Lecture 4&5 CMOS Circuits

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Transcription:

Lecture 4&5 CMOS Circuits Xuan Silvia Zhang Washington University in St. Louis http://classes.engineering.wustl.edu/ese566/

Worst-Case V OL 2

3 Outline Combinational Logic (Delay Analysis) Sequential Circuits Memory

RC Delay Lumped Model C only RC model 4

Elmore Delay Formula Assumptions regarding the RC network the network has a single input node all the capacitors are between a node and the ground the network does not contain any resistive loops (tree) Unique resistive path path resistance shared path resistance 5

6 Example: RC Ladder/Chain What if distributed?

Distributed RC Line 7

8 Calculate Wire Delay Rule of Thumb RC delay should only be considered when t prc >>t pgate RC delay should only be considered when the rise/fall time at the line input is smaller than RC: t rise <RC

9 Inverter Propagation Delay Simplified switch model find equivalent resistance apply RC delay

Minimize Inverter Delay Reduce C L keep the drain diffusion areas as small as possible Increase W/L ratio will minimize the delay until intrinsic capacitance dominate è self-loading Increase V DD reliability concerns NMOS/PMOS ratio 10

11 Sizing Inverter for Performance Inverter delay model Size scaling factor (S)

12 Sizing Inverter Chain Intrinsic delay Inverter delay chain

Optimal Number of Inverters in the Chain 13

Examples: Inverter Sizing and Delay 14

15 Propagation Delay of Complex Logic Gates Depend on inputs Internal cap matters

Sizing Combinational Network for Performance Inverter delay Complex logic delay p: ratio of the intrinsic (unloaded) delay of the complex gate and the simple inverter. Affected by both topology and layout style g: logic effort f: electrical effort 16

17 Logic Effort (g) For a given capacitive load, complex gates have to work harder than an inverter to produce similar response

18 Optimal Sizing of Combinational Network Gate effort h=fg Optimal delay condition

Outline 19

Level-Sensitive Latch 20

SR Latch Basic NOR latch R (reset) Q S (set) Q S R Q 0 0 0 set Q 1 reset t pd No change not allowed unstable 21

Other SR Latches Clocked S Clk R 1 2 Q Q NAND SR latch S (set) Q S S Q C R (reset) Q R R Q 22

Edge-Sensitive Flip-Flop 23

24 Outline Combinational Logic (Delay Analysis) Sequential Circuits Memory

Static RAM Applications CPU register file, cache, embedded memory, DSP Characteristics 6 transistor per cell, other topologies no need to refresh access time ~ cycle time no charge to leak faster, more area, more expensive 25

SRAM Operation Standby word line de-asserted Read precharge bit lines assert WL BL rise/drop slightly Write apply value to BL assert WL input drivers stronger 26

27 SRAM Architecture source: semiengineering.com

28 Multi-Bank Layout source: semiengineering.com

29 Questions? Comments? Discussion?

Homework #3 Posted on class website Due on 2/6 at 2:30pm Solution will be posted on 2/5 evening Use it as an exercise to prepare for exam Will release excerpts from textbook on BlackBoard 30

In-Class Exam 2/6 in the lecture room Starts at 2:40pm and ends at 4:00pm Designed to be completed in 60min 75% material similar to HW0 and HW1 25% material similar to HW2 and HW3 31

32 Design Tool Tutorials Standard-cell based design flow

Design Tool Tutorials Functional Simulation tool: Synopsys VCS simulate your HDL (eg. Verilog) code to verify functionality Logic Synthesis tool: Synopsys Design Compiler (DC) convert/synthesize behavioral/rtl level HDL to gatelevel netlist (i.e. connectivity list) Physical Design (Place & Route) tool: Cadence Encounter given the gate-level netlist, place and route the design to complete an IC chip in its final physical form 33

Lab1: Design Tool Tutorials Will be posted on 2/7 before the Wed lecture TA will give hand-on introduction on 2/8 Please bring your laptop Please set up your SEAS account Please send your Github ID to Yunfei Please walk through the Linuxlab tutorial Please read Lab1 before the lecture, so you can ask questions Due on 2/22 at 2:30pm 34

35 Acknowledgement Jan Rabaey, Digital Integrated Circuits, 2006 Cornell University, ECE 5745