered: V2c6-007. VCM is defined in Vl. 2, Sectin 6.4, table Differential Output DC Characteristics, Maximum VCM=1.0 V and Minimum VCM=0.50 V. Integratr List Test: N. DUT Signaling: The test is perfrmed n the TS1 rdered-sets captured by the scillscpe while the DUT is in the Plling Active state described in sectin 3.3. Prbing Cnfiguratin: Prbe Cnfiguratin C - Use tw active prbes. Test Prcedure is as fllws: Cnnect the prbe fr the psitive leg f the differential t Ch1 and the negative leg t Ch3. In the RT-Eye InfiniBand cmpliance mdule, select Single Ended as the Prbe Type. Select CM Vltage as the measurement. Select the Cnfigure Buttn t access the Cnfiguratin menu. Select the Surce Tab and set up that menu as fllws: Live as the Surce Type. Select Ch1, Ch3 as the D+, D-. Select the Start buttn. The RT-Eye applicatin gives measurement results alng with a Pass /Fail indicatin f the measurement. See Figure 7. Figure 7 Result f the DC Cmmn Mde Measurement 10 InfiniBand Cmpliance Measurements
6.2 AC Cmmn Mde Measurement MOI Methds f Implementatin This test checks the AC cmmn mde vltage frm the driver using a Tektrnix real-time scillscpe and RT-Eye sftware. This test checks the cmmn mde vltage level f the transmitter utput signal, is defined fr a single physical bit lane, and must be repeated fr each bit lane f each prt n the DUT. TD Assertin cvered: Nne. VCM is defined in Vl. 2, Sectin 6.4, table Differential Output DC Characteristics, Maximum VACCM =25 mv RMS. Integratr List Test: N. DUT Signaling: The test is perfrmed n the TS1 rdered-sets captured by the scillscpe while the DUT is in the Plling Active state described in sectin 3.3. Prbing Cnfiguratins (frm sectin 3.2): Cnfiguratin A Use TCA-SMA cnnectrs with blcking capacitrs. Cnfiguratin C Use tw active prbes. Test Prcedure as fllws: Cnnect the prbe fr the psitive leg f the differential t Ch1 and the negative leg t Ch3. In the RT-Eye InfiniBand cmpliance mdule, select Single Ended as the Prbe Type. Select AC CM Vltage as the measurement. Select the Cnfigure buttn t access the Cnfiguratin menus. Select the Surce tab and set up that menu as fllws: Live as the Surce Type. Select Ch1, Ch3 as the D+, D-. Select the Start buttn. The RT-Eye applicatin gives measurement results alng with a Pass /Fail indicatin f the measurement. See Figure 8. Figure 8 Result f AC Cmmn Mde Measurement InfiniBand Cmpliance Measurements 11
Methds f Implementatin 6.3 Transmitter Peak-Peak Measurement MOI This test checks the Pk-Pk vltage frm the driver using a Tektrnix real-time scillscpe and RT-Eye sftware. This test checks the Pk-Pk differential vltage level f the transmitter utput signal, is defined fr a single physical bit lane, and must be repeated fr each bit lane f each prt n the DUT. An eye diagram is displayed t give additinal infrmatin n the health f the transmitter. TD Assertin cvered: V2c6-007#02 Vdiff is defined in Vl. 2, Sectin 6.4, table Differential Output Differential Pk-Pk Vltage Characteristics. Maximum Vdiff = 1.6 V Pk-Pk, Minimum Vdiff is dependent n the test pint. Table 5 Chapter 6 Test Pint Descriptins, frm Table 19 f the Specificatin* Test pint Descriptin Unsigned Wavefrm Amplitude (IEEE181) Eye Width TP1 Transmitted signal at the bard side f the backplane cnnectr.800 250 ps TP2 Transmitted signal at the backplane side f the backplane cnnectr.750 240 ps TP3 Received signal at the bard side f the cnnectr.316 150 ps TP4 Received signal at the backplane side f the cnnectr.335 160 ps TP5 Transmitted signal at the bard side f the cable cnnectr.890 250 ps TP6 Transmitted signal at the cable side f the cable cnnectr.820 240 ps TP7 Received signal at the bard side f the cable cnnectr.282 150 ps TP8 Received signal at the cable side f the cable cnnectr.300 160 ps TP9 Transmitted signal at the bard side f the pluggable interface scket.890 296 ps TP10 Received signal at the bard side f the pluggable interface scket.282 126 ps * Measurements will require de-embedding r ther cmpensatin technique fr prperties f measurement fixtures and test equipment. Integratr List Test: Yes DUT Signaling: The test is perfrmed n the TS1 rdered-sets captured by the scillscpe while the DUT is in the Plling Active state described in sectin 3.3. Prbing Cnfiguratins (frm sectin 3.2): Cnfiguratin A Use TCA-SMA cnnectrs with blcking capacitrs. Cnfiguratin B Use P7300SMA Series prbe (recmmended). Cnnect via prt breakut (Fujikura fixture in 4X case) t SMA inputs f prbe cnfiguratin. Test Prcedure is as fllws: Cnnect the SMA cnnectrs frm the Break-ut Harness t Ch1 and Ch3 f the scillscpe, r t Ch1 depending n the prbe cnfiguratin used. In the RT-Eye InfiniBand cmpliance mdule, select Single Ended as the Prbe Type if using prbe cnfiguratin (A), r Differential as the Prbe Type if using prbe cnfiguratin (B). 12 InfiniBand Cmpliance Measurements
Methds f Implementatin Select Eye Height and Differential Vltage as the measurements. Select the Cnfigure buttn t access the Cnfiguratin menus. Select the Surce tab and set up that menu as fllws: Live as the Surce Type. Select Ch1, Ch3 as the D+, D- if using prbe cnfiguratin (A) r select Ch1 if using prbe cnfiguratin (B). Select the Meas Params tab and set up that menu as fllws: TP6 (Transmitted signal at the cable side f the cable cnnectr) as the Test Pint. Stand By r Disable as the Differential Vltage Mde. Select the Start buttn. The RT-Eye applicatin gives measurement results alng with a Pass /Fail indicatin f the measurement. See Figure 9. Figure 9 - Result f the Differential Amplitude Measurement The last tw lines reprt Pass/Fail n Min and Max f Diff Vltage. The wavefrm is als cmpared t a wavefrm mask where the vertical and hrizntal dimensins are defined by amplitude and jitter eye width. 6.4 Rise/Fall Time Measurements This test checks the Transitin Times frm the driver using Tektrnix real-time scillscpe and RT-Eye sftware. This test checks the 20-80% Rise/Fall times f the transmitter utput signal and cmpares them against the specified limits. This test is defined fr a single physical bit lane and must be repeated fr each bit lane f each prt n the DUT. TD Assertin cvered: V2c6-007#05 tdrf is defined in Vl. 2, Sectin 6.4, Table 16 f the specificatin, Characteristics Minimum tdrf = 100 ps. InfiniBand Cmpliance Measurements 13
Methds f Implementatin Integratr List Test: Yes DUT Signaling: The test is perfrmed n the TS1 rdered-sets captured by the scillscpe while the DUT is in the Plling Active state described in sectin 3.3. Prbing Cnfiguratins (frm sectin 3.2): Cnfiguratin A Use TCA-SMA cnnectrs with blcking capacitrs. Cnfiguratin B Use P7300SMA Series prbe (recmmended). Cnnect via prt breakut (Fujikura fixture in 4X case) t SMA inputs f prbe cnfiguratin. Test Prcedure is as fllws: Cnnect the SMA cnnectrs frm the Break-ut Harness t Ch1 and Ch3 f the scillscpe, r t Ch1 depending n the prbe cnfiguratin used. In the RT-Eye InfiniBand cmpliance mdule, select Single Ended as the Prbe Type if using prbe cnfiguratin (A) r Differential as the Prbe Type if using prbe cnfiguratin (B). Select Eye Height and Differential Vltage as the measurements. Select the Cnfigure buttn t access the Cnfiguratin menus. Select the Surce tab and set up that menu as fllws: Live as the Surce Type. Select Ch1, Ch3 as the D+, D- ptin if using prbe cnfiguratin (A), r select Ch1 if using prbe cnfiguratin (B). Select the Meas Params tab and set up that menu as fllws: TP6 (Transmitted signal at the cable side f the cable cnnectr) as the Test Pint. Stand By r Disable as the Differential Vltage Mde. Select the Start buttn. The RT-Eye applicatin gives measurement results alng with a Pass /Fail indicatin f the measurement. See Figure 10. Figure 10 - Results f Transitin Time Test 14 InfiniBand Cmpliance Measurements
6.5 Driver Jitter Measurements Methds f Implementatin This test checks the Ttal Jitter frm the driver using Tektrnix real-time scillscpe and RT-Eye sftware. This test checks the values f Ttal Jitter @ 10-12 BER and Deterministic Jitter and cmpares them against the specified limits. This test is defined fr a single physical bit lane and must be repeated fr each bit lane f each prt n the DUT. TD Assertin cvered: V2c6-007#14 Ttal Jitter (J T ) and Deterministic Jitter (JD) fr the driver are defined in Vl. 2, Sectin 6.4, Table 16 Driver Characteristics. Jitter Eye Opening at different cmpliance pints are defined in Table 5. Integratr List Test: Yes DUT Signaling: The test is perfrmed n the TS1 rdered-sets captured by the scillscpe while the DUT is in the Plling Active state described in sectin 3.3. Prbing Cnfiguratins (frm sectin 3.2): Cnfiguratin A Use TCA-SMA cnnectrs with blcking capacitrs. Cnfiguratin B Use P7300SMA Series prbe (recmmended). Cnnect via prt breakut (Fujikura fixture in 4X case) t SMA inputs f prbe cnfiguratin. Test Prcedure is as fllws: Cnnect the SMA cnnectrs frm the Break-ut Harness t Ch1 and Ch3 f the scillscpe, r t Ch1 depending n the prbe cnfiguratin used. In the RT-Eye InfiniBand cmpliance mdule, select Single Ended as the Prbe Type if using prbe cnfiguratin (A) r Differential as the Prbe Type if using prbe cnfiguratin (B). Select Jitter @ BER as the measurement. Select the Cnfigure buttn t access the Cnfiguratin menus. Select the Surce tab and set up that menu as fllws: Live as the Surce Type. Select Ch1, Ch3 as the D+, D- ptin if using prbe cnfiguratin (A), r select Ch1 if using prbe cnfiguratin (B). Select the Meas Params tab and set up that menu as fllws: TP6 (Transmitted signal at the cable side f the cable cnnectr) as the Test Pint. Stand By r Disable as the Differential Vltage Mde. Select the Start buttn. The RT-Eye applicatin gives measurement results alng with a Pass /Fail indicatin f the measurement. See Figure 11. InfiniBand Cmpliance Measurements 15
Methds f Implementatin Figure 11 - Results f the Jitter Eye Opening @ 10-12 BER Measurement The results f the Ttal Jitter can be directly cmpared t Table 5, where: Ttal Jitter + Jitter Eye Opening = 400ps (1UI) Deterministic Jitter can be viewed by selecting it in the Measurement Details menu as shwn in Figure 12. Figure 12 Deterministic jitter results 16 InfiniBand Cmpliance Measurements
6.6 Cmbining Driver Measurements Methds f Implementatin Using the RT-Eye InfiniBand Cmpliance Mdule (Opt. IBA), all measurements can be made in a single acquisitin. Measurements that can be cmbined int a single acquisitin are as fllws: Eye Height/Eye Width Rise Time/Fall Time Unit Interval Jitter @ BER (RJ, DJ, TJ, and Jitter Eye Opening) Differential Vltage Figure 13 Cmbining all measurements int a single test InfiniBand Cmpliance Measurements 17
Methds f Implementatin 7 InfiniBand Cable Measurements 7.1 Required Equipment The fllwing equipment is required t make the measurements in this dcument. TDS/CSA7404 r TDS6000 OR DPO/DSA70000 series scillscpe equipped with TDS RT-Eye sftware (Opt. RTE) and InfiniBand Cmpliance Mdule (IBA). DTG5000, AWG710 r AWG7102 signal generatr. Prbes Prbing cnfiguratin is MOI specific. Refer t each MOI fr prper prbe cnfiguratin. InfiniBand cable test fixture (available frm Gre; see Figure 14) Figure 14 Gre cable test fixture 7.2 Cnnecting t the Driver Under Test The cnnectin methd t the Device Under Test is shwn in Figure 15. Lw Jitter (<30pSec Pk) Signal Surce 2.5Gb/Sec Aggressr Signal IB Cnnectr Figure 15 Test Setup fr IB cable testing This test setup shws the use f a P7300SMA Series Differential Active prbe with SMA inputs. Alternatively, each leg f the differential signal being tested can be cnnected t Ch1 and Ch3 f the scillscpe and the measurement can be made in a pseud-differential manner. 18 InfiniBand Cmpliance Measurements
7.3 Cnfiguring the Device Under Test (DUT) Methds f Implementatin The signal generatr is set up t transmit a repeating CJTPAT (Cmpliance Jitter Test Pattern). 7.4 Initial Oscillscpe Setup After cnnecting t the DUT with the prper prbing cnfiguratin fr the test, press the DEFAULT frntpanel buttn and then the AUTOSET buttn t display the serial data bit stream. 7.5 Running the RT-Eye Sftware G t File > Run Applicatin > RT-Eye Serial Cmpliance and Analysis. The result shuld be similar t Figure 3. 7.6 Cable Cnnected Minimum Differential Vltage This test checks cable assembly minimum differential vltage using Tektrnix real-time scillscpe and signal surce. This test checks the minimum differential utput vltage peak t peak f the Cable cnnectr utput signal. This test is defined fr a single physical bit lane and must be repeated fr each bit lane n the DUT (differential pair f cable). TD Assertin cvered: V2c7-002#010 Ttal Jitter (J T ) and Deterministic Jitter (JD) fr the driver are defined in Vl. 2, Sectin 6.4, Table 16 Driver Characteristics. Jitter Eye Opening at different cmpliance pints are defined in Table 19 f the specificatin. Ntes: The test applies t the cable cnnectr and t the cable assembly (ambiguusly defined in the InfiniBand Architecture Specificatin 1.1) Differential Amplitude = 1 Vpp VCut (peak-peak), minimum differential utput Vltage (peak-peak) limits defined in Vl.2, Sectin 7.9.2, table Cable assembly electrical perfrmance requirements. Vmeas is the minimum differential vltage measured at the center f the eye Diagram (Eye Height). Test must be perfrmed n each lane n the DUT. Integratr List Test: Yes DUT Signaling: The test is perfrmed n the CJTPAT Ordered Sets captured by the scillscpe. The vltage measurement is taken fr 1 Vpp Fibre Channel CJTPAT stimulus fr 1000 wavefrms r equivalent. Prbing Cnfiguratins (frm sectin 3.2): Cnfiguratin A Use TCA-SMA cnnectrs with blcking capacitrs. Cnfiguratin B Use P7300SMA Series prbe (recmmended). Cnnect via prt breakut (Fujikura fixture in 4X case) t SMA inputs f prbe cnfiguratin. InfiniBand Cmpliance Measurements 19
Methds f Implementatin Test Prcedure: Cnnect SMA cnnectrs frm Break-ut Harness t Ch1 and Ch3 f the scillscpe, r t Ch1 depending n the prbe cnfiguratin used. In the RT-Eye InfiniBand cmpliance mdule, select Single Ended as the Prbe Type if using prbe cnfiguratin (A) r Differential as the Prbe Type if using prbe cnfiguratin (B). Select Cable Assembly frm the Test drpdwn. Select Eye Width/Eye Height and TIE Jitter as the measurement. Select the Cnfigure buttn t access the Cnfiguratin menus. Select the Surce tab and set up that menu as fllws: Live as the Surce Type. Select Ch1, Ch3 as the D+, D- if using prbe cnfiguratin (A) r select Ch1 if using prbe cnfiguratin (B). Select the Start buttn. The RT-Eye applicatin gives measurement results alng with a Pass /Fail indicatin f the measurement. See Figure 16. Figure 16 - Results f the Cable Cnnected Minimum Differential test 20 InfiniBand Cmpliance Measurements
8 Giving a Device an ID Methds f Implementatin The InfiniBand Cmpliance Mdule prvides a graphical user interface fr entering a Device ID and Descriptin. Data entered here will appear n the cmpliance reprt and is recmmended fr device tracking. 9 Creating a Cmpliance Reprt T create a cmpliance reprt, select Utilities > Reprts. The Reprt Generatr utility can create a cmplete reprt f the cmpliance test. 10 Appendix A Measurement Algrithms Refer t the RT-Eye sftware s nline help (OLH) fr measurement Algrithm infrmatin. InfiniBand Cmpliance Measurements 21