DEI3182A ARINC 429 DIFFERENTIAL LINE DRIVER

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Device Engineering Incorporated 385 East Alamo Drive Chandler, AZ 85225 Phone: (480) 303-0822 Fax: (480) 303-0824 E-mail: admin@deiaz.com DEI3182A ARINC 429 DIFFERENTIAL LINE DRIVER FEATURES Adjustable rise and fall times Low supply current Capable of driving 30 nf 400Ω Digitally selectable 12.5 or 100 kbit/sec data rate Adjustable output voltages swing Output over-voltage protected Short circuit tolerant TTL and CMOS compatible inputs MIL-STD-883B burn-in screening available Package Options:16L SB DIP, 16L CERDIP, 28L CLCC Direct replacement for Fairchild/Raytheon RM3182A FUNCTION DIAGRAM 2005 Device Engineering Inc Page 1 of 10 DS-MW-03182-01 Rev E

Description The DEI3182A is a complete differential line driver IC. When Data A = Data B or Sync or Clock Signal is low, the driver forces the output to a Voltage Null level (0V ± 250 mv). Designed to address the ARINC 429 Standard, the DEI3182A has output rise and fall times that can be adjusted by the selection of an external capacitor (CA or CB) and an output voltage range adjustable through an externally applied VREF signal. All logic inputs and sync control inputs are TTL/CMOS compatible. The device is constructed on a monolithic IC using a junction-isolated bipolar process. SiCr resistors in the internal bias circuitry provide for stable bias currents and a tighter tolerance of output impedance. The DEI3182A is available in 16-lead ceramic side-brazed DIP and can be ordered with MIL-STD-883B burn-in screening. Functional Description The device contains three main functional blocks. The first block is a digital section used to decode the ARINC Clock, Synchronization, and Data inputs as shown in Block Diagram. This block takes these inputs and channels the data to the charge pump circuits. The logical relationship for these pins is presented in Table 1. Table 1. I/O Truth Table Sync Clock Data A Data B Out A Out B Comments X L X X 0V 0V Null L X X X 0V 0V Null H H L L 0V 0V Null H H L H -VREF +VREF Low H H H L +VREF -VREF High H H H H 0V 0V Null The second functional block is a charge pump circuit that is used to control the output waveform and its timing characteristics. This is achieved through charging and discharging a capacitor with a known current. The capacitor is user selectable, and is connected between CA or CB pins and ground. A rate select pin (digital input) enables to set the rise and fall time. If this pin is tied to ground, the device functions in the high rate. This mode is recommended if the user does not have an application requiring data rate switching. In the table below, recommended capacitor values are given for each possible data combination. Rate Select CA CB (pf) Table 2. Rate Select Pin Truth Table 10% to 90% Rise/Fall Ca/Cb nom. Data Rate time (µs) charge current (Kbits/sec) Comments (ua) Logic 0 68* 1.0 2.0 210 100 High Rate Logic 1 68* 5-15 30 12-14.5 Low Rate Logic 0 470 5-15 210 12-14.5 Low Rate Logic 1 470 N/A 30 N/A Not Used * Does not include the assumed 10pf for PCB trace and IC lead capacitance. The last functional block of the device consists of a voltage follower and a high power output differential amplifier. The voltage follower buffers the signals presented at the charge caps and presents the mirrored signal to the difference amplifier to drive the ARINC line. Two different outputs are available from the differential amplifiers: Amp A, Amp B, and Out A, Out B. The outputs Amp A and Amp B are the direct outputs of the power amplifier. The outputs Out A and Out B include 37.5Ω series resistors added to minimize bus reflections by matching the power amplifier s output impedance to the cable s impedance of 75Ω. Amp A and Amp B may be used to customize the output impedance of the device. These outputs can also be used to enhance the device s drive capability. For example, driving the standard 30 nf 400Ω load defined in the ARINC specifications (see output drive capability and capacitive loads for more details). All outputs are protected from voltage spikes with diodes connected between the output pins and the supply lines. Output Drive Capability and Capacitive Loads The Traditional Approach The DEI3182A is capable of driving a high capacitive/resistive load. If complete ARINC compliance is required then Out A and Out B pins are recommended to maintain the output impedance. In this configuration, driving the full ARINC load of 30nF 400Ω the output characteristic takes on the transfer function of a low pass filter due to the internal 37.5Ω resistor, the line resistance and the capacitance associated with the cable. This will result in a lower rise/fall time of the device. Equation 1.1 relates the output voltage at Out A and Out B to the voltage at the power amplifier s output. Output A is taken for this example: The output as a function of 2005 Device Engineering Inc Page 2 of 10 DS-MW-03182-01 Rev E

frequency is given by equation 1.1 1.1 OutA = AmpA ZL /2 (ZL/2) + ROUT Where: ROUT = 37.5Ω and ZL = RL CL The output as a function of Frequency is given by Equation 1.2. RL 1.2 AOUT(jω) = Amp A(jω) [ ] RL + 2ROUT(1+ jωclrl) Using equation 1.2, a time constant can be determined for the given application which is shown in equation 1.3. 1.3 τ = (ROUT RL)CL So, for the maximum loading condition of 30nF 400Ω the resulting time constant is 1.9 µs. This shows that with a maximum load, the output waveform is greatly affected by the low pass filter combination of the ROUT RL resistor and the load capacitance. A New Option: Amp A/Amp B The DEI3182A also provides the user the option of connecting the data line directly to the power output amplifiers thus bypassing the internal 37.5Ω resistance of the device and matching the line more precisely. For example, using a 1% 37.5Ω resistor allows better control of the output impedance. By applying the load directly to the power amplifiers output pins, the resulting waveform is virtually unchanged when driving other loads. There may be applications where these pins present a more desirable result. For instance, if the line that the chip is driving is short, then the parasitic components of the line can be neglected, and power amplifier can be tied directly to the lines. This option can be utilized to achieve a greater noise immunity through bypassing the internal resistors. Pin Assignments 2005 Device Engineering Inc Page 3 of 10 DS-MW-03182-01 Rev E

Absolute Maximum Ratings Parameter Min. Max. Units Supply Voltage: +VS to -VS +VS to GND +36 +20 V V -Vs to GND -20 V VLOGIC Threshold Voltage 0 +7 V VREF Voltage 0 +6 V Logic Input Voltage -0.5 VLOGIC + 0.5 V AMP A/B Transient Pulse: 150uS pulse applied through an external 37.5Ω resistor. (1) -70 +70 V Storage Temperature Range -65 +150 C Operating Temperature Range -55 +125 C Junction Temperature -55 +175 C Lead Soldering Temperature (60 sec.) +300 C Note: 1. Sample tested on each wafer lot. Thermal Characteristics (Still air, soldered into PC board) Parameter 16-Lead Side-brazed DIP 16-Lead CERDIP 28-Lead LCC Thermal Resistance, θja 70 C/W 70 C/W 60 C/W Thermal Resistance, θjc 28 C/W 28 C/W 25 C/W Recommended Operating Conditions Symbol Parameters Min. Max. Units +Vs Positive Supply Voltage 13.5 16.5 V -Vs Negative Supply Voltage -16.5-13.5 V VLOGIC VLOGIC Supply Voltage 4.5 5.5 V VREF VREF Voltage 4.75 5.25 V Top Case Temperature -55 125 ºC Electrical Characteristics Symbol Parameters Test Conditions (1,2) Min. Max. Units POWER SUPPLIES ICC Positive Supply Current +VS = 16.5V, -VS = -16.5V, 4.0 18 ma VLOGIC = VREF = 5.5V, DATAA =CLOCK=SYNC=VIH DATAB=RATE = VIL Outputs = HI, unloaded IEE Negative Supply Current +VS = 16.5V, -VS = -16.5V, 4.0 18 ma VLOGIC = VREF = 5.5V, DATAA =CLOCK=SYNC=VIH DATAB=RATE = VIL Outputs = HI, unloaded ILOGIC VLOGIC Supply Current +VS = 16.5V, -VS = -16.5V, 150 300 µa VLOGIC = VREF = 5.5V, DATAA =CLOCK=SYNC=VIH DATAB=RATE = VIL Outputs = HI, unloaded IREF VREF Supply Current +VS = 16.5V, -VS = -16.5V, -800-100 µa VLOGIC = VREF = 5.5V, DATAA =CLOCK=SYNC=VIH DATAB=RATE = VIL Outputs = HI, unloaded LOGIC INPUTS VIH Logic 1 Input Voltage Functional Tests 2.0 V 2005 Device Engineering Inc Page 4 of 10 DS-MW-03182-01 Rev E

Symbol Parameters Test Conditions (1,2) Min. Max. Units VIL Logic 0 Input Voltage Functional Tests 0.5 V IIH Logic 1 Input Current VIN = 2.0V, +Vs=+15V, -Vs=-15V, VLOGIC=VREF=4.5V 1 µa IIL Logic 0 Input Current VIN = 0.5V, +Vs=+15V, -Vs=-15V, VLOGIC=VREF=5.5V -645-50 na CI Input Capacitance (3) 15 pf A429 OUTPUTS VOH Output Voltage High Outputs open, referenced to Ground, 4.75 5.25 V Vref =5.0V, Supplies = min to max VOL Output Voltage Low Outputs open, referenced to Ground, -5.25-4.75 V Vref =5.0V, Supplies = min to max VNULL Output Voltage Null Outputs open, referenced to Ground, -250 +250 mv Vref =5.0V, Supplies = min to max Rout Output Resistance Tc = 25ºC 33.7 41.2 Ohms TC = -55ºC to +125ºC Rout = Vout/ Iout Vout measured at 0mA & 10mA 33 44 Trf-hi HI rate rise/fall time RATE = VIL, Ca/Cb = 68pf, 1.0 2.0 us Cload = 50pf 10 to 90% (4) Trf-lo LO rate rise/fall time RATE = VIH, Ca/Cb = 68pf, 5.0 15.0 us Cload = 50pf 10 to 90% (4) CAPACITOR PINS ICL Low Rate Capacitor Current Rate Sel = 1, CA (CB) = 2.5V, HL 20 60 ua edge currents are negative ICH High Rate Capacitor Current Rate Sel = 0, CA (CB) = 2.5V, HL 138 277 ua edge currents are negative SHORT CIRCUIT CONDITIONS ISC Output Short Circuit Current AOUT and/or BOUT shorted line-to-line 100 156 ma or to GND. Outputs HI or LOW. ISC+VS +VS Short Circuit Current AOUT and/or BOUT shorted line-to-line 100 165 ma or to GND. Outputs HI or LOW. ISC-VS -VS Short Circuit Current AOUT and/or BOUT shorted line-to-line or to GND. Outputs HI or LOW. 100 165 ma Notes: 1. Unless otherwise indicated, +VS = +15V, -VS = -15V, VREF = +5V, VLOGIC = +5V, Rate Select = 0V, RL = Open Circuit, CL = 0 pf, and -55 C < Tcase < +125 C. 2. Unless otherwise indicated, currents flowing into DUT are positive, currents flowing out of DUT are negative, and voltages are referenced to Ground. 3. Guaranteed by design. Not production tested 4. Sample tested. Typical Power Dissipation Characteristics (+VS = +15V, -VS = -15V, VREF = +5V, TA = + 25 C, CA = CB = 68pF) Data Rate Load Rate Select Positive Supply Current Negative Supply Current VLOGIC Supply Current Total Power Dissipation (Kbits/sec) 0 100 Open Circuit Logic 1,0 5.7 ma 4.9 ma 214 µa 160 mw 12.5 14 Full Load(1) Logic 1 19.6 ma 22.7 ma 200 µa 655 mw 100 Full Load(1) Logic 0 39.1 ma 38.4 ma 200 µa 1165 mw Note: 1. RL = 400Ω, CL = 0.03 µf (see Block Diagram). 2005 Device Engineering Inc Page 5 of 10 DS-MW-03182-01 Rev E

Applications Heat Sinking / Air Flow and Short Circuit Protection The user application will determine if and how much heat sinking/air flow will be required for the DEI3182A. Consideration must be given to ambient temperature, load conditions and output voltage swing. In addition, power consumption increases with increased operating frequency. Use the numbers given in the Thermal Characteristics Table to determine that the maximum allowable junction temperature of 175 C is not exceeded. Outputs Out A and Out B are short circuit protected by the internal 37.5Ω back termination resistors. During a short circuit of the output to either power supply or ground, the device must be able to dissipate the generated heat. For example, if the output is shorted to ground and +VS = +15V, the device must dissipate 15V x 0.165A = 2.5W. An appropriate heat sink is required in this situation. Note that the Amp A and Amp B outputs are not short circuit protected. Shorting these pins to either power supply or ground will cause failure of the device. An added external resistor will protect the circuit by limiting the current. Power Supply Considerations Three power supplies are required to operate the DEI3182A in a typical ARINC 429 bus application: +15V for +VS, -15V for -VS, and +5V for both VREF and VLOGIC. The differential output swing of the DEI3182A is equal to 2 x VREF. Using +5V gives a differential output swing of 10V. If a different output voltage swing is required, an additional power supply is needed to set VLOGIC. Each power supply pin should be decoupled to ground using a high quality 10 µf tantalum capacitor. This is especially true when driving a large capacitive or resistive loads. The decoupling capacitors should be located as close to the device pins as possible to eliminate the wiring inductance. Typical ARINC 429 Application Figure 1 shows typical switching waveform for the DEI3182A in any configuration. Figure 2 depicts connections for a ARINC 429 high speed bus driver application. This circuit shows the complete configuration for a 100 Kbits/sec, 10V differential output swing using the terminated output pins. +V REF x 2 -V REF x 2 Figure 1. Switching Waveforms 2005 Device Engineering Inc Page 6 of 10 DS-MW-03182-01 Rev E

68pF 68pF Figure 2. ARINC 429 Bus Driver Applications (100 kb/s Mode) 2005 Device Engineering Inc Page 7 of 10 DS-MW-03182-01 Rev E

Mechanical Dimensions 16-Lead Side-Braze Ceramic DIP Lead Finish: Au plated with Sn63/Pb37 solder dip covering the lead to the seating plane. 2005 Device Engineering Inc Page 8 of 10 DS-MW-03182-01 Rev E

16-Lead CERDIP.752 -.780 PIN 1 0.025 RAD Dimensions Are in Inches.280 -.296 0.308-0.325 0.050 MAX.200 MAX.056 0.125 MIN.010 -.012 0.325-0.410 0.140-0.175 0.100 ± 0.010 0.018 ± 0.002 28-Lead CLCC 11.450 SQ +.008 -.005 5 -+.002.060.006 +- 5.300.050 11 12 4 1 REF. X45.040 4 1 MIN..015 PIN N0.1 INDEX. MIN..035.003.025 + - 12.010.075 -+ REF..040 X45 18 26 26 18 19 25 0.015 Lead Finish: Au plated with Sn63/Pb37 solder dip..050 25 +.008.085-19 R.008 2005 Device Engineering Inc Page 9 of 10 DS-MW-03182-01 Rev E

Process Flow Process Step Standard Burn-In THERMAL CYCLE MIL-STD-883B M1010.4 Condition B 10 Cycles 10 Cycles CONSTANT ACCELERATION MIL-STD-883B M2001, Method D YES YES GROSS & FINE LEAK MIL-STD-883B M1014.10 YES YES PRE-BURN-IN Electrical Test NO YES BURN IN MIL-STD-883B M1015 Condition A NO 160hrs @ +125 C FINAL ELECTRICAL TEST, Room Temperature 100% 100% FINAL ELECTRICAL TEST, High Temperature 100% @ +125 C 100% @ +125 C FINAL ELECTRICAL TEST, Low Temperature 0.65% AQL @ -55 C 0.65% AQL @ -55 C Ordering Information Part Number Package Operating Temperature Range Burn In DEI3182A-DMS 16-Lead Side-braze Ceramic DIP -55 C to + 125 C N DEI3182A-DMB 16-Lead Side-braze Ceramic DIP -55 C to + 125 C Y DEI3182A-CMS 16-Lead CERDIP -55 C to + 125 C N DEI3182A-CMB 16-Lead CERDIP -55 C to + 125 C Y DEI3182A-EMS 28 Lead Ceramic LCC -55 C to + 125 C N DEI3182A-EMB 28 Lead Ceramic LCC -55 C to + 125 C Y Note: The CMB/-DMB/-EMB parts may be marked as CMS / DMS/-EMS with a B stamp to denote burn-in. DEI reserves the right to make changes to any products or specifications herein. DEI makes no warranty, representation, or guarantee regarding suitability of its products for any particular purpose. 2005 Device Engineering Inc Page 10 of 10 DS-MW-03182-01 Rev E