Electronics Development for psec Time-of. of-flight Detectors. Enrico Fermi Institute University of Chicago. Fukun Tang

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Transcription:

Electronics Development for psec Time-of of-flight Detectors Fukun Tang Enrico Fermi Institute University of Chicago With Karen Byrum and Gary Drake (ANL) Henry Frisch, Mary Heintz and Harold Sanders (UC)

Introduction: Readout Electronics System Anode structure Harold s TOF system

Characteristics of MCP-PMT Output Signal MCP-PMT output signal from Tim simulation Rise time 15ps (equivalents to a signal bandwidth of 23.3 GHz) Pulse width (FWHM): 40ps Reflection coefficient: -0.98 (Load=100 ohms) Reflection time delay (round trip): 240ps Recovery time: 75ns (Settled at 1ppm) 240ps 15ps 40ps 75ns@1ppm

Proposed Time Stretcher TDC with 1ps Resolution Start MCP_PMT Output Signal Stop psfront-end 500ps Tw Reference Clock fine time interval

Electronics Requirements & Process Evaluations Input signal bandwidth: Input signal width (FWHM): TDC resolution: ~23.3GHz ~40ps ~1ps Minimum Requirements: ultra low noise, ultra high f T transistors > 5-10x of the input signal bandwidth ~(110-220GHz) stable passive components Inductors, MIM Capacitors, Resistors, Varactors Available Processes: IHP SiGe BiCMOS 0.25μm technology: (SG25H1, SG25H2) --- Europractice IBM SiGe BiCMOS 0.13μm Technology: (8HP) --- MOSIS

UC designed 2 GHz VCO with 55 fsec Cycle-to to-cycle Timing Jitter Using IHP SG25H1 Process

IBM SiGe BiCMOS8HP Process Cross-section M3 M4 M2

Brief Summary of IBM BiCMOS8HP Process SiGe hetero-junction bipolar transistors f T (high performance): 200GHz, BVceo=1.7V, BVcbo=5.9V f T (high breakdown): 57GHz, BVceo=3.55V, BVcbo=12V High-Q Q inductors and metal-insulator insulator-metal capacitors 4 types of low-tolerance resistors with low and high sheet resistivity n+ diffusion, tantalum nitride, p+ polisilicon and p-p polisilicon CMOS transistors (VDD=1.2V or 2.5/3.3V) Twin-well well CMOS Hyperabrupt junction and MOS varactors Deep trench and shallow trench isolations

8HP NPN Ft Characteristics vs. Emitter size (25C) 0.12x3u 0.12x6u 0.12x12u GHz 1mA Ic (A) 10mA

2GHz VCO Design using IBM SiGe BiCMOS8HP Process EDA Tools: Cadence Virtuoso Analog Environment Verification Tools: Diva/Assura Simplified VCO Schematic Core Purely hetero-junction transistors Negative resistance On-chip high-q LC tank High Frequency PN diode Varactors Capacitor voltage dividers 130Mhz tuning range Full differential 50-ohm line drivers CORE

VCO Schematic (Pre-layout) Simulation Result Transit Outputs Phase Noise Phase Noise -97dBc/Hz Equivalents to Cycle-tocycle timing jitter of 5 fs V-F Transfer Function Tuning Range=130M 2GHz@VC=1.35V

Analysis of CMOS Latchup Famous CMOS latch-up which created by parasitic lateral pnp and npn transistors Solution: apply substrate contacts and tie them to the lowest voltage terminals apply shallow trenches to increase isolation

Substrate Noise Minimization (1) One of the major substrate noise is caused by current injection from bipolar transistors working in saturation mode. (2) Substrate PN diode occasionally forward biased by EMI interference or some other reasons. (3) Parasitic coupling capacitance Solution: Prevent transistors from working in saturation mode unless you have to. N N P apply substrate contacts and tie them to the lowest voltage potential on the chip. apply deep or shallow trench shielding rings to increase isolation (3) P- Substrate NBL (1) (2)

UC Designed 2GHz VCO Chip with 5 fsec Cycle-to-Cycle Time Jitter Using IBM 0.13μm SiGe BiCMOS8HP Process (Feb. 2007) Chip Size: 850x640μ

Layout and Parasitic Extraction Diva/Assura DRC Check Diva/Assura LVS Check Floating Gate, NWell & Antenna Check Global Pattern Density Check Local Pattern Density Check GR594 (Dendrite Rules) Check Assura RCL extraction GDSII Stream Out (CDS GDSII mapping) GDSII/Layout Comparison Check Backup your full data after you passed all checks!!!

Schematic & Post Layout Comparison: Hierarchy Setup Schematic av_extracted (RCL)

RLC_Extracted Schematic Back Annotation View Node_Tn: ΣC=119.8f ΣL=73pH

Post Simulation: Configuration Setup Parasitic Parameters Back Annotation

Post Simulation Parasitic Parameter List

Schematic/Post Layout Simulation Comparison: Transit Outputs (first layout) Vmax=1.52V Schematic Transit Outputs Vmax=1.475V Layout Extraction Transit Outputs

VCO Post Layout Simulation Result (First Layout) Output Phase Noise Spectra Plot

Schematic/Post Layout Simulation Comparison: V-F Transfer Function Plot (first layout) Designed Schematic V-F Transfer Function F=2Ghz @VC=1.35V Tuning Range=130MHz Post-layout V-F Transfer Function F=2Ghz @VC=0.9V Tuning rang=80mhz

VCO Post Layout Transit Simulation Result (Final) Transit Output Waveforms Modify schematic design Re-layout Re-simulation

VCO Post Layout Simulation Result (Final) Output Phase Noise Spectra Plot Equivalents to RMS cycleto-cycle time jitter of 5 femto-seconds

VCO Simulation Result (Final) V-F Transfer Function Plot Schematic V-F Transfer Function Post Layout V-F Transfer Function F=2GHz@VC=1.35V Tuning Range=130MHz

Conclusion (1) IBM 0.13μm SiGe BiCMOS8HP has been evaluated; it is a user-friendly design kit. (2) Circuit performance meets our requirements (very) well. (3) MOSIS has resumed 8HP Multi-Project Wafer runs schedule has been changing(!). We are in the process of understanding how to proceed toward a full chip design starting with our first little VCO chip. (4) Challenging Issues for the entire readout electronics. Thanks!