FQA24N60 FQA24N60 600V N-Channel MOSFET April 2000 QFET TM General Description These N-Channel enhancement mode power field effect transistors are produced using Fairchild s proprietary, planar stripe, DMOS technology. This advanced technology has been especially tailored to minimize on-state resistance, provide superior switching performance, and withstand high energy pulse in the avalanche and commutation mode. These devices are well suited for high efficiency switch mode power supply. Features 23.5A, 600V, R DS(on) = 0.24 Ω @ = 10 V Low gate charge ( typical 110 nc) Low Crss ( typical 56 pf) Fast switching 100% avalanche tested Improved dv/dt capability D! G "! " "! " G D S TO-3P FQA Series! S Absolute Maximum Ratings T C = 25 C unless otherwise noted Symbol Parameter FQA24N60 Units S Drain-Source Voltage 600 V I D Drain Current - Continuous (T C = 25 C) 23.5 A - Continuous (T C = 100 C) 14.9 A I DM Drain Current - Pulsed (Note 1) 94 A S Gate-Source Voltage ±30 V E AS Single Pulsed Avalanche Energy (Note 2) 1300 mj I AR Avalanche Current (Note 1) 23.5 A E AR Repetitive Avalanche Energy (Note 1) 31 mj dv/dt Peak Diode Recovery dv/dt (Note 3) 4.5 Vns P D Power Dissipation (T C = 25 C) 310 W - Derate above 25 C 2.5 W/ C T J, T STG Operating and Storage Temperature Range -55 to +150 C T L Maximum lead temperature for soldering purposes, 1/8 from case for 5 seconds 300 C Thermal Characteristics Symbol Parameter Typ Max Units R θjc Thermal Resistance, Junction-to-Case -- 0.4 CW R θcs Thermal Resistance, Case-to-Sink 0.24 -- CW R θja Thermal Resistance, Junction-to-Ambient -- 40 CW
Electrical CharacteristicsT C = 25 C unless otherwise noted Symbol Parameter Test Conditions Min Typ Max Units Off Characteristics BS Drain-Source Breakdown Voltage = 0 V, I D = 250 µa 600 -- -- V BS Breakdown Voltage Temperature / T J Coefficient I D = 250 µa, Referenced to 25 C -- 0.6 -- V/ C I DSS = 600 V, = 0 V -- -- 10 µa Zero Gate Voltage Drain Current = 480 V, T C = 125 C -- -- 100 µa I GSSF Gate-Body Leakage Current, Forward = 30 V, = 0 V -- -- 100 na I GSSR Gate-Body Leakage Current, Reverse = -30 V, = 0 V -- -- -100 na FQA24N60 On Characteristics (th) Gate Threshold Voltage =, I D = 250 µa 3.0 -- 5.0 V R DS(on) Static Drain-Source V On-Resistance GS = 10 V, I D = 11.8 A -- 0.18 0.24 Ω g FS Forward Transconductance = 50 V, I D = 11.8 A (Note 4) -- 22.5 -- S Dynamic Characteristics C iss Input Capacitance = 25 V, = 0 V, -- 4200 5500 pf C oss Output Capacitance f = 1.0 MHz -- 550 720 pf C rss Reverse Transfer Capacitance -- 56 75 pf Switching Characteristics t d(on) Turn-On Delay Time = 300 V, I D = 23.5 A, -- 90 190 ns t r Turn-On Rise Time R G = 25 Ω -- 270 550 ns t d(off) Turn-Off Delay Time -- 200 410 ns t f Q g Turn-Off Fall Time Total Gate Charge (Note 4, 5) = 480 V, I D = 23.5 A, -- -- 170 110 350 145 ns nc Q gs Gate-Source Charge = 10 V -- 25 -- nc Q gd Gate-Drain Charge (Note 4, 5) -- 53 -- nc Drain-Source Diode Characteristics and Maximum Ratings I S Maximum Continuous Drain-Source Diode Forward Current -- -- 23.5 A I SM Maximum Pulsed Drain-Source Diode Forward Current -- -- 94 A V SD Drain-Source Diode Forward Voltage = 0 V, I S = 23.5 A -- -- 1.4 V t rr Reverse Recovery Time = 0 V, I S = 23.5 A, -- 470 -- ns Q rr Reverse Recovery Charge di F / dt = 100 A/µs (Note 4) -- 6.2 -- µc Notes: 1. Repetitive Rating : Pulse width limited by maximum junction temperature 2. L = 4.3mH, I AS = 23.5A, = 50V, R G = 25 Ω, Starting T J = 25 C 3. I SD 23.5A, di/dt 200A/µs, BS, Starting T J = 25 C 4. Pulse Test : Pulse width 300µs, Duty cycle 2% 5. Essentially independent of operating temperature
FQA24N60 Typical Characteristics I D, Drain Current [A] 10 1 10 0 Top : 15.0 V 10.0 V 8.0 V 7.0 V 6.5 V 6.0 V Bottom : 5.5 V 1. 250s Pulse Test 2. T C = 25 I D, Drain Current [A] 10 1 150 25 10 0-55 1. = 50V 2. 250s Pulse Test 10-1 10 0 10 1, Drain-Source Voltage [V] 10-1 2 4 6 8 10, Gate-Source Voltage [V] Figure 1. On-Region Characteristics Figure 2. Transfer Characteristics 1.0 0.8 R DS(ON) [], Drain-Source On-Resistance 0.6 0.4 0.2 = 20V = 10V Note : T J = 25 I DR, Reverse Drain Current [A] 10 1 10 0 150 25 1. = 0V 2. 250s Pulse Test 0.0 0 10 20 30 40 50 60 70 80 90 100 I D, Drain Current [A] 10-1 0.2 0.4 0.6 0.8 1.0 1.2 1.4 V SD, Source-Drain voltage [V] Figure 3. On-Resistance Variation vs. Drain Current and Gate Voltage Figure 4. Body Diode Forward Voltage Variation vs. Source Current and Temperature 8000 C iss = C gs + C gd (C ds = shorted) C oss = C ds + C gd C rss = C gd 12 10 = 120V = 300V Capacitance [pf] 6000 4000 2000 C iss C oss C rss 1. = 0 V 2. f = 1 MHz, Gate-Source Voltage [V] 8 6 4 2 = 480V Note : I D = 23.5 A 0 10-1 10 0 10 1, Drain-Source Voltage [V] 0 0 20 40 60 80 100 120 Q G, Total Gate Charge [nc] Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics
Typical Characteristics (Continued) 1.2 3.0 FQA24N60 2.5 BS, (Normalized) Drain-Source Breakdown Voltage 1.1 1.0 0.9 1. = 0 V 2. I D = 250 A R DS(ON), (Normalized) Drain-Source On-Resistance 2.0 1.5 1.0 0.5 1. = 10 V 2. I D = 11.8 A 0.8-100 -50 0 50 100 150 200 T J, Junction Temperature [ o C] Figure 7. Breakdown Voltage Variation vs. Temperature 0.0-100 -50 0 50 100 150 200 T J, Junction Temperature [ o C] Figure 8. On-Resistance Variation vs. Temperature 24 Operation in This Area is Limited by R DS(on) 20 10 2 10 µs I D, Drain Current [A] 10 1 10 0 1. T C = 25 o C 2. T J = 150 o C 3. Single Pulse 10 ms DC 100 µs 1 ms 10-1 10 0 10 1 10 2 10 3, Drain-Source Voltage [V] I D, Drain Current [A] 16 12 8 4 0 25 50 75 100 125 150 T C, Case Temperature [] Figure 9. Maximum Safe Operating Area Figure 10. Maximum Drain Current vs. Case Temperature Z JC (t), Thermal Response 10-1 N otes : 0.2 1. Z JC (t) = 0.4 /W M ax. 2. D uty Factor, D =t 1 /t 2 0.1 3. T JM - T C = P DM * Z JC (t) 10-2 D=0.5 0.05 0.02 0.01 single pulse P DM t 1 t 2 10-5 10-4 10-3 10-2 10-1 10 0 10 1 t 1, S q uare W ave P ulse D uration [sec] Figure 11. Transient Thermal Response Curve
FQA24N60 Gate Charge Test Circuit & Waveform 12V 200nF 50K 300nF Same Type as DUT 10V Q g Q gs Q gd 3mA DUT Charge Resistive Switching Test Circuit & Waveforms R L 90% R G 10V DUT 10% t d(on) t r t d(off) tf t on t off Unclamped Inductive Switching Test Circuit & Waveforms L 1 E AS = ---- 2 LI 2 AS BS -------------------- BS - I D BS I AS R G I D (t) 10V DUT (t) t p t p Time
Peak Diode Recovery dv/dt Test Circuit & Waveforms FQA24N60 DUT + _ I SD L Driver R G Same Type as DUT dv/dt controlled by RG I SD controlled by pulse period ( Driver ) Gate Pulse Width D = -------------------------- Gate Pulse Period 10V I FM, Body Diode Forward Current I SD ( DUT ) di/dt I RM Body Diode Reverse Current ( DUT ) Body Diode Recovery dv/dt V SD Body Diode Forward Voltage Drop
FQA24N60 Package Dimensions TO-3P 15.60 ±0.20 ø3.20 ±0.10 13.60 ±0.20 9.60 ±0.20 3.80 ±0.20 4.80 ±0.20 1.50 +0.15 0.05 13.90 ±0.20 12.76 ±0.20 19.90 ±0.20 23.40 ±0.20 18.70 ±0.20 2.00 ±0.20 3.00 ±0.20 1.00 ±0.20 3.50 ±0.20 16.50 ±0.30 1.40 ±0.20 5.45TYP [5.45 ±0.30] 5.45TYP [5.45 ±0.30] 0.60 +0.15 0.05
TRADEMARKS The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks. ACEx Bottomless CoolFET CROSSVOLT E 2 CMOS FACT FACT Quiet Series FAST FASTr GTO HiSeC ISOPLANAR MICROWIRE POP PowerTrench QFET QS Quiet Series SuperSOT -3 SuperSOT -6 SuperSOT -8 SyncFET TinyLogic UHC VCX DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. LIFE SUPPORT POLICY FAIRCHILD S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR INTERNATIONAL. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, or (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in significant injury to the user. 2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. PRODUCT STATUS DEFINITIONS Definition of Terms Datasheet Identification Product Status Definition Advance Information Formative or In Design This datasheet contains the design specifications for product development. Specifications may change in any manner without notice. Preliminary First Production This datasheet contains preliminary data, and supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design. No Identification Needed Full Production This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design. Obsolete Not In Production This datasheet contains specifications on a product that has been discontinued by Fairchild semiconductor. The datasheet is printed for reference information only. Rev. A, January 2000