Test specification: Section (e)(1), Radiated emissions below 40 GHz Test procedure: ANSI C63.4, Sections 8.3.2, 13.2, 13.4 Test mode: Compliance
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1 Test specification: Section (e)(1), Radiated emissions below 40 GHz Test procedure: ANSI C63.4, Sections 8.3.2, 13.2, 13.4 Plot Radiated emission measurements at frequency 7280 MHz Low channel (CW) Semi-anechoic chamber Average Mid channel (CW) Page 26 of 91
2 Test specification: Section (e)(1), Radiated emissions below 40 GHz Test procedure: ANSI C63.4, Sections 8.3.2, 13.2, 13.4 Plot Radiated emission measurements from MHz Low channel (CW) Semi-anechoic chamber Peak hold Mid channel (CW) High channel (CW) Page 27 of 91
3 Test specification: Section (e)(1), Radiated emissions below 40 GHz Test procedure: ANSI C63.4, Sections 8.3.2, 13.2, 13.4 Plot Radiated emission measurements from MHz Low channel (CW) Semi-anechoic chamber Average Mid channel (CW) Page 28 of 91
4 Test specification: Section (e)(1), Radiated emissions below 40 GHz Test procedure: ANSI C63.4, Sections 8.3.2, 13.2, 13.4 Plot Radiated emission measurements from MHz Semi-anechoic chamber Average High channel (CW) Note: Final measurement was done in chirp modulation mode, for test results refer to Plot , Plot Page 29 of 91
5 Test specification: Section (e)(1), Radiated emissions below 40 GHz Test procedure: ANSI C63.4, Sections 8.3.2, 13.2, 13.4 Plot Radiated emission measurements in MHz Semi-anechoic chamber Peak hold Plot Radiated emission measurements in MHz Semi-anechoic chamber 3 m Average Page 30 of 91
6 Test specification: Section (e)(1), Radiated emissions below 40 GHz Test procedure: ANSI C63.4, Sections 8.3.2, 13.2, 13.4 Plot Radiated emission measurements at frequency MHz Low channel (CW) Semi-anechoic chamber Peak hold Mid channel (CW) Page 31 of 91
7 Test specification: Section (e)(1), Radiated emissions below 40 GHz Test procedure: ANSI C63.4, Sections 8.3.2, 13.2, 13.4 Plot Radiated emission measurements at frequency MHz Low channel (CW) Semi-anechoic chamber Average Mid channel (CW) Page 32 of 91
8 Test specification: Section (e)(1), Radiated emissions below 40 GHz Test procedure: ANSI C63.4, Sections 8.3.2, 13.2, 13.4 Plot Radiated emission measurements from to MHz Low Channel (CW) Semi-anechoic chamber Peak Mid channel (CW) Page 33 of 91
9 Test specification: Section (e)(1), Radiated emissions below 40 GHz Test procedure: ANSI C63.4, Sections 8.3.2, 13.2, 13.4 Plot Radiated emission measurements from to MHz OATS Peak hold Page 34 of 91
10 Test specification: Section (e)(1), Radiated emissions below 40 GHz Test procedure: ANSI C63.4, Sections 8.3.2, 13.2, 13.4 Plot Radiated emission measurements from to MHz Low channel (CW) OATS Average (VBW = 30 khz) Mid channel (CW) Page 35 of 91
11 Test specification: Section (e)(1), Radiated emissions below 40 GHz Test procedure: ANSI C63.4, Sections 8.3.2, 13.2, 13.4 Plot Radiated emission measurements at frequency 38 GHz Semi-anechoic chamber Peak hold Plot Radiated emission measurements at frequency 38 GHz Semi-anechoic chamber Average Page 36 of 91
12 7.3 Out of band radiated emissions above 40 GHz up to 220 GHz General This test was performed to measure field strength of spurious emissions from the EUT. Specification test limits are given in Table Frequency, GHz Table Power density emission limits Power density at distance pw/cm2 Distance, m Field strength db(nv/m)*, peak Field strength db(nv/m)*, average ** 93.5** *** *** **** **** **** **** ** 95.8** **** **** *- The limit is provided in average values. **- The field strength was calculated as follows: [20 log (10 2 x Px1207c) + 120] db(µv/m) ***- The limit for 0.5 m test distance was calculated using the inverse square distance extrapolation factor as follows: LimS2 = LimS log (S1/S2), where S1 and S2 standard defined and test distance respectively in meters; ****- The limit for 0.08 m test distance was calculated using the inverse square distance extrapolation factor from the point of measurement to the edge of far field as follows: LimS3 = LimS log (S2/S3), where S2 and S3 the edge of far field boundary and test distance respectively in meters Test procedure for spurious emission field strength measurements The EUT was set up as shown in Figure 7.3.1, energized and the performance check was conducted The specified frequency range was investigated with antenna connected to spectrum analyzer/ EMI receiver. To find maximum radiation the turntable was rotated 360 0, the measuring antenna height was changed from 1 to 4 m, its polarization was switched from vertical to horizontal The test results are shown in the associated plots. Page 37 of 91
13 Figure Radiated emissions above 40 GHz test set up Photograph Setup for radiated emissions measurements above 40 GHz Page 38 of 91
14 Photograph Setup for radiated emissions measurements above 40 GHz, EUT close view Page 39 of 91
15 Table Out of band radiated emissions test results EUT POSITION: Typical (Vertical) MODULATION: FM MODULATING SIGNAL: Linear Chirp TRANSMITTER OUTPUT POWER: Maximum INVESTIGATED FREQUENCY RANGE: GHz RESOLUTION BANDWIDTH: 1000 khz VIDEO BANDWIDTH: z Resolution bandwidth TEST ANTENNA TYPE: Standard Gain Horn 25dB (40-60 GHz) Standard Gain Horn 25dB (50-75 GHz) Standard Gain Horn 25dB ( GHz) Standard Gain Horn 24dB ( GHz) Standard Gain Horn 25dB ( GHz Antenna Peak field strength(vbw=3 MHz) Average field strength(vbw=1 khz) Frequency, He g Azimuth, Measured, Limit, Margin, Measured, Limit, Margin, MHz Polariz. I ht, degrees* m db(µv/m) db(µv/m) I db** db(µv/m) db(µv/m) db** Low carrier frequency GHz No spurious emissions were found Mid carrier frequency GHz No spurious emissions were found High carrier frequency GHz No spurious emissions were found *- EUT front panel refer to 0 degrees position of turntable. **- Margin = Measured emission - specification limit. Verdict Pass Pass Pass NOTE: Spurious investigation was performed with EUT set to produce unmodulated carrier at the lowest, middle and highest carrier frequency and the peak values were measured. Then the EUT was configured to produce the normally modulated sweep and average values were measured at the specific spurious frequencies. Reference numbers of test equipment used HL 0747 HL 0770 HL 0771 HL 0772 HL 1303 HL 1312 HL 209 HL 3235 HL 3295 HL 3305 HL 3306 HL 3433 HL 3434 HL 3536 Full description is given in Appendix A Page 40 of 91
16 Plot Radiated emission measurements from 40 to 60 GHz ANTENNA Low carrier OATS Peak hold High carrier (CW) = GHz ~ R NOTE: All spurious emissions are imaginary products of the mixing process. Page 41 of 91
17 Plot Radiated emission measurements from 40 to 60 GHz ANTENNA Low carrier OATS Peak hold High carrier (CW) = GHz ~ R NOTE: All spurious emissions are imaginary products of the mixing process. Page 42 of 91
18 Plot Radiated emission measurements from 60 to 75 GHz Low carrier (CW) = GHz OATS Peak hold Mid carrier (CW) = GHz High carrier (CW) = GHz NOTE: All spurious emissions are imaginary products of the mixing process. Page 43 of 91
19 Plot Radiated emission measurements from 60 to 75 GHz Low carrier (CW) = GHz OATS VBW = 30 khz Mid carrier (CW) = GHz NOTE: All spurious emissions are imaginary products of the mixing process. Page 44 of 91
20 Plot Radiated emission measurements from 75 to 76 GHz Low carrier (CW) = GHz OATS Peak hold Mid carrier (CW) = GHz NOTE: All spurious emissions are imaginary products of the mixing process. Page 45 of 91
21 Plot Radiated emission measurements from 75 to 76 GHz Low carrier (CW) = GHz OATS Mid carrier (CW) = GHz VBW = 10 khz NOTE: All spurious emissions are imaginary products of the mixing process. Page 46 of 91
22 Plot Radiated emission measurements from 77 to 80 GHz Low carrier (CW) = GHz OATS Peak Mid carrier (CW) = GHz NOTE: All spurious emissions are imaginary products of the mixing process. Page 47 of 91
23 Plot Radiated emission measurements from 77 to 80 GHz Low carrier (CW) = GHz OATS VBW = 10 khz Mid carrier (CW) = GHz NOTE: All spurious emissions are imaginary products of the mixing process. Page 48 of 91
24 Plot Radiated emission measurements from 80 to 90 GHz Low carrier (CW) = GHz OATS Peak Mid carrier (CW) = GHz NOTE: All spurious emissions are imaginary products of the mixing process. Page 49 of 91
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