MICROELECTRONICS ASSSEMBLY TECHNOLOGIES. The QFN Platform as a Chip Packaging Foundation

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West Coast Luncheon January 15, 2014. PROMEX PROMEX INDUSTRIES INC. MICROELECTRONICS ASSSEMBLY TECHNOLOGIES The QFN Platform as a Chip Packaging Foundation 3075 Oakmead Village Drive Santa Clara CA Ɩ 95051 USA +1.408.496.0222 www.promex-ind.com January 15, 2014 1

PROMEX PROMEX INDUSTRIES INC. MICROELECTRONICS ASSEMBLY TECHNOLOGIES Topics QFN Overview Overmolded QFNs Open Cavity QFNs Special QFNs LGA Based QFNs Harvey s SMT Issue Conclusions January 15, 2014 2

PROMEX PROMEX INDUSTRIES INC. MICROELECTRONICS ASSEMBLY TECHNOLOGIES The Package of Choice for 100 leads or less QFN Overview Foundation 1: A Versatile Platform January 15, 2014 3

Platform Versatility PROMEX INDUSTRIES INC. PROMEX MICROELECTRONICS ASSEMBLY TECHNOLOGIES JEDEC Standard Plastic Over Molded Versions Open Cavity Plastic Molded Versions QFNs, DFNs and LGAs are bottom terminated components (BTC s) as described by the IPC Standard 7093 in which Promex participated. QFNs are build using a standard lead frame array that fits a common mold. The lead frame array is customized for each new QFN size. January 15, 2014 4

JEDEC QFN / DFN INDUSTRIES INC. MICROELECTRONICS ASSEMBLY TECHNOLOGIES MO-220 package outline ranges (Quad I/O s on 4 sides) QFN Body size (mm) Pitch Options (mm) Lead Counts 2 x 2 through 12 x 12 0.8, 0.65, 0.5, 0.4 4 to 108 MO-229 package outline ranges (Dual I/O s on 2 sides) DFN Body size (mm) Square packages Pitch Options (mm) Lead Counts 1.5x 1.5 through 5 x 5 0.95, 0.80, 0.65, 0.5 4 to 18 DFNBody size (mm) Rectangular packages Pitch Options (mm Lead Counts 1.5 x 1 through 6 x 5 0.8, 0.5 4 to 18 January 15, 2014 5

Promex tooled sizes MICROELECTRONICS ASSEMBLY TECHNOLOGIES QFN Size, Pitch and Lead Counts DFN Size, Pitch, Lead Counts QFN (mm) 0.65 pitch 0.50 pitch 0.40 pitch DFN (mm) 0.50 pitch 3x 3 8, 12 16 20 2 x 2 6,8, 10 4x 4 16 20, 24 28 2 x 3 10, 12 5 x 5 20 28, 32 36, 40 3 x 3 8,10 6 x 6 40 56, 60 3 x 4 12 7 x 7 48 56, 60 4 x 4 12 8 x 8 52, 56 68 9 x9 64 10 x 10 72 12x 12 80 100 Customer demand pull JEDEC open tooled packages at Promex January 15, 2014 6

Demand Response Favored body sizes, pitch and lead count demand, custom versions trending QFN Body size (mm) Pitch Options (mm) Lead Counts X 2 x 2 through 12 x 12 0.8, 0.65, 0.5, 0.4 4 to 108 3 x 3 8 x 8 0.5 20-60 DFN Body size (mm) Square packages Pitch Options (mm) Lead Counts 1.5x 1.5 through 5 x 5 0.95, 0.80, 0.65, 0.5 4 to 18 DFNBody size (mm) Rectangular packages X X X Pitch Options (mm X Lead Counts 1.5 x 1 through 6 x 5 0.8, 0.5 4 to 18 2 x 2 4 x 4 square 0.5 10-12 January 15, 2014 7

QFN Platform Advantages Common mold tool saves significant NRE Lead frame spins in 4 6 weeks Standard and custom versions trivial to design, fabricate and manufacture Meets all green standards Industry standard processes QFN s penetrated in all markets January 15, 2014 8

PROMEX PROMEX INDUSTRIES INC. MICROELECTRONICS ASSEMBLY TECHNOLOGIES OvermoldedQFNs Foundation 2: Easily Modified January 15, 2014 9

Overmolded LF Array Saw Street Wire Bond Pads DAP Top: die attach side (bare copper & NiPdAu plating) Custom site ~ 5 weeks lead time JEDEC standard site X-ray of Die & w/b Bottom: SMT side showing polyimide tape prior to molding (NiPdAu plating) January 15, 2014 10

Typical QFN Overmolded Process Flow Die Die Attach Material Parts & Materials Cure Die Attach Material 150C Place Die Dispense Die Attach Material Leadframe Assembly Process @ 20C Molding Compound Assembly Process Temp? Remove Array from Mold Transfer Mold 180C Place Leadframe In Mold Gold Wire Ball Bond 150C Finished Part Mark Saw Inspect, Package Finished Singulate test & bin Part for Shipment January 15, 2014 11

Over Molded Array Saw lines Completed process steps: die attach, wire bonding, over molding. The standard 1 mm thickness can be varied from 0.4 mm to 2.00 mm. Next process steps: marking/identification, saw singulate, inspect, test, ship. January 15, 2014 12

PROMEX PROMEX INDUSTRIES INC. MICROELECTRONICS ASSEMBLY TECHNOLOGIES Open Cavity QFNs Foundation 3: A Versatile Alternate January 15, 2014 13

Open Cavity QFN Allows test probing MEMS device packaging RF air cavity applications Optical device packaging 3x3 QFN Open Cavity 8L Lids available NiPdAu lead frame Quick assembly by filling cavity 5x5 QFN Open Cavity 40L January 15, 2014 14

Open Cavity QFN 40 sizes currently available spanning: 3x3 to 12x12 20 more soft tooled January 15, 2014 15

Open Cavity Availability Off-the-Shelf from: www.mirrorsemi.com Web site has many tools available sizes variety of drawings Lids Etc. January 15, 2014 16

MSL & Parastic Properties Package Performance Foundation 4: Performance January 15, 2014 17

PROMEX Industries Plastic Over Molded QFNs: MSL Testing Compilation Via Third Parties Lead QFN Size, mm x mm # Leads Pitch, mm Die attach pad, mm x mm Die size, mm x mm 3x3 16 0.5 1.65 1.05 4x4 20 0.5 2.35 1.75 5x5 20 0.65 3.65 3.05 5x5 32 0.5 3.65 3.05 5x5 40 0.4 3.70 3.10 6x6 40 0.5 4.52 3.92 7x7 48 0.5 5.65 5.05 7x7 56 0.4 5.65 5.05 8x8 52 0.5 6.65 6.05 9x9 64 0.5 7.65 7.05 10 x10 72 0.5 8.10 7.50 12x12 100 0.4 10.10 9.50 MSL-1 MSL-3 MSL-5 Typical MSL Results January 15, 2014 18

QFN Electrical Parasitics Project Goals: Promex, Eric Bogatin Collaboration Develop a simple technique to characterize electrical parasitics in QFNs at GHz frequencies Include coupling between leads Using a model that is usable by ALL simulator engines (transportable) Characterize for a variety of package sizes and lead location within a packge The solution: Described with LC matrix elements Describe as single ended characteristic impedance Describe as a differential impedance Constraints Only have access to the leads outside the package Surrogate chips with opens or shorts can be added inside die cavity Address multiple package sizes Dry gold to gold contact to external leads- no soldering Low cost, simple and robust The full project report is available via log-in: www.promex-ind.com January 15, 2014 19

Parasitic Project The Process of Extracting Model Parameters from a Measurement 1. For each package, build 2 identical packages with dummy die inside: At die, all leads shorted to return At die, all leads open 2. Build low cost fixture board between SMA connectors and 2 adjacent signal leads- with contact to return paths. 3. Measure fixture board only, open and shorted at far end Extract C, L matrix of fixture board 4. Measure fixture board + package open and shorted at far end with dummy die 5. Extract package only C, L matrix elements from low frequency measurement 6. Build higher bandwidth transmission line model from LC matrix elements 7. Verify models to as high a bandwidth as the measurements. 1 2 Plane under trace is return path January 15, 2014 20

Summary Data 0.5mm Pitch Over molded QFN s are viable candidates for frequencies up to 20 GHz C11 (pf) C21 (pf) L11 (nh) L21 (nh) 0.5 mm pitch Center 3X3 0.153 0.055 0.926 0.393 5X5 0.225 0.060 0.919 0.389 7X7 0.208 0.053 0.800 0.458 Corner 3X3 0.227 0.014 1.010 0.478 5X5 0.258 0.018 1.050 0.530 7X7 0.268 0.012 1.340 0.598 January 15, 2014 21

Advanced Packaging Foundation 5: Platform & Process Leverage January 15, 2014 22

Multiple Die Packaging PROMEX PROMEX INDUSTRIES INC. MICROELECTRONICS ASSEMBLY TECHNOLOGIES Lead frame based, dual die with die-to-die wire bonding Stacked die on a substrate January 15, 2014 23

Open Cavity Applications Optical Window Options PROMEX PROMEX INDUSTRIES INC. MICROELECTRONICS ASSEMBLY TECHNOLOGIES Light Emitter or sensor die Optically clear encapsulant Light Emitter or sensor die Custom die attach pad for thermal efficiency if needed January 15, 2014 24

Expanding the Process Typical LGA (Land Grid Array) Format Substrate Options: FR-4, 5, BT Rogers Material Top side: component to substrate termination Bottom side: substrate to board termination January 15, 2014 25

System-in-Package PROMEX PROMEX INDUSTRIES INC. MICROELECTRONICS ASSEMBLY TECHNOLOGIES Substrate versions Horizontal placement wire bonded flip chip (solder bumps / Cu pillars) Stacked structure wire bonded wire bonded & flip chip Direct connection between dice wire bonded + flip chip (CoC version) Source: inemi January 15, 2014 26

System-in-Package PROMEX PROMEX INDUSTRIES INC. MICROELECTRONICS ASSEMBLY TECHNOLOGIES Lead frame versions QFN R Flip chip die Bump QFN QFN Flip chip die Bump QFN R Flip chip die Bump January 15, 2014 27

RF Modules PROMEX PROMEX INDUSTRIES INC. MICROELECTRONICS ASSEMBLY TECHNOLOGIES Passives Minimal length, controlled loop height RF ribbon wire bonds Mold cap or air cavity lid outline Substrate (Rogers, BT) recessed die in bath tub area conventionally wire bonded die January 15, 2014 28

Package Development PROMEX PROMEX INDUSTRIES INC. MICROELECTRONICS ASSEMBLY TECHNOLOGIES Lead Frame or Substrate? Performance Requirements Stack-up & Select: Materials,Geometry, Design Rules, BoM Model Extractions Design Review Pre-Layout / Simulation Test Vehicle Builds (optional) AC / Transcient Simulation Design Approval Feedback to layout & design Design & Layout Thermal & Mechanical Analysis Lab Verification -Time domain simulation Correlate? NO Package Production YES Typical Advanced Package Design Flow January 15, 2014 29

Typical LGA or SiP Process Circuit Board/ Substrate with Array of sites Solder Paste Stencil Deposit Solder Paste SMT Parts Place SMT Parts Reflow Solder Water Wash Parts & Materials Assembly Process @ 20C Wire bondable Die Flip Chip Die Flux Die Place Die Reflow Solder Assembly Process Temp? Dispense Die Attach Material Place Die Cure Die Attach Material 150C Gold Wire Ball Bond 150C Place Assembly In Mold Assembly Process @ 260C Molding Compound Finished Part Transfer Mold Assembly ~180C Remove Array from Mold Mark Saw Singulate Inspect, test, bin Package Finished Part for Shipment January 15, 2014 30

Harvey s Issue A BTC Assembly Issue: solder voids January 15, 2014 31

Harvey s Issue Voiding in BTC/QFN SMT assembly Vendors recommend voiding of 50% or less of the die pad area for BTC components Voiding is hard to eliminate in BTC components Results from gases escaping from the solder past Can be minimized by stencil design and controlled solder deposition Voiding can be measured with X-ray and CSAM Amount of allowable voiding depends on the application When voiding is important, need careful layout and process design For low power and/or non RF devices, concerns are minimal. January 15, 2014 32

Conclusions PROMEX PROMEX INDUSTRIES INC. MICROELECTRONICS ASSEMBLY TECHNOLOGIES Significantly lower tooling NRE and lead time Reduces time-to-market Proven packaging methodology Versatility, flexibility, performance Single die and complex advanced packaging Compatibility with future innovations: - routed substrates, 3D printed substrates, embedded die and components, new materials January 15, 2014 33

PROMEX PROMEX INDUSTRIES INC. MICROELECTRONICS ASSEMBLY TECHNOLOGIES Discussion, Questions January 15, 2014 34