Keysight N5990A Test Automation Software Platform for USB. User Guide

Transcription

1 Keysight N5990A Test Automation Software Platform for USB User Guide

2 Notices Keysight Technologies 2017 No part of this manual may be reproduced in any form or by any means (including electronic storage and retrieval or translation into a foreign language) without prior agreement and written consent from Keysight Technologies as governed by United States and international copyright laws. Manual Part Number N Edition Edition 2.0, December 2017 Keysight Technologies Deutschland GmbH Herrenberger Strasse 130, Böblingen, Germany Technology Licenses The hard ware and/or software described in this document are furnished under a license and may be used or copied only in accordance with the terms of such license. U.S. Government Rights The Software is commercial computer software, as defined by Federal Acquisition Regulation ( FAR ) Pursuant to FAR and and Department of Defense FAR Supplement ( DFARS ) , the U.S. government acquires commercial computer software under the same terms by which the software is customarily provided to the public. Accordingly, Keysight provides the Software to U.S. government customers under its standard commercial license, which is embodied in its End User License Agreement (EULA), a copy of which can be found at The license set forth in the EULA represents the exclusive authority by which the U.S. government may use, modify, distribute, or disclose the Software. The EULA and the license set forth therein, does not require or permit, among other things, that Keysight: (1) Furnish technical information related to commercial computer software or commercial computer software documentation that is not customarily provided to the public; or (2) Relinquish to, or otherwise provide, the government rights in excess of these rights customarily provided to the public to use, modify, reproduce, release, perform, display, or disclose commercial computer software or commercial computer software documentation. No additional government requirements beyond those set forth in the EULA shall apply, except to the extent that those terms, rights, or licenses are explicitly required from all providers of commercial computer software pursuant to the FAR and the DFARS and are set forth specifically in writing elsewhere in the EULA. Keysight shall be under no obligation to update, revise or otherwise modify the Software. With respect to any technical data as defined by FAR 2.101, pursuant to FAR and and DFARS , the U.S. government acquires no greater than Limited Rights as defined in FAR or DFAR (c), as applicable in any technical data. Warranty THE MATERIAL CONTAINED IN THIS DOCUMENT IS PROVIDED "AS IS," AND IS SUBJECT TO BEING CHANGED, WITHOUT NOTICE, IN FUTURE EDITIONS. FURTHER, TO THE MAXIMUM EXTENT PERMITTED BY APPLICABLE LAW, KEYSIGHT DISCLAIMS ALL WARRANTIES, EITHER EXPRESS OR IMPLIED WITH REGARD TO THIS MANUAL AND ANY INFORMATION CONTAINED HEREIN, INCLUDING BUT NOT LIMITED TO THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. KEYSIGHT SHALL NOT BE LIABLE FOR ERRORS OR FOR INCIDENTAL OR CONSEQUENTIAL DAMAGES IN CONNECTION WITH THE FURNISHING, USE, OR PERFORMANCE OF THIS DOCUMENT OR ANY INFORMATION CONTAINED HEREIN. SHOULD KEYSIGHT AND THE USER HAVE A SEPARATE WRITTEN AGREEMENT WITH WARRANTY TERMS COVERING THE MATERIAL IN THIS DOCUMENT THAT CONFLICT WITH THESE TERMS, THE WARRANTY TERMS IN THE SEPARATE AGREEMENT WILL CONTROL. Safety Notices CAUTION A CAUTION notice denotes a hazard. It calls attention to an operating procedure, practice, or the like that, if not correctly performed or adhered to, could result in damage to the product or loss of important data. Do not proceed beyond a CAUTION notice until the indicated conditions are fully understood and met. WARNING A WARNING notice denotes a hazard. It calls attention to an operating procedure, practice, or the like that, if not correctly performed or adhered to, could result in personal injury or death. Do not proceed beyond a WARNING notice until the indicated conditions are fully understood and met. 2 Keysight N5990ATest Automation Software Platform for USB User Guide

3 Contents 1 Introduction What s in this Chapter 8 Overview of this Guide 8 Document History 9 First Edition (May, 2015) 9 Second Edition (April, 2017) 9 Third Edition (January, 2015) 9 Fourth Edition (September, 2015) 9 Fifth Edition (July, 2016) 9 Sixth Edition (May, 2017) 9 Seventh Edition (October, 2017) 9 Eighth Edition (December, 2017) 9 2 N5990A Overview Test Automation Software Platform 12 3 Using Software Test Station Configuration 14 Test Station Selection 14 Test Station Configuration 16 Test Station Configuration 17 Using Keysight IO VISA Connection Expert 18 Keysight N5990A Test Automation Software Platform for USB User Guide 3

4 Contents 4 USB Computer Bus Test Application Starting Test Station 20 Configuring DUT 21 Selecting, Modifying and Running Tests 23 System Calibration 25 Modifying Parameters 25 Running Procedures 26 Results 28 Runtime Data Display 28 Results Workbook 31 Smiley's Representation 33 Oscilloscope Transmitter Test Integration 34 Using the Software 34 Troubleshooting 35 Wrong version of the transmitter test application 36 Error message at startup and connection fails 36 Transmitter test application and oscilloscope seem to hang 37 Introd uction 40 Supported Hard ware Configurations 41 ValiFrame USB Station Configuration 41 Starting ValiFrame USB 48 Configuring the USB DUT 49 High Speed Procedure Description 63 Calibration 63 Receiver 70 Super Speed Module Procedure Description 81 Calibration 81 Receiver Keysight N5990A Test Automation Software Platform for USB User Guide

5 Contents 5 Troubleshooting and Support 6 Appendix Super Speed Plus Mod ule Proced ure Description 218 Calibration 218 Receiver 243 Log List and File 278 Data Structure and Backup 280 ValiFrame Data Structure 280 ValiFrame Backup 281 Remote Interface 282 Introduction 282 Interface Description 282 Using the Remote Interface 284 Results Format 288 Controlling Loop Parameters and Looping Over Selected Tests 291 Connect() 292 SetToDefault() 293 Init() 293 GetParameterList() and GetParameterValues() 293 SetNextValue() 293 Disconnect() 293 IBerReader 294 IBerReader Interface 294 Main Power Switch Control 299 Keysight N5990A Test Automation Software Platform for USB User Guide 5

6 Contents 6 Keysight N5990A Test Automation Software Platform for USB User Guide

7 Keysight N5990A Test Automation Software Platform for USB User Guide 1 Introduction What s in this Chapter / 8 Document History / 9

8 1 Introduction What s in this Chapter The Keysight Technologies N5990A Test Automation Software Platform ValiFrame is an open and flexible framework for automating electrical compliance tests for digital buses such as USB and PCI Express. The product runs on a standard PC that controls a wide range of test hardware. Typically, the hardware comprises of instruments for stimulus and response tests, such as pattern generators, bit error ratio testers (BERTs), and oscilloscopes. Key elements of the software platform are a test sequencer, receiver test libraries, and interfaces to oscilloscope applications for transmitter tests. Additional options are available, for example, User Programming. N5990A is implemented in C# within the Microsoft.NET Framework. The software platform is specified in the data sheet EN, including the PC requirements. Overview of this Guide This guide provides a detailed description of the N5990A Test Automation Software Platform. 8 Keysight N5990A-Test Automation Software Platform for USB User Guide

9 Introduction 1 Document History First Edition (May, 2015) The first edition of this user guide describes functionality of software version 1.0 Second Edition (April, 2017) The second edition of this user guide describes functionality of software version 1.2 Third Edition (January, 2015) The third edition of this user guide describes functionality of software version N5990A ValiFrame_2.23_USB3_1.50 Fourth Edition (September, 2015) The fourth edition of this user guide describes functionality of software version N5990A ValiFrame_2.23_USB3_1.53 Fifth Edition (July, 2016) The fifth edition of this user guide describes functionality of software version N5990A_ValiFrame_2.23_USB_2.00 Sixth Edition (May, 2017) The sixth edition of this user guide describes functionality of software version N5990A_ValiFrame_2.23_USB_2.04 Seventh Edition (October, 2017) The seventh edition of this user guide describes functionality of software version N5990A_ValiFrame_2.23_USB_3.1 Eighth Edition (December, 2017) The eighth edition of this user guide describes functionality of software version N5990A_ValiFrame_2.23_USB_2.10 Keysight N5990A-Test Automation Software Platform for USB User Guide 9

10 1 Introduction 10 Keysight N5990A-Test Automation Software Platform for USB User Guide

11 Keysight N5990A Test Automation Software Platform for USB User Guide 2 N5990A Overview Test Automation Software Platform / 12

12 2 N5990A Overview Test Automation Software Platform The Keysight Technologies N5990A Test Automation Software Platform ValiFrame is an open and flexible framework for automating electrical compliance tests for digital buses such as USB and PCI Express. The product runs on a standard PC that controls a wide range of test hardware. Typically, the hardware comprises of instruments for stimulus and response tests, such as pattern generators, bit error ratio testers (BERTs), and oscilloscopes. Key elements of the software platform are a test sequencer, receiver test libraries, and interfaces to oscilloscope applications for transmitter tests. Additional options are available, for example, User Programming. N5990A is implemented in C# within the Microsoft.NET Framework. The software platform is specified in the data sheet EN, including the PC requirements. 12 Keysight N5990A Test Automation Software Platform for USB User Guide

13 Keysight N5990A Test Automation Software Platform for USB User Guide 3 Using Software Test Station Configuration / 14 Starting Test Station / 20 Oscilloscope Transmitter Test Integration / 34

14 3 Using Software Test Station Configuration Test Station Selection The set of test instruments used for a specific application is referred to in the following as Test Station or in short Station. The test station is controlled by a suitable PC and the N5990A Test Automation Software Platform. At first, ValiFrame Station Configuration (Start > All Programs > BitifEye> USB >ValiFrame USB Station Configuration) must be started prior to ValiFrame USB (see Figure 1 and Figure 6). Figure 1 ValiFrame Station Configuration Icon When the ValiFrame Station Configuration is started, a window is displayed as shown in Figure 2. The available Test Stations are listed in a drop-down menu. Multiple entries can be generated by User Programming (N5990A opt. 500) and the required station can be selected. 14 Keysight N5990A Test Automation Software Platform for USB User Guide

15 Using Software 3 Figure 2 N5990A station selection window The N5990A opt. 001 is an interface to SQL databases (and web browsers). In case you have purchased this option, perform the following steps: 1 Clear the default Database Offline Check box so as to connect to the database application server. 2 Enter the IP address of the server. 3 Select any of one the options in the Result Viewer section to determine how the results of the calibrations and tests are presented; that is, as an MS Excel workbook or as an HTML document. You can receive an audio notification when a sequence of tests completes, when a Connection diagram is displayed, or when there is a Dialog prompt. Select the specific sound for each of these (Figure 2). The available options are as follows: None Car brake Feep Feep Ringing TaDa Tut 4 Click Play to hear the selected sound before you set the sound of your choice. Keysight N5990A Test Automation Software Platform for USB User Guide 15

16 3 Using Software 5 Proceed with Next or quit with Cancel. Click Next to open a ValiFrame Station Configuration window as shown in Figure 3. Test Station Configuration Depending on the selected station in Figure 2, the ValiFrame Station Configuration window displays the instruments or instrument combinations that are required. You can select the required instruments using the drop-down menus. NOTE You must ensure that all the selected instruments for the test station are connected to the test station PC controller by the remote control interfaces such as LAN or USB. Figure 3 N5990A station configuration window 16 Keysight N5990A Test Automation Software Platform for USB User Guide

17 Using Software 3 Test Station Configuration Once the USB station is configured, press Next button to continue. The ValiFrame Instrument Configuration Wizard Window appears as shown in Figure 4. In order to control instruments for use with the test station, you must establish connections to the instruments by using specific hardware addresses as described in the following section. Select the Mode Check box to set the relevant instrument status from Offline to Online. Figure 4 N5990A instrument configuration window NOTE When starting a specific test station configuration for the first time, all instruments are set to the Offline mode. In this mode, the test automation software does not connect to any instrument. This mode can be used for demonstrations or checks. Keysight N5990A Test Automation Software Platform for USB User Guide 17

18 3 Using Software Using Keysight IO VISA Connection Expert Introduction The Keysight Connection Expert is recommended to set up new connections or verify existing connections, for which you must perform the following steps: 1 Start the Connection Expert by right-clicking on the Keysight IO Libraries Suite icon in the task bar 2 Select Connection Expert. A window as shown in Figure 5, is displayed. Figure 5 Keysight Connection Expert 3 Click Instruments > Rescan 18 Keysight N5990A Test Automation Software Platform for USB User Guide

19 Using Software 3 For each instrument that is required, verify that an entry exists in the list for the instrument and that before the VISA Address, there is a green check mark. Once all the instruments to be used are listed properly, you must enter their address strings in the ValiFrame Instrument Configuration Window (see Figure 4). The recommended way of doing this is by copying and pasting instrument addresses as follows: 1 Click the VISA Address field next to an instrument in the Connection Expert. 2 Copy the address, and highlight the same instrument in the Test Station Connection window. 3 Paste the address in the Instrument Address text field and click Apply Address. 4 Repeat this procedure for all the instruments being used, except standard specific applications running on the oscilloscope. The applications running on the oscilloscope use a different technology to provide remote access to ValiFrame, called.net Remoting. Communication. The remote access is only possible using a LAN connection to the oscilloscope and for this reason the IP address needs to be used with this type of instrument. 5 Once all the instruments are set with the appropriate addresses, select the instruments that will be used by the Test Automation Software by selecting the Check boxes. This will set the instrument mode to Online. Click Check Connections to verify that the instrument addresses are valid. 6 Click Finish to save the changes and close the ValiFrame Station Configuration. Keysight N5990A Test Automation Software Platform for USB User Guide 19

20 3 Using Software Starting Test Station Start the ValiFrame test station by double-clicking the icon on the desktop (see Figure 6). Alternatively, start the ValiFrame station by clicking Start > All Programs > BitifEye > USB > ValiFrame USB. Figure 6 ValiFrame USB test station icon Following widow opens which gives the complete license information to the users. Figure 7 License Information 20 Keysight N5990A Test Automation Software Platform for USB User Guide

21 Using Software 3 Click OK and then the ValiFrame N5990A connects automatically to the instruments which are set to Online mode in the ValiFrame Station Configuration (see Figure 4). The application is ready for use once all the connections have been initialized successfully and the main menu is displayed (see Figure 8). Configuring DUT Once the N5990A main menu is displayed, you must configure the DUT in order to proceed with testing. Click the Configure DUT icon on the toolbar or select the Configure DUT option from the File menu (see Figure 8). A window is displayed as shown in Figure 9. Figure 8 ValiFrame main window Keysight N5990A Test Automation Software Platform for USB User Guide 21

22 3 Using Software Figure 9 Configure DUT Panel The parameters available on the Configure DUT panel depends on the specific application. Enter all the information which is relevant for a USB DUT, such as DUT Name, DUT Type (Device or Host), Spec version and Connector type. The selected DUT parameters and the information entered by the user will be shown in the measurement report. It is also stored with the measurement data in case a connection to an SQL database exists. As this information will be used to retrieve data from the database, select unique identifiers and descriptions. To set additional calibration and test parameters, click Parameters. 22 Keysight N5990A Test Automation Software Platform for USB User Guide

23 Using Software 3 NOTE In USB applications, either Compliance or Expert Mode must be selected. In compliance mode, the tests run according to the specific test specification. In expert mode, the DUT can be characterized to determine performance margins. It is provided for ad vanced users and includes additional tests as well as additional parameters to run tests differently than in compliance mode. Selecting, Modifying and Running Tests After the DUT has been configured, click OK in the Configure DUT Panel. The ValiFrame main window is displayed with the procedure tree as shown in Figure 10. It contains the list of calibration and test procedures, typically in the following groups: Calibration Receiver tests Transmitter tests Keysight N5990A Test Automation Software Platform for USB User Guide 23

24 3 Using Software Figure 10 N5990A main window with the procedures Click the Properties and Log List buttons of the main toolbar (see Figure 10) to display or hide procedure parameters on the right side and log messages at the bottom of the ValiFrame main window, respectively. The parameter grid on the right side of the window shows the parameters which are related to the selected calibration or test procedure subgroups or to individual procedures.these parameters can only be set before the execution of the procedure subgroup or procedure is started. The log list at the bottom of the window shows calibration and test status messages (regular progress updates as well as warnings and error messages). 24 Keysight N5990A Test Automation Software Platform for USB User Guide

25 Using Software 3 System Calibration It is necessary to calibrate the test system before running the first test, in order to ensure that the test results are consistent from run to run. Provided the equipment has achieved thermal stability before the calibration is started (typically after 30 minutes of warm-up), and no system elements have been exchanged, the calibration is stable and may only have to be repeated once a week or even less frequently. The calibration interval depends on the degree of accuracy desired. If the station is not calibrated prior to a DUT test, as the results of the previous calibration will be used for the current tests. Modifying Parameters Most calibration and test procedures, as well as the groups containing them, have parameters that control the details of how the procedures are run. In compliance mode, most of these parameters are read-only. In expert mode, almost all the parameters can be modified. Select a specific calibration or test procedure or one of the groups containing them in the ValiFrame procedure tree. The parameters must be displayed in a property list on the right side of the screen. If they are not displayed, click the Properties icon on the toolbar. Depending on the user selection in the Properties pane, the properties are ordered either alphabetically or in categories. The test parameters available can be changed individually (see Figure11). The test parameters selected are listed in the Results viewer (see Figure12). Figure 11 Editing Test Parameters Keysight N5990A Test Automation Software Platform for USB User Guide 25

26 3 Using Software. Figure 12 An example of test results Running Procedures To run the selected procedures, click the Start icon on the toolbar (see Figure 10). The procedures are run sequentially in the order shown in the procedure tree. Some procedures may require user interaction, such as changing cable connections or entering DUT parameters. The required action is prompted in pop-up dialog boxes prior to the execution as shown in Figure Keysight N5990A Test Automation Software Platform for USB User Guide

27 Using Software 3 Figure 13 Connection diagram pop-up window Keysight N5990A Test Automation Software Platform for USB User Guide 27

28 3 Using Software Results Runtime Data Display Most procedures generate data output. While the procedure is running, the data is displayed in a temporary MS Excel worksheet or HTML document, which opens automatically for each individual procedure. An example is given in Figure 14. See the Appendix section for more details about the file directories. 28 Keysight N5990A Test Automation Software Platform for USB User Guide

29 Using Software 3 Figure 14 Example of test results The MS-Excel worksheet or HTML document is opened during the procedure run and closes once the specific procedure is finished. As long as the N5990A Software is running, each result file can be reopened with a double-click on the respective procedure. However, the individual files are Keysight N5990A Test Automation Software Platform for USB User Guide 29

30 3 Using Software lost when the N5990A Test Automation Software Platform (main window) is closed, unless individual files or a collection of them were saved by the user. NOTE If a test or calibration procedure was run more than once, the list of results is visible below the particular procedure after expanding the tree below the procedure (see Figure 15). Figure 15 Selecting the repeated procedure and show test results 30 Keysight N5990A Test Automation Software Platform for USB User Guide

31 Using Software 3 Results Workbook For user convenience, all individual results are combined in a summary MS Excel workbook or HTML document at the end of the test run. The workbook must be saved explicitly (File > Save Results as Workbook...) as shown in Figure 16, otherwise it will be lost!. After all tests have been run, a test report can be generated additionally for easy documentation and printing with the standard Print function of the File menu (see Figure 16). An example Test result summary for USB is shown in Figure 17. Figure 16 Save results as workbook Keysight N5990A Test Automation Software Platform for USB User Guide 31

32 3 Using Software Figure 17 Test report example 32 Keysight N5990A Test Automation Software Platform for USB User Guide

33 Using Software 3 Smiley's Representation Once the selected procedures are run successfully, the smiley at the individual procedure indicates the result (Pass / Fail / Incomplete) by displaying its face in specific ways as given below (see Figure 18). Figure 18 Smiley's result description table Keysight N5990A Test Automation Software Platform for USB User Guide 33

34 3 Using Software Oscilloscope Transmitter Test Integration Keysight Technologies provides a range of transmitter test applications for high-speed digital interfaces. The transmitter test applications run on real-time oscilloscopes of the Keysight series such as a Digital Sampling Oscilloscope (DSO). The transmitter test applications can be used standalone, without the N5990A Test Automation Software Platform. For this use model, refer to the user documentation of the specific application. The transmitter test applications however, can be run through the N5990A Test Automation Software Platform too. A remote interface is used to execute the transmitter test procedures. For this model, a test controller PC with the N5990A software must be connected to the oscilloscope via Ethernet, for example, through a LAN switch. The remote interface of the transmitter test applications does not support USB connections. Using the Software In the N5990A Test Station Configuration, the available transmitter test applications are listed as instruments (see Figure 19). To use the software, perform the following steps: 1 Use the IP address of the oscilloscope as the instrument address. 2 After entering the address, set the transmitter test application instrument to Online, by selecting the relevant Check box. 3 Click Check Connections to verify that the connection works properly. If the transmitter test application is not running already, on the oscilloscope, the N5990A Test Automation Software automatically starts it via the oscilloscope firmware. 34 Keysight N5990A Test Automation Software Platform for USB User Guide

35 Using Software 3 Figure 19 Setting the TX scope application online The N5990A Main Window lists the transmitter tests in the procedure tree under the Transmitter group. During the test run, the oscilloscope transmitter test application sends its connection diagrams and pop-up dialog windows to the controller PC on which the N5990A Test Automation Software is running. Once the oscilloscope application finishes the test run, the N5990A software saves the test results including screenshots, data graphs, data tables and specification limits similar to a calibration or receiver test report. Troubleshooting This section provides solutions for the following problems: Wrong version of the transmitter test application Error message at startup and connection failures Transmitter test application and oscilloscope seem to hang Keysight N5990A Test Automation Software Platform for USB User Guide 35

36 3 Using Software Wrong version of the transmitter test application When starting the transmitter tests, the N5990A software compares the version of the transmitter test application which is currently installed on the oscilloscope with the version which was tested with N5990A. In case the versions do not match, an error message is displayed in the N5990A log file and a warning dialog shows the details about the latest tested version. The appropriate version of the transmitter test application must be installed on the oscilloscope to avoid problems. Even if the versions do not match, the N5990A Test Automation Software can try to run the transmitter tests. This may work if the changes between the transmitter test application versions are small, but installing the officially supported version is always strongly recommended. Error message at startup and connection fails The connection to the transmitter test application must be established through Ethernet (LAN); however, the firewall settings might not be set properly on the oscilloscope or the controller PC. This might result in error messages when the N5990A Test Automation Software tries to start the oscilloscope transmitter test application. In this case, check whether the following applications are added to the firewall exception list: 1 Transmitter test application on the oscilloscope 2 N5990A Test Automation Software and N5990A Station Configuration on the controller PC In case the controller PC has more than one LAN adapter, the.net remoting back channel which displays the dialogs, may not work, and the oscilloscope application may try to open the remoting back channel to an invalid address. To recover from this, the LAN adapter which is connected to the oscilloscope should be set to be the primary adapter. This might require help from a network administrator as the specific setting depends on the Windows version. NOTE If the connection and information dialogs from the oscilloscope are not displayed properly, check the firewall settings first and then make sure that the LAN adapter connected to the oscilloscope network is set to the primary one. 36 Keysight N5990A Test Automation Software Platform for USB User Guide

37 Using Software 3 Transmitter test application and oscilloscope seem to hang In general, the transmitter test application expects a valid signal that can be used as a trigger for the sampling but sometimes the signal is missing or too small, that is, below the threshold. In this case, the oscilloscope may appear to be frozen. This is expected oscilloscope behavior because the oscilloscope trigger hardware stops the execution of oscilloscope firmware as long as the trigger signal is missing. To exit from this state, apply a valid signal or reboot the oscilloscope and restart the N5990A software to check the signals before starting transmitter tests if the required trigger signal is unknown. Report the test and test conditions to your Keysight support contact. Keysight N5990A Test Automation Software Platform for USB User Guide 37

38 3 Using Software 38 Keysight N5990A Test Automation Software Platform for USB User Guide

39 Keysight N5990A Test Automation Software Platform for USB User Guide 4 USB Computer Bus Test Application Introduction / 40 Supported Hardware Configurations / 41 High Speed Procedure Description / 63 Super Speed Module Procedure Description / 81 Super Speed Plus Module Procedure Description / 218

40 4 N5990A Overview Introduction This chapter describes the calibrations and test procedures conducted by N5990A ValiFrame for Universal Serial Bus (USB) in detail. The N5990A software implements the Electrical Compliance Test Specification and also offers some custom characterization tests to provide more details on DUT behavior beyond the limits. The electrical compliance tests are conducted to verify that the receiver can handle maximum stress signals according to the specification. 40 Keysight N5990A Test Automation Software Platform for USB User Guide

41 ValiFrame USB Station 4 Supported Hardware Configurations ValiFrame N5990A supports the following instruments for receiver testing 1 USB 2.0: Keysight J-BERT N4903B and Keysight J-BERT M8020A 2 USB 3.0: Keysight J-BERT N4903B and Keysight J-BERT M8020A 3 USB 3.1: Keysight J-BERT N4903B and Keysight J-BERT M8020A ValiFrame USB Station Configuration After the software has been installed, a ValiFrame USB Station Configuration icon is added to the desktop as (see Figure 20). Start the software with a double-click of the left mouse button or, alternatively, click Start > All Programs > BitifEye > USB > ValiFrame USB Station Configuration. Figure 20 USB station configuration icon When the software is started, the ValiFrame Configuration Wizard window is displayed (see Figure 21). It allows the USB station to be selected. Keysight N5990A Test Automation Software Platform for USB User Guide 41

42 4 N5990A Overview Figure 21 USB Station Selection Window USB Station Configuration Window Options Data Generator The data generator is used to create patterns with specified stress parameters. The following instruments can be selected as data generator: JBERT- N4903B (Keysight N4903B High Performance Serial BERT) JBERT- M8020A (Keysight J-BERT M8020A High Performance Serial BERT) The error detector of the selected data generator (BERT system) will be used to check if the data looped back from the DUT contains errors. 42 Keysight N5990A Test Automation Software Platform for USB User Guide

43 ValiFrame USB Station 4 Figure 22 Configuration with JBERT M8020A Figure 23 Configuration with JBERT N4903B Keysight N5990A Test Automation Software Platform for USB User Guide 43

44 4 N5990A Overview De-Emphasis Generation When the data generator is the JBERT N4903B, the de-emphasis source can be selected as: N4916 (Keysight N4916 De-Emphasis Signal Converter). AUX_DATA (requires JBERT second data channel option 002). None (only for debugging purposes). M8020A will generate the de-emphasis internally. Therefore this selection is not visible when M8020A is selected as Data Generator. Power Supply for Auto Loopback Training It contains the following options: None. E3631A (Keysight Triple Output DC Power Supply). E363xA (Keysight E363xA Series Programmable DC Power Supplies). E364xA (Keysight E364xA Single Output DC Power Supplies). N67xx (Keysight N67xx Modular Power Supply from MATLAB). When any power supply is selected, the DUT is power-cycled automatically. Power Switch for Auto Loopback Training It can be selected as: None. NetIo 230 B (a power distribution unit with one 230 V input and four 230 V outlets). ALL4076. SynaccessNP. When any power switch is selected, the DUT is power-cycled automatically. To use the Power Switch, the ValiFrame opt. 008: Remote Power Management Support is required. For more details, refer to the Appendix section Main Power Switch Control on page 299 Tx Scope Application Depending on the selection of Tx Scope Application (for USB2 or USB3), the respective tests in the Transmitter group are available. It contains the following options: 44 Keysight N5990A Test Automation Software Platform for USB User Guide

45 ValiFrame USB Station 4 N5416A USB 2.0: Required for Tx USB2.0 compliance test software. N5416B USB 2.0: Required for Tx USB2.0 compliance test software. U7243A USB 3.0: Required for Tx USB3.0 compliance test software. U7243B USB 3.1: Required for Tx USB3.1 compliance test software. Type-C Test Controller It has the following option: N7016A N7018A SigTest Configuration The SigTest software is used for USB 3.1 Gen1 and Gen2 receiver calibration. Download the required versions from the following web link: The user is responsible for installing the versions mentioned and providing the installation directories using the SigTest Configuration dialog shown below. If the user selected installation directories different from the default, they must be entered. Keysight N5990A Test Automation Software Platform for USB User Guide 45

46 4 N5990A Overview Figure 24 Signal Test Configuration Window This dialog shows which SigTest templates will be used for random jitter, sinusoidal jitter and eye calibrations. It is possible, yet highly discouraged to use different SigTest templates or modifying it. Test Type-C PDOs Check the option Test Type-C PDOs for adding Type C PDO test. Note that the N7018A Type-C Test Controller will be automatically selected. For a detailed explanation about the PDOs support and configuration please refer to the "Keysight N5990A Type-C Extension" guide Instrument Configuration After the installation process, all instruments are configured by default in Offline mode. In this simulation mode, hardware does not need to be physically connected to the test controller PC. ValiFrame cannot connect to any instrument in this mode. In order to control the instruments that are connected to the PC, the instrument address must be entered in the Instrument Address text box (see Figure 25). The address depends on the bus type that is used for the connection, for example, General Purpose Interface Bus (GPIB) or Local Area Network (LAN). Most of the instruments used in the USB station use a Virtual Instrument Software Architecture (VISA) connection. To determine the VISA address, perform the follwing steps: 1 Run the "Keysight Connection Expert" (right-click on the IO Libraries Suite icon in the taskbar and then select the first entry Keysight Connection Expert). 2 Enter the instrument addresses in the Station Configuration Wizard, for example, by copying and pasting the address strings from the Connection Expert entries. 3 After the address strings have been entered, remove the Offline flag of all the required instruments. 4 Click Check Connections to verify that the connections for the instruments have been established properly. 46 Keysight N5990A Test Automation Software Platform for USB User Guide

47 ValiFrame USB Station 4 Figure 25 USB instrument configuration window You may configure the Keysight N7015A Type-C High-Speed Test Fixture and the Keysight N7016A Type-C Low-Speed Signal Access and Control Fixture, either manually or through ValiFrame. If you want to manually configure these fixtures, you are not required to specify the following: IP address or set the instrument to Online in the USB Station Configuration. You can find the configuration instructions in the Connection Diagram description for each receiver test. However, if you want ValiFrame to automate the configuration of these fixtures, you must use the BitifEye Remote Instruments Server. To download and install the BitifEye Remote Instruments Server, visit Keysight N5990A Test Automation Software Platform for USB User Guide 47

48 4 N5990A Overview NOTE Always cross-check the ValiFrame USB change-log to verify which version of the BitifEye Remote Instruments Server should be installed. Follow the given steps to use the Keysight N7015A and N7016A fixtures with ValiFrame: 1 Start the BitifEye Remote Instruments Server from any PC of the test setup (for example, the oscilloscope or the ValiFrame host). 2 Connect the N7016A fixture to that PC with a USB cable. 3 Set the Keysight N7016A fixture as Online. 4 Enter the IP address of the PC. 5 Verify the connection. Starting ValiFrame USB Start ValiFrame USB by double-clicking the ValiFrame USB icon that is displayed on the desktop (see Figure 26). Alternatively, click Start > All Programs > BitifEye > USB > ValiFrame USB. Starting ValiFrame USB opens the N5990A Test Automation Software Platform window (see Figure 27). Figure 26 ValiFrame USB icon 48 Keysight N5990A Test Automation Software Platform for USB User Guide

49 ValiFrame USB Station 4 Figure 27 ValiFrame USB user interface Configuring the USB DUT Click the Configure DUT icon on the toolbar of the ValiFrame USB user interface window to display the Configure DUT window. See Figure 28, Figure 29 and Figure 30, for Spec.Versions 2.0, 3.0 and 3.1, respectively. Keysight N5990A Test Automation Software Platform for USB User Guide 49

50 4 N5990A Overview Figure 28 Configure DUT window with Spec Version 2.0 selected 50 Keysight N5990A Test Automation Software Platform for USB User Guide

51 ValiFrame USB Station 4 Figure 29 Configure DUT window with Spec Version 3.0 selected Keysight N5990A Test Automation Software Platform for USB User Guide 51

52 4 N5990A Overview Figure 30 Configure DUT window with Spec Version 3.1 selected Product Parameters DUT Type: The DUT type can be chosen as: Device Host Spec Version: The available specific versions are: Connector: When DUT type Device is selected: With Spec Version 2.0 StandardB 52 Keysight N5990A Test Automation Software Platform for USB User Guide

53 ValiFrame USB Station 4 With Spec Version 3.0 Standard-B Micro-B Tethered Std-A With Spec Version 3.1 Micro-B Type-C Tethered Std-A Tethered Type-C When DUT type Host is selected: With Spec Version 2.0 Standard-A With Spec Version 3.0 Std-A With Spec Version 3.1 Std-A Type-C Test Parameters As for all the applications, a User Name, Description, and Comment can be entered. Compliance/Expert Mode: In Compliance Mode, only the plain compliance tests are shown with very little customization parameters. In Expert Mode, additional debugging tests are added and the compliance tests can be run with customized settings. Speed Class: When Spec Version 2.0 is selected: The available USB Speed class is High Speed. When Spec Version 3.0 is selected: The available USB Speed class is Super Speed. When Spec Version 3.1 is selected: The available USB Speed classes are Super Speed and Super Speed Plus. Keysight N5990A Test Automation Software Platform for USB User Guide 53

54 4 N5990A Overview Show Parameters: Click Parameters to display a dialog that enables you to configure some additional test parameters, which are available for Spec Version 3.0 and 3.1. Depending on the speed classes selected, individual tabs are displayed (see Figure 31). Figure 31 Test Parameters Window 54 Keysight N5990A Test Automation Software Platform for USB User Guide

55 ValiFrame USB Station 4 NOTE In the Station Configuration window, if you have selected None in Power Supply, then Power Supply Mode will not appear in PowerAutomation (see Figure 32). Similarly, if in the Station Configuration window, you have selected None in Power Switch, then Power Switch Mode will not appear in PowerAutomation (see Figure 33). Figure 32 Station Configuration Window showing the available options for Power Supply for auto loopback training Keysight N5990A Test Automation Software Platform for USB User Guide 55

56 4 N5990A Overview Figure 33 Station Configuration Window showing the available options for Power Switch for auto loopback training J-BERT N4903B and J-BERT M8020A have the same Test Parameters under the Rx 5 Gb/s tab except for the Error Detector parameters as shown below. 56 Keysight N5990A Test Automation Software Platform for USB User Guide

57 ValiFrame USB Station 4 Figure 34 Test parameters window showing the parameter of Rx 5 Gb/s with J-BERT M8020A The Equalization and Sensitivity parameters are available only when J-BERT M8020A is the selected Data Generator in the N5990A Station Configuration. Note that the Equalization requires M8070A option 0A3 and that the available presets depend on the factory calibration of the J-BERT M8020A. Keysight N5990A Test Automation Software Platform for USB User Guide 57

58 4 N5990A Overview Figure 35 Test parameters window showing the parameter of Rx 5 Gb/s with J-BERT N4903B Note that the DUT transmits with SSC and Deviation parameters are available only when JBERT N4903B is the selected Data Generator in the N5990A Station Configuration. J-BERT N4903B and J-BERT M8020A have same Test Parameters for Rx Super Speed Plus as shown in Figure 36 and Figure Keysight N5990A Test Automation Software Platform for USB User Guide

59 ValiFrame USB Station 4 Figure 36 Test parameters window showing the parameter of Rx 10Gb/s with J-BERT N4903B Keysight N5990A Test Automation Software Platform for USB User Guide 59

60 4 N5990A Overview Figure 37 Test parameters window showing the parameter of Rx 10Gb/s with J-BERT M8020A 60 Keysight N5990A Test Automation Software Platform for USB User Guide

61 ValiFrame USB Station 4 Figure 38 Test parameters window showing the parameter of Transmitter with U7243A USB 3.A Keysight N5990A Test Automation Software Platform for USB User Guide 61

62 4 N5990A Overview Figure 39 Test parameters window showing the parameter of Transmitter with U7243B USB 3.1 For more detail about these parameters, see Receiver on page 70. NOTE Rx 10Gb/s and Transmitter tabs are not available with Spec Version 2.0 and Spec Version Keysight N5990A Test Automation Software Platform for USB User Guide

63 ValiFrame USB Station 4 High Speed Procedure Description This section describes the High Speed calibration and test procedures of the USB2 module based on version These procedures are available for Spec Version 2.0. The following configurations are included: J-BERT N4903B J-BERT M8020A Calibration Common Calibration Parameters Repetitions: The number of times to repeat a test or a test sequence. Direct SMA scope connection: Direct SMA connections to the oscilloscope can be either to channels 1 and 3 or to channels 2 and 4. Differential scope connection: Differential connections to the oscilloscope can be to any channel (1, 2, 3, or 4). USB2 Random Jitter Calibration Purpose and Method: In the Rx tests, the input signal will be stressed with a combination of jitter sources to simulate the possible impairments expected at the Rx input when operating in a target system. Random jitter is added to simulate the effects of thermal noise. Due to system intrinsic jitter, the effective jitter level is different from the value set in the data generator, so the jitter amplitude is calibrated. The test automation calibrates six equally spaced RJ values (from 0 to 220 ps). The data generator sends a clock pattern during this calibration procedure. The actual jitter is measured on a DSO using the RJ/DJ-separation software EzJIT. The set and measured random jitter values are stored in a calibration table file. Keysight N5990A Test Automation Software Platform for USB User Guide 63

64 4 N5990A Overview Connection Diagram : Figure 40 Connection Setup for 5G Random Jitter Calibration 64 Keysight N5990A Test Automation Software Platform for USB User Guide

65 ValiFrame USB Station 4 Figure 41 Connection setup for USB 2 random jitter calibration for M8020A and N4903B, respectively Parameters in Expert Mode: The following Sequencer parameters are available for all the tests: Procedure Error Case Behavior: Specifies the action to be taken when an error occurs during the execution of a test in a test sequence. The available options include: Proceed with Next Procedure and Abort Sequence. Procedure Failed Case Behavior: Specifies the action to be taken when the execution of a test fails in a test sequence. The available options include: Proceed with Next Procedure and Abort Sequence. Repetitions: Specifies the number of times to repeat the execution of a test. Keysight N5990A Test Automation Software Platform for USB User Guide 65

66 4 N5990A Overview Used Calibrations: None Procedure Report: Figure 42 Result description Column 1: Set Random Jitter: The jitter amplitude set in the instrument. Column 2: Measured Random Jitter: The measured jitter amplitude. 66 Keysight N5990A Test Automation Software Platform for USB User Guide

67 ValiFrame USB Station 4 USB2 Differential Voltage Calibration Purpose and Method: This procedure calibrates the differential voltage. The test automation uses the data generator to send the IN packet pattern to the DUT. It measures the differential amplitude of the received IN packets with a real time oscilloscope. The voltage is calibrated from 0 to 600mV with 25 mv steps. This calibration depends on the DUT, so it is necessary to do it every time the user configures a new DUT. It is not saved. Connection Diagram Figure 43 Connection setup for USB 2 differential voltage calibration for M8020A Keysight N5990A Test Automation Software Platform for USB User Guide 67

68 4 N5990A Overview Parameters in Expert Mode: Sequencer parameters are same as described in the Random Jitter Calibration. Additionally: Keep Caldata: When set to True, calibration data is saved and reloaded when configuring the DUT. Since the differential voltage calibration data is DUT dependent, this option must be used if the calibrated DUT is identical to the DUT currently used. Used Calibrations: None Procedure Report: 68 Keysight N5990A Test Automation Software Platform for USB User Guide

69 ValiFrame USB Station 4 Figure 44 Result description Column 1: Set Differential Voltage [mv]: The differential voltage set in the instrument. Column 2: Keysight N5990A Test Automation Software Platform for USB User Guide 69

70 4 N5990A Overview Measured Vdiff [mv]: The differential voltage of the IN packet in the DUT. Receiver Common Calibration Parameters Repetitions: The number of times to repeat tests in a test sequence. Scope connection: For Rx tests a differential connection to the oscilloscope is used. The connection can be to any oscilloscope channel (1, 2, 3 or 4). Force DUT re-initialization at each step. USB2 Rx Sensitivity Compliance Test, EL_11, EL_13, EL_15, EL_17 Purpose and Method: This test verifies that the DUT meets the high speed compliance electrical criteria EL_11, EL_13, EL_15, and EL_17. According to EL_11 and EL_15, the DUT must be able to receive at 480Mb/s ±0.05% and should be able to reliably receive in the presence of a common mode voltage component over the range of -50 mv to 500 mv. So the DUT is tested at the four corner points: ( %, -50 mv), ( %, -50 mv), ( %, 500 mv) and ( %, 500 mv). According to EL_13, a USB 3.1upstream facing port on a device must tolerate 300 mu of jitter. The automated test adds 80 mu of random jitter and 220 mu of sinusoidal jitter for all the four points. The procedure sends an IN packet pattern to the DUT and checks if in these four points the DUT answers with NAK packets. Connection Diagram: Same as for Differential Voltage Calibration. Parameters in Expert Mode: Vdiff: Differential Voltage used for this test. Vcm: Common mode voltage used for this test. Random Jitter: Random jitter (peak-peak) used for this test. Sinusoidal Jitter: Sinusoidal jitter used for this test. Sinusoidal Jitter Frequency : Sinusoidal jitter frequency used for this test. 70 Keysight N5990A Test Automation Software Platform for USB User Guide

71 ValiFrame USB Station 4 Num In Packets: The number of IN packets that the scope observes to check if they have NAK answer. Max missing NAK: The maximum number of allowed missing NAK packets. Used Calibrations: Differential Voltage Calibration Random Jitter Calibration Procedure Report: Figure 45 Result description Column 1: Result: Pass if the number of missing NAK is below or equal of the max number of missing NAK packets. Column 2: Keysight N5990A Test Automation Software Platform for USB User Guide 71

72 4 N5990A Overview Common Mode Voltage [mv]: CM voltage applied during the test. Column 3: Data Rate [Mbit/s]: Effective data rate applied during the test. Column 4: Number of missing NAK packets. USB2 Squelch Detection Compliance Test EL_16 Purpose and Method: This test verifies that the DUT meets the high speed compliance electrical criterion EL_16. According to EL_16 "a high speed capable device must implement a transmission envelope detector that indicates squelch (that is, never receives packets) when a receivers input falls below 100 mv differential amplitude. The procedure begins with setting 50 mv differential amplitude and increases it until the DUT starts sending NAK packets. The last voltage with which the DUT does not send any NAK packet is the squelch level. To pass the test the squelch level has to be above 100 mv. Connection Diagram: Same as for Differential Voltage Calibration. Parameters in Expert Mode: Vcm: Common mode voltage used for this test. Random Jitter: Random jitter (peak-peak) used for this test. Sinusoidal Jitter Amplitude: Sinusoidal jitter amplitude used for this test. Sinusoidal Jitter Frequency: Sinusoidal jitter frequency used for this test. Start Differential Voltage: The differential amplitude where the test starts looking for the squelch level. Differential Voltage Step Size: Step size used to increase the differential amplitude. Num In Packets: The number of IN packets that the scope observes to check if they have NAK answer. Used Calibrations: Differential Voltage Calibration Random Jitter Calibration 72 Keysight N5990A Test Automation Software Platform for USB User Guide

73 ValiFrame USB Station 4 Procedure Report: Figure 46 Result description Column 1: Result: Pass if the squelch detection voltage is more than 100 mv. Column 2: Squelch Detection Voltage [mv]: Differential voltage below which the DUT does not respond. USB2 Minimum SYNC Field Compliance EL_18 Purpose and Method: The purpose of this test is to check the high speed electrical criterion EL_18: "A high speed capable device's transmission envelope detector must be fast enough to allow the HS receiver to detect data transmission, Keysight N5990A Test Automation Software Platform for USB User Guide 73

74 4 N5990A Overview archive DLL lock, and detect end of the SYNC field within 12 bit times". The procedure sends the IN Token with the Minimum SYNC of 12 bits and checks if the DUT answers with NAKs. Connection Diagram: Same as for Differential Voltage Calibration. Parameters in Expert Mode: Vdiff: Differential voltage used for this test. Vcm: Common mode voltage used for this test. Random Jitter: Random jitter (peak-peak) used for this test. Sinusoidal Jitter Amplitude: Sinusoidal Jitter amplitude used for this test. Sinusoidal Jitter Frequency: Sinusoidal Jitter frequency used for this test. Num In Packets: The number of IN packets that the scope observes to check if they have NAK answer. Max missing NAK Packets: The maximum number of allowed missing NAK packets. Used Calibrations: Differential Voltage Calibration Random Jitter Calibration 74 Keysight N5990A Test Automation Software Platform for USB User Guide

75 ValiFrame USB Station 4 Procedure Report: Figure 47 Result description Column 1: Result: Pass if the number of missing NAK is below or equal to the maximum number of missing NAK packets. Column 2: Missing NAK packets [ ]: Number of IN packets that are not answered with a NAK packet. Keysight N5990A Test Automation Software Platform for USB User Guide 75

76 4 N5990A Overview USB2 Sensitivity Characterization EL_13, EL_16, EL_17 Purpose and Method: This test characterizes the answer of the DUT depending on the differential voltage amplitude. According to EL_13 and EL_16 the device should not send any NAK packets below 100 mv and should always answer with NAK packets above 150 mv. The procedure sends IN packets to the DUT and analyses the response using a real time oscilloscope. It detects every IN packet and checks if there is a NAK packet after each one. The test stops if the DUT responds to all NAK packets at any point above 150 mv. If that does not happen it stops at the voltage defined in Max Differential Voltage. Connection Diagram: Same as for Differential Voltage Calibration. Parameters in Expert Mode: Min Differential Voltage: Start amplitude used for this test. Max Differential Voltage: The maximum tested voltage. Differential Voltage Step Size: Step size to increase the voltage amplitude. Common Mode Voltage: Common mode voltage added to the input signal. Data Rate Deviation: Variation on the data rate. Random Jitter: Random jitter added to the signal. Sinusoidal Jitter: Sinusoidal jitter amplitude added to the signal. Sinusoidal Jitter Frequency: Frequency of the sinusoidal jitter component. Num In Packets: The number of IN packets that the scope observes to check if they have NAK answer. Max missing NAK Packets. The maximum number of allowed missing NAK packets. Used Calibrations: Differential Voltage Calibration Random Jitter Calibration 76 Keysight N5990A Test Automation Software Platform for USB User Guide

77 ValiFrame USB Station 4 Procedure Report: Figure 48 Result description Column 1: Result: Pass if DUT does not respond with NAK packets below 100 mv and responds to all NAK packets above 150 mv. Column 2: Actual Differential Voltage [mv]: Voltage of the IN packets. Keysight N5990A Test Automation Software Platform for USB User Guide 77

78 4 N5990A Overview Column 3: Squelch Detection Spec [mv]: Level below which NAK packets should not be sent. Column 4: Min Differential Voltage Spec [mv]: Level above which all IN packets should be responded to with a NAK packet. Column 5: Missing NAK packets [ ]: Number of IN packets that are not answered with a NAK packet. USB2 Constant Parameter Stress EL_13, EL_16 Purpose and Method: This test analyses the DUT answer for specific values of the signal parameters that can be modified in the user interface. As in all the other tests, the IN packet pattern is sent with the data generator and the number of missing NAK packets is measured with the scope. The test passes if the answer meets the specification EL_13 and EL_16 (no NAK packets below 100 mv and always a NAK packet for each IN packet above 150 mv). Connection Diagram: Same as for Differential Voltage Calibration. Parameters in Expert Mode: Vdiff: Differential voltage of the IN packet. Common Mode Voltage: Common mode voltage added to the input signal. Data Rate Deviation: Variation on the data rate. Random Jitter: Random jitter added to the signal. Sinusoidal Jitter: Sinusoidal jitter amplitude added to the signal. Sinusoidal Jitter Frequency: Frequency of the sinusoidal jitter component. Num In Packets: The number of IN packets that the scope observes to check if they have NAK answer. Max missing NAK Packets. The maximum number of allowed missing NAK packets. 78 Keysight N5990A Test Automation Software Platform for USB User Guide

79 ValiFrame USB Station 4 Used Calibrations: Differential Voltage Calibration Random Jitter Calibration Procedure Report: Figure 49 Result description Column 1: Result: Pass if DUT does not respond with NAK packets below 100 mv and responds to all NAK packets above 150 mv. Column 2: Differential Voltage [mv]: Voltage of the IN packets. Keysight N5990A Test Automation Software Platform for USB User Guide 79

80 4 N5990A Overview Column 3: Squelch Detection Spec [mv]: Level below which NAK packets should not be sent. Column 4: Min Differential Voltage Spec [mv]: Level above which all IN packets should be responded to with a NAK packet. Column 5: Missing NAK packets [ ]: Number of IN packets that are not answered with a NAK packet. 80 Keysight N5990A Test Automation Software Platform for USB User Guide

81 ValiFrame USB Station 4 Super Speed Module Procedure Description This section describes the Super Speed calibration and test procedures for Specification Versions 3.0 and 3.1. Calibration Common Calibration Parameters: Repetitions: The number of times to repeat tests in a test sequence. Scope Cal Connection: Connection to the scope used for calibrations. The available choices include Chan 1 3 Direct Connect and Chan 2 4 Direct Connect. Amplitude Imbalance Check: Enables or disables the amplitude imbalance check during calibration.you can also access the following parameter from the Test Parameters window that can be invoked from the Configure DUT screen: Scope Connection: It allows you to select Chan1 3 Direct Connect or Chan 2 4 Direct Connect. Calibration with Specification Version 3.0 5G LFPS Voltage Calibration Purpose and Method: This procedure calibrates the differential voltage for low frequency periodic signaling. The data generator sends an LFPS pattern. The test automation sets nine equally spaced differential voltages from 600 mv to 1400 mv in the data generator. The differential amplitude is measured with the scope. Keysight N5990A Test Automation Software Platform for USB User Guide 81

82 4 N5990A Overview Connection Diagram: Figure 50 Connection Setup for 5G LFPS Voltage Calibration (J-BERT M8020A) 82 Keysight N5990A Test Automation Software Platform for USB User Guide

83 ValiFrame USB Station 4 Figure 51 Connection Setup for 5G LFPS Voltage Calibration (J-BERT N4903B, Generation = AUX DATA) Parameters in Expert Mode: No additional parameters. Used Calibrations: None Available for the following configurations: J-BERT N4903B with AUX_DATA J-BERT M8020A Keysight N5990A Test Automation Software Platform for USB User Guide 83

84 4 N5990A Overview Procedure Report: Figure 52 Result description Column 1 Set Differential Voltage [mv]: The differential voltage amplitude set in the instrument. 84 Keysight N5990A Test Automation Software Platform for USB User Guide

85 ValiFrame USB Station 4 Column 2 Measured Differential Voltage [mv]: The measured voltage amplitude. 5G De-Emphasis Calibration Purpose and Method: This procedure calibrates the de-emphasis. The pattern generator sends the equalization pattern, consisting of 64 consecutive zeros, 64 consecutive ones and a portion of clock pattern, to the oscilloscope. The calibration is done at the nominal voltage of 800 mv, setting the de-emphasis level from -6 db to 0 db, in steps of 1 db. Connection diagram: J-BERT N4903B with AUX_DATA and J-BERT M8020A: Same as for 5G LFPS Voltage Calibration. J-BERT N4903B with N4916 De-Emphasis Generator: See Figure 53. Keysight N5990A Test Automation Software Platform for USB User Guide 85

86 4 N5990A Overview Figure 53 Connection setup for 5G De-Emphasis Calibration (J-BERT N4903B, DeGeneration = N4916B) Parameters in Expert Mode: Differential Voltage Points: Set of voltage points where the de-emphasis is calibrated. Used Calibrations: None Available for the following configurations: J-BERT N4903B with N4916 De-Emphasis Generator J-BERT N4903B with AUX_DATA J-BERT M8020A 86 Keysight N5990A Test Automation Software Platform for USB User Guide

87 ValiFrame USB Station 4 Procedure Report: Figure 54 Result description Column 1: Set De-Emphasis [db]: The de-emphasis set in the instrument. Column 2: Measured De-Emphasis (db): The measured de-emphasis for each voltage point. Keysight N5990A Test Automation Software Platform for USB User Guide 87

88 4 N5990A Overview 5G Generator Output Voltage Calibration Purpose and Method: This procedure calibrates the differential voltage. The data generator sends the equalization pattern and the peak to peak differential voltage is measured at several set levels. Connection Diagram: Same as for 5G De- Emphasis Calibration Parameters in Expert Mode: No additional parameters Used Calibrations: None Available for the following configurations: J-BERT N4903B with N4916 De-Emphasis Generator J-BERT N4903B with AUX_DATA J-BERT M8020A 88 Keysight N5990A Test Automation Software Platform for USB User Guide

89 ValiFrame USB Station 4 Procedure Report Figure 55 Result description Column 1: Set Differential Voltage [mv]: Shows the diiferential value, set in the instrument. Column 2 Measured Differential Voltage [mv]: Shows the measured voltage. Keysight N5990A Test Automation Software Platform for USB User Guide 89

90 4 N5990A Overview Long Channel 5G Random Jitter Calibration Purpose and Method: This procedure calibrates the Random Jitter (RJ). The pattern generator sends the CP1 pattern and adds random jitter to the signal. It sets eleven equally spaced RJ values (from 0 to 250 mui). The jitter is measured with a real time oscilloscope using SigTest. Connection Diagram Figure 56 Connection setup for 5G Random Jitter Calibration (J-BERT N4903B, DeGeneration = N4916B, Device) 90 Keysight N5990A Test Automation Software Platform for USB User Guide

91 ValiFrame USB Station 4 Figure 57 Connection setup for 5G Random jitter calibration (J-BERT N4903B, De- Generation = AUX DATA, Device) Keysight N5990A Test Automation Software Platform for USB User Guide 91

92 4 N5990A Overview Figure 58 Connection Setup for 5G Random Jitter Calibration (J-BERT M8020A) In the host case, the instruments connections are the same but with the following fixtures: Figure 59 Host case fixtures of connection setup for LF sinusoidal jitter calibration jitter calibration Parameters in Expert Mode: BER: The target BER used for the random jitter measurements. 92 Keysight N5990A Test Automation Software Platform for USB User Guide

93 ValiFrame USB Station 4 Used Calibrations: None Available for the following configurations: J-BERT N4903B with N4916 De-Emphasis Generator J-BERT N4903B with AUX_DATA J-BERT M8020A Procedure Report: Figure 60 Result description Keysight N5990A Test Automation Software Platform for USB User Guide 93

94 4 N5990A Overview Column 1 Set Jitter [mui]: The jitter amplitude set in the instrument. Column 2 Actual Random Jitter [mui]: The measured jitter amplitude. 5G LF Sinusoidal Jitter Calibration Purpose and Method: This procedure calibrates the sinusoidal jitter for low frequencies (from 100 KHz to 2 MHz). The data generator sends the CP0 pattern during this calibration. The procedure makes a sinusoidal jitter sweep in five different frequencies. The sinusoidal jitter is measured with the oscilloscope using the SigTest software, according to the CTS. Connection Diagram: Same as for 5G Random Jitter Calibration. Parameters in Expert Mode: No additional parameters. Used Calibrations: None Available for the following configurations: J-BERT N4903B with N4916 De-Emphasis Generator J-BERT N4903B with AUX_DATA J-BERT M8020A 94 Keysight N5990A Test Automation Software Platform for USB User Guide

95 ValiFrame USB Station 4 Procedure Report: Figure 61 Result description Column 1: Set Jitter [UI]: The jitter amplitude set in the instrument. Column 2: Sinusoidal Jitter (x jitter frequency) [UI]: The measured jitter amplitude for each jitter frequency. Keysight N5990A Test Automation Software Platform for USB User Guide 95

96 4 N5990A Overview 5G HF Sinusoidal Jitter Calibration Purpose and Method: This procedure calibrates the sinusoidal jitter for high frequencies (from 4.9 MHz to 50 MHz). The method is the same as for 5G LF Sinusoidal Jitter Calibration but in this case the maximum allowed deviation is 5%. As in the LF calibration, the data generator sends the CP0 pattern during this calibration. The procedure makes a sinusoidal jitter sweep in five different frequencies. The sinusoidal jitter is measured with the oscilloscope using the SigTest software, according to the CTS. Connection Diagram: Same as for 5G Random Jitter Calibration. Parameters in Expert Mode: No additional parameters. Used Calibrations: None Available for the following configurations: J-BERT N4903B with N4916 De-Emphasis Generator J-BERT N4903B with AUX_DATA J-BERT M8020A 96 Keysight N5990A Test Automation Software Platform for USB User Guide

97 ValiFrame USB Station 4 Procedure Report: Figure 62 Result description Column 1: Set Jitter: The jitter amplitude set in the instrument. Column 2: Sinusoidal Jitter (x jitter frequency): The measured jitter amplitude for each jitter frequency. Keysight N5990A Test Automation Software Platform for USB User Guide 97

98 4 N5990A Overview 5G Eye Height Calibration Purpose and Method: This procedure calibrates the eye height. The data generator sends the CP0 pattern. The test automation sets several differential voltage amplitudes and measures the corresponding eye height. The measurements are done using the SigTest software. Connection Diagram: Same as for 5G Random Jitter Calibration. Parameters in Expert Mode: No additional parameters. Used Calibrations: All the previous calibrations except 5G LFPS Voltage Calibration Available for the following configurations: J-BERT N4903B with N4916 De-Emphasis Generator J-BERT N4903B with AUX_DATA J-BERT M8020A 98 Keysight N5990A Test Automation Software Platform for USB User Guide

99 ValiFrame USB Station 4 Procedure Report: Figure 63 Result description Keysight N5990A Test Automation Software Platform for USB User Guide 99

100 4 N5990A Overview Column 1: Input Diff Voltage [mv]: The differential voltage amplitude set in the instrument. Column 2: Measured Eye Height [mv]: The measured eye height amplitude. 5G Total Jitter Calibration Purpose and Method: This procedure calibrates the total jitter. The data generator sends the "CPO_2SKP_RD-" pattern. Random jitter and sinusoidal jitter with the values specified in the USB Compliance Test Specification are added to the signal. Total jitter is measured on the oscilloscope using the SigTest software. Connection Diagram: Same as for 5G LF Sinusoidal Jitter Calibration. Parameters in Expert Mode: SJ Frequency: The frequency of the sinusoidal jitter component. Used Calibrations: All the previous calibrations except 5G LFPS Voltage Calibration Available for the following configurations: J-BERT N4903B with N4916 De-Emphasis Generator J-BERT N4903B with AUX_DATA J-BERT M8020A 100 Keysight N5990A Test Automation Software Platform for USB User Guide

101 ValiFrame USB Station 4 Procedure Report: Figure 64 Result description Column1: Pass/Fail Result Column2: Total Jitter (mui): The measured total jitter. 5G Eye Height Verification Purpose and Method: This test checks if it is possible to meet the eye height specification with the current calibration data and setup. The pattern generator sends the CP0 pattern to the oscilloscope and random jitter and sinusoidal jitter are set to the values specified in the USB Compliance Test Specification. The differential output voltage amplitude is set to the specified value plus a small margin defined with the "Eye Height Margin" parameter. The eye height is measured with the oscilloscope using SigTest. Keysight N5990A Test Automation Software Platform for USB User Guide 101

102 4 N5990A Overview Connection Diagram: Same as for 5G Random Jitter Calibration. Parameters in Expert Mode: Eye Height Margin: Differential voltage added to the value specified in the CTS. Used Calibrations: All the previous calibrations except 5G LFPS Voltage Calibration Available for the following configurations: J-BERT N4903B with N4916 De-Emphasis Generator J-BERT N4903B with AUX_DATA J-BERT M8020A Procedure Report: Figure 65 Result description Column 1: Result: Specifies whether the eye height specifications have been met. Column 2: Set Eye Height [mv]: The eye height set in the instrument. Column 3: Measured Eye Height [mv]: The measured eye height. 102 Keysight N5990A Test Automation Software Platform for USB User Guide

103 ValiFrame USB Station 4 Column 4: Upper Spec [mv]: The upper spec limit. Column 5: Lower Spec [mv]: The lower spec limit. 5G Total Jitter Verification Purpose and Method: This test checks if it is possible to meet the total jitter specification with the current calibration data and setup. The pattern generator sends the CP0 pattern to the oscilloscope. The differential output voltage amplitude is set to the value specified in the USB Compliance Test Spec. Random jitter and sinusoidal jitter are set to the specified values plus a small margin defined with the "Random Jitter Margin and Sinusoidal Jitter Margin parameters. The total jitter is measured with the oscilloscope using SigTest. Connection Diagram: Same as for 5G Random Jitter Calibration. Parameters in Expert Mode: Specification Random Jitter Margin: Percentage added to the specified RJ amplitude value. Sinusoidal Jitter Margin: Percentage added to the specified SJ amplitude value. Sinusoidal Jitter Frequency Used Calibrations: All the previous calibrations except 5G LFPS Voltage Calibration Available for the following configurations: J-BERT N4903B with N4916 De-Emphasis Generator J-BERT N4903B with AUX_DATA J-BERT M8020A Keysight N5990A Test Automation Software Platform for USB User Guide 103

104 4 N5990A Overview Procedure Report: Figure 66 Result description Column 1: Result. Column 2: Measured Total Jitter. Column 3: Min TJ at IE-12 [mui]. Column 4: Max TJ at IE-12 [mui]. 104 Keysight N5990A Test Automation Software Platform for USB User Guide

105 ValiFrame USB Station 4 Calibration with Specification Version 3.1 The calibration procedures defined for specification version 3.0 hold true for specification version 3.1. The difference with regard to specification version 3.0 is the addition of the connectors Type-C and Tethered Type-C. The following are the calibration procedures for the specification version 3.1: 5G LFPS Voltage Calibration 5G De-Emphasis Calibration 5G Generator Output Voltage Calibration 5G Random Jitter Calibration 5G LF Sinusoidal Jitter Calibration 5G HF Sinusoidal Jitter Calibrations The above calibration procedures are available for all the following configurations, except the 5G LFPS Voltage Calibration, which is not available for the first configuration: J-BERT N4903B with N4916 De-Emphasis Generator J-BERT N4903B with AUX_DATA J-BERT M8020A For the following information, refer to the descriptions in the Calibration section for specification version 3.0: Purpose and Method Parameters in Expert Mode Used Calibrations Procedure Report The connection diagrams for all the calibration procedures are the same. An exception is the 5G LFPS Voltage Calibration, which does not support DeGeneration = N4916. Keysight N5990A Test Automation Software Platform for USB User Guide 105

106 4 N5990A Overview Figure 67 Connection Setup for 5G LFPS Voltage Calibration (M8020A) 106 Keysight N5990A Test Automation Software Platform for USB User Guide

107 ValiFrame USB Station 4 Figure 68 Connection Setup for 5G LFPS Voltage Calibration (J-BERT N4903B, DeGeneration = AUX DATA) Keysight N5990A Test Automation Software Platform for USB User Guide 107

108 4 N5990A Overview Receiver To view the Receiver parameters, click Show Parameters in the Configure Dut window (seefigure 69). Figure 69 Configure DUT Window Select Spec Version 3.1 for Super Speed Module procedure. 108 Keysight N5990A Test Automation Software Platform for USB User Guide

109 ValiFrame USB Station 4 Figure 70 Test Parameters Window For Super Speed Module description you have three tabs for classifying the test parameters; Common, Rx 5Gb/sand Transmitter. The receiver-related parameters are confined to the Common and Rx 5Gb/s tabs. Following is the description of these tabs. Common: This tab includes the Power Automation and BER Reader sections. Power Automation: There are three available modes: Manual, Power Supply, and Power Switch: Manual: The user will be responsible for supplying power to the DUT and power-cycling it. Power Switch: It is only available when a power switch was selected in the Station Configurator. Following are the additional parameters: Keysight N5990A Test Automation Software Platform for USB User Guide 109

110 4 N5990A Overview Component: The component which is used to power up the DUT or enable the DUT's USB bus. This can be Main Power or Vbus (seefigure 71). Channel: This indicates the channel of the power switch that will be used to power-cycle the DUT. The number of channels available depends on the power switch model selected. Off On Duration: The duration between turning off the DUT off and turning it on. Settling Time: The timespan after the DUT is turned on and before the test continues with loopback training. Max Power Cycle Retries: The maximum number of loopback training retries. After all retries, the following SER test will be considered as failed. Power Supply: It is only available when a power supply was selected in the Station Configurator. All of the additional parameters are the same as those for Power Switch, except for: Vdd(5.0 V): The DC output voltage of the power supply connected to the DUT DC power input. BER Reader: It has two available options: External Analyzer and Offline BER Reader. For External Analyzer, there is no address but for Offline BER Reader you need to specify the address. Figure 71 Power Automations: Mode & Component Types Rx 5 Gb/s Calibration: Scope Connection: It allows you to select Chan 1 3 Direct Connect or Chan 2 4 Direct Connect Use Transfer Function: Embed a custom transfer function for calibrations. Receiver Super Loopback Training 110 Keysight N5990A Test Automation Software Platform for USB User Guide

111 ValiFrame USB Station 4 Loopback Training Method: Determines how the loopback training is performed. The available link training methods are WarmReset, PowerOnReset and Vendor Specific. Additionally, the M8020A J-BERT configuration with option 0S3 or US3 supports interactive link training with methods WarmReset LTSSM and PowerOnReset LTSSM. LFPS Idle: The signal applied between the LFPS bursts. LFPS Trigger Threshold: Detection level for LFPS signals sent by the DUT. This parameter is available only if PowerOnReset is selected as the Loopback Training Method. Use Link Training Suite Script: If False, you can configure the link training directly in ValiFrame: Delay After Reset: Time span between the Reset state and Configure LFPS used during loopback training. LFPS count: Number of bursts that are sent to the DUT. TS1 count: Number of TS1 Ordered Sets which are sent to the DUT. TS2 count: Number of TS2 Ordered Sets which are sent to the DUT. TSEQ count: Number of TSEQ Ordered Sets which are sent to the DUT. If True, the user can specify the Link Training Suite script file which will be loaded, depending on the loopback training method selected: Warm Reset Link Training Suite Settings File Power On Reset Link Training Suite Settings File For PowerOn Reset: All the parameters are same except that in this training method you can set the value of LFPS trigger threshold. WarmReset_LTSSM: Select the Link Training Suite Settings File and specify LFPS timing parameters and WarmReset burst length used during loopback training. PowerOnReset_LTSSM: Select the Link Training Suite Settings File and specify LFPS timing parameters used during loopback training. Vendor Specific Link Training Suite Settings File For VendorSpecific: Just select the sequence file. This file should only contain the loopback pattern for the generator and the analyzer. When Vendor Specific is selected, the user is responsible for setting the DUT in loopback mode. Differential voltage for loopback training: It has the following parameters: Long Channel Short Channel Keysight N5990A Test Automation Software Platform for USB User Guide 111

112 4 N5990A Overview Use voltage setting from Rx tests Error Detector: It sets the following CDR settings: Loop bandwidth: It sets the loop bandwidth in MHz. Transition density: It sets the Transition density in %. Peaking: It sets the peaking in db. DUT transmits with SSC: Indicate if DUT transmits with SCC to configure the error detector. It is available only for J-BERT N4903B. Expected SSC Deviation: In case DUT transmits with SCC, specify the expected deviation. Only for J-BERT N4903B Equalization: Only for J-BERT M8020A Sensitivity: Only for J-BERT M8020A Rx Specification Version 3.0 Long Channel Tests These tests are available for the following configurations: J-BERT N4903B with N4916 De-Emphasis Generator J-BERT N4903B with AUX_DATA J-BERT M8020A 5G Receiver Compliance Test Purpose and Method: This test determines if the DUT meets the receiver Compliance Test Specification. The procedure measures the number of symbol errors when all jitter types and the eye height are set to their specification limit values (maximum for jitter, minimum for eye height). This is done for several predefined jitter frequencies. For this measurement, it is necessary to train the DUT into loopback mode. For that, the data generator sends a training sequence to the DUT. The training sequence is generated based on the Loopback Training parameter settings (for example, PowerOnReset or WarmReset). 112 Keysight N5990A Test Automation Software Platform for USB User Guide

113 ValiFrame USB Station 4 The loopback training should be done with the same physical stress parameters as the measurements. This gives the DUT receiver the chance to optimize its equalizer for the test signal during loopback training. Keysight N5990A Test Automation Software Platform for USB User Guide 113

114 4 N5990A Overview Connection Diagram: Figure 72 Connection diagram for 5G Rx Compliance for JBERT N4903B, degenerator = N4916B (Device) 114 Keysight N5990A Test Automation Software Platform for USB User Guide

115 ValiFrame USB Station 4 Figure 73 Connection diagram for 5G Rx Compliance for JBERT N4903B, degenerator = AUX DATA (Device) Keysight N5990A Test Automation Software Platform for USB User Guide 115

116 4 N5990A Overview Figure 74 Connection diagram for 5G Rx Compliance for M8020A, warm reset (Device) 116 Keysight N5990A Test Automation Software Platform for USB User Guide

117 ValiFrame USB Station 4 Figure 75 Connection diagram for 5G Rx Compliance for M8020A, Power On Reset (Device) Keysight N5990A Test Automation Software Platform for USB User Guide 117

118 4 N5990A Overview Parameters in Expert Mode: Loopback Training Retrain at each Jitter Frequency: If false, the DUT is trained into loopback only at the beginning. If true, it is trained into loopback for each sinusoidal jitter frequency. Train with Jitter: If true, random and sinusoidal jitter are added to the signal during loopback training. Specification SSC Deviation: Spread spectrum clock deviation (downspread). SSC Frequency: Frequency of SSC. Eye Height: The eye height of the generator signal. Random Jitter: The amount of random jitter (peak peak) added to the test signal. HF Sinusoidal Jitter: The sinusoidal jitter amplitude. That only applies for jitter frequencies above or equal to the 4.9 MHz corner frequency. For all frequencies below 4.9 MHz, the compliance SJ levels are used. Eye Height Margin: The amount of voltage added to the specified value of the eye height. Random Jitter Margin: Percentage of random jitter added to the base value. Sinusoidal Jitter Margin: Percentage of sinusoidal jitter added to the base value. BER Setup Target BER: The Target BER for the measurements used in the test. Allowed Errors: The number of allowed symbol errors for one measurement. Relax Time: The time between the jitter is changed at the beginning of the measurement. Used Calibrations: All 5G calibrations except 5G LFPS Voltage Calibration 118 Keysight N5990A Test Automation Software Platform for USB User Guide

119 ValiFrame USB Station 4 Procedure Report: Keysight N5990A Test Automation Software Platform for USB User Guide 119

120 4 N5990A Overview Figure 76 Result description 120 Keysight N5990A Test Automation Software Platform for USB User Guide

121 ValiFrame USB Station 4 Column1: Result: Pass if the number of symbol errors is smaller than or equal to the Allowed Errors, failed otherwise. Column 2: SJ Frequency [MHz]: The tested sinusoidal jitter frequency point. Column 3: Failed Jitter [UI]: The sinusoidal jitter amplitude if the tested point fails. Column 4: Passed Jitter [UI]: The sinusoidal jitter amplitude if the tested point passes. Column 5: Min Spec [UI]: Minimum sinusoidal jitter amplitude that the DUT must tolerate. Column 6: Symbol Errors: Number of errors during the test. 5G Receiver Constant Parameter Stress Test Purpose and Method: This test determines if the DUT meets the receiver specifications for a particular jitter frequency. The procedure is similar to the receiver compliance test but it measures the number of symbol errors at a single sinusoidal jitter frequency, by default 4.9 MHz. This procedure is not a compliance test. Connection Diagram: Same as for 5G Receiver Compliance Test. Parameters in Expert Mode: Loopback Training Train with Jitter: Jitter is turned on or off for loopback training. Specification SSC Deviation: Spread spectrum clock deviation (downspread). SSC Frequency. Eye Height: The eye height of the generator signal. Random Jitter: The amount of random jitter (rms) added to the test signal. Keysight N5990A Test Automation Software Platform for USB User Guide 121

122 4 N5990A Overview Sinusoidal Jitter: The amplitude of the sinusoidal jitter component. Sinusoidal Jitter Frequency: The frequency of the sinusoidal jitter component. Eye Height Margin: The amount of voltage added to the specified value of the eye height. Random Jitter Margin: Percentage of random jitter added to the base value. Sinusoidal Jitter Margin: Percentage of sinusoidal jitter added to the base value. BER Setup Target BER: The Target BER for the measurements used in the test. Allowed Errors: The number of allowed errors for one measurement. Used Calibrations: All 5G Calibrations except 5G LFPS Voltage Calibration. 122 Keysight N5990A Test Automation Software Platform for USB User Guide

123 ValiFrame USB Station 4 Procedure Report: Figure 77 Result description Column1: Result: Pass if the number of errors is less than or equal to the number of allowed errors, fail otherwise. Column 2: Bit Errors: Number of errors during the test. Keysight N5990A Test Automation Software Platform for USB User Guide 123

124 4 N5990A Overview 5G Receiver Jitter Tolerance Test Purpose and Method: This test characterizes how much jitter a DUT can tolerate at different sinusoidal jitter frequencies. For each sinusoidal jitter frequency, the jitter amplitude is increased in equally-spaced steps until the number of measured symbol errors is bigger than Allowed Errors. Note that this receiver test is not a compliance test. Connection Diagram: Same as for 5G Receiver Compliance Test Parameters in Expert Mode: Loopback Training Force LB Training at Initialization: If true, loopback training is always done at the initialization of this test procedure without checking if the DUT is already in loopback. Retrain at each Jitter Frequency: If true, the DUT is re-trained into loopback mode for each SJ frequency. Train with Jitter: Jitter is turned on or off for loopback training. Sinusoidal Jitter Variation Frequency Mode: Specifies the distribution of the frequency points to test. It can be: Compliance Frequencies: Only the jitter frequencies from the compliance test. Equally Spaced Frequencies. Between a minimum and a maximum frequency the frequency points are distributed equally (linear or logarithmic). User Defined Frequencies: The user can define a list of frequencies. Single Frequency: Only one frequency is tested. Number of Jitter Steps: Number of jitter values tested to search the Max passed jitter at one frequency. Show Min Failed Points: The results graph can show the minimum failed jitter amplitude in addition to the maximum passed jitter amplitude for each tested frequency. Specification: SSC Deviation: Spread spectrum clock deviation (downspread). SSC Frequency. Eye Height: The eye height of the generator signal. 124 Keysight N5990A Test Automation Software Platform for USB User Guide

125 ValiFrame USB Station 4 Random Jitter: The amount of random jitter (peak-peak) added to the test signal. Eye Height Margin: The amount of voltage added to the specified value of the eye height. Random Jitter Margin: Percentage of random jitter added to the base value. Sinusoidal Jitter Margin: Percentage of sinusoidal jitter added to the base value. BER Setup Target BER: The Target BER for the measurements used in the test. Allowed Errors: Number of allowed errors for one measurement. Relax Time: Time between when the jitter is changed and the beginning of the measurement. Used Calibrations: All 5G Calibrations except 5G LFPS Voltage Calibration Procedure Report: Keysight N5990A Test Automation Software Platform for USB User Guide 125

126 4 N5990A Overview Figure 78 Result description Column 1: Results: Shows whether the test has passed or failed. 126 Keysight N5990A Test Automation Software Platform for USB User Guide

127 ValiFrame USB Station 4 Column 2: SJ Frequency [MHz]: Shows the sinusoidal jitter frequency set in the instrument. Column 3: Min Failed Jitter [UI]: Shows the minimum jitter amplitude at which the DUT introduces errors. Column 4: Max Passed Jitter [UI]: Shows the maximum jitter amplitude at which the DUT introduces no errors. Column 5: Jitter Capability Test Setup [UI]: Shows the maximum jitter amplitude that can be set depending on the current hardware setup. Column 6: Min Spec [UI]: Shows the minimum jitter amplitude defined by the specification at which the DUT is not allowed to introduce any error. Column 7: Margin [%]:Shows the ratio between the minimum jitter amplitude defined by the specification and the maximum jitter amplitude passed. 5G Receiver Sensitivity Test Purpose and Method: This test searches the minimum eye height a DUT can tolerate. The procedure starts with an eye height value of Start Eye Height and decreases it with steps of Step Size. The minimum passed value is the last test point that did not return more errors than specified in the Allowed Errors parameter. For DUTs which do not support disconnect it is necessary to train the DUT in every step. This procedure is not a compliance test. Connection Diagram: Same as for 5G Receiver Compliance Test. Parameters in Expert Mode: Loopback Training Force LB Training at Initialization: If true, loopback training is always done at the initialization of this test procedure without checking if the DUT is already in loopback. Keysight N5990A Test Automation Software Platform for USB User Guide 127

128 4 N5990A Overview Eye Height Variation Start Eye Height: The eye height that is used when the test starts. Eye Height Step Size: The amount the eye height is decreased by in one step to locate the Min passed Eye Height. Specification SSC Deviation: Spread spectrum clock deviation (down spread). SSC Frequency: Frequency of SSC. Random Jitter: The amount of random jitter (peak-peak) added to the test signal. Sinusoidal Jitter: The amount of sinusoidal jitter (peak-peak) added to the test signal. Sinusoidal Jitter Frequency: The frequency of the sinusoidal jitter component. Random Jitter Margin: Percentage of random jitter added to the base value. Sinusoidal Jitter Margin: Percentage of sinusoidal jitter added to the base value. Used Calibrations: All 5G Calibrations except 5G LFPS Voltage Calibration 128 Keysight N5990A Test Automation Software Platform for USB User Guide

129 ValiFrame USB Station 4 Procedure Report: Figure 79 Result description Column 1: Result: The Minimum Passed Differential Voltage should be smaller than the Minimum Spec. Keysight N5990A Test Automation Software Platform for USB User Guide 129

130 4 N5990A Overview Column 2: Min Passed Differential Voltage [mv]: The smallest eye height at which the DUT passes the test. Column 3: Min Spec [mv]: The smallest eye height at which the DUT has to pass the test to meet the specifications. Column 4: Margin [%]: Margin between the Minimum Passed Differential Voltage and the Min Spec, expressed as a percentage. 5G Receiver Data Rate Deviation Test Purpose and Method: This test checks the range of data rate deviation in which the DUT works properly. The method sets the specified values for eye height, jitter and SSC and measures the number of symbol errors for every tested deviation. The test is successful when all deviations between -300 ppm and 300 ppm pass the error test. This method is not a compliance test. Connection Diagram: Same as for 5G Receiver Compliance Test. Parameters in Expert Mode: Data Rate Variation Deviation Mode: Specifies the distribution of the deviation points to test. It can be: Pre-Defined Deviations: The tested points in this mode are: min spec (-300 ppm), nominal spec (0 ppm), max spec (300 ppm), -600 ppm, +600 ppm and ppm. The last three of those do not affect the overall test result because they are out of the specification range. Equally Spaced Deviations. User Defined Deviations. Single Deviation. Specification SSC Deviation: Spread spectrum clock (down spread) deviation. SSC Frequency: Frequency of the SSC. Eye Height: The eye height of the generator signal. 130 Keysight N5990A Test Automation Software Platform for USB User Guide

131 ValiFrame USB Station 4 Random Jitter: The amount of random jitter (rms) added to the test signal. Sinusoidal Jitter: The amplitude of the sinusoidal jitter component. Sinusoidal Jitter Frequency: The frequency of the sinusoidal jitter component. Eye Height Margin: The amount of voltage added to the specified value of the eye height. Random Jitter Margin: Percentage of random jitter added to the base value. Sinusoidal Jitter Margin: Percentage of sinusoidal jitter added to the base value. BER Setup Target BER: The Target BER for the measurements used in the test. Allowed Errors: The number of allowed errors for one measurement. Relax Time: Time between when the jitter is changed and the beginning of the measurement. Used Calibrations: All 5G Calibrations except 5G LFPS Voltage Calibration Keysight N5990A Test Automation Software Platform for USB User Guide 131

132 4 N5990A Overview Procedure Report: Figure 80 Result description 132 Keysight N5990A Test Automation Software Platform for USB User Guide

133 ValiFrame USB Station 4 Column1: Result: The deviations inside the range -300 ppm to 300 ppm have to pass for the the overall test result to pass. The other deviations are informative only. Column 2: Deviation [ppm]: Deviation added to the nominal data rate. Column 3: Data Rate [GBit/s]: Data rate after adding the deviation. Column 4: Errors [ ]: Number of errors during the test. Column 5: Comment: Additional remarks. Short Channel Tests These tests are available for the following configurations: J-BERT N4903B with N4916 De-Emphasis Generator. J-BERT N4903B with AUX_DATA. J-BERT M8020A. 5G Receiver Short Channel Compliance Test Purpose and Method: This test determines if the DUT meets the receiver Compliance Test Specification. The procedure measures the number of symbol errors when all jitter types and the eye height are set to their specification limit values (maximum for jitter, minimum for eye height). This is done for several predefined jitter frequencies. For this measurement, it is necessary to train the DUT into Loopback mode. For that, the data generator sends a training sequence to the DUT. The training sequence is generated based on the Loopback Training parameter settings (for example, PowerOnReset or WarmReset). The Loopback Training should be done with the same physical stress parameters as the measurements. This gives the DUT receiver the chance to optimize its equalizer for the test signal during Loopback Training. Keysight N5990A Test Automation Software Platform for USB User Guide 133

134 4 N5990A Overview Connection Diagram: Figure 81 Connection diagram for JBERT N4903B, degenerator = N4916B (Device) 134 Keysight N5990A Test Automation Software Platform for USB User Guide

135 ValiFrame USB Station 4 Figure 82 Connection diagram for JBERT N4903B, degenerator = AUX DATA (Device) Keysight N5990A Test Automation Software Platform for USB User Guide 135

136 4 N5990A Overview Figure 83 Connection diagram for M8020A, warm reset (Device) 136 Keysight N5990A Test Automation Software Platform for USB User Guide

137 ValiFrame USB Station 4 Figure 84 Connection diagram for M8020A, Power On Reset (Device) Keysight N5990A Test Automation Software Platform for USB User Guide 137

138 4 N5990A Overview Parameters in Expert Mode: The method and the parameters in Expert Mode are the same as for the 5G Receiver Compliance Test. There are two differences, however: Instead of using a signal with the minimum eye height, the maximum differential voltage is set to test the short channel scenario. Instead of the USB 3.0 Device/Host fixtures the Keysight U fixture is used. It has less insertion loss. Used Calibrations: All 5G Calibrations except 5G LFPS Voltage Calibration Procedure Report: 138 Keysight N5990A Test Automation Software Platform for USB User Guide

139 ValiFrame USB Station 4 Figure 85 Result description Column1: Result: The number of errors should be less than the number of allowed errors. Column 2: SJ Frequency [UI]: Sinusoidal jitter frequency. Column 3: Keysight N5990A Test Automation Software Platform for USB User Guide 139

140 4 N5990A Overview Failed Jitter[UI]: The amplitude of the jitter that fails the test. Column 4: Passed Jitter[UI]: The amplitude of the jitter that passes the test. Column 5: Min Spec[UI] Column 6: Symbol Errors: Number of errors during the test 5G Receiver Short Channel Constant Parameter Stress Test Purpose and Method: This test determines if the DUT meets the receiver specifications for a particular jitter frequency. The procedure is similar to the receiver compliance test but it measures the number of symbol errors at a single sinusoidal jitter frequency, by default 4.9 MHz. This procedure is not a compliance test. Connection Diagram: Same as for 5G Short Channel Compliance Test. Parameters in Expert Mode: All the parameters are the same as for 5G Receiver Compliance Test (Long Channel Test), but with the following difference: Instead of using a signal with the minimum eye height, the maximum Differential Voltage is set to test the short channel scenario. Used Calibrations: All 5G Calibrations except 5G LFPS Voltage Calibration 140 Keysight N5990A Test Automation Software Platform for USB User Guide

141 ValiFrame USB Station 4 Procedure Report: Figure 86 Result description Column1: Result: The number of errors should be less than the number of allowed errors. Column 2: Bit Errors: Number of errors during the test. Keysight N5990A Test Automation Software Platform for USB User Guide 141

142 4 N5990A Overview 5G Receiver Short Channel Jitter Tolerance Test Purpose and Method: This test characterizes how much jitter a DUT can tolerate at different sinusoidal jitter frequencies. For each sinusoidal jitter frequency, the jitter amplitude is increased in equally-spaced steps until the number of measured symbol errors is bigger than "Allowed Errors". Note that this receiver test is not a compliance test. Connection Diagram: Same as for 5G Receiver Compliance Test (Short Channel Test). Parameters in Expert Mode: All the parameter are same as for 5G Receiver Compliance Test (Long Channel Test), but with the following difference: Instead of using a signal with the minimum eye height the maximum differential voltage is set to test the short channel scenario. Used Calibrations: All 5G Calibrations except 5G LFPS Voltage Calibration. 142 Keysight N5990A Test Automation Software Platform for USB User Guide

143 ValiFrame USB Station 4 Procedure Report Keysight N5990A Test Automation Software Platform for USB User Guide 143

144 4 N5990A Overview Figure 87 Result description Column 1: Result: Shows whether the test has passed or failed. Column 2: SJ Frequency [MHz]: Shows the sinusoidal jitter frequency set in the instrument. Column 3: Min Failed Jitter [UI]: Shows the minimum jitter amplitude at which the DUT introduces errors.shows the number of failed jitter. Column 4: Max Passed Jitter [UI]: Shows the maximum jitter amplitude at which the DUT introduces no errors.number of passed jitter. Column 5: 144 Keysight N5990A Test Automation Software Platform for USB User Guide

145 ValiFrame USB Station 4 Jitter Capability Test Setup [UI]: Shows the maximum jitter amplitude that can be set depending on the current hardware setup. Column 6: Min Spec [UI]: Shows the minimum jitter amplitude defined by the specification at which the DUT is not allowed to introduce any error. Column 7: Margin [%]: Shows the ratio between the minimum jitter amplitude defined by the specification and the maximum jitter amplitude passed. 5G Receiver Short Channel Sensitivity Test Purpose and Method This test is similar to the 5G Receiver (Long Channel) Sensitivity Test. The difference is that instead of using a signal with the Eye height variation, it has differential voltage variation set to test the short channel scenario. This test searches the minimum differential voltage a DUT can tolerate. The procedure starts with a differential voltage value of "Start Differential Voltage" and decreases it with steps of Differential Voltage Step Size". The minimum passed value is the last test point that did not return more errors than specified in the Allowed Errors parameter. For DUTs which do not support disconnect it is necessary to train the DUT in every step. This procedure is not a compliance test. Connection Diagram: Same as for 5G Receiver Compliance Test (Short Channel Test). Parameters in Expert Mode: All the parameter are same as for 5G Receiver Sensitivity Test (Long Channel Test), but with the following difference: Differential Voltage Variation Start Differential Voltage: The differential Voltage where the test starts. Differential Voltage Step Size: Span between two consecutive differential voltage steps. Used Calibrations: All 5G Calibrations except 5G LFPS Voltage Calibration Keysight N5990A Test Automation Software Platform for USB User Guide 145

146 4 N5990A Overview Procedure Report: Figure 88 Result description Column 1: 146 Keysight N5990A Test Automation Software Platform for USB User Guide

147 ValiFrame USB Station 4 Result: The Min Passed Differential Voltage should be smaller than the Min Spec. Column 2: Min Passed Differntial Voltage [mv]: The smallest differential voltage at which the DUT passes the test. Column 3: Min Spec [mv]: The smallest differential voltage at which the DUT has to pass the test to meet the specifications. Column 4: Margin [%]: Ratio between the Min Passed Jitter and the Min Spec, expressed as a percentage. 5G Receiver Short Channel Data Rate Deviation Test Purpose and Method: This test checks the range of data rate deviation in which the DUT works properly. The method sets the specified values for differential voltage, jitter, and SSC, and measures the number of symbol errors for every tested deviation. The test is successful when all the deviations between -300 ppm and 300 ppm pass the error test. This method is not a compliance test. Connection Diagram: Same as for 5G Receiver Compliance Test (Short Channel Test). Parameters in Expert Mode: All the parameter are same as for 5G Receiver Data Rate Deviation Test (Long Channel Test), but with the following difference: Instead of using a signal with the minimum eye height the maximum differential voltage is set to test the short channel scenario. Used Calibrations: All 5G Calibrations except 5G LFPS Voltage Calibration. Keysight N5990A Test Automation Software Platform for USB User Guide 147

148 4 N5990A Overview Procedure Report: Figure 89 Result Description 148 Keysight N5990A Test Automation Software Platform for USB User Guide

149 ValiFrame USB Station 4 Column 1: Result: The deviations inside the range -300 ppm to 300 ppm have to pass for the overall test result to pass. The other deviations are informative only. Column 2: Deviation [ppm]: Deviation added to the nominal data rate. Column 3: Data Rate [GBit/s]: Data rate after adding the deviation. Column 4: Errors [ ]: Number of errors during the test. Column 5: Comments: Additional remarks. LFPS Tests The LFPS tests contain the following common parameters: Repetitions: The number of times to repeat the test sequence. Send TSEQ after LFPS: Set to True, in case of crystal-less devices, which require TSEQ pattern after LFPS for their CDR. Trigger Delay after LFPS: Sets the time between the last LFPS burst sent out by the pattern generator and the oscilloscope start with acquisition to detect TSEQ sent by the DUT. These tests are available for the following configurations: J-BERT N4903B with AUX_DATA J-BERT M8020A 5G Receiver LFPS Compliance Test Purpose and Method: This test verifies that the DUT recognizes LFPS signaling at the limit of what the spec allows. The procedure generates a sequence consisting of an LFPS pattern looped 16 times. The sequence is downloaded to the J-BERT and sent to the DUT. The procedure checks if the DUT responds with TSEQ using a real time oscilloscope. This is repeated for a set of differential voltage and duty cycle compliance combinations. Keysight N5990A Test Automation Software Platform for USB User Guide 149

150 4 N5990A Overview Connection Diagram: Figure 90 Connection setup for 5G Receiver LFPS Compliance Test 150 Keysight N5990A Test Automation Software Platform for USB User Guide

151 ValiFrame USB Station 4 Parameters in Expert Mode: Specification tperiod: The period of a single LFPS cycle. tburst: The period of time LFPS cycles are continuously sent to form a single LFPS burst. trepeat: The time between the start of two adjacent LFPS bursts. The following figure illustrates the concept of tperiod, tburst, and trepeat. Figure 91 LFPS definitions Used Calibrations: 5G LFPS Voltage Calibration Keysight N5990A Test Automation Software Platform for USB User Guide 151

152 4 N5990A Overview Procedure Report: Figure 92 Result description Column 1: Diff Volt pp [mv]: Differential voltage of the LFPS. Column 2: Measured Differential Voltage [%]: Measured Differential Voltage of the LFPS. 152 Keysight N5990A Test Automation Software Platform for USB User Guide

153 ValiFrame USB Station 4 5G Receiver LFPS Sensitivity Test Purpose and Method: This procedure characterizes the minimum differential LFPS amplitude at which the DUT still answers to the LFPS signal. Connection Diagram: Same as for 5G Receiver LFPS Compliance Test. Parameters in Expert Mode: Differential Voltage Variation Start Differential Voltage: The start differential voltage (peak-peak) of the LFPS bursts. Differential Voltage Step Size: The amount the differential voltage is decreased by, at each step. Specification tperiod: The period of a single LFPS cycle. tburst: The period of time LFPS cycles are sent continuously to form a single LFPS burst. trepeat: The time between the start of two adjacent LFPS bursts. Duty Cycle: The duty cycle of the LFPS burst. Used Calibrations: 5G LFPS Voltage Calibration Keysight N5990A Test Automation Software Platform for USB User Guide 153

154 4 N5990A Overview Procedure Report Figure 93 Result description Column 1: Result: The test passes if the minimum passed differential voltage is smaller than or equal to the spec limit. 154 Keysight N5990A Test Automation Software Platform for USB User Guide

155 ValiFrame USB Station 4 Column 2: Min Passed Diff Volt pp [mv]: Minimum Differential voltage of the LFPS at which DUT answer with a TSEQ. Column 3: Min Spec [mv]: The minimum spec levels. Column 4: Margin [%]: The margin between the minimum passed differential voltage and the spec level, expressed as a percentage. 5G Receiver LFPS Duty Cycle Test Purpose and Method: This procedure characterizes the LFPS duty cycle range that the DUT detects. The data generator sends LFPS signals varying the duty cycle in each test step. Each step is passed if the DUT sends the TSEQ pattern upon detecting the LFPS signal. The test passes if the DUT could respond to LFPS signals with a duty cycle between 40 and 60%. Connection Diagram: Same as for 5G Receiver LFPS Compliance Test. Parameters in Expert Mode: Duty Cycle Variation Start Duty Cycle: The duty cycle value for the first step. Stop Duty Cycle: The duty cycle value for the last step. Duty Cycle Step Size: After every step, the duty cycle is increased by this value. Specification tperiod: The period of a single LFPS cycle. tburst: The period of time LFPS cycles are continuously sent to form a single LFPS burst. trepeat: The time between the start of two adjacent LFPS bursts. Differential Voltage: The differential voltage (peak - peak) for the LFPS signal. Used Calibrations: 5G LFPS Voltage Calibration Keysight N5990A Test Automation Software Platform for USB User Guide 155

156 4 N5990A Overview Procedure Report Figure 94 Result description 156 Keysight N5990A Test Automation Software Platform for USB User Guide

157 ValiFrame USB Station 4 Column1: Result Column 2: Duty Cycle [%] Column 3: Min Spec Column 4: Max Spec 5G Receiver LFPS trepeat Test Purpose and Method: This procedure determines whether the DUT responds to LFPS signals with different trepeat values. Connection Diagram: Same as for 5G Receiver LFPS Compliance Test. Parameters in Expert Mode: Specification tperiod: The period of a single LFPS cycle. tburst: The period of time LFPS cycles are continuously sent to form a single LFPS burst. Differential Voltage: The differential voltage peak-peak of the LFPS burst. Duty Cycle: The duty cycle within tperiod. trepeat Variation Start trepeat Stop trepeat trepeat Step Size Used Calibrations: 5G LFPS Voltage Calibration Keysight N5990A Test Automation Software Platform for USB User Guide 157

158 4 N5990A Overview Procedure Report Figure 95 Result description Column 1: Result Column 2: 158 Keysight N5990A Test Automation Software Platform for USB User Guide

159 ValiFrame USB Station 4 Repeat [us] Column 3: Min Spec [us] Column 4: Max Spec [us] Power Connections This section illustrates the power connections and use of test fixtures in the procedures compliant with the Receiver Specification Version 3.0. On the Configure DUT window, click Show Parameters to display the Test Parameters window. On the Test Parameters window, the Common tab enables you to select a Power Mode. You can select Manual, PowerSwitch or PowerSupply. This section describes the required power connections for each of these modes. Manual In the Manual Mode, the user is responsible for supplying power to the DUT and power-cycling it. The following two diagrams illustrate the connections between the DUT and test fixtures for the Device and Host cases. Keysight N5990A Test Automation Software Platform for USB User Guide 159

160 4 N5990A Overview Device Figure 96 Device test fixtures 160 Keysight N5990A Test Automation Software Platform for USB User Guide

161 ValiFrame USB Station 4 Host Figure 97 Host Test Fixtures Power Switch, Vbus In PowerSwitch Mode, you can use either the Vbus or Main Power component to power up the DUT or enable the DUT's USB bus. The following diagrams illustrate the power connections for the Device and Host cases. Keysight N5990A Test Automation Software Platform for USB User Guide 161

162 4 N5990A Overview Device Figure 98 Device test fixtures Power Switch, Main Power Device Figure 99 Device test fixtures 162 Keysight N5990A Test Automation Software Platform for USB User Guide

163 ValiFrame USB Station 4 Host Figure 100 Host test fixtures Power Supply, Vbus In PowerSupply Mode, by default, any of these power supply instruments can be used for auto loopback training: E3631A, E363xA, E364xA, or N67xx. The following diagrams illustrate the power connections for the Device and Host cases. Keysight N5990A Test Automation Software Platform for USB User Guide 163

164 4 N5990A Overview Device Figure 101 Device test fixtures Power Supply, Main Power Device Figure 102 Device test fixtures 164 Keysight N5990A Test Automation Software Platform for USB User Guide

165 ValiFrame USB Station 4 Host Figure 103 Host test fixtures Rx Specification Version 3.1 Common Receiver Parameters: Same as for USB Spec Version 3.0. But the following differences exist: On the Common Test parameter tab there is a new parameter Type -C-Fixture (only available if the connector type selected is Type-C). It allows to select: USB IF fixture or N7015A: By selecting N7015A fixture, a new parameter, ISI Channel is displayed. Here, it is also possible to select the PDOs. For details, please refer to the USB section - Chapter 3- Valiframe DUT Configuration of Keysight ValiFrameType C Extension User Guide. On the Rx Super Speed Plus tab, there is one more parameter Use Link Training Suite script, which is the same as available on the Rx Super Speed tab, but with the difference that it is selected, by default, and cannot be disabled. This is because in case of Super Speed Plus, it is mandatory to use a Link Training Suite script file. Long Channel Tests These tests are available for the following configurations: Keysight N5990A Test Automation Software Platform for USB User Guide 165

166 4 N5990A Overview J-BERT N4903B with N4916 De-Emphasis Generator J-BERT N4903B with AUX_DATA J-BERT M8020A 5G Receiver Compliance Test Purpose and Method: This test determines if the DUT meets the receiver Compliance Test Specification. The procedure measures the number of symbol errors when all jitter types and the eye height are set to their specification limit values (maximum for jitter, minimum for eye height). This is done for several predefined jitter frequencies. For this measurement, it is necessary to train the DUT into Loopback Mode. For that, the data generator sends a training sequence to the DUT. The training sequence is generated based on the Loopback Training parameter settings (for example, PowerOnReset or WarmReset). The loopback training should be done with the same physical stress parameters as the measurements. This gives the DUT receiver the chance to optimize its equalizer for the test signal during loopback training. Connection Diagram 166 Keysight N5990A Test Automation Software Platform for USB User Guide

167 ValiFrame USB Station 4 Figure 104 Connection setup for 5G Receiver1 Comp Test for Super Speed with Long Channel (J-BERT N4903B, DeGeneration = N4916B) Keysight N5990A Test Automation Software Platform for USB User Guide 167

168 4 N5990A Overview Figure 105 Connection setup for 5G Receiver1 Comp Test for Super Speed with Long Channel (J-BERT N4903B, DeGeneration = AUX DATA) 168 Keysight N5990A Test Automation Software Platform for USB User Guide

169 ValiFrame USB Station 4 Figure 106 Connection setup for 5G Receiver Comp Test for Super Speed with Long Channel Test (M8020A) using Keysight N7015A Test Fixture Keysight N5990A Test Automation Software Platform for USB User Guide 169

170 4 N5990A Overview Figure 107 Connection setup for 5G Receiver Comp Test for Super Speed with Long Channel Test (M8020A) using Keysight N7015A Test Fixture Parameters in Expert Mode: Same as for the 5G Receiver Compliance Test for Spec Version 3.0 with the following are the differences: 170 Keysight N5990A Test Automation Software Platform for USB User Guide

171 ValiFrame USB Station 4 Instead of using a signal with the minimum eye height, the differential voltage is set to test the channel scenario. There are no margin parameters, that is, Eye Height Margin, Random Jitter Margin, and Sinusoidal Jitter Margin. Used Calibrations: All 5G Calibrations Procedure Report Keysight N5990A Test Automation Software Platform for USB User Guide 171

172 4 N5990A Overview Figure 108 Result description Column 1: Result: Pass if the number of symbol errors is smaller than or equal to the Allowed Errors, failed otherwise. Column 2: SJ Frequency [MHz]: The tested sinusoidal jitter frequency point. Column 3: Failed Jitter [UI]: The amplitude of the jitter that causes the test to fail. 172 Keysight N5990A Test Automation Software Platform for USB User Guide

173 ValiFrame USB Station 4 Column 4: Passed Jitter [UI]: The amplitude of the jitter that causes the test to pass. Column : Min Spec [UI]: Minimum sinusoidal jitter amplitude that the DUT must tolerate. Column 4: Symbol Errors: Shows the number of symbol errors. 5G Receiver Constant Parameter Stress Test Purpose and Method: This test determines if the DUT meets the receiver specifications for a particular jitter frequency. The procedure is similar to the receiver compliance test but it only measures the number of symbol errors once, by default at 4.9 MHz sinusoidal jitter. This procedure is not a compliance test. Connection Diagram: Same as for 5G Receiver Compliance Test. Parameters in Expert Mode: The parameters in the Expert Mode are the same as for 5G Receiver Constant Parameter Stress Test for spec version 3.0, but the following are the differences: Instead of using a signal with the minimum eye height, the differential voltage is set to test the channel scenario. There are no margin parameters, that is, Eye Height Margin, Random Jitter Margin, and Sinusoidal Jitter Margin. Used Calibrations: All 5G Calibrations. Keysight N5990A Test Automation Software Platform for USB User Guide 173

174 4 N5990A Overview Procedure Report Figure 109 Result description Column 1: Result: Shows the test result. 174 Keysight N5990A Test Automation Software Platform for USB User Guide

175 ValiFrame USB Station 4 Column 2: Bit Errors: Shows the number of Bit errors. 5G Receiver Jitter Tolerance Test Purpose and Method: This test characterizes how much jitter a DUT can tolerate at different sinusoidal jitter frequencies. Starting with the Min Frequency the jitter amplitude is increased with equally spaced steps until the number of measured symbol errors is bigger than Allowed Errors. The test is then repeated for all the remaining SJ frequencies. This method is not a compliance test. Connection Diagram: Same as for 5G Receiver Compliance Test. Parameters in Expert Mode: The parameters in Expert Mode are the same as for 5G Receiver Jitter Tolerance Test for spec version 3.0 but the following are the differences: Instead of using a signal with the minimum eye height, the differential voltage is set to test the channel scenario. There are no margin parameters, that is, Eye Height Margin, Random Jitter Margin, and Sinusoidal Jitter Margin. Used Calibrations: All 5G Calibrations Keysight N5990A Test Automation Software Platform for USB User Guide 175

176 4 N5990A Overview Procedure Report: 176 Keysight N5990A Test Automation Software Platform for USB User Guide

177 ValiFrame USB Station 4 Figure 110 Result description Column 1: Result: Shows whether the test has passed or failed. Keysight N5990A Test Automation Software Platform for USB User Guide 177

178 4 N5990A Overview Column 2: SJ Frequency [MHz]: Shows the sinusoidal jitter frequency set in the instrument. Column 3: Min Failed Jitter [UI]: Shows the minimum jitter amplitude at which the DUT introduces errors. Column 4: Max Passed Jitter [UI]: Shows the maximum jitter amplitude at which the DUT introduces no errors.number of passed jitter. Column 5: Jitter Capability Test Setup [UI]: Shows the maximum jitter amplitude that can be set depending on the current hardware setup. Column 6: Min Spec[UI]: Shows the minimum jitter amplitude defined by the specification at which the DUT is not allowed to introduce any error. Column 7: Margin [%]: Shows the ratio between the minimum jitter amplitude defined by the specification and the maximum jitter amplitude passed. 5G Receiver Sensitivity Test Purpose and Method: This test determines the minimum differential voltage at which DUT does not generate errors. Connection Diagram Same as for 5G Receiver Compliance Test. Parameters in Expert Mode: The parameters in the Expert Mode are the same as for 5G Receiver Sensitivity Test for spec version 3.0, but the following are some of the differences: Instead of using an eye height variation, it uses the Differential Voltage Variation as following: Start Differential Voltage: The differential amplitude where the test starts looking for the squelch level. Differential Voltage Step Size: Step size used to increase the differential amplitude. 178 Keysight N5990A Test Automation Software Platform for USB User Guide

179 ValiFrame USB Station 4 There are no margin parameters, that is, Eye Height Margin, Random Jitter Margin, and Sinusoidal Jitter Margin. Used Calibrations: All 5G Calibrations Keysight N5990A Test Automation Software Platform for USB User Guide 179

180 4 N5990A Overview Procedure Report Figure 111 Result description 180 Keysight N5990A Test Automation Software Platform for USB User Guide

181 ValiFrame USB Station 4 Column 1: Result: Shows the test result. Column 2: Min Passed Differential Voltage [mv]: Shows the smallest value of differential voltage at which the DUT passes the test. Column 3: Min Spec [UI]: The smallest differential voltage at which the DUT has to pass the test to meet the specifications.. Column 4: Margin: Margin between the Minimum Passed Differential Voltage and the Min Spec, expressed as a percentage. 5G Data Rate Deviation Test Purpose and Method: This test checks the range of data rate deviation in which the DUT works properly. The method sets the specified values for differential voltage, jitter, and SSC and measures the number of symbol errors for every tested deviation. The test is successful when all deviations between -300 ppm and 300 ppm pass the error test. This method is not a compliance test. Connection Diagram: Same as for 5G Compliance Test. Parameters in Expert Mode: The parameters in the Expert Mode are the same as for 5G Receiver Data Rate Deviation Test for spec version 3.0, but the following are some differences: Instead of using a signal with the minimum eye height, the differential voltage is set to test the channel scenario. There are no margin parameters, that is, Eye Height Margin, Random Jitter Margin, and Sinusoidal Jitter Margin. Used Calibrations: All 5G Calibrations Keysight N5990A Test Automation Software Platform for USB User Guide 181

182 4 N5990A Overview Procedure Report Figure 112 Result description 182 Keysight N5990A Test Automation Software Platform for USB User Guide

183 ValiFrame USB Station 4 Column 1: Result: The deviations inside the range -300 ppm to 300 ppm have to pass for the overall test result to pass. The other deviations are informative only. Column 2: Deviation [ppm]: Deviation added to the nominal data rate. Column 3: Data Rate [GBit/s]: Data rate after adding the deviation. Column 4: Errors: Shows the number of errors during the test. Column 5: Comments: Shows additional remarks. Short Channel Tests These tests are available for the following configurations: J-BERT N4903B with N4916 De-Emphasis Generator J-BERT N4903B with AUX_DATA J-BERT M8020A 5G Receiver Short Channel Compliance Test Purpose and Method: This test determines if the DUT meets the receiver Compliance Test Specification. The procedure measures the number of symbol errors when all jitter types and the eye height are set to their specification limit values (maximum for jitter, minimum for eye height). This is done for several predefined jitter frequencies. For this measurement, it is necessary to train the DUT into Loopback Mode. For that, the data generator sends a training sequence to the DUT. The training sequence is generated based on the Loopback Training parameter settings (for example, PowerOnReset or WarmReset). The Loopback Training should be done with the same physical stress parameters as the measurements. This gives the DUT receiver the chance to optimize its equalizer for the test signal during Loopback Training. Keysight N5990A Test Automation Software Platform for USB User Guide 183

184 4 N5990A Overview Connection Diagram Figure 113 Connection setup for 5G Receiver 1 Short Channel Comp Test for Super Speed with Short Channel (J-BERT N4903B, DeGeneration = N4916B) 184 Keysight N5990A Test Automation Software Platform for USB User Guide

185 ValiFrame USB Station 4 Figure 114 Connection setup for5g Receiver 1 Short Channel Comp Test for Super Speed with Short Channel (J-BERT N4903B, DeGeneration = AUX DATA) Keysight N5990A Test Automation Software Platform for USB User Guide 185

186 4 N5990A Overview Figure 115 Connection setup for5g Receiver 1 Short Channel Comp Test for Super Speed with Short Channel (M8020A) 186 Keysight N5990A Test Automation Software Platform for USB User Guide

187 ValiFrame USB Station 4 Figure 116 Connection setup for 5G Receiver 1 Short Channel Comp Test for Super Speed with Short Channel (M8020A) using Keysight N7015A Test Fixture Keysight N5990A Test Automation Software Platform for USB User Guide 187

188 4 N5990A Overview Parameters in Expert Mode: Same as for 5G Receiver Compliance Test. Used Calibrations: All 5G Calibrations Procedure Report: 188 Keysight N5990A Test Automation Software Platform for USB User Guide

189 ValiFrame USB Station 4 Figure 117 Result description Column 1: Result: The number of errors should be less than the number of allowed errors. Column 2 : SJ Frequency [MHz]: Shows the Sinusoidal Jitter frequency set in the instrument. Column 3: Failed Jitter: The amplitude of the jitter that fails the test. Column 4 : Passed Jitter: The amplitude of the jitter that passes the test. Column 5: Min Spec [UI]: Minimum sinusoidal jitter amplitude that the DUT must tolerate. Column 6: Keysight N5990A Test Automation Software Platform for USB User Guide 189

190 4 N5990A Overview Symbol Errors: The number of errors during the test. 5G Receiver Short Channel Constant Parameter Stress Test Purpose and Method: This test determines if the DUT meets the receiver specifications for a particular jitter frequency. The procedure is similar to the receiver compliance test but it only measures the number of symbol errors once, by default at 4.9 MHz sinusoidal jitter. This procedure is not a compliance test. Connection Diagram: Same as for 5G Receiver Compliance Test. Parameters in Expert Mode: Same as for 5G Receiver Constant Parameter Stress Test. Used Calibrations: All 5G Calibrations 190 Keysight N5990A Test Automation Software Platform for USB User Guide

191 ValiFrame USB Station 4 Procedure Report: Figure 118 Result description Column 1: Result: Shows the test result. Keysight N5990A Test Automation Software Platform for USB User Guide 191

192 4 N5990A Overview Column 2 : Bit Errors: Shows the number of Bit errors. 5G Receiver Short Channel Jitter Tolerance Test Purpose and Method: This test characterizes how much jitter a DUT can tolerate at different sinusoidal jitter frequencies. Starting with the Min Frequency" the jitter amplitude is increased with equally spaced steps until the number of measured symbol errors is bigger than "Allowed Errors". The test is then repeated for all the remaining SJ frequencies. This method is not a compliance test. Connection Diagram: Same as for 5G Receiver Compliance Test. Parameters in Expert Mode: Same as for 5G Receiver Jitter Tolerance Test. Used Calibrations: All 5G Calibrations 192 Keysight N5990A Test Automation Software Platform for USB User Guide

193 ValiFrame USB Station 4 Procedure Report: Keysight N5990A Test Automation Software Platform for USB User Guide 193

194 4 N5990A Overview Figure 119 Result description 194 Keysight N5990A Test Automation Software Platform for USB User Guide

195 ValiFrame USB Station 4 Column 1: Result: Shows whether the test has passed or failed. Column 2: SJ Frequency [MHz]: Shows the sinusoidal jitter frequency set in the instrument. Column 3: Min Failed Jitter: Shows the minimum jitter amplitude at which the DUT introduces errors.shows the number of failed jitter. Column 4: Max Passed Jitter: Shows the maximum jitter amplitude at which the DUT introduces no errors.number of passed jitter. Column 5: Jitter Capability Test Setup [UI]: Shows the maximum jitter amplitude that can be set depending on the current hardware setup. Column 6: Min Spec [UI]: Shows the minimum jitter amplitude defined by the specification at which the DUT is not allowed to introduce any error. Column 7: Margin [%]: Shows the ratio between the minimum jitter amplitude defined by the specification and the maximum jitter amplitude passed. 5G Receiver Short Channel Sensitivity Test Purpose and Method: This test determines the minimum differential voltage at which DUT does not generate errors. Connection Diagram: Same as for 5G Receiver Compliance Test Parameters in Expert Mode: Same as for 5G Receiver Channel Sensitivity Test. Used Calibrations: All 5G Calibrations Keysight N5990A Test Automation Software Platform for USB User Guide 195

196 4 N5990A Overview Procedure Report: Figure 120 Result description Column 1: Result: The Min Passed Differential Voltage should be smaller than the Min Spec. 196 Keysight N5990A Test Automation Software Platform for USB User Guide

197 ValiFrame USB Station 4 Column 2: Min Passed Differential Voltage [mv]: The smallest differential voltage at which the DUT passes the test. Column 3: Min Spec [UI]: The smallest differential voltage at which the DUT has to pass the test to meet the specifications. Column 4: Margin [%]: Ratio between the Min Passed Jitter and the Min Spec, expressed as a percentage. 5G Receiver Short Channel Data Rate Deviation Test Purpose and Method: This test checks the range of data rate deviation in which the DUT works properly. The method sets the specified values for differential voltage, jitter, and SSC, and measures the number of symbol errors for every tested deviation. The test is successful when all the deviations between -300 ppm and 300 ppm pass the error test. This method is not a compliance test. Connection Diagram: Same as for 5G Receiver Compliance Test. Parameters in Expert Mode: Same as for 5G Receiver Data Rate Deviation Test. Used Calibrations: All 5G Calibrations Keysight N5990A Test Automation Software Platform for USB User Guide 197

198 4 N5990A Overview Procedure Report: Figure 121 Result description 198 Keysight N5990A Test Automation Software Platform for USB User Guide

199 ValiFrame USB Station 4 Column 1: Result: The deviations inside the range -300 ppm to 300 ppm have to pass for the the overall test result to pass. The other deviations are informative only. Column 2: Deviation [ppm]: Deviation added to the nominal data rate. Column 3: Data Rate [GBit/s]: Data rate after adding the deviation. Column 4: Errors [ ]: Number of errors during the test. Column 5: Comments: Additional remarks. LFPS Tests The LFPS tests contain the following common parameters: Repetitions: The number of times to repeat the test sequence. Send TSEQ after LFPS: Set to True, in case of crystal-less devices, which require TSEQ pattern after LFPS for their CDR. Trigger Delay after LFPS: Sets the time between the last LFPS burst sent out by the pattern generator and the oscilloscope start with acquisition to detect TSEQ sent by the DUT. These tests are available for the following configurations: J-BERT N4903B with AUX_DATA. J-BERT M8020A. 5G Receiver LFPS Compliance Test Purpose and Method: This procedure verifies that the DUT recognizes LFPS signaling at the limit of what the spec allows. The procedure generates a sequence consisting of an LFPS pattern looped 16 times. The sequence is downloaded to the J-BERT and sent to the DUT. The procedure checks if the DUT responds with TSEQ using a real time oscilloscope. This is repeated for a set of differential voltage and duty cycle compliance combinations. Keysight N5990A Test Automation Software Platform for USB User Guide 199

200 4 N5990A Overview Connection Diagram: Figure 122 Connection setup for 5G Receiver LFPS Compliance Test (J-BERT N4903B, DeGeneration = AUX DATA) 200 Keysight N5990A Test Automation Software Platform for USB User Guide

201 ValiFrame USB Station 4 Figure 123 Connection setup for 5G Receiver LFPS Compliance Test (M8020A) Keysight N5990A Test Automation Software Platform for USB User Guide 201

202 4 N5990A Overview Figure 124 Connection setup for 5G Receiver LFPS Compliance Test (M8020A) using Keysight N7015A Test Fixture Parameters in Expert Mode: Same as for 5G Receiver LFPS Compliance Test for Spec Version Keysight N5990A Test Automation Software Platform for USB User Guide

203 ValiFrame USB Station 4 Used Calibrations: 5G LFPS Voltage Calibration Procedure Report: Figure 125 Result description Keysight N5990A Test Automation Software Platform for USB User Guide 203

204 4 N5990A Overview Column 1: Result: The test passes if the DUT answers with TSEQ. Column 2 : Diff Volt pp [mv]: Differential voltage of the LFPS. Column 3: Duty Cycle [%]: Duty cycle of the LFPS. 5G Receiver LFPS Sensitivity Test Purpose and Method: This procedure determines the minimum differential voltage of LFPS burst that the DUT can recognize. Connection Diagram: Same as for 5G Receiver LFPS Compliance Test. Parameters in Expert Mode: Same as for 5G Receiver LFPS Sensitivity Test for Spec Version 3.0. Used Calibrations: 5G LFPS Voltage Calibration 204 Keysight N5990A Test Automation Software Platform for USB User Guide

205 ValiFrame USB Station 4 Procedure Report: Figure 126 Result description Keysight N5990A Test Automation Software Platform for USB User Guide 205

206 4 N5990A Overview Column 1: Result: The test passes if the minimum passed differential voltage is smaller than or equal to the spec limit. Column 2: Min Passed Diff Volt pp [mv]: Minimum Differential voltage of the LFPS at which DUT answer with a TSEQ. Column 3: Min Spec [mv]: The minimum spec levels. Column 4: Margin [%]: The margin between the minimum passed differential voltage and the spec level, expressed as a percentage. 5G Receiver LFPS Duty Cycle Test Purpose and Method: This procedure determines the minimum and maximum duty cycle of the LFPS burst that the DUT can recognize. The data generator sends LFPS signals varying the duty cycle in each test step. Each step is passed if the DUT sends the TSEQ pattern upon detecting the LFPS signal. The test passes if the DUT could respond to LFPS signals with a duty cycle between 40 and 60%. Connection Diagram: Same as for 5G Receiver LFPS Compliance Test. Parameters in Expert Mode: Same as for 5G Receiver LFPS Duty Cycle Test for Spec Version 3.0 Used Calibrations: 5G LFPS Voltage Calibration 206 Keysight N5990A Test Automation Software Platform for USB User Guide

207 ValiFrame USB Station 4 Procedure Report: Figure 127 Result description Keysight N5990A Test Automation Software Platform for USB User Guide 207

208 4 N5990A Overview Column 1: Result Column 2: Duty Cycle [%] Column 3: Min Spec [%] Column 4: Max Spec [%] 5G Receiver LFPS trepeat Test Purpose and Method: This procedure determines whether the DUT responds to LFPS signals with different trepeat values. Connection Diagram: Same as for 5G Receiver LFPS Compliance Test. Parameters in Expert Mode: Specification tperiod: The period of a single LFPS cycle. tburst: The period of time LFPS cycles are continuously sent to form a single LFPS burst. Differential Voltage: The differential voltage peak-peak of the LFPS burst. Duty Cycle: The duty cycle within tperiod. trepeat Variation Start trepeat Stop trepeat trepeat Step Size Used Calibrations: 5G LFPS Voltage Calibration 208 Keysight N5990A Test Automation Software Platform for USB User Guide

209 ValiFrame USB Station 4 Procedure Report: Figure 128 Result description Keysight N5990A Test Automation Software Platform for USB User Guide 209

210 4 N5990A Overview Column 1: Result Column 2: Repeat [us] Column 3: Min Spec [us] Column 4: Max Spec [us] Power Connections This section illustrates the power connections and use of test fixtures in the procedures compliant with the Receiver Specification Version 3.1. On the Configure DUT window, click Show Parameters to display the Test Parameters window. On the Test Parameters window, the Common tab enables you to select a Power Mode. You can select Manual, PowerSwitch, or PowerSupply. This section describes the required power connections for each of these modes. Manual In the Manual Mode, the user is responsible for supplying power to the DUT and power-cycling it. The following two diagrams illustrate the connections between the DUT and test fixtures for the Device and Host cases. 210 Keysight N5990A Test Automation Software Platform for USB User Guide

211 ValiFrame USB Station 4 Device Figure 129 Device test fixtures Keysight N5990A Test Automation Software Platform for USB User Guide 211

212 4 N5990A Overview Host Figure 130 Host test fixtures Power Switch, Vbus In the PowerSwitch Mode, you can use either the Vbus or Main Power component to power up the DUT or enable the DUT's USB bus. The following diagrams illustrate the power connections for the Device and Host cases. 212 Keysight N5990A Test Automation Software Platform for USB User Guide

213 ValiFrame USB Station 4 Device Figure 131 Device test fixtures Power Switch, Main Power In the PowerSupply Mode, by default, any of these power supply instruments can be used for auto Loopback Training: E3631A, E363xA, E364xA, or N67xx. The following diagrams illustrate the power connections for the Device and Host cases. Keysight N5990A Test Automation Software Platform for USB User Guide 213

214 4 N5990A Overview Device Figure 132 Device test fixtures 214 Keysight N5990A Test Automation Software Platform for USB User Guide

215 ValiFrame USB Station 4 Host Figure 133 Host test fixtures Keysight N5990A Test Automation Software Platform for USB User Guide 215

216 4 N5990A Overview Power Supply, Vbus Device Figure 134 Device test fixtures Power Supply, Main Power Device Figure 135 Device test fixtures 216 Keysight N5990A Test Automation Software Platform for USB User Guide

217 ValiFrame USB Station 4 Host Figure 136 Host test fixtures Keysight N5990A Test Automation Software Platform for USB User Guide 217

218 4 N5990A Overview Super Speed Plus Module Procedure Description These tests are available for the following configurations: J-BERT N4903B with N4916 De-Emphasis Generator J-BERT M8020A Calibration 10G Pre-Shoot Calibration Purpose and Method: This procedure calibrates the pre-shoot by performing a sweep of several pre-shoot settings. The pattern generator first sends the equalization pattern to the Oscilloscope. The pre-shoot is set from 0 to 6 db with 1 db steps. The real values are measured with the oscilloscope. 218 Keysight N5990A Test Automation Software Platform for USB User Guide

219 ValiFrame USB Station 4 Connection Diagram: Figure 137 Connection setup for pre-shoot calibration (J-BERT N4903B, DeGeneration = N4916) Keysight N5990A Test Automation Software Platform for USB User Guide 219

220 4 N5990A Overview Figure 138 Connection setup for pre-shoot calibration (M8020A) Parameters in Expert Mode: No additional parameters. Used Calibrations: None 220 Keysight N5990A Test Automation Software Platform for USB User Guide

221 ValiFrame USB Station 4 Procedure Report: Figure 139 Result description Keysight N5990A Test Automation Software Platform for USB User Guide 221

222 4 N5990A Overview Column 1: Set Pre-Shoot [db]: Shows the Pre-Shoot value, set in the instrument. Column 2 Measured Pre-Shoot [db]: Shows the measured Pre-Shoot. 10G De-Emphasis Calibration Purpose and Method: This procedure calibrates the de-emphasis by performing a sweep of several de-emphasis settings. The pattern generator first sends the equalization pattern to the Oscilloscope. The de-emphasis is set from -6 to 0 db with 1 db steps. The real values are measured with the oscilloscope. Connection Diagram: Same as for 10G Pre-Shoot Calibration. Parameters in Expert Mode: No additional parameters. Used Calibrations: 10G Pre-Shoot Calibration 222 Keysight N5990A Test Automation Software Platform for USB User Guide

223 ValiFrame USB Station 4 Procedure Report: Figure 140 Result description Keysight N5990A Test Automation Software Platform for USB User Guide 223

224 4 N5990A Overview Column 1: Set De-Emphasis [db]: Shows the de-emphasis value, set in the instrument. Column 2: Measured De-Emphasis [db]: Shows the measured de-emphasis for each voltage point. 10G Generator Output Voltage Calibration Purpose and Method: This procedure calibrates the differential voltage. In this procedure, the pre-shoot is first set to 2.2 db using the pre-shoot calibration. Next, three different de-emphasis levels, 0 db, -3dB, and -6 db are set using the de-emphasis calibration. The generator output voltage levels are set to 900 mv and 700 mv, respectively. Finally, the two different voltage levels are measured with the oscilloscope. Connection Diagram: Same as 10G Pre-Shoot Calibration Parameters in Expert Mode: No additional parameters. Used Calibrations: 10G Pre-Shoot Calibration 10G De-Emphasis Calibration 224 Keysight N5990A Test Automation Software Platform for USB User Guide

225 ValiFrame USB Station 4 Procedure Report: Figure 141 Result Description Keysight N5990A Test Automation Software Platform for USB User Guide 225

226 4 N5990A Overview Column 1: Set Generator Voltage: Shows the generator voltage value, set in the instrument. Column 2, 3, & 4: Voltage x[db] de-emphasis [mv]: Shows the measured voltage. 10G Random Jitter Calibration Purpose and Method: This procedure calibrates the random jitter (RJ) directly at the generator output. The data generator sends the CP10 compliance pattern. It sets a total of 10 RJ values from 0 to 5 ps. These values are in the steps of 0.25 ps from 0 to 1 ps, and then from 1 to 2 ps with 1.5 ps as the intermediate step, and finally from 2 to 5 ps, in the steps of 1 ps (values set as 2 ps, 3 ps, 4 ps, and 5 ps). The jitter is measured with a real time oscilloscope using SigTest. Connection Diagram: Same as for 10G Pre-Shoot Calibration. Parameters in Expert Mode: Number of Averages: Number of waveforms that will be acquired for SigTest calculations. Used Calibrations: None 226 Keysight N5990A Test Automation Software Platform for USB User Guide

227 ValiFrame USB Station 4 Procedure Report: Figure 142 Result description Keysight N5990A Test Automation Software Platform for USB User Guide 227

228 4 N5990A Overview Column 1: Set Random Jitter: Shows the random jitter amplitude set in the instrument. Column 2,: Measured RJ [ps]: Shows the measured random jitter amplitude. 10G LF Sinusoidal Jitter Calibration Purpose and Method: This procedure calibrates the low frequency sinusoidal jitter directly at the generator output. This procedure calibrates the sinusoidal jitter for low frequencies (from 200 KHz to 4 MHz). The data generator sends the CP9 compliance pattern during this calibration. The procedure makes a sinusoidal jitter sweep in five different frequencies. It checks that the measured jitter amplitude values are consistent across jitter frequencies. Deviations bigger than 2.5% between the measured jitter amplitudes for the same set jitter amplitude with different frequencies are not allowed. In case of a bigger deviation, the point is re-measured up to three times. The sinusoidal jitter is measured with the oscilloscope using the SigTest software. SigTest is the standard method to measure Eye Height and Jitter. It is the only valid option for compliance testing. Connection Diagram: Same as for 10G Pre-Shoot Calibration. Parameters in Expert Mode: Same as for 10G Random Jitter Calibration. Used Calibrations: None 228 Keysight N5990A Test Automation Software Platform for USB User Guide

229 ValiFrame USB Station 4 Procedure Report: Figure 143 Result description Keysight N5990A Test Automation Software Platform for USB User Guide 229

230 4 N5990A Overview Column 1: Set Jitter: Shows the jitter amplitude set in the instrument. Column 2, 3, 4, 5 & 6 : SJ (x MHz) [ps]: Shows the measured jitter. 10G HF Sinusoidal Jitter Calibration Purpose and Method: This procedure calibrates the low frequency sinusoidal jitter directly at the generator output. This procedure calibrates the sinusoidal jitter for low frequencies (from 10 MHz to 100 MHz). The data generator sends the CP9 compliance pattern during this calibration. The procedure makes a sinusoidal jitter sweep in three different frequencies. It checks that the measured jitter amplitude values are consistent across jitter frequencies. Deviations bigger than 5 % between the measured jitter amplitudes for the same set jitter amplitude with different frequencies are not allowed. In case of a bigger deviation, the point is re-measured up to three times. The sinusoidal jitter is measured with the oscilloscope using the SigTest software. SigTest is the standard method to measure Eye Height and Jitter. It is the only valid option for compliance testing. Connection Diagram: Same as for 10G Pre-Shoot Calibration. Parameters in Expert Mode: Same as for 10G LF Sinusoidal Jitter Calibration. Used Calibrations: None 230 Keysight N5990A Test Automation Software Platform for USB User Guide

231 ValiFrame USB Station 4 Procedure Report: Figure 144 Result description Keysight N5990A Test Automation Software Platform for USB User Guide 231

232 4 N5990A Overview Column 1: Set Sinusoidal Jitter [ps]: Shows the sinusoidal jitter amplitude set in the instrument. Column 2, 3, & 4,: SJ (x MHz) [ps]: Shows the measured sinusoidal jitter amplitude. Long Channel All the calibrations in this section are performed using a calibration channel. 10G Compliance Load Board Selection Purpose and Method: In this procedure, the data generator sends the CP9 compliance pattern. The procedure measures the eye height with nominal stress settings (refer to the non-editable parameters for this test) of all three CLBs to determine the right CLB that will be used for further calibrations and Rx tests. The software selects the CLB with which the measured eye height is closest to 70 mv. 232 Keysight N5990A Test Automation Software Platform for USB User Guide

233 ValiFrame USB Station 4 Connection diagram: Figure 145 Connection Setup for 10G Compliance Load Board Selection (J-BERT N4903B, DeGeneration = N4916B) Keysight N5990A Test Automation Software Platform for USB User Guide 233

234 4 N5990A Overview Figure 146 Connection Setup for 10G Compliance Load Board Selection (M8020A) Parameters in Expert Mode: Non-editable SSC Deviation Pre- Shoot De-Emphasis: The de-emphasis of the data signal Differential Voltage: The differential voltage (peak - peak) for the signal. Random Jitter: The amount of random jitter (peak peak) added to the test signal. 234 Keysight N5990A Test Automation Software Platform for USB User Guide

235 ValiFrame USB Station 4 Sinusoidal Jitter: Sinusoidal jitter used for this test. Editable: Number of Averages: Number of waveforms that will be acquired for SigTest calculations. Used Calibrations: All previous calibrations Procedure Report: Figure 147 Result Description Column 1: CLB Length (inch): Shows the CLB length set in the instrument. Column 2,: Measured Eye Height [mv]: Shows the measured eye height for each corresponding CLB length. Keysight N5990A Test Automation Software Platform for USB User Guide 235

236 4 N5990A Overview 10G Eye Width Pre Calibration Purpose and Method: In this procedure, the data generator sends the CP9 compliance pattern. The procedure calibrates the eye-width by sweeping over several de-emphasis settings to discover the de-emphasis setting which makes the eye-width closest to the target specification value. Connection diagram: Same as for 10G Compliance Load Board Selection. Parameters in Expert Mode: Same as for 10G Compliance Load Board Selection. Used Calibrations: All previous calibrations Procedure Report: Figure 148 Result description 236 Keysight N5990A Test Automation Software Platform for USB User Guide

237 ValiFrame USB Station 4 Column 1: Set De-Emphasis: Shows the de-emphasis value, set in the instrument. Column 2: Measured Eye Width [ps]: Shows the measured Eye Width for each voltage point. Column 1: Set De-Emphasis: Shows the de-emphasis value, set in the instrument. Column 2: Measured Eye Height [mv]: Shows the measured Eye Height for each voltage point. 10G Eye Height and Width Calibration Purpose and Method: In this procedure, the data generator sends the CP9 compliance pattern. The procedure measures the eye height and eye width with respect to differential voltage and sinusoidal jitter. The calibration data is used to generate a stress Rx eye with a defined eye height and width. Connection Diagram: Same as for 10G Eye Width Pre Calibration. Parameters in Expert Mode: Same as for 10G Compliance Load Board Selection. Used Calibrations: All previous calibrations Keysight N5990A Test Automation Software Platform for USB User Guide 237

238 4 N5990A Overview Procedure Report: Figure 149 Result description 10G Eye Height Calibration Column 1: Set SJ {ps}: Shows the de-emphasis value, set in the instrument. Column 2 & 3: Eye Height [x ps] [mv]: Shows the measured Eye Height for each voltage point. 10G Eye Width Calibration Column 1: Set SJ {ps}: Shows the de-emphasis value, set in the instrument. Column 2 & 3: Eye Width [x ps]: Shows the measured Eye Width for each voltage point. 238 Keysight N5990A Test Automation Software Platform for USB User Guide

239 ValiFrame USB Station 4 10G Compliance Eye Calibration Purpose and Method: In this procedure, the data generator sends the CP9 compliance pattern. The procedure calibrates eye height and eye width according to the test specification, using sinusoidal jitter to adjust the eye width. The measurements are done on the scope using the SigTest software. Connection Diagram: Same as for 10G Eye Width Pre Calibration. Parameters in Expert Mode: Same as for 10G Eye Height and Width Calibration and Max Number of Search Steps: The maximum number of steps after the search for optimum Vdiff and SJ values is aborted. Used Calibrations: All previous calibrations Keysight N5990A Test Automation Software Platform for USB User Guide 239

240 4 N5990A Overview Procedure Report: Figure 150 Result description Column 1: Vdiff [mv] Column 2: SJ [ps]: Sinusoidal jitter. Column 3: Eye-Height [mv]: Shows the measured Eye Height. Column 4: Eye-Width [mv]: Shows the measured Eye Width. 240 Keysight N5990A Test Automation Software Platform for USB User Guide

241 ValiFrame USB Station 4 10G Compliance Eye Verification Purpose and Method: This test checks if it is possible to meet the eye height specification with the current calibration data and setup. The pattern generator sends the CP9 pattern to the Oscilloscope and Random Jitter and Sinusoidal Jitter are set to the values specified in the USB Compliance Test Specification. The differential output voltage amplitude is set to the specified value plus a small margin defined with the Eye Height Margin parameter. The eye height is measured with the oscilloscope using SigTest. Connection Diagram: Same as for 10G Eye Width Pre Calibration. Parameters in Expert Mode: Same as for 10G Compliance Load Board Selection and CLB Trace Length: The specified Compliance Load Board (CLB) trace length causes the receiver eye height to be closest to the target eye height specified. Used Calibrations: All previous calibrations Keysight N5990A Test Automation Software Platform for USB User Guide 241

242 4 N5990A Overview Procedure Report: Figure 151 Result description Column 1: Result: Shows the test result. Column 2: Measured Eye Height [mv]. Column 3: Min Eye Height [mv]. Column 4: Max Eye Height [mv].. Column 5: Measured Eye Width [mv]. Column 6: Min Eye Width [mv]. Column 7: Max Eye Width [mv]. 242 Keysight N5990A Test Automation Software Platform for USB User Guide

243 ValiFrame USB Station 4 Receiver Figure 152 List of Receiver Tests Long Channel Tests In the following section, for connectors Type-C and Tethered Type-C, the receiver tests are duplicated for each lane. The abbreviations Rx1 and Rx2 are added to each procedure name in the software, meaning Lane 1 and Lane 2, respectively. Note that both lanes must be tested for a valid compliance test. 10G Compliance Test Purpose and Method: This test determines if the DUT meets the receiver Compliance Test Specification. Keysight N5990A Test Automation Software Platform for USB User Guide 243

244 4 N5990A Overview The procedure measures the number of symbol errors when all jitter types and the eye height are set to their specification limit values (maximum for jitter, minimum for eye height). This is done for several predefined jitter frequencies. For this measurement, it is necessary to train the DUT into Loopback Training mode. For this, the data generator sends a training sequence to the DUT. The training sequence is generated based on the Loopback Training parameter settings (for example, WarmReset, PowerOnReset, WarmReset_LTSSM or PowerOnReset_LTSSM). The WarmReset_LTSSM link training method is used for devices only while the PowerOnReset_LTSSM link training method is used for device or host. Figure 153 Loopback training methods The Loopback Training should be done with the same physical stress parameters as the measurements. This gives the DUT receiver the chance to optimize its equalizer for the test signal during Loopback Training. 244 Keysight N5990A Test Automation Software Platform for USB User Guide

245 ValiFrame USB Station 4 Connection diagram: Figure 154 Connection setup for 10GReceiver1 Comp. Test for Super Speed plus with Long Channel (J-BERT N4903B, DeGeneration = N4916B) Keysight N5990A Test Automation Software Platform for USB User Guide 245

246 4 N5990A Overview NOTE Super Speed Plus is not available with (J-BERT N4903B, DeGeneration = AUX DATA.. Figure 155 Connection setup for 10GReceiver1 Comp. Test for Super Speed plus with Long Channel (M8020A) 246 Keysight N5990A Test Automation Software Platform for USB User Guide

247 ValiFrame USB Station 4 Figure 156 Connection setup for 10G Receiver Comp. Test for Super Speed plus with Long Channel (M8020A) using Keysight N7015A Test Fixture Parameters in Expert Mode: Loopback Training Keysight N5990A Test Automation Software Platform for USB User Guide 247

248 4 N5990A Overview Retrain at each Jitter Frequency: If false, the DUT is trained into loopback only at the beginning of the test. If true, it is trained into loopback for each sinusoidal jitter frequency. Train with Jitter: If true, Random Jitter and Sinusoidal Jitter are added to the signal during Loopback Training. Specification (Non-editable parameters) Target Eye Height. Target Eye Width. Eye Height: The differential voltage amplitude of the data signal. Eye Width. Pre-Shoot: Pre-shoot used for calibrations and receiver tests. De-Emphasis: The de-emphasis of the data signal. Differential Voltage: The differential voltage (peak - peak) for the signal. Random Jitter: The amount of random jitter (peak peak) added to the test signal. SJ Reduction for Eye-Width Adjusment: Amount of sinusoidal jitter at the frequency specified that is subtracted for eye-width adjustment. Second Tone SJ for Eye-Width Adjusment: Amount of sinusoidal jitter at 87 MHz that is added for eye width adjustment. SSC Deviation. BER Setup BER Test Duration: Duration of the BER test for one SJ point. Allowed Errors: The number of allowed symbol errors for one measurement. Relax Time: The time between the jitter is changed and the beginning of the measurement. 248 Keysight N5990A Test Automation Software Platform for USB User Guide

249 ValiFrame USB Station 4 Used Calibrations: All 10G Calibrations Procedure Report: Keysight N5990A Test Automation Software Platform for USB User Guide 249

250 4 N5990A Overview Figure 157 Result description Column 1: Result: Shows the test result. Column 2 : SJ Frequency [MHz]: Shows the Sinusoidal Jitter set in the instrument. Column 3: Failed Adjusted SJ[ps]: Shows the number of failed jitter. Column 4 : Passed Adjusted SJ[ps]: Shows the number of passed jitter. 250 Keysight N5990A Test Automation Software Platform for USB User Guide

251 ValiFrame USB Station 4 Column 5: Min Spec[UI]: Shows the min Spec required. Column 6: Nominal SJ[ps] Column 7: Errors: Shows the number of errors. 10G Constant Parameter Stress Test Purpose and Method: This test determines if the DUT meets the receiver specifications for a particular jitter frequency. The procedure is similar to the receiver compliance test but it only measures the number of symbol errors once, by default at 4.9 MHz sinusoidal jitter. This procedure is not a compliance test. Connection Diagram: Same as for 10G Compliance Test. Parameters in Expert Mode Loopback Training Retrain at each Jitter Frequency: If false the DUT is trained into loopback only at the beginning. If true it is trained into loopback for each Sinusoidal Jitter frequency. Train with Jitter: If true Random Jitter and Sinusoidal Jitter are added to the signal during Loopback Training. Specification Pre-Shoot. De-Emphasis: The de-emphasis of the data signal Differential Voltage: The differential voltage (peak - peak) for the signal. Random Jitter: The amount of random jitter (peak peak) added to the test signal. Nominal SJ. Sinusoidal Jitter Frequency. SJ Reduction for Eye-Width Adjustment. Second Tone SJ for Eye-Width Adjustment. SSC Deviation Adjusted SJ (Non-editable) Keysight N5990A Test Automation Software Platform for USB User Guide 251

252 4 N5990A Overview BER Setup Target BER: The Target BER for the measurements used in the test. Allowed Errors: The number of allowed errors for one measurement. Relax time for BER Measurement: Time span between when the jitter is enabled and the start of the BER test. Used Calibrations: All 10G Calibrations 252 Keysight N5990A Test Automation Software Platform for USB User Guide

253 ValiFrame USB Station 4 Procedure Report: Figure 158 Result description Keysight N5990A Test Automation Software Platform for USB User Guide 253

254 4 N5990A Overview Column 1: Result Column 2 : Pre-Shoot [db] Column 3: De-Emphasis [db] Column 4 : Differential Voltage [mv] Column 5: Random Jitter [ps] Column 6: Nominal SJ [ps] Column 7: SJ Frequency [MHz] Column 8: Adjusted SJ [ps] Column 9: Second Tone SJ [ps] Column 10: Errors 10G Jitter Tolerance Test Purpose and Method: This test characterizes how much jitter a DUT can tolerate at different sinusoidal jitter frequencies. For each sinusoidal jitter frequency, the jitter amplitude is increased in equally-spaced steps until the number of measured symbol errors is bigger than "Allowed Errors". Note that this receiver test is not a compliance test. Connection Diagram: Same as for 10G Compliance Test. Parameters in Expert Mode Loopback Training Retrain at each Jitter Frequency: If false the DUT is trained into loopback only at the beginning. If true it is trained into loopback for each Sinusoidal Jitter frequency. 254 Keysight N5990A Test Automation Software Platform for USB User Guide

255 ValiFrame USB Station 4 Train with Jitter: If true random and sinusoidal jitter are added to the signal during loopback training. Sinusoidal Jitter Variation Number of Jitter Steps Frequency Mode: Specifies the distribution of the frequency points to test. It can be: Compliance Frequencies: Only the jitter frequencies from the compliance test. Equally Spaced Frequencies. Between a minimum and a maximum frequency the frequency points are distributed equally (linear or logarithmic). User Defined Frequencies: The user can define a list of frequencies. Single Frequency: Only one frequency is tested Show Min. Failed Points: If True, the minimum sinusoidal jitter amplitude at which the BER test failed is included in the results graph. Specification Target Eye Height: The calibration is performed to achieve this target eye height. Target Eye Width: The calibration is performed to achieve this target eye width. Eye Height: The differential voltage amplitude of the data signal. Eye Width: Eye width that is obtained after the calibration. Pre-Shoot: Pre-shoot used for calibration and receiver tests. De-Emphasis: The de-emphasis of the data signal. Differential Voltage: The differential voltage (peak - peak) for the signal. Random Jitter: The amount of random jitter (peak peak) added to the test signal. SJ Reduction for Eye-Width Adjustment: Amount of sinusoidal jitter at the frequency specified that is subtracted for eye width adjustment. Second Tone SJ for Eye-Width Adjusment: Amount of sinusoidal jitter at 87 MHz that is added for eye width adjustment. SSC Deviation. BER Setup Target BER: The Target BER for the measurements used in the test. Relax Time: The time between the jitter is changed and the beginning of the measurement. Keysight N5990A Test Automation Software Platform for USB User Guide 255

256 4 N5990A Overview Used Calibrations: All 10G Calibrations Procedure Report: 256 Keysight N5990A Test Automation Software Platform for USB User Guide

257 ValiFrame USB Station 4 Figure 159 Result description Column 1: Result: Shows whether the test has passed or failed. Keysight N5990A Test Automation Software Platform for USB User Guide 257

258 4 N5990A Overview Column 2: SJ Frequency [MHz]: Shows the sinusoidal jitter frequency set in the instrument. Column 3: Min Failed Jitter [ps]: Shows the minimum jitter amplitude at which the DUT introduces errors.shows the number of failed jitter. Column 4 : Max Passed Jitter [ps]: Shows the maximum jitter amplitude at which the DUT introduces no errors.number of passed jitter. Column 5 : Jitter Capability Test Setup [ps]: Shows the maximum jitter amplitude that can be set depending on the current hardware setup.column 6 : Min Spec[ps]: Shows the minimum jitter amplitude defined by the specification at which the DUT is not allowed to introduce any error. Column 7 : Margin [%]:Shows the ratio between the minimum jitter amplitude defined by the specification and the maximum jitter amplitude passed. 10G Sensitivity Test Purpose and Method: This test searches the minimum eye height a DUT can tolerate. The procedure starts with an eye height value of "Start Eye Height" and decreases it with steps of "Step Size". The minimum passed value is the last test point that did not return more errors than specified in the Allowed Errors parameter. For DUTs which do not support disconnect it is necessary to train the DUT in every step. This procedure is not a compliance test. Connection Diagram: Same as for 10G Compliance Test. Parameters in Expert Mode Loopback Training Train with Jitter: If true Random Jitter and Sinusoidal Jitter are added to the signal during Loopback Training. Eye Height Variation Start Eye Height: The eye height (transitions bits) where the test starts. 258 Keysight N5990A Test Automation Software Platform for USB User Guide

259 ValiFrame USB Station 4 Eye Height Step Size: The amount the eye height is decreased by one step to search the Min passed Eye Height. Specification (Non-editable parameters) Pre-Shoot: Pre-shoot used for calibrations and receiver tests. De-Emphasis: The de-emphasis of the data signal. Random Jitter: The amount of random jitter (peak peak) added to the test signal. Nominal SJ: Sinusoidal jitter amplitude at the frequency specified that will be set to achieve the target eye-width. Sinusoidal Jitter Frequency: Sinusoidal jitter frequency that will be set to achieve the target eye-width. SJ Reduction for Eye-Width Adjusment: Amount of sinusoidal jitter at the frequency specified that is subtracted for eye width adjustment. Second Tone SJ for Eye-Width Adjusment: Amount of sinusoidal jitter at 87 MHz that is added for eye width adjustment. SSC Deviation Adjusted SJ BER Setup Target BER: The Target BER for the measurements used in the test. Relax Time for BER Measurement: The time between the jitter is changed and the beginning of the measurement. Used Calibrations: All 10G Calibrations Keysight N5990A Test Automation Software Platform for USB User Guide 259

260 4 N5990A Overview Procedure Report: Figure 160 Result description Column 1: Result: The Minimum Passed Eye Height should be smaller than the Minimum Spec. Column 2: Min Passed Eye Height [mv]: The smallest eye height at which the DUT passes the test. 260 Keysight N5990A Test Automation Software Platform for USB User Guide

261 ValiFrame USB Station 4 Column 3: Min Spec[mV]: The smallest eye height at which the DUT has to pass the test to meet the specifications. Column 4: Margin [%]:Margin between the Minimum Passed Eye Height and the Min Spec, expressed as a percentage. Short Channel Test The Short Channel tests are similar to the Long Channel tests. The difference between them lies in the test channel that is used. 10G Short Channel Compliance Test Purpose and Method: This test determines if the DUT meets the receiver Compliance Test Specification. The procedure measures the number of symbol errors when all jitter types and the eye height are set to their specification limit values (maximum for jitter, minimum for eye height). This is done for several predefined jitter frequencies. For this measurement, it is necessary to train the DUT into loopback mode. For that, the data generator sends a training sequence to the DUT. The training sequence is generated based on the Loopback Training parameter settings (for example, PowerOnReset or WarmReset). The loopback training should be done with the same physical stress parameters as the measurements. This gives the DUT receiver the chance to optimize its equalizer for the test signal during Loopback Training. Keysight N5990A Test Automation Software Platform for USB User Guide 261

262 4 N5990A Overview Connection diagram Figure 161 Connection setup for 10GReceiver1 Short Channel Comp. Test for Super Speed plus with Long Channel (J-BERT N4903B, DeGeneration = N4916B) 262 Keysight N5990A Test Automation Software Platform for USB User Guide

263 ValiFrame USB Station 4 Figure 162 Connection setup for 10GReceiver1 Short Channel Comp. Test for Super Speed plus with Long Channel (M8020A Keysight N5990A Test Automation Software Platform for USB User Guide 263

264 4 N5990A Overview Figure 163 Connection setup for 10G Receiver1 Short Channel Comp. Test for Super Speed plus with Long Channel (M8020A) using Keysight N7015A Test Fixture 264 Keysight N5990A Test Automation Software Platform for USB User Guide

265 ValiFrame USB Station 4 Parameters in Expert Mode: Loopback Training Retrain at each Jitter Frequency: If false the DUT is trained into loopback only at the beginning. If true it is trained into loopback for each sinusoidal jitter frequency. Train with Jitter: If true random and sinusoidal jitter are added to the signal during loopback training. Specification Pre-Shoot: Pre-shoot used for calibrations and receiver tests. De-Emphasis: The de-emphasis of the data signal. Differential Voltage: The differential voltage (peak - peak) for the signal. Random Jitter: The amount of random jitter (peak peak) added to the test signal. SJ Reduction for Eye-Width Adjusment: Amount of sinusoidal jitter at the frequency specified that is subtracted for eye-width adjustment. Second Tone SJ for Eye-Width Adjusment: Amount of sinusoidal jitter at 87 MHz that is added for eye width adjustment. SSC Deviation BER Setup BER Test Duration: Duration of the BER test for one SJ point. Allowed Errors: The number of allowed symbol errors for one measurement. Relax Time: The time between the jitter is changed and the beginning of the measurement. Used Calibrations: All 10G Calibrations Keysight N5990A Test Automation Software Platform for USB User Guide 265

266 4 N5990A Overview Procedure Report: 266 Keysight N5990A Test Automation Software Platform for USB User Guide

267 ValiFrame USB Station 4 Figure 164 Result description Column 1: Result: Shows the test result. Column 2: SJ Frequency [MHz]: Shows the Sinusoidal Jitter frequency set in the instrument. Keysight N5990A Test Automation Software Platform for USB User Guide 267

268 4 N5990A Overview Column 3: Failed Adjusted SJ [ps]: Shows the jitter amplitude which caused the DUT to introduce errors. Column 4 : Passed Adjusted SJ [ps]: Shows the jitter amplitude at which the DUT still worked without introducing errors. Column 5: Min Spec [ps]: Shows the min Spec required. Column 6: Nominal SJ [ps]: Nominal sinusoidal jitter that is used in the test. Column 7: Errors: Shows the number of errors. 10G Short Channel Constant Parameter Stress Test Purpose and Method: This test determines if the DUT meets the receiver specifications for a particular jitter frequency. Connection Diagram: Same as for 10G Compliance Test. Parameters in Expert Mode Same as for 10G Long Channel Constant Parameter Stress Test. Used Calibrations: All 10G Calibrations 268 Keysight N5990A Test Automation Software Platform for USB User Guide

269 ValiFrame USB Station 4 Procedure Report: Figure 165 Result description Keysight N5990A Test Automation Software Platform for USB User Guide 269

270 4 N5990A Overview Column 1: Result Column 2 : Pre-Shoot [db] Column 3: De-Emphasis [db] Column 4: Differential Voltage [mv] Column 5: Random Jitter [ps] Column 6: Nominal SJ [ps]: Column 7: SJ Frequency [MHz] Column 8: Adjusted SJ [ps] Column 9: Second Tone SJ [ps] Column 10: Errors 10G Short Channel Jitter Tolerance Test Purpose and Method: This test characterizes how much jitter a DUT can tolerate at different sinusoidal jitter frequencies. For each sinusoidal jitter frequency, the jitter amplitude is increased in equally-spaced steps until the number of measured symbol errors is bigger than "Allowed Errors". Note that this receiver test is not a compliance test. Connection Diagram: Same as for 10G Compliance Test Parameters in Expert Mode Same as for 10G Long Channel Jitter Tolerance Test except for the following parameters that are not included: Target Eye-Height 270 Keysight N5990A Test Automation Software Platform for USB User Guide

271 ValiFrame USB Station 4 Target Eye-Width Eye-Height Eye-Width Used Calibrations: All 10G Calibrations Procedure Report: Keysight N5990A Test Automation Software Platform for USB User Guide 271

272 4 N5990A Overview Figure 166 Result description Column 1: Result: Shows whether the test has passed or failed. Column 2: SJ Frequency [MHz]: Shows the sinusoidal jitter frequency set in the instrument. Column 3: Min Failed Jitter [ps]: Shows the minimum jitter amplitude at which the DUT introduces errors. 272 Keysight N5990A Test Automation Software Platform for USB User Guide

273 ValiFrame USB Station 4 Column 4: Max Passed Jitter [ps]: Shows the maximum jitter amplitude at which the DUT introduces no errors. Column 5: Jitter Capability Test Setup [ps]: Shows the maximum jitter amplitude that can be set depending on the current hardware setup. Column 6: Min Spec [ps]: Shows the minimum jitter amplitude defined by the specification at which the DUT is not allowed to introduce any error. Column 7: Margin [%]: Shows the ratio between the minimum jitter amplitude defined by the specification and the maximum jitter amplitude passed. 10G Short Channel Sensitivity Test Purpose and Method: This test searches the minimum eye height a DUT can tolerate. The procedure starts with an eye height value of "Start Eye Height" and decreases it with steps of "Step Size". The minimum passed value is the last test point that did not return more errors than specified in the Allowed Errors parameter. For DUTs which do not support disconnect it is necessary to train the DUT in every step. This procedure is not a compliance test. Connection Diagram: Same as for 10G Compliance Test. Parameters in Expert Mode All the parameter are same as for 5G Receiver Sensitivity Test (Long Channel Test), but with the following difference: Instead of using a signal with the Eye height variation, it has differential voltage variation set to test the short channel scenario. Differential Voltage Variation Start Differential Voltage: The differential Voltage where the test starts. Differential Voltage Step Size: Span between two consecutive differential voltage steps. Used Calibrations: All 10G Calibrations Keysight N5990A Test Automation Software Platform for USB User Guide 273

274 4 N5990A Overview Procedure Report: Figure 167 Result description 274 Keysight N5990A Test Automation Software Platform for USB User Guide

275 ValiFrame USB Station 4 Column 1: Result: The Min Passed Differential Voltage should be smaller than the Min Spec. Column 2: Min Passed Differntial Voltage [mv]: The smallest differential voltage at which the DUT passes the test.column 3: Min Spec [mv]: The smallest differential voltage at which the DUT has to pass the test to meet the specifications. Column 4: Margin [%]: Ratio between the Min Passed Jitter and the Min Spec, expressed as a percentage. Keysight N5990A Test Automation Software Platform for USB User Guide 275

276 4 N5990A Overview 276 Keysight N5990A Test Automation Software Platform for USB User Guide

277 Keysight N5990A Test Automation Software Platform for USB User Guide 5 Troubleshooting and Support Log List and File / 278

278 5 Troubleshooting and Support Log List and File In case of problems, the Log List can often help in identifying the root cause. To display the Log List, click the Log List icon on the toolbar. The log file can be accessed by right-clicking within the Log List section as shown in Figure 10. Note that all log information is lost when the N5990A application is terminated unless the log file is saved. (Figure to be added) In case of persisting problems with an application, send the Log File with the problem description to 278 Keysight N5990A Test Automation Software Platform for USB User Guide

279 Keysight N5990A Test Automation Software Platform for USB User Guide 6 Appendix Data Structure and Backup / 280 Remote Interface / 282 Controlling Loop Parameters and Looping Over Selected Tests / 291 IBerReader / 294 Main Power Switch Control / 299

280 6 N5990A Overview Data Structure and Backup ValiFrame Data Structure All ValiFrame internal data is saved in the application data folder: "Documents and Settings\All Users\Application Data\BitifEye \ValiFrame" for Windows XP or "ProgramData\BitifEye\ValiFrame" for Windows 7. Windows hides the system folders, by default. To make the application data folder visible, the "Hidden Files and Folders" setting needs to be set to "Show hidden files and folders" in the Windows File Explorer > View Settings. The ValiFrame application data folder contains the following folders: Images Settings Pattern Images Settings Pattern Properties Calibrations Tmp The "Images" folder contains the connection diagram images. The "Settings" folder contains the default settings file for the instrument and.vset file which contains the changes to the default registry entries. For each application, a sub folder is created and a ValiFrame.vset file is created in this sub folder as soon as any ValiFrame setting is changed from its default. The settings files contain, for example, the instrument connection setup. The Pattern folder contains the test pattern files. These are text files which contain the pattern in hexadecimal format. 280 Keysight N5990A Test Automation Software Platform for USB User Guide

281 ValiFrame USB Station 6 Calibrations Tmp The calibration data is stored in the "Calibrations" folder. For each calibration procedure at least one calibration file is stored. These files are text files and can be imported into MS Excel or displayed with the HTML viewer. All temporary files are created in the Tmp folder. The sub folder "Results" contains the final result of each calibration and test procedure. This is a safety feature and these files are used for recovery in case the user forgot to save them. ValiFrame Backup Use the ValiFrame application data folder to save calibration data, modified test pattern or settings for backup or transfer to another PC. The files in the folders, "Images" and "Pattern" will be generated or if they already exist, be overwritten during a ValiFrame installation. In the "Settings" folder, all instrument settings are overwritten by the installation except the.vset files. In the "Calibration" folder, all files are generated by the calibration procedures and will not be overwritten by the installation. To compare or archive the calibration data, backup the "Calibration" folder. Keysight N5990A Test Automation Software Platform for USB User Guide 281

282 6 N5990A Overview Remote Interface Introduction The N5990A ValiFrame remote interface allows ValiFrame functionality (such as test setup information, calibration, and test procedures, and results) to be accessed from external programming environments, for example MS.NET/C#, VEE, LabView, TestExec SL, or TestStand. The remote interface can thus be used to control N5990A by external software. In typical use, a top-level external test sequencer takes advantage of ValiFrame functionality. If ValiFrame is to be used as a top-level test sequencer, the control of external software is achieved with N5990A opt. 500, User Programming. Interface Description The ValiFrame functionality is accessible via ValiFrameRemote.dll. It contains a class ValiFrameRemote in the BitifEye.ValiFrame.ValiFrameRemote namespace (Figure 168). Its use is illustrated by the ValiFrameRemoteTester application. The source code and the Visual Studio solution of this example are available on the BitifEye support webpage. Using this interface requires that the ValiFrame dlls are either in the same folder or the Windows Path variable contains the folder in which these dlls are located. 282 Keysight N5990A Test Automation Software Platform for USB User Guide

283 ValiFrame USB Station 6 Figure 168 Members of the ValiFrameRemote class Keysight N5990A Test Automation Software Platform for USB User Guide 283

284 6 N5990A Overview Using the Remote Interface 1 Add the ValiFrameRemote.dll as a reference to the project. 2 Create an instance of the ValiFrameRemote class. 3 Call SetConfigurationFile(string filename), if it is needed. It is required only when the station configuration file generated by the station configurator is not to be used. This file format is same as the files generated by the station configurator, which can be found in the Valiframe Application data folder (Windows XP: C:\documents and settings\all users\application data\bitifeye\valiframe\settings\ <application name>\valiframe.vset, or Windows 7: c:\programdata\ bitifeye\valiframe\settings\<application name>\valiframe.vset). The station configuration files contain just the differences to the registry. Refer to Figure 169 for more details. 4 By calling InitApplication(string applicationname), the instruments of the selected Test Station (see Test Station Configuration on page 14 are connected and initialized. 5 Call either ConfigureApplication() or LoadProject(string filename) to initialize the DUT properties and test procedures. The project file can be generated with the ValiFrame User Interface and it contains the DUT properties, the selected test procedures and the properties of each test procedure. 6 Calling Configure Application() prompts a dialog for setting the DUT properties. NOTE The number and type of available test procedures can depend on the DUT properties. 7 The number and type of available test procedures can depend on the DUT properties. 8 Get the list of available procedures with GetProcedures(out int[] procedureids, out string[] procedurenames[]). 9 Select procedures individually with SelectProcedures(int[] procedureids) or combined with Run(int[] procedureids, out stringxmlresult). 10 Execute selected procedures by calling any of the Run functions given below: The Run(out string[]xmlresults) executes all selected procedures. The results of all procedures executed are returned at the end of the execution of all selected procedures. 284 Keysight N5990A Test Automation Software Platform for USB User Guide

285 ValiFrame USB Station 6 The RunProcedure(int id, out string xmlresult) executes a single procedure and returns the result in an xml formatted string. The RunProcedures(int[] procedureids, out string[] xmlresults) executes the list of procedures given in the procedureids array. The StartRun() function returns immediately. It is mainly used for event-driven programming. In this case the events StatusChanged() and ProcedureCompleted() can be used to determine the actual status of the ValiFrame sequencer and read the results. The ProcedureCompleted() event provides the ID and the xmlresult of the procedure completed. After the run the xmlresults are also available via the Result property.?xml version="1.0" encoding="utf-8" standalone="yes"?> <Folder name="valiframe"> <Folder name="stations"> <Folder name="usb Station"> <Folder name="instruments"> <Folder name="instrument6"> <Property name="offline">true</property> <Property name="address">tcpip0:: ::inst0::instr</property> <Property name="timeout">00:01:00</property> <Property name="description">m8020a J-BERT with integrated jitter sources for SER tests</property> <Property name="dll">vfagm8000.dll</property> </Folder> <Folder name="instrument7"> <Property name="offline">true</property> <Property name="address"> </property> <Property name="timeout">00:05:00</property> <Property name="description">usb 3.0 Tx application running on realtime-scope</property> <Property name="dll">vfagu7243a.dll</property> </Folder> Keysight N5990A Test Automation Software Platform for USB User Guide 285

286 6 N5990A Overview <Folder name="instrument8"> <Property name="offline">true</property> <Property name="address"> </property> <Property name="timeout">00:05:00</property> <Property name="description">usb 2.0 Tx application running on realtime-scope</property> <Property name="dll">vfagn5416a.dll</property> </Folder> <Folder name="instrument9"> <Property name="offline">true</property> <Property name="address">gpib0::13::instr</property> <Property name="timeout">00:01:00</property> <Property name="description">powersupply for automated loopback training</property> <Property name="dll">vfage363xa.dll</property> </Folder> <Folder name="instrument10"> <Property name="offline">true</property> <Property name="address"> ;username;password</property> <Property name="timeout">00:01:00</property> <Property name="description">main power switch</property> <Property name="dll">vfsynaccessnp.dll</property> </Folder> </Folder> <Folder name="properties"> <Property name="station Name">USB Station</Property> <Property name="user Name">Unknown User</Property> <Property name="user Label"> </Property> 286 Keysight N5990A Test Automation Software Platform for USB User Guide

287 ValiFrame USB Station 6 <Property name="use Graphics">True</Property> <Property name="asynchronous Graphics">False</Property> <Property name="show All Instruments">False</Property> <Property name="system Configuration">Unknown</Property> <Property name="de Emphasis Generation">N4916</Property> <Property name="generator Type">JBERT B</Property> <Property name="power Supply Type">None</Property> <Property name="power Switch Type">SynaccessNP</Property> <Property name="tx Usb Application">U7243A Usb</Property> <Property name="use Serial Bus Switch">False</Property> </Folder> <Folder name="children" /> <Property name="software Version">ValiFrame 1.0</Property> </Folder> </Folder> <Folder name="database"> <Folder name="properties"> <Property name="offline">true</property> <Property name="applicationserverhostname"> :8082</property> </Folder> </Folder> </Folder> Figure 169 Example of a station configuration file If the ValiFrame sequencer is called via a.net GUI (System.Windows.Forms.Form), the current status, the available procedures, and the procedure selection can be shown and modified by passing a TreeView control via the ProductPreTreeView property to the ValiFrame sequencer prior to the InitApplication() call. In this case, the TreeView control directly shows which procedures were selected as well as Keysight N5990A Test Automation Software Platform for USB User Guide 287

288 6 N5990A Overview the procedure currently being processed during the run. At the end of each run, the pass/fail result is given. Refer to the ValiFrameRemoteTester source code for more details. The log entries generated by the ValiFrame sequencer can be accessed via the LogChanged() event. Each time the sequencer generates a log entry this event will be broadcast. It is recommended that the user monitors this event and tracks the log changes to identify problems during execution. The procedures requiring interaction with the user will pop up dialog panels. For example, each time a new connection between an instrument and the DUT is necessary, the procedure will start to display pop-up windows with the required connections. The dialog can be suppressed by attaching to the ConnectionChangeRequired() event. In some cases, internal dialogs or message boxes are also shown. For full automation without any user interaction, events must be defined and implemented such that the controlling environment can react to all dialog and message boxes without user input. Currently, how to handle these dialogs has to be decided case by case. Results Format Each Procedure Run will produce an xml-formatted result string, which can be accessed via the out parameters of the Run() functions or the Results property of the ValiFrameRemote class. The result string starts with a summary, which contains the procedure name, ID, result, and the time stamp of the procedure run (Figure 170): <?xml version="1.0" encoding="utf-16"?> <Test Results> <Summary> <ProcedureName>Jitter Tolerance Test 2 MHz SJ RBR Lane 0</ProcedureName> <ProcedureID>400008</ProcedureID> <Result>Passed</Result> <DateTime>4/30/ :29:14 AM</DateTime> </Summary> 288 Keysight N5990A Test Automation Software Platform for USB User Guide

289 ValiFrame USB Station 6 <DocumentElement> <Parameters> <Name>Number of Lanes</Name> <Value>1</Value> </Parameters> <Parameters> <Name>Spec. Version</Name> <Value>1.1</Value> </Parameters> <Parameters> <Name>ISI Amplitude</Name> <Value>570 mui</value> </Parameters> <Parameters> <Name>Step Mode</Name> <Value>False</Value> </Parameters> <Parameters> <Name>Parade DP621 Device</Name> <Value>False</Value> </Parameters> </DocumentElement> <Data> <ColumnHeader> Result Jitter Freq. Sin.-Jitter Amp. Number of Errors Min Spec Max Spec Details </ColumnHeader> <Values> pass </Values> </Data> </Test Results> Figure 170 Result String Format Keysight N5990A Test Automation Software Platform for USB User Guide 289

290 6 N5990A Overview The following part contains the list of parameters. These parameters may be changed via the project file or the remote interface. The last part contains the test data. It starts with the column header, followed by one or more data rows. The format is similar to what is obtained in the Excel output if the same procedure is run via the ValiFrame user interface. Each column name/value is separated by the pipe symbol ' '. 290 Keysight N5990A Test Automation Software Platform for USB User Guide

291 ValiFrame USB Station 6 Controlling Loop Parameters and Looping Over Selected Tests Often parameters such as temperatures or supply voltages need to be varied systematically. A simple example would be repeating tests over a temperature range from -10 to 30 C to verify an operating temperature range. In this case, after the tests have been run at -10 C, the temperature of the climate chamber is increased by the selected temperature step width, for example, 1 C. The tests are then repeated at -9 C. After the test execution, the temperature is incremented again and the tests are rerun repeatedly until they are finally run at 30 C. This repetitive process is called looping. In this example, the temperature within a climate chamber is the loop parameter. While the loop is executed, the test results have to be documented for each loop parameter value. In practice, multiple loop levels might be required, as shown in Figure 171 Figure 171 Temperature and voltage sweeps using N5990A sequencer As the loop parameters are typically customer-specific, N5990A permits a list of loop parameters to be specified. N5990A supports: 1 Looping over user-specified parameters or run tests with a single parameter value. 2 Defining a set of loop parameters and for each parameter a range of test points. Keysight N5990A Test Automation Software Platform for USB User Guide 291

292 6 N5990A Overview 3 Using custom drivers to control instruments that are not part of the ValiFrame Test Station (see section 3.1) for example, climate chambers, ovens, and power supplies. 4 Saving the results of each test together with the actual loop parameter value independently of the results from the other runs. 5 An overview of each run after the end of the test execution. These features are provided by an interface called IVFEnvironmentalControl. The definition of this interface is: namespace BitifEye.ValiFrame.Instruments { public interface IVFEnvironmentalControl { string UserLabel { get; } void Connect(); void Disconnect(); string[] GetParameterList(); string[] GetParameterValues(); void Init(); bool SetNextValue(); void SetToDefault(); } } The interface has to be implemented by a class EnvironmentalControl in a.net dll named EnvironmentalControl.dll, which then needs to be copied into the ValiFrame Program Files Folder. ValiFrame will load this dll and call the function of the Interface in the following order: Connect() At startup of ValiFrame allows the implementation to load the instrument drivers and connect to them. 292 Keysight N5990A Test Automation Software Platform for USB User Guide

293 ValiFrame USB Station 6 SetToDefault() After the Connect() call, the implementation should set all instruments with initial values to set default values. It is recommended that the sequence is stated with nominal values to ensure that the test setup is done properly. With this setting, the first run will be done and the Init() call will not overwrite the values. Init() The function is used to initialize the instruments with start values at the beginning of test sequence. GetParameterList() and GetParameterValues() These functions are used to get the parameter names and values lists and put them into the result output of each test procedure. SetNextValue() If this function returns true at the end of each run over the selected test procedures, ValiFrame will run the selected tests again. This function should get the next parameter set, set the controlling instruments, and return true if a new set of parameters is available. Example For a sweep over temperature starts at 20 C, increasing the temperature by 2 C at each run, and ending at 40 C, the function should increase the temperature of the chamber and return true if 40 C is not reached. If the next step is greater than 40 C, this function should return false. ValiFrame will end the test sequence in this case. Disconnect() It is called at the closing of ValiFrame. The driver should set the instruments to default values and disconnect from the instruments. An example project is available on the BitifEye webpage. Keysight N5990A Test Automation Software Platform for USB User Guide 293

294 6 N5990A Overview IBerReader ValiFrame cannot integrate all possible instruments and custom interfaces to communicate with the DUT. To overcome this problem, the customer can provide a.net DLL which implements the IBerReader interface. This DLL is used by ValiFrame, and invoked during the test; the DLL then takes care of the instrument or DUT communication. To use this feature in ValiFrame USB, go to Configure DUT > Show Parameters dialog and change the property BER Reader to "Custom BER Reader." This option will only be available if the dll with the name UsbCustomBerReader.dll is there in its installation folder. USB-specific calling conventions: Connect(string) The string parameter is an empty string by default. It can be changed by setting the "Address" property in the Confugure DUT > Show Parameters dialog. This is used to do general initialization or start external programs if it is required. Disconnect() This method will be called every time a test run is finished (after all selected tests are done, not after each individual test). It is used to clean up or shut down external programs if applicable. Init(string) This will be called when the DUT needs to be put into a specific state. In the USB case, the unique option is "5Gb/s". IBerReader Interface using System; using System.Collections.Generic; using System.Text; 294 Keysight N5990A Test Automation Software Platform for USB User Guide

295 ValiFrame USB Station 6 namespace BerReader { public interface IberReader { /// <summary> /// This method is called to connect to your error reader. /// </summary> /// <param name="address">the address string can be used by your implementation /// to configure the connection to the BerReader interface</param> void Connect(string address); /// <summary> connection /// This method is called to close the /// </summary> void Disconnect(); /// <summary> /// This method will be called prior the individual tests to tell the device /// what mode is tested. This can be used to load appropriate /// setups. /// </summary> /// <param name="mode">configuration mode in which the DUT will be tested. The mode must be "5Gb/s" or "10Gb/s"</param> void Init(string mode); Keysight N5990A Test Automation Software Platform for USB User Guide 295

296 6 N5990A Overview /// <summary> /// Is called at the beginning of the error measurement and allows /// a reset for the DUT to be implemented. /// </summary> void ResetDut(); /// <summary> /// Starts the counters. This method MUST reset all counters! /// </summary> void Start(); /// <summary> /// Stop the DUT to read out the counters (see /// GetReadCounterWithoutStopSupported()). /// </summary> void Stop(); /// <summary> /// This method returns counters, the 1st counting the bits/frames/lines /// or bursts and the 2nd one counting the errors detected by the BerReader. /// The automation software will compute the BER using the following /// equation BER=errorCounter/bitCounter. In the case bitcounter = 0 even when /// the stimulus is sending data, this is also interpreted as fail. /// </summary> 296 Keysight N5990A Test Automation Software Platform for USB User Guide

297 ValiFrame USB Station 6 /// <param name="bitcounter"> Contains the number of bits which are received /// by the DUT. If it is not possible to count bits the value can also contain /// frames, or bursts. It is just a matter of the value defined as target BER. /// If it is not possible to get the number of bits/frames/bursts then the /// method can return a value of -1 and the automation software can compute /// the number of bits from the data rate and the runtime.</param> /// <param name="errorcounter"> Total number of errors since the last start. /// </param> void GetCounter(out double bitcounter, out double errorcounter); /// <summary> /// This method returns a Boolean value indicating whether the device /// supports reading the counters while it is running. If this method /// returns false, the device needs to be stopped to read the counters. /// In this case the automation software will stop data transmission /// before calling the GetCounter() function, and re-start data transmission /// again after reading the counter values. /// </summary> /// <returns> false if device needs to be stopped before reading the counters, Keysight N5990A Test Automation Software Platform for USB User Guide 297

298 6 N5990A Overview /// true if the counters can be read on the fly.</returns> bool GetReadCounterWithoutStopSupported(); /// <summary> /// This property returns a number to multiply the value delivered by the /// bitcounter in the GetCounter() function. /// </summary> Double NumberOfBitsPerFrame {set; get;}; the BER. /// This property returns the number of payload /// bits in a frame used for the detection of /// If i.e. the errorcounter in the GetCounter() function is just the /// checksum error then this parameter is the number of the payload. get;}; /// </summary> double NumberOfCountedBitsPerFrame {set; } } 298 Keysight N5990A Test Automation Software Platform for USB User Guide

299 ValiFrame USB Station 6 Main Power Switch Control Intended to power on/off automatically the DUT and run the loopback training without user interaction. The Main Power Switch Control can be selected as: "Manual "Netlo 230B. It is a PDU (Power Distribution Unit) that integrates one 230 V input and four 230 V outlets which allow to connect virtually any 230 V powered device) "SynaccessNP If it is selected as Manual, the DUT has to be power cycle manually. A dialog asking for power cycling the DUT, pops-up in the initialization of each receiver test procedure (Figure 172). Figure 172 Manual Power Cycle Dialog The number of user interactions for Manual option is equal to the number of times that the DUT need to be trained into loopback. When it is selected as Netlo230B or SynaccsessNP, the DUT is power cycle automatically. A dialog asking to check the connection between the power supply and the power switch, pops-up in the first receiver test procedure executed (Figure 173). Keysight N5990A Test Automation Software Platform for USB User Guide 299

300 6 N5990A Overview Figure 173 Automatic Power Cycle Dialog In this case, the number of user interactions (related with the power cycle) is one, independently of the number of Rx tests and the number of times that a retraining is required. Some properties related with the remote controllable power switch can be selected in the Parameters Dialog (Figure 174). 300 Keysight N5990A Test Automation Software Platform for USB User Guide

301 ValiFrame USB Station 6 Figure 174 Power Switch Parameters (I) The same properties can be selected in the Parameters Panel of the Main Windows (Figure 175). Figure 175 Power Switch Parameters (II) These configurable properties are: Channel: This sets the channel number of the power switch channel which is connected to the DUT. On-Off Duration: This is the duration between turning the DUT off and then turning it on again. Setting Time: This is the wait time after the DUT is turned on and before the test continues with loopback training. Max Retries for LB Training: Maximum number of times that ValiFrame will try to train the DUT into loopback mode. If it is not possible within these tries the test will be aborted automatically. When Power Switch Automation is unselected, ValiFrame asks the user to retry every time loopback fails. Keysight N5990A Test Automation Software Platform for USB User Guide 301

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304 This information is subject to change without notice. Keysight Technologies 2017 Edition 2.0, December