Features. Table 1: Device summary Order code Marking Package Packing STL10LN80K5 10LN80K5 PowerFLAT 5x6 VHV Tape and reel

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Transcription:

N-channel 800 V, 0.59 Ω typ., 6 A MDmesh K5 Power MOSFET in a PowerFLAT 5x6 VHV package Datasheet - production data Features Order code V DS R DS(on) max. I D STL10LN80K5 800 V 0.66 Ω 6 A 1 2 3 4 PowerFLAT 5x6 VHV Industry s lowest R DS(on) x area Industry s best figure of merit (FoM) Ultra-low gate charge 100% avalanche tested Zener-protected Figure 1: Internal schematic diagram Applications Switching applications G(4) D(5, 6, 7, 8) 8 7 6 5 Description This very high voltage N-channel Power MOSFET is designed using MDmesh K5 technology based on an innovative proprietary vertical structure. The result is a dramatic reduction in on-resistance and ultra-low gate charge for applications requiring superior power density and high efficiency. 1 2 3 4 S(1, 2, 3) Top View Table 1: Device summary Order code Marking Package Packing STL10LN80K5 10LN80K5 PowerFLAT 5x6 VHV Tape and reel February 2016 DocID027748 Rev 2 1/17 This is information on a product in full production. www.st.com

Contents STL10LN80K5 Contents 1 Electrical ratings... 3 2 Electrical characteristics... 4 2.1 Electrical characteristics (curves)... 6 3 Test circuits... 9 4 Package information... 10 4.1 PowerFLAT 5x6 VHV package information... 11 4.2 PowerFLAT 5x6 packing information... 14 5 Revision history... 16 2/17 DocID027748 Rev 2

Electrical ratings 1 Electrical ratings Table 2: Absolute maximum ratings Symbol Parameter Value Unit V GS Gate-source voltage ± 30 V I D Drain current (continuous) at T C = 25 C 6 A I D Drain current (continuous) at T C = 100 C 3.8 A I D (1) Drain current pulsed 24 A P TOT Total dissipation at T C = 25 C 42 W dv/dt (2) Peak diode recovery voltage slope 4.5 dv/dt (3) MOSFET dv/dt ruggedness 50 T j T stg Operating junction temperature range Storage temperature range Notes: (1) Pulse width limited by safe operating area (2) ISD 6 A, dv/dt 100 A/μs; V DS peak < V (BR)DSS, V DD=640 V (3) VDS 640 V V/ns - 55 to 150 C Table 3: Thermal data Symbol Parameter Value Unit R thj-case Thermal resistance junction-case 3 C/W R thj-amb (1) Thermal resistance junction-ambient 59 C/W Notes: (1) When mounted on 1inch² FR-4 board, 2 oz Cu Table 4: Avalanche characteristics Symbol Parameter Value Unit I AR E AS Avalanche current, repetitive or not repetitive (pulse width limited by T jmax) Single pulse avalanche energy (starting T j = 25 C, I D = I AR, V DD = 50 V) 2.7 A 240 mj DocID027748 Rev 2 3/17

Electrical characteristics STL10LN80K5 2 Electrical characteristics T C = 25 C unless otherwise specified Table 5: On/off-state Symbol Parameter Test conditions Min. Typ. Max. Unit V (BR)DSS Drain-source breakdown voltage V GS = 0 V, I D = 1 ma 800 V I DSS Zero gate voltage drain current V GS = 0 V, V DS = 800 V 1 µa V GS = 0 V, V DS = 800 V T C = 125 C (1) 50 µa I GSS Gate body leakage current V DS = 0 V, V GS = ±20 V ±10 µa V GS(th) Gate threshold voltage V DS = V GS, I D = 100 µa 3 4 5 V R DS(on) Static drain-source on-resistance V GS = 10 V, I D = 4 A 0.59 0.66 Ω Notes: (1) Defined by design, not subject to production test. Table 6: Dynamic Symbol Parameter Test conditions Min. Typ. Max. Unit C iss Input capacitance - 427 - pf C oss Output capacitance V DS = 100 V, f = 1 MHz, V GS = 0 V - 43 - pf C rss Reverse transfer capacitance - 0.25 - pf C o(tr) (1) C o(er) (2) Equivalent capacitance time related V DS = 0 to 640 V, Equivalent capacitance energy V GS = 0 V related - 72 - pf 27 - pf R g Intrinsic gate resistance f = 1 MHz, I D= 0 A - 7 - Ω Q g Total gate charge V DD = 640 V, I D = 8 A - 15 - nc Q gs Gate-source charge V GS= 10 V - 4.2 - nc Q gd Gate-drain charge (see Figure 16: "Test circuit for gate charge behavior") - 9 - nc Notes: (1) Time related is defined as a constant equivalent capacitance giving the same charging time as Coss when V DS increases from 0 to 80% V DSS (2) Energy related is defined as a constant equivalent capacitance giving the same stored energy as Coss when V DS increases from 0 to 80% V DSS 4/17 DocID027748 Rev 2

Electrical characteristics Table 7: Switching times Symbol Parameter Test conditions Min. Typ. Max. Unit t d(on) Turn-on delay time V DD= 400 V, I D = 4 A, R G = 4.7 Ω - 11.8 - ns t r Rise time V GS = 10 V (see Figure 15: "Test - 10 - ns circuit for resistive load switching t d(off) Turn-off delay time times" and Figure 20: "Switching - 28 - ns t f Fall time time waveform") - 13 - ns Table 8: Source-drain diode Symbol Parameter Test conditions Min. Typ. Max. Unit I SD Source-drain current - 6 A I SDM (1) V SD (2) Source-drain current (pulsed) - 24 A Forward on voltage I SD = 6 A, V GS = 0 V - 1.5 V t rr Reverse recovery time I SD = 6 A, di/dt = 100 A/µs, Reverse recovery V DD = 60 V charge (see Figure 17: "Test circuit for inductive load switching Reverse recovery and diode recovery times") current Q rr I RRM t rr Reverse recovery time I SD = 6 A, di/dt = 100 A/µs, Reverse recovery V DD = 60 V, T j = 150 C charge (see Figure 17: "Test circuit for inductive load switching Reverse recovery and diode recovery times") current Q rr I RRM Notes: (1) Pulse width limited by safe operating area (2) Pulsed: pulse duration = 300 µs, duty cycle 1.5% - 350 ns - 3.9 µc - 22.5 A - 505 ns - 5 µc - 20 A Table 9: Gate-source Zener diode Symbol Parameter Test conditions Min Typ. Max Unit V (BR)GSO Gate-source breakdown voltage I GS= ± 1 ma, I D= 0 A 30 - - V The built-in back-to-back Zener diodes are specifically designed to enhance the ESD performance of the device. The Zener voltage facilitates efficient and cost-effective device integrity protection,thus eliminating the need for additional external componentry. DocID027748 Rev 2 5/17

Electrical characteristics 2.2 Electrical characteristics (curves) Figure 2: Safe operating area Figure 3: Thermal impedance STL10LN80K5 Figure 4: Output characteristics Figure 5: Transfer characteristics Figure 6: Gate charge vs gate-source voltage Figure 7: Static drain-source on-resistance 6/17 DocID027748 Rev 2

Figure 8: Capacitance variations Electrical characteristics Figure 9: Normalized gate threshold voltage vs temperature Figure 10: Normalized on-resistance vs temperature Figure 11: Normalized V (BR)DSS vs temperature Figure 12: Output capacitance stored energy Figure 13: Source-drain diode forward characteristics DocID027748 Rev 2 7/17

Electrical characteristics STL10LN80K5 Figure 14: Maximum avalanche energy vs starting T J 8/17 DocID027748 Rev 2

Test circuits 3 Test circuits Figure 15: Test circuit for resistive load switching times Figure 16: Test circuit for gate charge behavior Figure 17: Test circuit for inductive load switching and diode recovery times Figure 18: Unclamped inductive load test circuit Figure 19: Unclamped inductive waveform Figure 20: Switching time waveform DocID027748 Rev 2 9/17

Package information STL10LN80K5 4 Package information In order to meet environmental requirements, ST offers these devices in different grades of ECOPACK packages, depending on their level of environmental compliance. ECOPACK specifications, grade definitions and product status are available at: www.st.com. ECOPACK is an ST trademark. 10/17 DocID027748 Rev 2

Package information 4.1 PowerFLAT 5x6 VHV package information Figure 21: PowerFLAT 5x6 VHV Package outline 1 2 3 4 Bottom view Pin 1 identification 8 7 6 5 Side view 8 7 6 5 Pin 1 identification 1 2 3 4 Top view DocID027748 Rev 2 11/17

Package information STL10LN80K5 Table 10: PowerFLAT 5x6 VHV package mechanical data mm Dim. Min. Typ. Max. A 0.80 1.00 A1 0.02 0.05 A2 0.25 b 0.30 0.50 D 5.00 5.20 5.40 E 5.95 6.15 6.35 D2 4.30 4.40 4.50 E2 2.40 2.50 2.60 e 1.27 L 0.50 0.55 0.60 K 2.60 2.70 2.80 12/17 DocID027748 Rev 2

Package information Figure 22: PowerFLAT 5x6 VHV recommended footprint (dimensions are in mm) DocID027748 Rev 2 13/17

Package information 4.2 PowerFLAT 5x6 packing information Figure 23: PowerFLAT 5x6 tape (dimensions are in mm) STL10LN80K5 Figure 24: PowerFLAT 5x6 package orientation in carrier tape 14/17 DocID027748 Rev 2

Figure 25: PowerFLAT 5x6 reel Package information DocID027748 Rev 2 15/17

Revision history STL10LN80K5 5 Revision history Table 11: Document revision history Date Revision Changes 25-Sep-2015 1 First release. 09-Feb-2016 2 Modified: R DS(on) in cover page Modified: Table 2: "Absolute maximum ratings", Table 3: "Thermal data", Table 5: "On/off-state", Table 6: "Dynamic" and Table 8: "Sourcedrain diode" Added: Section 3.1: "Electrical characteristics (curves)" Minor text changes 16/17 DocID027748 Rev 2

IMPORTANT NOTICE PLEASE READ CAREFULLY STMicroelectronics NV and its subsidiaries ( ST ) reserve the right to make changes, corrections, enhancements, modifications, and improvements to ST products and/or to this document at any time without notice. Purchasers should obtain the latest relevant information on ST products before placing orders. ST products are sold pursuant to ST s terms and conditions of sale in place at the time of order acknowledgement. Purchasers are solely responsible for the choice, selection, and use of ST products and ST assumes no liability for application assistance or the design of Purchasers products. No license, express or implied, to any intellectual property right is granted by ST herein. Resale of ST products with provisions different from the information set forth herein shall void any warranty granted by ST for such product. ST and the ST logo are trademarks of ST. All other product or service names are the property of their respective owners. Information in this document supersedes and replaces information previously supplied in any prior versions of this document. 2016 STMicroelectronics All rights reserved DocID027748 Rev 2 17/17