Integrating a PXI Automated Test System

Transcription

1 Integrating a PXI Automated Test System Top Considerations to Integrating a PXI Automated Test System Agilent Technologies Software and Modular Solutions Alan Lesko Application Engineer April 24 th, /24/2012

2 Agenda Top Considerations to Integrating a PXI Automated Test System Introduction #1: Automated test topologies #2: Switch technology and topologies #3: Instrument selection #4: PXI Chassis considerations #5: Power supply selection #6: Load management methods #7: PXI Controller and software infrastructure #8: Test executive make vs. buy? #9: Test system interface Summary 2

3 Introduction - Automated PXI test systems Heavily used in electronic functional test (EFT) Applying stimulus and measuring response for the purpose of validating proper operation of a device Industries: Industrial automation Automotive Communications Aerospace Consumer electronics Product lifecycle R&D Design Validation Manufacturing 3

4 Consideration #1: Automated test topologies Application test mode vs. DUT assisted test mode Application emulation Tester targeted for application DUT Assisted Test optimizes flexibility 4

5 Consideration #1: Automated test topologies Switching: Measurement, RF & Load Instrumentation: Measurement core High frequency Multichannel Serial Communications Load & power subsystem Utility DIO Test system interface Chassis & Controller* Software infrastructure* Automated systems constructed from all or part of these sections *Not shown in diagram 5

6 Consideration #2: Switch technology and topologies Common relay technologies Electromechanical Armature Relays Rugged, supports higher currents and voltages Low Resistance Slower switch speeds Armature Reed Relays High-speed switching Very low contact resistance Long mechanical life if not overstressed Reed FET Switches high-speed switching Very long lifetimes Higher on resistance Low voltage/current handling capability FET 6

7 Consideration #2: Switch technology and topologies Switching solutions take various forms Low frequency (up to 20Mhz) RF switches (up to 3Ghz) uw switches (up to 26.5Ghz) For more information see: 7

8 Consideration #2: Switch technology and topologies Measurement matrix low frequency precision measurements Single wire configuration: 1 relay per cross point Relay efficient Lower cost Dual wire configuration: 2 relays per cross point H-L run together Better bandwidth Lower noise Higher cost Instrumentation access Measurement Matrix architecture (16 x 4 x 32 shown) 4 wide abus interconnect single or dual wire H L H L 32 channels for DUT (expand as needed) 8

9 Consideration #3: Instrumentation selection Measurement core - DMM DC measurement traceability High speed low latency Edge triggering pre/post trigger captures Internal V & I source For more information see: M9181A, M9182A, M9183A 9

10 Consideration #3: Instrumentation selection Measurement core precision sources High resolution & voltage range Isolated and accurate Source V/Measure I & Source I/ Measure V Source I / Measure V Source V/ Measure I For more information see: M918xA combined with M9186A Source V/ Measure I 10

11 Consideration #3: Instrumentation selection Measurement core precision digitizer High resolution for quantitative results Triggering pre/post trigger samples High Z input and higher voltage 8 bit capture 16 bit capture For more information see: M918xA (15kS/sec ) M9216A (250kS/sec) L453xA (20Mhz LXI) 11

12 Consideration #3: Instrumentation selection Measurement core DAC s Remote sense Isolated outputs Voltage and current mode High voltage range For more information see: M9185A 8/16 channel DAC M9186A precision source 12

13 Consideration #3: Instrumentation selection Measurement core AWG s/dynamic DAC s Low frequency signals Sensor emulation For more information see: L4451A 4Ch dynamic DAC A & 33521A AWG 13

14 Consideration #3: Instrumentation selection High frequency instruments High frequency analyzers, AWG s & scopes One Box testers Cannot route through measurement matrix Use direct connect or RF/uW switching For more information see Agilent site for: M9210A 2/4GS/sec digitizer M9211A 4 GS/sec digitizer M9392A microwave receiver M9330A 1.25 GS/sec AWG E6607A EXT one box testers E5515C 8960 Wireless test set Assortment of SA s & SG s 14

15 Consideration #3: Instrumentation selection Multichannel instruments Simultaneous stimulus for application mode test Parallel testing for improved through-put May not be able to route through matrix Provide disconnect to prevent DUT loading For more information see: M9185A (8/16 channel) M9216A (8 channel w/ 4:1 MUX)

16 Consideration #4: Chassis selection Select for maximum flexibility Select chassis for future growth Hybrid slots to support PXI-1 to PXIe migration Engineered cooling improves test rack utilization Slot style hybrid for max flexibility Cooling and racking implications For more information see: M9018A PXIe chassis Webcast: PXI Multi-Vendor Interoperability 16

17 Consideration #5: Power supply selection Power supply speed, size & accuracy Must be fast for high throughput - Fast programming AND Fast settling External to PXI? Best if low profile & modular Small Flexible 4 Outputs, 1U Modular Mix-and-Match For more information see: N6700B with N675xA, N676x & N678x

18 Consideration #6: Load management methods Use load tray for high powered loads L o a d t r a y s t r u c t u r e l o c a t e d either in test system or fixture e x p a n d P B x as needed Current shunt R ~0. 05 ohm typically S w i t c h i n g o v e r - c u r r e n t protection if required current limiting resistors Load tray example D e v i c e Under Test ( D U T ) * t o D M M o r d i g i t i z e r via meas matrix m e a s u r e m e n t m a t r i x For more information see: E6191B Switch/Load Unit P o w e r B u s 2 ( P B 2 ) V b a t t P o w e r B u s 1 ( P B 1 ) G N D ( + ) To power supply ( - ) * s p e c i a l c a s e ; i n e v e n t o f v e r y h i g h c u r r e n t s c a n u s e f i x t u r e mounted disconnect. 18

19 Consideration #7: PXI Controller and software System controller - external or embedded? External PC Benefits: Highest CPU performance for the price Most flexible I/O solution More internal slot Larger memory Lots of choices and form-factors Embedded PC Benefits: Designed specifically for modular systems Supported by Agilent WW Transportable embedded solution Less rack space, compact size For more information see: 19

20 Consideration #7: PXI Controller and software Primary consideration for PXI driver support IVI-C or IVI-COM depending on environment LabVIEW G drivers and MATLAB drivers also important Make sure Soft Front Panels supported for debug Example programs to get you started PXI For more information see: 20

21 Consideration #7: PXI Controller and Software Software infrastructure operator & enterprise network Test Executive / Operator interface Agilent Application SW MATLAB Lab- Windows CVI Visual Studio C#, C/C++ VB.NET LabVIEW VEE Microsoft Office suite Signal Studio Waveform Editing VSA Jitter Generation Digital Debug Waveform analysis Programming Environment System Vue IVI-C,COM, LabVIEW G drivers, MATLAB, Soft Front Panels Hardware For more information see:

22 Consideration #8: Test Executive Valuable in high volume manufacturing Make vs. Buy? Agilent example products Agilent TestExecSL 22

23 Consideration #9: Test system interface Don t underestimate value of engineered interface Style Simple (DSUB or other) Engineered interconnect Advantages Low cost Easy to procure No special tooling Fast fixture change-out Higher interconnect capacity & life cycle Provides area for supplemental assemblies Supports fixture programming Variety of contact styles Panel mounted connector Engineered commercial interfaces Graphics for interfaces used with permission MAC Panel Corporation, Virginia Panel Corporation 23

24 Summary Consideration #1: Test system topologies Topologies for maximum re-use and flexible deployment Consideration #2: Switch technology and topologies Select correct switch technologies for your needs Consideration #3: Instrument selection Recognize instrumentation types: core, high frequency and multi-channel instruments Consideration #4: Chassis selection Select a PXIe chassis for greatest flexibility and future applications Consideration #5: Power supply selection Speed impacts to test through-put, commonly GPIB/LXI (external to PXI) Consideration #6: Load management methods Placing loads in fixture or system rack when needed for Application or DAT mode testing Consideration #7: PXI Controller and software infrastructure External vs. embedded, robust instrument drivers, IVI-C and IVI-COM drivers Consideration #8: Test executive Valuable for high volume manufacturing environments. Make vs. buy tradeoffs? Consideration #9: Test system interface Don t underestimate value of engineered interconnect 24

25 Questions?

26 Where Can I Get More Info on PXI? 1. Application notes, datasheets, flyers, whitepapers and more 2. YouTube Videos (Modular PXI & AXIe channel on AgilentTube) 3. Webcasts: : The Importance and Value of PXI Multi-vendor Interoperability Top Considerations to Integrating a PXI Automated Test System Optimizing PXI Modular Functional Test System Throughput Webcast Electronic Functional Test Best Practices Addressing the Challenges of Wideband Radar Signal Generation and Analysis

27 Need help? Integrating an automated test system can be overwhelming Additional resources: Training and application notes: See Agilent site: see control and automation section Standard platforms: See Agilent site: Find a partner: See Agilent site:

28 Thank you for attending!

29 Introduction - Automated PXI test systems Automated test strategies Application emulation mode Tests full operation- hardware & firmware Slowest testing Difficult to leverage Emulation test methodology Application emulation commonly used in development or burn-in testing DUT Assisted Test (DAT) Fastest method for high volume test Most Common & Most Reusable Embedded test code required Transactional test methodology DAT commonly used in manufacturing test 29