Investigation of the film FUJIFILM IX 80 in TETENAL machine processing

Transcription

1 Investigation of the film FUJIFILM IX 80 in TETENAL machine processing Test Report No.: BAM 8.3 / 7315 d Date: Name and address: TETENAL AG & CO. KG Schützenwall Norderstedt Investigation: Measurement of the film system parameters according to EN 584-1:2006, ISO :2008 and ASTM E of the film FUJIFILM IX 80 (10x24), emulsion No E, exp. date , vacu packed with lead screens (0.027 mm front and back), film processing according to the test specification Test specification: Investigation of the film FUJIFILM IX 80 in TETENAL Roentoroll HC developer and TETENAL Superfix MRP fixer, automatic processing in AGFA NDT S machine with 8 min cycle time, immersion time 100 s, temperature 28 C Date of testing: Place of testing: BAM Berlin This test report consists of page 1 to 7 and enclosures one figure. This test report may only be published in full and without any additions. A revocable permission in writing has to be obtained from BAM for any amended reproduction of this certificate or the publication of any excerpts. The test results refer exclusively to the tested materials.

2 BAM Test Report page 2 of 7 pages BAM Ref.:8.3/7315d Aim of the investigation: Processing of the received emulsions of the mentioned non-destructive testing film FUJIFILM IX 80 in the processing chemistry TETENAL Roentoroll HC developer and TETENAL Superfix MRP fixer (processor AGFA NDT S, cycle time 8 min, immersion time 100 s, temperature 28 C) and measurement of the film system parameters gradient and granularity as well as determination of the gradient/noise ratio according to the standards EN 584-1:2006, ISO :2008 and ASTM E Test Program: 1. Exposure of the films in steps of optical density with an automatic film transport unit at conditions according to the above standards. 2. Development of the films. 3. Measurement of the optical density of the steps to determine the characteristic film curve and the film gradients at D-D 0 = 2.00 and D-D 0 = Measurement of the granularity at D-D 0 = Instruments for processing and measurements: The exposures of the films (packed in AGFAPACK 10x24 with 0,027 mm lead screens) were performed with the filtered (8 mm Cu) 220 kv radiation of a highly stabilized X ray facility (320 Isovolt D for dosimetry of the Seifert company) and an automated computer controlled film transport for exposure. For the measurement of the diffuse optical density a calibrated densitometer (Macbeth TD 502) was used, while the granularity was measured with a computer controlled microdensitometer of the type Joyce Loebl 3CS with an quadratic aperture of 100 m x 100 m. Film processing: For the automatic processing in the TETENAL Roentoroll HC developer (LOT , ) and TETENAL Superfix MRP fixer (LOT , ) the following parameters were observed: temperature of the developer 28 C, immersion time 100 s, cycle time of the process 8 minutes. Procedure for determination of the film system parameters according to EN 584-1:2006, ISO :2008 and ASTM E : The system parameters gradient G(2) and G(4) at the optical densities 2.00 and 4.00 above fog and base (D 0 ), the granularity D and the gradient/noise ratio G(2)/ D are determined for a film system, which comprises a film type and the processing chemistry inclusive the processing at specified parameters. In detail the following processing steps were carried out:

3 BAM Test Report page 3 of 7 pages BAM Ref.:8.3/7315d - procurement of films and processing chemicals, - preparation of the developer and fixer according to the prescriptions of the manufacturer, - stabilisation of the developer with approximately 0.1 m 2 film material - test exposure for the determination of the suitable exposure times for the steps of optical density, - exposure of at least 6 film samples for each system with filtered 220 kv radiation on at least 12 steps of optical density between D=1 and D= 4.7 in each case (see procedure in EN 584-1:2006, ISO :2008, ASTM E , - processing of the films according to the prescriptions of the manufacturer and controlling by a film test strip according to EN and ISO , - measurement of the processed films with the Macbeth densitometer and storage of the exposure data and the density values as the average of 3 measured values per density step in a file as well as the density of fog and film base, - evaluation of the data by approximation of the film curve by a third order polynomial and determination of the gradient G(2) for the density D - D 0 = 2.00 and the gradient G(4) at D - D 0 = 4.00 in accordance with EN 584-1:2006, ISO :2008 and ASTM E , - measurement of the local density fluctuations of the films at density D - D 0 = with a microdensitometer (scan length 140 mm), - calibration of the microdensitometer into diffuse optical density with the aid of a film sample of the investigated film system, - calculation of the root mean square D of the optical density after conversion of the specular density into diffuse density, a digital high pass filtering to cut off low frequency noise below 0.1 mm -1 and the determination of the median according to ISO 10505:2009 and EN 584-1:2006, - conversion of the granularity value into the corresponding value for measurements with a circular aperture with a diameter of 100 m, - correction of the granularity value on the basis of measured density above fog and base to D - D 0 = 2.00, - calculation of the average of the relevant data from at least 6 film samples. Results: The diffuse density of fog and film base results in: D 0 = 0.21 The characteristic curve of the films shows up to the density 4.5 above fog and base the usual shape. Under the given conditions the exposed dose for density 2 above fog and base amounts to:

4 BAM Test Report page 4 of 7 pages BAM Ref.:8.3/7315d K S = ( ) mgy According to table 2 of EN 584-1:2006 this corresponds to a CEN speed of: S = 160 The values of the gradients determined under the given conditions amount to: G (2) = G (4) = The granularity D at density D - D 0 = 2.00 results in: D = The gradient/noise ratio is calculated to: G(2) / D = 179 According to table 1 of EN 584-1:2006 the limiting values for the film system class C4 amount to: G (2) 4.1, G (4) 6.8, D 0.028, G/(2)/ D 150 The film system consisting of emulsion No E of the non-destructive testing film FUJIFILM IX 80 in the processing chemistry TETENAL Roentoroll HC developer and TETENAL Superfix MRP fixer (automatic processing AGFA NDT S machine, cycle time 8 min, immersion time 100 s, temperature 28 C), meets the requirements of the film system class C4 of the standards EN 584-1:2006 and ISO :2008 and system class I of ASTM E The values and its standard deviations mentioned above were determined from the respective values of the gradients and the granularity at the given densities (D - D 0 = 2.00 and D - D 0 = 4.00) from 6 film samples (trimmed mean). The plots in the added graph (page 6, optical density (above fog and base) and gradient) result from the average of 8 film curves measured on 8 different film samples of the emulsion. The certified FUJIFILM PMC pre-exposed control strips (batch 84843, emulsion No E, exp. date ) according to EN and ISO provide the following indices (as reference values the values for FUJIFILM HUNT AUDEL developer and FUJIFILM HUNT AUFIX fixer at am immersion time of 100 s (8 min cycle) and a developer temperature of 27 C were used):. S x = 1.95 (- 10 %) compared to S r = 2.19 and C x = 1.41 (+28 %) compared to C r = 1.1.

5 BAM Test Report page 5 of 7 pages BAM Ref.:8.3/7315d The certified FUJIFILM process monitor strips indicate deviations larger than 10 % from the certified values, which indicates that the investigated chemistry and development conditions are outside the specification (see EN 584-1:2006). But this behaviour was already observed before for other mixed systems and is typically for FUJIFILM PMC stripes. The certified AGFA PMC pre-exposed control strips (batch C075, emulsion No , exp. date ) according to EN and ISO provide the following indices (as reference values the certified values for AGFA G135 developer and AGFA G335 fixer at an immersion time of 100s (8 min cycle) and a developer temperature of 28 C were used): S x = 1.96 (± 0 %) compared to S r =1.96 and C x = 1.35 (+2.3 %) compared to C r = The certified AGFA process monitor strips indicate no deviations larger than 10 % from the certified values, which indicates that the investigated chemistry and development conditions are within the specification (see EN 584-1:2006). Finally, the Agfa Structurix Thio-Test was performed to estimate the archivability of the processed films. The evaluation of the results according to ISO results in: L.E. = 100 (colour of the light step indicating a Life Expectancy of 100 years)

6 BAM Test Report page 6 of 7 pages BAM Ref.:8.3/7315d Remark: This report summarizes only the results of the measurements at a single emulsion and is valid only for this special emulsion; especially it states no general classification of a film system. For a system classification corresponding to EN 584-1:2006 a continuous measurement of all films of all manufactured emulsions by an independent third party is necessary, or, the continuous own product control in the house of the manufacturer in connection with the participation in a proficiency test according to EN 584-1:2006 for the harmonisation of the measuring procedures and algorithms and sample test measurements by an independent third party. BAM Federal Institute for Materials Research and Testing BAM Bundesanstalt für Materialforschung und prüfung Division 8.3 Nondestructive Testing - Radiological Methods D Berlin, on behalf on behalf Prof. Dr. U. Ewert Dr. rer. nat. U. Zscherpel BAM division 8.3 is an accredited testing laboratory by Deutsche Akkreditierungsstelle GmbH (DAkkS) against DIN EN ISO/IEC The accreditation is valid for the testing procedures listed in the certificate D-PL D-PL

7 BAM Test Report page 7 of 7 pages BAM Ref.:8.3/7315d Density and Gradient Dose (mgray) opt. Density BAM 12-04