A Channel Constant-Current LED Driver. Features and Benefits. Description. Packages: Typical Application

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Features and Benefits 16 constant-current outputs, up to 50 ma each LED output voltage up to 12 V 3.0 to 5.5 V logic supply range Schmitt trigger inputs for improved noise immunity Power-On Reset (POR), all register bits = 0 Low-power MOS logic and latches High data input rate: 30 MHz Output current accuracy: between channels < ±3% and between Is ±7%, over the full operating temperature range Internal UVLO and thermal shutdown (TSD) circuitry Packages: 24-pin TSSOP with exposed thermal pad (Package LP) 24-contact QFN 4 mm 4 mm 0.75 mm (Package ES) Description The A6282 device is designed for LED display applications. This MOS device includes an input shift register, accompanying data latches, and 16 MOS constant current sink drivers. The MOS shift registers and latches allow direct interfacing with microprocessor-based systems. With a 3.3 or 5 V logic supply, typical serial data input rates can reach up to 30 MHz. The LED drive current level can be set by a single external resistor, selected by the application designer. A serial data output permits cascading of multiple devices in applications requiring additional drive lines. The A6282 is available in two 24-terminal packages: QFN (package ES) and TSSOP (LP), which have an exposed thermal pad. Both packages are lead (Pb) free with 100% matte tin leadframe plating. Applications include the following: Monocolor, multicolor, or full-color LED display Monocolor, multicolor, or full-color LED signboard Display backlighting Multicolor LED lighting Not to scale Typical Application V LED 10 μf 10 μf SDI SDI OUT0 OUT15 SDO SDI OUT0 OUT15 SDO ontroller LK LE OE LK LE OE A6282 V DD VDD 100 nf GND REXT LK LE OE A6282 V DD VDD 100 nf GND REXT I 1 I 2 ascaded A6282 devices 6282-DS, Rev. 4

Selection Guide Part Number Package Packing A6282EESTR-T 4 mm 4 mm QFN, 24 pins, exposed thermal pad 1500 pieces per 7-in. reel A6282ELPTR-T TSSOP, 24 pins, exposed thermal pad 4000 pieces per 13 in. reel Absolute Maximum Ratings haracteristic Symbol Notes Rating Unit Supply Voltage* V DD 0.3 to 5.5 V OUTx urrent (any single output) I O 60 ma Input Voltage Range* V I V OE, V LE, V LK, V SDI 0.3 to V DD + 0.3 V LED Load Supply Range* V LED 0.3 to 13.2 V ESD Rating HBM (JEDE JESD22-A114, Human Body Model) 2.0 kv DM (JEDE JESD22-101, harged Device Model) 1.0 kv Operating Temperature Range (E) T A 40 to 85 Junction Temperature T J (max) 150 Storage Temperature Range T stg 55 to 150 *With respect to ground. Thermal haracteristics haracteristic Symbol Test onditions 1 Value Units ES package, 4-layer PB based on JEDE standard 37 /W Package Thermal Resistance R θja LP packge, 4-layer PB based on JEDE standard 28 /W *Additional thermal information available on the Allegro website. 5.0 Allowable Package Power Dissipation (W) 4.0 3.0 2.0 1.0 Package LP, R JA = 28 /W Package ES, R JA = 37 /W 0 25 50 75 100 125 150 Ambient Temperature ( ) 2

Functional Block Diagram VDD UVLO and TSD SDI LK Serial - Parallel Shift Register SDO OE LE ontrol Logic Block Latches Output ontrol Drivers REXT I O Regulator Exposed Pad (ET and LP packages) GND OUT0 OUT1 OUT15 V LED Inputs and Outputs Equivalent ircuits Resistor values are equivalent resistance and not tested VDD VDD LK, SDI, LE, Ō Ē 500 Ω 10 Ω SDO 3

Pin-out Diagrams Top-down views SDO REXT VDD GND SDI LK 1 2 3 4 5 6 LE 7 24 OE OUT0 8 23 OUT15 OUT14 OUT13 OUT12 22 21 20 PAD 9 10 11 OUT1 OUT2 OUT3 OUT4 12 19 OUT11 18 OUT10 17 OUT9 16 OUT8 15 OUT7 14 OUT6 13 OUT5 GND 1 SDI 2 LK 3 LE 4 OUT0 5 OUT1 6 OUT2 7 OUT3 8 OUT4 9 OUT5 10 OUT6 11 OUT7 12 PAD 24 VDD 23 REXT 22 SDO 21 OE 20 OUT15 19 OUT14 18 OUT13 17 OUT12 16 OUT11 15 OUT10 14 OUT9 13 OUT8 ES Package LP Package Terminal List Table Name Number ES LP Description LK 6 3 lock; data shift clock input terminal GND 4 1 Logic supply ground and load supply ground LE 7 4 Latch Enable input terminal Ō Ē 24 21 Output Enable input terminal, active low (when Ō Ē = high, all OUTx outputs are forced off; when Ō Ē = low, on/off status of OUTx outputs is controlled by the state of the latches OUT0 8 5 OUT1 9 6 OUT2 10 7 OUT3 11 8 OUT4 12 9 OUT5 13 10 OUT6 14 11 OUT7 15 12 OUT8 16 13 onstant current outputs OUT9 17 14 OUT10 18 15 OUT11 19 16 OUT12 20 17 OUT13 21 18 OUT14 22 19 OUT15 23 20 PAD Exposed pad for enhanced thermal dissipation; not connected internally, connect to GND REXT 2 23 Reference current terminal; sets output current for all channels SDI 5 2 Serial Data In terminal SDO 1 22 Serial Data Out terminal VDD 3 24 Logic Supply terminal 4

Output urrent Shift % I ELETRIAL HARATERISTIS at T 1 A = 25, V DD = 3.0 to 5.5 V, unless otherwise noted haracteristic Symbol Test onditions Min. Typ. 2 Max. Unit Logic Supply Voltage Range V DD Operating 3.0 5.0 5.5 V LED Load Supply Output Voltage V LED Operating 12.0 V V Undervoltage Lockout V DD 0 5.0 V 2.5 2.7 2.9 V DD(UV) V DD 5 0.0 V 2.3 2.5 2.7 V V DD = 4.5 to 5.5 V, V DS(x) = 1 V, R EXT = 374 47.4 51.1 54.5 ma Output urrent I O V DD = 3.0 to 3.6 V, V DS(x) = 1 V, R EXT = 374 46.5 50.1 53.5 ma V DD = 4.5 to 5.5 V, V DS(x) = 1 V, R EXT = 910 19.8 21.4 22.8 ma V DD = 3.0 to 3.6 V, V DS(x) = 1 V, R EXT = 910 19.5 21.0 22.4 ma T A = 25 ; between one output on and ±1 % V DD = 5.5 V, V DS(x) = 1 V, R EXT = 910 Ω, O all outputs on Output to Output Matching Error 3 Err V DS = 1 V, R EXT = 374, all outputs on +1.0 +3.0 % V DS = 1 V, R EXT = 910, all outputs on +1.0 +3.0 % V DD = 5.5 V, V DS(x) = 1 to 3 V, R EXT = 374, all outputs on 1.7 3 %/V Output urrent Regulation %I O(reg) V DD = 5.5 V, V DS(x) = 1 to 3 V, R EXT = 910, all outputs on 2.4 4 %/V V DD = 3.6 V, V DS(x) = 1 to 3 V, R EXT = 374, all outputs on 1.2 2 %/V V DD = 3.6 V, V DS(x) = 1 to 3 V, R EXT = 910, all outputs on 1.8 3 %/V Output Leakage urrent I DSS V OH = 12 V 0.5 μa Logic Input Voltage V IH 0.8 V DD V DD V V IL GND 0.2 V DD V Logic Input Voltage Hysteresis V Ihys All digital inputs 250 900 mv Logic Input urrent I I All digital inputs 1 1 μa SDO Voltage V OL I OL = 1 ma 0.5 V V OH I OH = 1 ma V DD 0.5 V I DD(OFF) R EXT = 910, V OE = 5 V 16 ma R EXT = 3.8 k, V OE = 5 V 6 ma R EXT = 374, V OE = 5 V 40 ma Supply urrent 4 All outputs on, R EXT = 910, V O = 1 V, 20 ma data transfer 30 MHz I DD(ON) All outputs on, R EXT = 374, V O = 1 V, 45 ma data transfer 30 MHz ontinued on the next page 5

ELETRIAL HARATERISTIS (continued), at T 1 A = 25, V DD = 3.0 to 5.5 V, unless otherwise noted haracteristic Symbol Test onditions Min. Typ. 2 Max. Unit Thermal Shutdown Temperature T JTSD Temperature increasing 165 Thermal Shutdown Hysteresis T JTSDhys 15 Reference Voltage at External Resistor REXT V EXT R EXT = 374 1.21 V 1 Tested at 25. Specifications are assured by design and characterization over the operating temperature range of 40 to 85. 2 Typical data are for initial design estimations only, and assume optimum manufacturing and application conditions. Performance may vary for individual units, within the specified maximum and minimum limits. 3 Err = (I O (min or max) I O (av)) / I O (av). I O (av) is the average current of all outputs. I O (min or max) is the output current with the greatest difference from I O (av). 4 Recommended operating range: V O = 1.0 to 3.0 V. SWITHING HARATERISTIS at T A 1 = 25, V DD = V IH = 5.0 V, V DS = 1 V, V IL = 0 V, R EXT = 910 Ω, I O = 21.4 ma, V L = 2 V, R L = 51 Ω, L = 15 pf (see also Timing Diagrams section) haracteristic Symbol Test onditions Min. Typ. 2 Max. Unit lock Frequency f LK LK 30 MHz lock Frequency (cascaded devices) f LK LK 25 MHz lock Pulse Duration t wh0 LK = high 16 ns LE Pulse Duration t wh1 LE = high 20 ns Setup Time Hold Time Rise Time Fall Time t su0 SDI to LK 10 ns t su1 LK to LE 10 ns t h0 LK to SDI 10 ns t h1 LE to LK 10 ns t r0 SDO, 10/90% points (measurement circuit A) 16 ns t r1 OUTx, V DD = 5 V,10/90% points (measurement circuit B) 10 30 ns t f0 SDO, 10/90% points (measurement circuit A) 16 ns t f1 OUTx, V DD = 5 V,10/90% points (measurement circuit B) 10 30 ns t pd0 LK to SDO (measurement circuit A) 30 ns Propagation Delay Time t pd1 Ō Ē to OUTx (measurement circuit B) 60 ns t pd2 LE to OUTx (measurement circuit B) 60 ns Output Enable Pulse Duration t w(oe) (see Timing Diagrams section) 60 ns 1 Tested at 25. Specifications are assured by design and characterization over the operating temperature range of 40 to 85. 2 Typical data are for initial design estimations only, and assume optimum manufacturing and application conditions. Performance may vary for individual units, within the specified maximum and minimum limits. Parameter Measurement ircuits V L A6282 SDO A6282 R L 15 pf OUTx L (A) ircuit for t f0, t pd0, and t r0 (B) ircuit for t f1, t pd1, t pd2, and t r1. 6

Timing Diagrams Normal Operation t wh0 LK t su0 t h0 SDI SDO t pd0 10% t r0 90% 50% t f0 t su1 t wh1 LE OE Low = All Outputs Enabled t pd2 High = Output on OUTx (current) Low = Output off Disabling Outputs t w (OE) OE 50% 50% t pd1 t pd1 OUTx (current) t f1 t r1 90% 50% 10% 7

Operating haracteristics hannel Maximum onstant Output urrent versus External Reference Resistance 60 hannel Output urrent versus Output Voltage V DD = 5.0 V 50 I O (max) (ma) 50 40 30 20 V DD (V) 4.5 to 5.0 3.0 to 3.6 I O (ma) 45 40 35 30 25 20 15 R EXT = 470 Ω R EXT = 910 Ω 10 10 5 0 0.3 1.0 2.0 3.0 4.0 5.0 R EXT (kω) 0 0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0 V DS (V) Input-Output Truth Table Serial Data Input (SDI) lock Input (LK) Shift Register ontents Serial Latch Latch ontents Output Output ontents Data Enable Enable Out Input Input I I 0 I 1 I 2 I 15 I 0 I 1 I 2 I 0 I 1 I 2 15 (SDO) (LE) (Ō Ē ) I 15 H H R 0 R 1 R 15 R 14 L L R 0 R 1 R 15 R 14 X R 0 R 1 R 2 R 15 R 15 X X X X X L R 0 R 1 R 2 R 15 P 0 P 1 P 2 P 15 P 15 H P 15 P 0 P 1 P 2 L (Outputs on) P 15 P 0 P 1 P 2 H X X X X H H H H (Outputs off) L = Low logic (voltage) level, H = High logic (voltage) level, X = Don t care, P = Present state, R = Previous state 8

Functional Description Normal Operation Serial data present at the SDI (Serial Data In) input is transferred to the shift register on the transition from logic 0 to logic 1 of the LK (lock) input pulse. On succeeding LK pulses, the register shifts data towards the SDO (Serial Data Out) output. The serial data must appear at the input prior to the rising edge of the LK waveform. Data present in any register is transferred to the respective latch when the LE (Latch Enable) input is high (serial-to-parallel conversion). The latches continue to accept new data as long as LE is held high (level triggered). Applications where the latches are bypassed (LE tied high) require that the Ō Ē (Output Enable) input be high during serial data entry. When Ō Ē is high, the output sink drivers are disabled (off). The data stored in the latches is not affected by the state of Ō Ē. With Ō Ē active (low), the outputs are controlled by the state of their respective latches. Setting Maximum hannel urrent The maximum output current per channel is set by a single external resistor, REXT, which is placed between the REXT pin and GND. The voltage on REXT, V EXT, is set by an internal band gap and is 1.21 V, typical. The maximum channel output current can be calculated as: I O (max) = (18483.1/ R EXT ) + 0.67, for V DD = 3.0 to 3.6 V, or I O (max) = (18841.2/ R EXT ) + 0.68, for V DD = 4.5 to 5.5 V, where R EXT is the value of the user-selected external resistor, which should not be less than 374 Ω. A chart of the maximum per channel (OUT0 to OUT15) constant output current, I O (max), at various values of R EXT is shown in, the Operating haracteristics section. Undervoltage Lockout The A6282 includes an internal undervoltage lockout (UVLO) circuit that disables the outputs in the event that the logic supply voltage drops below a minimum acceptable level. This feature prevents the display of erroneous information, a necessary function for some critical applications. Upon recovery of the logic supply voltage after a UVLO event, all internal shift registers and latches are set to 0. The A6282 is then in normal mode. Thermal Shutdown Protection If the junction temperature exceeds the threshold temperature, T JTSD, 165 typical, the outputs will be turned off until the junction temperature cools down through the thermal shutdown hysteresis, 15 typical. The shift register and output latches register will remain active during a thermal shutdown event. Therefore, there is no need to reset the data in the output latches. 9

Application Information Load Supply Voltage (V LED ) This device is designed to operate with driver voltage drops (V DS ) of 1.0 to 3.0V. If higher voltages are dropped across the driver, package power dissipation will increase. To minimize package power dissipation, it is recommended to use the lowest possible load supply voltage, V LED, or to set a series voltage drop, V DROP, according to the following formula: V DROP = V LED V F V DS, where V F is the LED forward voltage. For reference, typical LED forward voltages are: LED Type V F (V) White 3.5 to 4.0 Blue 3.0 to 5.5 Green 1.8 to 2.5 Yellow 2.0 to 2.5 Amber 1.9 to 3.0 Red 1.6 to 2.5 Infrared 1.2 to 1.8 UV 3.0 to 4.0 V DROP = I O R DROP for a single driver, for a Zener diode (V Z ), or for a series string of silicon diodes (approximately 0.7 V per diode) for a group of drivers (these configurations are shown in the figure below). If the available voltage source will cause unacceptable power dissipation and series resistors or diodes are undesirable, a voltage regulator can be used to provide V LED. Pattern Layout To save pins and board space, the A6282 uses one pin for both logic ground and power ground. Therefore, achieving optimal performance requires careful attention to layout. Following the suggestions below will improve the analog performance and logic noise immunity. V LED V DROP V F V DS V LED V DROP V F V DS Typical application voltage drops V LED V DROP V F V DS 1. Place the REXT resistor as close as possible to the REXT pin and GND pin. This will minimize parasitic inductance and capacitance. 2. Use a separate line to the device GND pin for REXT, and separate lines for the decoupling capacitors. The lines should join at ground. This star grounding will improve output load regulation and minimize any chance of oscillation. The REXT ground line should carry only the small current from the internal voltage reference at REXT. The high A currents flowing through the decoupling capacitors and their resistive and inductive PB lines cause noise (ground bounce) on the capacitor ground lines. Such noise could disturb the reference voltage at REXT and promote oscillation. onnect the exposed thermal pad of the ES and LP packages to the power ground, along with the decoupling capacitors, and not to the ground line for REXT. 3. Keep the output drive lines (OUT0 through OUT15) away from the REXT pin to avoid coupling of the output signal into the reference for the current sources. Output lines should not run adjacent to the REXT pin or directly under the REXT pin. 4. Use decoupling capacitors on the VDD pin and the LED supply bus. Place the logic decoupling capacitor (0.1 μf, one for each A6282) as close as possible to the VDD pin. Use at least one 10 μf capacitor from the LED supply line to device ground for at least every two A6282s. 5. Use multilayer boards if possible. Package Power Dissipation The maximum allowable package power dissipation based on package type is determined by: P D(max) = (150 T A ) / R JA, where R JA is the thermal resistance of the package, determined experimentally. Power dissipation levels based on the package are shown in the Thermal haracteristics table. The actual package power dissipation is determined by: P D(act) = D (V DS I O 16) + (V DD I DD ), where D is the duty cycle. The value 16 is the maximum number of available device outputs, representing the worst-case scenario (displaying all 16 LEDs). When the load supply voltage, V LED, is greater than 3 to 5 V, and P D(act) > P D(max), an external voltage reducer (V DROP ) must be used (figure at left). Reducing D will also reduce power dissipation. The ES and LP packages contain an exposed thermal pad on the bottom of the package for enhanced heat dissipation. onnect this pad to a large power ground plane using thermal vias. JEDE documents JESD51-3 and JESD51-5 give suggestions for PB and thermal via designs. 10

Package ES, 4 mm x 4 mm, 24-pin QFN with Exposed Thermal Pad 0.30 1 2 24 A 4.00 ±0.15 4.00 ±0.15 2.10 4.10 0.90 1 2 24 0.50 2.10 25X D 0.08 SEATING PLANE 4.10 PB Layout Reference View 0.25 +0.05 0.07 2 1 0.50 0.40 +0.15 0.10 B 2.10 0.75 ±0.05 A For Reference Only (reference JEDE MO-220WGGD) Dimensions in millimeters Exact case and lead configuration at supplier discretion within limits shown Terminal #1 mark area B Exposed thermal pad (reference only, terminal #1 identifier appearance at supplier discretion) D Reference land pattern layout (reference IP7351 QFN50P400X400X80-25W6M) All pads a minimum of 0.20 mm from all adjacent pads; adjust as necessary to meet application process requirements and PB layout tolerances; when mounting on a multilayer PB, thermal vias at the exposed thermal pad land can improve thermal dissipation (reference EIA/JEDE Standard JESD51-5) oplanarity includes exposed thermal pad and terminals 24 2.10 11

Package LP, 24-pin TSSOP with Exposed Thermal Pad 24 7.80 ±0.10 4 ±4 0.15 +0.05 0.06 0.45 0.65 B 3.00 4.40 ±0.10 6.40 ±0.20 0.60 ±0.15 3.00 6.10 A (1.00) 24X 0.10 1 2 4.32 SEATING PLANE 0.25 SEATING PLANE GAUGE PLANE 1.65 4.32 PB Layout Reference View 0.25 +0.05 0.06 0.65 1.20 MAX 0.15 MAX For reference only (reference JEDE MO-153 ADT) Dimensions in millimeters Dimensions exclusive of mold flash, gate burrs, and dambar protrusions Exact case and lead configuration at supplier discretion within limits shown A Terminal #1 mark area B Exposed thermal pad (bottom surface) Reference land pattern layout (reference IP7351 TSOP65P640X120-25M); all pads a minimum of 0.20 mm from all adjacent pads; adjust as necessary to meet application process requirements and PB layout tolerances; when mounting on a multilayer PB, thermal vias at the exposed thermal pad land can improve thermal dissipation (reference EIA/JEDE Standard JESD51-5) 12

opyright 2008-2013, reserves the right to make, from time to time, such de par tures from the detail spec i fi ca tions as may be required to permit improvements in the per for mance, reliability, or manufacturability of its products. Before placing an order, the user is cautioned to verify that the information being relied upon is current. Allegro s products are not to be used in life support devices or systems, if a failure of an Allegro product can reasonably be expected to cause the failure of that life support device or system, or to affect the safety or effectiveness of that device or system. The in for ma tion in clud ed herein is believed to be ac cu rate and reliable. How ev er, assumes no responsibility for its use; nor for any in fringe ment of patents or other rights of third parties which may result from its use. For the latest version of this document, visit our website: www.allegromicro.com 13