Comments, if any, may please made in the format indicated and mailed to the undersigned at address given below.

Transcription

1 DOCUMENT DESPATCH ADVICE DRAFTS IN WIDE CIRCULATION Ref : Date LITD 24/T TECHNICAL COMMITTEE : LITD 24 ADDRESSED TO: 1. All members of Magnetic Components, Ferrite Materials Piezoelectric and Frequency Control Device Sectional Committee, LITD All Principal Members of Electronics and Information Technology Department, LITDC 3. All others interested Dear Sir(s), Please find enclosed the documents listed in the Annex. Kindly examine the draft standard and forward your comments stating any difficulties which you are likely to experience in your business or profession, if this is finally adopted as National Standards. Last Date for comments: Comments, if any, may please made in the format indicated and mailed to the undersigned at address given below. In case no comments are received or comments received are of editorial nature, you may kindly permit us to presume your approval for the above document as finalized. However, in case of comments of technical in nature are received then it may be finalized either in consultation with the Chairman, Sectional Committee or referred to the Sectional committee for further necessary action if so desired by the Chairman, Sectional Committee. This document is identical with corresponding ISO/IEC Standard and is not attached with this letter. For considering comments on the document corresponding ISO/IEC Standard may be referred. In case a copy of ISO/IEC standard is required, please send request by mail. Thanking you, Yours faithfully, Encl: As above (D. Goswami) Sc `F & Head (Electronics and IT) hlitd@bis.org.in litd@bis.org.in

2 ANNEX Sl. No. Document No Title 1 LITD 24 (3526) /IEC :2010 Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections 2 LITD 24 (3527) /IEC : 2010 Ferrite cores - Dimensions - Part 2: Pot-cores for use in telecommunications, power supply, and filter applications 3 LITD 243 (3528) /IEC :2007 Quartz crystal controlled oscillators of assessed quality Part 1: Generic specification 4 LITD 24 (3529) /IEC : 2002 Terms and nomenclature for cores made of magnetically soft ferrites - Part 1: Terms used for physical irregularities 5 LITD 24 (3530) /IEC : 2009 Terms and nomenclature for cores made of magnetically soft ferrites - Part 2: Reference of dimensions 6 LITD 24(3531) /IEC :2003 Terms and nomenclature for cores made of magnetically soft ferrites - Part 3: Guidelines on the format of data appearing in manufacturers' catalogues of transformer and inductor cores 7 LITD 24 (3532) /IEC : 2005 Laminations for transformers and inductors - Part 1: Mechanical and electrical characteristics 8 LITD 24 (3533) /IEC :1993 Laminations for transformers and inductors for use in telecommunication and electronic equipment - Part 2: Specification for the minimum permeabilities of laminations made of soft magnetic metallic materials

3 य पक पर च लन मस द रलख रषण स ञ पन स द भ तकन क सम तत : एलआईट ड 24 एलआईट ड 13/ट 1-8 ददन क क य घटक, फ इट स मर, प ज इल र क औ आव त ननय रण उपक ण प न व ल क न म: 1) चब ववषय सममन एल आई ट ड 24 क स सद य, 2) ह दय(य ) 3) इलर ननक एव सच न र य ग क वव पर षद क रध न सद य गच खन व ल अ य क पय स ल नक स ल न रÏलêख क अवल कन कर : क पय इन स द क अवल कन कर और अपन स ततय, यह बत त ह ए कक यदद यह भ रत य नक रक म त ह त अ ल करन आप क यवस य य कद न ईय आ सकत ह, भज स ततय भजन क अ तत ततथ यदद क ई स तत र त नह ह त ह अ व स तत कवल स प दक य स ब य वत अ तत प ददय ज यग द ट ह ई त पपर त रलख क यदद क ई स तत तकन क रक तत क ह ई त वयय सम तत क अ य क पर श स अ व पनक इ छ पर आग क क य व ह क मलए वयय सम तत क भज ज न क ब द रलख क अ तत प द ददय ज एग यह स द आईईस नक क स प ह आईईस नक प क स स ल न नह ह अगर स तत भजन क मलए अन प आईईस नक क आव यकत पडन पर आईईस नक तन नमलखखत ल पत स रतत गव सकत ह यदद क ई स ततय क ऊपर तनम त ह त क पय अ ह त र क तन नमलखखत ल पत पर स ल न फ ट भज द यव द, भवद य, (ड.ग व ) स ल नक : पपर त hlitd@bis.org.in/litd@bis.org.in व.एफ एव र ख (इल र तनक व आई ट ) ई ल:

4 स ल नक र. स. श षभक ÖÏ»Öê Ö ÃÖÓ µöö 1 एलआईट ड 24(3526) लय ककत ग णत क व ट ज़ क टल इक ई भ ग 3 नक रख 2 एलआईट ड 24 (3527) /आईईस (2010) फर एट क र आय भ ग 2 दर स च र, प वर स ल ई एव कफलटर अन रय ग रय ग प ट क र 3 एलआईट ड 24 (3528) लय ककत ग णत क व ट ज़ क टल तनय र त द मलत 4 एलआईट ड 24 (3529) /आईईस (2002) च बक य प स द फर इट स बन क र हत त एव न वल भ ग 1 भ ततक अतनयम तत ओ हत रय त त 5 एलआईट ड 24 (3530) /आईईस (2009) च बक य प स द फर इट स बन क र हत त एव न वल भ ग 2 आय क स दभ 6 एलआईट ड 24 (3531) च बक य प स द फर इट स बन क र हत त एव न वल 7 8 /आईईस (2010) /आईईस (2007) एव ल ड कन न भ ग 1 जनररक वम टट /आईईस (2003) भ ग 3 र सफ र एव इ ड ट क र क तन णकत कटल ग पर लष त एलआईट ड 24 (3532) र सफ र एव इ ड टर हत लम न न भ ग 1 य र क य एव व य त य /आईईस (2005) एलआईट ड 24 (3533) /आईईस (1993) आ कड क फ ट स ब ग द मस त अमभल ण दर स च र एव व यत य पपकरण रय ग र सफ र एव इ ड टर हत लम न न भ ग 2 द च बक य त स थ य स बन लम न न क य नत प रग यत क वम टट

5 IEC : 2010 Doc. No : LITD 24 (3526) भ रत य म नक मल य क त गण तय वय ट ज़ क ल इ यई भयग 3 मयन र खय एव ल ड न शन Indian Standard QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY PART 3 STANDARD OUTLINES AND LEAD CONNECTIONS ICS BIS 2015 BUREAU OF INDIAN STANDARDS MANAK BHAVAN, 9 BAHADUR SHAH ZAFAR MARG NEW DELHI Jan 2015 Price Group

6 Magnetic Components, Ferrite materials, Piezoelectric and Frequency control devices Sectional Committee LITD 24 NATIONAL FOREWORD This Indian Standard (Part 3) which is identical with IEC :2010 Quartz crystal units of assessed quality Part 3: Standard outlines and lead connections issued by the the International Organization for Standardization (ISO) and International Electrotechnical Commission (IEC) jointly was adopted by the Bureau of Indian Standards on the recommendations of Information and Communication Technology, Sectional Committee and approval of the Electronics and Information Technology Division Council. The text of the ISO/IEC standard has been approved as suitable for publication as Indian Standard without deviations. Certain conventions are, however, not identical to those used in Indian Standards. Attention is particularly drawn to the following a) Wherever the words International Standard appear referring to this standard, they should be read as Indian Standard. b) Comma (,) has been used as a decimal marker while in Indian Standards, the current practice is to use a point (.) as the decimal marker. For the purpose of deciding whether a particular requirement of this standard is complied with, the final value, observed or calculated, expressing the result of a test or analysis, shall be rounded off in accordance with IS 2:1960 Rules for rounding off numerical values (revised). The number of significant places retained in the rounded off value should be the same as that of the specified value in this standard.

7 IEC : 2002 Doc. No : LITD 24 (3529) भ रत य म नक च बक य प स मद फ र इट स बन क र ह त शत एव न म वल भ ग 1 भ ततक अतनयममतत ओ ह त रय त शत Indian Standard TERMS AND NOMENCLATURE FOR CORES MADE OF MAGNETICALLY SOFT FERRITES PART 1 TERMS USED FOR PHYSICAL IRREGULARITIES ICS BIS 2015 BUREAU OF INDIAN STANDARDS MANAK BHAVAN, 9 BAHADUR SHAH ZAFAR MARG NEW DELHI Jan 2015 Price Group

8 Magnetic Components, Ferrite materials, Piezoelectric and Frequency control devices Sectional Committee LITD 24 NATIONAL FOREWORD This Indian Standard (Part 1) which is identical with IEC :2002 Terms and nomenclature for cores made of magnetically soft ferrites Part 1: Terms used for physical irregularities issued by the the International Organization for Standardization (ISO) and International Electrotechnical Commission (IEC) jointly was adopted by the Bureau of Indian Standards on the recommendations of Information and Communication Technology, Sectional Committee and approval of the Electronics and Information Technology Division Council. The text of the ISO/IEC standard has been approved as suitable for publication as Indian Standard without deviations. Certain conventions are, however, not identical to those used in Indian Standards. Attention is particularly drawn to the following a) Wherever the words International Standard appear referring to this standard, they should be read as Indian Standard. b) Comma (,) has been used as a decimal marker while in Indian Standards, the current practice is to use a point (.) as the decimal marker. For the purpose of deciding whether a particular requirement of this standard is complied with, the final value, observed or calculated, expressing the result of a test or analysis, shall be rounded off in accordance with IS 2:1960 Rules for rounding off numerical values (revised). The number of significant places retained in the rounded off value should be the same as that of the specified value in this standard.

9 IEC : 2009 Doc. No : LITD 24 (3530) भ रत य म नक च बक य प स मद फ र इट स बन क र ह त शत एव न म वल भ ग 2 आय म क स दभभ Indian Standard TERMS AND NOMENCLATURE FOR CORES MADE OF MAGNETICALLY SOFT FERRITES PART 2 REFERENCE OF DIMENSIONS ICS BIS 2015 BUREAU OF INDIAN STANDARDS MANAK BHAVAN, 9 BAHADUR SHAH ZAFAR MARG NEW DELHI Jan 2015 Price Group

10 Magnetic Components, Ferrite materials, Piezoelectric and Frequency control devices Sectional Committee LITD 24 NATIONAL FOREWORD This Indian Standard (Part 2) which is identical with IEC :2009 Terms and nomenclature for cores made of magnetically soft ferrites Part 2: Reference of dimensions issued by the the International Organization for Standardization (ISO) and International Electrotechnical Commission (IEC) jointly was adopted by the Bureau of Indian Standards on the recommendations of Information and Communication Technology, Sectional Committee and approval of the Electronics and Information Technology Division Council. The text of the ISO/IEC standard has been approved as suitable for publication as Indian Standard without deviations. Certain conventions are, however, not identical to those used in Indian Standards. Attention is particularly drawn to the following a) Wherever the words International Standard appear referring to this standard, they should be read as Indian Standard. b) Comma (,) has been used as a decimal marker while in Indian Standards, the current practice is to use a point (.) as the decimal marker. The technical committee has reviewed the provisions of following International Standards referred in this adopted standard and has decided that they are acceptable for use in conjunction with this standard. For undated references, the latest edition of the referenced document applies, including any corrigenda and amendment. International Standard IEC (all parts) Title Ferrite cores Dimensions For the purpose of deciding whether a particular requirement of this standard is complied with, the final value, observed or calculated, expressing the result of a test or analysis, shall be rounded off in accordance with IS 2:1960 Rules for rounding off numerical values (revised). The number of significant places retained in the rounded off value should be the same as that of the specified value in this standard.

11 IEC : 2003 Doc. No : LITD 24 (3531) भ रत य म नक च बक य प स मद फर इट स बन क र हत शत एव न म वल भ ग 3 सफ ममर एव इड ट क र क ननम मणकत म कटल ग म पर लष त आकड क फ म ट सबध मगमदश सस त Indian Standard TERMS AND NOMENCLATURE FOR CORESMADE OF MAGNETICALLY SOFT FERRITES PART 3 GUIDELINES ON THE FORMAT OF DATA APPEARING IN MANUFACTURERS' CATALOGUES OF TRANSFORMER AND INDUCTOR CORES ICS BIS 2015 BUREAU OF INDIAN STANDARDS MANAK BHAVAN, 9 BAHADUR SHAH ZAFAR MARG NEW DELHI Jan 2015 Price Group

12 Magnetic Components, Ferrite materials, Piezoelectric and Frequency control devices Sectional Committee LITD 24 NATIONAL FOREWORD This Indian Standard (Part 3) which is identical with IEC :2003 Terms and nomenclature for cores made of magnetically soft ferrites Part 3: Guidelines on the format of data appearing in manufacturers' catalogues of transformer and inductor cores issued by the the International Organization for Standardization (ISO) and International Electrotechnical Commission (IEC) jointly was adopted by the Bureau of Indian Standards on the recommendations of Information and Communication Technology, Sectional Committee and approval of the Electronics and Information Technology Division Council. The text of the ISO/IEC standard has been approved as suitable for publication as Indian Standard without deviations. Certain conventions are, however, not identical to those used in Indian Standards. Attention is particularly drawn to the following a) Wherever the words International Standard appear referring to this standard, they should be read as Indian Standard. b) Comma (,) has been used as a decimal marker while in Indian Standards, the current practice is to use a point (.) as the decimal marker. The technical committee has reviewed the provisions of following International Standards referred in this adopted standard and has decided that they are acceptable for use in conjunction with this standard. For undated references, the latest edition of the referenced document applies, including any corrigenda and amendment. International Standard IEC 61332:1995 IEC 61604:1997 Title Soft ferrite material classification Dimensions of uncoated ring cores of magnetic oxides IEC :2002 Cores made of soft magnetic materials Measuring methods Part 1: Generic specification IEC Cores made of soft magnetic materials Measuring methods Part 2: Magnetic properties at low excitation level IEC :2000, Cores made of soft magnetic materials Measuring methods Part 3: Magnetic properties at high excitation level For the purpose of deciding whether a particular requirement of this standard is complied with, the final value, observed or calculated, expressing the result of a test or analysis, shall be rounded off in accordance with IS 2:1960 Rules for rounding off numerical values (revised). The number of significant places retained in the rounded off value should be the same as that of the specified value in this standard.

13 IEC : 2007 Doc. No : LITD 24 (3528) भ रत य म नक मल य क त गण तय वय ट ज़ क ल न र त द ललत भयग 1 ज र ववल ट Indian Standard QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY PART 1 GENERIC SPECIFICATION ICS BIS 2015 BUREAU OF INDIAN STANDARDS MANAK BHAVAN, 9 BAHADUR SHAH ZAFAR MARG NEW DELHI Jan 2015 Price Group

14 Magnetic Components, Ferrite materials, Piezoelectric and Frequency control devices Sectional Committee LITD 24 NATIONAL FOREWORD This Indian Standard (Part 1) which is identical with IEC :2007 Quartz crystal controlled oscillators of assessed quality Part 1: Generic specification' catalogues of transformer and inductor cores issued by the the International Organization for Standardization (ISO) and International Electrotechnical Commission (IEC) jointly was adopted by the Bureau of Indian Standards on the recommendations of Information and Communication Technology, Sectional Committee and approval of the Electronics and Information Technology Division Council. The text of the ISO/IEC standard has been approved as suitable for publication as Indian Standard without deviations. Certain conventions are, however, not identical to those used in Indian Standards. Attention is particularly drawn to the following a) Wherever the words International Standard appear referring to this standard, they should be read as Indian Standard. b) Comma (,) has been used as a decimal marker while in Indian Standards, the current practice is to use a point (.) as the decimal marker. In this adopted standard, reference appears to certain International Standards for which Indian Standards also exist. The corresponding Indian Standards which are to be substituted in their respective places are listed below along with their degree of equivalence for the editions indicated: International Standard Corresponding Indian Standard Degree of Equivalence IEC :1988, Environmental testing Part 1: General and guidance Amendment 1 (1992) IS 9000(Part 1):1988 Basic environmental testing procedures for electronic and electrical items: Part 1 General (first revision) IEC , Environmental testing Part 2: Tests Tests A: Cold IS 9000(Part 2/Sec 1):1977 Basic environmental testing procdures for electronic and electrical items: Part2 Cold test, Sec 1 General IEC , Environmental testing Part 2: Tests Tests B: Dry heat IS 9000(Part 3/Sec 1):1977 Basic environmental testing procedures for electronic and electrical items: Part 3 Dry heat test, Sec 1 General

15 IEC , Environmental testing Part 2: Tests Test Fc: Vibration (sinusoidal) IS 9000(Part 8):1981 Basic environmental testing procedures for electronic and electrical items: Part 8 Vibration (sinusoidal) test IEC , Environmental testing Part 2: Tests Test Ga and guidance: Acceleration, steady state IS 9000(Part 9):1984 Basic environmental testing procedures for electronic and electrical items: Part 9 Acceleration (steady state) IEC , Environmental testing IS 9000(Part 10):1979 Part 2-10: Tests Test J and Basic environmental testing procedures guidance: Mould growth for electronic and electrical items: Part 10 Mould growth test IEC , Environmental testing IS 9000(Part 13):1981 Basic Part 2: Tests Test M: Low air environmental testing procedures for pressure electronic and electrical items: Part 13 Low air pressure test IEC , Environmental testing IS 9000(Part 14/Sec 1):1988 Part 2: Tests Test N: Change of Basic environmental testing procedures temperature for electronic and electrical items:pt 14 Test N:Change of temp., Sec 1 Test Na: Rapid change of temperature(thermal shock)with prescribed time of TransitionTwo chamber method(first revision) IEC , Environmental testing IS 9000(Part 15/Sec 1):1982 Part 2: Tests Test Q: Sealing Basic environmental testing procedures for electronic and electrical items: Part 15 Sealing test, Sec 1 General IEC , Environmental testing IS 9000(Part 18/Sec 1):1981 Part 2: Tests Test T: Soldering Basic environmental testing procedures for electronic and electrical items:part18 Solderability test, Sec 1 Solderability of wire and tag terminations IEC , Environmental testing Part 2-21: Tests Test U: Robustness of terminations and integral mounting devices IS 9000(Part 19/Sec 1):1986 Basic environmental testing procedures for electronic and electrical items: Part 19 Test U: Robustness of terminations and integral mounting devices, Sec 1 Test Ua1: Tensile (first revision)

16 IEC , Environmental testing IS 9001(Part 17/Sec 1):2000 Guidance for Part 2: Tests Test Ea and guidance: environmental testing: Part 17 Impact test, Shock Sec 1 Shock test (First revision) IEC , Environmental testing IS 9001(Part 17/Sec 2):1985 Part 2: Tests Test Eb and guidance: Guidance for environmental testing: Part Bump 17 Impact test, Section 2 Bump test IEC , Environmental testing IS 9000(Part 5/Sec 2):1981 Basic Part 2-30: Tests Test Db: Damp environmental testing procedures for heat, cyclic (12h + 12 h cycle) electronic and electrical items: Part 5 Damp heat (cyclic) test, Sec h cycle IEC , Environmental testing IS 9000(Part 7/Sec 4):1979 Basic Part 2: Tests Test Ed: Free fall environmental testing procedures for electronic and electrical items: Part 7 Impact test, Sec 4 Free fall IEC :2001, Environmental testing Part 2-78: Tests Test Cab: Damp heat, steady state IS 9000(Part 4):2008 Basic environmental testing procedures for electronic and electrical items: Part 4 Damp heat (steady state) (First Revision) IEC :1987, Pulse techniques and apparatus Part 1: Pulse terms and definitions IS 14501(Part 1):1998 Pulse techniques and apparatus Part 1 Pulse terms and definitions IEC , Electromagnetic compatibility (EMC) Part 4-2: Testing and measurement techniques Electrostatic discharge immunity test IS 14700(Part 4/Sec 2):2008 Electromagnetic compatibility (EMC) Part 4: Testing and measurement techniques Section 2: Electrostatic discharge immunity test (First Revision) Identical IECQ 01, IEC Quality Assessment System for Electronic Components (IECQ) Basic Rules ISQC : 2000 IEC quality assessment system for electronic components (IECQ) - Rules of procedure Part 1: Administration (First revision) Identical IEC QC :1998, IEC Quality Assessment System for Electronic Components (IECQ) Rules of Procedure Part 2: Documentation ISQC : 2000 IEC quality assessment system for electronic components (IECQ) - Rules of procedure Part 2: Documentation (First revision) Identical

17 IEC QC :1998, IEC Quality Assessment System for Electronic Components (IECQ) Rules of Procedure Part 3:Approval procedures ISQC : 2000 IEC quality assessment system for electronic components (IECQ) - Rules of procedure Part 3: Approval Procedures (First revision) Identical The technical committee has reviewed the provisions of following International Standards referred in this adopted standard and has decided that they are acceptable for use in conjunction with this standard. For undated references, the latest edition of the referenced document applies, including any corrigenda and amendment. International Standard IEC (all parts) IEC IEC IEC IEC IEC IEC DB 2001 IEC ISO 1000 ITU-T G.810 ITU-T G.811 ITU-T G.812 ITU-T G.813 ITU-T G.825 ANSI T1.101 ANSI T Title Letter symbols to be used in electrical technology International Electrotechnical Vocabulary (IEV) Part 561: Piezoelectric devices for frequency control and selection Environmental testing Part 2: Tests Test XA and guidance: Immersion in cleaning solvents Environmental testing Part 2: Tests Test Kb: Salt mist, cyclic (sodium chloride solution) Environmental testing Part 2-58: Tests Test Td: Test methods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD) Environmental testing Part 2: Test methods Test Fh: Vibration,broad-band random (digital control) and guidance Graphical symbols for diagrams Quartz crystal controlled oscillators of assessed quality Part 5: Sectional specification Qualification approval SI units and recommendations for the use of their multiples and of certain other units Definitions and terminology for synchronization networks Timing characteristics of primary reference clocks Timing requirements of slave clocks suitable for use as node clocks in synchronization networks Timing characteristics of SDH equipment slave clocks (SEC) The control of jitter and wander within digital networks which are based on the synchronous digital hierarchy (SDH) Synchronization Interface Standard Synchronous Optical Network (SONET) Jitter and Wander at Network Equipment Interfaces

18 ETSI EN (all parts) Telcordia GR-253, Transmission and Multiplexing (TM); Generic requirements for synchronization networks Synchronous Optical Network (SONET) Transport Systems: Common Generic Criteria For the purpose of deciding whether a particular requirement of this standard is complied with, the final value, observed or calculated, expressing the result of a test or analysis, shall be rounded off in accordance with IS 2:1960 Rules for rounding off numerical values (revised). The number of significant places retained in the rounded off value should be the same as that of the specified value in this standard.

19 IEC : 2005 Doc. No : LITD 24 (3532) भ रत य म नक रसफर मर एव इड टर ह त ल म नशन भरग 1 यरर क य एव वव यत य अमभलषण Indian Standard LAMINATIONS FOR TRANSFORMERS AND INDUCTORS PART 1 MECHANICAL AND ELECTRICAL CHARACTERISTICS ICS BIS 2015 BUREAU OF INDIAN STANDARDS MANAK BHAVAN, 9 BAHADUR SHAH ZAFAR MARG NEW DELHI Jan 2015 Price Group

20 Magnetic Components, Ferrite materials, Piezoelectric and Frequency control devices Sectional Committee LITD 24 NATIONAL FOREWORD This Indian Standard (Part 1) which is identical with IEC :2005 Laminations for transformers and inductors Part 1: Mechanical and electrical characteristics' catalogues of transformer and inductor cores issued by the the International Organization for Standardization (ISO) and International Electrotechnical Commission (IEC) jointly was adopted by the Bureau of Indian Standards on the recommendations of Information and Communication Technology, Sectional Committee and approval of the Electronics and Information Technology Division Council. The text of the ISO/IEC standard has been approved as suitable for publication as Indian Standard without deviations. Certain conventions are, however, not identical to those used in Indian Standards. Attention is particularly drawn to the following a) Wherever the words International Standard appear referring to this standard, they should be read as Indian Standard. b) Comma (,) has been used as a decimal marker while in Indian Standards, the current practice is to use a point (.) as the decimal marker. The technical committee has reviewed the provisions of following International Standards referred in this adopted standard and has decided that they are acceptable for use in conjunction with this standard. For undated references, the latest edition of the referenced document applies, including any corrigenda and amendment. International Standard IEC 60050(221) IEC :2000 IEC : 1998 IEC :1997 IEC : 1999, Title International Electrotechnical Vocabulary (IEV) Chapter 221: Magnetic materials and components Magnetic materials Part 1: Classification Magnetic materials Part 84: Specifications for individual materials Coldrolled non oriented electrical steel sheet and strip delivered in the fully processed state Magnetic materials Part 87: Specifications for individual materials Coldrolled grain oriented electrical steel sheet and strip delivered in the fully processed state Magnetic materials Part 11: Method of test for the determination of surface insulation resistance of magnetic sheet and strip

21 IEC :1990 IEC :1995 ISO 2861:1988, Laminated core packages for transformers and inductors used in telecommunication and electronic equipment Part 1: Dimensions Laminated core packages for transformers and inductors used in telecommunication and electronic equipment Part 2: Electrical characteristics for cores using YEE 2 laminations ISO system of limits and fits Part 1: Bases of tolerances, deviations and fits For the purpose of deciding whether a particular requirement of this standard is complied with, the final value, observed or calculated, expressing the result of a test or analysis, shall be rounded off in accordance with IS 2:1960 Rules for rounding off numerical values (revised). The number of significant places retained in the rounded off value should be the same as that of the specified value in this standard.

22 IEC : 1993 Doc. No : LITD 24 (3533) भ रत य म नक दर स च र एव वव यत य उपकरण म रय ग थ सफ मथर एव इ ड टर ह त ल ममनशन भ ग 2 मद बक य ध त स मर य स बन ल ममनशन क यन तम च प रग यत क ववमश टट Indian Standard LAMINATIONS FOR TRANSFORMERS ANDINDUCTORS FOR USE IN TELECOMMUNICATIONAND ELECTRONIC EQUIPMENT PART 2 SPECIFICATION FOR THE MINIMUM PERMEABILITIES OF LAMINATIONS MADE OF SOFT MAGNETIC METALLIC MATERIALS ICS BIS 2015 BUREAU OF INDIAN STANDARDS MANAK BHAVAN, 9 BAHADUR SHAH ZAFAR MARG NEW DELHI Jan 2015 Price Group

23 Magnetic Components, Ferrite materials, Piezoelectric and Frequency control devices Sectional Committee LITD 24 NATIONAL FOREWORD This Indian Standard (Part 2) which is identical with IEC :1993 Laminations for transformers and inductors for use in telecommunication and electronic equipment Part 2: Specification for the minimum permeabilities of laminations made of soft magnetic metallic materials issued by the the International Organization for Standardization (ISO) and International Electrotechnical Commission (IEC) jointly was adopted by the Bureau of Indian Standards on the recommendations of Information and Communication Technology, Sectional Committee and approval of the Electronics and Information Technology Division Council. The text of the ISO/IEC standard has been approved as suitable for publication as Indian Standard without deviations. Certain conventions are, however, not identical to those used in Indian Standards. Attention is particularly drawn to the following a) Wherever the words International Standard appear referring to this standard, they should be read as Indian Standard. b) Comma (,) has been used as a decimal marker while in Indian Standards, the current practice is to use a point (.) as the decimal marker. In this adopted standard, reference appears to certain International Standards for which Indian Standards also exist. The corresponding Indian Standards which are to be substituted in their respective places are listed below along with their degree of equivalence for the editions indicated: International Standard IEC 740: 1982, Laminations for transformers and inductors for use in telecommunication and electronic equipment Amendment 1 (1991) Corresponding Indian Standard IS 11794:1986 Laminations for transformers and inductors for use in telecommunication and electronic equipment. Degree of Equivalence equivalent The technical committee has reviewed the provisions of following International Standards referred in this adopted standard and has decided that they are acceptable for use in conjunction with this standard. For undated references, the latest edition of the referenced document applies, including any corrigenda and amendment.

24 International Standard IEC 404-1: 1979 IEC : 1986 ISO 3: 1973 Title Magnetic materials - Part 1: Classification Magnetic materials - Part 8: Specifications for individual materials Section 6: Soft magnetic metallic materials Amendment 1 (1992) Preferred numbers - Series of preferred numbers For the purpose of deciding whether a particular requirement of this standard is complied with, the final value, observed or calculated, expressing the result of a test or analysis, shall be rounded off in accordance with IS 2:1960 Rules for rounding off numerical values (revised). The number of significant places retained in the rounded off value should be the same as that of the specified value in this standard.

25 IEC : 2010 Doc No : LITD 24 (3527) भ रत य म नक फ र एट क र आय म भ ग 2 दर स च र, प वर स ल ई एव फफ टर अनर य ग म रय ग थ प ट क र Indian Standard FERRITE CORES DIMENSIONS PART 2 POT-CORES FOR USE IN TELECOMMUNICATIONS, POWER SUPPLY, AND FILTER APPLICATIONS ICS BIS 2015 BUREAU OF INDIAN STANDARDS MANAK BHAVAN, 9 BAHADUR SHAH ZAFAR MARG NEW DELHI Jan 2015 Price Group

26 Magnetic Components, Ferrite materials, Piezoelectric and Frequency control devices Sectional Committee LITD 24 NATIONAL FOREWORD This Indian Standard (Part 2) which is identical with IEC :2010 :1993 Ferrite cores Dimensions Part 2: Pot-cores for use in telecommunications, power supply, and filter applications issued by the the International Organization for Standardization (ISO) and International Electrotechnical Commission (IEC) jointly was adopted by the Bureau of Indian Standards on the recommendations of Information and Communication Technology, Sectional Committee and approval of the Electronics and Information Technology Division Council. The text of the ISO/IEC standard has been approved as suitable for publication as Indian Standard without deviations. Certain conventions are, however, not identical to those used in Indian Standards. Attention is particularly drawn to the following a) Wherever the words International Standard appear referring to this standard, they should be read as Indian Standard. b) Comma (,) has been used as a decimal marker while in Indian Standards, the current practice is to use a point (.) as the decimal marker. The technical committee has reviewed the provisions of following International Standards referred in this adopted standard and has decided that they are acceptable for use in conjunction with this standard. For undated references, the latest edition of the referenced document applies, including any corrigenda and amendment. International Standard Title IEC Calculation of the effective parameters of magnetic piece parts Ferrite cores Dimensions Part 1: General specification IEC For the purpose of deciding whether a particular requirement of this standard is complied with, the final value, observed or calculated, expressing the result of a test or analysis, shall be rounded off in accordance with IS 2:1960 Rules for rounding off numerical values (revised). The number of significant places retained in the rounded off value should be the same as that of the specified value in this standard.