Gas Tube Aestes The Potection Poducts Goup of Wold Poducts Inc., specializing in potection poducts fo AC and DC cicuits, is poud to featue a full line of Gas Tube Aestes. Ceamic Gas Tube Aestes povide potection fo pesonnel, equipment and cicuity fom the abnomally high tansient voltages which can be caused by lightning o electomagnetic induction. The aestes ae designed with defined suge limiting chaacteistics. When the abnomal voltage on a line eaches that defined level, spakove (o beakdown) occus within the gas tube aeste, the suge is ediected and people and equipment ae potected. Ceamic Aestes ae vey duable and extemely gastight. They have pecise spakove voltages and vey high AC cuent withstand capability and impulse withstand capability. Diffeent applications equie diffeent types of aestes and WPI povides aestes to meet evey need. Aeste models vay both in dimension and in electical chaacteistics and it is impotant that aestes be selected in accodance with the equiements of the paticula application. While two electode aestes have the advantage of being lowe piced, the opening in the cente electode of the thee electode aeste allows the two gaps of the aeste to shae a common gas chambe. This causes spakove to occu almost simultaneously in both sides of the aeste and minimizes the cuent suge in the potected lines. The vaious standad designs ae descibed in this catalogue. Aestes fo special applications ae also available and we welcome you inquiies if the model you need is not listed hee. Discove why WPI is the fist choice in Gas Tube Aestes. Table of Contents Geneal Infomation Fail-Safe Device Standad Pat Numbe Definitions Teminology Y08JS Seies - Two Electode U, Y08U, Y08UZ Seies - Two Electode Y, YZ, Y08 Seies - Two Electode 3J, 3YVJ Seies - Thee Electode 3YVH Seies - Thee Electode 3YW Seies - Thee Electode Y06S Seies - Miniatue Two Electode 3Y06 Seies - Miniatue Thee Electode Technical Data Cetifications, Device Selection Pupose, Opeation, Installation Pat Numbe Constuction, Pat Making Definition of tems Pat Numbe Specs, Lead Types, Dimensions Pat Numbe Specs, Lead Types, Dimensions Pat Numbe Specs, Lead Types, Dimensions Pat Numbe Specs, Lead Types, Dimensions Pat Numbe Specs, Lead Types, Dimensions Pat Numbe Specs, Lead Types, Dimensions Pat Numbe Specs, Lead Types, Dimensions Pat Numbe Specs, Lead Types, Dimensions Cicuit Applications
Gas Tube Aestes - Geneal Infomation ISO-9001 Quality contols of all poducts accoding to stictly established ISO-9001 standads. 100% Inspection The DC Spakove Voltage, Insulation Resistance and Extenal Dimension chaacteistics of all aestes (100% sampling) ae tested duing the poduction pocess. Othe pefomance chaacteistics ae checked with appopiate sampling pocedues. AQL Sampling The scope of sampling inspections and the maximum admissible numbe of defects ae based on the Single Sampling Plan fo Geneal Inspection - Level-I and the Nomal Inspection Pocedues as defined by ISO 2859. The AQL at delivey is 0.65 fo the DC Spakove Voltage and Insulation Resistance chaacteistics of ou aestes. Waanty Poduct waanty is fo a peiod of one yea afte installation o fifteen months afte shipment fom the factoy, whicheve comes fist. If defective poduct claims ae found to be justifiable, eplacement poducts meeting the applicable specification will be povided in pinciple. Radioactive Mateial Fee Poducts contain no adioactive mateial. Tempeatue Stess Opeation Tempeatue Range Models without Fail-Safe Device: -30 C ~ 65 C Models with Fail-Safe Device: -20 C ~ 65 C Stoage Tempeatue Range Models without Fail-Safe Device: -30 C ~ 65 C Models with Fail-Safe Device: -20 C ~ 65 C Packaging Aestes ae nomally packed 100 pieces in a plastic tay o 200 pieces in a vacuum bag, ten tays o five bags (1,000 pieces) to a standad box.
Fail Safe Device Pupose Gas Tube Aestes ae typically used to quickly and safely potect moden telecommunications equipment fom damage caused by tansient suge voltages. Lightning and equipment switching opeations ae two common causes of these shot duation suge voltages. Gas Tube Aeste opeation does not geneate any significant heat duing these events which nomally last a few micoseconds o less. Howeve, suge voltages can also be caused by cossove fom powe supply lines and last significantly longe. Gas Tube Opeation may continue fo extended peiods and geneate significant themal enegy. To pevent heat caused damage to the aeste magazine o the teminal block and to eliminate any possible fie hazad, a Gas Tube Aeste equipped with back-up shot cicuit mechanism known as a Fail-Safe Device may be employed. Opeation The Fail-Safe Device is a shot cicuit sping that is mounted on the cente electode of the Gas Tube Aeste. Pio to opeation, a solde pellet installed between the sping and the cente electode of the Gas Tube Aeste and thin insulating tubes coveing shap pojections at each end of the shot cicuit sping foce the Fail-Safe Device to "float" 0. 1-0.5 mm above the oute electodes of the Gas Tube Aeste. Befoe Opeation When polonged dischage opeation causes the tempeatue of the Gas Tube Aeste to ise to the melting point of the solde pellet, the shot cicuit sping moves close to the Gas Tube Aeste and its tension foces the pojections though the thin insulation making contact with both Gas Tube Aeste oute electodes. This pocess pemanently shot-cicuits all thee electodes ceating a low esistance path to gound that will conduct the fault cuent without geneating significant heat. Afte Opeation Fail-Safe Activation Time Fail-Safe Device Activation Times vay fom model to model. See the Gas Tube Aeste Specifications fo details. Installation Cae should be taken when installing Gas Tube Aestes equipped with Fail-Safe Devices into aeste magazines, pinted cicuit boads, etc. because too much downwad pessue may foce the shot cicuit sping pojections though the thin insulation ceating a shoted condition.
Fail Safe Device Fail-Safe Device Equipped Gas Tube Aeste Model Numbes Two Electode Gas Tube Aestes with Fail-Safe Device Y08JS-230AF1 Y08UZ-230AF1 Thee Electode Gas Tube Aestes with Fail-Safe Device 3YVJ-90J1F2 3YVH-230AF5 3YVJ-145J1F2 3YVH-250AF5 3YVJ-200J1F2 3YVH-350AF5 3YVJ-230J1F2 3YVH-230J1F5 3YVJ-250J1F2 3YVJ-260J1F2 3YVJ-300J1F2 3YVJ-350J1F2 3YVJ-400J1F2 3YVJ-550J1F2
Standad Pat Numbe Definitions Two Electode Aestes Example: Pat Numbe Y08UZ-230A Thee Electode Aestes Example: Pat Numbe 3YVH-230J1F5
Making Refeence Guide Two Electode Aestes Example: Pat Numbe Y08UZ-230A Thee Electode Aestes Example: Pat Numbe 3YVH-230J1F5
Teminology Unless othewise specified, the tems used thoughout this catalogue ae defined as follows. DC Spakove Voltage: With a ate of ise of 100V/s o less, the minimum ising DC voltage that will cause spakove o beakdown when applied acoss the teminals of an aeste Impulse Spakove Voltage: The maximum voltage attained by an impulse of designated wavefom (100 V/µs o 1 kv/µs) applied acoss the teminals of an aeste pio to the flow of dischage cuent. Insulation Resistance: The esistance measued between the teminals of an aeste when the DC voltage specified in this catalogue is applied at a nominal ambient tempeatue (25 C) and elative humidity (75%). Capacitance: The capacitance as measued between the teminals of an aeste. DC Holdove Voltage: The maximum DC Voltage acoss the teminals of an aeste unde which it may be expected to clea and etun to its high impedance state afte the passage of a suge unde specified cicuit conditions. Impulse Life: The minimum numbe of impulses of a specified wavefom and peak cuent which an aeste will conduct without suffeing any of the failue judgment modes as defined in this catalogue. Impulse Dischage Cuent: The maximum cuent of a wavefom of 8/20µs that can be applied acoss the teminals of an aeste without causing the aeste to fail as defined by the failue judgment modes descibed below. AC Dischage Cuent: The RMS cuent value that an aeste will conduct without suffeing any of the failue judgment modes defined in this catalogue when a cuent of 50 Hz o 60 Hz is applied fo a peiod of 9 cycles (50 Hz) o 11 cycles (60 Hz). Failue Judgment: Afte the Impulse Life Test, Impulse Dischage Cuent Test and the AC Dischage Cuent Test, an aeste shall be judged to have failed if any of the following failue modes exists. Low DC Spakove Voltage: Less than 50% of the nominal DC Spakove Voltage High DC Spakove Voltage: Moe than 150% of the nominal DC Spakove Voltage High Impulse Spakove Moe than 150% of the nominal 100V/µs Impulse Voltage: Spakove Voltage Insulation Resistance: Less than one Megohm.
Y08JS Seies - Two Electode P a t N u m b e Model A: Without Leads Note : 1. Insulation Resistance shall be measued with the following voltages fo each nominal DC Spakove Voltage. Nominal DC Spakove Voltage 90 ~ 145V 230 ~ 350V 2. DC Holdove Voltage shall be measued in accodance with the ITU-T K.12, Test Cicuit o the IEEE C62.31-1987 Test Cicuit. 3. Fail-safe Opeation Time 50Hz Measuing Voltage DC 50V DC 100V 0.7A: 210sec. 2.0A: 60sec. 7.0A: Instantaneous See Fig. 1 Y08JS-90A Y08JS-145A Y08JS-230A Y08JS-250A Y08JS-350A Model B: With Leads See Fig. 3 Y08JS-90B Y08JS-145B Y08JS-230B Y08JS-250B Y08JS-350B Model AF1: With Fail-Safe (See Note 3) See Fig. 2 N/A N/A Y08JS-230AF1 N/A N/A Model YX See Fig. 4 Y08JS-90YX Y08JS-145YX Y08JS-230YX Y08JS-250YX Y08JS-350YX DC Spakove Voltage 100V/S 70-110V 115-175V 180-280V 200-300V 290-430V Impulse Spakove 100V/µs < 700V < 700V < 700V < 700V < 700V Voltage 1KV/µs < 800V < 800V < 800V < 800V < 800V Insulation Resistance See Note 1 Capacitance 1MHz < 1.5pF < 1.5pF < 1.5pF See Note 4 < 1.5pF < 1.5pF DC Holdove Voltage See Note 2 < 52V < 52V < 52V < 52V < 52V Impulse Life 10/1000µs, 100A 300 times 300 times 300 times 300 times 300 times Impulse Dischage Cuent, 8/20µs AC Dischage Cuent, 50Hz Single 20kA 20kA 20kA 20kA 20kA (5 Times - each polaity) 15kA 15kA 15kA 15kA 15kA Single, 9 Cycles 90A 90A 90A 90A 90A 1 sec. 20A 20A 20A 20A 20A
Y08U and Y08UZ Seies - Two Electode Note : 1. Insulation Resistance shall be measued with the following voltages fo each nominal DC Spakove Voltage. Nominal DC Spakove Voltage 75 ~ 145V 230 ~ 400V 470 ~ 800V Measuing Voltage DC 50V DC 100V DC 250V 2. DC Holdove Voltage shall be measued in accodance with the ITU-T K.12, Test Cicuit o the IEEE C62.31-1987 Test Cicuit. 3. Recognized unde UL497B, File Numbe E140906 P a t N u m b e Standad P/N UL Appoved P/N See Note 3 Model A Without Leads Model B With Leads Model A Without Leads Model B With Leads See Fig. 1 Y08U-75A Y08U-90A Y08UZ-145A Y08UZ-230A Y08UZ-250A Y08UZ-300A See Fig. 2 Y08U-75B Y08U-90B Y08UZ-145B Y08UZ-230B Y08UZ-250B Y08UZ-300B See Fig. 1 U-1A U-2A U-3A U-4A U-5A U-6A See Fig. 2 U-1B U-2B U-3B U-4B U-5B U-6B DC Spakove Voltage 100V/S 75V 90V 145V ± 15% 230V ± 15% 255V ± 15% 300V ± 15% 100V/µs < 500V < 500V < 500V < 600V < 600V < 700V Impulse Spakove Voltage 1KV/µs < 700V < 700V < 700V < 750V < 800V < 850V Insulation Resistance See Note 1 Capacitance 1MHz < 1.0pF < 1.0pF < 1.0pF < 1.0pF < 1.0pF < 1.0pF DC Holdove Voltage See Note 2 < 52V < 52V < 80V < 135V < 135V < 150V Impulse Life Impulse Dischage Cuent, 8/20µs AC Dischage Cuent, 50Hz 10/1000µs, 500A 300 times 300 times 300 times 300 times 500 times 500 times Single 10kA 10kA 10kA 10kA 10kA 10kA 10 times (5 Times - each 5kA 5kA 5kA 5kA 5kA 5kA polaity) Single, 9 Cycles 65A 65A 65A 65A 65A 65A 1 sec. 5 times 5 times 5 times 5 times
Y08U and Y08UZ Seies - Two Electode P a t N u m b e Standad P/N UL Appoved P/N See Note 3 Model A Without Leads Model B With Leads Model A Without Leads Model B With Leads See Fig. 1 Y08U-350A Y08U-400A Y08UZ-470A Y08UZ-600A Y08UZ-800A See Fig. 2 Y08U-350B Y08U400B Y08UZ-470B Y08UZ-600B Y08UZ-800B See Fig. 1 U-7A U-8A U9A U-10A U-11A See Fig. 2 U-7B U-8B U-9B U-10B U-11B DC Spakove Voltage 100V/S 350V ± 15% 400V ± 15% 470V ± 15% 600V ± 15% 800V ± 15% 100V/µs < 700V < 700V < 700V < 800V < 1,000V Impulse Spakove Voltage 1KV/µs < 850V < 850V < 850V < 1,00V < 1,200V Insulation Resistance See Note 1 Capacitance 1MHz < 1.0pF < 1.0pF < 1.0pF < 1.0pF < 1.0pF DC Holdove Voltage See Note 2 < 150V < 150V < 150V < 150V < 150V Impulse Life 10/1000µs, 500A 500 times 500 times 500 times 500 times 500 times Single 10kA 10kA 10kA 10kA 10kA Impulse Dischage Cuent, 8/20µs (5 Times - each polaity) 5kA 5kA 5kA 5kA 5kA Single, 9 Cycles 65A 65A 65A 65A 65A AC Dischage Cuent, 50Hz 1 sec.
Y08 Seies - Two Electode Note : 1. Insulation Resistance shall be measued with the following voltages fo each nominal DC Spakove Voltage. Nominal DC Spakove Voltage 1,000V 1,500 ~ 2,100V 2,400 ~ 6,000V Measuing Voltage DC 250V DC 500V DC 1,000V 2. Measued with an 8/20µs, 100A impulse 3. fo each polaity. 4. All UL Appoved Pat Numbe Models ae Recognized unde UL1449, File Numbe E96234 5. Y08SV-272B is also Recognized unde UL1414, File Numbe E165829 P a t N u m b e Model B With Axial Leads See Figue 1 DC Spakove Voltage Standad P/N Y08Z-102B Y08-152B Y08-212B Y08-242B Y08-302B UL Appoved P/N See Notes 4 & 5 YZ-102B Y-152B Y-212B Y-242B Y-302B "L" in mm 8.0 ± 0.3 8.5 ± 0.3 8.5 ± 0.3 8.5 ± 0.3 8.5 ± 0.3 Unit Weight (g) 1.5 1.5 1.5 1.5 1.5 100V/S 1,000V 1,500V ± 15% 2,100V 2,400V 3,000V Impulse Spakove Voltage 100V/µs < 1,500V < 2,200V < 2,700V < 3,000V < 4,000V Insulation Resistance See Note 1 Capacitance 1MHz < 1.0pF < 1.0pF < 1.0pF < 1.0pF < 1.0pF Impulse Life 10/1000µs, 500A 200 times Single 10kA 10kA 10kA 10kA 10kA Impulse Dischage Cuent, 8/20µs (5 Times - each polaity) 3kA 3kA 3kA 3kA 1kA Single, 9 Cycles 5A 5A 5A 5A 5A AC Dischage Cuent, 50Hz 1 sec. 1A 1A 1A 1A 1A
Y08 Seies - Two Electode P a t N u m b e DC Spakove Voltage Model B With Axial Leads See Figue 1 Standad P/N Y08-402B Y08-602B N/A N/A UL Appoved P/N See Notes 4 & 5 Y-402B Y-602B Y08SV-262B Y08SV-272B "L" in mm 8.5 ± 0.3 13.0 ± 0.3 8.8 ± 0.3 8.8 ± 0.3 Unit Weight (g) 1.5 1.9 1.6 1.6 100V/S 4,000V 6,000V 2,400 ~ 2,860V at 5kV/s 2,340 ~ 2,970V at 5kV/s Impulse Spakove Voltage 100V/µs < 5,000V < 8,000V < 3,700V < 3,700V Insulation Resistance See Note 1 100Mohm 100Mohm Capacitance 1MHz < 1.0pF < 1.0pF < 1.0pF < 1.0pF Impulse Life 10/1000µs, 500A Impulse Dischage Cuent, 8/20µs AC Dischage Cuent, 50Hz 300 times See note 2 300 times See note 2 Single 10kA 10kA N/A N/A (5 Times - each polaity) 1kA 1kA 3kA See note 3 3kA See note 3 Single, 9 Cycles 5A 5A N/A N/A 1 sec. 1A 1A N/A N/A
3YVJ Seies - Thee Electode Note : 1. Insulation Resistance shall be measued with the following voltages fo each nominal DC Spakove Voltage. Nominal DC Spakove Voltage 90 ~ 145V 200 ~ 550V Measuing Voltage DC 50V DC 100V 2. DC Holdove Voltage shall be measued in accodance with the ITU-T K.12, Test Cicuit o the IEEE C62.31-1987 Test Cicuit. 3. Recognized unde UL497B, File Numbe E 140906 4. Fail-Safe opeation time : at 25 C fo Fail-Safe Model F2. (Othe Fail-Safe models ae available) L1 + L2 - E 1A + 1A : < 15 sec 3A + 3A : < 10 sec 5A + 5A : < 7 sec 10A + 10A : < 5 sec P a t N u m b e Standad Pat Numbe UL Appoved Pat Numbe (See Note 3) DC Spakove Voltage Impulse Spakove Voltage Lead Configuation : J1 Fail-Safe Model : J1F2 Lead Configuation : B Lead Configuation : B Lead Configuation : J1 See Fig. 1 See Fig. 3 See Fig. 2 See Fig. 2 See Fig. 1 With Fail-Safe (See Note 4) 100V/S Insulation Resistance See Note 1 5. Measued with impulse wavefom : 10/1000µs, 1000A 6. Lead spacing (pitch) of 4.7mm and 5.0mm ae available by equest. 3YVJ-90J1 3YVJ-145J1 N/A 3YVJ-230J1 N/A 3YVJ-90J1F2 3YVJ-145J1F2 3YVJ-200J1F2 3YVJ-230J1F2 3YVJ-250J1F2 3YVJ-90B 3YVJ-145B N/A 3YVJ-230B 3YVJ-250B 3J-1B 3J-2B N/A 3J-3B 3J-4B 3J-1J1 3J-2J1 N/A 3J-3J1 3J-4J1 90V 145V 200V ± 25% 230V 250V 100V/µs < 700V < 700V < 500V < 500V < 500V 1kV/µs < 850V < 850V < 650V < 650V < 650V Capacitance 1MHz < 3.0pF < 3.0pF < 3.0pF < 3.0pF < 3.0pF DC Holdove Voltage See Note 2 < 52V < 52V < 135V < 135V < 135V Impulse Life 10/1000µs, 400A 300 times 300 times 300 times 300 times 300 times Impulse Dischage Cuent, 8/20µs Single 20kA 20kA 20kA 20kA 20kA (5 Times - each polaity) 10kA 10kA 10kA 10kA 10kA AC Dischage Cuent, 50Hz Single, (9 Cycles) 130A 130A 130A 130A 130A (1 second) 10A 10A 10A 10A 10A
3YVJ Seies - Thee Electode Note : 1. Insulation Resistance shall be measued with the following voltages fo each nominal DC Spakove Voltage. Nominal DC Spakove Voltage 90 ~ 145V 200 ~ 550V Measuing Voltage DC 50V DC 100V 2. DC Holdove Voltage shall be measued in accodance with the ITU-T K.12, Test Cicuit o the IEEE C62.31-1987 Test Cicuit. 3. Recognized unde UL497B, File Numbe E 140906 4. Fail-Safe opeation time : at 25 C fo Fail-Safe Model F2. (Othe Fail-Safe models ae available) L1 + L2 - E 1A + 1A : < 15 sec 3A + 3A : < 10 sec 5A + 5A : < 7 sec 10A + 10A : < 5 sec 5. Measued with impulse wavefom : 10/1000µs, 1000A 6. Lead spacing (pitch) of 4.7mm and 5.0mm ae available by equest. P a t N u m b e Standad Pat Numbe UL Appoved Pat Numbe (See Note 3) DC Spakove Voltage Impulse Spakove Voltage Lead Configuation : J1 See Fig. 1 3YVJ-260J1 3YVJ-300J1 3YVJ-350J1 3YVJ-400J1 3YVJ-550J1 Fail-Safe Model : J1F2 See Fig. 3 With Fail-Safe (See Note 4) 3YVJ-260J1F2 3YVJ-300J1F2 3YVJ-350J1F2 3YVJ-400J1F2 3YVJ-550J1F2 Lead Configuation : B See Fig. 2 3YVJ-2690B 3YVJ-300B 3YVJ-350B 3YVJ-400B N/A Lead Configuation : B See Fig. 2 N/A 3J-5B 3J-6B 3J-7B N/A Lead Configuation : J1 See Fig. 1 N/A 3J-5J1 3J-6J1 3J-7J1 N/A 100V/S Insulation Resistance See Note 1 260V 300V 350V 400V 550V 100V/µs < 500V < 600V < 600V < 700V < 850V 1kV/µs < 650V < 750V < 750V < 850V < 1,000V Capacitance 1MHz < 3.0pF < 3.0pF < 3.0pF < 3.0pF < 3.0pF DC Holdove Voltage See Note 2 < 135V < 135V < 150V < 150V < 150V Impulse Life 10/1000µs, 400A 300 times 300 times 300 times Impulse Dischage Cuent, 8/20µs AC Dischage Cuent, 50Hz 400 times See Note 5 300 times Single 20kA 20kA 20kA 20kA 20kA (5 Times - each polaity) 10kA 10kA 10kA 10kA 10kA Single, (9 Cycles) 130A 130A 130A 130A 130A (1 second) 10A 10A 10A 10A 10A
3YVH Seies - Thee Electode P a t N u m b e Note : 1. DC Holdove Voltage measuement shall comply with the ITU-T K.12, Test #3 fo 3YVH-230 & 3YVH-250, and Test #2 fo 3YVH-350. 2. Fail-Safe opeation time : 10 sec at AC 10A(5A+5A=L1+ L2) 3. Measued Impulse : 100A(5A+5A=L1+ L2) A. Afte Impulse Life, Impulse & AC Dischage Cuent Test DC Spakove Voltage : 180 ~ 300V Impulse Spakove Voltage : < 900V Insulation Resistance : 100Mohm B. Afte Impulse Life, Impulse & AC Dischage Cuent Test DC Spakove Voltage : 250V ± 50% Impulse Spakove Voltage : < 900V Insulation Resistance : 100Mohm C. Afte Impulse Life, Impulse & AC Dischage Cuent Test DC Spakove Voltage : 250 ~ 450V Impulse Spakove Voltage : < 900V Insulation Resistance : 100Mohm Model A : Without Leads See Fig. 1 3YVH-230A 3YVH-250A 3YVH-350A Model AF5 : Fail-Safe (See Note 2) See Fig. 2 3YVH-230AF5 3YVH-250AF5 3YVH-350AF5 Model AF5 : With leads and Fail-Safe See Fig. 3 3YVH-230J1F5 N/A N/A DC Spakove Voltage Impulse Spakove Voltage Insulation Resistance 100V/S 180-300V 200-300V 280-420V 1kV/µs < 900V < 900V < 900V 100V DC 1,000Mohm 1,000Mohm 1,000Mohm Capacitance 1MHz < 3.0pF < 3.0pF < 3.0pF DC Holdove Voltage See Note 1 < 135V < 135V < 80V Impulse Life Impulse Dischage Cuent, 8/20µs AC Dischage Cuent, 50Hz 10/1000µs, 200A 300 times See Note 3A 300 times See Note 3B 300 times See Note 3C (5 Times - each polaity) Not Specified Not Specified 20kA See Note 3C 5 times (1 second) 10A See Note 3A 20A See Note 3B 20A See Note 3C
3YW Seies - Thee Electode Note : 1. Insulation Resistance shall be measued with the following voltages fo each nominal DC Spakove Voltage. Nominal DC Spakove Voltage 90V 230 ~ 400V Measuing Voltage DC 50V DC 100V 2. DC Holdove Voltage shall be measued in accodance with the ITU-T K.12, Test Cicuit o the IEEE C62.31-1987 Test Cicuit. Pat Numbe DC Spakove Voltage Impulse Spakove Voltage Insulation Resistance See Note 1 See Fig. 1 3YW-90A 3YW-230A 3YW-350A 3YW-400A See Fig. 2 3YW-90YZ 3YW-230YZ 3YW-350YZ 3YW-400YZ 100V/S 90V 230V 350V 400V ± 25% 100V/µs < 500V < 600V < 650V < 700V 1kV/µs < 700V < 800V < 850V < 900V Capacitance 1MHz < 3.0pF < 3.0pF < 3.0pF < 3.0pF DC Holdove Voltage See Note 2 < 52V < 150V < 150V < 150V Impulse Life 10/1000µs, 1000A 1,000 times 1,000 times 1,000 times 1,000 times Impulse Dischage Cuent, 8/20µs Single 40kA 40kA 40kA 40kA (5 Times - each polaity) 20kA 20kA 20kA 20kA AC Dischage Cuent, 50Hz Single (9 cycles) (1 second) 400A 400A 400A 400A 20A 20A 20A 20A
Y06S Seies - Miniatue Two Electode Pat Numbe Note : 1. Insulation Resistance shall be measued with the following voltages fo each nominal DC Spakove Voltage. Nominal DC Spakove Voltage 100V 230 ~ 350V Measuing Voltage DC 50V DC 100V 2. DC Holdove Voltage shall be measued in accodance with the ITU-T K.12, Test Cicuit o the IEEE C62.31-1987 Test Cicuit. Model A : Without Leads See Fig. 1 Y06S-100A Y06SZ-230A Y06SZ-350A Model B : With Leads See Fig. 2 Y06S-100B Y06SZ-230B Y06SZ-350B DC Spakove Voltage Impulse Spakove Voltage Insulation Resistance See Note 1 100V/S 100V 230V 350V 100V/µs < 500V < 500V < 600V 1kV/µs < 700V < 700V < 800V Capacitance 1MHz < 1.0pF < 1.0pF < 1.0pF DC Holdove Voltage See Note 2 < 52V < 135V < 135V Impulse Life 10/1000µs, 100A 200 times 200 times 200 times Impulse Dischage Cuent, 8/20µs AC Dischage Cuent, 50Hz Single 3kA N/A N/A (5 Times - each polaity) Single (9 cycles) (1 second) N/A 5kA 5kA 20A 20A 20A N/A 5A 5A
3Y06 Seies - Miniatue Thee electode Note : 1. Insulation Resistance shall be measued with the following voltages fo each nominal DC Spakove Voltage. Nominal DC Spakove Voltage 90V 230 ~ 350V Measuing Voltage DC 50V DC 100V 2. DC Holdove Voltage shall be comply with ITU-T K.12. 3. Afte Impulse Life, Impulse & AC Dischage Cuent Test A. DC Spakove Voltage : 90V ± 50% Impulse Spakove Voltage : < 900V Insulation Resistance : 100Mohm s B. DC Spakove Voltage : 180 ~ 300V Impulse Spakove Voltage : < 900V Insulation Resistance : 100Mohm C. DC Spakove Voltage : 350V ± 50% Impulse Spakove Voltage : < 900V Insulation Resistance : 100Mohm Pat Numbe Model A : Without Leads See Fig. 1 3Y06-90A 3Y06-230A 3Y06-350A Model P1 : With leadss See Fig. 2 3Y06-90P1 3Y06-230P1 3Y06-350P1 DC Spakove Voltage Impulse Spakove Voltage Insulation Resistance 100V/S 90V 230V 350V 1kV/µs < 850V < 700V < 750V 100V DC Capacitance 1MHz < 3.0pF < 3.0pF < 3.0pF DC Holdove Voltage See Note 1 < 52V < 135V < 150V Impulse Life 10/1000µs, 200A Impulse Dischage Cuent, 8/20µs AC Dischage Cuent, 50Hz (5 Times - each polaity) 5 times (1 second) 100 times See Note 3A 5kA See Note 3A 5A See Note 3A 100 times See Note 3B 10kA See Note 3B 10A See Note 3B 100 times See Note 3C 5kA See Note 3C 5A See Note 3C
Gas Tube Aestes - Technical Data AC Line MOV - M1,M2, M3: Conside high line voltage conditions when choosing MOV's voltage clamping level, 20mm disc diamete is ecommended size. Isolation Inductance - Select inductance value geate than 100 micoheny at fequency ange fom 50KHZ to 1MHZ. Telecom Line MOV - M4, M5, M6: Follow cuent limiting MOV. Choose vaisto voltage at 1mA which is appoximately 15% lowe than MOV's M1, M2 and M3. 20mm disc diamete size is ecommended fo all MOV's. Gas Tube - See Gas Tube Device Selection in Geneal Infomation. Gas Tube with Fail Safe - When Switch Gade Gas Tube acs continuously due to follow cuent, fail safe mechanism shots the tube and fuse opens. Gas Tube - See Gas Tube Device Selection in Geneal Infomation. T1, T2, T3 - TVS Diodes o MOV's select standby voltage which is geate than max peak incoming signal including inging voltage. R1, R2 - Select value 10 to 20 ohms.