LK V xx Technical Datasheet

Transcription

1 LK V xx.5. Technical Datasheet

2 Performance: LK V 0.5., 5.5., 0.5. and 5.5. Accuracy Verification and Acceptance Tests ISO 060-:00 : maximum permissible length error Five different length gauges are measured three times in seven different locations on the CMM, 05 measurements in total. The shortest gauge is less than 0mm and longest at least 66% of the longest diagonal of the CMM, up to a maximum of m. The difference between the measured length and calibrated length, traceable to National Standards, is taken as the error. The error of all 05 measurements must not exceed the value quoted by the CMM manufacture. ISO 060-:00 : maximum permissible probing error A test sphere is measured using 5 touch points while in a single location on the CMM. The nominal diameter of the test sphere must be between 0mm and 50mm. All 5 touch points are used to calculate a best-fit sphere and the radial distance of each touch point to that sphere centre. The difference, between the minimum radial distance and maximum radial distance, must not exceed the value quoted by the CMM manufacture. ISO 060-4:000 MPE THP and MPE time : maximum permissible scanning error, and time taken to perform the test A test sphere is measured using 4 scans while in a single location on the CMM. The nominal diameter of the test sphere must be 5mm and calibrated sphere radius traceable to National Standards. All 4 scans are used to calculate a best-fit sphere and the radial distance of each measured point to that sphere centre. The maximum absolute difference, between the individual radial distances and calibrated sphere radius, must not exceed the MPE THP value quoted by the CMM manufacture. The time taken MPE THP to complete the test must be stated if the test results are to be considered valid. Tactile Probes EDD MS.0 Rev C Scanning 8- C (µm) according to ISO 060-:00 (µm, L/mm) according to ISO 060-:00 MPE THP/time (µm/s) according to ISO 060-4: C Probe System MPE THP/time MPE THP/time PH0MQ PLUS / TP0.8.+L/ L/75 - PH0MQ PLUS / TP00..+L/ L/75 - PH0.8.+L/ L/75 - Max. D Speed (mm/s) Max. D Acc (mm/s²) 4 PH0MQ PLUS / SP5M.9.+L/75 4./59.9.+L/75 4./59 5 SP L/75./ REVO / RSP..+L/75.0/ REVO / RSP..+L/75.0/ Standard environment temperature variation C/hour, C/8 hours, gradient C/metre (vertically and horizontally) Extended environment temperature variation C/hour, 5 C/4 hours, gradient C/metre Stylus assembly with standard force module, maximum length 0mm or maximum of g 4 Stylus assembly with SM5-/SH5-, maximum length 50mm 5 Stylus assembly for and length 50mm and diameter 8mm, for MPE THP/time length 80mm and diameter mm. 6 REVO tested with RSP50 module. DIN EN ISO derived test with helix scan at probe head angle A45B45, filtered to 0 UPR 7 REVO tested with RSP- probe. DIN EN ISO test with standard ISO scan path at probe head angle A45B45, filtered to 0 UPR Laser Scanners Multi-stylus 8- C (µm) derived from ISO 060-:00 (µm, L/mm) derived from ISO 060-:00 (µm) derived from ISO 060-5: C Probe System PH0MQ PLUS / LC5Dx.5 4.+L/ L/ PH0MQ PLUS / LC50Cx L/ L/ PH0MQ PLUS / LC60Dx L/ L/ PH0MQ PLUS / XC65Dx L/ L/ PH0MQ PLUS / XC65Dx-LS.0 4.+L/ L/75.0 Sphere measured using a single probe head position, δ sphere fit used for accuracy. Sphere measured using five probe head positions, maximum D deviation of all five fitted sphere centres used for accuracy.

3 Performance: LK V 40.5., 45.5., 50.5., and Tactile Probes EDD MS.0 Rev C /04/v` Scanning 8- C (µm) according to ISO 060-:00 (µm, L/mm) according to ISO 060-:00 MPE THP/time (µm/s) according to ISO 060-4: C Probe System MPE THP/time MPE THP/time PH0MQ PLUS / TP0.8.4+L/ L/75 - PH0MQ PLUS / TP00..4+L/ L/75 - PH0.8.4+L/ L/75 - Max. D Speed (mm/s) Max. D Acc (mm/s²) 4 PH0MQ PLUS / SP5M.9.4+L/75 4./ L/75 4./59 5 SP80.7.+L/75./ REVO / RSP.4.4+L/75.0/ REVO / RSP.6.4+L/75.0/ Standard environment temperature variation C/hour, C/8 hours, gradient C/metre (vertically and horizontally) Extended environment temperature variation C/hour, 5 C/4 hours, gradient C/metre Stylus assembly with standard force module, maximum length 0mm or maximum of g 4 Stylus assembly with SM5-/SH5-, maximum length 50mm 5 Stylus assembly for and length 50mm and diameter 8mm, for MPE THP/time length 80mm and diameter mm. 6 REVO tested with RSP50 module. DIN EN ISO derived test with helix scan at probe head angle A45B45, filtered to 0 UPR 7 REVO tested with RSP- probe. DIN EN ISO test with standard ISO scan path at probe head angle A45B45, filtered to 0 UPR Laser Scanners Multi-stylus 8- C (µm) derived from ISO 060-:00 (µm, L/mm) derived from ISO 060-:00 (µm) derived from ISO 060-5: C Probe System PH0MQ PLUS / LC5Dx L/ L/ PH0MQ PLUS / LC50Cx L/ L/ PH0MQ PLUS / LC60Dx L/ L/ PH0MQ PLUS / XC65Dx L/ L/ PH0MQ PLUS / XC65Dx-LS L/ L/75.0 Sphere measured using a single probe head position, δ sphere fit used for accuracy. Sphere measured using five probe head positions, maximum D deviation of all five fitted sphere centres used for accuracy.

4 Weights and Dimensions: LK V 0.5., 5.5., 0.5., 5.5., and Metric units Models X Strokes Y Overall dimensions Daylights Table Inserts Z A B C B B C C C D D Max. part (kg) (kg) tbc tbc For REVO, reduce the given stroke by 0mm and for PH0, reduce the given stroke by 60mm Imperial / English units Models X Strokes Y Overall dimensions Daylights Table Inserts Z A B C B B C C C D D Max. part (lb) (lb) tbc tbc For REVO, reduce the given stroke by 4.7 and for PH0, reduce the given stroke by.6

5 Technical Characteristics: LK V xx.5. X axis guideway Granite table incorporating integral dovetail section guideway Flatness to DIN 876/III grade 0 with threaded inserts M0 x.5 on a 50mm grid Y axis guideway Mono-crystalline alumina ceramic beam (96% aluminium oxide, 4% silica-magnesia-glass) Cross-section 75 x 0mm Z axis guideway Mono-crystalline alumina ceramic spindle with adjustable pneumatic counterbalance Cross-section 90 x 80mm Air bearings (all axes) Pre-loaded unique single orifice, multi-groove design with <5µm air gap and increased stiffness Motors DC servomotors with step-down gearing to all axes Friction drives Incorporating chrome plated hardened steel drive bar to the X and Z axis Large section, high yield stainless steel belt to Y axis Measuring system Renishaw linear encoder scales (gold on steel) with 0.µm resolution Scales bonded to granite/ceramic guideway, no separate thermal compensation required Temperature compensation Integrated temperature sensors for the machine with real-time temperature monitoring Re-positional temperature sensor for the component with real-time temperature monitoring Compensation of probe assembly applied direct to the stylus Air supply Minimum air supply pressure 6 bar (90 psi), air consumption minimum 5 NL/min (4.4 cfm) Acceptable vibration Maximum.7µm (peak-to-peak) over.5 to 90Hz range Optional pneumatic anti-vibration damping available (on-site retrofit possible) Power supply 5V/0A or 0V/A, 50 to 60Hz regulated to within +0% -5% Supported Probe Systems Motorised probe heads Touch-trigger probes Scanning probes/heads Laser probes Stylus/probe changers Approval Warranty Renishaw PH0MQ PLUS, PH0, REVO (RSP, RSP) Renishaw TP0, TP00, TP7M Renishaw SP5M (SM5- to SM5-5 inclusive), SP80 Nikon Metrology LC5Dx, LC50Cx, LC60Dx, XC65Dx, XC65DX-LS Renishaw MCR0, SCR00, SCP80, FCR5 (standalone and MRS mounted), ACR (MRS mounted) Full CE certification in accordance with harmonised standards: 006/95/EC (low voltage directive) 004/08/EC (electromagnetic directive) 006/4/EC (machinery directive) EN 98 :996+A :008 (safety of machinery: pneumatics) ISO 850:008 (safety of machinery: emergency stop) EN ISO 00:00 (safety of machinery: general principles of design) EN :006+A :009 (safety of machinery. electrical equipment of machines. general) EN :005 (electromagnetic immunity: general industrial) EN :007 (electromagnetic emissions: generic) months warranty as standard. Unique 0 year original accuracy guarantee as standard. Extended warranty also available, ask your Nikon Metrology provider for more information. Terms and conditions apply, see Nikon Metrology website for full details. NIKON METROLOGY NV Geldenaaksebaan 9 B-00 Leuven, Belgium phone: fax: info@nikonmetrology.com NIKON CORPORATION Shin-Yurakucho Bldg., -, Yurakucho -chome Chiyoda-ku, Tokyo 00-8 Japan phone: fax: NIKON METROLOGY EUROPE NV tel sales_europe@nikonmetrology.com NIKON METROLOGY GmbH tel sales_germany@nikonmetrology.com NIKON METROLOGY SARL tel sales_france@nikonmetrology.com NIKON METROLOGY, INC. tel sales_us@nikonmetrology.com us.nikonmetrology.com NIKON METROLOGY UK LTD. tel sales_uk@nikonmetrology.com NIKON INSTRUMENTS (SHANGHAI) CO.LTD. tel (Shanghai office) tel (Beijing office) tel (Guangzhou office) NIKON SINGAPORE PTE. LTD. tel NIKON MALAYSIA SDN. BHD tel NIKON INSTRUMENTS KOREA CO. LTD. tel NIKON INDIA PRIVATE LIMITED tel More offices and resellers at 0 Nikon Metrology. All rights reserved. All information is subject to change without prior notice. (Rev 05)