ILX pixel CCD Linear Image Sensor (B/W)

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1 VOUT VGG 8 Internal Structure Output amplifier S/H circuit D3 D4 D32 S S2 S3 S246 S247 S248 D33 D34 D3 D36 D37 D38 Clock plse generator/ Sample-and-hold pulse generator Readout gate CCD analog shift register Clock-drivers Mode selector SHSW 9 Readout gate pulse generator φrog 248-pixel CCD Linear Image Sensor (B/W) ILX Description The ILX is a rectangular reduction type CCD linear image sensor designed for bar code POS hand scanner and optical measuring equipment use. A built-in timing generator and clock-drivers ensure single V power supply for easy use. 22 pin DIP (Plastic) Features Number of effective pixels: 248 pixels Pixel size: 4 µm 2 µm (4 µm pitch) Single V power supply Ultra-high sensitivity Built-in timing generator and clock-drivers Built-in sample-and-hold circuit Maximum clock frequency: 2MHz Block Diagram Absolute Maximum Ratings Supply voltage 6 V Operating temperature to +6 C Storage temperature 3 to +8 C Pin Configuration (Top View) VOUT SHSW φclk VGG φclk 3 φrog Sony reserves the right to change products and specifications without prior notice. This information does not convey any license by any implication or otherwise under any patents or other right. Application circuits shown, if any, are typical examples illustrating the operation of the devices. Sony cannot assume responsibility for any problems arising out of the use of these circuits. E948-TE

2 ILX Pin Description Pin No Symbol VOUT SHSW φ CLK φ ROG VGG Signal output Switch (with S/H or without S/H) Clock pulse input V power supply V power supply Readout gate pulse input V power supply Output circuit gate bias V power supply V power supply V power supply Description Mode Description Mode in Use With S/H Without S/H Pin 4 (SHSW) Recommended Voltage Item Min. Typ. Max. Unit 4... V Input Clock Voltage Condition (Note) Item Min. Typ. Max. Unit VIH 4... V VIL. V Note) This is applied to the all pulses applied externally. (φ CLK, φ ROG) Item Symbol Min. Typ. Max. Unit Input capacity of φ CLK pin Cφ CLK pf 2

3 ILX Electro-optical Characteristics (Ta = 2 C, = V, Clock frequency: MHz, Light source = 32 K, IR cut filter: CM-S (t =. mm), Without S/H mode) Item Symbol Min. Typ. Max. Unit Remarks Sensitivity R 2 2 V/(lx s) Note Sensitivity 2 R2 8 V/(lx s) Note 2 Sensitivity nonuniformity PRNU.. % Note 3 Saturation output voltage VSAT.6.8 V Dark voltage average VDRK mv Note 4 Dark signal nonuniformity DSNU mv Note 4 Image lag IL % Note Dynamic range DR 267 Note 6 Saturation exposure SE.4 lx s Note 7 V current consumption I.. ma Total transfer efficiency TTE % Output impedance ZO 2 Ω Offset level VOS 2.8 V Note 8 Note). For the sensitivity test light is applied with a uniform intensity of illumination. 2. Light source: LED λ = 66nm 3. PRNU is defined as indicated below. Ray incidence conditions are the same as for Note. PRNU = (VMAX-VMIN)/2 (%) VAVE The maximum output of all the valid pixels is set to VMAX, the minimum output to VMIN and the average output to VAVE. 4. Integration time is ms.. Typical value is used for clock pulse and readout pulse. VOUT = mv. 6. DR = VSAT/VDRK. When optical integration time is shorter, the dynamic range sets wider because dark voltage is in proportion to optical integration time. 7. SE = VSAT/R 8. Vos is defined as indicated below. D3 D3 D32 S VOUT Vos 3

4 ILX Clock Timing Diagram (Without S/H mode) 288 or more clock pulses are required. VOUT φrog φclk 286 D D2 D3 D4 D D D D2 D3 D4 D3 D3 D32 S S2 S3 S4 S24 S246 S247 S248 D33 D34 D3 D36 D37 D Without S/H mode (4pin Æ ) Dummy signal (32 pixels) Optical black (8 pixels) Effective picture elements signal (248 pixels) -line output period (286 pixels) Dummy signal (6 pixels) 4

5 φrog φclk VOUT D D D2 D3 D4 D D9 D D D2 D3 D3 D3 D32 S S2 S3 S4 S24 S246 S247 S248 D33 D34 D3 D36 D37 D Dummy signal (33 pixels) Optical black (8 pixels) Effective picture elements signal (248 pixels) -line output period (287 pixels) Dummy signal (6 pixels) ILX Clock Timing Diagram (With S/H mode) 288 or more clock pulses are required.

6 ILX φ CLK Timing (For all modes) t t2 φclk t3 t4 Item φ CLK pulse rise/fall time φ CLK pulse duty (Note ) Symbol Min. Typ. Max. Unit t, t2 ns 4 6 % Note ) t4 / (t3 + t4) φ ROG, φ CLK Timing φrog t6 t7 t8 φclk t t9 Item φ ROG, φ CLK pulse timing φ ROG, φ CLK pulse timing 2 φ ROG pulse rise/fall time φ ROG pulse period Symbol Min. Typ. Max. Unit t 3 t9 3 t6, t8 ns t7 3 6

7 ILX φ CLK, VOUT Timing (Note ) (Note 3) φclk t t Vout Vout (Note 2) t2 Item φ CLK-VOUT φ CLK-VOUT 2 φ CLK-VOUT (with S/H) Symbol Min. Typ. Max. Unit t 4 28 t 2 2 ns t Note ) Note 2) Note 3) fck = MHz, φ CLK pulse duty = %, φ CLK pulse rise/fall time = ns Output waveform when internal S/H is in use. indicates the correspondence of clock pulse and data period. 7

8 H MTF Dark voltage rate Relative sensitivity ILX. Spectral sensitivity (Typ.) (Ta = 2 C) Wavelength (nm) MTF of main scanning direction (Typ.) Dark voltage rate vs. Ambient temperature (Typ.). Spatial frequency (cycles/mm) Normalized spatial frequency τ=6nm Ta Ambient temperature ( C) 8

9 VOS Offset level (V) VOS Offset level (V) Output voltag rate Current consumption rate ILX Output voltage rate vs. Integration time (Typ.) Current consumption rate vs. Clock frequency (Typ.) τ int Integration time (ms) Clock frequency (MHz) 3.2 Offset level vs. (Typ.) 3.2 Offset level vs. Ambient temperature (Typ.) (V) Ta Ambient temperature ( C) 9

10 VOUT SHSW fclk frog VGG ILX Application Circuit (Without S/H mode (Note)) µ/6v V Output signal 3KΩ + 2SA7 φclk φrog.µ 22µ/V Note) This circuit diagram is the case when internal S/H is not used. Application circuits shown are typical examples illustrating the operation of the devices. Sony cannot assume responsibility for any problems arising out of the use of these circuits or for any infringement of third party and other right due to same.

11 ILX Notes on Handling ) Static charge prevention CCD image sensors are easily damaged by static discharge. Before handling, be sure to take the following protective measures. a) Either handle bare handed or use non-chargeable gloves, clothes or material. Also use conductive shoes. b) When handling directly use an earth band. c) Install a conductive mat on the floor or working table to prevent the generation of static electricity. d) Ionized air is recommended for discharge when handling CCD image sensors. e) For the shipment of mounted substrates use cartons treated for the prevention of static charges. 2) Notes on handling CCD Cer-DIP package The following points should be observed when handling and installing this package. a) () Compressive strength: 39N/surface (Do not apply any load more than.7 mm inside the outer perimeter of the glass portion.) (2) Shearing strength: 29N/surface (3) Tensile strength: 29N/surface (4) Torsional strength:.9nm Upper ceramic layer 39N 29N 29N.9Nm Lower ceramic layer Low-melting glass () (2) (3) (4) b) In addition, if a load is applied to the entire surface by a hard component, bending stress may be generated and the package may fracture, etc., depending on the flatness of the ceramic portion. Therefore, for installation, either use an elastic load, such as a spring plate, or an adhesive. c) Be aware that any of the following can cause the glass to crack because the upper and lower ceramic layers are shielded by low-melting glass. () Applying repetitive bending stress to the external leads. (2) Applying heat to the external leads for an extended period of time with a soldering iron. (3) Rapid cooling or heating. (4) Applying a load or impact to a limited portion of the low-melting glass with a small-tipped tool such as tweezers. () Prying the upper or lower ceramic layers away at a support point of the low-melting glass. Note that the preceding notes should also be observed when removing a component from a board after it has already been soldered. 3) Soldering a) Make sure the package temperature does not exceed 8 C. b) Solder dipping in a mounting furnace causes damage to the glass and other defects. Use a grounded 3W soldering iron and solder each pin in less than 2 seconds. For repairs and remount, cool sufficiently. c) To dismount image sensors, do not use a solder suction equipment. When using an electric desoldering tool, ground the controller. For the control system, use a zero cross type.

12 ILX 4) Dust and dirt protection a) Operate in clean environments. b) Do not either touch glass plates by hand or have any object come in contact with glass surfaces. Should dirt stick to a glass surface blow it off with an air blower. (For dirt stuck through static electricity, ionized air is recommended.) c) Clean with a cotton bud and ethyl alcohol if the glass surface is grease stained. Be careful not to scratch the glass. d) Keep in case to protect from dust and dirt. To prevent dew condensation, preheat or precool when moving to a room with great temperature differences. ) Exposure to high temperature or humidity will affect the characteristics. Accordingly avoid storage or usage in such conditions. 6) CCD image sensors are precise optical equipment that should not be subject to mechanical shocks. 7) Make sure the input pulse should not be - V or below. 8) Normal output signal is not obtained immediately after device switch on. Use the output signal added 22 pulses or above to φ CLK clock pulse. 2

13 4. ± ±.. ±.. ±. 9. (AT STAND OFF).6 to 9 ILX Package Outline Unit : mm 22pin DIP (4mil) 6.46 ± ± (4µm 248Pixels) 22 2 V H No. Pixel The height from the bottom to the sensor surface is 2.4 ±.3mm. 2. The thickness of the cover glass is.8mm, and the refractive index is M PACKAGE STRUCTURE PACKAGE MATERIAL LEAD TREATMENT LEAD MATERIAL PACKAGE WEIGHT Cer-DIP TIN PLATING 42 ALLOY.2g 3

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